TW201508294A - 床台式光學元件對位與導電性之檢測機構 - Google Patents
床台式光學元件對位與導電性之檢測機構 Download PDFInfo
- Publication number
- TW201508294A TW201508294A TW102130470A TW102130470A TW201508294A TW 201508294 A TW201508294 A TW 201508294A TW 102130470 A TW102130470 A TW 102130470A TW 102130470 A TW102130470 A TW 102130470A TW 201508294 A TW201508294 A TW 201508294A
- Authority
- TW
- Taiwan
- Prior art keywords
- displacement
- conductive glass
- fine adjustment
- electrical
- axis direction
- Prior art date
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 17
- 230000003287 optical effect Effects 0.000 title claims abstract description 14
- 238000006073 displacement reaction Methods 0.000 claims abstract description 89
- 239000011521 glass Substances 0.000 claims abstract description 52
- 238000005259 measurement Methods 0.000 claims abstract description 47
- 238000012360 testing method Methods 0.000 claims description 17
- 238000001179 sorption measurement Methods 0.000 claims description 7
- 238000013519 translation Methods 0.000 claims description 7
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 6
- 238000000034 method Methods 0.000 claims description 3
- 239000000969 carrier Substances 0.000 claims 1
- 238000012937 correction Methods 0.000 claims 1
- 238000005516 engineering process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000012536 packaging technology Methods 0.000 description 3
- 238000009434 installation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000003070 Statistical process control Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW102130470A TW201508294A (zh) | 2013-08-26 | 2013-08-26 | 床台式光學元件對位與導電性之檢測機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW102130470A TW201508294A (zh) | 2013-08-26 | 2013-08-26 | 床台式光學元件對位與導電性之檢測機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI470250B TWI470250B (enrdf_load_stackoverflow) | 2015-01-21 |
TW201508294A true TW201508294A (zh) | 2015-03-01 |
Family
ID=52784789
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW102130470A TW201508294A (zh) | 2013-08-26 | 2013-08-26 | 床台式光學元件對位與導電性之檢測機構 |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201508294A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI694611B (zh) * | 2019-05-01 | 2020-05-21 | 蔡東猛 | 微型發光二極體和影像感測元件測試和修復流程 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7235964B2 (en) * | 2003-03-31 | 2007-06-26 | Intest Corporation | Test head positioning system and method |
CN101488371B (zh) * | 2009-03-04 | 2010-12-29 | 上海微电子装备有限公司 | 六自由度精密定位平台 |
TW201121696A (en) * | 2009-12-25 | 2011-07-01 | Metal Ind Res & Dev Ct | Ultra-precision piezoelectric positioning platform |
CN102059589B (zh) * | 2010-10-21 | 2013-04-17 | 大连理工大学 | 激光位移传感器倾斜角误差的检测装置及方法 |
TW201321742A (zh) * | 2011-11-30 | 2013-06-01 | Chiuan Yan Technology Co Ltd | 光學系統 |
TW201328832A (zh) * | 2012-01-13 | 2013-07-16 | Chiuan Yan Technology Co Ltd | 手動微調偏擺平台裝置 |
-
2013
- 2013-08-26 TW TW102130470A patent/TW201508294A/zh not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI694611B (zh) * | 2019-05-01 | 2020-05-21 | 蔡東猛 | 微型發光二極體和影像感測元件測試和修復流程 |
Also Published As
Publication number | Publication date |
---|---|
TWI470250B (enrdf_load_stackoverflow) | 2015-01-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI490478B (zh) | 基板檢驗裝置 | |
CN104515914A (zh) | 床台式光学元件对位与导电性的检测机构及检测方法 | |
CN107478871A (zh) | 一种用于柔性oled面板和fpc的自动对位点灯设备 | |
KR102072061B1 (ko) | 기판벤딩장치, 기판벤딩검사장치 및 이를 이용한 기판벤딩검사방법 | |
JP2018029172A (ja) | 圧着装置 | |
CN113013067A (zh) | 一种兼具检测及修补芯片的转移方法 | |
CN113161273A (zh) | 位置偏离检测方法及装置、位置异常判定及搬送控制方法 | |
JP5062204B2 (ja) | 部品実装基板の検査方法と装置及び部品実装装置 | |
KR102058364B1 (ko) | 기판 본딩 접합장치 | |
KR101354690B1 (ko) | 터치스크린 패널의 조립장치에 적용되는 패널 이송장치 | |
TW201508294A (zh) | 床台式光學元件對位與導電性之檢測機構 | |
CN202793746U (zh) | Led光棒量测机具 | |
JPH0794561A (ja) | プローブ装置 | |
TWI603410B (zh) | 用於重組晶圓之測試系統及其方法 | |
KR20130046878A (ko) | 액정표시패널의 양면 검사장치 | |
KR101219285B1 (ko) | 기판 검사방법 및 장치 | |
KR101194190B1 (ko) | 카메라 모듈 제조용 본딩 장치 | |
CN218447851U (zh) | 一种晶圆的搬运装置 | |
JP7496506B2 (ja) | 部品圧着装置および部品圧着方法 | |
CN103730385B (zh) | 图像传感器的晶圆级测试系统及方法 | |
JP4383255B2 (ja) | 電子部品実装方法および装置 | |
KR100553816B1 (ko) | 칩온글래스 본딩장치 | |
CN111687788B (zh) | 用于组装光学装置的设备 | |
CN220819861U (zh) | 一种芯片自动检查结构 | |
JP7595264B2 (ja) | 部品圧着装置および部品圧着方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |