TW201314741A - Thin-film forming method and thin-film forming apparatus - Google Patents
Thin-film forming method and thin-film forming apparatus Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/005—Curtain coaters
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C9/00—Apparatus or plant for applying liquid or other fluent material to surfaces by means not covered by any preceding group, or in which the means of applying the liquid or other fluent material is not important
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- B05C9/12—Apparatus or plant for applying liquid or other fluent material to surfaces by means not covered by any preceding group, or in which the means of applying the liquid or other fluent material is not important for applying liquid or other fluent material and performing an auxiliary operation the auxiliary operation being performed after the application
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- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/02—Processes for applying liquids or other fluent materials performed by spraying
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/06—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation
- B05D3/061—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by exposure to radiation using U.V.
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- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D7/00—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials
- B05D7/24—Processes, other than flocking, specially adapted for applying liquids or other fluent materials to particular surfaces or for applying particular liquids or other fluent materials for applying particular liquids or other fluent materials
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/101—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by casting or moulding of conductive material
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Abstract
Description
本發明係有關一種朝向基板吐出薄膜材料的液滴且對附著在基板之薄膜材料照射光並使其固化之薄膜形成方法及薄膜形成裝置。 The present invention relates to a film forming method and a film forming apparatus which discharge droplets of a film material toward a substrate and irradiate and cure the film material adhering to the substrate.
在印刷配線板等基板的圖案形成面吐出薄膜材料、例如阻焊抗蝕劑的液滴來形成薄膜之技術備受矚目。一邊使基板相對噴頭移動,一邊依應形成之薄膜圖案的圖像資料使液滴著落於印刷配線板的表面。由此,能夠形成具有所期望的圖案之薄膜。與藉由光刻法形成薄膜圖案時相比,能夠實現縮減製造成本。 A technique of forming a thin film material, for example, a droplet of a solder resist on a pattern forming surface of a substrate such as a printed wiring board, has been attracting attention. While moving the substrate relative to the head, the droplets are placed on the surface of the printed wiring board in accordance with the image data of the formed thin film pattern. Thereby, a film having a desired pattern can be formed. The manufacturing cost can be reduced as compared with when a thin film pattern is formed by photolithography.
專利文獻1:日本特開2004-104104號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2004-104104
若使光固化性(紫外線固化性)液狀薄膜材料的液滴著落於基板上,則液滴欲在基板上向面內方向擴展。由液滴的擴展引起之滲入導致薄膜圖案的位置精確度下降。為了抑制液滴的擴展,著落後迅速地照射光(紫外線)並使其固化為較佳。由此,能夠防止將基板移動到下一工藝區 之期間內液滴擴展。然而,若欲在輸送基板前使基板上的薄膜材料完全固化,則噴頭的閒置時間(不工作的時間)變長,導致裝置整體的吞吐量降低。 When droplets of the photocurable (ultraviolet curable) liquid film material are dropped on the substrate, the droplets are intended to spread in the in-plane direction on the substrate. The penetration caused by the expansion of the droplets causes the positional accuracy of the film pattern to decrease. In order to suppress the expansion of the droplets, it is preferable to rapidly irradiate the light (ultraviolet rays) and cure them. Thereby, it is possible to prevent the substrate from being moved to the next process area The droplets expand during the period. However, if the film material on the substrate is to be completely cured before the substrate is transported, the idle time (time of non-operation) of the head becomes long, resulting in a decrease in the throughput of the entire device.
本發明的目的在於提供一種不導致降低吞吐量就能夠使附著於基板之薄膜材料固化之薄膜形成方法及薄膜形成裝置。 An object of the present invention is to provide a film forming method and a film forming apparatus capable of curing a film material adhering to a substrate without causing a decrease in throughput.
若基於本發明的一個觀點,則提供一種薄膜形成方法,該薄膜形成方法具有:在載物台上保持基板,從噴頭吐出光固化性薄膜材料的液滴,使前述薄膜材料的液滴著落於前述基板的表面之製程;從臨時固化用光源對著落於前述基板之前述薄膜材料照射光,使前述薄膜材料的表層部固化之製程;及著落前述液滴之製程及使前述薄膜材料的表層部固化之製程之後,從前述載物台搬出前述基板之製程。 According to one aspect of the present invention, there is provided a film forming method comprising: holding a substrate on a stage, discharging a droplet of the photocurable film material from the head, and causing the droplet of the film material to land thereon a process for the surface of the substrate; a process for irradiating the film material falling on the substrate with a light source for temporary curing to cure the surface layer portion of the film material; and a process for depositing the droplets and a surface portion of the film material After the curing process, the process of removing the substrate from the stage is performed.
若基於本發明的其他觀點,則提供一種薄膜形成裝置,該薄膜形成裝置具有:噴頭,設置有複數個吐出薄膜材料的液滴之噴嘴孔;載物台,將基板保持在與前述噴頭對置之位置,使前述基板相對於前述噴頭向與基板面平行之方向移動;臨時固化用光源,與保持在前述載物台之基板對置,並對著落於前述基板之前述薄膜材料照射使該薄膜材料的表層部固化之強度的光;輸送裝置,將保持在前述載物台之前述基板輸送至正式固化部;及正式固化用光 源,在前述正式固化部中對前述基板表面上的前述薄膜材料照射比從前述臨時固化用光源放射之光強度更大強度的光。 According to another aspect of the present invention, there is provided a film forming apparatus comprising: a head having a plurality of nozzle holes for discharging droplets of a film material; and a stage for holding the substrate opposite to the head Positioning the substrate so as to move parallel to the substrate surface with respect to the head; the temporary curing light source faces the substrate held on the stage, and irradiates the film material on the substrate The light of the strength of the surface layer of the material is solidified; the conveying device transports the substrate held on the stage to the main curing portion; and the light for the main curing In the source forming unit, the film material on the surface of the substrate is irradiated with light having a strength higher than that of the light source emitted from the temporary curing light source.
能夠藉由分開進行臨時固化和正式固化,與正式固化處理獨立地進行著落薄膜材料的液滴之製程。由此,能夠抑制吞吐量降低。 It is possible to carry out the process of dropping the droplets of the film material independently from the main curing process by performing the temporary curing and the main curing separately. Thereby, it is possible to suppress a decrease in throughput.
第1圖中示出基於實施例1之薄膜形成裝置的概要圖。基於實施例1之薄膜形成裝置劃分為搬入站21、第1對準站22、第1薄膜材料吐出站23、基板反轉站24、第2對準站25、第2薄膜材料吐出站26及搬出站27。各站被收納於筐體20內。 Fig. 1 is a schematic view showing a thin film forming apparatus according to the first embodiment. The film forming apparatus according to the first embodiment is divided into a loading station 21, a first alignment station 22, a first film material discharge station 23, a substrate inversion station 24, a second alignment station 25, and a second film material discharge station 26, and Move out of station 27. Each station is housed in the casing 20.
直線導引件30及4個支撐於直線導引件30之昇降器31~34構成輸送裝置。輸送裝置從前端站向後段站輸送基板40。基板40例如為在兩面形成有配線圖案之印刷配線板。控制裝置50移動昇降器31~34並控制各站。對將基板40的輸送方向設為x軸的正方向、並將鉛垂上方設為z軸的正方向之xyz正交坐標系進行定義。 The linear guide 30 and the four lifters 31 to 34 supported by the linear guide 30 constitute a conveying device. The conveyor transports the substrate 40 from the front end station to the rear station. The substrate 40 is, for example, a printed wiring board in which wiring patterns are formed on both surfaces. The control device 50 moves the lifters 31 to 34 and controls the stations. The xyz orthogonal coordinate system in which the transport direction of the substrate 40 is the positive direction of the x-axis and the vertical upper side is the positive direction of the z-axis is defined.
搬入傳送帶35從筐體20的外部穿過搬入口36向搬入站21內搬入基板40。搬入於搬入站21之基板40藉由 昇降器31被輸送到第1對準站22。在第1對準站22中檢測形成於基板40的上表面的對準標誌,並感測基板40的姿勢及應變。將在輸送到第1對準站22之時刻朝向上方之面稱為“第1面”,朝向下方之面稱為“第2面”。感測出姿勢及應變之基板40藉由昇降器31被輸送到第1薄膜材料吐出站23。 The loading conveyor 35 carries the substrate 40 into the loading station 21 from the outside of the casing 20 through the loading port 36. The substrate 40 carried in the loading station 21 is The lifter 31 is transported to the first alignment station 22. The alignment mark formed on the upper surface of the substrate 40 is detected in the first alignment station 22, and the posture and strain of the substrate 40 are sensed. The surface facing upward at the time of transport to the first alignment station 22 is referred to as a "first surface", and the surface facing downward is referred to as a "second surface". The substrate 40 that senses the posture and the strain is transported to the first film material discharge station 23 by the lifter 31.
在第1薄膜材料吐出站23中依應形成之薄膜圖案的圖像資料使薄膜材料的液滴著落於基板40的第1面。由此,在基板40的第1面形成由薄膜材料構成之薄膜。形成有薄膜之基板40藉由昇降器32被輸送到反轉站24。 The image material of the thin film pattern formed in the first film material discharge station 23 is caused to land on the first surface of the substrate 40 in accordance with the image data of the thin film pattern formed. Thereby, a film made of a film material is formed on the first surface of the substrate 40. The substrate 40 on which the thin film is formed is transported to the reversing station 24 by the lifter 32.
在反轉站24中,藉由對形成於基板40的表面之薄膜照射紫外線來使薄膜固化。另外,使基板40的上下反轉。亦即,形成有薄膜之第1面朝向下方,未形成薄膜之第2面朝向上方。 In the inversion station 24, the film is cured by irradiating ultraviolet rays to the film formed on the surface of the substrate 40. Further, the upper and lower sides of the substrate 40 are reversed. That is, the first surface on which the thin film is formed faces downward, and the second surface on which the thin film is not formed faces upward.
上下反轉之基板40藉由昇降器33被輸送到第2對準站25。在第2對準站25中藉由檢測形成於基板40的第2面之對準標誌來感測基板40的姿勢及應變。感測出姿勢及應變之基板40藉由昇降器33被輸送到第2薄膜材料吐出站26。 The substrate 40 that is vertically inverted is transported to the second alignment station 25 by the lifter 33. The posture and strain of the substrate 40 are sensed by detecting the alignment mark formed on the second surface of the substrate 40 in the second alignment station 25. The substrate 40 that senses the posture and strain is transported to the second film material discharge station 26 by the lifter 33.
在第2薄膜材料吐出站26中依應形成之薄膜圖案的圖像資料使薄膜材料的液滴著落於基板40的第2面。由此,在基板40的第2面形成由薄膜材料構成之薄膜。在第2面形成有薄膜之基板40藉由昇降器34被輸送到搬出站27。搬出傳送帶37穿過搬出口38從搬出站27向筐體 20的外部搬出基板40。由搬出傳送帶37輸送基板40的期間,從正式固化用光源51對基板40的第2面照射紫外線。由此,形成於基板40的第2面之薄膜材料的膜被固化。 The image material of the thin film pattern formed in the second film material discharge station 26 is caused to land on the second surface of the substrate 40 in accordance with the image data of the thin film pattern formed. Thereby, a thin film made of a thin film material is formed on the second surface of the substrate 40. The substrate 40 on which the thin film is formed on the second surface is transported to the carry-out station 27 by the lifter 34. The carry-out conveyor 37 passes through the carry-out port 38 from the carry-out station 27 to the casing The outside of the 20 is carried out of the substrate 40. While the substrate 40 is being transported by the carry-out conveyor 37, the second surface of the substrate 40 is irradiated with ultraviolet rays from the main curing light source 51. Thereby, the film of the film material formed on the second surface of the substrate 40 is cured.
第2圖中示出基於實施例1之薄膜形成裝置的第1對準站22、第1薄膜材料吐出站23及反轉站24的俯視圖。昇降器31、昇降器32被引導至直線導引件30而向x方向移動。第1薄膜材料吐出站23內收納有載物台55。載物台55被引導至直線導引件56而向與x方向交叉之方向(y方向)移動。昇降器31保持基板40而移動至第1薄膜材料吐出站23內,使基板40載於載物台55上。載物台55吸附基板40。 Fig. 2 is a plan view showing the first alignment station 22, the first film material discharge station 23, and the reversing station 24 of the thin film forming apparatus of the first embodiment. The lifter 31 and the lifter 32 are guided to the linear guide 30 to move in the x direction. The stage 55 is accommodated in the first film material discharge station 23. The stage 55 is guided to the linear guide 56 to move in a direction (y direction) crossing the x direction. The lifter 31 holds the substrate 40 and moves into the first film material discharge station 23, and the substrate 40 is placed on the stage 55. The stage 55 adsorbs the substrate 40.
載物台55移動之路徑的上方配置有噴頭單元57。噴頭單元57由支撐構件58支撐,載物台55通過噴頭單元57的下方。當載物台55通過噴頭單元57的下部時,依應形成之薄膜圖案的圖像資料從噴頭單元57的複數個噴嘴孔朝向基板40吐出薄膜材料的液滴。 A head unit 57 is disposed above the path on which the stage 55 moves. The head unit 57 is supported by a support member 58 that passes under the head unit 57. When the stage 55 passes through the lower portion of the head unit 57, droplets of the film material are ejected from the plurality of nozzle holes of the head unit 57 toward the substrate 40 in accordance with the image data of the formed film pattern.
昇降器32保持形成有薄膜之基板40,並從第1薄膜材料吐出站23移動至反轉站24。反轉站24內收納有反轉台60及正式固化用光源61。移動至反轉站24內之昇降器32使基板40載於反轉台60上。藉由對基板40的第1面照射從正式固化用光源61放射之紫外線,使形成於基板40之薄膜正式固化。之後,藉由使反轉台60旋轉180°,使基板40的上下反轉。在上下反轉之狀態下,基 板40藉由昇降器33(第1圖)被輸送到第2對準站25(第1圖)。 The lifter 32 holds the substrate 40 on which the thin film is formed, and moves from the first film material discharge station 23 to the reversing station 24. The reversing station 60 and the main curing light source 61 are housed in the reversing station 24. The lifter 32 that has moved into the reversing station 24 causes the substrate 40 to be carried on the reversing table 60. The film formed on the substrate 40 is completely cured by irradiating the first surface of the substrate 40 with ultraviolet rays radiated from the main curing light source 61. Thereafter, the vertical rotation of the substrate 40 is reversed by rotating the reversing table 60 by 180°. In the state of upside down, base The plate 40 is conveyed to the second alignment station 25 (Fig. 1) by the lifter 33 (Fig. 1).
第3圖A中示出沿第2圖的一點虛線3A-3A之截面圖。第3圖B中示出沿第3圖A的一點虛線3B-3B之截面圖。在基台70上透過直線導引件56支撐Y載物台71。Y載物台71能夠引導至直線導引件56而向y方向移動。載物台55能夠向x方向移動地支撐於Y載物台71上。在載物台55的上表面保持基板40。Y載物台71向y方向的移動及載物台55向x方向的移動藉由控制裝置50(第1圖)控制。 A cross-sectional view along the dotted line 3A-3A of Fig. 2 is shown in Fig. 3A. A cross-sectional view taken along the dashed line 3B-3B of Fig. 3A is shown in Fig. 3B. The Y stage 71 is supported on the base 70 by a linear guide 56. The Y stage 71 can be guided to the linear guide 56 to move in the y direction. The stage 55 is supported by the Y stage 71 so as to be movable in the x direction. The substrate 40 is held on the upper surface of the stage 55. The movement of the Y stage 71 in the y direction and the movement of the stage 55 in the x direction are controlled by the control device 50 (Fig. 1).
噴頭單元57藉由支撐構件58支撐在載物台55的上方。噴頭單元57隔著間隙與保持在載物台55之基板40對置。噴嘴昇降機構59使噴頭單元57相對於載物台55昇降。噴嘴昇降機構59由控制裝置50(第1圖)控制。 The head unit 57 is supported above the stage 55 by a support member 58. The head unit 57 faces the substrate 40 held on the stage 55 with a gap therebetween. The nozzle elevating mechanism 59 raises and lowers the head unit 57 with respect to the stage 55. The nozzle elevating mechanism 59 is controlled by a control device 50 (Fig. 1).
第4圖A中示出噴頭單元57的概要立體圖。噴嘴夾具64上組裝有複數個(例如2個)噴頭65。噴頭65上分別配置有複數個向x方向排列之噴嘴孔66。接受來自控制裝置50(第1圖)的控制,從噴嘴孔66吐出紫外線固化性薄膜材料的液滴。向y方向排列有複數個噴頭65。在y方向,在噴頭65各自的兩側配置有臨時固化用光源68。臨時固化用光源68分別包括複數個向x方向排列之發光二極管,對基板40照射紫外線。 A schematic perspective view of the head unit 57 is shown in Fig. 4A. A plurality of (for example, two) heads 65 are assembled to the nozzle holder 64. A plurality of nozzle holes 66 arranged in the x direction are disposed on the head 65, respectively. The control from the control device 50 (Fig. 1) is received, and droplets of the ultraviolet curable thin film material are discharged from the nozzle holes 66. A plurality of heads 65 are arranged in the y direction. In the y direction, a temporary curing light source 68 is disposed on each of both sides of the head 65. The temporary curing light source 68 includes a plurality of light emitting diodes arranged in the x direction, and the substrate 40 is irradiated with ultraviolet rays.
另外,作為薄膜材料,使用藉由紫外域以外的波長域的光固化之光固化性材料即可。此時,臨時固化用光源 68、正式固化用光源51射出包括能夠使薄膜材料固化之波長成份之光。 Further, as the film material, a photocurable material which is cured by light in a wavelength range other than the ultraviolet region may be used. At this time, the temporary curing light source 68. The main curing light source 51 emits light including a wavelength component capable of curing the film material.
第4圖B示出噴頭65及臨時固化用光源68的仰視圖。噴頭65分別包括在x方向上隔開間隔配置之2列噴嘴列67。噴嘴列67分別包括向y方向排列之複數個噴嘴孔66。各噴嘴列67中,以間距2P排列噴嘴孔66。其中一方的噴嘴列67的噴嘴孔66相對於另一方的噴嘴列67的噴嘴孔66向y方向僅偏離P。若著眼於1個噴頭65,則複數個噴嘴孔66在y方向上的間距等於P。間距P例如相當於300dpi的分辨率。 4A shows a bottom view of the head 65 and the temporary curing light source 68. The heads 65 each include two rows of nozzle rows 67 which are arranged at intervals in the x direction. The nozzle rows 67 each include a plurality of nozzle holes 66 arranged in the y direction. In each of the nozzle rows 67, the nozzle holes 66 are arranged at a pitch 2P. The nozzle hole 66 of one of the nozzle rows 67 is offset from the nozzle hole 66 of the other nozzle row 67 by only P in the y direction. If one head 65 is focused, the pitch of the plurality of nozzle holes 66 in the y direction is equal to P. The pitch P corresponds, for example, to a resolution of 300 dpi.
其中一方的噴頭65相對於另一方的噴頭65向y方向僅偏離P/2而組裝於噴嘴夾具64(第4圖A)上。因此,1個噴頭單元57(第4圖A)包括複數個向y方向以間距P/2排列之噴嘴孔66。間距P/2例如相當於600dpi的分辨率。 One of the heads 65 is assembled to the nozzle holder 64 (FIG. 4A) with respect to the other head 65 in the y direction with only a deviation of P/2. Therefore, one head unit 57 (Fig. 4A) includes a plurality of nozzle holes 66 arranged in the y direction at a pitch P/2. The pitch P/2 is equivalent to, for example, a resolution of 600 dpi.
第4圖C中示出複數個噴頭65與基板40的平面位置關係。例如,在噴嘴夾具64上安裝有10個噴頭65。噴頭65以向y方向排列2個、向x方向排列5個之2行5列的行列狀配置。能夠藉由2個向y方向排列之噴頭65使薄膜材料的液滴著落於x方向的寬度W的區域。配置成行列狀之噴頭在x方向上的間距為2W。 The positional relationship between the plurality of heads 65 and the substrate 40 is shown in Fig. 4C. For example, ten nozzles 65 are mounted on the nozzle holder 64. The head 65 is arranged in a matrix in which two rows are arranged in the y direction and five rows and five columns are arranged in the x direction. The droplets of the film material can be landed on the region of the width W in the x direction by the two heads 65 arranged in the y direction. The nozzles arranged in a row and column have a pitch of 2 W in the x direction.
一邊向y方向移動基板40,一邊從2個噴頭65吐出薄膜材料的液滴,由此能夠以x方向的分辨率600dpi著落薄膜材料的液滴。一邊向y方向以每P/8偏離基板 40,一邊進行4次(2個往復)x方向的掃描,由此能夠將x方向的分辨率提高至2400dpi。使基板40向y方向僅移動W,進行同樣的x方向的掃描,由此能夠使薄膜材料的液滴著落於基板40的大致整個區域。關於y方向之分辨率依基板40的y方向的移動速度和吐出薄膜材料的液滴之週期確定。依所形成之薄膜圖案的圖像資料控制每個噴嘴孔66吐出薄膜材料的液滴之定時,由此能夠形成所期望圖案的薄膜。 By moving the substrate 40 in the y direction, droplets of the film material are discharged from the two heads 65, whereby droplets of the film material can be dropped at a resolution of 600 dpi in the x direction. Offset the substrate every P/8 in the y direction 40, the scanning in the x direction is performed four times (two reciprocations), whereby the resolution in the x direction can be improved to 2400 dpi. By moving the substrate 40 only in the y direction and performing the same x-direction scanning, droplets of the thin film material can be landed on substantially the entire area of the substrate 40. The resolution in the y direction is determined in accordance with the moving speed of the substrate 40 in the y direction and the period of the droplets of the discharged film material. The timing of discharging the droplets of the film material by each of the nozzle holes 66 is controlled in accordance with the image data of the formed film pattern, whereby a film of a desired pattern can be formed.
附著於基板40之薄膜材料藉由從臨時固化用光源68放射之紫外線臨時固化,前述臨時固化用光源配置在基板40的移動方向比噴頭57更靠下游側。其中,“臨時固化”是指只有其表層部固化,而不是所有薄膜材料固化。由於薄膜材料的液滴著落於基板40之後,迅速地進行臨時固化,因此能夠抑制薄膜材料的擴展。 The film material adhering to the substrate 40 is temporarily cured by ultraviolet rays radiated from the temporary curing light source 68, and the temporary curing light source is disposed on the downstream side of the head 57 in the moving direction of the substrate 40. Among them, "temporary curing" means that only the surface layer portion is cured, and not all film materials are cured. Since the droplets of the film material are deposited on the substrate 40 and then temporarily cured, it is possible to suppress the expansion of the film material.
參閱第5圖A~第5圖D、第6圖A~第6圖C,對從第1薄膜材料吐出站23向反轉站24輸送基板40之方法進行說明。 A method of transporting the substrate 40 from the first film material discharge station 23 to the reversing station 24 will be described with reference to FIGS. 5A to 5D and 6A to 6C.
如第5圖A所示,昇降器32能夠向x方向移動地支撐於直線導引件30。另外,昇降器32能夠相對載物台55昇降。昇降器32包括昇降板70、複數個昇降銷71、吸附墊片72及局部固化用光源73。昇降銷71安裝於昇降板70上,並從昇降板70向下方延伸。昇降銷71的各個下端安裝有吸附墊片72。吸附墊片72與基板40的上表面接觸來吸附基板40,由此昇降器32能夠保持基板40。 As shown in FIG. 5A, the lifter 32 is supported by the linear guide 30 so as to be movable in the x direction. Further, the lifter 32 can be moved up and down with respect to the stage 55. The lifter 32 includes a lift plate 70, a plurality of lift pins 71, an adsorption pad 72, and a partial curing light source 73. The lift pin 71 is attached to the lift plate 70 and extends downward from the lift plate 70. Adsorption pads 72 are attached to the lower ends of the lift pins 71. The adsorption pad 72 is in contact with the upper surface of the substrate 40 to adsorb the substrate 40, whereby the lifter 32 can hold the substrate 40.
昇降銷71各自的附近配置有局部固化用光源73。局部固化用光源73對基板40的上表面中吸附墊片72所接觸之區域(墊片接觸區域)照射紫外線。當從載物台55搬出基板40時,首先使昇降器32向載物台55的上方移動。 A local curing light source 73 is disposed in the vicinity of each of the lift pins 71. The partial curing light source 73 irradiates the ultraviolet ray to the region (the gasket contact region) where the adsorption pad 72 is in contact with the upper surface of the substrate 40. When the substrate 40 is carried out from the stage 55, the lifter 32 is first moved to the upper side of the stage 55.
第6圖A中示出昇降板70、昇降銷71、局部固化用光源73的平面位置關係。作為一例,基板40具有長方形的平面形狀,比基板40的四角稍稍靠內側配置有昇降銷71。比昇降銷71稍稍靠外側配置有局部固化用光源73。局部固化用光源73朝向基板40的內側放射紫外線。由此,能夠對吸附墊片72(第5圖A)所接觸之墊片接觸區域照射紫外線。 The plane positional relationship of the lift plate 70, the lift pins 71, and the partial curing light source 73 is shown in Fig. 6A. As an example, the substrate 40 has a rectangular planar shape, and the lift pins 71 are disposed slightly inside the four corners of the substrate 40. A partial curing light source 73 is disposed slightly outside the lift pin 71. The local curing light source 73 emits ultraviolet rays toward the inside of the substrate 40. Thereby, the contact area of the spacer which the adsorption pad 72 (FIG. 5A) contacts can be irradiated with ultraviolet rays.
如第5圖B所示,使昇降器32下降,並且從局部固化用光源73對基板40照射紫外線。從局部固化用光源73放射的紫外線的強度高於從臨時固化用光源68(第4圖A、第4圖B)放射之紫外線的強度。 As shown in FIG. 5B, the lifter 32 is lowered, and the substrate 40 is irradiated with ultraviolet rays from the partial curing light source 73. The intensity of the ultraviolet light emitted from the local curing light source 73 is higher than the intensity of the ultraviolet light emitted from the temporary curing light source 68 (Fig. 4A, Fig. 4B).
第6圖B中示出從局部固化用光源73照射紫外線之前的基板40的截面圖。基板40的上表面形成有由薄膜材料構成之薄膜80。薄膜80的表層部81藉由來自臨時固化用光源68(第4圖A、第4圖B)的紫外線照射固化。但是,薄膜80的內部為未固化的狀態。 FIG. 6B is a cross-sectional view showing the substrate 40 before the ultraviolet rays are irradiated from the partial curing light source 73. A film 80 made of a film material is formed on the upper surface of the substrate 40. The surface layer portion 81 of the film 80 is cured by ultraviolet irradiation from the temporary curing light source 68 (Fig. 4A, Fig. 4B). However, the inside of the film 80 is in an uncured state.
第6圖C中示出藉由局部固化用光源73照射紫外線之後的基板40的截面圖。吸附墊片72所接觸之墊片接觸區域82內的薄膜83固化至其內部。將固化至薄膜內部之 製程稱為“正式固化”。其他區域的薄膜80為僅固化表層部81之狀態。作為一例,為了正式固化薄膜材料,需要照射能量密度為1J/cm2左右的紫外線。當從局部固化用光源73放射之紫外線的功率密度在基板40的表面中為1W/cm2時,能夠藉由進行約1秒的照射來正式固化薄膜。 A cross-sectional view of the substrate 40 after the ultraviolet light is irradiated by the partial curing light source 73 is shown in Fig. 6C. The film 83 in the gasket contact region 82 where the adsorption pad 72 is in contact is cured to the inside thereof. The process of curing to the inside of the film is referred to as "formal curing." The film 80 in the other region is in a state in which only the surface layer portion 81 is cured. As an example, in order to formally cure the film material, it is necessary to irradiate ultraviolet rays having an energy density of about 1 J/cm 2 . When the power density of the ultraviolet light emitted from the partial curing light source 73 is 1 W/cm 2 on the surface of the substrate 40, the film can be formally cured by irradiation for about 1 second.
如第5圖C所示,進一步降低昇降器32,使吸附墊片72與基板40的上表面接觸。如第6圖C所示,由於墊片接觸區域82內的薄膜材料83固化至內部,所以即使吸附墊片72與薄膜83接觸,也不會產生薄膜83的變形或薄膜材料的再流動。昇降銷71及吸附墊片72的內部形成有吸引流路84。吸附墊片72與薄膜83接觸之後,經由吸引流路84吸引基板40,由此將基板40吸附於吸附墊片72。 As shown in Fig. 5C, the lifter 32 is further lowered to bring the suction pad 72 into contact with the upper surface of the substrate 40. As shown in Fig. 6C, since the film material 83 in the pad contact region 82 is solidified to the inside, even if the adsorption pad 72 is in contact with the film 83, deformation of the film 83 or reflow of the film material does not occur. A suction flow path 84 is formed inside the lift pin 71 and the suction pad 72. After the adsorption pad 72 comes into contact with the film 83, the substrate 40 is sucked through the suction flow path 84, whereby the substrate 40 is adsorbed to the adsorption pad 72.
如第5圖D所示,使昇降器32上昇。基板40被吸附於吸附墊片72,與昇降器32一同上昇。之後,使昇降器32移動至反轉站23(第1圖)。 As shown in Fig. 5D, the lifter 32 is raised. The substrate 40 is adsorbed to the adsorption pad 72 and rises together with the lifter 32. Thereafter, the lifter 32 is moved to the inversion station 23 (Fig. 1).
參閱第7圖A~第7圖F,對反轉站23中的反轉動作進行說明。旋轉軸62的前端固定有反轉台60。反轉台60包括連結部60x與2根臂部60y。連結部60x在x方向上較長,在其中點與旋轉軸62連結。2根臂部60y分別從連結部60x的兩端向y方向延伸。反轉台60附近配置有在x方向上較長之正式固化用光源61。正式固化用光源61例如使用汞燈及金屬鹵化物燈等。 The reverse operation in the inversion station 23 will be described with reference to FIGS. 7A to 7F. A reversing table 60 is fixed to the front end of the rotating shaft 62. The reversing table 60 includes a coupling portion 60x and two arm portions 60y. The connecting portion 60x is long in the x direction, and is connected to the rotating shaft 62 at a midpoint thereof. The two arm portions 60y extend in the y direction from both ends of the coupling portion 60x. A main curing light source 61 that is long in the x direction is disposed in the vicinity of the reversing table 60. For the main curing light source 61, for example, a mercury lamp, a metal halide lamp, or the like is used.
如第7圖B所示,將基板40從昇降器32(第1圖、第2圖)移交到反轉台60。基板40的3個邊緣分別藉由連結部60x及臂部60y支撐。連結部60x及臂部60y的上表面設置有複數個吸引孔,基板40被吸附在反轉台60。另外,可採用按壓基板40的邊緣附近來保持之機構代替吸引孔。例如可用滾輪按壓基板40,亦可以用夾具機構按壓基板40。 As shown in FIG. 7B, the substrate 40 is transferred from the lifter 32 (Fig. 1 and Fig. 2) to the reversing table 60. The three edges of the substrate 40 are supported by the connecting portion 60x and the arm portion 60y, respectively. A plurality of suction holes are provided on the upper surfaces of the connecting portion 60x and the arm portion 60y, and the substrate 40 is adsorbed to the reversing table 60. In addition, a mechanism for holding the vicinity of the edge of the substrate 40 to hold the suction hole may be employed. For example, the substrate 40 may be pressed by a roller, or the substrate 40 may be pressed by a clamp mechanism.
如第7圖C所示,一邊向y方向移動正式固化用光源61,一邊對基板40的表面照射紫外線。由此,形成於基板40的上表面(第1面)之薄膜80(第6圖C)固化(正式固化)至內部。本說明書中,有時將反轉站24稱為“正式固化部”。供給於基板40的表面之紫外線的能量密度大於藉由臨時固化用光源68(第4圖A、第4圖B)供給於基板40的表面之紫外線的能量密度,例如為約100倍。作為一例,藉由臨時固化用光源68及正式固化用光源61供給於基板40的表面之紫外線的能量密度分別為10mW/cm2及1W/cm2。為了使由正式固化部照射之紫外線的能量密度大於臨時固化時照射之紫外線的能量密度,可加長正式固化部中的紫外線的照射時間,亦可增大由正式固化部照射之紫外線的光強度(功率密度)。 As shown in FIG. 7C, the surface of the substrate 40 is irradiated with ultraviolet rays while moving the main curing light source 61 in the y direction. Thereby, the film 80 (FIG. 6C) formed on the upper surface (first surface) of the substrate 40 is cured (formally cured) to the inside. In the present specification, the inversion station 24 may be referred to as a "formal curing portion". The energy density of the ultraviolet rays supplied to the surface of the substrate 40 is larger than the energy density of the ultraviolet rays supplied to the surface of the substrate 40 by the temporary curing light source 68 (Fig. 4A, Fig. 4B), for example, about 100 times. As an example, the energy density of the ultraviolet rays supplied to the surface of the substrate 40 by the temporary curing light source 68 and the main curing light source 61 is 10 mW/cm 2 and 1 W/cm 2 , respectively . In order to increase the energy density of the ultraviolet ray irradiated by the main curing portion by the energy density of the ultraviolet ray irradiated during the temporary curing, the irradiation time of the ultraviolet ray in the main curing portion may be lengthened, and the light intensity of the ultraviolet ray irradiated by the main curing portion may be increased ( Power density).
如第7圖D所示,使旋轉軸62旋轉180°。由此,基板40的上下反轉,未附著有薄膜之面(第2面)朝向上方。如第7圖E所示,使昇降器33下降。昇降器33與昇降器32(第5圖A)相同地包括昇降銷及吸附墊片74。 使吸附墊片74與基板40的第2面接觸。之後,由吸附墊片74吸附基板40。如第7圖F所示,從昇降器33與基板40之間抽出反轉台60(第7圖E)。之後,使昇降器33上昇,並移動至第2對準站25(第1圖)。 As shown in Fig. 7D, the rotating shaft 62 is rotated by 180°. Thereby, the upper and lower sides of the substrate 40 are reversed, and the surface (second surface) on which the film is not adhered faces upward. As shown in Fig. 7E, the lifter 33 is lowered. The lifter 33 includes a lift pin and an adsorption pad 74 in the same manner as the lifter 32 (Fig. 5A). The adsorption pad 74 is brought into contact with the second surface of the substrate 40. Thereafter, the substrate 40 is adsorbed by the adsorption pad 74. As shown in Fig. 7F, the reversing table 60 is extracted from the lifter 33 and the substrate 40 (Fig. 7E). Thereafter, the lifter 33 is raised and moved to the second alignment station 25 (Fig. 1).
第1圖所示之第2對準站25及第2薄膜材料吐出站26中的處理與第1對準站22及第1薄膜材料吐出站23中的處理相同。由此,還能夠在基板40的第2面形成薄膜。當形成於第2面之薄膜被搬出傳送帶37輸送時,藉由從正式固化用光源51放射之紫外線正式固化。 The processing in the second alignment station 25 and the second thin film material discharge station 26 shown in Fig. 1 is the same as the processing in the first alignment station 22 and the first thin film material discharge station 23. Thereby, a thin film can also be formed on the second surface of the substrate 40. When the film formed on the second surface is transported by the carry-out conveyor 37, the ultraviolet light emitted from the main curing light source 51 is solidified.
實施例1中,第4圖C所示之一邊向y方向移動基板40一邊使薄膜材料的液滴著落之製程中,僅固化(臨時固化)形成於基板40之薄膜的表層部。由此,能夠抑制附著於基板40的表面之薄膜材料向面內方向擴展。若欲在剛著落液滴之後使薄膜正式固化,則為了確保供給於薄膜之充份的能量密度,必需延遲基板40的移動速度。實施例1中,由於僅固化薄膜的表層部,因此能夠加快基板40的移動速度。由此,能夠實現提高吞吐量。 In the first embodiment, one of the steps shown in FIG. 4C moves the substrate 40 in the y direction while the droplets of the thin film material are dropped, and only the surface layer portion of the thin film formed on the substrate 40 is cured (temporarily cured). Thereby, it is possible to suppress the film material adhering to the surface of the substrate 40 from spreading in the in-plane direction. If the film is to be formally cured immediately after the drop is dropped, it is necessary to delay the moving speed of the substrate 40 in order to secure the sufficient energy density supplied to the film. In the first embodiment, since only the surface layer portion of the film is cured, the moving speed of the substrate 40 can be increased. Thereby, it is possible to achieve an improvement in throughput.
若使吸附墊片72(第6圖C)與臨時固化之薄膜接觸,則有時固化之表層部被破壞而未固化的薄膜材料流出。實施例1中,由於在使吸附墊片72與薄膜接觸之前使墊片接觸區域82內的薄膜固化至內部,所以能夠防止薄膜材料的流出或變形。第2薄膜材料吐出站26(第1圖)中,在使薄膜材料附著於基板40的第2面之前,在正式固化部(反轉站)24中在第1面的整個區域中薄膜 被固化(正式固化)至其內部。第1薄膜材料吐出站23中使薄膜材料的液滴著落於基板40時基板40的移動速度能夠與正式固化部24中的正式固化處理相獨立地設定成最佳值。 When the adsorption pad 72 (Fig. 6C) is brought into contact with the temporarily cured film, the cured surface layer portion may be broken and the uncured film material may flow out. In the first embodiment, since the film in the gasket contact region 82 is solidified to the inside before the adsorption pad 72 is brought into contact with the film, it is possible to prevent the film material from flowing out or being deformed. In the second film material discharge station 26 (first drawing), the film is applied to the entire surface of the first surface in the main curing portion (reverse station) 24 before the film material is adhered to the second surface of the substrate 40. Cured (formally cured) to its interior. When the droplets of the film material are dropped on the substrate 40 in the first film material discharge station 23, the moving speed of the substrate 40 can be set to an optimum value independently of the main curing process in the main curing portion 24.
實施例1中,剛使薄膜材料的液滴著落於載物台55上的基板40之後,從臨時固化用光源68對薄膜材料照射紫外線,但是未必一定在剛著落之後臨時固化。亦可在薄膜材料著落於基板之後從載物台55搬出基板40之前,使薄膜材料臨時固化。此時,無需將臨時固化用光源68固定於安裝有噴頭65之噴嘴夾具64。將臨時固化用光源68配置於載物台55的上方即可。 In the first embodiment, immediately after the droplets of the film material are dropped on the substrate 40 on the stage 55, the film material is irradiated with ultraviolet rays from the temporary curing light source 68, but it is not necessarily required to be temporarily cured immediately after landing. The film material may be temporarily cured before the substrate material is carried out from the stage 55 after the film material is landed on the substrate. At this time, it is not necessary to fix the temporary curing light source 68 to the nozzle holder 64 to which the head 65 is attached. The temporary curing light source 68 may be disposed above the stage 55.
與不使薄膜材料臨時固化而是從載物台55搬出基板40之後臨時固化或正式固化時相比,能夠藉由在搬出前進行臨時固化來抑制薄膜材料的液滴滲入。另外,如實施例1,若採用一邊移動基板一邊在比薄膜材料的著落位置稍稍靠下游側對薄膜材料照射紫外線之結構,則能夠縮短從薄膜材料的著落到臨時固化為止的時間。 It is possible to suppress the infiltration of the liquid droplets of the film material by temporarily curing before carrying out, as compared with the case where the film material is temporarily cured without being temporarily cured, and the substrate 40 is unloaded from the stage 55. Further, as in the first embodiment, the structure in which the film material is irradiated with ultraviolet rays slightly on the downstream side from the landing position of the film material while moving the substrate can shorten the time from the landing of the film material to the temporary curing.
接著,對實施例1的變形例進行說明。實施例1中,在基板反轉站24中進行基板上的薄膜的正式固化。該變形例中,將用於進行正式固化之獨立之站配置於第1薄膜材料吐出站23與基板反轉站24之間來代替基板反轉站24兼有正式固化部之結構。進行該正式固化之站例如與第1圖所示之搬出傳送帶37和正式固化用光源51相同地,能夠由用於輸送基板之傳送帶與配置於其上方之正式 固化用光源構成。 Next, a modification of the first embodiment will be described. In the first embodiment, the film is completely cured in the substrate inversion station 24. In this modification, the independent station for performing the main curing is disposed between the first film material discharge station 23 and the substrate inverting station 24 instead of the substrate reversing station 24 having the structure of the main solidified portion. The station that performs the main curing can be, for example, the conveyor belt for transporting the substrate and the officially disposed above it, similarly to the carry-out conveyor 37 and the main curing light source 51 shown in Fig. 1 . It is composed of a light source for curing.
在正式固化用站中藉由來自正式固化用光源的光投入到基板40上的薄膜材料之光的能量密度成為能夠固化至薄膜材料內部之大小。該光能密度大於在載物台55上藉由來自臨時固化用光源68的光投入到基板40上的薄膜材料之光的能量密度。為了增大光能密度,可以加大光源的功率,亦可以加長光照射時間。能夠藉由調整在用於進行正式固化之站的傳送帶上輸送基板之速度來調節正式固化用光的照射時間。 In the main curing station, the energy density of the light of the film material which is supplied onto the substrate 40 by the light from the light source for the main curing becomes a size which can be cured to the inside of the film material. The light energy density is greater than the energy density of light on the stage 55 that is applied to the film material by the light from the temporary curing light source 68 onto the substrate 40. In order to increase the light energy density, the power of the light source can be increased, and the light irradiation time can be lengthened. The irradiation time of the main curing light can be adjusted by adjusting the speed at which the substrate is conveyed on the conveyor belt for the station for performing the final curing.
第8圖中示出基於實施例2之薄膜形成裝置的第1薄膜材料吐出站的俯視圖。以下對與實施例1的不同點進行說明,對相同結構省略說明。實施例1中局部固化用光源73(第5圖A)安裝於昇降器32上,但是實施例2中局部固化用光源90安裝於支撐構件58上。亦即,局部固化用光源90配置於載物台55的上方並與基板40對置。當向y方向移動基板40時,調整局部固化用光源90在x方向上的位置,以便在基板40的表面上所劃分之墊片接觸區域82穿過從局部固化用光源90放射之紫外線的路徑內。 Fig. 8 is a plan view showing a first film material discharge station of the film forming apparatus of the second embodiment. The differences from the first embodiment will be described below, and the description of the same configurations will be omitted. The partial curing light source 73 (Fig. 5A) of the first embodiment is attached to the lifter 32, but the partial curing light source 90 of the second embodiment is attached to the support member 58. That is, the partial curing light source 90 is disposed above the stage 55 and faces the substrate 40. When the substrate 40 is moved in the y direction, the position of the partial curing light source 90 in the x direction is adjusted so that the pad contact region 82 divided on the surface of the substrate 40 passes through the path of the ultraviolet rays radiated from the partial curing light source 90. Inside.
接著,參閱第9圖A~第9圖D,對使墊片接觸區域82內的薄膜正式固化之方法進行說明。 Next, a method of forming the film in the gasket contact region 82 to be completely cured will be described with reference to FIGS. 9A to 9D.
如第9圖A所示,薄膜形成於基板40的第1面的整 個區域之後,使基板40向y方向移動。如第9圖B所示,當墊片接觸區域82(第8圖)配置於局部固化用光源90的正下方時,從局部固化用光源90對墊片接觸區域82內的薄膜照射紫外線。例如,當從局部固化用光源90放射之紫外線的功率密度在基板40的表面中為1W/cm2時,能夠藉由進行1秒左右的紫外線照射來正式固化薄膜。 As shown in FIG. 9A, after the film is formed over the entire area of the first surface of the substrate 40, the substrate 40 is moved in the y direction. As shown in FIG. 9B, when the spacer contact region 82 (Fig. 8) is disposed directly under the partial curing light source 90, the film in the spacer contact region 82 is irradiated with ultraviolet rays from the partial curing light source 90. For example, when the power density of the ultraviolet light emitted from the partial curing light source 90 is 1 W/cm 2 on the surface of the substrate 40, the film can be formally cured by ultraviolet irradiation for about 1 second.
如第9圖C所示,當進一步向y方向移動基板40,其他墊片接觸區域82配置於局部固化用光源90的正下方時,從局部固化用光源90對墊片接觸區域內的薄膜照射紫外線。如第9圖D所示,使基板40移動至能夠與昇降器32(第2圖)交接之部位。在該時刻墊片接觸區域82內的薄膜正式固化。 As shown in FIG. 9C, when the substrate 40 is further moved in the y direction and the other pad contact region 82 is disposed directly under the partial curing light source 90, the film in the pad contact region is irradiated from the partial curing light source 90. Ultraviolet light. As shown in Fig. 9D, the substrate 40 is moved to a position where it can be transferred to the lifter 32 (Fig. 2). At this point in time, the film in the gasket contact region 82 is completely cured.
由於僅正式固化墊片接觸區域82內的薄膜,所以與正式固化基板40的整個區域的薄膜時相比,能夠縮短正式固化所需之時間。因此,能夠縮短基板40滯留於第1薄膜材料吐出站23之時間。由此,能夠抑制因正式固化處理引起之吞吐量的下降。 Since only the film in the pad contact region 82 is completely cured, the time required for the main curing can be shortened compared to when the film of the entire region of the substrate 40 is completely cured. Therefore, the time during which the substrate 40 stays in the first film material discharge station 23 can be shortened. Thereby, it is possible to suppress a decrease in throughput due to the main curing process.
若加大局部固化用光源90的功率,則即使在基板40以使薄膜材料著落於基板40時的移動速度穿過局部固化用光源90的下方時,亦能夠將充份的紫外線的能量密度供給於薄膜。此時,能夠在薄膜材料的液滴著落時從局部固化用光源90照射紫外線來進行正式固化。這時,正式固化之區域可僅設為墊片接觸區域82,亦可設為包括墊 片接觸區域82之與y方向平行之帶狀區域。 When the power of the partial curing light source 90 is increased, even when the substrate 40 is moved below the partial curing light source 90 at a moving speed when the film material is landed on the substrate 40, the energy density of the sufficient ultraviolet light can be supplied. In the film. At this time, it is possible to perform the main curing by irradiating ultraviolet rays from the partial curing light source 90 when the droplets of the film material are dropped. At this time, the area to be formally cured may be set only as the pad contact area 82, or may be set to include the pad. A strip-shaped region of the sheet contact region 82 that is parallel to the y-direction.
參閱第10圖A及第10圖B,對基於實施例3之薄膜形成裝置及薄膜形成方法進行說明。以下,對與實施例1的不同點進行說明,對相同的結構省略說明。 A film forming apparatus and a film forming method according to Example 3 will be described with reference to FIGS. 10A and 10B. Hereinafter, differences from the first embodiment will be described, and the description of the same configurations will be omitted.
第10圖A中示出以基於實施例3之方法成為形成薄膜的對象之基板及形成之薄膜圖案的俯視圖。實施例1中薄膜形成於基板40的表面的大致整個區域。實施例3中,基板40中劃分有複數個印刷配線區域41,薄膜形成於印刷配線區域41的內部。印刷配線區域41以外的區域未形成薄膜。複數個印刷配線區域41配置成例如將x方向設為行方向、將y方向設為列方向之行列狀。在2個與x方向及y方向鄰接之印刷配線區域41之間及印刷配線區域41與基板40的邊緣之間確保不形成薄膜之區段42。墊片接觸區域82配置於區段42的內部。 Fig. 10A is a plan view showing a substrate to be formed into a film and a film pattern formed by the method according to the third embodiment. The film in Example 1 was formed on substantially the entire area of the surface of the substrate 40. In the third embodiment, a plurality of printed wiring regions 41 are defined in the substrate 40, and a film is formed inside the printed wiring region 41. A film is not formed in a region other than the printed wiring region 41. The plurality of printed wiring regions 41 are arranged, for example, in a row direction in which the x direction is the row direction and the y direction is the column direction. A section 42 in which no film is formed is secured between the two printed wiring regions 41 adjacent to the x direction and the y direction and between the printed wiring region 41 and the edge of the substrate 40. The shim contact area 82 is disposed inside the section 42.
第10圖B中示出沿第10圖A的一點虛線10B-10B之截面圖。第10圖B中示出使昇降器33的吸附墊片74與基板40接觸之狀態。基板40的第1面的印刷配線區域41中形成有薄膜80。在該時刻,薄膜80為被臨時固化之狀態而未正式固化。區段42中未形成有薄膜80。 A cross-sectional view taken along the dotted line 10B-10B of Fig. 10A is shown in Fig. 10B. FIG. 10B shows a state in which the suction pad 74 of the lifter 33 is brought into contact with the substrate 40. A film 80 is formed in the printed wiring region 41 of the first surface of the substrate 40. At this point in time, the film 80 is temporarily cured without being formally cured. A film 80 is not formed in the section 42.
昇降器33的吸附墊片74與區段42內的墊片接觸區域82(第10圖A)接觸。由於吸附墊片74不與薄膜80接觸,所以即使薄膜80為臨時固化的狀態,亦能夠由昇 降器33輸送基板40。 The suction pad 74 of the lifter 33 is in contact with the pad contact area 82 (Fig. 10A) in the section 42. Since the adsorption pad 74 is not in contact with the film 80, even if the film 80 is temporarily cured, it can be lifted. The drop device 33 transports the substrate 40.
參閱第11圖A及第11圖B,對基於實施例4之薄膜形成裝置及薄膜形成方法進行說明。以下,對與實施例1的不同點進行說明,對相同結構省略說明。 A film forming apparatus and a film forming method according to Example 4 will be described with reference to FIGS. 11A and 11B. Hereinafter, differences from the first embodiment will be described, and the description of the same configurations will be omitted.
如第11圖A所示,載物台55上保持有基板40。基板40的上表面(第1面)形成有臨時固化狀態的薄膜80。昇降器33具有複數個向下方延伸之保持銷75。保持銷75以支點為中心開閉。在保持銷75打開之狀態下,以俯視觀察時,保持銷75的前端位於比基板40的外周線更靠外側。 As shown in FIG. 11A, the substrate 40 is held on the stage 55. A film 80 in a temporarily cured state is formed on the upper surface (first surface) of the substrate 40. The lifter 33 has a plurality of retaining pins 75 extending downward. The holding pin 75 is opened and closed around the fulcrum. When the holding pin 75 is opened, the front end of the holding pin 75 is located outside the outer peripheral line of the substrate 40 in a plan view.
如第11圖B所示,使昇降器33下降至保持銷75的前端位於與基板40的端面相同高度之位置。關閉保持銷75使其前端與基板40的端面接觸。藉由保持銷75的前端與基板40的端面接觸而基板40被保持於昇降器33。由於基板40的端面未形成薄膜80,所以即使薄膜80為臨時固化的狀態,亦能夠由昇降器33保持並輸送基板40。 As shown in FIG. 11B, the lifter 33 is lowered to a position where the front end of the holding pin 75 is located at the same height as the end surface of the substrate 40. The holding pin 75 is closed so that its front end comes into contact with the end surface of the substrate 40. The substrate 40 is held by the lifter 33 by the front end of the holding pin 75 being in contact with the end surface of the substrate 40. Since the film 80 is not formed on the end surface of the substrate 40, the substrate 40 can be held and transported by the lifter 33 even if the film 80 is temporarily cured.
參閱第12圖A及第12圖D,對基於實施例5之薄膜形成裝置及薄膜形成方法進行說明。以下,對與實施例1的不同點進行說明,對相同的結構省略說明。 A film forming apparatus and a film forming method based on Example 5 will be described with reference to FIGS. 12A and 12D. Hereinafter, differences from the first embodiment will be described, and the description of the same configurations will be omitted.
如第12圖A所示,載物台55上保持有基板40。基板40的第1面上形成有臨時固化狀態的薄膜80。載物台55上具備有昇降銷77。在載物台55上保持基板40之狀態下,昇降銷77的前端退避到低於載物台55的上表面(基板保持面)之位置。 As shown in Fig. 12A, the substrate 40 is held on the stage 55. A film 80 in a temporarily cured state is formed on the first surface of the substrate 40. The stage 55 is provided with a lift pin 77. In a state where the substrate 40 is held on the stage 55, the tip end of the lift pin 77 is retracted to a position lower than the upper surface (substrate holding surface) of the stage 55.
如第12圖B所示,使昇降銷77上昇。昇降銷77的昇降由控制裝置50(第1圖)控制。基板40載於昇降銷77的前端而上昇,在載物台55與基板40之間形成空腔。 As shown in Fig. 12B, the lift pins 77 are raised. The lifting and lowering of the lift pins 77 is controlled by the control device 50 (Fig. 1). The substrate 40 is lifted at the tip end of the lift pin 77, and a cavity is formed between the stage 55 and the substrate 40.
如第12圖C所示,在載物台55與基板40之間的空腔中插入機械手臂78。如第12圖D所示,使昇降銷77下降並由機械手臂78支撐基板40。之後,使機械手臂78動作,向反轉站24(第1圖)輸送基板40。 As shown in Fig. 12C, a robot arm 78 is inserted into the cavity between the stage 55 and the substrate 40. As shown in Fig. 12D, the lift pins 77 are lowered and the substrate 40 is supported by the robot arm 78. Thereafter, the robot arm 78 is operated to transport the substrate 40 to the reversing station 24 (Fig. 1).
實施例5中,輸送基板40時由其下表面支撐基板40。因此,即使薄膜80為臨時固化的狀態,亦能夠保持並輸送基板40。 In the fifth embodiment, the substrate 40 is supported by the lower surface thereof when the substrate 40 is transported. Therefore, even if the film 80 is in a temporarily cured state, the substrate 40 can be held and conveyed.
第13圖A~第13圖E中示出在基於實施例6之薄膜形成裝置中同時並排進行正式固化與表裏反轉之例子。以下,對與實施例1的不同點進行說明,對相同結構省略說明。如第13圖A所示,紫外光源102的兩側設置有一對半圓形的導引件106。紫外光源102能夠沿著兩側的導引件106移動。紫外光源102的移動藉由控制裝置50控 制。自紫外光源102射出之紫外光照射於將表面朝向Z軸正方向保持於反轉台60之基板40的表面。另外,第13圖A~第13圖E所示之例子中紫外光源102射出發散之紫外光。 An example in which the main curing and the surface inversion are simultaneously performed side by side in the film forming apparatus according to the embodiment 6 is shown in FIGS. 13A to 13E. Hereinafter, differences from the first embodiment will be described, and the description of the same configurations will be omitted. As shown in Fig. 13A, a pair of semicircular guide members 106 are disposed on both sides of the ultraviolet light source 102. The ultraviolet light source 102 is movable along the guides 106 on both sides. The movement of the ultraviolet light source 102 is controlled by the control device 50 system. The ultraviolet light emitted from the ultraviolet light source 102 is irradiated onto the surface of the substrate 40 that holds the surface in the positive direction of the Z-axis on the inversion stage 60. Further, in the example shown in Figs. 13A to 13D, the ultraviolet light source 102 emits ultraviolet light which is scattered.
如第13圖B~第13圖E所示,控制裝置50以旋轉軸62為旋轉中心例如以恆定的角速度旋轉基板40。與基板40的旋轉同步,沿著導引件106以恆定速度移動紫外光源102,以便對旋轉中的基板40的表面照射規定強度以上的紫外光。例如如第13圖E所示,當基板40的背面朝向Z軸正方向時,結束紫外光的照射。 As shown in FIGS. 13B to 13D, the control device 50 rotates the substrate 40 at a constant angular velocity with the rotation shaft 62 as a rotation center. In synchronization with the rotation of the substrate 40, the ultraviolet light source 102 is moved at a constant speed along the guide 106 to illuminate the surface of the rotating substrate 40 with ultraviolet light of a predetermined intensity or higher. For example, as shown in FIG. 13E, when the back surface of the substrate 40 faces the positive direction of the Z-axis, the irradiation of the ultraviolet light is ended.
實施例6中,同時進行基板40的反轉與基於紫外線照射之薄膜的正式固化。因此,能夠縮短整個處理時間。 In Example 6, the inversion of the substrate 40 and the final curing of the film based on the ultraviolet irradiation were simultaneously performed. Therefore, the entire processing time can be shortened.
第14圖A~第14圖D中示出在基於實施例7之薄膜形成裝置中同時並排進行正式固化與表裏反轉之例子。以下,對與實施例1的不同點進行說明,對相同的結構省略說明。第14圖A~第14圖D所示之例子中,紫外光源102射出聚焦之紫外光。如第14圖A所示,支撐構件101的兩端設置有1對導引件106。支撐構件101能夠沿著兩端的導引件106移動。支撐構件101的移動藉由控制裝置50控制。 An example in which the main curing and the front-back reversal are simultaneously performed side by side in the film forming apparatus according to the seventh embodiment is shown in FIGS. 14A to 14D. Hereinafter, differences from the first embodiment will be described, and the description of the same configurations will be omitted. In the example shown in Figs. 14A to 14D, the ultraviolet light source 102 emits focused ultraviolet light. As shown in Fig. 14A, a pair of guides 106 are provided at both ends of the support member 101. The support member 101 is movable along the guides 106 at both ends. The movement of the support member 101 is controlled by the control device 50.
如第14圖A~第14圖D所示,控制裝置50以旋轉軸62為旋轉中心例如以恆定的角速度旋轉基板40。與基 板40的旋轉同步,沿著導引件106以恆定速度移動支撐構件101。另外,沿著支撐構件101以恆定速度移動紫外光源102。第14圖A示出基板40的表面朝向Z軸正方向之狀態,第14圖D示出逐漸旋轉而基板40的背面朝向Z軸正方向之狀態。在第14圖A所示之狀態下,紫外光源102處於對基板40的Y軸正方向端部照射紫外光之位置,如第14圖A~第14圖D所示,隨著基板40旋轉而移動至對基板40的Y軸負方向端部照射紫外光之位置。當基板40的表面朝向Z軸正方向時開始照射紫外光,當基板40的背面朝向Z軸正方向時結束照射紫外光。 As shown in FIGS. 14A to 14D, the control device 50 rotates the substrate 40 at a constant angular velocity with the rotation shaft 62 as a rotation center. Base The rotation of the plate 40 is synchronized, and the support member 101 is moved at a constant speed along the guide 106. In addition, the ultraviolet light source 102 is moved at a constant speed along the support member 101. Fig. 14A shows a state in which the surface of the substrate 40 faces the positive direction of the Z-axis, and Fig. 14D shows a state in which the back surface of the substrate 40 is gradually oriented in the positive direction of the Z-axis. In the state shown in FIG. 14A, the ultraviolet light source 102 is at a position where the ultraviolet light is irradiated to the end portion of the substrate 40 in the positive Y-axis direction, as shown in FIGS. 14A to 14D, as the substrate 40 rotates. It moves to a position where the end portion of the substrate 40 in the negative direction of the Y-axis is irradiated with ultraviolet light. The ultraviolet light is started to be irradiated when the surface of the substrate 40 faces the positive direction of the Z-axis, and the ultraviolet light is irradiated when the back surface of the substrate 40 faces the positive direction of the Z-axis.
實施例7中,亦與實施例6相同地同時進行基板40的反轉與基於紫外線照射之薄膜的正式固化。因此能夠縮短整個處理時間。 In the seventh embodiment, the inversion of the substrate 40 and the final curing of the film based on the ultraviolet irradiation were simultaneously performed in the same manner as in the sixth embodiment. Therefore, the entire processing time can be shortened.
第15圖中示出基於實施例8之薄膜形成裝置的概要圖。平板120上藉由移動機構121保持有保持機構125。移動機構121包括Y載物台122、X載物台123及θ載物台124。對將水平面設為XY面、將鉛垂方向設為Z軸之XYZ正交坐標系進行定義。Y載物台122使X載物台123向Y軸方向移動。X載物台123使θ載物台124向X方向移動。θ載物台124以與Z軸平行之軸為旋轉中心改變保持機構125的旋轉方向的姿勢。保持機構125保持作為薄膜形成對象(描繪對象)之印刷基板40。保持機構125 例如使用真空卡盤。另外,當將印刷基板40保持於保持機構125之前預先完成印刷基板40在θ方向上的定位時,無需θ載物台124。 Fig. 15 is a schematic view showing a film forming apparatus based on Example 8. A holding mechanism 125 is held by the moving mechanism 121 on the flat plate 120. The moving mechanism 121 includes a Y stage 122, an X stage 123, and a θ stage 124. The XYZ orthogonal coordinate system in which the horizontal plane is the XY plane and the vertical direction is the Z axis is defined. The Y stage 122 moves the X stage 123 in the Y-axis direction. The X stage 123 moves the θ stage 124 in the X direction. The θ stage 124 changes the posture of the rotation direction of the holding mechanism 125 with the axis parallel to the Z axis as the center of rotation. The holding mechanism 125 holds the printed substrate 40 as a film formation target (drawing target). Holding mechanism 125 For example, a vacuum chuck is used. Further, when the positioning of the printed substrate 40 in the θ direction is completed in advance before the printed substrate 40 is held by the holding mechanism 125, the θ stage 124 is not required.
平板120的上方由支柱130支撐梁131。梁131上安裝有噴頭單元57及攝像裝置132。攝像裝置132及噴頭單元57與保持在保持機構125之印刷基板40對置。攝像裝置132對形成於印刷基板40的表面之配線圖案進行攝像。攝像結果被輸入到控制裝置133。噴頭單元57從複數個噴嘴朝向印刷基板40吐出紫外線固化型樹脂,例如阻焊抗蝕劑的液滴。被吐出之液滴附著於印刷基板40的表面。 The beam 131 is supported by the pillars 130 above the flat plate 120. A head unit 57 and an image pickup device 132 are attached to the beam 131. The imaging device 132 and the head unit 57 are opposed to the printed substrate 40 held by the holding mechanism 125. The imaging device 132 images the wiring pattern formed on the surface of the printed substrate 40. The imaging result is input to the control device 133. The head unit 57 discharges an ultraviolet curable resin such as a droplet of a solder resist from a plurality of nozzles toward the printed substrate 40. The discharged droplets adhere to the surface of the printed substrate 40.
控制裝置133對Y載物台122、X載物台123、θ載物台124、保持機構125及噴頭單元57進行控制。 The control device 133 controls the Y stage 122, the X stage 123, the θ stage 124, the holding mechanism 125, and the head unit 57.
第15圖中相對於平板120固定噴頭單元57,但未必一定要固定。亦可能夠相對於平板120移動地支撐噴頭單元57。 The head unit 57 is fixed relative to the flat plate 120 in Fig. 15, but does not necessarily have to be fixed. It is also possible to movably support the head unit 57 with respect to the flat plate 120.
第16圖A中示出噴頭單元57的立體圖。噴嘴夾具64的底面以向Y方向排列的方式安裝有4個噴頭65A~65D。噴頭65A~65D以該順序朝向Y軸的負方向排列。噴頭65A~65D上分別形成有複數個噴嘴孔66。 A perspective view of the head unit 57 is shown in Fig. 16A. Four nozzles 65A to 65D are attached to the bottom surface of the nozzle holder 64 so as to be aligned in the Y direction. The heads 65A to 65D are arranged in the negative direction of the Y-axis in this order. A plurality of nozzle holes 66 are formed in the nozzles 65A to 65D, respectively.
噴頭65A與噴頭65B之間、噴頭65B與噴頭65C之間、噴頭65C與噴頭65D之間配置有臨時固化用光源68。另外,比噴頭65A更靠Y軸正側區域及比噴頭65D更靠Y軸負側區域配置有臨時固化用光源68。臨時固化 用光源68對印刷基板40(第15圖)照射紫外線。 A temporary curing light source 68 is disposed between the head 65A and the head 65B, between the head 65B and the head 65C, and between the head 65C and the head 65D. Further, a temporary curing light source 68 is disposed on the Y-axis positive side region of the head 65A and the Y-axis negative side region than the head 65D. Temporary curing The printed circuit board 40 (Fig. 15) is irradiated with ultraviolet light by the light source 68.
第16圖B中示出噴頭65A~65D及臨時固化用光源68的仰視圖。噴頭65A的底面(與印刷基板40對置之表面)形成有2列噴嘴列67a、噴嘴列67b。噴嘴列67a及噴嘴列67b分別由向X軸方向以間距(週期)2P排列之複數個噴嘴孔66構成。噴嘴列67b相對於噴嘴列67a向Y軸的正方向偏離,另外,向X軸的負方向僅偏離間距P。亦即,噴頭65A的噴嘴孔66在X方向以間距P等間隔分佈。間距P例如為80μm左右。 A bottom view of the heads 65A to 65D and the temporary curing light source 68 is shown in Fig. 16B. The bottom surface of the shower head 65A (the surface facing the printed circuit board 40) is formed with two nozzle rows 67a and a nozzle row 67b. Each of the nozzle row 67a and the nozzle row 67b is composed of a plurality of nozzle holes 66 arranged at a pitch (period) 2P in the X-axis direction. The nozzle row 67b is offset from the nozzle row 67a in the positive direction of the Y-axis, and is shifted from the negative direction of the X-axis by only the pitch P. That is, the nozzle holes 66 of the head 65A are distributed at equal intervals in the X direction at a pitch P. The pitch P is, for example, about 80 μm.
噴頭65B~65D的結構與噴頭65A的結構相同。噴頭65B、噴頭65C、噴頭65D分別相對於噴頭65A向X軸的負方向僅偏離2P/4、P/4、3P/4,並安裝於噴嘴夾具64(第16圖A)上。噴頭65A~65D之間及比最外側噴頭65A、噴頭65D更靠外側配置有臨時固化用光源68。 The structures of the heads 65B to 65D are the same as those of the head 65A. The head 65B, the head 65C, and the head 65D are respectively shifted by 2P/4, P/4, and 3P/4 in the negative direction of the X-axis with respect to the head 65A, and are attached to the nozzle holder 64 (Fig. 16A). A temporary curing light source 68 is disposed between the heads 65A to 65D and outside the outermost head 65A and the head 65D.
如第17圖所示,對與Y軸垂直之假想平面156垂直投影噴頭65A~65D的噴嘴孔66之圖像155A~155D向X方向以間距P/4等間隔排列。對噴頭65A~65D附加序列號,對噴嘴孔66的圖像155A~155D附加對應之噴頭65A~65D的序列號。此時,噴嘴孔66的圖像155A~155D在X方向並未以序列號順序排列。具體而言,當對噴頭65A~65D附加序列號1~4時,對噴嘴孔66的圖像155A、圖像155B、圖像155C、圖像155D分別附加序列號1、2、3、4。噴嘴孔66的圖像向X方向以序列號1、3、2、4的順序排列。 As shown in Fig. 17, the images 155A to 155D of the nozzle holes 66 of the vertical projection heads 65A to 65D perpendicular to the imaginary plane 156 perpendicular to the Y-axis are arranged at equal intervals in the X direction at a pitch P/4. A serial number is added to the heads 65A to 65D, and the serial numbers of the corresponding heads 65A to 65D are added to the images 155A to 155D of the nozzle holes 66. At this time, the images 155A to 155D of the nozzle holes 66 are not arranged in the order of the serial numbers in the X direction. Specifically, when the serial numbers 1 to 4 are attached to the heads 65A to 65D, the serial numbers 1, 2, 3, and 4 are added to the image 155A, the image 155B, the image 155C, and the image 155D of the nozzle hole 66, respectively. The image of the nozzle hole 66 is arranged in the order of serial numbers 1, 3, 2, and 4 in the X direction.
第18圖A中示出從各噴嘴孔66吐出之液滴的著落點的X坐標與吐出時刻的關係。第18圖的橫軸顯示經過時間,縱軸顯示X軸方向的位置。一邊使保持機構125(第15圖)向Y軸的正方向移動,一邊從噴嘴孔66吐出液滴。 Fig. 18A shows the relationship between the X coordinate of the landing point of the liquid droplets discharged from each nozzle hole 66 and the discharge timing. The horizontal axis of Fig. 18 shows the elapsed time, and the vertical axis shows the position in the X-axis direction. The droplets are ejected from the nozzle holes 66 while moving the holding mechanism 125 (Fig. 15) in the positive direction of the Y-axis.
時刻tAa、tAb時,分別從噴頭65A的噴嘴列67a、噴嘴列67b吐出液滴。由此,液滴著落於著落點147Aa、著落點147Ab。之後,時刻tBa、tBb時,分別從噴頭65B的噴嘴列67a、噴嘴列67b吐出液滴,時刻tCa、tCb時,分別從噴頭65C的噴嘴列67a、噴嘴列67b吐出液滴,時刻tDa、tDb時,分別從噴頭65D的噴嘴列67a、噴嘴列67b吐出液滴。由此,液滴著落於著落點147Ba、著落點147Bb、著落點147Ca、著落點147Cb、著落點147Da、著落點147Db。 At the time tAa and tAb, droplets are discharged from the nozzle row 67a and the nozzle row 67b of the head 65A, respectively. Thereby, the droplets land on the landing point 147Aa and the landing point 147Ab. Then, at time tBa and tBb, droplets are ejected from the nozzle row 67a and the nozzle row 67b of the head 65B, and droplets are ejected from the nozzle row 67a and the nozzle row 67b of the head 65C at times tCa and tCb, respectively, at times tDa and tDb. At this time, droplets are ejected from the nozzle row 67a and the nozzle row 67b of the head 65D, respectively. Thereby, the droplets land on the landing point 147Ba, the landing point 147Bb, the landing point 147Ca, the landing point 147Cb, the landing point 147Da, and the landing point 147Db.
藉由控制保持機構125(第15圖)的移動速度及來自各噴嘴列67a、噴嘴列67b的吐出時刻,能夠在印刷基板40的表面的1條假想直線上配置著落點147Aa~147Db。 By controlling the moving speed of the holding mechanism 125 (Fig. 15) and the ejection timing from each of the nozzle rows 67a and the nozzle rows 67b, the landing points 147Aa to 147Db can be placed on one imaginary straight line on the surface of the printed substrate 40.
第18圖B中示出在1條假想直線上排列著落點147Aa~147Db之狀態。從噴頭65A的噴嘴孔66吐出之液滴的著落點147Aa、著落點147Ab向X方向以間距P排列。同樣道理,從其他噴頭65B~65D各自的噴嘴孔66吐出之液滴的著落點亦向X方向以間距P排列。 Fig. 18B shows a state in which the landing points 147Aa to 147Db are arranged on one imaginary straight line. The landing point 147Aa and the landing point 147Ab of the liquid droplet discharged from the nozzle hole 66 of the head 65A are arranged at a pitch P in the X direction. By the same token, the landing points of the liquid droplets discharged from the respective nozzle holes 66 of the other heads 65B to 65D are also arranged at a pitch P in the X direction.
著落點147Ba位於將X軸的正方向的端點設為著落 點147Aa、將負方向的端點設為著落點147Ab之線段的中點。著落點147Ca位於以著落點147Aa與著落點147Ba為兩端之線段的中點。著落點147Da位於以著落點147Ba與著落點147Ab為兩端之線段的中點。 The landing point 147Ba is located at the end point of the positive direction of the X-axis. Point 147Aa sets the end point in the negative direction to the midpoint of the line segment of the falling point 147Ab. The landing point 147Ca is located at the midpoint of the line segment where the landing point 147Aa and the landing point 147Ba are both ends. The landing point 147Da is located at the midpoint of the line segment where the landing point 147Ba and the landing point 147Ab are both ends.
同樣道理,在將X軸的正方向的端點設為著落點147Ab、將負方向的端點設為著落點147Aa之線段上排列與各噴頭65B~65D的噴嘴列67b的噴嘴孔66對應之著落點。 By the same token, the end point in the positive direction of the X-axis is defined as the landing point 147Ab, and the line segment in which the end point in the negative direction is the landing point 147Aa is arranged in line with the nozzle hole 66 of the nozzle row 67b of each of the heads 65B to 65D. Landing point.
從相互鄰接之噴頭吐出之液滴的著落點不與X方向鄰接。兩者之間必須配置從其他噴頭吐出之液滴的著落點。例如,從相互鄰接之噴頭65A、噴頭65B吐出之液滴的著落點147Aa與著落點147Ba並不鄰接,兩者之間配置從噴頭65C吐出之液滴的著落點147Ca。 The landing points of the liquid droplets discharged from the nozzles adjacent to each other are not adjacent to the X direction. The landing point of the droplets ejected from the other nozzles must be arranged between the two. For example, the landing point 147Aa of the liquid droplets discharged from the nozzles 65A and 65B adjacent to each other and the landing point 147Ba are not adjacent to each other, and the landing point 147Ca of the liquid droplet discharged from the head 65C is disposed therebetween.
第18圖B所示之圓形是指著落位置的中心與圓形中心一致,並不顯示液滴擴展之區域。著落於著落點147Aa之液滴擴展之區域實際上寬於第18圖B所示之圓形區域。 The circle shown in Fig. 18B indicates that the center of the landing position coincides with the center of the circle, and does not show the area where the droplet spreads. The area where the droplet is landed at the landing point 147Aa is actually wider than the circular area shown in Fig. 18B.
第19圖A中示出以與X軸平行之視線觀察噴頭單元57及印刷基板40時的概要圖。噴嘴夾具64的底面安裝有噴頭65A~65D及臨時固化用光源68。印刷基板40與噴頭65A~65D對置。 Fig. 19 is a schematic view showing the head unit 57 and the printed circuit board 40 viewed in a line of sight parallel to the X-axis. The heads 65A to 65D and the temporary curing light source 68 are attached to the bottom surface of the nozzle holder 64. The printed substrate 40 faces the heads 65A to 65D.
安裝於噴頭65A與噴頭65B之間之臨時固化用光源68對印刷基板40的表面中與噴頭65A對置之區域148A和與噴頭65B對置之區域148B之間的區域照射光。同樣 道理,與噴頭65B對置的區域148B、與噴頭65C對置之區域148C及與噴頭65D對置之區域148D之間的區域亦藉由安裝於對應之噴頭之間之臨時固化用光源68被照射光。 The temporary curing light source 68 mounted between the head 65A and the head 65B illuminates a region between the region 148A of the surface of the printed substrate 40 facing the head 65A and the region 148B opposed to the head 65B. same The region between the region 148B opposed to the head 65B, the region 148C opposed to the head 65C, and the region 148D opposed to the head 65D is also irradiated by the temporary curing light source 68 mounted between the corresponding heads. Light.
安裝於比噴頭65A更靠外側(Y軸的負側)之臨時固化用光源68對比區域148A更靠Y軸負側之區域照射光。安裝於比噴頭65D更靠外側(Y軸的正側)之臨時固化用光源68對比區域148D更靠Y軸的正側之區域照射光。 The temporary curing light source 68 mounted on the outer side (the negative side of the Y-axis) of the head 65A is irradiated with light in a region closer to the Y-axis negative side than the region 148A. The temporary curing light source 68 mounted on the outer side (the positive side of the Y-axis) of the head 65D is irradiated with light in a region closer to the positive side of the Y-axis than the region 148D.
對一邊向Y軸的正方向移動印刷基板40一邊從噴頭65A~65D吐出液滴來進行薄膜形成(描繪)之情況進行說明。從噴頭65A~65D吐出並附著於印刷基板40之液滴藉由從比著落之時刻的液滴位置更靠前方(Y軸的正方向)的光源照射光來臨時固化。 A case where the liquid droplets are ejected from the heads 65A to 65D while moving the printed circuit board 40 in the positive direction of the Y-axis to form a film (drawing) will be described. The liquid droplets ejected from the heads 65A to 65D and attached to the printed circuit board 40 are temporarily solidified by irradiating light from a light source that is further forward (positive direction of the Y axis) than the position of the liquid droplet at the time of landing.
由於各噴頭65A~65D各自的前方配置有臨時固化用光源68,所以能夠在液滴附著於印刷基板40之後短時間內固化液滴。並且,由於各噴頭65A~65D的Y軸的負側亦配置有臨時固化用光源68,所以在一邊使印刷基板40向Y軸的負方向移動一邊形成薄膜時亦能夠縮短從液滴的附著至固化為止的時間。 Since the temporary curing light source 68 is disposed in front of each of the heads 65A to 65D, the liquid droplets can be solidified in a short time after the droplets adhere to the printed substrate 40. In addition, since the temporary curing light source 68 is disposed on the negative side of the Y-axis of each of the heads 65A to 65D, the adhesion of the liquid droplets can be shortened even when the printed circuit board 40 is moved in the negative direction of the Y-axis. The time until curing.
第19圖B中示出臨時固化用光源68的概要圖。臨時固化用光源68分別包括向與X軸平行之方向排列之複數個發光二極管160及在X方向上較長之柱面透鏡161。從發光二極管160放射的紫外線藉由柱面透鏡161在ZX面 內聚焦並入射到印刷基板40。若在ZX面內向印刷基板40入射之角度變大,則有時由印刷基板40反射之紫外線入射到附近的噴頭65A~65D的噴嘴孔66(第16圖A)。若紫外線入射到噴嘴孔66,則紫外線固化型樹脂在噴嘴孔66內固化,堵塞噴嘴孔66之危險性昇高。 A schematic view of the temporary curing light source 68 is shown in Fig. 19B. Each of the temporary curing light sources 68 includes a plurality of light emitting diodes 160 arranged in a direction parallel to the X axis and a cylindrical lens 161 which is long in the X direction. The ultraviolet rays radiated from the light emitting diode 160 are on the ZX plane by the cylindrical lens 161 The inside is focused and incident on the printed substrate 40. When the angle of incidence on the printed circuit board 40 in the ZX plane is increased, ultraviolet rays reflected by the printed circuit board 40 may enter the nozzle holes 66 of the adjacent heads 65A to 65D (FIG. 16A). When the ultraviolet rays are incident on the nozzle holes 66, the ultraviolet curable resin is solidified in the nozzle holes 66, and the risk of clogging the nozzle holes 66 is increased.
柱面透鏡161縮小向印刷基板40入射之角度,以免反射光入射到噴嘴孔66。例如,在ZX面內大致垂直地入射紫外線為較佳。 The cylindrical lens 161 reduces the angle at which the printed substrate 40 is incident to prevent the reflected light from entering the nozzle hole 66. For example, it is preferred to inject ultraviolet rays substantially vertically in the ZX plane.
接著,參閱第18圖A及第18圖B對薄膜形成方法進行說明。對在印刷基板40(第15圖、第19圖)形成與X軸平行之直線之例子進行說明。若向Y方向排列該直線,則能夠在二維面內塗佈液滴。依應形成之薄膜的位圖資料選擇吐出液滴之噴嘴孔66(第16圖A、第16圖B),由此能夠形成各種圖案。 Next, a film forming method will be described with reference to Figs. 18A and 18B. An example in which a straight line parallel to the X-axis is formed on the printed circuit board 40 (Fig. 15 and Fig. 19) will be described. When the straight line is arranged in the Y direction, the liquid droplets can be applied in the two-dimensional surface. The nozzle holes 66 (Fig. 16A, Fig. 16B) for discharging the droplets are selected in accordance with the bitmap data of the formed film, whereby various patterns can be formed.
時刻tAa時,從噴頭65A的噴嘴列67a吐出液滴。之後,時刻tAb時,從噴頭65A的噴嘴列67b吐出液滴。由此,液滴附著於第18圖B所示之著落點147Aa、著落點147Ab。當該液滴所附著之區域穿過與噴頭65A與噴頭65B之間的臨時固化用光源68對置之區域時,液滴藉由光照射臨時固化。時刻tBa、tBb時,分別從噴頭65B的噴嘴列67a、噴嘴列67b吐出液滴。由此,液滴附著於以著落點147Aa與著落點147Ab為兩端之第1線段上的著落點147Ba、著落點147Bb。當該液滴所附著之區域穿過與噴頭65B與噴頭65C之間的臨時固化用光源68對置之 區域時,液滴藉由光照射臨時固化。 At the time tAa, the liquid droplets are discharged from the nozzle row 67a of the head 65A. Thereafter, at time tAb, droplets are discharged from the nozzle row 67b of the head 65A. Thereby, the droplet adheres to the landing point 147Aa and the landing point 147Ab shown in Fig. 18B. When the region to which the droplet adheres passes through a region opposed to the temporary curing light source 68 between the head 65A and the head 65B, the droplet is temporarily solidified by light irradiation. At the time tBa and tBb, droplets are discharged from the nozzle row 67a and the nozzle row 67b of the head 65B, respectively. Thereby, the droplet adheres to the landing point 147Ba and the landing point 147Bb on the first line segment which is the both ends of the landing point 147Aa and the landing point 147Ab. When the area to which the droplet adheres passes through the temporary curing light source 68 between the head 65B and the head 65C. In the region, the droplets are temporarily cured by light irradiation.
時刻tCa時,從噴頭65C的噴嘴列67a吐出液滴。由此,液滴附著於第1線段上即比著落點147Ba更靠第1側(X軸的正側)之線段上的著落點147Ca。時刻tCb時,從噴頭65C的噴嘴列67b吐出液滴。由此,液滴附著於第1線段上即比著落點147Bb更靠第1側(X軸的正側)之線段上的著落點147Cb。當該液滴所附著之區域穿過與噴頭65C與噴頭65D之間的臨時固化用光源68對置之區域時,液滴藉由光照射臨時固化。 At the time tCa, the liquid droplets are discharged from the nozzle row 67a of the head 65C. Thereby, the droplet adheres to the first line segment, that is, the landing point 147Ca on the line segment closer to the first side (the positive side of the X-axis) than the falling point 147Ba. At the time tCb, the liquid droplets are discharged from the nozzle row 67b of the head 65C. Thereby, the droplet adheres to the first line segment, that is, the landing point 147Cb on the line segment closer to the first side (the positive side of the X-axis) than the falling point 147Bb. When the region to which the droplet adheres passes through a region opposed to the temporary curing light source 68 between the head 65C and the head 65D, the droplet is temporarily cured by light irradiation.
時刻tDa時,從噴頭65D的噴嘴列67a吐出液滴。由此,液滴附著於由著落點147Ba將第1線段分成2等分而得到之2個線段中未配置著落點147Ca之一方的線段上的著落點147Da。時刻tDb時,從噴頭65D的噴嘴列67b吐出液滴。由此,液滴附著於由著落點147Bb將第1線段分成2等分而得到之2個線段中未配置著落點147Cb之一方的線段上的著落點147Db。當該液滴所附著之區域穿過與配置在噴頭65D的外側之臨時固化用光源68對置之區域時,液滴藉由光照射臨時固化。 At the time tDa, the liquid droplets are discharged from the nozzle row 67a of the head 65D. Thereby, the droplet adheres to the landing point 147Da on the line segment in which one of the two line segments obtained by dividing the first line segment into two equal parts by the landing point 147Ba is not disposed with one of the falling points 147Ca. At the time tDb, the liquid droplets are discharged from the nozzle row 67b of the head 65D. Thereby, the droplet adheres to the landing point 147Db on the line segment in which one of the two line segments obtained by dividing the first line segment into two equal parts by the landing point 147Bb is not disposed with one of the falling points 147Cb. When the region to which the droplet adheres passes through a region opposed to the temporary curing light source 68 disposed outside the head 65D, the droplet is temporarily cured by light irradiation.
第20圖A~第20圖D中示出從液滴的吐出到附著於印刷基板為止的液滴的形狀的時間變化。如第20圖A所示,即將著落於印刷基板40之前,液滴151為大致球形。如第20圖B所示,若液滴151著落於印刷基板40,則液滴151稍微向面內方向擴展。 20A to 20D show temporal changes in the shape of the liquid droplets from the discharge of the liquid droplets to the adhesion to the printed circuit board. As shown in Fig. 20A, the droplet 151 is substantially spherical immediately before landing on the printed substrate 40. As shown in FIG. 20B, when the liquid droplet 151 landed on the printed substrate 40, the liquid droplet 151 slightly expands in the in-plane direction.
如第20圖C所示,若從著落時刻經過時間,則液滴 151的擴展變大並產生滲入152。如第20圖D所示,若再經過時間,則滲入152的擴展變大。 As shown in Fig. 20C, if the time elapses from the landing time, the droplet The expansion of 151 becomes larger and infiltrates 152. As shown in Fig. 20D, if the elapsed time, the expansion of the infiltration 152 becomes large.
上述實施例8中,由於液滴151與印刷基板40接觸之後至臨時固化為止的時間變短,所以能夠抑制滲入的擴展。由此,能夠高精確度地形成微細的圖案。 In the above-described eighth embodiment, since the time until the liquid droplet 151 comes into contact with the printed substrate 40 until the temporary curing is shortened, the expansion of the penetration can be suppressed. Thereby, a fine pattern can be formed with high precision.
實施例8中,在噴頭65A~65D中鄰接之噴頭之間的所有區域配置臨時固化用光源68。依允許之滲入大小,未必一定在所有區域配置光源。相互鄰接之噴頭之間的區域中可僅在一部份區域配置光源。例如,第16圖A及第16圖B中亦能夠設為未在噴頭65A與噴頭65B之間及噴頭65C與噴頭65D之間配置臨時固化用光源68之結構。 In the eighth embodiment, the temporary curing light source 68 is disposed in all areas between the adjacent heads of the heads 65A to 65D. Depending on the allowable penetration size, it is not necessary to configure the light source in all areas. The light source may be disposed in only a portion of the area between the mutually adjacent nozzles. For example, in FIGS. 16A and 16B, the temporary curing light source 68 may be disposed between the head 65A and the head 65B and between the head 65C and the head 65D.
並且,實施例8中,在比兩側的噴頭65A、噴頭65D更靠外側分別配置臨時固化用光源68,但是當一邊僅向一方向移動印刷基板40一邊形成薄膜時,僅在一方配置光源即可。例如,第16圖A及第16圖B中,當一邊僅向Y軸的正方向移動印刷基板40一邊形成薄膜時,無需在比噴頭65A更靠後方(Y軸的負側)配置臨時固化用光源68。 In the eighth embodiment, the temporary curing light source 68 is disposed on the outer side of the head 65A and the head 65D on both sides. However, when the film is formed while moving the printed circuit board 40 in only one direction, the light source is disposed only on one side. can. For example, in FIG. 16 and FIG. 16B, when a film is formed while moving the printed circuit board 40 only in the positive direction of the Y-axis, it is not necessary to arrange the temporary curing for the rear side (the negative side of the Y-axis) of the head 65A. Light source 68.
第21圖A中示出著落於與X軸平行之1條直線上之液滴的俯視圖,第21圖B中示出沿第21圖A的一點虛線21B-21B之截面圖。最下方附著從噴頭65A的噴嘴列67a、噴嘴列67b吐出之液滴149Aa、液滴149Ab。在液滴149Aa與液滴149Ab之間附著從噴頭65B的噴嘴列67a、噴嘴列67b吐出之液滴149Ba、液滴149Bb。在從 噴頭65B的噴嘴吐出之液滴著落於印刷基板40(第19圖A)之前,臨時固化液滴149Aa及液滴149Ab。因此,液滴149Ba及液滴149Bb不會與液滴149Aa及液滴149Ab混合。由此,液滴149Ba及液滴149Bb的外周附近與液滴149Aa及液滴149Ab重疊。 Fig. 21A shows a plan view of a droplet landing on a straight line parallel to the X-axis, and Fig. 21B shows a cross-sectional view taken along a dotted line 21B-21B of Fig. 21A. Droplet 149Aa and droplet 149Ab discharged from the nozzle row 67a of the head 65A and the nozzle row 67b are attached to the lowermost portion. Droplets 149Ba and 149Bb discharged from the nozzle row 67a of the head 65B and the nozzle row 67b are attached between the droplet 149Aa and the droplet 149Ab. In from The droplets ejected from the nozzles of the head 65B are placed before the printed circuit board 40 (Fig. 19A), and the liquid droplets 149Aa and 149Ab are temporarily solidified. Therefore, the droplets 149Ba and 149Bb are not mixed with the droplets 149Aa and 149Ab. Thereby, the vicinity of the outer periphery of the droplet 149Ba and the droplet 149Bb overlaps with the droplet 149Aa and the droplet 149Ab.
另外,從噴頭65C的噴嘴列67a吐出之液滴149Ca與液滴149Aa和液滴149Ba的境界線重疊,從噴頭65C的噴嘴列67b吐出之液滴149Cb與液滴149Ab和液滴149Bb的境界線重疊。另外,從噴頭65D的噴嘴列67a吐出之液滴149Da與液滴149Ab和液滴149Ba的境界線重疊,從噴頭65D的噴嘴列67b吐出之液滴149Db與液滴149Aa和液滴149Bb的境界線重疊。 Further, the droplet 149Ca discharged from the nozzle row 67a of the head 65C overlaps with the boundary line of the droplet 149Aa and the droplet 149Ba, and the boundary between the droplet 149Cb and the droplet 149Ab and the droplet 149Bb discharged from the nozzle row 67b of the head 65C is discharged. overlapping. Further, the droplet 149Da discharged from the nozzle row 67a of the head 65D overlaps with the boundary line of the droplet 149Ab and the droplet 149Ba, and the boundary between the droplet 149Db discharged from the nozzle row 67b of the head 65D and the droplet 149Aa and the droplet 149Bb overlapping.
第22圖A中示出基於比較例之噴頭65A~65D的配置。比較例中,噴頭65B~65D分別相對於噴頭65A向X軸的負方向僅偏離P/4、2P/4、3P/4。與第16圖B所示之實施例8的情況相同地,噴頭65A~65D上形成有2列噴嘴列67a、噴嘴列67b。 The arrangement of the heads 65A to 65D based on the comparative example is shown in Fig. 22A. In the comparative example, the heads 65B to 65D are respectively shifted by P/4, 2P/4, and 3P/4 in the negative direction of the X-axis with respect to the head 65A. Similarly to the case of the eighth embodiment shown in Fig. 16B, the nozzles 65A to 65D are formed with two rows of nozzle rows 67a and nozzle rows 67b.
第22圖B中示出使用基於比較例之配置的噴頭65A~65D形成之直線截面圖。從噴頭65A的噴嘴列67a吐出之液滴149Aa、從噴頭65B的噴嘴列67a吐出之液滴149Ba、從噴頭65C的噴嘴列67a吐出之液滴149Ca及從噴頭65D的噴嘴列67a吐出之液滴149Da以該順序朝向X軸的正方向配置。位於X軸的正側之液滴重疊在位於負側之液滴上。 Fig. 22B is a linear cross-sectional view showing the use of the heads 65A to 65D based on the configuration of the comparative example. Droplets 149Aa discharged from the nozzle row 67a of the head 65A, droplets 149Ba discharged from the nozzle row 67a of the head 65B, droplets 149Ca discharged from the nozzle row 67a of the head 65C, and droplets discharged from the nozzle row 67a of the head 65D The 149Da is arranged in this order toward the positive direction of the X-axis. The droplets on the positive side of the X-axis overlap the droplets on the negative side.
每次在臨時固化之液滴上重疊接著吐出的液滴時,液滴頂點的高度都會被增高。因此,由液滴構成之直線的高低差在長邊方向會變大。 The height of the apex of the droplet is increased each time the droplet that is subsequently ejected is superimposed on the temporarily solidified droplet. Therefore, the height difference of the straight line formed by the droplets becomes large in the longitudinal direction.
實施例8時,如第21圖B所示,液滴149Ba著落之後在比液滴149Ba更靠X軸的負側著落液滴149Ca,之後,在比液滴149Ba更靠X軸的正側著落液滴149Da。亦即,隨著時間經過,著落位置並非僅向X軸的正方向一方向移動,而是向正方向及負方向兩個方向移動。因此,能夠縮小由液滴構成之直線的高低差。 In the case of the eighth embodiment, as shown in Fig. 21B, after the droplet 149Ba is landed, the droplet 149Ca is landed on the negative side of the X-axis than the droplet 149Ba, and then landed on the positive side of the X-axis than the droplet 149Ba. Droplet 149Da. That is, as time passes, the landing position does not move only in the positive direction of the X-axis, but in both the positive and negative directions. Therefore, it is possible to reduce the height difference of the straight line formed by the liquid droplets.
第23圖中示出基於實施例9之薄膜形成裝置的噴頭的結構及配置。以下,對與實施例8的不同點進行說明,對相同的結構省略說明。 Fig. 23 is a view showing the structure and arrangement of a head according to the film forming apparatus of the ninth embodiment. Hereinafter, differences from the eighth embodiment will be described, and the description of the same configurations will be omitted.
實施例8中,噴頭65A~65D分別形成有2列噴嘴列67a、噴嘴列67b,但是在實施例9中,形成有1列噴嘴列67。噴嘴列67由以間距P向X方向排列之複數個噴嘴孔66構成。實施例8中,如第18圖A所示,時刻tAa時從噴嘴列67a吐出液滴,時刻tAb時從噴嘴列67b吐出液滴,由此使液滴附著在1條直線上。實施例9中,能夠藉由從1條噴嘴列67同時吐出液滴來使液滴附著在1條直線上。 In the eighth embodiment, the nozzles 65A to 65D are formed with two rows of nozzle rows 67a and nozzle rows 67b. However, in the ninth embodiment, one row of nozzle rows 67 is formed. The nozzle row 67 is composed of a plurality of nozzle holes 66 arranged in the X direction at a pitch P. In the eighth embodiment, as shown in Fig. 18A, at the time tAa, the liquid droplets are discharged from the nozzle row 67a, and at the time tAb, the liquid droplets are discharged from the nozzle row 67b, whereby the liquid droplets are adhered to one straight line. In the ninth embodiment, droplets can be simultaneously ejected from one nozzle row 67 to adhere the droplets to one straight line.
與實施例8相同地,噴頭65B、噴頭65C、噴頭65D分別相對於噴頭65A向X軸的負方向僅偏離2P/4、P/4、 3P/4而配置。另外,在與實施例8相同的位置配置有臨時固化用光源68。因此,在實施例9中亦能夠高精確度地形成微細的圖案,並能夠縮小由液滴構成之直線的高低差。 Similarly to the eighth embodiment, the head 65B, the head 65C, and the head 65D are respectively shifted by 2P/4, P/4 in the negative direction of the X-axis with respect to the head 65A. 3P/4 configuration. Further, a temporary curing light source 68 is disposed at the same position as in the eighth embodiment. Therefore, in the ninth embodiment, the fine pattern can be formed with high precision, and the height difference of the straight line formed by the liquid droplets can be reduced.
第24圖中示出基於實施例10之薄膜形成裝置的噴頭的配置。以下,對與實施例8的不同點進行說明,對相同的結構省略說明。 The configuration of the head according to the film forming apparatus of Example 10 is shown in Fig. 24. Hereinafter, differences from the eighth embodiment will be described, and the description of the same configurations will be omitted.
實施例8中,如第16圖B所示,噴頭65C及噴頭65D分別相對於噴頭65A向X軸的負方向僅偏離P/4、3P/4。實施例10中,噴頭65C及噴頭65D的偏離量分別與實施例8的噴頭65D及噴頭65C的偏離量替換。噴頭65A~65D各自的結構與實施例8的噴頭65A的結構相同。 In the eighth embodiment, as shown in Fig. 16B, the head 65C and the head 65D are respectively shifted by P/4 and 3P/4 in the negative direction of the X-axis with respect to the head 65A. In the tenth embodiment, the amounts of deviation between the head 65C and the head 65D are replaced with the amounts of deviation between the head 65D and the head 65C of the eighth embodiment, respectively. The respective structures of the heads 65A to 65D are the same as those of the head 65A of the eighth embodiment.
對噴頭65A~65D附加序列號1~4。對向與Y軸垂直之假想平面垂直投影噴頭65A~65D的噴嘴孔66之圖像亦分別附加序列號1、2、3、4。此時,附加在噴嘴孔66的圖像之序列號向X方向以1、4、2、3的順序排列。 Serial numbers 1 to 4 are attached to the nozzles 65A to 65D. Serial numbers 1, 2, 3, and 4 are also attached to the images of the nozzle holes 66 of the vertical projection heads 65A to 65D perpendicular to the imaginary plane perpendicular to the Y-axis. At this time, the serial number of the image attached to the nozzle hole 66 is arranged in the order of 1, 4, 2, and 3 in the X direction.
在實施例10中與實施例8的情況相同地,噴嘴孔66的圖像在X方向並未以序列號順序排列。因此,能夠縮小由液滴構成之直線的高低差。 In the tenth embodiment, as in the case of the eighth embodiment, the images of the nozzle holes 66 are not arranged in the order of the serial numbers in the X direction. Therefore, it is possible to reduce the height difference of the straight line formed by the liquid droplets.
第25圖中示出基於實施例11之薄膜形成裝置的噴頭的配置。以下,對與實施例8的不同點進行說明,對相同的結構省略說明。 The configuration of the head according to the thin film forming apparatus of Example 11 is shown in Fig. 25. Hereinafter, differences from the eighth embodiment will be described, and the description of the same configurations will be omitted.
實施例8中,向Y方向排列有4個噴頭65A~65D,但是實施例11中,向Y方向排列有6個噴頭65A~65F。噴頭65A~65F各自的結構與實施例8的噴頭65A的結構相同。噴頭65B~65F分別相對於噴頭65A向X軸的負方向僅偏離2P/6、4P/6、P/6、3P/6、5P/6。 In the eighth embodiment, four heads 65A to 65D are arranged in the Y direction. However, in the eleventh embodiment, six heads 65A to 65F are arranged in the Y direction. The respective structures of the heads 65A to 65F are the same as those of the head 65A of the eighth embodiment. The heads 65B to 65F are respectively shifted by 2P/6, 4P/6, P/6, 3P/6, and 5P/6 in the negative direction of the X-axis with respect to the head 65A.
向與Y軸垂直之假想平面垂直投影噴頭65A~65F的噴嘴孔66之圖像向X方向以間距P/6排列。因此,與基於實施例8之薄膜形成裝置相比,能夠形成分辨率較高之圖形。 The images of the nozzle holes 66 of the vertical projection heads 65A to 65F perpendicular to the imaginary plane perpendicular to the Y-axis are arranged at a pitch P/6 in the X direction. Therefore, it is possible to form a pattern having a higher resolution than the film forming apparatus according to the eighth embodiment.
與實施例8的情況相同地,對噴頭65A~65F分別附加序列號1~6。對向與Y軸垂直之假想平面垂直投影噴頭65A~65F的噴嘴孔66之圖像亦分別附加序列號1、2、3、4、5、6。此時,序列號1、4、2、5、3、6的噴嘴孔66的圖像以列舉之順序向X方向排列。由於噴嘴孔66的圖像在X方向並未以序列號順序排列,所以能夠縮小由液滴構成之直線的高低差。 In the same manner as in the eighth embodiment, serial numbers 1 to 6 are attached to the heads 65A to 65F, respectively. Serial numbers 1, 2, 3, 4, 5, and 6 are also attached to the images of the nozzle holes 66 of the vertical projection heads 65A to 65F perpendicular to the imaginary plane perpendicular to the Y-axis. At this time, the images of the nozzle holes 66 of the serial numbers 1, 4, 2, 5, 3, and 6 are arranged in the X direction in the order listed. Since the images of the nozzle holes 66 are not arranged in the order of the serial numbers in the X direction, the height difference of the straight line formed by the liquid droplets can be reduced.
作為薄膜形成對象物例示印刷基板,但是亦能夠在其他基板例如可撓性基板、觸控面板等形成薄膜。 The printed circuit board is exemplified as the film formation target, but a film may be formed on another substrate such as a flexible substrate or a touch panel.
依以上實施例雖對本發明進行了說明,但是本發明不限於這些實施例。對於本領域技術人員來講,例如能夠進行各種變更、改良及組合等是應該理解的。 The present invention has been described based on the above examples, but the present invention is not limited to these examples. It will be understood by those skilled in the art that various modifications, improvements, combinations, etc. can be made.
20‧‧‧筐體 20‧‧‧ housing
21‧‧‧搬入站 21‧‧‧ moving into the station
22‧‧‧第1對準站 22‧‧‧1st alignment station
23‧‧‧第1薄膜材料吐出站 23‧‧‧1st film material discharge station
24‧‧‧基板反轉站(正式固化部) 24‧‧‧Substrate reversing station (formal curing department)
25‧‧‧第2對準站 25‧‧‧2nd alignment station
26‧‧‧第2薄膜材料吐出站 26‧‧‧Second film material discharge station
27‧‧‧搬出站 27‧‧‧ Move out of the station
30‧‧‧直線導引件 30‧‧‧Line guides
31~34‧‧‧昇降器 31~34‧‧‧ Lifter
35‧‧‧搬入傳送帶 35‧‧‧ moving into the conveyor belt
36‧‧‧搬入口 36‧‧‧ Move in
37‧‧‧搬出傳送帶 37‧‧‧Removing conveyor belt
38‧‧‧搬出口 38‧‧‧Moving out
40‧‧‧基板(印刷基板、描繪對象物) 40‧‧‧Substrate (printed substrate, object to be drawn)
41‧‧‧印刷配線區域 41‧‧‧Printed wiring area
42‧‧‧區段 Section 42‧‧‧
50‧‧‧控制裝置 50‧‧‧Control device
51‧‧‧正式固化用光源 51‧‧‧Formal curing light source
55‧‧‧載物台 55‧‧‧stage
56‧‧‧直線導引件 56‧‧‧Line guides
57‧‧‧噴頭單元 57‧‧‧Spray unit
58‧‧‧支撐構件 58‧‧‧Support members
59‧‧‧噴嘴昇降機構 59‧‧‧Nozzle lifting mechanism
60‧‧‧反轉台 60‧‧‧Reversal table
60x‧‧‧連結部 60x‧‧‧Link Department
60y‧‧‧臂部 60y‧‧‧arms
61‧‧‧正式固化用光源 61‧‧‧Formal curing light source
62‧‧‧旋轉軸 62‧‧‧Rotary axis
64‧‧‧噴嘴夾具 64‧‧‧Nozzle fixture
65、65A、65B、65C、65D‧‧‧噴頭 65, 65A, 65B, 65C, 65D‧‧‧ nozzle
66‧‧‧噴嘴孔 66‧‧‧Nozzle hole
67、67a、67b‧‧‧噴嘴列 67, 67a, 67b‧‧‧ nozzle column
68‧‧‧臨時固化用光源 68‧‧‧ Temporary curing light source
70‧‧‧昇降板 70‧‧‧ lifting plate
71‧‧‧昇降銷 71‧‧‧lifting pin
72‧‧‧吸附墊片 72‧‧‧Adsorption gasket
73‧‧‧局部固化用光源 73‧‧‧Local curing light source
74‧‧‧吸附墊片 74‧‧‧Adsorption gasket
75‧‧‧保持銷 75‧‧‧ Keep selling
77‧‧‧昇降銷 77‧‧‧lifting pin
78‧‧‧機械手臂 78‧‧‧ Robotic arm
80‧‧‧薄膜 80‧‧‧ film
81‧‧‧表層部 81‧‧‧Surface
82‧‧‧墊片接觸區域 82‧‧‧shield contact area
83‧‧‧墊片接觸區域內的薄膜材料 83‧‧‧film material in the contact area of the gasket
84‧‧‧吸引流路 84‧‧‧Attracting the flow path
90‧‧‧局部固化用光源 90‧‧‧Local curing light source
101‧‧‧支撐構件 101‧‧‧Support members
102‧‧‧紫外光源 102‧‧‧UV source
106‧‧‧導引件 106‧‧‧Guide
120‧‧‧平板 120‧‧‧ tablet
121‧‧‧移動機構 121‧‧‧Mobile agencies
122‧‧‧Y載物台 122‧‧‧Y stage
123‧‧‧X載物台 123‧‧‧X stage
124‧‧‧θ載物台 124‧‧‧θ stage
125‧‧‧保持機構 125‧‧‧ Keeping institutions
130‧‧‧支柱 130‧‧‧ pillar
131‧‧‧梁 131‧‧‧ beams
132‧‧‧攝像裝置 132‧‧‧ camera
133‧‧‧控制裝置 133‧‧‧Control device
147Aa、147Ab、147Ba、147Bb、147Ca、147Cb、147Da、147Db‧‧‧著落點 147Aa, 147Ab, 147Ba, 147Bb, 147Ca, 147Cb, 147Da, 147Db‧‧‧ landing points
148A、148B、148C、148D‧‧‧與噴頭對置之區域 148A, 148B, 148C, 148D‧‧‧ areas opposite the nozzle
149Aa、149Ab、149Ba、149Bb、149Ca、149Cb、149Da、149Db‧‧‧液滴 149Aa, 149Ab, 149Ba, 149Bb, 149Ca, 149Cb, 149Da, 149Db‧‧‧ droplets
151‧‧‧液滴 151‧‧‧ droplets
152‧‧‧滲入 152‧‧‧Infiltration
155A、155B、155C、155D‧‧‧噴嘴圖像 155A, 155B, 155C, 155D‧‧‧ nozzle image
156‧‧‧假想平面 156‧‧‧imaginary plane
160‧‧‧發光二極管 160‧‧‧Light-emitting diodes
161‧‧‧柱面透鏡 161‧‧‧ cylindrical lens
第1圖係基於實施例1之薄膜形成裝置的概要圖。 Fig. 1 is a schematic view showing a film forming apparatus based on Example 1.
第2圖係基於實施例1之薄膜形成裝置的第1對準站、第1薄膜材料吐出站及反轉站的俯視圖。 Fig. 2 is a plan view showing a first alignment station, a first film material discharge station, and a reversing station of the film forming apparatus of the first embodiment.
第3圖A係沿第2圖的一點虛線3A-3A之截面圖,第3圖B係沿第3圖A的一點虛線3B-3B之截面圖。 Fig. 3A is a cross-sectional view taken along a dashed line 3A-3A of Fig. 2, and Fig. 3B is a cross-sectional view taken along a dashed line 3B-3B of Fig. 3A.
第4圖A係基於實施例1之薄膜形成裝置的噴頭單元的立體圖,第4圖B係噴頭及臨時固化用光源的仰視圖,第4圖C係噴頭及基板的俯視圖。 Fig. 4A is a perspective view of a head unit of the film forming apparatus of the first embodiment, Fig. 4B is a bottom view of the head and the light source for temporary curing, and Fig. 4C is a plan view of the head and the board.
第5圖A~第5圖D係用基於實施例1之薄膜形成裝置從載物台接收基板時的載物台及輸送裝置的側視圖。 5A to 5D are side views of the stage and the conveying device when the substrate is received from the stage by the film forming apparatus of the first embodiment.
第6圖A係顯示基板、昇降銷及臨時固化用光源的位置關係之俯視圖,第6圖B係基板及臨時固化後的薄膜的截面圖,第6圖C係基板及局部固化後的薄膜的截面圖。 Fig. 6A is a plan view showing the positional relationship between the substrate, the lift pins, and the light source for temporary curing, and Fig. 6B is a cross-sectional view of the substrate and the temporarily cured film, and Fig. 6C is a substrate and a partially cured film. Sectional view.
第7-1圖中,第7圖A及第7圖B係反轉站的反轉台及正式固化用光源的立體圖。 In Fig. 7-1, Fig. 7A and Fig. 7B are perspective views of the inversion stage of the inversion station and the light source for main curing.
第7-2圖中,第7圖C及第7圖D係反轉站的反轉台及正式固化用光源的立體圖。 In Fig. 7-2, Fig. 7C and Fig. 7D are perspective views of the inversion stage of the inversion station and the light source for main curing.
第7-3圖中,第7圖E及第7圖F係反轉站的反轉台及正式固化用光源的立體圖。 In Fig. 7-3, Fig. 7E and Fig. 7F are perspective views of the inversion stage of the inversion station and the light source for main curing.
第8圖係基於實施例2之薄膜形成裝置的第1薄膜材料吐出站的俯視圖。 Fig. 8 is a plan view showing a first film material discharge station based on the film forming apparatus of the second embodiment.
第9圖A~第9圖D係用基於實施例2之薄膜形成裝置進行薄膜的局部固化時的第1薄膜材料吐出站的俯視圖。 9A to 9D are plan views of the first film material discharge station when the film is partially cured by the film forming apparatus of the second embodiment.
第10圖A係由基於實施例3之薄膜形成方法製作之基板及薄膜的俯視圖,第10圖B係沿第10圖A的一點虛線10B-10B之截面圖。 Fig. 10A is a plan view of a substrate and a film produced by the film forming method of Example 3, and Fig. 10B is a cross-sectional view taken along a dashed line 10B-10B of Fig. 10A.
第11圖A及第11圖B係基於實施例4之薄膜形成裝置的輸送裝置、基板及載物台的截面圖。 11A and 11B are cross-sectional views of a transport device, a substrate, and a stage based on the thin film forming apparatus of the fourth embodiment.
第12圖A~第12圖D係用基於實施例5之薄膜形成裝置將基板從載物台交接到輸送裝置時的基板、載物台及輸送裝置的截面圖。 12A to 12D are cross-sectional views of a substrate, a stage, and a transport apparatus when a substrate is transferred from a stage to a transport apparatus by the thin film forming apparatus of the fifth embodiment.
第13圖A~第13圖E係顯示用基於實施例6之薄膜形成裝置同時並排進行正式固化和表裏反轉之順序之圖。 Fig. 13 to Fig. 13 to Fig. E are views showing the order of simultaneous solidification and in-situ reversal by side-by-side with the film forming apparatus of Example 6.
第14圖A~第14圖D係顯示用基於實施例7之薄膜形成裝置同時並排進行正式固化和表裏反轉之例子之圖。 Fig. 14 to Fig. 14D are diagrams showing an example in which the film forming apparatus according to the seventh embodiment is used for simultaneous solidification and surface inversion at the same time.
第15圖係基於實施例8之薄膜形成裝置(描繪裝置)的概要圖。 Fig. 15 is a schematic view showing a film forming apparatus (drawing device) based on Example 8.
第16圖A係基於實施例8之薄膜形成裝置的噴嘴單元的立體圖,第16圖B係噴嘴單元的仰視圖。 Fig. 16A is a perspective view of a nozzle unit based on the film forming apparatus of the eighth embodiment, and Fig. 16B is a bottom view of the nozzle unit.
第17圖係顯示噴嘴與噴嘴的圖像的關係之圖。 Figure 17 is a diagram showing the relationship between the nozzle and the image of the nozzle.
第18圖A係顯示從噴嘴吐出之液滴的著落點的X坐標與吐出時刻的關係之圖,第18圖B係顯示印刷基板上的著落點的位置之圖。 Fig. 18 is a view showing the relationship between the X coordinate of the landing point of the liquid droplet discharged from the nozzle and the discharge timing, and Fig. 18B is a view showing the position of the landing point on the printed substrate.
第19圖A係噴嘴單元及印刷基板的主視圖,第19 圖B係光源的概要圖。 Figure 19A is a front view of the nozzle unit and the printed circuit board, 19th Figure B is a schematic view of a light source.
第20圖A~第20圖D係顯示吐出之液滴的形狀的時間變化之圖。 Fig. 20A to Fig. 20D are diagrams showing temporal changes in the shape of the discharged droplets.
第21圖A係藉由著落於印刷基板上之液滴形成之(被描繪之)直線俯視圖,第21圖B係沿第21圖A的一點虛線21B-21B之截面圖。 Fig. 21A is a plan view of a straight line formed by droplets landing on a printed substrate, and Fig. 21B is a cross-sectional view taken along a dotted line 21B-21B of Fig. 21A.
第22圖A係基於比較例之噴嘴單元的仰視圖,第22圖B係利用基於比較例之噴嘴單元形成之(被描繪之)直線截面圖。 Fig. 22A is a bottom view of a nozzle unit based on a comparative example, and Fig. 22B is a (cross-sectional view) line view formed by a nozzle unit based on a comparative example.
第23圖係基於實施例9之薄膜形成裝置的噴嘴單元的仰視圖。 Fig. 23 is a bottom view of the nozzle unit of the film forming apparatus of Example 9.
第24圖係基於實施例10之薄膜形成裝置的噴嘴單元的仰視圖。 Fig. 24 is a bottom view of a nozzle unit based on the film forming apparatus of Example 10.
第25圖係基於實施例11之薄膜形成裝置的噴嘴單元的仰視圖。 Fig. 25 is a bottom view of the nozzle unit of the film forming apparatus of Example 11.
24‧‧‧基板反轉站(正式固化部) 24‧‧‧Substrate reversing station (formal curing department)
23‧‧‧第1薄膜材料吐出站 23‧‧‧1st film material discharge station
56‧‧‧直線導引件 56‧‧‧Line guides
57‧‧‧噴頭單元 57‧‧‧Spray unit
58‧‧‧支撐構件 58‧‧‧Support members
22‧‧‧第1對準站 22‧‧‧1st alignment station
30‧‧‧直線導引件 30‧‧‧Line guides
60‧‧‧反轉台 60‧‧‧Reversal table
61‧‧‧正式固化用光源 61‧‧‧Formal curing light source
40‧‧‧基板(印刷基板、描繪對象物) 40‧‧‧Substrate (printed substrate, object to be drawn)
32‧‧‧昇降器 32‧‧‧ Lifter
55‧‧‧載物台 55‧‧‧stage
31‧‧‧昇降器 31‧‧‧ Lifter
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JP2012096653A JP2013233472A (en) | 2011-07-27 | 2012-04-20 | Thin film formation method and thin film formation apparatus |
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JP6156633B2 (en) * | 2013-06-28 | 2017-07-05 | 住友重機械工業株式会社 | Thin film forming method and thin film forming apparatus |
JP6085578B2 (en) * | 2014-03-11 | 2017-02-22 | 住友重機械工業株式会社 | Film forming method and film forming apparatus |
CN109720105A (en) * | 2019-03-13 | 2019-05-07 | 苏州星烁纳米科技有限公司 | For printing the spray head of quantum dispensing liquid |
CN109720104A (en) * | 2019-03-13 | 2019-05-07 | 苏州星烁纳米科技有限公司 | It is used to prepare the ink jet printing device of quantum dot colour filter |
DE102020113109B4 (en) * | 2020-05-14 | 2023-07-06 | Schmoll Maschinen Gmbh | Processing station and method for checking or identifying plate-shaped workpieces |
CN117062324A (en) * | 2023-08-10 | 2023-11-14 | 淮安特创科技有限公司 | Automatic adjust etching liquid concentration and linear speed device |
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US20030049377A1 (en) * | 2001-09-11 | 2003-03-13 | Chesnut W. Richard | Machine and method for making a rotogravure printing medium |
US6841096B2 (en) * | 2001-10-08 | 2005-01-11 | California Institute Of Technology | Microfabricated lenses, methods of manufacture thereof, and applications therefor |
JP2004170526A (en) | 2002-11-18 | 2004-06-17 | Tokyo Electron Ltd | Method and device for manufacturing liquid crystal display element |
US7510277B2 (en) * | 2004-03-01 | 2009-03-31 | Fujifilm Corporation | Image forming apparatus and method |
JP2006289226A (en) | 2005-04-08 | 2006-10-26 | Seiko Epson Corp | Film forming method, method for producing electrical circuit, and droplet ejection apparatus |
JP2008073647A (en) * | 2006-09-22 | 2008-04-03 | Fujifilm Corp | Liquid discharge apparatus and method of forming resist pattern |
CN101626881B (en) * | 2007-01-17 | 2012-11-14 | 3D系统公司 | Imager assembly and method for solid imaging |
JP2008203485A (en) * | 2007-02-20 | 2008-09-04 | Epson Imaging Devices Corp | Method for manufacturing liquid crystal device |
CN101585233B (en) * | 2009-06-24 | 2011-06-22 | 唐少林 | Ice-light solidifying quick forming device and using method thereof |
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2012
- 2012-07-02 KR KR1020120071653A patent/KR101322198B1/en active IP Right Grant
- 2012-07-05 TW TW101124279A patent/TWI471908B/en active
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Cited By (1)
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CN106914392A (en) * | 2017-05-09 | 2017-07-04 | 宁波视睿迪光电有限公司 | A kind of UV curing and 3D display solidification equipments |
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KR20130006316A (en) | 2013-01-16 |
CN102861706A (en) | 2013-01-09 |
KR101322198B1 (en) | 2013-10-28 |
TWI471908B (en) | 2015-02-01 |
CN102861706B (en) | 2015-09-30 |
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