TW201247913A - Film forming apparatus - Google Patents

Film forming apparatus Download PDF

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Publication number
TW201247913A
TW201247913A TW101104817A TW101104817A TW201247913A TW 201247913 A TW201247913 A TW 201247913A TW 101104817 A TW101104817 A TW 101104817A TW 101104817 A TW101104817 A TW 101104817A TW 201247913 A TW201247913 A TW 201247913A
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TW
Taiwan
Prior art keywords
film forming
substrate
processed
forming material
capturing
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TW101104817A
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Chinese (zh)
Inventor
Hiroshi Kaneko
Teruyuki Hayashi
Yuji Ono
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Tokyo Electron Ltd
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Publication of TW201247913A publication Critical patent/TW201247913A/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

A film forming device is provided to prevent the separation of film forming materials between a processing substrate and the upper side of a processing chamber by arranging capturing units between first to sixth deposition heads and on both sides of a transfer direction. A film forming device includes a processing chamber(11) and a film forming material spraying unit(13). The processing chamber receives a substrate(G) and includes a capturing unit(16). The film forming material spraying unit sprays steam of the film forming material to a substrate. A capturing unit captures the film forming materials separated from the substrate and includes a plurality of gaps or holes to input the film forming materials from the substrate.

Description

201247913 六、發明說明: 【發明所屬之技術領域】 本發明係關於-種成膜裝置,係具備有使得成膜 材料之蒸氣朝向被處理基板噴出之成膜材料喷出部。 【先前技術】 於專利文獻1當中揭示了一種以蒸鏡法來製造有 機EL元件之成膜裳置。成膜裝置係具備有收容玻璃基 板等被處理基板的處理室,而產生成膜材料I氣的落 氣產生部配置於處理室外部。處理室之内部係設置有 成,材料喷出部’其通過配管而連接於蒸氣產生部, 將蒸氣產生部所產生之賴材料蒸氣朝麵基板喷 出。成膜材料噴出部具有並列設置之複數蒗 蒸鏡頭分別噴出不同的成膜材料。 ° 先前技術文獻 專利文獻1國際公開第2008/066103號小冊 【發明内容】 本案申請人發現有下述問題:從蒸鍍頭噴射之成 膜材料會在被處理基板與處理室或是其他蒸鍍頭之間 反彈,而在非應該蒸鍍之部位附著成膜材料;或是來 自各成膜材料喷出部之蒸氣相混而以雜質的形式混入 鄰接之膜中。此外,專利文獻1所記载之成膜^置並 未揭示成骐材料反彈之問題、以及用來解決該問題之 201247913 構成。 本發日狀錢H,係具備有:處 反;以及,成膜材料嘴出部,係將成膜材料;= =理基板喷出;其特徵在於:係於該處理室之内 有可將從軸蹄㈣出部在刻^理基板反彈 之成膜材料加以捕捉之捕捉部。[Technical Field] The present invention relates to a film forming apparatus including a film forming material discharge portion that ejects vapor of a film forming material toward a substrate to be processed. [Prior Art] Patent Document 1 discloses a film forming skirt in which an organic EL element is produced by a steam mirror method. The film forming apparatus is provided with a processing chamber for accommodating a substrate to be processed such as a glass substrate, and a gas generating portion for generating a film forming material I is disposed outside the processing chamber. The inside of the processing chamber is provided, and the material ejecting portion is connected to the vapor generating portion by a pipe, and the vapor of the material generated by the steam generating portion is ejected toward the surface substrate. The film forming material ejection portion has a plurality of vapor deposition lenses arranged in parallel to eject different film forming materials. ° Prior Art Document Patent Document 1 International Publication No. 2008/066103 Booklet [Invention] The applicant of the present application found the following problem: the film-forming material sprayed from the vapor deposition head will be in the substrate to be treated and the processing chamber or other steaming. The plating heads are rebounded, and the film forming material is attached to the portions which are not to be vapor-deposited; or the vapors from the respective film forming material ejection portions are mixed and mixed into the adjacent film as impurities. Further, the film formation described in Patent Document 1 does not disclose the problem that the ruthenium material rebounds, and the composition of 201247913 for solving the problem. The hair date H of the hair is provided with: a reverse; and a film forming material is a film forming material; = = a substrate is ejected; and is characterized in that it is within the processing chamber A capturing portion that captures a film forming material that rebounds from the substrate by the hoof (4).

依據本♦明’可防止從蒸鍍頭噴射之成膜材料在 被處理基板與處理室或是其他級頭之間反彈而在非 應該蒸鍍之部位附著成膜材料、或是防止來自各成膜 材料喷出部之蒸氣相混而以雜質的形式混入鄰接之膜 中。 【實施方式】 以下’基於顯示實施形態之圖式來詳述本發明。 圖1係示意說明本實施形態之成膜系統之一構成 例的說明圖。本實施形態之成膜系統之構成包括:沿 著被處理基板G(參見圖3)之搬送方向上串聯之裝載器 90、傳送室91、成膜裝置1、傳送室92、蝕刻裝置93、 傳送室94、濺鍍裝置95、傳送室96、CVD裝置97、 傳送室98、以及卸載器99。 裝載器90係用以將被處理基板G(例如事先於表 面形成有ITO層之玻璃基板G)搬入成膜系統内之裝 置。傳送室91、92、94、96、98係用以在各處理裝置 間來收授被處理基板G的裝置。 5 201247913 成膜裝置i係用以利用真空蒸鑛法來於被處理基 板G上形成電洞注入層、電洞輸送層、藍發光層、紅 發光層、綠發光層、以及電子輸送層乃至電子注入層 的裝置。詳細内容如後述。 蝕刻裝置93係用以將有機層形狀調整為既定形 狀之裂置。 、,濺鍍裝置95係使用圖案罩體來濺鍍例如銀Ag、 鎮Mg/銀Ag合金等以於電子輸送層上形成陰極層之 裝置。 η 、Vt>l置97係藉由CVD法等來形成氮化膜等所 構成之密封層’來將形成於玻璃基板(}上各種膜加以 密封之裴置。 卸载器99係用以將被處理基板g搬出成膜系统外 之裝置。 ' 圖2係示意顯示成膜裝置1之一構成例之立體 圖,圖3係示意顯示成膜裝置1之一構成例之側戴面 圖,圖4係圖3之IV-IV線截面圖。成膜裝置!係包含 〇 有·收谷被處理基板G之處理室11、以及將成膜材料 之条氣往被處理基板G喷出之成膜材料喷出部13。處 理室11係呈現以搬送方向為長邊方向之中空大致長方 體形狀,由IS、不鏽鋼等所構成。於處理室11之長邊 方向的一端侧之面(圖2中背面侧之面)形成有用以將 被處理基板G搬入處理室11内之搬入口 na,於長邊 方向另一端側之面(圖2中前侧面)形成有用以將被處 6 201247913 搬出處理室u外之搬出口 nb。搬入口⑴ Ϊ搬出口 llb係具有相對於搬入方向呈正交之長邊方 =狹縫狀’搬入口 lla與搬出口 nb之長邊方向大 :同-。以下,將搬入口 lla與搬出口 ub之長邊方 =稱為橫向,將和該横向與搬送方向呈正交之方向稱According to the invention, the film-forming material sprayed from the vapor deposition head can be prevented from rebounding between the substrate to be processed and the processing chamber or other heads, and the film-forming material can be attached to the portion which is not to be vapor-deposited, or can be prevented from being formed. The vapor of the film material discharge portion is mixed and mixed into the adjacent film as impurities. [Embodiment] Hereinafter, the present invention will be described in detail based on the drawings showing the embodiments. Fig. 1 is an explanatory view schematically showing an example of a configuration of a film forming system of the embodiment. The film forming system of the present embodiment includes a loader 90, a transfer chamber 91, a film forming apparatus 1, a transfer chamber 92, an etching device 93, and a transfer which are connected in series in the transport direction of the substrate G to be processed (see FIG. 3). A chamber 94, a sputtering device 95, a transfer chamber 96, a CVD device 97, a transfer chamber 98, and an unloader 99. The loader 90 is a device for carrying a substrate G to be processed (for example, a glass substrate G on which an ITO layer is formed in advance) into a film formation system. The transfer chambers 91, 92, 94, 96, 98 are devices for receiving the substrate G to be processed between the respective processing devices. 5 201247913 The film forming apparatus i is used to form a hole injection layer, a hole transport layer, a blue light emitting layer, a red light emitting layer, a green light emitting layer, an electron transport layer, and even an electron on the substrate G to be processed by a vacuum evaporation method. A device for injecting layers. The details will be described later. The etching device 93 is for adjusting the shape of the organic layer to a predetermined shape. The sputtering apparatus 95 is a device for sputtering a metal layer such as silver Ag, a town Mg/silver Ag alloy or the like on the electron transport layer by using a pattern cover. η, Vt>l is a device in which a sealing layer formed of a nitride film or the like is formed by a CVD method or the like to seal various films formed on a glass substrate. The unloader 99 is used to be FIG. 2 is a perspective view schematically showing a configuration example of the film forming apparatus 1, and FIG. 3 is a side view showing a configuration example of the film forming apparatus 1. FIG. Fig. 3 is a cross-sectional view taken along the line IV-IV of Fig. 3. The film forming apparatus includes a processing chamber 11 including a substrate G to be processed, and a film forming material which ejects a strip of a film forming material onto the substrate G to be processed. The processing unit 11 is formed in a hollow substantially rectangular parallelepiped shape in which the conveying direction is the longitudinal direction, and is composed of IS, stainless steel, etc. on the one end side in the longitudinal direction of the processing chamber 11 (the back side in Fig. 2) The surface of the transfer substrate na for inserting the substrate G to be processed into the processing chamber 11 is formed on the other end side in the longitudinal direction (the front side surface in FIG. 2) to move the portion 6 201247913 out of the processing chamber. Move the exit nb. Move the entrance (1) Ϊ move the exit llb with respect to the mover The long side of the orthogonal direction = the slit shape is the same as the long side direction of the carry-in port 11a and the carry-out port nb: hereinafter, the long side of the carry-in port 11a and the carry-out port ub is referred to as a horizontal direction, and The direction of the transverse direction is orthogonal to the direction of transport

G :个下方向。此外’於收容室之適當部位形成有排氣 =C,配置於處理室U外部之真空泵15係經由排氣 =4而連接於排氣孔Uc。藉由驅動真空果15來將處 王至11之内部減壓至既定壓力例如ι〇_2ρ&。 /於處理室11内部之底部係設置有將被處理基板G 從搬入口 11a側往搬出口 llb側搬送之搬送裝置12。 搬送裝置12係包含有··導執12a,係於處理室u之底 部沿著長邊方向設置者;移動構件12b,係被引導於 該導執12a而可沿著搬送方向亦即前述長邊方向來移 動;以及支撐台12c,係設置於移動構件12b之上端 部,將被處理基板G相對於底部以成為大致平行的方 式加以支撐。於支撐台12c之内部係設有保持被處理 基板G之靜電夾、用以將被處理基板G之溫度保持一 疋之加熱器、冷媒管等。此外,支撐台12c係利用線 性馬達來移動。 此外,於處理室11之上部在搬送方向大致中央部 係設有對被處理基板G以真空蒸鍍法來進行成膜之成 膜材料噴出部13。成膜材料噴出部13係使得用以將 複數之成膜材料蒸氣分別朝向前述被處理基板G來噴 7 201247913 出之複數―頭(亦即蒸錢電洞 之第2蒸錄頭13b、蒸= 層之第4蒸心 ^ ^ ^之弟5瘵鍍碩i3e、以及蒸鍍電子耠样® 二著搬送方向依序配置來構成。、酉: ' 至1外部之蒸氣產生部17係經由配总·^ Ϊ i 材料喷出部13。圖4雖代表性圖二於& 至第t二頭…連接配管叫之構成,惟關於其他第2 〇 土二下來…驗頭⑽及蒸氣產生= 蒸氣產生部17包含有容器17&、配置於G: The direction is down. Further, exhaust gas = C is formed in an appropriate portion of the storage chamber, and the vacuum pump 15 disposed outside the processing chamber U is connected to the exhaust hole Uc via the exhaust gas = 4. The inside of the king to 11 is decompressed to a predetermined pressure such as ι〇_2ρ& by driving the vacuum fruit 15. The bottom of the inside of the processing chamber 11 is provided with a transporting device 12 that transports the substrate G to be processed from the side of the inlet 11a to the side of the outlet llb. The transport device 12 includes a guide 12a that is disposed along the longitudinal direction of the bottom of the processing chamber u, and the moving member 12b is guided to the guide 12a so as to be along the transport direction, that is, the long side. The support table 12c is disposed at an upper end portion of the moving member 12b, and supports the substrate G to be processed so as to be substantially parallel with respect to the bottom portion. Inside the support table 12c, an electrostatic chuck for holding the substrate G to be processed, a heater for holding the temperature of the substrate G to be processed, a refrigerant tube, and the like are provided. Further, the support table 12c is moved by a linear motor. Further, a film forming material discharge portion 13 for forming a film on the substrate G to be processed by a vacuum deposition method is provided in the upper portion of the processing chamber 11 at a substantially central portion in the transport direction. The film forming material ejecting portion 13 is configured to spray a plurality of film forming material vapors toward the substrate G to be processed, respectively, to a plurality of heads (hereinafter, the second steaming head 13b of the steaming hole), steaming = The fourth steaming heart of the layer is ^^^, the fifth 瘵 plating i3e, and the vapor-deposited electronic 耠-like 二 二 二 二 二 二 二 二 二 二 二 二 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ·^ Ϊ i material ejection unit 13. Fig. 4 is a representative view of Fig. 2 from the & to the tth head... the connection piping is called, but the other 2nd clay is down... inspection head (10) and steam generation = steam The generating unit 17 includes a container 17 &

G 構⑺。加熱機構l7b係以將各層心 方式所構成、:才|料UC以電源所供給之電力來加熱的 般=在=:7電:Γ熱的方式叫^ 生有機系成膜材料二;㈣广,熱 遠接古私〜I 氧。此外,於容器i7a係 ㈣赠供給管l8b,用以對被處理基板G供 例如Ar等稀有氣體所構成之輸送氣 以,敕於^ Γχ及輸送氣體供給管18b分別設有用 1剧送乱體以及療氣量之調整閥18c、18d。此外, 供未rrirf;來加熱_18a、輪送氣體 成㈣树”及 錢碩13a。加熱器係用以防止 膜材料17c之蒸氣附著於管内者。成膜材料17c之 8 201247913 ⑭供給管撕供給於容器仏而被 由西的輪送氣體一同從蒸氣產生部】7經 :18a而被供給至第1蒸鍍頭…。 排出、itrr二3蒸氣排出管186設有開闕該蒸氣 幵3關闕18f。此外,於装裔排屮总1 〇 設置加熱該蒸氣排出管18e之:二、、孔排出“8e可 圖5係第i蒸錢頭13a之底 =::=__基“噴射= =呈正交方向上直線狀^==^;^7送 成二 =別限定’只要可大致均勻 再者,成臈裝置i在處理室内部係包含 材料喷出部13所“ 3 暴板G反彈之成膜材料加 皮處理 置在第i至第6蒸锻頭⑽之;數= 方向的上游側、第6蒸㈣13f :::。各捕捉部16由於具有同樣構成,故於::的 月主要針對配置在第丨蒸錢頭13a與第2 下說 之間的捕捉部來說明。 &頌13b 圖6係顯示本實施形態之捕捉部^ 側截面圖。捕捉部16係具有從成膜材料噴出部成::: 201247913 喷出而在被處理基板G反彈之成膜材料可進入的複數 間隙16c。具體而f,捕捉部16係具有隔離壁偷(將 第1蒸鍍頭13a與第2蒸鑛頭l3b加以隔離)以及複數 板部16b(呈大致矩形狀而面對向著),複數板部⑽係 以在被處理基板G側之-邊相較於$丨與第2轉頭 i3M3b更位於被處理基板㈣的方式配置在第i與第 2蒸鍍頭13a,13b之間。間陴於丄丨, 偷所構成。 係由對向之複數板部 / 言,隔離壁16&之下端部(亦即隔離壁i6a 在被處理基板G _部分)㈣於 支撐台12c具有大致平行 、—土极〇次疋 在和第i至第6蒸錢頭13a〜13f 係以 -方向上排列的方式面對向,致同 大致垂直突出。 相對於Μ下面往下方G structure (7). The heating mechanism 17b is formed by a layering method, and the material UC is heated by the electric power supplied by the power source. ===7: The heat is called the organic film forming material; (4) , heat far away from ancient private ~ I oxygen. Further, the container i7a is provided with a supply tube 18b for supplying a transport gas composed of a rare gas such as Ar to the substrate G to be processed, and a transporting gas supply tube 18b for each of the transporting gas supply tubes 18b. And the air volume adjusting valves 18c and 18d. In addition, for the non-rrirf; to heat _18a, the gas into the (four) tree" and Qian Shuo 13a. The heater is used to prevent the vapor of the membrane material 17c from adhering to the tube. The film-forming material 17c of the 8 201247913 14 supply tube tear It is supplied to the container 仏 and is supplied to the first vapor deposition head by the steam generating unit 7 from the steam generating unit 7 through 18a. The discharge, itrr 2 3 vapor discharge pipe 186 is provided with the steam 幵 3 In addition, the steam discharge pipe 18e is heated to be installed in the first row of the shovel: 2, the hole discharge "8e can be the bottom of the i-steam head 13a =::=__ base" The injection == is linear in the orthogonal direction ^==^; ^7 is sent to two = not limited 'as long as it can be substantially uniform, the device i in the processing chamber contains the material ejection portion 13 The film-forming material rebounded by the sheet G is placed on the i-th to sixth steam-forging heads (10); the number = the upstream side of the direction, and the sixth steam (four) 13f:::. Since each of the capturing units 16 has the same configuration, the month of:: is mainly explained for the capturing unit disposed between the second steaming head 13a and the second lower portion. & 13b Fig. 6 is a cross-sectional view showing the capturing portion of the embodiment. The capturing unit 16 has a plurality of gaps 16c into which the film forming material which is ejected from the film forming material ejecting unit: 201247913 and which is bounced on the substrate G to be processed can enter. Specifically, the capturing unit 16 has a partition wall stealing (separating the first vapor deposition head 13a from the second vapor head 1bb) and a plurality of plate portions 16b (facing in a substantially rectangular shape), and the plurality of plate portions (10) The side between the i-th and second vapor-deposited heads 13a and 13b is disposed such that the side on the side of the substrate G to be processed is located closer to the substrate (4) to be processed than the second turn i3M3b. Between the shackles and the scams. By the opposite plurality of plate portions, the lower portion of the partition wall 16 & (i.e., the partition wall i6a is in the processed substrate G _ portion) (d) has substantially parallel to the support table 12c, The i to the sixth steaming heads 13a to 13f are oriented in the direction of the - direction, and are substantially vertically protruded. Relative to the bottom below

更詳細來說,捕捉部1 A 頭13a,13b之橫向大致中1與第2蒸鑛 即板部鳩在法線方向之央。虽捕捉部16之厚度(亦 』时m 门之一側端板部16b盥另一她如 之板部16b的距離)定為D 二另鳊側 下式之情況,即便從第、滿足下式。當滿足 且未碰撞於捕捉部16之^第2蒸錢頭仏,说嘴射More specifically, the lateral direction of the first portion 13a, 13b of the capturing portion 1 A is approximately 1 in the horizontal direction and the second portion, i.e., the plate portion, is at the center of the normal direction. The thickness of the capturing portion 16 (also referred to as the distance between the one end side plate portion 16b of the m-gate and the other plate portion 16b) is defined as D and the other side of the lower side, even if the following formula is satisfied . When it is satisfied and does not collide with the second steaming head of the capturing unit 16, the mouth is shot.

G D^2xdxH/Ad 其中 201247913 d:板部16b之下邊(亦即被處理基板g側之一邊 與被處理基板G的距離 H:前述法線方向之第1蒸鍍頭與最靠近第1蒸錢 頭之板部16b的距離 ' & △d:被處理基板G之法線方向上的板部16b之下GD^2xdxH/Ad where 201247913 d: the lower side of the plate portion 16b (that is, the distance H between the side of the substrate g side to be processed and the substrate G to be processed: the first vapor deposition head in the normal direction and the first steamed money The distance ' & Δd of the head portion 16b: below the plate portion 16b in the normal direction of the substrate G to be processed

邊(亦即被處理基板G側之一邊)與第1蒸鍍頭下端部 的距離 D 〇 圖7係示意顯示捕捉部16作用之說明圖。自第2 喬氣頭13b喷出之成膜材料係於被處理基板〇反彈, 進入構成捕捉部16之複數板部Mb間。圖7中,自第 2+瘵氣頭13b延伸之直線係顯示了從第2蒸氣頭13^ 噴射之成膜材料的執跡。進入板部16b間之成膜材料 係於該板部16b間重複反彈後,附著於板部16b。亦 即,成膜材料被捕捉部16所捕捉。 圖8係示意顯示用以說明捕捉部16作用之實驗事 〇 置的侧面圖。如圖8A所示般,所準備之實驗裝置 1基板2與第2基板3係橫向排列,以從未圖示之蒗 鑛頭所喷射之成膜材料蒸氣不致直接附著於第2基^ 3的方式配置有保護板4。然後,將成膜材料蒗二 1基板2噴射。接著測定於ρ基板2與第 $分別附著之成膜材料的附著量,計算附著量之比。 實驗結果,附著量的比為〇43。亦即,將附著於第1 基板2之成膜材料的附著量定為丨之情況,附著於第 2基板3之成膜材料的附著量為〇43。從此實驗結果 201247913 1基板2與保2喷射之成膜材料的一部份會在身 另一方=之間反彈,而附著於第2基板3 和圖8 A具有同揭』8 B所不般’所準備的實驗裝置卷 為同樣的她心、板5設置與本實施形態 板尊^^後’將成膜材料蒸氣朝第1基 =之成膜材料的附 結果,附著量之比為0〇37。 里〇匕a的The distance between the side (i.e., one side of the substrate G side to be processed) and the lower end portion of the first vapor deposition head D 〇 Fig. 7 is an explanatory view showing the action of the capturing portion 16. The film-forming material ejected from the second Q-head 13b is rebounded from the substrate to be processed, and enters between the plurality of plate portions Mb constituting the capturing portion 16. In Fig. 7, the straight line extending from the 2+th xenon head 13b shows the formation of the film forming material ejected from the second vapor head 13^. The film forming material entering between the plate portions 16b is repeatedly bounced between the plate portions 16b, and adheres to the plate portion 16b. That is, the film forming material is captured by the capturing portion 16. Fig. 8 is a side view schematically showing an experimental matter for explaining the action of the capturing portion 16. As shown in FIG. 8A, the substrate 2 and the second substrate 3 of the prepared experimental apparatus 1 are arranged side by side, and the vapor of the film forming material sprayed from the tantalum head (not shown) is not directly attached to the second substrate. The protection board 4 is configured in a manner. Then, the film forming material 蒗 2 substrate 2 is ejected. Next, the adhesion amount of the film-forming material adhered to each of the ρ substrate 2 and the first sheet was measured, and the ratio of the adhesion amount was calculated. As a result of the experiment, the ratio of the adhesion amount was 〇43. In other words, when the amount of deposition of the film-forming material adhering to the first substrate 2 is 丨, the amount of adhesion of the film-forming material adhering to the second substrate 3 is 〇43. From this experimental result 201247913, a part of the film-forming material of the substrate 2 and the 2 spray will rebound between the other side = and the second substrate 3 and the figure 8A have the same "8 B" The prepared experimental device roll is the same as that of the core plate 5 and the embodiment of the present embodiment, and the film forming material vapor is directed toward the first base = the film forming material, and the ratio of the adhesion amount is 0. 37.里〇匕a

從此實驗結果可知@4σ #。 2所反彈之㈣ 具麵從第1基板 、料加以捕捉而防止成膜材料反彈的 功能。From this experimental result, we know that @4σ #. (2) The function of capturing the material from the first substrate and the material to prevent the film material from rebounding.

本貝》形態’可防止從蒸綱所喷射之成膜材料 在被處理基板G與處理室u或是第〗至第6蒸鐘頭 13a〜13f之間反彈而在非應蒸鍍之部位附著成膜材 料、或是來自第1至第6蒸鍍頭13a〜13f之蒸氣相混 而以雜質的形式混入鄰接膜中。從而可防止於蒸鍛二 種成膜材料之際混入其他種成膜材料後進行蒸鍍^ 此外,於本實施形態,係說明了於隔離壁l6a之 下端部設有複數板部16b之捕捉部16,惟亦可僅以複 數板部16b來構成捕捉部16。 此外,雖舉出在第1至第6蒸鍍頭13a〜13f之間、 以及搬送方向兩側配置捕捉板16的例子來說明,惟捕 捉板16亦可配置於處理至内之其他部位。例如亦可於 處理室上部配置捕捉板16。此種情況,可防止成膜材 12 201247913 料在被處理基板G與處理室上部之間反彈。此外,亦 可於處理室之内側壁以及底部設置捕捉板16。 再者,雖說明了使得複數板部16b以等間隔排列 之捕捉板16,惟各板部16b之間隔亦可不同。當各板 部16b之間隔為非週期性之情況,可能可更有效地捕 捉成膜材料。 再者,於本貫施形態,係針對主要捕捉有機系成 〇 膜材料之捕捉部做了說明,惟本實施形態之捕捉部亦 可適用於形成無機系成膜材料之成膜裝置上。 (變形例1) 變形例1之成膜裝置1僅在捕捉部116之構成上 和實施形態不同,是以以下主要針對上述差異點來說 明。 圖9係顯示變形例1之捕捉部116之一構成例的 侧截面圖。變形例1之捕捉部116係和實施形態同樣 〇 地具有隔離壁116a以及複數板部116b,藉由複數板部 116b來構成間隙116c。複數板部116b在被處理基板G 側之部位係往最接近的第1蒸鍍頭13a或是第2蒸鍍 頭13b側彎曲。例如,位於第1蒸鍍頭13a侧之板部 116b在被處理基板G侧之部位係往第1蒸鍍頭13a側 彎曲,位於第2蒸鑛頭13b側之板部116b在被處理基 板G侧之部位係往第2蒸鍍頭13b側彎曲。其他配置 於第2至第6蒸鍍頭13b〜13f間的捕捉部116也為同 樣構成。 13 201247913 於變形例1 ’由於板部116b在被處理基板G側之 部位係往最接近的第1至第6蒸鍍頭13a〜13f側彎曲, 故可更有效地捕捉從被處理基板G反彈之成膜材料。 (變形例2) 變形例2之成膜裝置1僅在捕捉部216之構成上 和實施形態不同,是以以下主要針對上述差異點來說 明0 圖1U係&、員示變形例上^用狄部z A 〇之一構成例的 側截面圖。具體而言,捕捉部216係具有隔離壁216a(將 第1蒸鑛頭13a與第2蒸鍍頭13b加以隔離)以及複數 孔部216b(形成於隔離壁216a之下部亦即被處理基板 G侧之部位’從成膜材料喷出部13所喷出而在被處理 基板G反彈之成膜材料可進入該處)。孔部21汕為長 孔,長邊方向乃相對於第!至第6蒸鑛頭⑸〜⑶之 並列方向呈正交之方向。其他配置於第2至第6基鑛 頭13b〜13f間的捕捉部216也為同樣構成。 即,可達成與實施形態同樣的效果。亦 :材St 第6蒸鍍頭所喷射之成 、才枓在被處理基板G與處理 反彈而在非應蒸錢之部位附著成騎料他减頭之間 此外,變形例2雖說明了具有 長孔僅為一例,亦7目供且古;、f長孔之捕捉部,惟 部的捕捉部。/有錢圓形或其他形狀孔 (變形例3) 201247913 例3之成膜處理系統僅在成膜裝置301為面 朝下式攻點以及捕捉部316之配置上有別於實施形 態’故以下主要針對上述相異之處說明。 圖11係示意說明變形例3之成膜裝置301之一構 成例的說明目。變形例3之成膜裝置301 #有和實施 形態同樣的處理室11。於處理室11之底部設有成膜材 料噴出部313。成膜材料噴出部313具有在搬送方向 ❹ 上排列之第1至第6蒸鍍頭313a〜313f,於各第1至第 6蒸鍍頭313&〜313€間配置有捕捉部316。 此外’於處理室U内部設置有保持被處理基板G 而從搬入口 lla搬送至搬出口 lib之搬送裝置312。 圖12係顯示變形例3之捕捉部316之一構成例之 侧截面圖。與實施形態同樣’捕捉部316係具有複數 間隙316c ’從成膜材料喷出部313所喷出而在被處理 基板G反彈之成膜材料可進入該處。具體而言,捕捉 & 部316係具有隔離壁316a(將第1蒸鍍頭313a與第2 蒸鍍頭313b加以隔離)以及複數板部316b(呈大致矩形 狀,為面對向狀態),複數板部316b以被處理基板G 側之一邊相較於第1至第6蒸鍍頭313a〜313f更位於 被處理基板G側的方式配置於第1至第6蒸鍵頭 313a〜313f間。間隙316c係由對向之複數板部316b所 構成。 更具體而言’隔離壁316a之上端部、意即隔離壁 316 a在被處理基板G側部分相對於被處理基板G或是 15 201247913 搬送裝置312具有大致平行的上面。複數板部316b係 以在和第1至第6蒸鍍頭313a〜313f之並列方向為大 致同一方向上排列的方式面對向,從上面往上方大致 垂直突出。 變形例3可達成與實施形態同樣效果。亦即,可 防止從第1至第6蒸鍍頭313a〜313f喷射之成膜材料 在被處理基板G與處理室11或其他第丨至第6蒸鍍頭The present invention can prevent the film-forming material sprayed from the steaming table from rebounding between the substrate G to be processed and the processing chamber u or the sixth to sixth steaming heads 13a to 13f, and is attached to the portion to be vapor-deposited. The film material or the vapors from the first to sixth vapor deposition heads 13a to 13f are mixed and mixed into the adjacent film as impurities. Therefore, it is possible to prevent vapor deposition of the other kinds of film-forming materials when steam-forging the two kinds of film-forming materials, and further, in the present embodiment, the capturing portion of the plurality of plate portions 16b is provided at the lower end portion of the partition wall 16a. 16. However, the capturing unit 16 may be configured only by the plurality of plate portions 16b. Further, although an example in which the catching plates 16 are disposed between the first to sixth vapor deposition heads 13a to 13f and both sides in the transport direction will be described, the catching plate 16 may be disposed at another portion to be processed. For example, the capture plate 16 can also be disposed on the upper portion of the processing chamber. In this case, it is possible to prevent the film forming material 12 201247913 from bounce between the substrate G to be processed and the upper portion of the processing chamber. Further, a catching plate 16 may be provided on the inner side wall and the bottom of the processing chamber. Further, although the capturing plate 16 in which the plurality of plate portions 16b are arranged at equal intervals has been described, the interval between the plate portions 16b may be different. When the interval between the plate portions 16b is non-periodic, it is possible to capture the film forming material more efficiently. Further, in the present embodiment, the capturing portion that mainly captures the organic film forming material is described. However, the capturing portion of the present embodiment can also be applied to a film forming device that forms an inorganic film forming material. (Variation 1) The film forming apparatus 1 according to the first modification differs from the embodiment only in the configuration of the capturing unit 116, and the following mainly points out the above differences. Fig. 9 is a side cross-sectional view showing a configuration example of one of the capturing portions 116 of the first modification. Similarly to the embodiment, the capturing unit 116 of the first modification has the partition wall 116a and the plurality of plate portions 116b, and the plurality of plate portions 116b constitute the gap 116c. The portion of the plurality of plate portions 116b on the side of the substrate G to be processed is bent toward the side of the first first vapor deposition head 13a or the second vapor deposition head 13b. For example, the portion of the plate portion 116b on the side of the first vapor deposition head 13a is bent toward the first vapor deposition head 13a on the side of the substrate G to be processed, and the plate portion 116b on the side of the second vapor deposition head 13b is on the substrate G to be processed. The side portion is bent toward the second vapor deposition head 13b side. The trap portion 116 disposed between the second to sixth vapor deposition heads 13b to 13f is also configured in the same manner. 13 201247913 In the first modification, the portion of the plate portion 116b on the side of the substrate G to be processed is bent toward the closest first to sixth vapor deposition heads 13a to 13f, so that the substrate G can be more effectively captured and rebounded. Film forming material. (Variation 2) The film forming apparatus 1 according to the second modification differs from the embodiment only in the configuration of the capturing unit 216, and is mainly described below with respect to the difference point. FIG. 1U is an example of the modification of the member. A side cross-sectional view of one of the constituent examples of the D-part z A 〇. Specifically, the capturing unit 216 has a partition wall 216a (separating the first vapor head 13a from the second vapor deposition head 13b) and a plurality of holes 216b (formed on the lower side of the partition wall 216a, that is, the substrate G side to be processed The portion "the film forming material that is ejected from the film forming material ejecting portion 13 and rebounds on the substrate G to be processed can enter". The hole portion 21 is a long hole, and the long side direction is relative to the first! The parallel direction to the sixth steam heads (5) to (3) is orthogonal. The other capturing portions 216 disposed between the second to sixth base heads 13b to 13f are also configured in the same manner. That is, the same effects as those of the embodiment can be achieved. Also: the material St is sprayed by the sixth vapor deposition head, and the film is rebounded between the substrate G to be processed, and the portion where the liquid is not to be steamed is attached to the head and the head is reduced. The long hole is only an example, and it is also available for the 7-mesh and ancient; the capture part of the f-long hole, and the capture part of the only part. / Money-rich round or other shape hole (Modification 3) 201247913 The film formation processing system of Example 3 differs from the embodiment only in the arrangement of the film formation device 301 in the face-down type and the capturing portion 316. Mainly for the above differences. Fig. 11 is a view schematically showing an example of the configuration of one of the film forming apparatuses 301 of the third modification. The film forming apparatus 301 of the third modification has the same processing chamber 11 as that of the embodiment. A film forming material ejecting portion 313 is provided at the bottom of the processing chamber 11. The film forming material discharge portion 313 has first to sixth vapor deposition heads 313a to 313f arranged in the transport direction ,, and a capturing portion 316 is disposed between each of the first to sixth vapor deposition heads 313 & Further, inside the processing chamber U, a transfer device 312 that holds the substrate G to be processed and transports it from the transfer port 11a to the transfer port lib is provided. Fig. 12 is a side sectional view showing a configuration example of one of the capturing portions 316 of the third modification. In the same manner as the embodiment, the capturing portion 316 has a plurality of gaps 316c' which are formed by the film forming material ejecting portion 313 and which are ejected on the substrate G to be processed. Specifically, the capturing & portion 316 has a partition wall 316a (separating the first vapor deposition head 313a from the second vapor deposition head 313b) and a plurality of plate portions 316b (in a substantially rectangular shape, facing each other). The plurality of plate portions 316b are disposed between the first to sixth steaming heads 313a to 313f so that one side of the substrate G side to be processed is located closer to the substrate G to be processed than the first to sixth vapor deposition heads 313a to 313f. The gap 316c is constituted by the opposing plurality of plate portions 316b. More specifically, the upper end portion of the partition wall 316a, that is, the partition wall 316a has a substantially parallel upper surface with respect to the substrate to be processed G or the 15 201247913 transporting device 312 on the side of the substrate G to be processed. The plurality of plate portions 316b face each other so as to be aligned in the same direction as the parallel direction of the first to sixth vapor deposition heads 313a to 313f, and protrude substantially vertically upward from the upper surface. The third modification achieves the same effects as the embodiment. That is, the film forming material sprayed from the first to sixth vapor deposition heads 313a to 313f can be prevented from being processed on the substrate G and the processing chamber 11 or other third to sixth vapor deposition heads.

13a〜13f之間反彈而使得成膜材料附著於非應蒸鍍之 部位。 (變形例4) 變形例4之成膜處理系統僅在捕捉部416之構造 以及對處理至411之安裝構造上有別於實施形態,故 以下主要針對上述相異點來說明。 圖13係顯示變形例4之捕捉部4丨6之一構成例的 側截面圖。 〇 變形例4之捕捉部416係和實施形態同樣地呈有 隔離壁416a與複數板部416b,藉由複數板部41饨來 構成間隙416c。於隔離壁416a之内部設有加埶捕捉部 仙之加熱部4制。加熱部4l6d係例如切純 器,加熱部·之動作由未圖式之控制部所 制部係例如於成膜處理停止時使得加熱部侧^ 作。此外,構成上亦可具備加熱部 為手動之開關。 σ"、、可切換 十生之材料例如銅 捕捉部416係由具有良好熱傳導 16 201247913 之表面亦可藉由具有良好 所形成。此外,捕捉部416 熱傳導性之材料所被覆。 力二 具有將捕捉部416以裳卸自如的方式 係例==室411之保持部411d。保持… 墓於頭°n 至第6蒸鑛頭13a〜13f間以及第1 二向上游側與第2蒸鐘一The rebound between 13a and 13f causes the film-forming material to adhere to the portion which is not to be vapor-deposited. (Variation 4) The film formation processing system according to the fourth modification differs from the embodiment only in the configuration of the capturing unit 416 and the mounting structure to the processing 411. Therefore, the differences will be mainly described below. Fig. 13 is a side sectional view showing a configuration example of one of the capturing portions 4 to 6 of the fourth modification. Similarly, the capturing portion 416 of the fourth modification has the partition wall 416a and the plurality of plate portions 416b in the same manner as the embodiment, and the gap portion 416c is formed by the plurality of plate portions 41A. The inside of the partition wall 416a is provided with a twisting and catching portion. The heating unit 146d is, for example, a dicing device, and the operation of the heating unit is performed by a control unit (not shown), for example, when the film forming process is stopped. Further, the configuration may be such that the heating unit is a manual switch. The σ", switchable material such as the copper trap portion 416 is formed by a surface having good heat conduction 16 201247913. Further, the capturing portion 416 is covered with a material of thermal conductivity. The force 2 has a holding portion 411d which is a method of detaching the catching portion 416. Keep... Tomb in the head °n to the 6th steam head 13a~13f and the 1st 2nd upstream side and the 2nd steaming one

定時式所構成之成臈處理系統,可藉由以既 得附著於動作來加熱捕捉部416,使 、 之成臈材料被蒸發並去除。此 m 須將捕捉部416從處理室411 ~除即可清洗捕 提部416。 ―、此=,亦可將保持部411d從捕捉部416卸除來進 订濕式,洗。使用者可藉由將經過濕式清洗之捕抓部 416再-人插入保持部4Hd之凹部來裝設於處理室A。 之上部。 此外’當面朝上成膜之情況,以同時具備加熱部 416d與保持部4Ud之構成為佳。當面朝下成膜之情 況’未必要有加熱部416d。 此外,亦可於隔離壁416a之内部設置將捕捉部 416加以冷卻之水流路。藉由冷卻捕捉部416可將在 被處理基板G反彈之成膜材料更有效率地捕捉。 此處所揭示之實施形態皆僅為例示,不應產生任 何限制。本發明範圍並不拘限於上述内容,而是包含 17 201247913 申請專利範圍所揭示之和申請專利範圍為均等意義以 及範圍内之所有變更。 【圖式簡單說明】 圖1係示意說明本實施形態之成膜系統之一構成 例的說明圖。 圖2係示意顯示成膜裝置之一構成例之立體圖。 圖3係示意顯示成膜裝置之一構成例之側截面 圖。 圖4係圖3之IV-IV線截面圖。 圖5係第1蒸鍍頭之底面圖。 圖6係顯示本實施形態之捕捉部之一構成例的側 截面圖。 圖7係示意顯示捕捉部作用之說明圖。 圖8A〜B係示意顯示用以說明捕捉部作用之實驗 裝置的側面圖。 圖9係顯示變形例1之捕捉部之一構成例的侧截 面圖。 圖10係顯示變形例2之捕捉部之一構成例的側截 面圖。 圖11係示意說明變形例3之成膜裝置之一構成例 的說明圖。 圖12係顯示變形例3之捕捉部之一構成例的側截 面圖。 18 201247913 圖13係顯示變形例4之捕捉部之一構成例的側截 面圖。 主要元件符號說明 成膜裝置 處理室 支撐台 成膜材料喷出部 第1蒸鍍頭 第2蒸鍍頭 第3蒸鍍頭 第4蒸鍍頭 第5蒸鍍頭 第6蒸鍍頭 捕捉部 捕捉部 隔離壁 板部 間隙 孔部 被處理基板 1 11 12cThe enthalpy processing system constituted by the timing type can heat the trap portion 416 by being attached to the operation, and the enthalpy material can be evaporated and removed. This m is required to clean the trap portion 416 by removing the trap portion 416 from the processing chamber 411. ―, this =, the holding portion 411d can also be removed from the capturing unit 416 to feed the wet type and wash. The user can install the processing unit A by inserting the wet-cleaning catching portion 416 into the concave portion of the holding portion 4Hd. The upper part. Further, in the case where the film is formed face up, it is preferable to have the configuration of the heating portion 416d and the holding portion 4Ud at the same time. When the film is formed face down, the heating portion 416d is not necessary. Further, a water flow path for cooling the trap portion 416 may be provided inside the partition wall 416a. The film forming material that rebounds on the substrate G to be processed can be more efficiently captured by the cooling trap portion 416. The embodiments disclosed herein are merely illustrative and should not be construed as limiting. The scope of the present invention is not limited to the above, but is intended to cover all modifications within the scope of the invention and the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is an explanatory view schematically showing an example of a configuration of a film formation system of the embodiment. Fig. 2 is a perspective view schematically showing a configuration example of a film forming apparatus. Fig. 3 is a side sectional view schematically showing a configuration example of a film forming apparatus. Figure 4 is a cross-sectional view taken along line IV-IV of Figure 3. Fig. 5 is a bottom view of the first vapor deposition head. Fig. 6 is a side cross-sectional view showing a configuration example of a capturing portion of the embodiment. Fig. 7 is an explanatory view showing the action of the capturing portion. 8A to 8B are side views schematically showing an experimental apparatus for explaining the action of the capturing portion. Fig. 9 is a side cross-sectional view showing a configuration example of one of the capturing portions of the first modification. Fig. 10 is a side cross-sectional view showing a configuration example of a capturing portion of a second modification. Fig. 11 is an explanatory view schematically showing an example of the configuration of a film forming apparatus according to a third modification. Fig. 12 is a side cross-sectional view showing a configuration example of a capturing portion of a third modification. 18 201247913 Fig. 13 is a side cross-sectional view showing an example of the configuration of a capturing unit according to a fourth modification. Main component symbol description Film forming apparatus processing chamber support table Film forming material ejection unit First vapor deposition head Second vapor deposition head Third vapor deposition head Fourth vapor deposition head 5th vapor deposition head 6th vapor deposition head capture unit capture Part of the partition wall portion clearance hole portion to be processed substrate 1 11 12c

13 13a 13b 13c 13d 13e 13f13 13a 13b 13c 13d 13e 13f

16,116,216,316 16a, 116a,216a,316a 16b,116b,216a,316a 16b,116b,316b 16c,116c,316c 216b G 1916,116,216,316 16a, 116a,216a,316a 16b,116b,216a,316a 16b,116b,316b 16c,116c,316c 216b G 19

Claims (1)

201247913 七、申請專利範圍: 1· 一種成膜裝置,係具備有:處理室,係收容被 處理基板,以及,成膜材料喷出部,係將成膜材料蒸 氣朝向該被處理基板喷出;其特徵在於: 係於該處理室之内部具備有可將從該成膜材料喷 出部所喷出而在該被處理基板反彈之成膜材料加以捕 捉之捕捉部。 2. 如申請專利範圍第1項之成膜裝置,其中該捕 捉部係具有該成膜材料喷出部所喷出而在該被處理基 〇 板反彈之成膜材料可進入之複數間隙或是孔部。 3. 如申請專利範圍第1項之成膜裝置,其中該捕 捉部係具備有相對向之複數板部。 4. 如申請專利範圍第2項之成膜裝置,其中該捕 捉部係具備有相對向之複數板部。 5‘如申請專利範圍第3項之成膜裝置,係具備有 支撐该被處理基板之支撐台;該板部係以面方向相對 於β支樓台成為交叉的方式所配置,該被處理基板側 〇 之部位係朝向該成膜材料喷出部側彎曲。 6·如申请專利範圍第4項之成膜裝置,係具備有 ^撐該被處理基板之支撐台;該板部係以面方向相對 “亥支撐台成為交又的方式所配置,該被處理基板侧 之部位係朝向該成膜材料喷出部側彎曲。 番7.如申請專利範圍第1至6項中任-項之成膜裝 置’其中該成㈣料噴出部係具備有將複數成膜材料 20 201247913 =氣分別朝向該被處理基板來噴出之複數蒸鍍 捕捉部係配置於該複數蒸鍍頭之間。 ,μ 二、&如申請專利範圍第1或2項之成膜裝置,其令 該成膜材料喷出部係具備有將複數成膜材料蒸氣&別 朝向該被處理基板來噴出之複數蒸鍍頭;該捕捉部係 具備有呈大致矩形狀而相對向之複數板部;該複^板 Ο 部係以一邊較该複數蒸鍍頭更位於該被處理基板側的 方式配置在該複數蒸鍍頭之間。 9.如申請專利範圍第8項之成臈裝置,其中該複 數板部在該被處理基板側之部位係往最接近之該蒸鑛 頭侧彎曲。201247913 VII. Patent application scope: 1. A film forming apparatus comprising: a processing chamber for accommodating a substrate to be processed, and a film forming material ejecting portion for ejecting a film forming material vapor toward the substrate to be processed; The inside of the processing chamber is provided with a capturing portion that can be formed by capturing a film forming material that is ejected from the film forming material ejecting portion and rebounds from the substrate to be processed. 2. The film forming apparatus of claim 1, wherein the capturing portion has a plurality of gaps in which the film forming material is ejected from the film forming material and the film forming material rebounds from the processed substrate to enter Hole section. 3. The film forming apparatus of claim 1, wherein the capturing portion has a plurality of opposite plate portions. 4. The film forming apparatus of claim 2, wherein the capturing portion is provided with a plurality of opposite plate portions. 5' The film forming apparatus of claim 3 is provided with a support table for supporting the substrate to be processed; the plate portion is disposed so as to face the β-column in a plane direction, the substrate side to be processed The portion of the crucible is curved toward the film forming material discharge portion side. 6. The film forming apparatus of claim 4, wherein the film forming device is provided with a supporting table for supporting the substrate to be processed; and the plate portion is disposed in a plane direction with respect to the "sea support table", which is processed The portion on the side of the substrate is bent toward the side of the film-forming material discharge portion. The film-forming device according to any one of the first to sixth aspects of the invention, wherein the (four) material discharge portion is provided with a plurality of Membrane material 20 201247913 = a plurality of vapor deposition capturing portions that are ejected toward the substrate to be processed are disposed between the plurality of vapor deposition heads. μ 2 , & film forming device according to claim 1 or 2 The film forming material discharge unit includes a plurality of vapor deposition heads for ejecting a plurality of film forming material vapors & the substrate is formed in a substantially rectangular shape and is relatively plural a plate portion; the plurality of plate portions are disposed between the plurality of vapor deposition heads on the side of the substrate to be processed more than the plurality of vapor deposition heads. 9. The device according to claim 8 Where the plurality of plates are at the treated base Closest to the train-side portion of the ore was distilled bending head side. 21twenty one
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