TW201336608A - Laser processing device and laser processing method - Google Patents

Laser processing device and laser processing method Download PDF

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Publication number
TW201336608A
TW201336608A TW102104567A TW102104567A TW201336608A TW 201336608 A TW201336608 A TW 201336608A TW 102104567 A TW102104567 A TW 102104567A TW 102104567 A TW102104567 A TW 102104567A TW 201336608 A TW201336608 A TW 201336608A
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Taiwan
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laser
laser processing
region
processing
image
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TW102104567A
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Chinese (zh)
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Yasuyuki Okudaira
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Sumitomo Heavy Industries
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/02Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
    • B23K26/03Observing, e.g. monitoring, the workpiece
    • B23K26/032Observing, e.g. monitoring, the workpiece using optical means
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/08Devices involving relative movement between laser beam and workpiece
    • B23K26/083Devices involving movement of the workpiece in at least one axial direction
    • B23K26/0853Devices involving movement of the workpiece in at least in two axial directions, e.g. in a plane
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00Working by laser beam, e.g. welding, cutting or boring
    • B23K26/36Removing material
    • B23K26/38Removing material by boring or cutting
    • B23K26/382Removing material by boring or cutting by boring
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K37/00Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups
    • B23K37/04Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups for holding or positioning work
    • B23K37/0408Auxiliary devices or processes, not specially adapted to a procedure covered by only one of the preceding main groups for holding or positioning work for planar work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • B23K2101/42Printed circuits

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mechanical Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Laser Beam Processing (AREA)

Abstract

The present invention provides a laser processing device that can be used to shorten the time required for the determination of whether there is a poor processing. A laser beam emitting from a laser light source is incident to a processed object through a beam scanner, and the incident point of the laser beam is moved in the scanning range. A camera device photographs a portion of a surface area of the processed object to obtain image data. A control device controls an object stage and makes a first region of the processed object move in the scanning range for controlling the beam scanner to allow the laser beam to be incident to the first region for laser processing. During the laser processing in the first region, the camera device is controlled in order to get the image data of a second region, which is different from the first region and has already completed laser processing, on the surface of the processed object.

Description

雷射加工裝置及雷射加工方法 Laser processing device and laser processing method

本發明係有關一種將雷射光束依次向加工對象物上的複數個加工點入射而進行雷射加工之雷射加工裝置及雷射加工方法。 The present invention relates to a laser processing apparatus and a laser processing method for performing laser processing by sequentially projecting a laser beam onto a plurality of processing points on an object to be processed.

已知使脉衝雷射光束向印製基板等加工對象物入射而進行鑽孔加工之技術。通常,脉衝雷射光束的脉衝能有偏差,有時產生小於平均值之脉衝能的雷射脉衝。若產生小於鑽孔加工所需要之脉衝能的下限值之脉衝能的雷射脉衝,則會產生加工不良。 A technique in which a pulsed laser beam is incident on a processing object such as a printed board and is drilled is known. Typically, the pulse of a pulsed laser beam can be biased, sometimes producing a laser pulse that is less than the average pulse energy. If a laser pulse having a pulse energy lower than the lower limit of the pulse energy required for the drilling process is generated, a machining failure occurs.

專利文獻1中公開之方法中,使雷射光束向基板入射而進行鑽孔加工之後,藉由以CCD照相機拍攝施加鑽孔加工之位置來確認孔是否形成於所希望的位置。另外,在藉由觀測用雷射光束對加工部位附近進行掃描之同時使基板向上下方向移動,藉此確認所形成之孔的截面形狀。 In the method disclosed in Patent Document 1, after the laser beam is incident on the substrate and drilled, the position of the drilling process is photographed by a CCD camera to confirm whether or not the hole is formed at a desired position. Further, the cross-sectional shape of the formed hole is confirmed by moving the substrate in the vertical direction while scanning the vicinity of the processed portion by the observation laser beam.

專利文獻2中公開之方法中,當在基板上雷射光束經由掃描鏡入射時,藉由以拍攝裝置接收經由掃描鏡向相反方向傳播之光來獲取加工部的圖像。藉由對所獲取之圖像進行解析來判定鑽孔加工是否結束。 In the method disclosed in Patent Document 2, when a laser beam is incident on a substrate via a scanning mirror, an image of the processed portion is acquired by receiving, by the imaging device, light propagating in the opposite direction via the scanning mirror. Whether or not the drilling process is finished is determined by analyzing the acquired image.

專利文獻1:日本特開2001-121279號公報 Patent Document 1: Japanese Laid-Open Patent Publication No. 2001-121279

專利文獻2:日本特開2004-223553號公報 Patent Document 2: Japanese Laid-Open Patent Publication No. 2004-223553

進行鑽孔加工之後,藉由雷射光束的掃描及基板的上下移動確認孔的截面形狀之方法中,需要較長時間來確認。在雷射光束入射時,獲取加工部的圖像之方法中,因無法排除使用於加工之雷射光束的影響,所以難以高精度地觀測孔形狀。 After the drilling process, it is necessary to confirm the cross-sectional shape of the hole by the scanning of the laser beam and the vertical movement of the substrate. In the method of acquiring an image of a processed portion when a laser beam is incident, since the influence of the laser beam used for processing cannot be excluded, it is difficult to observe the shape of the hole with high precision.

本發明的目的在於提供一種能夠實現縮短用於判定有無加工不良的所需時間之雷射加工裝置及雷射加工方法。 An object of the present invention is to provide a laser processing apparatus and a laser processing method capable of shortening a required time for determining the presence or absence of a machining failure.

依本發明的一觀點,提供如下雷射加工裝置,其具有:載物台,保持加工對象物並使前述加工對象物向平行於其表面之方向移動;雷射光源;射束掃描儀,使從前述雷射光源射出之雷射光束向前述加工對象物入射,並且使雷射光束的入射點在可掃描範圍內移動;拍攝裝置,對前述加工對象物表面的一部份區域進行拍攝來獲取圖像資料;及控制裝置,控制前述載物台、前述雷射光源、前述射束掃描儀、及前述拍攝裝置;前述控制裝置控制前述載物台而使前述加工對象物的第1區域在前述可掃描範圍內移動,控制前述射束掃描儀並使雷射光束向前述第1區域 內入射而進行雷射加工,在進行前述第1區域內的雷射加工期間,控制前述拍攝裝置,獲取在前述加工對象物表面上與前述第1區域不同已結束雷射加工之第2區域的圖像資料。 According to one aspect of the present invention, there is provided a laser processing apparatus comprising: a stage for holding an object to be processed and moving the object to be processed in a direction parallel to a surface thereof; a laser source; a beam scanner a laser beam emitted from the laser light source is incident on the object to be processed, and an incident point of the laser beam is moved within a scannable range; and an imaging device captures a part of a surface of the object to be imaged And a control device that controls the stage, the laser light source, the beam scanner, and the imaging device; the control device controls the stage to cause the first region of the object to be processed Moving within the scan range, controlling the aforementioned beam scanner and directing the laser beam to the aforementioned first region Laser processing is performed by internal incidence, and during the laser processing in the first region, the imaging device is controlled to acquire a second region in which the laser processing is completed different from the first region on the surface of the object to be processed. Image data.

依本發明的另一種觀點,提供如下雷射加工方法,其具有:使雷射光束向加工對象物的第1區域內的複數個加工點入射而進行雷射加工之製程;在前述第1區域中,進行雷射加工期間,獲取已結束雷射加工之第2區域的圖像之製程;對前述第2區域的圖像進行解析,並檢測加工不良部位之製程。 According to another aspect of the present invention, there is provided a laser processing method comprising: a process of performing laser processing by causing a laser beam to be incident on a plurality of processing points in a first region of an object to be processed; and in the first region In the laser processing, a process of completing the image of the second region of the laser processing is performed, and an image of the second region is analyzed to detect a process of the defective portion.

對加工對象物之加工與已加工區域的拍攝同時進行,因此能夠縮短用於加工及拍攝之所需時間。 The processing of the object to be processed is simultaneously performed with the shooting of the processed area, so that the time required for processing and shooting can be shortened.

10‧‧‧載物台 10‧‧‧stage

11‧‧‧移動機構 11‧‧‧Mobile agencies

12‧‧‧加工對象物 12‧‧‧Processing objects

13‧‧‧基台 13‧‧‧Abutment

15‧‧‧控制裝置 15‧‧‧Control device

16‧‧‧雷射光源 16‧‧‧Laser light source

17‧‧‧光束整形光學系統 17‧‧‧ Beam shaping optical system

18‧‧‧折射鏡 18‧‧‧Reflective mirror

19‧‧‧射束掃描儀 19‧‧‧beam scanner

20‧‧‧f θ透鏡 20‧‧‧f θ lens

21‧‧‧可掃描範圍 21‧‧‧ scanable range

25‧‧‧拍攝裝置 25‧‧‧Photographing device

26‧‧‧升降機構 26‧‧‧ Lifting mechanism

27‧‧‧視野 27‧‧ Sight

28‧‧‧輸入裝置 28‧‧‧ Input device

29‧‧‧顯示裝置 29‧‧‧Display device

30‧‧‧掃描區 30‧‧‧Scanning area

31‧‧‧孔 31‧‧‧ hole

35‧‧‧基板 35‧‧‧Substrate

36‧‧‧內層銅圖案 36‧‧‧ Inner copper pattern

37‧‧‧樹脂膜 37‧‧‧ resin film

38‧‧‧表層銅膜 38‧‧‧Surface copper film

41‧‧‧y方向直線導引件 41‧‧‧y direction linear guide

42‧‧‧x方向直線導引件 42‧‧‧x direction linear guide

43‧‧‧拍攝裝置機構 43‧‧‧Photographing mechanism

45‧‧‧孔開口部的圖像 45‧‧‧Image of the opening of the hole

46‧‧‧孔底面的圖像 46‧‧‧Image of the bottom of the hole

50‧‧‧輸入按鈕 50‧‧‧ input button

第1圖係實施例之雷射加工裝置的概要圖。 Fig. 1 is a schematic view showing a laser processing apparatus of an embodiment.

第2圖係加工對象物的俯視圖。 Fig. 2 is a plan view of the object to be processed.

第3圖係顯示拍攝裝置、升降裝置、及加工對象物的相對位置關係之概要圖。 Fig. 3 is a schematic view showing the relative positional relationship between the imaging device, the lifting device, and the object to be processed.

第4圖A及第4圖B是顯示射束掃描儀與拍攝裝置的平面位置關係之概要圖。 4A and 4B are schematic views showing the positional relationship between the beam scanner and the imaging device.

第5圖係加工對象物的俯視圖。 Fig. 5 is a plan view of the object to be processed.

第6圖A係顯示劃分於加工對象物之掃描區的序列號 之圖,第6圖B係以實施例之方法進行加工時的掃描區的加工與拍攝的時序圖,第6圖C係基於比較例之方法進行加工時的掃描區的加工與拍攝的時序圖。 Fig. 6A shows the serial number of the scanning area divided by the object to be processed Fig. 6B is a timing chart of processing and photographing of the scanning area when processing is performed by the method of the embodiment, and Fig. 6C is a timing chart of processing and photographing of the scanning area when processing is performed based on the method of the comparative example. .

第7圖係實施例之雷射加工方法的流程圖。 Figure 7 is a flow chart of a laser processing method of an embodiment.

第8圖係顯示於顯示裝置之圖像及輸入裝置的概要圖。 Fig. 8 is a schematic view showing an image and an input device of the display device.

第1圖中示出實施例之雷射加工裝置的概要圖。在載物台10的保持面保持有印製基板等的加工對象物12。移動機構11安裝於基台13。移動機構11從控制裝置15受到控制,使載物台10向平行於加工對象物12的表面之方向移動。例如,移動機構11支撐於基台13,以便載物台10的保持面及加工對象物12的表面成為水平。定義如下xyz正交座標系,將與保持面平行且相互正交之2方向設為x方向及y方向,且將保持面的法線方向設為z方向。 Fig. 1 is a schematic view showing a laser processing apparatus of an embodiment. An object 12 to be processed such as a printed board is held on the holding surface of the stage 10. The moving mechanism 11 is mounted on the base 13. The moving mechanism 11 is controlled from the control device 15 to move the stage 10 in a direction parallel to the surface of the object 12 to be processed. For example, the moving mechanism 11 is supported by the base 13 so that the holding surface of the stage 10 and the surface of the object 12 are horizontal. The xyz orthogonal coordinate system is defined as follows. The two directions parallel to the holding surface and orthogonal to each other are defined as the x direction and the y direction, and the normal direction of the holding surface is defined as the z direction.

雷射光源16射出脉衝雷射光束。作為雷射光源16使用二氧化碳雷射,YAG雷射等。從雷射光源16射出之雷射光束藉由光束整形光學系統17對光束截面進行整形而被校準。被校準之雷射光束經由折射鏡18、射束掃描儀19、及f θ透鏡20向加工對象物12入射。 The laser source 16 emits a pulsed laser beam. As the laser light source 16, a carbon dioxide laser, a YAG laser or the like is used. The laser beam emitted from the laser source 16 is calibrated by shaping the beam section by the beam shaping optical system 17. The calibrated laser beam is incident on the object 12 via the refracting mirror 18, the beam scanner 19, and the f θ lens 20.

f θ透鏡20使光束整形光學系統17內的遮罩位置的光束截面形狀成像於加工對象物12的表面。射束掃描儀19從控制裝置15受到控制,在加工對象物12的表面上 使雷射光束的入射點向x方向及y方向移動。將雷射光束的入射點的可移動範圍稱為“可掃描範圍”21。射束掃描儀19例如由x用電流掃描儀及y用電流掃描儀構成。 The f θ lens 20 images the beam cross-sectional shape of the mask position in the beam shaping optical system 17 on the surface of the object 12 to be processed. The beam scanner 19 is controlled from the control device 15 on the surface of the object 12 to be processed. The incident point of the laser beam is moved in the x direction and the y direction. The movable range of the incident point of the laser beam is referred to as a "scannable range" 21. The beam scanner 19 is composed of, for example, a current scanner for x and a current scanner for y.

拍攝裝置25配置於載物台10的上方。升降機構26從控制裝置15受到控制,使拍攝裝置25向z方向移動。拍攝裝置25對加工對象物12的表面的一部份區域進行拍攝來獲取圖像資料。所獲取之圖像資料輸入到控制裝置15。拍攝裝置25中例如使用2維CCD照相機。另外,作為拍攝裝置25也可使用線感測器。使用線感測器時,使加工對象物12一邊向與線感測器的線方向正交之方向移動,一邊獲取複數個1維圖像。能夠組裝複數個1維圖像來獲得2維圖像。 The imaging device 25 is disposed above the stage 10 . The elevating mechanism 26 is controlled from the control device 15 to move the imaging device 25 in the z direction. The imaging device 25 captures a part of the surface of the object 12 to acquire image data. The acquired image data is input to the control device 15. For example, a two-dimensional CCD camera is used in the imaging device 25. Further, as the imaging device 25, a line sensor can also be used. When the line sensor is used, a plurality of one-dimensional images are acquired while moving the object 12 in a direction orthogonal to the line direction of the line sensor. A plurality of 1-dimensional images can be assembled to obtain a 2-dimensional image.

操作員對輸入裝置28進行掃描來向控制裝置15賦予各種指令(命令)。輸入裝置28中,例如使用鍵盤、定位設備等。控制裝置15將圖像等顯示於顯示裝置29。顯示裝置29中,例如使用液晶顯示器等。 The operator scans the input device 28 to give various commands (commands) to the control device 15. In the input device 28, for example, a keyboard, a pointing device, or the like is used. The control device 15 displays an image or the like on the display device 29. In the display device 29, for example, a liquid crystal display or the like is used.

第2圖中示出加工對象物12的俯視圖。在加工對象物12的表面確定待形成孔之位置(加工點)。加工點的位置記憶於控制裝置15(第1圖)。並且,加工對象物12的表面區隔為複數個掃描區30。1個掃描區30具有內含於射束掃描儀19及f θ透鏡20(第1圖)的可掃描範圍21之大小。對移動機構11進行控制來使未處理的掃描區30在可掃描範圍21內移動,從而能夠在其掃描區30內的任意加工點上照射雷射光束。使複數個掃描區30依 次在可掃描範圍21內移動,從而能夠在所有掃描區30內的加工點上進行鑽孔加工。本說明書中,有時將在掃描區30內的加工點上進行鑽孔加工之處理稱為“掃描區的加工”。 FIG. 2 is a plan view of the object 12 to be processed. The position (machining point) at which the hole is to be formed is determined on the surface of the object 12. The position of the machining point is stored in the control device 15 (Fig. 1). Further, the surface of the object 12 is divided into a plurality of scanning regions 30. The one scanning region 30 has a scanable range 21 which is included in the beam scanner 19 and the f θ lens 20 (Fig. 1). The moving mechanism 11 is controlled to move the unprocessed scanning zone 30 within the scannable range 21 so that the laser beam can be illuminated at any of the processing points within its scanning zone 30. Making a plurality of scanning areas 30 The movement is moved within the scannable range 21 so that drilling can be performed at the machining points in all of the scanning zones 30. In the present specification, the process of performing drilling processing at a processing point in the scanning zone 30 is sometimes referred to as "processing of a scanning zone".

第2圖中示出了定義成x方向為行方向,y方向為列方向時,掃描區30以4行4列的行列狀配置之例,但是掃描區30的個數及配置依賴於加工對象物12的大小及可掃描範圍21的大小。第2圖中,結束從y方向負側端2行量的所有掃描區30的加工,對於從y方向的負側端第3行的行,示出了從x方向的負側端2個量的掃描區30的加工完成狀態。在加工結束之掃描區30內,形成複數個孔31。 2 shows an example in which the x direction is the row direction and the y direction is the column direction, and the scanning area 30 is arranged in a matrix of 4 rows and 4 columns, but the number and arrangement of the scanning regions 30 depend on the processing target. The size of the object 12 and the size of the scannable range 21. In Fig. 2, the processing of all the scanning regions 30 from the negative side end of the y direction is completed, and for the row of the third row from the negative side in the y direction, two amounts from the negative side of the x direction are shown. The processing completion state of the scanning area 30. In the scanning area 30 where the processing is completed, a plurality of holes 31 are formed.

拍攝裝置25(第1圖)的視野27係內含有1個掃描區30之大小。例如,視野27內含與配置於可掃描範圍21內之掃描區30鄰接之加工劑的掃描區30。控制裝置15對加工劑的掃描區30的圖像資料進行解析,從而能夠判定鑽孔加工的好壞。 The field of view 27 of the imaging device 25 (Fig. 1) contains the size of one scanning zone 30. For example, the field of view 27 contains a scanning zone 30 of processing agent adjacent to the scanning zone 30 disposed within the scannable range 21. The control device 15 analyzes the image data of the scanning area 30 of the processing agent, thereby being able to determine the quality of the drilling process.

控制裝置15記憶定義於拍攝裝置25的視野27內之座標與定義於可掃描範圍21內之座標之相對位置關係。因此,能夠將藉由對圖像資料進行解析而獲得之加工不良部位與可掃描範圍21內的加工點1:1地對應關聯。 The control device 15 memorizes the relative positional relationship between the coordinates defined in the field of view 27 of the imaging device 25 and the coordinates defined within the scannable range 21. Therefore, the defective portion obtained by analyzing the image data can be associated with the processing point in the scannable range 21 1:1.

第3圖中示出加工對象物12、拍攝裝置25、及升降機構26的相對位置關係。在第3圖的下半部份示出加工對象物12的截面圖。由玻璃環氧樹脂構成之基板35上形 成有內層銅圖案36。在銅圖案36及基板35上形成有樹脂膜37。在樹脂膜37上形成有表層的銅膜38。形成有從銅膜38的表面到達至內層銅圖案36之複數個孔(凹部)31。將從拍攝裝置25到聚焦面的距離設為F0。 The relative positional relationship between the object 12, the imaging device 25, and the elevating mechanism 26 is shown in Fig. 3 . A cross-sectional view of the object 12 is shown in the lower half of Fig. 3. The substrate 35 made of glass epoxy is shaped An inner layer copper pattern 36 is formed. A resin film 37 is formed on the copper pattern 36 and the substrate 35. A surface copper film 38 is formed on the resin film 37. A plurality of holes (recesses) 31 are formed from the surface of the copper film 38 to the inner layer copper pattern 36. The distance from the imaging device 25 to the focus surface is set to F0.

若升降機構26使拍攝裝置25升降,則從加工對象物12到拍攝裝置25為止的高度產生變化。在孔31的深度(從底面到開口部的高度)比拍攝裝置25的緊深深時,無法與孔31的底面及開口部兩方同時對焦。第3圖中,在拍攝裝置25配置於以實線顯示之位置時,拍攝裝置25的聚焦面FSt與孔31的開口部一致。在使拍攝裝置25下降而配置於以虛線顯示之位置時,拍攝裝置25的聚焦面FSb與孔31的底面一致。如此,能夠藉由使拍攝裝置25升降來獲取與孔31的開口部對焦之圖像及與孔31的底面對焦之圖像。 When the elevating mechanism 26 raises and lowers the imaging device 25, the height from the object 12 to the imaging device 25 changes. When the depth of the hole 31 (the height from the bottom surface to the opening portion) is deeper than that of the imaging device 25, it is impossible to simultaneously focus on both the bottom surface and the opening portion of the hole 31. In the third drawing, when the imaging device 25 is placed at a position displayed by a solid line, the focal plane FSt of the imaging device 25 coincides with the opening of the hole 31. When the imaging device 25 is lowered and placed at a position shown by a broken line, the focal plane FSb of the imaging device 25 coincides with the bottom surface of the hole 31. In this manner, an image in which the opening of the hole 31 is focused and an image in which the bottom surface of the hole 31 is focused can be obtained by moving the imaging device 25 up and down.

第4圖A中示出射束掃描儀19與拍攝裝置25的平面位置關係。射束掃描儀19相對於基台13(第1圖)固定。拍攝裝置25藉由拍攝裝置移動機構43,能夠相對於射束掃描儀19向x方向及y方向移動。 The positional relationship between the beam scanner 19 and the imaging device 25 is shown in Fig. 4A. The beam scanner 19 is fixed relative to the base 13 (Fig. 1). The imaging device 25 can be moved in the x direction and the y direction with respect to the beam scanner 19 by the imaging device moving mechanism 43.

拍攝裝置移動機構43包括y方向直線導引件41及x方向直線導引件42。y方向直線導引件41固定於基台13。x方向直線導引件42支撐於y方向直線導引件41,向y方向移動。拍攝裝置25支撐於x方向直線導引件42,向x方向移動。第4圖A示出拍攝裝置25相對於射束掃描儀19配置於x方向的負側之狀態。相反,可將拍 攝裝置25相對於射束掃描儀19配置於x方向的正側。第4圖B顯示拍攝裝置25相對於射束掃描儀19配置於y方向的負側之狀態。 The imaging device moving mechanism 43 includes a y-direction linear guide 41 and an x-direction linear guide 42. The y-direction linear guide 41 is fixed to the base 13. The x-direction linear guide 42 is supported by the y-direction linear guide 41 and moves in the y direction. The imaging device 25 is supported by the linear guide 42 in the x direction and moves in the x direction. FIG. 4A shows a state in which the imaging device 25 is disposed on the negative side in the x direction with respect to the beam scanner 19. Instead, you can shoot The camera 25 is disposed on the positive side in the x direction with respect to the beam scanner 19. 4B shows a state in which the imaging device 25 is disposed on the negative side in the y direction with respect to the beam scanner 19.

第5圖中示出掃描區30的加工順序的一例。在第5圖中所示之例子中,如以箭頭所示,首先,朝向x方向的正方向依次進行掃描區30的加工。若x方向的正側端的掃描區30的加工結束,則使可掃描範圍21朝向y方向的正方向移動掃描區1個量。接著,朝向x方向的負方向依次進行掃描區30的加工。若x方向的負側端的掃描區30的加工結束,則使可掃描範圍21朝向y方向的正方向移動掃描區1個量。藉由反覆此步驟來進行所有掃描區30的加工。 An example of the processing order of the scanning area 30 is shown in FIG. In the example shown in Fig. 5, as indicated by the arrows, first, the processing of the scanning region 30 is sequentially performed in the positive direction of the x direction. When the processing of the scanning area 30 at the positive side end in the x direction is completed, the scanable range 21 is moved by one amount in the scanning direction toward the positive direction of the y direction. Next, the processing of the scanning region 30 is sequentially performed in the negative direction of the x direction. When the processing of the scanning area 30 at the negative side end in the x direction is completed, the scanable range 21 is moved by one amount in the scanning direction toward the positive direction of the y direction. Processing of all of the scanning zones 30 is performed by repeating this step.

在朝向x方向的正方向依次進行掃描區30的加工期間,如第4圖A所示,將拍攝裝置25相對於射束掃描儀19配置於x方向的負側。在朝向x方向的負方向依次進行掃描區30的加工期間,將拍攝裝置25相對於射束掃描儀19配置於x方向的正側。使可掃描範圍21朝向y方向的正向移動掃描區1個量時,如第4圖B所示,將拍攝裝置25相對於射束掃描儀19配置於y方向的負側。將拍攝裝置25相對於射束掃描儀19如上述配置,從而在進行掃描區30的加工的同時,能夠拍攝已結束加工之掃描區30。 While the processing of the scanning zone 30 is sequentially performed in the positive direction of the x direction, as shown in FIG. 4A, the imaging device 25 is placed on the negative side in the x direction with respect to the beam scanner 19. During the processing of the scanning zone 30 in the negative direction of the x direction, the imaging device 25 is placed on the positive side in the x direction with respect to the beam scanner 19. When the scanning range 21 is moved in the positive direction of the y direction by one amount, as shown in FIG. 4B, the imaging device 25 is placed on the negative side in the y direction with respect to the beam scanner 19. The photographing device 25 is disposed as described above with respect to the beam scanner 19, so that the scanning region 30 having finished processing can be photographed while the processing of the scanning region 30 is performed.

第2圖及第5圖示出視野27大於掃描區30之情況。視野27小於掃描區30時,在掃描區30的加工時,改變 拍攝裝置25的x方向及y方向的位置而進行多次拍攝,從而可獲取形成於1個掃描區30內之所有孔31的圖像資料。 2 and 5 show the case where the field of view 27 is larger than the scanning area 30. When the field of view 27 is smaller than the scanning area 30, the processing is changed during the processing of the scanning area 30. The image of the imaging device 25 in the x direction and the y direction is imaged a plurality of times, and image data of all the holes 31 formed in one scanning area 30 can be acquired.

參閱第6圖A及第6圖B,對掃描區30的加工順序及拍攝裝置25之拍攝順序進行說明。 The processing sequence of the scanning area 30 and the imaging sequence of the imaging device 25 will be described with reference to FIGS. 6A and 6B.

第6圖A示出掃描區30與對其附加序列號的關係。若將y方向的負側端的行設為第1行,則第奇數個行中朝向x方向的正向依升序附上序列號。x方向的正側端中,與y方向的正側鄰接之掃描區30附上其次的序列號。在第偶數個行中朝向x方向的負方向依升序附上序列號。x方向的負側端中,與y方向的正側鄰接的掃描區30附上其次的序列號。 Fig. 6A shows the relationship of the scanning area 30 to its attached serial number. If the row of the negative side end in the y direction is set to the first row, the sequence number is attached to the forward direction toward the x direction in the odd number of rows. In the positive side end of the x direction, the scanning area 30 adjacent to the positive side in the y direction is attached with the next serial number. In the even number of rows, the serial number is attached in ascending order in the negative direction toward the x direction. Among the negative side ends in the x direction, the scanning area 30 adjacent to the positive side in the y direction is attached with the next serial number.

在第6圖B中示出同時執行雷射加工與拍攝時之時序圖。橫軸顯示經過時間。在進行第i個掃描區(第1區域)30的雷射加工期間,同時進行已經結束加工之第(i-1)個掃描區(第2區域)30的拍攝。在加工第1個掃描區30期間無法進行拍攝。序列號最大之第N個掃描區30的加工結束之後,進行第N個掃描區30的拍攝。若將1個掃描區30的加工所需之時間設為Tm,將1個掃描區30的拍攝所需之時間設為Ti,則為了進行N個掃描區30的加工及拍攝所需之時間大致與Tm×N+Ti相等。另外,其中不考慮加工對象物12的移動時間。 A timing chart when laser processing and photographing are simultaneously performed is shown in Fig. 6B. The horizontal axis shows the elapsed time. During the laser processing of the i-th scanning area (first area) 30, the imaging of the (i-1)th scanning area (second area) 30 in which processing has been completed is simultaneously performed. Shooting is not possible during the processing of the first scanning zone 30. After the processing of the Nth scan area 30 having the largest serial number is completed, the photographing of the Nth scan area 30 is performed. If the time required for processing one scanning zone 30 is Tm and the time required for imaging of one scanning zone 30 is Ti, the time required for processing and shooting of the N scanning zones 30 is roughly It is equal to Tm×N+Ti. In addition, the moving time of the object 12 is not considered.

第6圖C中示出以比較例之方法進行加工及拍攝時之時序圖。比較例中,所有掃描區30的加工結束之後,進 行各掃描區30的拍攝。該方法中,為了進行N個掃描區30的加工及拍攝所需之時間大致與Tm×N+Ti×N相等。 Fig. 6C shows a timing chart when processing and photographing are carried out by the method of the comparative example. In the comparative example, after the processing of all the scanning areas 30 is completed, The shooting of each scanning area 30 is performed. In this method, the time required for processing and photographing the N scanning regions 30 is approximately equal to Tm × N + Ti × N.

如實施例,同時執行加工及拍攝,從而能夠縮短加工及拍攝所需時間。 As in the embodiment, processing and photographing are simultaneously performed, so that the time required for processing and photographing can be shortened.

第7圖中示出實施例之雷射加工方法的流程圖。步驟S1中,如第6圖B所示,同時進行掃描區30的加工及拍攝。步驟S2中,控制裝置15(第1圖)自動解析藉由拍攝裝置25獲取之圖像,檢測加工不良的部位。加工的好壞藉由判定例如第3圖所示之孔31的開口部的直徑與底面的直徑是否分別在容許範圍內來進行。 A flow chart of the laser processing method of the embodiment is shown in FIG. In step S1, as shown in Fig. 6B, processing and photographing of the scanning area 30 are simultaneously performed. In step S2, the control device 15 (first drawing) automatically analyzes the image acquired by the imaging device 25, and detects a defective portion. The quality of the processing is determined by determining whether, for example, the diameter of the opening of the hole 31 and the diameter of the bottom surface shown in Fig. 3 are within an allowable range.

步驟S3中,控制裝置15將判定為加工不良之部位的圖像顯示於顯示裝置29(第1圖)。 In step S3, the control device 15 displays an image of the portion determined to be defective in processing on the display device 29 (first drawing).

第8圖中示出顯示於顯示裝置29之圖像的一例。在顯示畫面上顯示有孔31的開口部圖像45及底面的圖像46。另外,“需要矯正”及“不需要矯正”的輸入按鈕也顯示於同一圖面內。 An example of an image displayed on the display device 29 is shown in FIG. An opening image 45 of the hole 31 and an image 46 of the bottom surface are displayed on the display screen. In addition, the "need to correct" and "do not need to correct" input buttons are also displayed in the same plane.

步驟S4中,操作員觀察所顯示之圖像來判斷是否需要矯正處理。在判斷為需要進行矯正處理時,操作輸入裝置28來向控制裝置15通知需要矯正處理。在判定為不需要進行矯正處理時,操作輸入裝置28來向控制裝置15通知不需要矯正處理。作為一例操作員藉由操作定位設備而選擇圖面上的“需要矯正”或“不需要矯正”的按鈕來通知控制裝置15。 In step S4, the operator observes the displayed image to determine whether or not correction processing is required. When it is determined that the correction processing is necessary, the input device 28 is operated to notify the control device 15 of the need for the correction processing. When it is determined that the correction processing is not required, the input device 28 is operated to notify the control device 15 that the correction processing is not required. As an example, the operator notifies the control device 15 by selecting a button "need to correct" or "no need to correct" on the drawing by operating the positioning device.

在被通知為需要矯正處理時,步驟S5中控制裝置15 將需要矯正處理之加工點的座標記錄於矯正處理表。若記錄結束,步驟S6中,對步驟S2中檢測之所有不良部位判定是否結束了是否需要矯正的判定。步驟S4中,判定為不需要矯正處理時,執行步驟S6,而不執行步驟S5。當未判定的不良部位殘留時,回到步驟S3對未判定的不良部位進行處理。當所有不良部位的判定結束時,步驟S7中進行記錄於矯正處理表上之需要矯正處理之不良部位的矯正處理。例如,矯正處理中,在不良部位上進行追加的雷射照射。 When it is notified that correction processing is required, the control device 15 in step S5 The coordinates of the processing points that need to be corrected are recorded in the correction processing table. When the recording is completed, in step S6, it is determined whether or not the correction is necessary for all the defective portions detected in step S2. In step S4, when it is determined that the correction processing is unnecessary, step S6 is executed without executing step S5. When the undetermined defective portion remains, the process returns to step S3 to process the undetermined defective portion. When the determination of all the defective parts is completed, the correction processing of the defective part to be corrected on the correction processing table is performed in step S7. For example, in the correction process, additional laser irradiation is performed on the defective portion.

實施例中,步驟S1中同時進行掃描區30(第2圖)的加工及拍攝,因此能夠縮短直至矯正處理完成為止的時間。並且,步驟S4中,操作員判斷是否需要進行矯正處理,因此能夠防止在不需要矯正的部位進行追加的雷射照射。 In the embodiment, the processing and imaging of the scanning area 30 (Fig. 2) are simultaneously performed in step S1, so that the time until the correction processing is completed can be shortened. Further, in step S4, the operator determines whether or not the correction processing is necessary. Therefore, it is possible to prevent additional laser irradiation from being performed at a portion where correction is not required.

上述實施例中,對掃描區30(第2圖)內的所有加工點進行了拍攝,但是也可僅拍攝一部份加工點。例如,當拍攝裝置25(第1圖)的視野27(第2圖)小於掃描區30時,對掃描區30內的一部份區域進行拍攝來獲取圖像資料。步驟S2(第7圖)中,解析該圖像資料,僅對包含於圖像資料之加工點自動判定加工的好壞。由該判定結果能夠統計推測所有區域的加工品質。 In the above embodiment, all the processing points in the scanning area 30 (Fig. 2) were photographed, but only a part of the processing points may be photographed. For example, when the field of view 27 (Fig. 2) of the photographing device 25 (Fig. 1) is smaller than the scan area 30, a part of the area in the scan area 30 is photographed to acquire image data. In step S2 (Fig. 7), the image data is analyzed, and the processing is automatically determined only for the processing points included in the image data. From this determination result, it is possible to statistically estimate the processing quality of all the regions.

依以上實施例對本發明進行了說明,但是本發明不限於這些。例如,本領域技術人員自明能夠進行各種變更、改良、組合等。 The present invention has been described based on the above examples, but the present invention is not limited to these. For example, it is obvious to those skilled in the art that various modifications, improvements, combinations, and the like can be made.

30‧‧‧掃描區域 30‧‧‧Scanning area

Claims (9)

一種雷射加工裝置,其特徵為,具有:載物台,保持加工對象物並使前述加工對象物向平行於其表面之方向移動;雷射光源;射束掃描儀,使從前述雷射光源射出之雷射光束向前述加工對象物入射,並且使雷射光束的入射點在可掃描範圍內移動;拍攝裝置,對前述加工對象物表面的一部份區域進行拍攝來獲取圖像資料;及控制裝置,控制前述載物台、前述雷射光源、前述射束掃描儀、及前述拍攝裝置;前述控制裝置控制前述載物台而使前述加工對象物的第1區域在前述可掃描範圍內移動,控制前述射束掃描儀並使雷射光束向前述第1區域內入射而進行雷射加工,在進行前述第1區域內的雷射加工期間,控制前述拍攝裝置,獲取在前述加工對象物表面上與前述第1區域不同已結束雷射加工之第2區域的圖像資料。 A laser processing apparatus comprising: a stage for holding an object to be processed and moving the object to be parallel to a surface thereof; a laser source; a beam scanner for causing a laser source from the laser light source The emitted laser beam is incident on the object to be processed, and the incident point of the laser beam is moved within a scannable range; and the photographing device photographs a part of the surface of the object to obtain image data; a control device that controls the stage, the laser light source, the beam scanner, and the imaging device; and the control device controls the stage to move the first region of the object within the scannable range Controlling the beam scanner and subjecting the laser beam to the first region to perform laser processing, and during the laser processing in the first region, controlling the imaging device to acquire the surface of the object to be processed The image data of the second region of the laser processing has been completed differently from the first region. 如申請專利範圍第1項所述之雷射加工裝置,其中,前述控制裝置具有前述拍攝裝置的視野內的座標與前述可掃描範圍內的座標的相對位置關係情報。 The laser processing apparatus according to claim 1, wherein the control device has information on a relative positional relationship between a coordinate in a field of view of the imaging device and a coordinate in the scannable range. 如申請專利範圍第1或2項所述之雷射加工裝置,其中, 前述拍攝裝置具備使聚焦面在相對於前述加工對象物表面垂直之方向上移動之功能。 A laser processing apparatus according to claim 1 or 2, wherein The imaging device has a function of moving the focus surface in a direction perpendicular to the surface of the object to be processed. 如申請專利範圍第3項所述之雷射加工裝置,其中,藉由前述雷射光束向前述加工對象物入射而在前述加工對象物形成凹部,前述控制裝置在進行前述加工對象物的前述第1區域內的雷射加工期間,將前述拍攝裝置的聚焦面對準形成於前述第2區域之凹部的開口部而獲取第1圖像資料,另外,將前述拍攝裝置的聚焦面對準形成於前述第2區域之凹部的底面來獲取第2圖像資料。 The laser processing apparatus according to claim 3, wherein the laser beam is incident on the object to be processed, and a concave portion is formed in the object to be processed, and the control device performs the processing target During the laser processing in the region, the focal plane of the imaging device is aligned with the opening formed in the concave portion of the second region to acquire the first image data, and the focal plane of the imaging device is aligned with The second image data is acquired on the bottom surface of the concave portion of the second region. 如申請專利範圍第1或2項所述之雷射加工裝置,其中,該裝置進一步具有移動機構,該移動機構使前述拍攝裝置與前述射束掃描儀的其中一方相對於另一方向平行於前述加工對象物表面之方向移動。 The laser processing apparatus of claim 1 or 2, wherein the apparatus further has a moving mechanism that causes one of the imaging device and the beam scanner to be parallel to the other direction The direction of the surface of the object to be processed moves. 如申請專利範圍第1或2項所述之雷射加工裝置,其中,該裝置進一步具有顯示裝置;及用於由操作員輸入指令之輸入裝置,前述控制裝置進行藉由前述拍攝裝置獲取之前述第2區域圖像資料的圖像解析,並檢測加工不良部位,將被檢測之加工不良部位的圖像顯示於前述顯示裝置, 在從操作員透過前述輸入裝置通知需要矯正處理之加工不良部位進行雷射光束的追加照射。 The laser processing apparatus according to claim 1 or 2, wherein the apparatus further comprises a display device; and an input device for inputting an instruction by an operator, wherein the control device performs the aforementioned acquisition by the camera device Image analysis of the second area image data, detecting a defective portion, and displaying an image of the detected defective portion on the display device. The additional irradiation of the laser beam is performed by the operator notifying the defective portion requiring the correction processing through the input device. 一種雷射加工方法,其特徵為,具有如下製程:使雷射光束向加工對象物的第1區域內的複數個加工點入射而進行雷射加工之製程;在前述第1區域中,進行雷射加工期間,獲取已結束雷射加工之第2區域的圖像之製程;對前述第2區域的圖像進行解析,並檢測加工不良部位之製程。 A laser processing method characterized by having a process of performing laser processing by causing a laser beam to be incident on a plurality of processing points in a first region of a workpiece, and performing a laser processing in the first region During the shot processing, a process of ending the image of the second region of the laser processing is performed; the image of the second region is analyzed, and the process of the defective portion is detected. 如申請專利範圍第7項所述之雷射加工方法,其中,在進行前述雷射加工之製程中,藉由雷射光束的入射來形成凹部,獲取前述圖像之製程中,將聚焦面對準前述凹部的開口部來獲取第1圖像,進一步將聚焦面對準前述凹部的底面來獲取第2圖像,檢測前述加工不良部位之製程中,解析前述第1圖像及前述第2圖像。 The laser processing method according to claim 7, wherein in the process of performing the laser processing, a concave portion is formed by incidence of a laser beam, and in the process of acquiring the image, the focus is faced. The first image is acquired by the opening of the concave portion, the second image is obtained by aligning the focal plane with the bottom surface of the concave portion, and the first image and the second image are analyzed during the process of detecting the defective portion. image. 如申請專利範圍第7或8項所述之雷射加工方法,其中,該方法進一步在檢測前述加工不良部位之製程中被檢測出之加工不良部位,進行追加的雷射照射。 The laser processing method according to claim 7 or 8, wherein the method further performs an additional laser irradiation by detecting a defective portion detected in the process of the defective portion.
TW102104567A 2012-03-05 2013-02-06 Laser processing device and laser processing method TW201336608A (en)

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