TW201232173A - Photosensitive resin composition - Google Patents

Photosensitive resin composition Download PDF

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TW201232173A
TW201232173A TW100145649A TW100145649A TW201232173A TW 201232173 A TW201232173 A TW 201232173A TW 100145649 A TW100145649 A TW 100145649A TW 100145649 A TW100145649 A TW 100145649A TW 201232173 A TW201232173 A TW 201232173A
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photosensitive resin
resin composition
mass
compound
integer
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TW100145649A
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Chinese (zh)
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TWI530757B (en
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Shinichi Kunimatsu
Yamato Tsutsui
Kazuya Naito
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Asahi Kasei E Materials Corp
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    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F2/00Processes of polymerisation
    • C08F2/46Polymerisation initiated by wave energy or particle radiation
    • C08F2/48Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
    • C08F2/50Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F290/00Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
    • C08F290/02Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
    • C08F290/06Polymers provided for in subclass C08G
    • C08F290/062Polyethers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • G03F7/031Organic compounds not covered by group G03F7/029
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/061Etching masks
    • H05K3/064Photoresists

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Materials For Photolithography (AREA)
  • Polymerisation Methods In General (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Graft Or Block Polymers (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)

Abstract

A photosensitive resin composition which comprises (A) an alkali-soluble polymer, (B) a photopolymerization initiator, and (C) a compound having an ethylenically unsaturated double bond, wherein the photopolymerization initiator (B) is a 2,4,5-triarylimidazole dimer or an acridine compound, while a compound represented by general formula (I) is contained as the compound (C). In general formula (I), R1, R2, A, B, n1, n2 and n3 are each as defined in the description. The photosensitive resin composition is excellently and stably dispersible in a developer to minimize the generation of an aggregate. Further, the resin composition exhibits proper developability and can provide a flexible cured resist with good etching resistance.

Description

201232173 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種感光性樹脂組合物等。 【先前技術】 v 先前,印刷電路板或金屬之精密加工等係藉由光微影法 . 而製造。所謂光微影法,係指將感光性樹脂組合物塗佈於 基板上’進行圖案曝光並使該感光性樹脂組合物之曝光部 分聚合硬化’以顯影液去除未曝光部分而於基板上形成抗 蝕劑圖案,實施蝕刻或電鍍處理而形成導體圖案後,將該 抗蝕劑圖案自該基板上剝離去除,藉此於基板上形成導體 圖案之方法。 於光微影法t,於將感光性樹脂組合物塗佈於基板上 時,使用將光阻劑溶液塗佈於基板上並使其乾燥之方法, 或將依序積層有包含支撐體、感光性樹脂組合物之層(以 下,稱作感光性樹脂層)、及視需要之保護層之感光性樹 脂積層體積層於基板上的方法中之任一種,但於製造印刷 電路板時,大多使用後者。 關於使用上述感光性樹脂積層體製造印刷電路板之方 、法,以下進行簡單地說明。 .首先’將聚乙烯膜等保護層自感光性樹脂積層體上剝 離。繼而,使用貼合機於銅箔積層板等基板上,以成為該 基板、感光性樹脂層、支撐體之順序之方式積層感光性樹 脂層及支撐體。繼而,經由具有配線圖案之光罩對該感光 性樹脂層進行曝光,藉此使曝光部分聚合硬化。繼而,將 160046.doc 201232173 包含聚對苯二曱酸乙二酯等之支撐體剝離。繼而,利用具 有弱鹼性之水溶液等顯影液使感光性樹脂層之未曝光部分 溶解或分散去除而於基板上形成抗蝕劑圖案。將利用該顯 影液使未曝光部分之感光性樹脂層溶解或分散去除之步驟 稱作顯影步驟,將為了使未曝光部分之感光性樹脂層溶解 而需要之最短時間作為最小顯影時間。 感光性樹脂組合物並非全部溶解於顯影液中,隨著每次 重複顯影步驟,顯影液分散性較差之不溶解成分逐漸增 加’並產生凝聚物。凝聚物附著於基板上,成為短路不良 之原因。 繼而,將所形成之抗㈣旧案作為保護掩模,進行已知 之姓刻處理或圖案電錢處理d最後,將該抗敍劑圖案自基 板上剝離而製造具有導體圖案之基板,即印刷電路板。 於触刻處理時,抗#劑圖案之耐㈣性較為重要。若耐 钱刻性較差,則於钱刻肖,钱刻液自抗钮劑圖案與基板之 間隙内滲入而飯刻電路頂部之一部分。就自頂部方向之表 面外觀而言’可觀察到因滲入而變色、氧化,i導體圖案 之寬度之再現性於-部分變差,直線性較差且起伏不定。 進而於耐蝕刻性較差之情形時’產生導體圖案之缺失或 斷線導體圖案越微細,該等缺陷變得越明顯。將以上述 所形成之抗㈣圖案作為保護掩模進行已知之㈣處理之 步驟稱作㈣㈣。切㈣㈣以情町錢刻步驟 連動,由於必需使不必要部分之導體完全溶解,故而基板 之輸送速度取決於㈣㈣Jim 160046.doc •4- 201232173 最小顯影時間較短者,存在過度地暴露於顯影液中而損害 基材與所形成之抗蝕劑圖案的密接性之情況,尤其是於為 了提昇解像性及蝕刻效率而使用厚度較薄之感光性樹脂層 之情形時,上述情況變得明顯。又,於顯影步驟及蝕刻步 驟中,於硬化抗蝕劑之柔軟性不足之情形時,有時會因與 輸送輥之接觸、或者顯影液或蝕刻液之喷附而損害抗蝕劑 圖案之一部分,從而導致導體圖案之缺失或斷線。 於該狀況下,報告有為了提昇硬化抗蝕劑之柔軟性及耐 化學品性而使用聚丁二醇二(甲基)丙烯酸酯之手段或使用 胺基甲酸酯化合物之手段(參照專利文獻丨、2)。 [先前技術文獻] [專利文獻] 專利文獻1 :曰本專利特開昭61_228007號公報 專利文獻2:曰本專利第3859934號公報 【發明内容】 [發明所欲解決之問題] 專利文獻1及2中所記載之耐化學品性係指將鹼水溶液或 電鍍液作為對象者,未對蝕刻步驟中所使用之酸性藥品之 耐性進行揭示,亦無關於顯影性或凝聚性之揭示。仍然需 要提供一種顯影液分散穩定性優異,可抑制凝聚物之產 生,且具有適度之顯影性、硬化抗蝕劑之柔軟性及良好之 耐蝕刻性的感光性樹脂組合物。 鑒於上述現狀,本發明所欲解決之課題在於提供一種顯 影液分散穩定性優異,可抑制凝聚物之產生,且具有適度 160046.doc 201232173 之顯影性、硬化抗敍劑之柔軟性及良好之耐姓刻性的感光 性樹脂組合物等。 [解決問題之技術手段] 本發明者為了解決上述課題而潛心研究並反覆實驗,結 果發現可藉由如下技術手段而解決該課題,從而完成本發 明。 即,本發明為如下所述者。 Π] 一種上述感光性樹脂組合物,其係包含⑷驗可溶性 高分子、W光聚合起始劑、及(C)具有乙雜㈣和雙鍵 之化合物者,且該(B)光聚合起始劑為2,4,5•三芳基味唾二 聚體或°丫錢合物,作為該(〇具有乙缔性不飽和雙鍵之 化合物而包含下述通式(!): [化1] Ο q p (I) CH2=i-i丨-+女卜 W 七“‘2 • · {式中,R,及112分別獨立表示氫原子或甲基,八為。办或 c3H6,於-(A-0)n,_及 _(A_0)n3_ 中,_C2H4 〇 及 _c办办之 重複单位之排列可為無規,亦'或4 ^ 規亦可為嵌段,於該排列為嵌段 之情形時,-C2H4-0-及-C3H6-〇-中之 # . τ之任一者亦可為_B 0基 側’ B為碳數4〜8之2價烷基鏈,. ηι為0〜丨〇之整數,n3為 0〜10之整數’ Π|+η3為〇〜10之整數,* 跫数,並且h為1〜20之整數} 所示之化合物。 ⑵如上述⑴之感光性樹脂組合物,其中作為上述⑹具 160046.doc -6 - 5 201232173 有乙烯性不飽和雙鍵之化人你,,仓二a a 冗。物,進而包含下述通式(π): [化2] R3 Ο H2C=:C一ς一〇_ {式中’ RAR4分別獨立為氫原子或曱基,…及〜分別獨立 為〇〜20之整數,n4+n7“〜4G之整數,n5h6分別獨立為 1〜20之整數,+ w為2〜4〇之整數,並且_(匸2^_〇卜及 (CsHU-O)-之重複單位之排列可為無規,亦可為嵌段,於 該排列為嵌段之情形時’ 之任一 者亦可為雙酚基側} 所示之化合物。 [3]如上述[2]之感光性樹脂組合物,其中上述通式⑴) 中,h及η?分別獨立為丨〜⑼之整數,並且〜+〜為2 〜40之整 數。 [4] 如上述[1]至[3]中任一項之感光性樹脂組合物,其中 上述(A)鹼吁溶性高分子係選自包含苯乙烯及/或(曱基)丙 婦酸节基自旨作為共聚物成分之鹼可溶性高分子中。 [5] 如上述[1]至[4]中任一項之感光性樹脂組合物,其中 上述通式⑴中’ n2為1〜10之整數,並且η丨+n3為0。 [6] 如上述[1]至[5]中任一項之感光性樹脂組合物,其中 作為上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含 於分子内具有至少一個胺基甲酸酯鍵之化合物。 [7] 如上述[丨]至[6]中任一項之感光性樹脂組合物,其中 作為上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含 160046.doc 201232173 下述通式(III): [化3] 卩5 〇 0 Re H^=^-〇^^H4-〇^C3H6_〇^__[!_i=CH2 {式中’ Rs及R6分別獨立為氫原子或曱基,…及!!9分別镯立 為3〜40之整數’並且_((:2^_〇)_及_((:3^_〇)_之重複單位之 排列可為無規’亦可為嵌段} 所示之化合物。 [8]如上述[1]至[7]中任一項之感光性樹脂組合物其中 作為上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含 下述通式(IV)及/或(V): [化4] h2c: R1 I V) ηι〇~η丨2分別獨 {式中’ R5及&分別獨立為氫原子或甲基 立為1〜30之整數} [化5]201232173 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to a photosensitive resin composition and the like. [Prior Art] v Previously, precision processing of printed circuit boards or metals was made by photolithography. The photolithography method refers to applying a photosensitive resin composition onto a substrate to perform pattern exposure and polymerizing and curing the exposed portion of the photosensitive resin composition. The developing solution removes the unexposed portion to form an anti-reflection on the substrate. The etching pattern is formed by etching or plating to form a conductor pattern, and then removing the resist pattern from the substrate to form a conductor pattern on the substrate. In the photolithography method, when the photosensitive resin composition is applied onto a substrate, a method of applying a photoresist solution onto a substrate and drying it is used, or a support layer and a photosensitive layer are sequentially laminated. Any one of a layer of a resin composition (hereinafter referred to as a photosensitive resin layer) and a photosensitive resin layer of a protective layer as required on a substrate, but is often used in the production of a printed circuit board. the latter. The method and method for producing a printed circuit board using the above-mentioned photosensitive resin laminate are briefly described below. First, a protective layer such as a polyethylene film is peeled off from the photosensitive resin laminate. Then, a photosensitive resin layer and a support are laminated on the substrate such as a copper foil laminate using a laminating machine so as to be in the order of the substrate, the photosensitive resin layer, and the support. Then, the photosensitive resin layer is exposed through a photomask having a wiring pattern, whereby the exposed portion is polymerized and cured. Then, the support of 160046.doc 201232173 containing polyethylene terephthalate or the like is peeled off. Then, the unexposed portion of the photosensitive resin layer is dissolved or dispersed by a developing solution such as a weakly alkaline aqueous solution to form a resist pattern on the substrate. The step of dissolving or dispersing the photosensitive resin layer in the unexposed portion by the developing solution is referred to as a developing step, and the minimum time required for dissolving the photosensitive resin layer in the unexposed portion is taken as the minimum development time. Not all of the photosensitive resin composition is dissolved in the developer, and as the development step is repeated each time, the insoluble component having poor developer dispersibility gradually increases, and aggregates are generated. The aggregates adhere to the substrate and cause a short circuit failure. Then, the formed anti-(4) old case is used as a protective mask, and the known surname processing or pattern electric money processing is performed. Finally, the anti-small agent pattern is peeled off from the substrate to manufacture a substrate having a conductor pattern, that is, a printed circuit board. . At the time of the etch treatment, the resistance of the anti-# agent pattern is more important. If the resistance to money is poor, then the money engraved into the gap between the anti-button pattern and the substrate and the part of the top of the circuit. In terms of the appearance of the surface from the top direction, discoloration and oxidation due to penetration were observed, and the reproducibility of the width of the i-conductor pattern was deteriorated in the - portion, and the linearity was poor and the fluctuation was indefinite. Further, in the case where the etching resistance is poor, the occurrence of the absence of the conductor pattern or the finer the broken conductor pattern becomes, the more the defects become more conspicuous. The step of performing the known (four) treatment using the anti-(four) pattern formed as described above as a protective mask is referred to as (4) (4). Cut (4) (4) In the case of the lyrics, the necessary steps are to completely dissolve the conductors, so the substrate transport speed depends on (4) (4) Jim 160046.doc • 4- 201232173 The minimum development time is shorter, there is excessive exposure to the developer In the case where the adhesion between the substrate and the formed resist pattern is impaired, particularly in the case where a photosensitive resin layer having a small thickness is used in order to improve the resolution and the etching efficiency, the above-described situation becomes remarkable. Further, in the developing step and the etching step, when the flexibility of the hardened resist is insufficient, a part of the resist pattern may be damaged by contact with the transport roller or deposition of the developer or the etching solution. , resulting in the absence or disconnection of the conductor pattern. Under this circumstance, means for using polytetramethylene glycol di(meth)acrylate or using a urethane compound in order to improve the softness and chemical resistance of the hardened resist has been reported (refer to the patent literature).丨, 2). [PRIOR ART DOCUMENT] Patent Document 1 Patent Document 1 and Japanese Patent Application Publication No. JP-A No. Hei. No. Hei. No. Hei. No. Hei. The chemical resistance described in the above refers to an alkali aqueous solution or a plating solution, and does not disclose the resistance of the acidic drug used in the etching step, and does not disclose the developability or cohesiveness. There is still a need to provide a photosensitive resin composition which is excellent in dispersion stability of a developer, suppresses generation of aggregates, and has moderate developability, flexibility of a cured resist, and good etching resistance. In view of the above circumstances, the object of the present invention is to provide a developing solution which is excellent in dispersion stability, can suppress generation of aggregates, and has a developing property of moderately 16046.doc 201232173, softness of a hardening antisynthesis agent, and good resistance. A photosensitive resin composition with a surname and the like. [Means for Solving the Problems] The present inventors have diligently studied and repeated experiments in order to solve the above problems, and as a result, have found that the present invention can be solved by the following technical means, and the present invention has been completed. That is, the present invention is as follows.上述] A photosensitive resin composition comprising (4) a soluble polymer, a W photopolymerization initiator, and (C) a compound having an ethyl (tetra) bond and a double bond, and (B) photopolymerization initiation The agent is a 2,4,5•triaryl taste salivary dimer or a ruthenium complex, and the compound having the ethylenically unsaturated double bond and having the following formula (!): [Chemical Formula 1] Ο qp (I) CH2=ii丨-+女卜W Seven "'2 • · { where R, and 112 respectively represent a hydrogen atom or a methyl group, eight are. or c3H6, at - (A-0 In n, _ and _(A_0)n3_, the arrangement of the repeating units of _C2H4 〇 and _c can be random, and the 'or 4^ can also be a block, when the arrangement is block , -C2H4-0- and -C3H6-〇-中之# . τ can also be _B 0 base side ' B is a carbon number 4 to 8 of a two-valent alkyl chain, . ηι is 0 ~ 丨An integer of 〇, n3 is an integer of 0 to 10' Π| + η3 is an integer of 〇 10, * 跫, and h is an integer of 1 to 20} (2) A photosensitive resin combination as described in (1) above Object, which as the above (6) has 160046.doc -6 - 5 201232173 has ethylenic unsaturation The double bond is different from you, and the second is a redundant, and further contains the following general formula (π): [Chemical 2] R3 Ο H2C=: C ς 〇 _ {wherein RAR4 is independently a hydrogen atom Or 曱 base, ... and ~ are respectively independent of 〇~20 integer, n4+n7 "~4G integer, n5h6 are each an integer of 1~20, + w is an integer of 2~4〇, and _(匸2 The arrangement of the repeating units of ^_〇卜 and (CsHU-O)- may be random or block, and in the case where the arrangement is a block, either of them may be a bisphenol side. [3] The photosensitive resin composition according to the above [2], wherein, in the above formula (1)), h and η are each independently an integer of 丨~(9), and 〜~~ is an integer of 2 to 40. [4] The photosensitive resin composition according to any one of the above [1] to [3] wherein the (A) alkali-soluble polymer is selected from the group consisting of styrene and/or (mercapto)-propionic acid The photosensitive resin composition of any one of the above-mentioned [1] to [4], wherein 'n2 is 1 to 10 in the above formula (1). The integer, and η丨+n3 is 0. [6] The photosensitive resin composition of any one of the above [1] to [5], wherein the compound (C) having an ethylenically unsaturated double bond further contains at least one urethane bond in the molecule. The photosensitive resin composition of any one of the above-mentioned (C) which has the ethylenic unsaturated double bond, and further contains 16046.doc 201232173 Formula (III): [Chemical 3] 卩5 〇0 Re H^=^-〇^^H4-〇^C3H6_〇^__[!_i=CH2 {wherein Rs and R6 are each independently a hydrogen atom or a ruthenium Base, ... and!! 9 respectively set the bracelet to an integer of 3 to 40' and the arrangement of the repeating units of _((:2^_〇)_ and _((:3^_〇)_ can be a random 'also It can be a compound represented by block}. [8] The photosensitive resin composition according to any one of the above [1] to [7] wherein the compound (C) having an ethylenically unsaturated double bond further comprises the following formula (IV) and/or (V): [Chemical 4] h2c: R1 IV) ηι〇~η丨2 respectively (wherein R5 and & respectively are independently hydrogen atoms or methyl groups are integers of 1 to 30} [Chemical 5]

Rs 〇Η^=Κ!_ 〇~fc3He-〇|^C2H4_〇t^C3He-0 七4 〇 Re —c=ch2 獨 {式中’ Rs及R0分別獨立為氫原子或曱基,ni〇〜ni2分別 160046.doc (V) 201232173 立為1〜3 0之整數} 所不之化合物。 [9] 如上述[丨]至[8]中任一項之感光性樹脂組合物,其中 作為上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含 於分子内具有異氰尿酸基之化合物。 [10] 如上述[1 ]至[9]中任一項之感光性樹脂組合物,其中 於將感光性樹脂組合物之總固形物成分質量設為〗〇〇質量 %時’上述(A)鹼可溶性高分子之調配量為4〇質量%〜80質 量% ’於將感光性樹脂組合物之總固形物成分質量設為 1 00質量%時’上述(B)光聚合起始劑之調配量為0.1質量 %〜20質量% ’於將感光性樹脂組合物之總固形物成分質量 設為100質量%時,上述(c)具有乙烯性不飽和雙鍵之化合 物之調配量為5質量%〜5 0質量0/〇。 Π1]—種感光性樹脂積層體,其係於支撐膜上積層有包 含如上述[1]至[10]中任一項之感光性樹脂組合物之感光性 樹脂層者。 [12]—種形成有抗蝕劑圖案之基板之製造方法,其包括 如下步驟:將如上述[11]之感光性樹脂積層體積層於基板 上之積層步驟、經由掩模而對該感光性樹脂積層體進行曝 光之曝光步驟、及去除未曝光部分之顯影步驟。 Π3]—種電路基板之製造方法,其係藉由對利用如上述 Π2]之方法所製造之基板進行蝕刻或電鍍而形成電路基 板。 [發明之效果] 160046.doc 201232173 根據本發明,可提供一種顯影液分散穩定性優異,可抑 制凝聚物之產生,具有適度之顯影性'硬化抗蝕劑之柔軟 性及良好之对触刻性,且用以形成良好之導體圖案的較佳 之感光性樹脂組合物;及具有包含該組合物之感光性樹月t 層之感光性樹脂積層體等。 【實施方式】 以下,對用以實施本發明之形態(以下,簡稱為「實施 形態」)進行詳細地說明。再者,本發明並不限定於以下 之貫施形態’可於其主旨之範圍内實施各種變形。 <感光性樹脂組合物> 於本實施形態中,感光性樹脂組合物包含鹼可溶性 高分子、(B)光聚合起始劑、及(c)具有乙烯性不飽和雙鍵 之化合物。 <(A)鹼可溶性高分子〉 所謂(A)鹼可溶性高分子,係指含有羧基之乙烯系樹 脂,例如為(甲基)丙烯酸、(曱基)丙烯酸酯、(甲基)丙烯 腈、(f基)丙烯醯胺等之共聚物。(A)鹼可溶性高分子較佳 為含有羧基,並且酸當量為100〜6〇(^酸當量就提昇顯影 耐性,並提昇解像度及密接性之觀點而言,較佳為1〇〇^ 上,就提昇顯影性及剝離性之觀點而言,較佳為6〇〇以 下。酸當量更佳為250〜450。 (A)鹼可溶性高分子之重量平均分子量較佳為5,〇〇〇以上 500,000以下。(A)鹼可溶性高分子之重量平均分子量就將 顯影凝聚物之性狀、製成感光性樹脂積層體之情形時之邊 160046.doc 1Λ -10 - 201232173 緣溶融性、切片性等未曝光膜之性狀之觀點而言,較佳為 5,000以上’就提昇顯影性之觀點而言,較佳為5〇〇〇〇〇以 下。此處,所謂邊緣熔融性,係指於將感光性樹脂積層體 捲曲成輥狀之情形時’感光性樹脂組合物層自輥之端面伸 出之現象。所謂切片性’係指於以切割機切割未曝光膜之 情形時,晶片飛散之現象,若晶片附著於感光性樹脂積層 體之上表面等,則於其後之曝光過程等中,轉印於掩模上 而成為不良之原因。(A)鹼可溶性高分子之重量平均分子 量更佳為5,000以上3〇〇,〇〇〇以下,進而較佳為1〇〇〇〇以上 200,〇〇〇以下。 (A)驗可溶性高分子例如可藉由使下述2種單體中之各一 種或一種以上之單體共聚合而獲得。 第一單體為於分子中具有一個聚合性不飽和基之羧酸或 酸肝°例如可列舉:(甲基)丙烯酸、反丁烯二酸、桂皮 酸、巴丑酸、衣康酸、順丁烯二酸酐、順丁烯二酸半酯 等。尤佳為(甲基)丙烯酸。此處’所謂(甲基)丙烯酸,係 指丙烯酸或甲基丙烯酸。 第二單體為非酸性且於分子中具有至少一個聚合性不飽 和基之單體。例如可列舉:(曱基)丙烯酸曱酯、(曱基)丙 烯酸乙酯、(曱基)丙烯酸正丙酯、(甲基)丙烯酸異丙酯、 (甲基)丙稀酸正丁酯、(曱基)丙烯酸異丁酯、(曱基)丙烯酸 第二丁醋、(甲基)丙稀酸2-羥乙酯、(曱基)丙烯酸2-羥丙 酯、(甲基)丙烯酸2_乙基己基酯、(曱基)丙烯酸苄基酯、 乙嫦醇之酿類,例如乙酸乙烯酯、(曱基)丙烯腈、笨乙 160046.doc 201232173 烯、苯乙稀衍生物等。尤佳為(甲基)丙烯酸甲酯、(甲基) 丙烯酸正丁酯、苯乙烯、苯乙烯衍生物、及(甲基)丙烯酸 苄基酯" 作為(A)驗可溶性高分子中之共聚物成分,較佳為苯乙 稀或苯乙烯衍生物,其共聚合比例較佳為2〇質量%〜6〇質 量0/。。該共聚合比例就具有充分之凝聚性及耐蝕刻性等之 觀點而言,較佳為20質量%以上’就具有適度之顯影性及 硬化膜柔軟性之觀點而言,較佳為60質量。/❶以下。該共聚 合比例更佳為20質量❶〜50質量%,進而較佳為20質量 %〜30質量%»進而’作為共聚物成分,較佳為使苯乙烯或 苯乙烯衍生物、(曱基)丙烯酸甲酯、及(甲基)丙烯酸共聚 合而成者。又’為了獲得與上述不同之優異之解像性,苯 乙烯或苯乙烯衍生物之共聚合比例較佳為4〇質量。/〇〜6〇質 量°/〇’進而’作為共聚物成分’較佳為使苯乙烯或苯乙烯 衍生物、(甲基)丙烯酸甲酯、及(甲基)丙稀酸共聚合而成 者。 於將感光性樹脂組合物之總固形物成分質量設為100質 量%時’感光性樹脂組合物中之(A)鹼可溶性高分子之調配 量較佳為40質量%〜80質量%之範圍,更佳為5〇質量%〜70 質量%。該調配量就邊緣熔融性之觀點而言,較佳為40質 量%以上,就顯影時間之觀點而言,較佳為8〇質量%以 下。 <(B)光聚合起始劑> 上述感光性樹脂組合物包含2,4,5-三芳基味唑二聚體或 160046.doc -12- 201232173 吖啶化合物作為(B)光聚合起始劑之必需成分。作為該等 之具體例,例如可列舉:2_(鄰氣苯基)_4,5_二苯基咪唑二 聚體、2-(鄰氣苯基)_4,5_二(甲氧基苯基)咪唑二聚體、^ (鄰氟苯基)-4,5·二苯基咪唑二聚體、2_(鄰甲氧基苯基) -4,5-二苯基咪唑二聚體、2_(對甲氧基苯基)_4,5_二笨基咪 唑二聚體等2,4,5-三芳基咪唑二聚體,9-苯基吖啶' 丨,7_雙 (9,9-吖啶基)庚烷等吖啶衍生物等。 作為可進而包含於感光性樹脂組合物中之光聚合起始 劑,除2,4,5-三芳基咪唑二聚體或吖啶化合物以外,例如 亦可列舉.二笨甲酮、N,N'-四甲基-4,4'-二曱基胺基二笨 甲酮(米其勒酮)、N,N,-四乙基-4,4,-二胺基二苯甲酮、4_甲 氧基-4'-二甲基胺基二笨甲酮、2_苄基_2_二甲基胺基。-(扣 嗎啉基苯基)-丁酮_丨、2_曱基(曱硫基)苯基]_2_嗎啉 基-丙酮-1等芳香族酮,2_乙基蒽醌、菲醌、2_第三丁基蒽 醌、辛曱基蒽醌、1,2-苯并蒽醌、2,3_苯并蒽醌、2_苯基蒽 醌、2,3-二苯基蒽醌、ι_氣蒽醌、2_甲基蒽醌、丨,4_萘醌、 9,10-菲醌、2-曱基_1,4_萘醌、2,3_二甲基蒽醌等醌類,安 息香曱鍵、安息香乙醚、安息香苯基醚等安息香醚化合 物,安息香甲喊等安息香衍生物,N_苯基甘胺酸衍生物, 香豆素系化合物,4,4、雙(二乙胺基)二苯曱酮等。該等光 聚合起始劑可單獨使用’亦可併用2種以上。 於將感光性樹脂組合物之總固形物成分質量設為100質 量%時,感光性樹脂組合物中之(B)光聚合起始劑之調配量 較佳為0.1質量。/。〜20質量%。該調配量就獲得充分之感光 160046.doc 201232173 度之觀點而言, 至抗蝕劑底面, 為20質量%以下 質量%。 較佳為0.1質量%以上,就使光充分地透射 並獲得良好之高解像性之觀點而言,較佳 。該調配量之更佳之範圍為〇.5質量%〜1〇 <(c)具有乙烯性不飽和雙鍵之化合物> 戶:謂(C)具有乙烯性不飽和雙鍵之化合物,係指如字面 意思般具有乙烯性;^飽和傾之化合物1為(c)具有乙 稀性不飽和雙鍵之化合物,例如可列舉二(甲基)㈣酸醋 類再者所谓(甲基)丙烯酸酯,係指丙烯酸醋或甲基丙 烯酸酯。 感光性樹脂組合物包含下述通式(〖): [化6] R·) Ο Or CH24—“卜0仏0 yA.〇y 一“H2 • · * (I) {式中,R】及I分別獨立表示氫原子或曱基,八為匕仏或 C3H6,於-(Α-Ο)η丨-及 _(A_〇)n3_ 中,_c2h4 〇 及 _C3H6 〇 之 重複單位之排列可為無規,亦可為嵌段,於該排列為嵌段 之情形時,-QHcO-及<3出-〇-中之任一者亦可為_Β_〇·基 側,Β為碳數4〜8之2價烷基鏈,〇|為〇〜1〇之整數,〜為 〇〜10之整數,ηι+η3為0〜10之整數,並且〜為卜2〇之整數} 所示之化合物作為(C)具有乙烯性不飽和雙鍵之化合物。 此處,於將如上述通式⑴所示之二(甲基)丙烯酸酯與其 I60046.doc •14- 201232173 他發明特^事項組合而製成感光性樹脂組合物之情形時, 關於提供顯影液分散穩定性優異,可抑制凝聚物之產生, 且具有適度之顯影性、硬化抗㈣之柔軟性及良好之耐飯 刻性之感光性樹脂組合物的機制之詳細情況,雖不明確, 但推測為如下所述之作用。 ?通式⑴所不之二(节基)丙烯酸酯具有以-(B-0)-表示 之基’與通常所使用之氧化乙烯基或氧化丙烯基相比,分 :鏈較長,且不具有側鏈,故而推測為主鏈之自由度較 间,且化學結構之柔軟性(有時稱作蓋孔性)優異者。 又謎鍵通节有如下傾向:由於酸而導致與氧鄰接之碳 1行親核取代反應並斷鍵,但通式(I)所示之二(甲基)丙稀 馱s曰所具有之以·(Β·〇)_表示的基係因酸產生之斷鍵反應部 位之比例y於氧化乙烯基或氧化丙烯基,推測為耐酸性 (有時稱作耐蝕刻性)優異者。 進而,通式(I)所示之二(甲基)丙烯酸酯所具有之以 〇)·表示的基具有較高之親油性,推測為易成為顯影凝聚 物之含苯基起始劑之分散穩定性優異(抑制凝聚物之產生 者。 再者,關於適度之顯影性,亦推測為源自通式⑴所示之 二(甲基)丙烯酸酯所具有的適度之親油性者。 於上述通式(1)所示之化合物中,η丨及h較佳為〇之整 數。即,n,+n3較佳為〇之整數。更詳細而言,就邊緣熔融 性、製造容易性等觀點而言,上述通式⑴所示之化合物例 如較佳為下述通式(VI): 160046.doc •••(VI) 201232173 [化7] CHz^C~~Q—Ό~^〇η2ΟΗ2〇Η2〇Η2〇·]—Rs 〇Η^=Κ!_ 〇~fc3He-〇|^C2H4_〇t^C3He-0 七4 〇Re —c=ch2 独 {中中' Rs and R0 are each independently a hydrogen atom or a sulfhydryl group, ni〇 ~ni2 respectively 16046.doc (V) 201232173 Established as an integer from 1 to 3 0. The photosensitive resin composition of any one of the above-mentioned (C), wherein the (C) compound having an ethylenically unsaturated double bond further contains an isocyanuric acid group in the molecule. Compound. [10] The photosensitive resin composition according to any one of the above [1] to [9] wherein, when the total solid content of the photosensitive resin composition is 〇〇 mass%, the above (A) The amount of the above-mentioned (B) photopolymerization initiator is adjusted when the total solid content of the photosensitive resin composition is 100% by mass. When the total solid content of the photosensitive resin composition is 100% by mass, the compounding amount of the compound having an ethylenically unsaturated double bond is 5% by mass. 50 0 quality 0 / 〇. And a photosensitive resin layer comprising the photosensitive resin composition according to any one of the above [1] to [10], which is laminated on the support film. [12] A method of producing a substrate on which a resist pattern is formed, comprising the steps of: laminating a photosensitive resin laminated layer layer as described in [11] above on a substrate, and performing the photosensitive property via a mask The exposure step of exposing the resin laminate and the developing step of removing the unexposed portion. A method of manufacturing a circuit board, which comprises forming a circuit board by etching or plating a substrate manufactured by the method of the above. [Effects of the Invention] 160046.doc 201232173 According to the present invention, it is possible to provide a developer which is excellent in dispersion stability, suppresses generation of aggregates, and has moderate developability. The softness of the hardened resist and the good touchability. A preferred photosensitive resin composition for forming a good conductor pattern; and a photosensitive resin laminate having a photosensitive denier layer containing the composition. [Embodiment] Hereinafter, a mode for carrying out the invention (hereinafter simply referred to as "the embodiment") will be described in detail. Further, the present invention is not limited to the following embodiments, and various modifications can be made without departing from the spirit and scope of the invention. <Photosensitive resin composition> In the present embodiment, the photosensitive resin composition contains an alkali-soluble polymer, (B) a photopolymerization initiator, and (c) a compound having an ethylenically unsaturated double bond. <(A) Alkali-soluble polymer> The (A) alkali-soluble polymer means a vinyl resin containing a carboxyl group, and examples thereof include (meth)acrylic acid, (mercapto) acrylate, and (meth)acrylonitrile. (f-) a copolymer of acrylamide or the like. (A) The alkali-soluble polymer preferably has a carboxyl group and has an acid equivalent of 100 to 6 Å (the acid equivalent is preferably 1 Å on the viewpoint of improving development resistance and improving resolution and adhesion. From the viewpoint of improving developability and releasability, it is preferably 6 Å or less. The acid equivalent is more preferably 250 to 450. (A) The alkali-soluble polymer preferably has a weight average molecular weight of 5 and more than 500,000 〇〇〇. (A) The weight average molecular weight of the alkali-soluble polymer is such that the properties of the coagulum are developed and the side of the photosensitive resin laminate is formed. 160046.doc 1Λ -10 - 201232173 Edge melting, slicing, etc. are not exposed. From the viewpoint of the properties of the film, it is preferably 5,000 or more. From the viewpoint of improving the developability, it is preferably 5 Å or less. Here, the edge meltability means that the photosensitive resin is laminated. When the body is curled into a roll shape, the phenomenon in which the photosensitive resin composition layer protrudes from the end surface of the roll. The so-called "slinterability" refers to a phenomenon in which the wafer scatters when the unexposed film is cut by a cutter, if the wafer is attached. Photosensitive resin product The upper surface of the layered body or the like is transferred to the mask in the subsequent exposure process or the like to cause a defect. (A) The weight average molecular weight of the alkali-soluble polymer is more preferably 5,000 or more and 3 Å, 〇 In the following, it is preferably 1 Å or more and 200 Å or less. (A) The soluble polymer can be, for example, one or more of the following two types of monomers: The first monomer is a carboxylic acid or a fatty liver having a polymerizable unsaturated group in the molecule. Examples thereof include (meth)acrylic acid, fumaric acid, cinnamic acid, barley acid, and clothing. Butic acid, maleic anhydride, maleic acid half ester, etc. More preferably (meth)acrylic acid. Here, 'the so-called (meth)acrylic acid means acrylic acid or methacrylic acid. The second monomer is a monomer which is non-acidic and has at least one polymerizable unsaturated group in the molecule, and examples thereof include decyl acrylate, ethyl (meth) acrylate, n-propyl (meth) acrylate, and (methyl) Isopropyl acrylate, n-butyl (meth) acrylate, (fluorenyl) Isobutyl enoate, second butyl ketone (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 2-hydroxypropyl (meth) acrylate, 2-ethyl hexyl (meth) acrylate Ester, benzyl (mercapto) acrylate, ethoxylated, such as vinyl acetate, (mercapto) acrylonitrile, stupid 600046.doc 201232173 ene, styrene derivatives, etc. Methyl acrylate, n-butyl (meth) acrylate, styrene, styrene derivative, and benzyl (meth) acrylate " as (A) a copolymer component in a soluble polymer, preferably The styrene derivative or the styrene derivative preferably has a copolymerization ratio of from 2% by mass to 6% by mass. The copolymerization ratio has sufficient cohesiveness and etching resistance. The amount is preferably 20% by mass or more. From the viewpoint of moderate developability and softness of the cured film, it is preferably 60% by mass. /❶The following. The copolymerization ratio is more preferably 20% by mass to 50% by mass, still more preferably 20% by mass to 30% by mass. Further, as a copolymer component, styrene or a styrene derivative, (mercapto) is preferably used. Methyl acrylate and (meth)acrylic acid are copolymerized. Further, in order to obtain excellent resolution different from the above, the copolymerization ratio of the styrene or styrene derivative is preferably 4 Å. /〇~6〇 mass ° / 〇 'and 'as a copolymer component' is preferably a copolymer of styrene or a styrene derivative, methyl (meth) acrylate, and (meth) acrylic acid . When the total solid content of the photosensitive resin composition is 100% by mass, the amount of the (A) alkali-soluble polymer in the photosensitive resin composition is preferably in the range of 40% by mass to 80% by mass. More preferably, it is 5 〇 mass% to 70 mass%. The blending amount is preferably 40% by mass or more from the viewpoint of edge meltability, and is preferably 8% by mass or less from the viewpoint of development time. <(B) Photopolymerization initiator> The above photosensitive resin composition contains 2,4,5-triarylmyrazole dimer or 160046.doc -12-201232173 acridine compound as (B) photopolymerization The essential ingredients of the starter. Specific examples of such may, for example, be 2—(o-phenyl)-4,5-diphenylimidazole dimer, 2-(o-phenyl)-4,5-bis(methoxyphenyl). Imidazole dimer, ^(o-fluorophenyl)-4,5.diphenylimidazole dimer, 2_(o-methoxyphenyl)-4,5-diphenylimidazole dimer, 2_(pair 2,4,5-triarylimidazole dimer such as methoxyphenyl)_4,5-diphenylimidazole dimer, 9-phenyl acridine 'oxime, 7-bis (9,9-acridine) Acridine derivatives such as heptane and the like. Examples of the photopolymerization initiator which can be further contained in the photosensitive resin composition include, in addition to the 2,4,5-triarylimidazole dimer or acridine compound, dibenzophenone, N, N. '-Tetramethyl-4,4'-didecylaminodibenzophenone (Mitchler), N,N,-tetraethyl-4,4,-diaminobenzophenone, 4 _Methoxy-4'-dimethylaminodibenzophenone, 2-benzyl-2-dimethylamino. -(Carboxylinylphenyl)-butanone 丨, 2, fluorenyl (decylthio)phenyl]_2_morpholinyl-acetone-1 and other aromatic ketones, 2_ethyl fluorene, phenanthrenequinone , 2_t-butyl hydrazine, octyl hydrazine, 1,2-benzopyrene, 2,3-benzopyrene, 2_phenyl fluorene, 2,3-diphenyl fluorene, ι蒽醌 gas, 2_methyl hydrazine, hydrazine, 4_naphthoquinone, 9,10-phenanthrenequinone, 2-mercapto-1, 4-naphthoquinone, 2,3-dimethylhydrazine, etc. , benzoin, benzoin ethyl ether, benzoin phenyl ether and other benzoin ether compounds, benzoin and other benzoin derivatives, N-phenylglycine derivatives, coumarin compounds, 4, 4, bis (diethylamine) Base) diphenyl fluorenone and the like. These photopolymerization initiators may be used singly or in combination of two or more. When the total solid content of the photosensitive resin composition is 100% by mass, the amount of the photopolymerization initiator (B) in the photosensitive resin composition is preferably 0.1% by mass. /. ~20% by mass. The blending amount is 20% by mass or less to the bottom surface of the resist from the viewpoint of obtaining a sufficient light sensitivity of 160,046.doc 201232173 degrees. It is preferably 0.1% by mass or more, and is preferable from the viewpoint of sufficiently transmitting light and obtaining good high resolution. A more preferable range of the blending amount is 〇.5 mass% to 1 〇<(c) a compound having an ethylenically unsaturated double bond>; a compound having an ethylenically unsaturated double bond; Equivalently, it has an ethylenic character; and the compound 1 which is saturated with pour is (c) a compound having an ethylenically unsaturated double bond, and examples thereof include di(methyl)(tetra) acid vinegar and then so-called (meth) acrylate. , means acrylic acrylate or methacrylate. The photosensitive resin composition contains the following general formula (〖): [Chemical 6] R·) Ο Or CH24—“Bu 0仏0 yA.〇y “H2 • · * (I) {wherein, R] and I independently represents a hydrogen atom or a sulfhydryl group, and octagonal or C3H6, in -(Α-Ο)η丨- and _(A_〇)n3_, the arrangement of the repeating units of _c2h4 〇 and _C3H6 可 may be Randomly, it may be a block. When the arrangement is a block, either -QHcO- and <3 out-〇- may be _Β_〇·base side, Β is carbon number 4 to 8 of the 2 valence alkyl chain, 〇| is an integer of 〇~1〇, ~ is an integer of 〇~10, ηι+η3 is an integer of 0 to 10, and ~ is an integer of 〇2〇} The compound serves as (C) a compound having an ethylenically unsaturated double bond. Here, in the case where the bis(meth) acrylate represented by the above formula (1) is combined with the invention of the invention to prepare a photosensitive resin composition, The details of the mechanism of the photosensitive resin composition which is excellent in dispersion stability, can suppress the generation of aggregates, and has moderate developability, softening resistance (4) flexibility, and good rice-resistance resistance, is not clear, but it is speculated It is the effect as described below. The second (nodular) acrylate of the formula (1) has a group represented by -(B-0)-, compared with the oxyethylene or oxypropylene group generally used, the chain: the chain is long, and Since it has a side chain, it is estimated that the degree of freedom of the main chain is relatively large, and the flexibility of the chemical structure (sometimes referred to as capping property) is excellent. The mysterious bond has a tendency to cause a nucleophilic substitution reaction of a carbon adjacent to oxygen due to an acid and to break the bond, but the bis(methyl) propyl s 曰 通式 represented by the general formula (I) has The ratio y of the bond-breaking reaction site due to the acid represented by (Β·〇)_ is preferably an oxidized vinyl group or an oxypropylene group, and is considered to be excellent in acid resistance (sometimes referred to as etching resistance). Further, the bis(meth) acrylate represented by the formula (I) has a higher oleophilicity as a group represented by 〇)·, which is presumed to be a dispersion of a phenyl-containing initiator which is easily developed as a coagulum. It is excellent in the stability (inhibition of the generation of the agglomerates. Further, the moderate developability is also estimated to be derived from the moderate lipophilicity of the di(meth)acrylate represented by the formula (1). In the compound of the formula (1), η丨 and h are preferably an integer of 〇. That is, n, +n3 is preferably an integer of 〇. More specifically, from the viewpoints of edge meltability and ease of production, etc. In other words, the compound represented by the above formula (1) is preferably, for example, the following formula (VI): 160046.doc •••(VI) 201232173 [Chemical 7] CHz^C~~Q—Ό~^〇ηΟΗ2〇Η2〇Η2 〇Η2〇·]—

" 〇JL C C—^C H2 {式中’心及尺2分別獨立表示氫原子或甲基,並且n2較佳 為1〜20之整數’更佳為丨〜15之整數,尤佳為丨〜⑺之整數) 所示之聚丁二醇二(甲基)丙烯酸酯。 更具體而言’例如可列舉:丁二醇二(甲基)丙烯酸酯、 二丁二醇二(甲基)丙烯酸酯、三丁二醇二(甲基)丙烯酸 酯、四丁二醇二(甲基)丙稀酸酯、五丁二醇二(甲基)丙烯 酸醋、六丁二醇二(甲基)丙稀酸酯、七丁二醇二(甲基)丙 稀酸a旨、八丁二醇二(甲基)丙烯酸酯、九丁二醇二(甲基) 丙烯酸酯、十丁二醇二(甲基)丙烯酸酯、十一丁二醇二(曱 基)丙稀酸醋、十二丁二醇二(甲基)丙烯酸酯、十三丁二醇 二(甲基)丙烯酸酯、十四丁二醇二(甲基)丙烯酸酯、十五 丁二醇二(曱基)丙稀酸醋等。 於上述通式(I)及(VI)所示之化合物中,〜較佳為卜2〇之 整數’更佳為1〜15之整數’尤佳為卜1〇之整數^ n2就硬化 膜柔軟性之觀點而言’較佳為1以上,另一方面,就耐姓 刻性之觀點而言’較佳為2〇以下。n2更佳為5〜1〇之整數。 於將感光性樹脂組合物之總固形物成分質量設為丨〇〇質 量%時,感光性樹脂組合物中之上述通式⑴或(VI)所示之 化合物的調配量較佳為!質量。/。〜丨5質量%。該調配量就獲 得硬化膜柔軟性之觀點而言,較佳為丨質量%以上,就耐 160046.doc 201232173 X"生之觀點而5,較佳為】5質量%以下。該調配量之更 佳之範圍為1質里%〜1〇質量% ’進而較佳之範圍為3質量 °/。〜10質量%。 又’就進-步提昇柔軟性之觀點而言,感光性樹脂組合 • 物較佳為進而包含下述通式(11): [化8] 一―U—fC3He,C^tr^P^令•。七" 〇JL CC—^C H2 {wherein the heart and the ruler 2 respectively represent a hydrogen atom or a methyl group, and n2 is preferably an integer of 1 to 20', more preferably an integer of 丨15, especially preferably 丨Polybutanediol di(meth)acrylate shown as an integer of (7). More specifically, 'for example, butanediol di (meth) acrylate, dibutyl diol di (meth) acrylate, tributyl diol di (meth) acrylate, tetrabutyl diol di ( Methyl) acrylate, pentabutyl glycol di(meth)acrylate vinegar, hexabutylene glycol di(meth) acrylate, heptabutyl diol di(meth) acrylate acid, eight butyl Diol di(meth)acrylate, nonabutylene glycol di(meth)acrylate, decabutylene glycol di(meth)acrylate, eleven butanediol di(decyl)acrylic acid vinegar, ten Dibutylene glycol di(meth)acrylate, thirteen butanediol di(meth)acrylate, tetradecanediol di(meth)acrylate, fifteen butanediol di(decyl)propene Sour and so on. In the compounds represented by the above formulas (I) and (VI), the integer is preferably an integer of from 1 to 15 and is preferably an integer of the formula From the viewpoint of the nature, it is preferably 1 or more, and on the other hand, it is preferably 2 or less in terms of resistance to surname. N2 is preferably an integer of 5 to 1 。. When the total solid content of the photosensitive resin composition is 丨〇〇% by mass, the compounding amount of the compound represented by the above formula (1) or (VI) in the photosensitive resin composition is preferably! quality. /. ~ 丨 5 mass%. The blending amount is preferably 丨% by mass or more from the viewpoint of obtaining the softness of the cured film, and is 5, preferably 5% by mass or less from the viewpoint of 160046.doc 201232173 X" A more preferable range of the blending amount is 1% by mass to 1% by mass, and a preferred range is 3% by mass. ~10% by mass. Further, from the viewpoint of further improving the flexibility, the photosensitive resin composition preferably further comprises the following formula (11): [Chemical 8] A-U-fC3He, C^tr^P^ •. Seven

• · · ( I {式中,R3及R4分別獨立為氫原子或曱基,…及n?分別獨立 為〇〜20之整數,…+恥為‘仙之整數,〜及…分別獨立為 1〜2〇之整數,n5 + n6為2〜4〇之整數,並且-(C2H4-〇)·及 •(CM-O)·之重複單位之排列可為無規,亦可為嵌段,於 忒排列為嵌段之情形時,_(C2H4_〇)_& _((:3Η6_〇)_中之任— 者亦可為雙酚基側} 所不之化合物作為具有乙烯性不飽和雙鍵之化合物。 此處,於將上述通式⑴或(VI)所示之化合物與上述通式 (11)所示之化合物併用之情形時,關於實現進一步提昇柔 軟吐之感光性樹脂組合物的機制之詳細情況,雖不明確, 但推測為如下所述之作用。 即’推測為於將通式⑴或(VI)所示之化合物與上述通式 (11)所示之化合物併用之情形時,提昇光聚合之反應性 者。並且’藉此曝光後之硬化膜成為更強韌者,且推測為 160046.doc 201232173 表現出良好之韌性者。 於上述通式(II)中,ru及η?分別獨立為〇〜20之整數, ήβη7為0〜40之整數’ ns及η6分別獨立為1〜20之整數, ήβη6為2〜40之整數。又,較佳為η4+η5 + η6+η7之下限為2以 上,另一方面,其上限為40以下。n4+ns + n6+n7就硬化膜之 柔軟性之觀點而言,較佳為2以上’另一方面,就解像性 之觀點而言,較佳為40以下。又,就耐蝕刻性之觀點而 言,ru+k+r^+n7之更佳之範圍的下限為4以上,上限為⑽ 以下,更佳之範圍之下限為6以上,上限為12以下。又, 就支撐性之觀點而言,…+〜+…+恥之更佳之範圍的下限為 16以上,上限為40以下,更佳之範圍之下限為以上上 限為40以下。進而較佳為…及η?分別獨立為1〜1〇之整數, 更佳Wn7^〜20之整數,另一方面,更佳為—為 2〜20之整數。 作為上述通式(11)所示之化合物之具體例,可列舉:於 雙紛A之兩端分別加成有平均2莫耳之氧化乙稀的乙二醇之 二甲基丙烯酸醋、或於雙齡八之兩端分別加成有平均5莫耳 之氧化乙烯的乙二醇之-甲其 坪之一甲基丙烯酸酯、於雙酚A之兩 为別加成有平均6莫耳之氧化乙稀 的炫二醇之二f基丙烯酸醋:耳之氧化丙稀 15苴且夕窃π, 、雙盼Α之兩端加成有平均 ?耳之氧化乙稀與平均2莫耳的氧 甲基丙烯酸酯等。 —醇之一 於將感光性樹脂組合物之 量%時,感光性樹脂 、:固形物成分質量設為HK)質 °物中之上述通式(Π)所示之化合物 160046.doc 201232173 的調配$較佳為5f量%〜2〇質量%。該調配量就獲得耐餘 刻性之觀點而t ’較佳為5質量%以上,就硬化膜柔軟性 之觀點而言,妨杜达 較佳為20質量%以下。該調配量之更佳之範 圍為5質量%〜丨5皙吾 M量/〇 ’進而較佳之範圍為7質量%〜15質 量 〇/〇。 iUI昇硬化膜柔軟性之觀點而言,感光性樹脂組合物較 佳為進而包含下述通式(III): [化9] 。—。如力廿咖。…,· . ·(丨丨丨) 5及R_6刀別獨立為氫原子或曱基,w及&分別獨立 為3〜40之整數,並且_(C2H4-〇)-及_(C3H6-0)-之重複單位之 排列可為無規,亦可為嵌段) 所不之化合物作為(c)具有乙烯性不飽和雙鍵之化合物。 於上述通式(111)所示之化合物中,就提昇硬化膜柔軟性 之觀點而言’較佳為W及Μ分別獨立為3以上之整數,更佳 為5以上之整數。 作為上述通式(ΠΙ)所示之化合物之具體例’例如可列舉 於加成有平均9莫耳之氧化丙烯之聚丙二醇上進而加成平 均1莫耳之氧化乙烯的聚烷二醇之二甲基丙烯酸酯等。 於將感光性樹脂組合物之總固形物成分質量設為丨00質 量0/。時,感光性樹脂組合物中之上述通式(ΠΙ)所示之化合 160046.doc 19 201232173 物的調配量較佳為i質量%〜20質量%。該調配量就獲得硬 化膜柔軟性之觀點而言,較佳為丨質量%以上,就耐蝕刻 性之觀點而言,較佳為20質量%以下。該調配量之更佳之 範圍為3質量%〜15質量%,進而較佳之範圍為5質量%〜1〇 質量°/〇。 就提昇硬化膜柔軟性之觀點而言,感光性樹脂組合物較 佳為進而包含下述通式(IV)及/或(v): [化 10] r5 ο 〇 % H2C=i-c-〇^C2H4-〇^c3He-〇^c2H4-〇^—!!--i=CH2 2 . · . ( I V) {式中,Rs及R6分別獨立為氫原子或曱基,ni〇〜ni2分別獨 立為1〜30之整數} [化 11]• · · (I (wherein, R3 and R4 are each independently a hydrogen atom or a sulfhydryl group, ... and n? are each independently an integer of 〇~20, ... + shame is an integer of '仙,' and ... are independently 1 An integer of 〜2〇, n5 + n6 is an integer of 2 to 4 ,, and the arrangement of repeating units of -(C2H4-〇)· and (CM-O)· may be random or block, When 忒 is arranged as a block, _(C2H4_〇)_& _((:3Η6_〇)_ may be a bisphenol group side as a compound having ethylenic unsaturation In the case where the compound represented by the above formula (1) or (VI) is used in combination with the compound represented by the above formula (11), the photosensitive resin composition for further improving softness is disclosed. Although the details of the mechanism are not clear, it is presumed to be as follows. That is, it is presumed that when the compound represented by the formula (1) or (VI) is used in combination with the compound represented by the above formula (11) , to enhance the reactivity of photopolymerization. And 'the cured film after this exposure becomes stronger, and is presumed to be 16046.doc 201232173 In the above formula (II), ru and η? are each independently an integer of 〇~20, and ήβη7 is an integer of 0 to 40' ns and η6 are each independently an integer of 1 to 20, and ήβη6 is 2~ Further, it is preferable that the lower limit of η4 + η5 + η6 + η7 is 2 or more, and the upper limit is 40 or less. n4 + ns + n6 + n7 from the viewpoint of the softness of the cured film, It is preferably 2 or more. On the other hand, from the viewpoint of resolution, it is preferably 40 or less. Further, from the viewpoint of etching resistance, the lower limit of the range of ru+k+r^+n7 is better. 4 or more, the upper limit is (10) or less, and the lower limit of the range is more preferably 6 or more, and the upper limit is 12 or less. Further, from the viewpoint of supportability, the lower limit of the range of ...+~+...+shame is 16 or more. The upper limit is 40 or less, and the lower limit of the more preferable range is 40 or less. Further preferably, ... and η are each independently an integer of 1 to 1 ,, more preferably an integer of Wn 7 2 to 20, and more preferably, The specific example of the compound represented by the above formula (11) is exemplified by the addition of both ends of the double A Ethylene glycol methacrylate with 2 moles of ethylene oxide, or ethylene glycol with an average of 5 moles of ethylene oxide at both ends of the double ages The acrylate and the two bisphenol A are bis-acrylic vinegars which are added with an average of 6 moles of ethylene oxide, and the oxidized propylene of the ear is 15 苴 and π π, The both ends are added with an average of ethylene oxide of the ear and an average of 2 moles of oxygen methacrylate, etc. One of the alcohols is a photosensitive resin or a solid component when the amount of the photosensitive resin composition is %. The compounding amount of the compound 160046.doc 201232173 represented by the above formula (Π) in the mass is set to HK) is preferably 5f% by mass to 2% by mass. The amount of the blending is preferably 5% by mass or more, and from the viewpoint of the softness of the cured film, the blending amount is preferably 20% by mass or less. A more preferable range of the blending amount is 5% by mass to 5%, and the amount is preferably from 7% by mass to 5% by mass. The photosensitive resin composition preferably further comprises the following general formula (III) from the viewpoint of the softness of the iUI-lifting film: [Chemical Formula 9]. —. Such as the power of coffee. ..., · . · (丨丨丨) 5 and R_6 are independent of hydrogen or sulfhydryl groups, w and & are respectively independent integers from 3 to 40, and _(C2H4-〇)- and _(C3H6-0 The arrangement of the repeating units may be random or block compounds as (c) compounds having ethylenically unsaturated double bonds. In the compound represented by the above formula (111), from the viewpoint of improving the flexibility of the cured film, it is preferred that W and Μ are each independently an integer of 3 or more, and more preferably an integer of 5 or more. Specific examples of the compound represented by the above formula (ΠΙ) include, for example, a polyalkylene glycol in which an average of 1 mole of ethylene oxide is added to a polypropylene glycol having an average of 9 moles of propylene oxide. Methacrylate and the like. The total solid content of the photosensitive resin composition was set to 丨00 mass 0/. In the photosensitive resin composition, the compounding amount of the compound 160046.doc 19 201232173 represented by the above formula (ΠΙ) is preferably from i% by mass to 20% by mass. The blending amount is preferably 丨% by mass or more from the viewpoint of obtaining the softness of the cured film, and is preferably 20% by mass or less from the viewpoint of etching resistance. A more preferable range of the blending amount is 3% by mass to 15% by mass, and further preferably a range of 5% by mass to 1% by mass. The photosensitive resin composition preferably further comprises the following general formula (IV) and/or (v) from the viewpoint of improving the flexibility of the cured film: [Chemical 10] r5 ο 〇 % H2C = ic - 〇 ^ C2H4 -〇^c3He-〇^c2H4-〇^—!!--i=CH2 2 . ( IV) {wherein, Rs and R6 are each independently a hydrogen atom or a sulfhydryl group, and ni〇~ni2 are independently 1 An integer of ~30} [化11]

Rs Ο 〇 R H2C_c—c—〇—(-C3H6-〇-)—(-c2H4-〇|—(-c3He-〇 -)—c—C=CH2 Πι° °11 n12 * · · (V) {式中,Rs及Re分別獨立為氫原子或甲基,ni〇〜ni2分別獨 立為1〜30之整數} 所示之化合物作為(C)具有乙烯性不飽和雙鍵之化合物。 於上述通式(IV)或(V)所示之化合物中,就提昇硬化犋柔 軟性之觀點而言,較佳為n1G〜ni2分別獨立為i以上之整 數,更佳為3以上之整數。 160046.doc •20- 201232173 列舉^Γ )或(V)心之化合物之具體例,例如可 1Γ 有平均18莫耳之氧化丙婦之聚丙二醇上,進 而於兩端分別加成平均各7莫耳之氧化乙稀的聚院二醇之 -甲基丙稀酸醋;於加成有平均18莫耳之氧化丙稀之聚丙 :酵亡,⑨而於兩端分別加成平均各3莫耳之氧化乙稀的 元醇之—甲基丙稀酸3旨;於加成有平均12莫耳之氧化 丙烯之聚丙二醇上,推、 坪上進而於兩端分別加成平均各3莫耳之 乙烯的聚烧一醇之二甲基丙稀酸醋;於加成有平均6 莫耳之氧化乙稀之聚乙二醇上,進而於兩端分別加成平均 各6莫耳之氧化丙烯的聚烷二醇之二甲基丙烯酸醋等。 旦於將感光性樹脂組合物之總固形物成分質量設為ι〇〇質 里%時’ €光性樹脂組合物中之上述通式(ιν)或⑺所示之 化合物的調配量較佳為1質量。質量。/。。該調配量就獲 得耐㈣性之觀點而言’較佳為1質量%以上,就硬化膜 柔軟性之觀點而言’較佳為3〇質量%以下。該調配量之更 佳之範圍為5質量%〜25質量%,進而較佳之範圍為5質量 %〜23質量%。 感光性樹脂組合物較佳為進而包含於分子内具有至少一 個胺基甲酸酯鍵之化合物作為(〇具有乙烯性不飽和雙鍵 之化合物。具體而言’可列舉:藉由六亞甲基二異氰酸 醋、甲苯二異氰酸醋、2,2,4_三甲基六亞甲基二異氰酸醋 等一異氰酸酯化合物與(f基)丙烯酸2_羥丙酯、低聚乙二 醇(甲基)丙烯酸酯、低聚丙二醇(甲基)丙烯酸酯等羥基(甲 基)丙烯酸酯化合物進行反應而獲得之胺基甲酸酯化合 160046.doc -21- 201232173 物於刀子内具有至少一個胺基甲酸醋鍵之化合物例如就 ⑭刻性之觀點而言,較佳為藉由六亞甲基二異氛酸醋、 甲苯一異氰酸酯、2,2,4-三甲基六亞曱基二異氰酸酯等二 異氰㈣化合物與低聚丙二醇(甲基)丙稀酸酿之反應而獲 得之胺基甲酸酯化合物。 於將感光性樹脂組合物之總固形物成分質量設為1〇〇質 量/〇時,感光性樹脂組合物中之於上述分子内具有至少一 個胺基曱g曰鍵之化合物的調配量較佳為5質量質量 /〇。该調配量就獲得耐蝕刻性之觀點而言,較佳為5質量% 以上,就凝聚性之觀點而言,較佳為2〇質量%以下。該調 配量之更佳之範圍為8質量。/。〜2〇質量。/〇,進而較佳之範圍 為8質量%〜17質量% β 感光性樹脂組合物較佳為進而包含於分子内具有異氰尿 酸基之化合物作為(C)具有乙烯性不飽和雙鍵之化合物。 具體而言,作為於分子内具有異氰尿酸基之化合物,例如 可列舉:乙氧基化異氰尿酸三丙烯酸酯、經ε_己内酯改性 之單-(2-丙烯醯氧基乙基)異氰尿酸酯、經ε_己内酯改性之 雙-(2-丙稀酿氧基乙基)異氰尿酸酯、經ε_己内醋改性之三_ (2-丙烯醯氧基乙基)異氰尿酸酯、經異氰尿酸氧化乙稀改 性之丙烯酸酯、經異氰尿酸氧化乙烯改性之二丙稀酸醋、 經異氰尿酸氧化乙烯改性之三丙烯酸酯、經異氰尿酸氧化 丙烯改性之丙烯酸酯、經異氰尿酸氧化丙烯改性之二丙稀 酸酯、經異氰尿酸氧化丙烯改性三丙烯酸酯等。 於將感光性樹脂組合物之總固形物成分質量設為1〇〇 f -22- 160046.docRs Ο 〇R H2C_c—c—〇—(-C3H6-〇-)—(-c2H4-〇|—(-c3He-〇-)—c—C=CH2 Πι° °11 n12 * · · (V) { In the formula, Rs and Re are each independently a hydrogen atom or a methyl group, and ni〇~ni2 are each independently an integer of from 1 to 30. The compound shown is (C) a compound having an ethylenically unsaturated double bond. In the compound represented by (IV) or (V), from the viewpoint of enhancing the flexibility of the hardening enthalpy, it is preferred that n1G to ni2 are each independently an integer of i or more, and more preferably an integer of three or more. 160046.doc • 20- 201232173 A specific example of a compound of (Γ) or (V) heart, for example, may have an average of 18 moles of propylene oxide on the polypropylene glycol, and then add an average of 7 moles of oxidation B at both ends. Dilute diol methacrylate-methyl acrylate vinegar; in addition to an average of 18 moles of propylene oxide polypropylene: yeast, 9 and add an average of 3 moles of ethylene oxide at each end The diol-methyl acrylate acid is added to the polypropylene glycol with an average of 12 moles of propylene oxide, and the average of 3 moles of ethylene is added to the ping on the ping. An alcohol-burning dimethyl acrylate vinegar; on the addition of an average of 6 moles of ethylene oxide on the polyethylene glycol, and then add an average of 6 moles of propylene oxide on both ends of the polyalkylene Alcoholic dimethacrylate vinegar and the like. When the total solid content of the photosensitive resin composition is set to 5% by mass, the compounding amount of the compound represented by the above formula (ιν) or (7) in the 'gremental resin composition is preferably 1 quality. quality. /. . The blending amount is preferably 1% by mass or more from the viewpoint of resistance to (four), and is preferably 3% by mass or less from the viewpoint of the flexibility of the cured film. More preferably, the blending amount is in the range of 5% by mass to 25% by mass, and further preferably in the range of 5% by mass to 23% by mass. The photosensitive resin composition preferably further contains a compound having at least one urethane bond in the molecule as a compound having an ethylenically unsaturated double bond. Specifically, it can be exemplified by a hexamethylene group. Monoisocyanate compound such as diisocyanate, toluene diisocyanate, 2,2,4-trimethylhexamethylene diisocyanate, and 2-hydroxypropyl (f-) acrylate, oligomeric B a urethane compound obtained by reacting a hydroxy (meth) acrylate compound such as a diol (meth) acrylate or an oligomeric propylene glycol (meth) acrylate, 160046.doc -21 - 201232173 has a knives The at least one urethane-bonded compound is preferably hexamethylene diisocyanate, toluene monoisocyanate, 2,2,4-trimethylhexaarene, for example, from the viewpoint of 14-grain. A urethane compound obtained by a reaction of a diisocyanate (tetra) compound such as a bis-isocyanate with an oligopropylene glycol (meth) acrylic acid. The total solid content of the photosensitive resin composition is set to 1 〇. 〇 mass / 〇, in the photosensitive resin composition The compounding amount of the compound having at least one amino group 曱g曰 bond in the above molecule is preferably 5 mass% / 〇. The amount of the compound is preferably 5% by mass or more in terms of etch resistance. From the viewpoint of the nature, it is preferably 2% by mass or less. A more preferable range of the blending amount is 8 mass% / 2 〇 mass. / 〇, and further preferably, the range is 8 mass% to 17 mass% β photosensitive The resin composition preferably further contains a compound having an isocyanuric acid group in the molecule as (C) a compound having an ethylenically unsaturated double bond. Specifically, as a compound having an isocyanuric acid group in the molecule, for example, Ethyl ethoxylated isocyanuric acid triacrylate, ε-caprolactone modified mono-(2-propenyloxyethyl) isocyanurate, modified by ε_caprolactone Bis-(2-propanyloxyethyl)isocyanurate, tris(2-propenyloxyethyl)isocyanurate modified by ε_hexyl vinegar, isocyanuric acid Ethylene oxide modified acrylate, ethylene diacetate modified by isocyanuric acid oxyethylene, isocyanuric acid Ethylene-modified triacrylate, acrylate modified by isocyanuric acid propylene oxide, diacrylic acid ester modified by propylene oxide isocyanurate, propylene oxide modified triacrylate by isocyanuric acid, etc. The total solid content of the photosensitive resin composition is set to 1〇〇f -22-160046.doc

S 201232173 量%時’感光性樹脂組合物中之於分子内具有異氰尿酸基 之化合物的調配量較佳為i質量%〜2〇質量%。該調配量就 獲得耐蝕刻性之觀點而言,較佳為1質量%以丨,就硬化 膜柔軟性之觀點而言,較佳為2〇質量%以下。該調配量之 $佳之範圍為1質量%〜15質量% ’進而較佳之範圍為2質量 °/。〜10質量%。 除選自由上述通式(I)〜(VI)所示之化合物、於分子内具 有至少一個胺基曱酸酯鍵之化合物、及於分子内具有異氰 尿酸基之化合物所組成之群中的化合物以外’感光性樹脂 組合物亦可包含如下所示之可進行光聚合的乙烯性不飽和 化合物作為(C)具有乙烯性不飽和雙鍵之化合物: 具體而言,作為可進行光聚合之乙烯性不飽和化合物, 可列舉·聚丙一醇二(甲基)丙烯酸酯、聚乙二醇(甲基)丙 烯酸酯、2_二(對羥基笨基)丙烷(f基)丙烯酸酯、甘油三 (曱基)丙烯酸酯、三羥甲基三(曱基)丙烯酸酯、聚氧丙基 二羥甲基丙烷三(甲基)丙烯酸酯、聚氧乙基三羥甲基丙烷 二(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊 四醇五(甲基)丙烯酸酯、三甲基丙烷三縮水甘油醚三(甲 基)丙烯酸酯、苯氧基聚乙二醇(曱基)丙烯酸酯、壬基苯氧 基聚乙二醇(曱基)丙烯酸酯等。該等可單獨使用,亦可併 用2種以上。 於將感光性樹月曰組合物之總固形物成分質量設為1 〇 〇質 量°/。情形時’感光性樹脂組合物中之(C)具有乙烯性不飽和 雙鍵之化合物的調配量較佳為5質量%〜5〇質量。。該調配 160046.doc -23- 201232173 。量就感光度、解像性、密接性之觀點而言,較佳為5質量 /〇以上,就抑制冷流及硬化抗蝕劑之剝離延遲之觀點而 言’較佳為50質量%以下。該調配量更佳為“質量%〜45質 量%。 <隱色染料、螢烷染料、著色物質> 感光性樹脂組合物亦可含有隱色染料、螢烷染料或著色 物質。藉由含有該等染料而使曝光部分顯色,故而就視認 性之方面而言較佳,又,於檢查機等讀取用於曝光之定位 才示s己之情形時,曝光部分與未曝光部分之對比度較大者容 易識別而較有利。 作為隱色染料,可列舉:三(4·二甲基胺基苯基)甲烷[隱 色結晶紫]、雙(4-二甲基胺基苯基)苯基甲烷[隱色孔雀 綠]°尤其是就對比度變得良好之觀點而言,較佳為使用 隱色結晶紫作為隱色染料。 作為螢烷染料’可列舉:2-(二苄基胺基)螢烷、2-苯胺 基-3-甲基-6-二乙胺基螢烷、2-苯胺基-3-甲基-6-二丁基胺 基螢烷、2-苯胺基-3-甲基-6-N·乙基-N-異戊基胺基螢烷、 2-苯胺基-3-甲基-6-N-曱基-N-環己基胺基螢烷、2-苯胺基 -3-氣-6-二乙胺基螢烷、2-苯胺基-3-曱基-6-N-乙基-N-異丁 基胺基螢烷、2-苯胺基-6-二丁基胺基螢烷、2-苯胺基-3-曱 基-6-N-乙基-N-四氫糠基胺基螢烷、2-苯胺基-3-甲基-6-哌 啶基胺基螢烷、2-(鄰氣苯胺基)-6-二乙胺基螢烷、2-(3,4-二氣苯胺基)-6-二乙胺基螢烷等。 於將感光性樹脂組合物之總固形物成分質量設為100質 160046.doc • 24- 201232173 量%時,感光性樹脂組合物中之隱色染料或螢烷染料之含 置較佳為0.1質量%〜1〇質量%。該含量就曝光部分與未曝 光部分之對比度之觀點而言,較佳為〇1質量%以上,就維 持保存穩定性之觀點而言,較佳為1〇質量%以下。 作為著色物質,例如可列舉:品紅、酞菁綠、金黃胺 鹼、對品紅、結晶紫、甲基橙、尼祿藍2B、維多利亞藍、 孔雀綠(保土谷化學工業股份有限公司製造之Aizen(註冊商 標),MALACmTE GREEN)、鹼性藍2〇、鑽石綠(保土谷化 學工業股份有限公司製造之Aizen(註冊商標),diam〇nd GREEN GH)。於將感光性樹脂組合物之總固形物成分質量 為100質量/。時,感光性樹脂組合物辛之著色物質之含 量較佳為〇.〇〇1質量%〜丨質量%。該含量就操作性提昇之觀 點而S,較佳為0.001質量%以上,就維持保存穩定性之觀 點而言,較佳為1質量%以下。 <鹵素化合物> 於本發明之實施形態中,就密接性及對比度之觀點而 δ,較佳為於感光性樹脂組合物中組合隱色染料與下述鹵 素化合物而使用。 作為函素化合物’例如可列舉:溴戊烷、溴異戊烷、溴 化異丁烯、溴化乙#、二苯溴代甲&、苄基溴、二溴曱 烷、三溴甲基苯砜、四溴化碳、三(2,3·二溴丙基)磷酸 酯、三氣乙醯胺、碘戊烷、碘異丁烷、u,卜三氯-2,2•雙 (對氯苯基)乙烧、氣化三啡化合物等,尤佳為三溴甲基苯 颯。於將感光性樹脂組合物之總固形物成分質量設為100 160046.doc -25- 201232173 質量%時,感光性樹脂組合物中之鹵素化合物之含量較佳 為0.01質量%〜3質量%。該調配量就獲得密接性及對比度 之觀點而言,較佳為0.01質量%以上,就保存穩定性之^ 點而言,較佳為3質量。/❶以下。 <自由基聚合抑制劑、苯并三唑類、羧基苯并三唑類〉 又’為了提昇感光性樹脂組合物之熱穩定性及保存穩定 性,感光性樹脂組合物亦可進而含有選自由自由基聚合抑 制劑、本并三唾類、及缓基笨并三唾類所組成之群中的至 少1種以上之化合物。 作為自由基聚合抑制劑,例如可列舉:對甲氧基紛、對 苯二紛、鄰苯三盼、蔡胺、第三丁基兒茶紛、氣化亞銅、 2’6-二-第三丁基_對甲紛、2,2,·亞甲基雙⑷甲基冬第三丁 亞甲基雙(4_乙基_6•第三丁基紛)、亞确基苯基 羥胺鋁鹽、二苯基亞硝基胺等。 作為苯并三唑類,例如可列舉:1,2,3-苯并三唑、卜氣 _1,2,3-苯并三嗤、雙(Ν'2.乙基己基)胺基亞甲基-苯 并三嗤、雙㈣.乙基己基)胺基亞甲基·123甲基苯并三 唾、雙(N_2-經基乙基)胺基亞甲基·苯并三唾等。 作為缓基本并三。坐類,例如可列舉:4邊基],苯并 三唑、5-羧基_丨2 3_贫 ,本并二唑、N_(N,N_:_2_乙基己基)胺 基亞甲基幾基笑41-, 二唑、N_(N,N-二_2_羥基乙基)胺基亞甲 基緩基苯并三》坐、·^ r —, Ν·(Ν,Ν-二乙基己基)胺基伸乙基羧基 苯并三唑等。 相對於感光性樹脂組合物整體之自由基聚合抑制劑、苯 160046.docWhen the amount of S 201232173 is %, the compounding amount of the compound having an isocyanuric acid group in the molecule in the photosensitive resin composition is preferably from 1% by mass to 2% by mass. The amount of the coating is preferably from 1% by mass in terms of the etch resistance, and is preferably from 2% by mass or less from the viewpoint of the flexibility of the cured film. The blended amount is preferably in the range of 1% by mass to 15% by mass, and further preferably in the range of 2% by mass. ~10% by mass. In addition to a compound selected from the group consisting of the compounds represented by the above formulas (I) to (VI), a compound having at least one amine phthalate bond in the molecule, and a compound having an isocyanuric acid group in the molecule. The photosensitive resin composition other than the compound may further comprise a photopolymerizable ethylenically unsaturated compound as (C) a compound having an ethylenically unsaturated double bond as follows: Specifically, as a photopolymerizable ethylene Examples of the unsaturated compound include polypropanol di(meth)acrylate, polyethylene glycol (meth)acrylate, 2-di(p-hydroxyphenyl)propane (f-) acrylate, and glycerin ( Mercapto) acrylate, trimethylol tris(mercapto) acrylate, polyoxypropyl dimethylolpropane tri(meth) acrylate, polyoxyethyl trimethylolpropane di(meth)acrylic acid Ester, pentaerythritol tetra(meth) acrylate, dipentaerythritol penta (meth) acrylate, trimethylpropane triglycidyl ether tri(meth) acrylate, phenoxy polyethylene glycol (fluorenyl) acrylate Mercaptobenzene Polyethylene glycol (Yue-yl) acrylate. These may be used alone or in combination of two or more. The mass of the total solid component of the photosensitive dendritic composition is set to 1 〇 ° mass ° /. In the case of the photosensitive resin composition, the compounding amount of the (C) ethylenically unsaturated double bond in the photosensitive resin composition is preferably from 5% by mass to 5% by mass. . The deployment is 160046.doc -23- 201232173. The amount is preferably 5 mass/〇 or more in terms of sensitivity, resolution, and adhesion, and is preferably 50% by mass or less from the viewpoint of suppressing the peeling delay of the cold flow and the hardened resist. The blending amount is more preferably "% by mass to 45% by mass. <leuco dye, fluorin dye, coloring matter> The photosensitive resin composition may further contain a leuco dye, a fluorin dye or a coloring matter. These dyes make the exposed portion develop color, so that it is preferable in terms of visibility, and the contrast between the exposed portion and the unexposed portion when the inspection machine or the like reads the position for exposure to show the situation. The larger one is easier to identify and is more advantageous. As the leuco dye, tris(4-dimethylaminophenyl)methane [leuco crystal violet], bis(4-dimethylaminophenyl)benzene The base methane [hidden malachite green] ° is particularly preferably a leuco crystal dye as a leuco dye from the viewpoint of a good contrast. As a fluorin dye, a 2-(dibenzylamino group) is exemplified. ) fluorin, 2-anilino-3-methyl-6-diethylamino fluorane, 2-anilino-3-methyl-6-dibutylamino fluorane, 2-anilino-3- Methyl-6-N-ethyl-N-isoamylamino fluorane, 2-anilino-3-methyl-6-N-indenyl-N-cyclohexylamino fluorane, 2-anilinyl 3- gas-6-diethylamine Fluorane, 2-anilino-3-indolyl-6-N-ethyl-N-isobutylamino fluorane, 2-anilino-6-dibutylamino fluorane, 2-anilino- 3-mercapto-6-N-ethyl-N-tetrahydrofurfurylamino fluorane, 2-anilino-3-methyl-6-piperidinylamino fluorane, 2-(o-anilinoyl) - 6-diethylamino fluorane, 2-(3,4-dianiline)-6-diethylamino fluorane, etc. The total solid content of the photosensitive resin composition is set to 100. The content of the leuco dye or the fluorescein dye in the photosensitive resin composition is preferably 0.1% by mass to 1% by mass. The content is the exposed portion and the unexposed portion. The viewpoint of the contrast is preferably 〇1% by mass or more, and is preferably 1% by mass or less from the viewpoint of maintaining storage stability. Examples of the coloring matter include magenta and phthalocyanine green. Golden amine base, p-magenta, crystal violet, methyl orange, Nero blue 2B, Victoria blue, malachite green (Aizen (registered trademark) manufactured by Hodogaya Chemical Industry Co., Ltd., MALACmTE GREEN), alkaline blue 2〇 Diamond green Aizen (registered trademark), diam〇nd GREEN GH) manufactured by Kasei Kogyo Co., Ltd.. When the total solid content of the photosensitive resin composition is 100 mass%, the photosensitive resin composition is a coloring substance. The content is preferably 质量.〇〇1% by mass to 丨% by mass. The content is preferably 0.001% by mass or more from the viewpoint of operability improvement, and is preferably 1 mass from the viewpoint of maintaining storage stability. In the embodiment of the present invention, it is preferable to use a leuco dye and the following halogen compound in the photosensitive resin composition in view of adhesion and contrast. As the functional compound, for example, bromopentane, bromoisopentane, brominated isobutylene, bromide #, diphenyl bromide & benzyl bromide, dibromodecane, tribromomethylphenylsulfone , carbon tetrabromide, tris(2,3·dibromopropyl)phosphate, trimethylacetamide, iodopentane, iodoisobutane, u, trichloro-2,2•bis(p-chlorobenzene) Ethyl bromide, gasified trimorphine compound, etc., especially tribromomethylphenylhydrazine. When the total solid content of the photosensitive resin composition is 100 160046.doc -25 to 201232173% by mass, the content of the halogen compound in the photosensitive resin composition is preferably 0.01% by mass to 3% by mass. The blending amount is preferably 0.01% by mass or more from the viewpoint of obtaining adhesion and contrast, and is preferably 3 mass in terms of storage stability. /❶The following. <Radical polymerization inhibitor, benzotriazole, carboxybenzotriazole> Further, in order to improve the thermal stability and storage stability of the photosensitive resin composition, the photosensitive resin composition may further contain a selected from At least one or more compounds selected from the group consisting of a radical polymerization inhibitor, an intrinsic trisalt, and a sulphonic trisalt. Examples of the radical polymerization inhibitor include p-methoxy group, p-benzoic acid, o-benzotrizene, cedaramine, t-butyl catechin, vaporized cuprous, and 2'6-di- Tributyl-p-methyl, 2,2,-methylenebis(4)methyl-tert-tert-butylenemethylenebis(4-ethyl-6-t-butylene), arginylphenylhydroxylamine aluminum salt, Diphenylnitrosamine and the like. Examples of the benzotriazoles include 1,2,3-benzotriazole, Buqi-1,2,3-benzotriazine, and bis(Ν'2.ethylhexyl)aminone. Benzo-benzotriazine, bis(tetra)ethylhexyl)aminomethylene·123 methylbenzotrisene, bis(N_2-traethylethyl)aminomethylene·benzotrisene, and the like. As a basic and three. Sitting class, for example, may be exemplified by: 4 side groups], benzotriazole, 5-carboxy_丨2 3_ lean, the present oxadiazole, N_(N,N_:_2-ethylhexyl)aminomethylene group Kexiao 41-, oxadiazole, N_(N,N-di-2-hydroxyethyl)aminomethylene sulfhydryl benzotriene, sitting, ·^ r —, Ν·(Ν,Ν-diethyl Hexyl) amine group ethyl carboxy benzotriazole and the like. Radical polymerization inhibitor, benzene 160046.doc relative to the entire photosensitive resin composition

-26· 201232173 并全類、及缓基苯并三唑類之合計含量較佳為〇.〇丨質量 質置’。更佳為〇·〇5質量%〜1質量%。該含量就對感光 性樹脂組合物賦予保存穩定性之觀點而言,較佳為〇.〇1質 里以上’就維持感光度並抑制染料之脫色之觀點而言, 較佳為3質量%以下。 <塑化劑> 感光性樹脂組合物亦可視需要含有塑化劑。作為此種塑 化劑,例如可列舉:鄰苯二甲酸二乙酯等鄰苯二甲酸酯 類、鄰f苯磺醯胺、對曱苯磺醯胺、檸檬酸三丁酯、檸檬 酸二乙酿、乙醯檸檬酸三乙酯、乙醯檸檬酸三-正丙酯、 乙醯擰檬酸三-正了酉旨、聚乙二酵、聚丙二醇、聚乙二醇 院基醚、聚丙二醇烷基醚等。 於將感光性樹脂組合物之總固形物成分質量設為J 〇〇質 量%時,感光性樹脂組合物中之塑化劑之含量較佳為i質 ϊ %〜50質量。/◦,更佳為丨〜儿質量。該含量就抑制顯影時 間之延遲,並對硬化膜賦予柔軟性之觀點而言,較佳為1 質里%以上,就抑制硬化不足或冷流之觀點而言較佳為 5 0質量%以下。 <溶劑> 作為溶解感光性樹脂組合物之溶劑,可列舉:以甲其乙 基酮(MEK ’ methyl ethyl ketone)為代表之酮類,及以曱 醇、乙醇或異丙醇為代表之醇類等。該溶劑較佳為以塗佈 於支撑膜上之感光性樹脂組合物的溶液之黏度於2 5 下成 為500 mPa.s〜4000 mPa.s之方式添加於感光性樹脂組合物 160046.doc -27- 201232173 中。 <感光性樹脂積層體> 於本實施形態中,感光性樹脂積層體包括含有感光性樹 脂組合物之感光性樹脂層及支撐膜。又,較佳為將感光性 樹脂層積層於支撐膜上〃視需要,亦可於與感光性樹脂層 之支撐膜側相反側之表面上具有保護層。 作為支標膜,較理想為使自曝光光源放射之光透過之透 明者。作為此種支揮膜,例如可列舉:聚對苯二甲酸乙二 酯膜、聚乙稀醇膜、聚氣乙烯膜、氣乙烯共聚物膜、聚偏 氯乙烯膜、偏氣乙烯共聚物膜、聚甲基丙烯酸甲酯共聚物 膜'聚苯乙烯膜、聚丙稀腈膜、苯乙烤共聚物膜、聚酿胺 膜 '纖維㈣生物膜等。該等薄膜亦可視需要使用經延伸 者,較佳為霧度5以了者。薄冑之厚度越薄於圖像形成性 及經濟性之方面越有利,但為了維持強度,可較佳地使用 10 μιη〜30 μιη者。 感光性樹脂積層體中所使用之保護層之重要特性係就與 感光性樹脂層之密接力而言,保護層充分小於支撐膜因 此可容易地剝離。例如聚乙稀膜、聚㈣膜等可較佳地用 作保護層。又’亦可使用日本專利特開昭59·搬Μ?號公 報中所揭示之剝離性優異之薄膜。保護層之膜厚較佳為1〇 μ 1〇〇 μιη ’更佳為1〇 μιη〜5〇叫。感光性樹脂積層體中 感光11树月曰層之厚度雖根據用途而不同,但較佳為$ μ 1〇〇 μιη ’更佳為7 μιη〜6〇㈣,越薄越提昇解像度, 又,越厚越提昇膜強度。進而,於無需較高之凹陷性之敍 160046.doc-26· 201232173 The total content of the whole class and the slow-base benzotriazoles is preferably 〇.〇丨quality. More preferably, it is 5 mass% to 1 mass%. In view of the storage stability of the photosensitive resin composition, the content is preferably 3% by mass or more from the viewpoint of maintaining sensitivity and suppressing discoloration of the dye. . <Plasticizer> The photosensitive resin composition may optionally contain a plasticizer. Examples of such a plasticizer include phthalic acid esters such as diethyl phthalate, o-f-benzenesulfonamide, p-toluenesulfonamide, tributyl citrate, and citric acid diethylbenzene. Stuffed, triethyl citrate triacetate, triterpene citrate tri-n-propyl ester, acetaminophen citrate tri-positive, polyethylene glycol, polypropylene glycol, polyethylene glycol terephthalyl ether, polypropylene glycol Alkyl ether and the like. When the total solid content of the photosensitive resin composition is J 〇〇% by mass, the content of the plasticizer in the photosensitive resin composition is preferably from 质 5% to 50% by mass. /◦, better for 丨~ child quality. The content is preferably 1% by mass or more from the viewpoint of imparting flexibility to the cured film, and is preferably 50% by mass or less from the viewpoint of suppressing insufficient hardening or cold flow from the viewpoint of imparting flexibility to the cured film. <Solvent> The solvent for dissolving the photosensitive resin composition may, for example, be a ketone represented by MEK 'methyl ethyl ketone, and represented by decyl alcohol, ethanol or isopropanol. Alcohols, etc. The solvent is preferably added to the photosensitive resin composition 16046.doc -27 so that the viscosity of the solution of the photosensitive resin composition coated on the support film becomes 500 mPa·s to 4000 mPa·s at 25 Å. - 201232173. <Photosensitive Resin Laminate> In the present embodiment, the photosensitive resin laminate includes a photosensitive resin layer containing a photosensitive resin composition and a support film. Further, it is preferable to laminate the photosensitive resin layer on the support film as needed, or to provide a protective layer on the surface opposite to the support film side of the photosensitive resin layer. As the branch film, a transparent person that transmits light emitted from the exposure light source is preferable. Examples of such a wrap film include a polyethylene terephthalate film, a polyethylene glycol film, a polystyrene film, a gas ethylene copolymer film, a polyvinylidene chloride film, and a gas-off ethylene copolymer film. , polymethyl methacrylate copolymer film 'polystyrene film, polyacrylonitrile film, styrene-bake copolymer film, poly-branched film 'fiber (four) biofilm, and the like. These films may also be used as an extension, preferably haze 5, as desired. The thinner the thickness of the thin enamel, the more advantageous it is in terms of image formation and economy, but in order to maintain the strength, it is preferable to use 10 μm to 30 μm. An important characteristic of the protective layer used in the photosensitive resin laminate is that the protective layer is sufficiently smaller than the support film to be easily peeled off from the contact with the photosensitive resin layer. For example, a polyethylene film, a poly(tetra) film or the like can be preferably used as the protective layer. Further, it is also possible to use a film excellent in peeling property disclosed in Japanese Laid-Open Patent Publication No. 59-59. The film thickness of the protective layer is preferably 1 〇 μ 1 〇〇 μιη ‘ more preferably 1 〇 μιη 〜 5 〇. The thickness of the photosensitive 11-tree layer in the photosensitive resin laminate is different depending on the application, but it is preferably $μ1〇〇μιη', more preferably 7 μm to 6〇 (four), and the thinner the resolution is, the more The thicker the film strength. Furthermore, without the need for higher depressions, 160046.doc

•28· 201232173 刻用途方面,感光性樹脂積層體中之感光性樹脂層之厚度 較佳為10 μιη〜20 μιη。就对姓刻性之觀點而言,為1 〇 以 上,就解像性之觀點而言,為20 μηι以下。 &lt;感光性樹脂積層體之製作方法&gt; 作為依序積層支撐膜、感光性樹脂層、及視需要之保護 層而製作感光性樹脂積層體之方法,可採用已知之方法。 例如,可將感光性樹脂層所使用之感光性樹脂組合物與溶 解該等之溶劑混合而製成均勻之溶液,首先,使用棒式塗 佈機或輥式塗佈機將該溶液塗佈於支撐膜上,繼而進行乾 燥而將包含感光性樹脂組合物之感光性樹脂層積層於支樓 膜上。繼而視需要將保護層積層於感光性樹脂層上,藉此 可製作感光性樹脂積層體。 &lt;具有抗蝕劑圖案之基板之製造方法&gt; 以下’對使用感光性樹脂積層體製造形成有抗触劑圖案 之基板的方法之一例進行說明。視需要對如此製造之基板 進行蝕刻或電鍍,藉此可製造電路基板或印刷電路板。 使用感光性樹脂積層體製造形成有抗蝕劑圖案之基板、 以及使用該基板之電路基板或印刷電路板之方法包括如下 步驟。再者’步驟(4)及(4’)可使用該等中之任一者或該等 之兩者。 (1)積層步驟 一面剝離感光性樹脂積層體之保護層,一面使用加熱報 貼合機,使感光性樹脂積層體密接於銅箔積層板、可撓性 基板等基板上之步驟。 160046.doc -29- 201232173 (2) 曝光步驟 使具有所需之配線圖案之掩模膜密接於支撐體(例如支 撐膜等)上並使用活性光源實施曝光,或藉由直接描繪而 對所需之配線圖案實施曝光之步驟。 (3) 顯影步驟 於曝光後’將感光性樹脂層上之支撐體剝離,繼而使用 絵:水 &gt;谷液之顯影液對未曝光部分進行顯影去除而於基板上 形成抗姓劑圖案之步驟。 作為驗水溶液,例如可使用Na2c〇3或k2C03之水溶液。 驗水溶液可根據感光性樹脂層之特性而適當選擇,通常為 約0.2質量%〜2質量%之濃度、約2〇°c〜4〇°C之Na2C03水溶 液。 可經由上述各步驟而獲得抗蝕劑圖案,亦可視情形進而 進行約100°C〜300°c下之加熱步驟。藉由實施該加熱步 驟’可進一步提昇耐化學品性。加熱可使用熱風、紅外 線、遠紅外線之方式之加熱爐。 (4) 蝕刻步驟 自所形成之抗蝕劑圖案上喷附蝕刻液而對未經抗蝕劑圖 案覆蓋之銅面進行蝕刻之步驟》 姓刻步驟可利用適合於酸性蝕刻、驗性钱刻等所使用之 感光性樹脂積層體之方法而進行。 (4·)電鍍步驟 使用鍍銅、鍍錫鉛等’於形成有抗蝕劑圖案之基板上進 行電鍍之步驟。 160046.doc 30· 201232173 作為電鍍處理之方法’可列舉以基板作為電極進行電鑛 之方法等。 (5)剝離 其後,利用具有較顯影液強之驗性之水溶液自基板上剝 . 離抗蝕劑圖案。對於剝離用鹼水溶液,亦無特別限制,通 $使用濃度約2質量%〜5質罝%、溫度約4〇。〇〜7〇。〇之 NaOH、KOH等之水溶液。亦可於剝離液中添加少量之水 溶性溶劑。 如上所述’本實施形態係關於:可利用鹼性水溶液進行 顯影之感光性樹脂組合物、將該感光性樹脂組合物積層於 支揮體上之感光性樹脂積層體、使用該感光性樹脂積層體 於基板上形成抗蝕劑圖案之方法、及該抗蝕劑圖案之用途 等。該等感光性樹脂組合物等可提供適合於印刷電路板之 製k、可挽性印刷電路板之製造、IC(integrated circuit, 積體電路)晶片搭載用導線架(以下,稱作導線架)之製造、 金屬掩模製造等金屬箔精密加工、BGA(Ball Grid Array, 球狀矩陣排列)或CSP(Chip Scale Package,晶片尺寸封裝) 專半導體封裝製造、.以TAB(Tape Automated Bonding,捲 . 帶式自動接合)或C〇F(Chip On Film(薄膜覆晶):將半導體 , IC搭載於薄膜狀之微細電路板上者)為代表之捲帶基板之 製造、半導體凸塊之製造 '平板顯示器領域中之IT〇 (Indium Tin Oxides,氧化銦錫)電極、定址電極、電磁波 遮罩等構件之製造的抗蝕劑圖案,因此較佳。 [實施例] 160046.doc •31 - 201232173 以下,藉由實施例1〜14以及比較例1及2更具體地進行說 明。 首先,對實施例及比較例之評價用樣品之製作方法進行 說明,繼而,表示關於所獲得之樣品之評價方法及其評價 結果。 (1)評價用樣品之製作方法 實施例及比較例中之評價用樣品係以如下所述之方式製 作。 &lt;感光性樹脂積層體之製作&gt; 將下述表1所示之組成(其中,各成分之數字表示作為固 形物成分之調配量(質量份))之感光性樹脂組合物及溶劑充 刀地攪拌、混合而製成感光性樹脂組合物調配液,使用棒 式塗佈機將調配液均勻地塗佈於作為支撐體之l6 pm厚之 聚對本一甲酸乙一酯膜(Mitsubishi p〇丨yes Him股份有限 公司製造’ R130-16)之表面上,並於95〇c之乾燥機中乾燥 1.5刀鐘而形成感光性樹脂組成層。感光性樹脂組成層之 厚度為15 μηι。 繼而,於感光性樹脂組成層之未積層聚對苯二曱酸乙二 酯膜之表面上貼合作為保護層之19 μπχ厚之聚乙烯膜 (Tamap〇ly股份有限公司製造,GF_8丨8)而獲得感光性樹脂 積層體。於下述表2中,表示表^以簡稱表示之感光性樹 脂組合物調配液十的材料成分之名稱。 〈基板整面&gt; 作為顯影性、耐蝕刻性之評價基板,使用積層有35 i60046.docIn the case of the use of the photosensitive resin layer, the thickness of the photosensitive resin layer in the photosensitive resin laminate is preferably 10 μm to 20 μm. In terms of the surname, it is more than 1 〇, and in terms of resolution, it is 20 μηι or less. &lt;Production Method of Photosensitive Resin Laminate&gt; A method of producing a photosensitive resin laminate by sequentially laminating a support film, a photosensitive resin layer, and optionally a protective layer can be carried out by a known method. For example, a photosensitive resin composition used for a photosensitive resin layer can be mixed with a solvent which dissolves them to form a uniform solution. First, the solution is applied to the solution using a bar coater or a roll coater. The support film is then dried to laminate a photosensitive resin containing the photosensitive resin composition on the support film. Then, if necessary, a protective layer is laminated on the photosensitive resin layer, whereby a photosensitive resin laminate can be produced. &lt;Manufacturing Method of Substrate Having Resist Pattern&gt; Hereinafter, an example of a method of manufacturing a substrate on which an anti-contact agent pattern is formed using a photosensitive resin laminate will be described. The substrate thus fabricated is etched or plated as needed, whereby a circuit substrate or a printed circuit board can be manufactured. The method of manufacturing a substrate on which a resist pattern is formed using a photosensitive resin laminate, and a circuit substrate or a printed circuit board using the substrate include the following steps. Further, either of the steps (4) and (4') may use either or both of these. (1) Laminating step The protective layer of the photosensitive resin laminate is peeled off, and the photosensitive resin laminate is adhered to a substrate such as a copper foil laminate or a flexible substrate by using a heat spreader. 160046.doc -29- 201232173 (2) The exposure step allows the mask film having the desired wiring pattern to be adhered to the support (for example, a support film or the like) and exposed using an active light source, or by direct drawing. The wiring pattern performs the step of exposure. (3) Developing step After the exposure, the step of peeling off the support on the photosensitive resin layer, and then developing the unexposed portion by using a developing solution of 絵:water&gt; gluten solution to form an anti-surname pattern on the substrate . As the aqueous solution, for example, an aqueous solution of Na2c〇3 or k2C03 can be used. The aqueous solution can be appropriately selected depending on the characteristics of the photosensitive resin layer, and is usually a Na2CO3 aqueous solution having a concentration of about 0.2% by mass to 2% by mass and about 2 〇 ° c to 4 °C. The resist pattern can be obtained through the above steps, and a heating step at about 100 ° C to 300 ° C can be carried out as the case may be. The chemical resistance can be further improved by carrying out the heating step. A heating furnace that uses hot air, infrared rays, or far infrared rays can be used for heating. (4) etching step: spraying the etching solution from the formed resist pattern to etch the copper surface not covered by the resist pattern. The surname step can be applied to acid etching, inspecting, etc. This is carried out by the method of using the photosensitive resin laminated body. (4.) Electroplating step A step of plating on a substrate on which a resist pattern is formed is performed using copper plating, tin-plated lead or the like. 160046.doc 30·201232173 A method of electroplating using a substrate as an electrode, and the like. (5) After peeling off, the resist pattern is peeled off from the substrate by using an aqueous solution having a stronger proof than the developer. The alkali aqueous solution for peeling is also not particularly limited, and the use concentration is about 2% by mass to 5% by mass, and the temperature is about 4 Torr. 〇~7〇. An aqueous solution of NaOH, KOH or the like. A small amount of a water-soluble solvent may also be added to the stripping solution. As described above, the present embodiment relates to a photosensitive resin composition which can be developed by using an aqueous alkaline solution, a photosensitive resin laminate which laminates the photosensitive resin composition on a support, and a laminate of the photosensitive resin. A method of forming a resist pattern on a substrate, a use of the resist pattern, and the like. These photosensitive resin compositions and the like can provide a printed circuit board, a lead-like printed circuit board, and an IC (integrated circuit) wafer mounting lead frame (hereinafter referred to as a lead frame). Manufacturing, metal mask manufacturing and other metal foil precision processing, BGA (Ball Grid Array), CSP (Chip Scale Package), semiconductor package manufacturing, TAB (Tape Automated Bonding, volume. Manufacture of semiconductor tape bumps, including the manufacture of semiconductor tapes, and the manufacture of semiconductor bumps, which are represented by "Chip On Film" (Chip On Film: a semiconductor wafer, IC mounted on a thin film-like circuit board) A resist pattern produced by a member such as an IT (Indium Tin Oxides) electrode, an address electrode, or an electromagnetic wave mask in the field of display is preferable. [Examples] 160046.doc • 31 - 201232173 Hereinafter, the examples 1 to 14 and the comparative examples 1 and 2 will be more specifically described. First, the method for producing the sample for evaluation of the examples and the comparative examples will be described, and then the evaluation method for the obtained sample and the evaluation result thereof will be described. (1) Method for producing sample for evaluation The samples for evaluation in the examples and comparative examples were produced as follows. &lt;Production of Photosensitive Resin Laminate&gt; A photosensitive resin composition and a solvent filling agent having the composition shown in the following Table 1 (wherein the number of each component indicates the amount (parts by mass) of the solid content component) The mixture was stirred and mixed to prepare a photosensitive resin composition preparation solution, and the preparation liquid was uniformly applied to a l6 pm thick poly-p-ethyl methacrylate film (Mitsubishi p〇丨yes) as a support by a bar coater. Him Co., Ltd. manufactures the surface of 'R130-16) and drys it in a 95 〇c dryer for 1.5 knives to form a photosensitive resin composition layer. The photosensitive resin layer has a thickness of 15 μm. Then, a 19 μπ thick polyethylene film which is a protective layer on the surface of the unstacked polyethylene terephthalate film of the photosensitive resin composition layer (manufactured by Tamap〇ly Co., Ltd., GF_8丨8) A photosensitive resin laminate was obtained. In the following Table 2, the names of the material components of the photosensitive resin composition preparation liquid indicated by the abbreviation are shown. <Overall surface of the substrate> As an evaluation substrate for developability and etching resistance, a laminate of 35 i60046.doc is used.

&quot;S -32- 201232173 壓延銅箔之1.6 mm厚之銅箔積層板。對基板表面進行濕式 拋光輥研磨(3M股份有限公司製造,Sc〇tch_Bdte(註冊商 標)HD#600,通過2次)。 &lt;積層&gt; 一面剝離感光性樹脂積層體之聚乙烯膜,一面利用加熱 輥貼合機(旭化成股份有限公司製造,AL_7〇〇)於輥溫度 105°C下積層於進行制面而預熱至60〇c之銅箔積層板上。 將氣壓設為0.35 MPa ’將積層速度設為2.0 m/min » &lt;曝光&gt; 將感光性樹脂組成層之評價所需之掩模膜置於作為支撐 體之聚對苯二甲酸乙二酯膜上,對於實施例卜6、實施例 9〜14、以及比較例,利用超高壓水銀燈(〇^製作所股 份有限公司製造’ HMW-801)以70 mJ/cm2之曝光量進行曝 光°對於實施例7及8,利用直接繪圖式曝光裝置(Hitachi&quot;S -32- 201232173 1.6 mm thick copper foil laminate with rolled copper foil. The surface of the substrate was subjected to wet polishing roll polishing (manufactured by 3M Co., Ltd., Sc〇tch_Bdte (registered trademark) HD #600, passed twice). &lt;Laminating&gt; The polyethylene film of the photosensitive resin laminate was peeled off, and the laminate was heated at a roll temperature of 105 ° C by a heating roll laminator (AL_7〇〇 manufactured by Asahi Kasei Co., Ltd.) to preheat the surface. To 60 〇c copper foil laminate. The air pressure was set to 0.35 MPa 'The lamination speed was set to 2.0 m/min » &lt;Exposure&gt; The mask film required for the evaluation of the photosensitive resin constituent layer was placed on the polyethylene terephthalate as a support. On the film, for Example 6, Example 9 to 14, and a comparative example, exposure was performed at an exposure amount of 70 mJ/cm 2 using an ultrahigh pressure mercury lamp (manufactured by 〇^ Manufacture Co., Ltd. 'HMW-801). 7 and 8, using a direct drawing exposure device (Hitachi

Via Mechanics股份有限公司製造,DI曝光機dejdh,光 源:GaN藍紫光二極體’主波長4〇5±5 nm)以15 mJ/cm2之 曝光量進行曝光。 於硬化膜柔軟性之評價樣品中,將評價所需之掩模膜置 於作為如上所述般製作之感光性樹脂積層體之支撐體的聚 對苯二曱酸乙二酯膜上,對於實施例1〜6、實施例9〜14、 以及比較例1及2 ’利用超高壓水銀燈(〇rc製作所股份有限 公司製造,HMW-801)以70 mJ/cm2之曝光量進行曝光。對 於實施例7及8,利用直接繪圖式曝光裝置(Hitachi Via Mechanics股份有限公司製造,di曝光機DE-1DH,光源: 160046.doc •33- 201232173Manufactured by Via Mechanics, Inc., DI exposure machine dejdh, light source: GaN blue-violet diode 'main wavelength 4 〇 5 ± 5 nm) was exposed at an exposure of 15 mJ/cm 2 . In the evaluation sample of the softness of the cured film, the mask film required for the evaluation was placed on a polyethylene terephthalate film as a support of the photosensitive resin laminate produced as described above, and Examples 1 to 6, Examples 9 to 14, and Comparative Examples 1 and 2' were exposed by an exposure amount of 70 mJ/cm 2 using an ultrahigh pressure mercury lamp (manufactured by 〇rc Manufacturing Co., Ltd., HMW-801). For Examples 7 and 8, a direct drawing exposure apparatus (manufactured by Hitachi Via Mechanics Co., Ltd., di exposure machine DE-1DH, light source: 160046.doc • 33-201232173) was used.

GaN藍紫光二極體’主波長405土5 nm)以15 mj/cm2之曝光 量進行曝光。 &lt;顯影&gt; 對於顯影性及耐㈣性之評價基板,於義聚對苯二甲 酸乙二酯膜後,使用驗性顯影機(富士機工股份有限公司 製造,乾膜用顯影機)將川艽之丨質量%iNa2C〇3水溶液喷 射特定時間’從而溶解去除感光性樹脂層之未曝光部分。 此時,以最小顯影時間之2倍之時間進行顯影而製作硬化 抗姓劑圖案。再者,所謂最小顯影時間,係指為了如上所 v般溶解未曝光部分之感光性樹脂層而需要之最短時間。 f於硬化膜柔軟性之評價樣品,於剝離聚乙婦膜後,以 f小顯影時間之2倍之時間並於相同條件下進行顯影而獲 得硬化抗钱劑。 &lt;蝕刻&gt; 藉由顯影而於形成有抗蝕劑圖案之評價基板上使用鋼鹽 蝕刻裝置(東京化工機股份有限公司製造,銅鹽蝕刻裝幻 將氣化亞銅濃度250 g/L、鹽酸濃度3 m〇1/Li5〇t之氣化 亞銅㈣液喷射特㈣間’從而將未藉由㈣積層板上之 抗敍劑圖案被覆之部分的銅箔溶解去除。 &lt;剝離&gt; 對蝕刻後之評價基板喷射加溫至5〇〇c之3質量%之氫氧 化納水溶液而將硬化之抗钱劑剝離。 (2)樣品之評價方法 繼而’對樣品之評價方法進行說明。 160046.doc -34· 201232173 ⑴顯影性 根據上述(1)評價用樣品 行積層、顯影而獲得抗姓…方法而製作基板’並進 下所述般進行分。基於最小《時間,如 A:最小顯影時間為14秒鐘以上 b:最小顯影時間為1〇秒鐘以上且未達14秒鐘 C:最小顯影時間未達1〇秒鐘 (ii) 耐蝕刻性 根據上述⑴汗價用樣品之製作方法,使 =_性評價用基板通過曝光部分與未曝光= 寬度為1 · 1之比率的绩阁安认The GaN blue-violet diode 'main wavelength 405 Å 5 nm) was exposed at an exposure of 15 mj/cm 2 . &lt;Development&gt; The substrate for the evaluation of the developability and the resistance (four) was used in an experimental polymerizer (manufactured by Fuji Machine Co., Ltd., a dry film developing machine) after the polyethylene terephthalate film. The % mass %iNa2C〇3 aqueous solution is sprayed for a specific time' to dissolve and remove the unexposed portion of the photosensitive resin layer. At this time, development was carried out at twice the minimum development time to prepare a hardened anti-surname pattern. In addition, the minimum development time means the shortest time required to dissolve the photosensitive resin layer of the unexposed portion as described above. In the evaluation sample of the softness of the cured film, after the polyethylene film was peeled off, development was carried out under the same conditions twice under the condition of f small development time to obtain a hardening anti-money agent. &lt;Etching&gt; A steel salt etching apparatus (manufactured by Tokyo Chemical Machinery Co., Ltd., copper salt etching device) was used to develop a vaporized cuprous copper concentration of 250 g/L on the evaluation substrate on which the resist pattern was formed by development. The vaporized cuprous (4) liquid of the hydrochloric acid concentration of 3 m〇1/Li5〇t is sprayed between the four (four) to dissolve and remove the copper foil which is not covered by the anti-narrant pattern on the (4) laminate. &lt;Peeling&gt; After the etching, the substrate was sprayed with a 3% by mass aqueous solution of sodium hydroxide heated to 5 〇〇c to peel off the hardened anti-money agent. (2) Evaluation method of the sample Next, the evaluation method of the sample will be described. Doc -34·201232173 (1) Developability According to the above (1) Evaluation sample layering and development to obtain an anti-surname method, a substrate is produced and divided as described above. Based on the minimum "time, such as A: minimum development time 14 seconds or more b: minimum development time is 1 〇 second or more and less than 14 seconds C: minimum development time is less than 1 〇 second (ii) etch resistance According to the above (1) method for producing a sample for sweat price, Passing the substrate for the _ evaluation of the substrate through the exposed portion Exposure width ratio of 1 = 1 · Court Ann recognize Result

手的線圖案掩模而進行曝光H 小顯影時間之2倍之時間推分細办 予間進仃㈣,將藉由_而去除銅 f白所需之時間作為最小蝕刻時… J JL以最小钱刻時間 K4倍之時間進行❹卜利用氫氧化鈉水溶液將硬化抗姓 劑剝離,並湘光學顯微鏡觀察導體圖案,基 果’如下所述般進行分級:The line pattern mask of the hand is used to perform the exposure H twice the development time twice, and the time required to remove the copper f white is taken as the minimum etching time... J JL is the smallest The time of the engraving time is K4 times. The hardening anti-surname agent is peeled off with an aqueous solution of sodium hydroxide, and the conductor pattern is observed by an optical microscope. The basis is classified as follows:

B C Α:直線性地形成導體圖案’未觀察到蝕刻液之滲入 直線性地形成導體圖案,觀察龍刻液之渗入 未直線性地形成導體圖案,觀察到凹凸 (iii) 硬化膜之柔軟性 使根據上述⑴評價用樣品之製作方法而製作之感光性 樹脂積層體通過5 mmx4() mm的長方 進而,以最小顯影時間之2倍之時間進行顯影而=化 抗银劑。利用拉伸試驗機(0rientec股份有限公司製造, 160046.doc •35- 201232173 RTM-500),以100 mm/min之速度拉伸所製作之5 mmx4〇 mm的硬化抗蝕劑,基於此時之硬化抗蝕劑之伸長率,如 下所述般進行分級: A+ :硬化抗蝕劑之伸長率為45 mm以上 A :硬化抗蝕劑之伸長率為4〇 mm以上且未達45 mm B :硬化抗蝕劑之伸長率為15 mm以上且未達4〇 mm C :硬化抗蝕劑之伸長率未達丨5 mm (iv) 凝聚性 使感光性樹脂積層體中之厚度15 μηι、面積2〇 m2之感 光層溶解於200 ml之1質量%iNa2C〇3水溶液中,並使用 循環式噴射裝置,於0.1 MPa之喷壓下喷射3小時。其後’ 將顯影液靜置1日並觀察凝聚物之產生。若大量地產生凝 聚物,則於喷射裝置之底面及側面上觀察到粉狀者或油狀 者。顯影液凝聚性良好之組成完全不產生該等凝聚物❶基 於凝聚物之產生狀態,如下所述般對凝聚性進行分級: A:完全不產生凝聚物 B:於喷射裝置之底部或者側面之一部分上觀察到凝聚 物 C .於整個喷射裝置整體上觀察到凝聚物 (v) 驗可溶性高分子之酸當量 所謂酸當t,係指其中具有!當量之絲之驗可溶性高 分子之質h酸當量之測定係使用平沼產業股份有限公司 製造之平沼自動滴定裝置(COM_555),利用〇」m〇l/L之氫 氧化鈉並藉由電位差滴定法而進行。 160046.docBC Α: a conductor pattern was formed linearly. A conductor pattern was formed in a straight line without observing the penetration of the etching liquid, and the conductor pattern was not formed linearly by observing the penetration of the dragon etch liquid, and the flexibility of the cured film was observed. The photosensitive resin laminate produced by the above-described (1) method for producing a sample was developed by a length of 5 mm x 4 () mm and developed at a time twice the minimum development time to form an anti-silver agent. The 5 mm x 4 mm hardened resist was stretched at a speed of 100 mm/min using a tensile tester (manufactured by 0rientec Co., Ltd., 160046.doc • 35-201232173 RTM-500), based on the time The elongation of the hardened resist is classified as follows: A+: The elongation of the hardened resist is 45 mm or more A: The elongation of the hardened resist is 4 mm or more and less than 45 mm B: Hardening The elongation of the resist is 15 mm or more and less than 4 mm. C: The elongation of the hardened resist is less than 5 mm (iv) The cohesiveness makes the thickness of the photosensitive resin laminate 15 μηι, area 2〇 The photosensitive layer of m2 was dissolved in 200 ml of a 1 mass% iNa2C〇3 aqueous solution, and sprayed at a spray pressure of 0.1 MPa for 3 hours using a circulating spray apparatus. Thereafter, the developer was allowed to stand for 1 day and the generation of aggregates was observed. If a large amount of the aggregate is produced, a powdery or oily person is observed on the bottom surface and the side surface of the spraying device. The composition in which the developer has good cohesiveness does not generate such agglomerates ❶ based on the state of formation of the agglomerates, and the cohesiveness is classified as follows: A: Coagulum B is not generated at all: one part of the bottom or side of the spraying device Condensate C was observed on the whole. The aggregate was observed on the whole spray device. (v) The acid equivalent of the soluble polymer was determined as the acid when t, which means that it has! Equivalent silk test The determination of the mass of the soluble polymer h acid equivalent is based on the Pingyu automatic titrator (COM_555) manufactured by Hiranuma Industry Co., Ltd., using 氢氧化钠"m〇l/L sodium hydroxide and by potentiometric titration And proceed. 160046.doc

S •36· 201232173 (Vi)重量平均分子量 重量平均分子量可利用日本分光股份有限公司製造之凝 膠透析層析儀(GPC,Gel Permeation Chromatography) (栗:Gulliver,PU-1580型,管柱:昭和電工股份有限公 司製造之 Shodex(註冊商標)(1&lt;^-807、〖?-806]^、1^-806M、KF-802.5)4支串聯,移動層溶劑:四氫呋喃、使用 藉由聚苯乙烯標準樣品(昭和電工股份有限公司製造之 Shodex STANDARD SM-105)所獲得之校正曲線),以聚苯 乙烯換算而求出。 (3)評價結果 將實施例及比較例之評價結果示於表1中 160046.doc 37- 201232173 £寸 l 01 (Nr〇g»nr^ ο O H o o 1.0 so V —^Ί u u 0'-88 oe οι 01 01 01 01 -·0 寸 ·0 so so.o so υ ffl m a S'-16 寸一 - -Ό 对 SOO 2 so.o so a v v 1-1.1-' 0对 - - -Ό 寸 ·0 so so.o so ffl v a ffl 99T6 SO 寸 - - οι οι 01 -Ό 寸 ·0 soS • 36· 201232173 (Vi) Weight average molecular weight Weight average molecular weight can be obtained by GPC, Gel Permeation Chromatography (GPC, Gulliver, PU-1580, column: Showa Shodex (registered trademark) (1 &lt;^-807, 〖?-806]^, 1^-806M, KF-802.5) manufactured by Electric Co., Ltd., in series, moving layer solvent: tetrahydrofuran, using polystyrene A standard sample (a calibration curve obtained by Shodex STANDARD SM-105 manufactured by Showa Denko Co., Ltd.) was obtained in terms of polystyrene. (3) Evaluation results The evaluation results of the examples and comparative examples are shown in Table 1 160046.doc 37-201232173 £inch l 01 (Nr〇g»nr^ ο OH oo 1.0 so V —^Ί uu 0'-88 Oe οι 01 01 01 01 -·0 inch ·0 so so.o so υ ffl ma S'-16 inch one - -Ό For SOO 2 so.o so avv 1-1.1-' 0 pairs - - - Ό inch · 0 so so.o so ffl va ffl 99T6 SO inch - - οι οι 01 -Ό inch·0 so

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·0 SO·0 SO

寸| SO ffl y a a ς·'ι6— d. d dl eLd. d. 22222222222222Inch | SO ffl y a a ς·'ι6— d. d dl eLd. d. 22222222222222

P^ r**» ^ »r&gt; νΛ NN NM NM wlwl ^1'5'1*1^1 1¾ i-v 9-V 'V 3 'V 'V I.v 160046.doc •38· s 201232173[表2] 符號 成分 P,! 具有苯乙稀/甲基丙烯酸甲酯/甲基丙烯酸(重量比為25/50/25)之組成, 酸當量為344,且重量平均分子詈為5¼之共聚物的35%(固形物成分)之MEK溶液 p_2 具有甲基丙烯酸/苯乙稀/甲基丙烯酸正丁酯/(重量比為30/20/50)之組成, 酸當量為287,且重量平均分子量為6萬之共聚物的47%(固形物成分)之MEK溶液 p_3 具有甲基丙烯酸/甲基丙烯酸甲醋/笨乙烯(重量比為29/19/52)之組成, j曼當量為297 ’且重量平均分子量為5萬^共聚物的38%(固形物成分)之MEK溶液 P-4 具有曱基丙烯酸甲酷/甲基丙烯酸/丙烯酸正丁酯(重量比為67/23/10)之組成, 酸當量為344,且重量平均分子量為20萬4L共聚物的30%(固形物成分)之MEK溶液 p_5 具有甲基丙烯酸/甲基丙烯酸苄基酯(重量比為20/80)之組成, 酸當量為430,且重量平均分子量為5萬5千之共聚物的42%(固形物成分)之MEK溶液 具有曱基丙烯酸/丙烯酸-2-乙基己酯/甲基丙烯酸苄基酯(重量比為25/10/65)之組成, 蓋當量為350,且重量平均分子量為5萬5千之共聚物的41%(固形物成分)之MEK溶液 具有甲基丙烯酸/曱基丙烯酸苄基酯(重量比為20/80)之組成, 酸當量為430,且重量平均分子量為7萬5千之共聚物的50%(固形物成分)之MEK溶液 九丁二醇二丙嫌酸酯 M-2於&amp;紛A之兩端㈣加成有平均各5莫耳之氧化6刺聚基丙稀酸醋~~ (新中村化學股份有限公司製造之BPE-i〇f,▲品名)_ M-3 $雙盼A之兩端分別加成有平均各6莫耳之氧化乙稀與2莫耳之氧化丙稀的 &quot; 聚烷基薛之二甲基丙烯酸酯 P-6 P-7 M-1 M-4藉由六亞甲基二異氰酸酯與五丙二醇單甲基丙烯酸曱酯之反應而獲得 _之二甲基丙烯酸胺基甲酸酯 M-5 | 4-壬基笨基七乙二醇二丙二薛而榇酩陆 _Με-己内酯改性之三-(2-丙烯醯氣基乙某)羼齓屁醅庙 $異戊四醇之4個末端分別加成有平均1莫耳之氧化乙烯的四丙烯酸酯 (Sartomer Japan股份有限公司製造,SR-494、 M-6 M-7 1-8 _於異戊四醇之4個末端加成有平均1莫耳之氩化乙烯的四丙烯酸酯 M-9於午成有平均12莫耳之氧化丙烯之聚丙二醇上,進而於兩端分別 --如成平均各3莫耳之氧化乙烯的聚院二酵之二甲某丙嫌醢酿 M-10四丁二醇二丙烯酸酯 &quot; - M-11 十三丁二醇二丙烯酸酯 m·13 sir乙y的從㈣平其均恐氧化丙稀與平均15莫耳 M-14 2聚Ϋ比60/40將雙粉A型環氧丙烯酸酯與使三羥曱基丙烷丙烯酸酯 化而成之三丙媾醢酯混合者 1-1 1-2P^ r**» ^ »r&gt; νΛ NN NM NM wlwl ^1'5'1*1^1 13⁄4 iv 9-V 'V 3 'V 'V Iv 160046.doc •38· s 201232173[Table 2] The symbol component P, has a composition of styrene/methyl methacrylate/methacrylic acid (25/50/25 by weight), an acid equivalent of 344, and 35% of a copolymer having a weight average molecular weight of 51⁄4. The MEK solution p_2 (solid content) has a composition of methacrylic acid/styrene/n-butyl methacrylate/(30/20/50 by weight), an acid equivalent of 287, and a weight average molecular weight of 60,000. 47% (solids component) of the copolymer MEK solution p_3 has a composition of methacrylic acid / methyl methacrylate / stupid ethylene (weight ratio of 29/19 / 52), j man equivalent of 297 ' and weight average MEK solution P-4 having a molecular weight of 50,000 ^ copolymer of 38% (solid content) has a composition of mercapto methacrylate / methacrylic acid / n-butyl acrylate (weight ratio of 67 / 23/10), acid The MEK solution p_5 having an equivalent weight of 344 and a weight average molecular weight of 30% (solid content) of 200,000 liters of copolymer has a composition of methacrylic acid/benzyl methacrylate (weight ratio of 20/80), acid equivalent Is 430, and The MEK solution of 42% (solid content) of a copolymer having a weight average molecular weight of 55,000 has a mercaptoacrylic acid/2-ethylhexyl acrylate/benzyl methacrylate (weight ratio 25/10/) 65) The composition of the MEK solution having a cap equivalent of 350 and a copolymer of 41% (solid content) having a weight average molecular weight of 55,000 is methacrylic acid/benzyl methacrylate (weight ratio 20/) 80) The composition, the acid equivalent weight is 430, and the weight average molecular weight is 70% of the copolymer of 50% (solid content) of the MEK solution, 9-butanediol dipropionate M-2, & The two ends (four) are added with an average of 5 moles of oxidized 6 punctured polyacrylic acid vinegar ~~ (BPE-i〇f, ▲ product name made by Xinzhongcun Chemical Co., Ltd.)_ M-3 $双盼A The two ends are respectively added with an average of 6 moles of ethylene oxide and 2 moles of propylene oxide. Polyalkyl Xuezhi dimethacrylate P-6 P-7 M-1 M-4 From the reaction of hexamethylene diisocyanate with pentapropylene glycol monomethyl methacrylate to obtain dimethyl methacrylate amide M-5 | 4-mercaptosyl heptaethylene glycol dipropylene disulfide榇酩陆_Με-内内Ester-modified tris-(2-propene oxime-based) 羼齓 醅 醅 $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ $ Manufactured by the company, SR-494, M-6 M-7 1-8 _ tetraacrylate at the 4th end of isopentaerythritol with an average of 1 mole of argon ethylene has an average of 12 in the afternoon. Mohr's propylene oxide on polypropylene glycol, and then at both ends - such as an average of 3 moles of ethylene oxide of the polyphenols of the dimethicone, bred M-10 tetrabutyl diol diacrylate &quot; - M-11 Thirteen butanediol diacrylate m·13 sir B y from (iv) flattened to fear oxidized propylene with an average of 15 m M-14 2 polypyrene ratio 60/40 double powder type A Mixture of epoxy acrylate and tripropyl decyl ester obtained by esterification of trishydroxypropyl propane 1-1 1-2

1-3 TT 1-5 D-1 D-21-3 TT 1-5 D-1 D-2

D-3 &quot;5T A-1 A-2 _2-(鄰氣笨基)-4,5-二笨基咪唑二聚體 4,4'-雙(二乙胺)二笨曱酮 9-笨基吖啶 N-笨基吖咬 2,4·二乙基硫雜茛酮 4-二甲基胺基苯甲酸乙酯 鑽石綠 隱色結晶紫 .溴甲基笨基颯D-3 &quot;5T A-1 A-2 _2-(o-gas base)-4,5-di-peptidyl imidazole dimer 4,4'-bis(diethylamine) dicodone 9-stupid Acridine N-stupyl bite 2,4·diethylthiazinone 4-dimethylaminobenzoic acid ethyl ester diamond green leuco crystal violet. Bromomethyl stupyl hydrazine

Aizen維多刹亞純藍 重量平均分子量為2000之聚丙二薛 ^雙酚A之兩側分別加成有平均2夏耳-- a-3 I 苯并三_分二-正丁基胺基甲基)- A-4加成有3莫耳之亞硝基笨基羥胺之鋁眵 --- A-5 52|=|^4域柳料之氧^細加餅均ifT A-6 | 對 y 笨磺“胺 ------- a-7 基_4-經基笨基]丙酸2莫耳與三乙二醇1莫耳 160046.doc -39· 201232173 [產業上之可利用性] 上述感光性樹脂組合物及積層體可較佳地用於印刷電路 板、可撓性印刷電路板、導線架之製造或金屬掩模製造等 金屬箔精密加工、.BGA或CSP等之半導體封裝製造、TAB 或COF等卷帶基板之製造、半導體凸塊之製造、ITO電極 或定址電極、電磁波遮罩等之製造。Aizen Vitra brakes pure blue weight average molecular weight of 2000 polyacrylic acid bisphenol A on both sides of the addition of an average of 2 Xiaer -- a-3 I benzotriazine _ di-n-butylamino group A Base) - A-4 addition has 3 moles of nitroso-hydroxylamine aluminum 眵--- A-5 52|=|^4 field squid oxygen ^ fine cakes ifT A-6 | y Stupid sulfonate "Amine ------- a-7 base _4- via phenyl group] propionic acid 2 molar and triethylene glycol 1 molar 16046.doc -39· 201232173 [Industrially available The photosensitive resin composition and the laminate are preferably used for precision processing of a metal foil such as a printed circuit board, a flexible printed circuit board, a lead frame, or a metal mask, and a semiconductor such as BGA or CSP. Manufacture of packaged substrates, tape substrates such as TAB or COF, manufacture of semiconductor bumps, fabrication of ITO electrodes or address electrodes, electromagnetic wave masks, etc.

160046.doc • 40· S160046.doc • 40· S

Claims (1)

201232173 七 、申請專利範圍: 一種感光性樹脂組合物,其係包含(A)鹼可溶性高分子、 (B)光聚合起始劑、及(C)具有乙稀性不飽和雙鍵之化合 物者,且該(B)光聚合起始劑為2,4,5·三芳基咪唑二聚體 或吖唆化合物,作為該(C)具有乙浠性不飽和雙鍵之化合 物而包含下述通式(I)所示之化合物: [化1] 〇 II CH2=C-C-〇-f A-O^B-O ^A.〇)^~^=CH2 (I) {式中,心及尺2分別獨立表示氫原子或甲基,A為或 C3H6 ’於·(Α_〇)ηι及 _(A_〇)n3•中,_c2H4 〇-及 _c3H6_〇_ 之重複單元之排列可為無規’亦可為嵌段,於該排列為 喪段之情形時,及·C3H6 〇中之任一者可為也 〇·基側’ B為碳數4〜8之2價烧基鍵,〜為㈠。之整數, 〜為〇〜H)之整數’ ηι+η3_〜1()之整數,並仏為卜2〇之 整數}。 2.如請求们之感光性樹脂組合物,其中作為上述⑹具有 乙稀性不飽和雙鍵之化合物’進而包含下述通式(Π)所 示之化合物: [化2] Rj Ο H2C=c—c_〇. • · · (I 160046.doc 201232173 {式中’ R3及R4分別獨立為氫原子或甲基,…及n7分別獨 立為0〜20之整數,n4+n?為〇〜40之整數,〜及…分別獨立 為1〜20之整數’ n5+n6為2~40之整數,並且_(c2H4-0)-及 _((:3比-〇)-之重複單元之排列可為無規,亦可為嵌段, 於該排列為嵌段之情形時,-(C2H4-〇)-及-(c3H6-0)-中之 任一者亦可為雙酚基側}。 3.如請求項2之感光性樹脂組合物,其中於上述通式(11) 令’ IU及η·;分別獨立為1〜20之整數,並且n4+n7為2〜4〇之 整數。 4·如請求項1至3中任一項之感光性樹脂組合物其中上述 (A)鹼可溶性高分子係選自包含苯乙烯及/或(曱基)丙烯 酸节基酯作為共聚物成分之驗可溶性高分子中。 5. 如請求項1至4中任一項之感光性樹脂組合物,其中於上 述通式(I)中’助為1〜10之整數,並且n1+n3為〇。 6. 如請求項丨至5中任一項之感光性樹脂組合物其中作為 上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含於分 子内具有至少一個胺基曱酸酯鍵之化合物。 7. 如請求項1至6中任一項之感光性樹脂組合物其中作為 上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含下述 通式(III)所示之化合物: [化3] r5 〇 、II I η—c一c=ch2 n9 H2C—C—C— 160046.doc 201232173 (式中’ R5ARA別獨立為氫原子或曱基,〜及〜分別獨 立為3〜40之整數,並且_((^4_〇)及_((^6_〇)之重複單 元之排列可為無規,亦可為嵌段)。 8.如凊求項1至7中任一項之感光性樹脂組合物,其中作為 上述(C)具有乙烯性不飽和雙鍵之化合物,進而包含下述 通式(IV)及/或(V)所示之化合物: [化4] R5 〇 H2C==C—C-O—(-C2H4-〇-)-(c3H6-〇)- n10 ^-C2H4-〇-j-C ni2201232173 VII. Patent application scope: A photosensitive resin composition comprising (A) an alkali-soluble polymer, (B) a photopolymerization initiator, and (C) a compound having a ethylenically unsaturated double bond, And the (B) photopolymerization initiator is a 2,4,5·triarylimidazole dimer or an anthracene compound, and the (C) compound having an ethylenically unsaturated double bond includes the following formula ( The compound shown in I): [Chemical 1] 〇II CH2=CC-〇-f AO^BO ^A.〇)^~^=CH2 (I) {wherein, the heart and the ruler 2 respectively represent hydrogen atoms or Methyl, A is or C3H6 'in · (Α_〇) ηι and _(A_〇) n3•, the arrangement of repeating units of _c2H4 〇- and _c3H6_〇_ can be random or embedded In the case where the arrangement is a mourning stage, and any one of the C3H6 〇 may be a 〇·base side 'B is a valence bond of carbon number 4 to 8, and the number is (1). The integer, ~ is an integer of 〇~H) ηι+η3_~1(), and is an integer of 〇2〇. 2. The photosensitive resin composition of the present invention, wherein the compound (6) having an ethylenically unsaturated double bond further comprises a compound represented by the following formula (Π): [Chemical 2] Rj Ο H2C=c —c_〇. • · · (I 160046.doc 201232173 {wherein R3 and R4 are each independently a hydrogen atom or a methyl group, ... and n7 are each independently an integer of 0 to 20, and n4+n? is 〇~40 The integers, ~ and ... are each independently an integer from 1 to 20' n5+n6 is an integer from 2 to 40, and the arrangement of the repeating units of _(c2H4-0)- and _((:3 ratio-〇)- can be In the case of random, it may be a block, and in the case where the arrangement is a block, either of -(C2H4-〇)- and -(c3H6-0)- may be a bisphenol side}. The photosensitive resin composition of claim 2, wherein the above formula (11) is such that 'IU and η· are each independently an integer of from 1 to 20, and n4 + n7 is an integer of from 2 to 4 。. The photosensitive resin composition according to any one of claims 1 to 3, wherein the (A) alkali-soluble polymer is selected from the group consisting of styrene and/or (mercapto)acrylic acid benzyl ester as a copolymer component. In the molecule. The photosensitive resin composition according to any one of claims 1 to 4, wherein in the above formula (I), 'help is an integer from 1 to 10, and n1 + n3 is 〇. 6. If the request is 丨 to 5 The photosensitive resin composition according to any one of the above, wherein the compound (C) having an ethylenically unsaturated double bond further contains a compound having at least one amino phthalate bond in the molecule. The photosensitive resin composition of any one of the above-mentioned (C) which has the ethylenically unsaturated double bond, and further comprises the compound represented by the following formula (III): [Chemical 3] r5 〇, II I Η—c—c=ch2 n9 H2C—C—C— 160046.doc 201232173 (wherein R5ARA is independently a hydrogen atom or a sulfhydryl group, and ~ and ~ are each independently an integer of 3 to 40, and _((^4 The photosensitive resin composition according to any one of the items 1 to 7, wherein the photosensitive resin composition of any one of items 1 to 7 is the same as the photosensitive resin composition of any one of items 1 to 7, wherein The compound (C) having an ethylenically unsaturated double bond further includes a compound represented by the following formula (IV) and/or (V): [Chemical 4] R5 〇 H2C==C—C-O—(-C2H4-〇-)-(c3H6-〇)- n10 ^-C2H4-〇-j-C ni2 IV) {式中’ R5及R_6分別獨立氫原子或甲基,n1〇〜ni2分別獨立 1〜30之整數} [化5] ? H °\ Re H2C=C - C-0—fc3H6-〇t(c2H4-〇tfc3H6-〇 七-U—i=CH2 ⑺ {式中’ R5及R6分別獨立為氫原子或曱基,η! 0~n! 2分別獨 立為1〜30之整數}。 9. 如請求項1至8中任一項之感光性樹脂組合物,其中作為 上述(C)具有乙稀性不飽和雙鍵之化合物,進而包含於分 子内具有異氰尿酸基之化合物。 10. 如請求項1至9中任一項之感光性樹脂組合物,其中於將 感光性樹脂組合物之總固形物成分質量設為100質量〇/0 時,上述(A)鹼可溶性高分子之調配量為40質量%〜80質 160046.doc 201232173 量%, 於將感光性樹脂組合物之總固形物成分質量設為100 質量%時,上述(B)光聚合起始劑之調配量為0.1質量 %~20質量%,並且 於將感光性樹脂組合物之總固形物成分質量設為1〇〇 質量%時’上述(C)具有乙稀性不飽和雙鍵之化合物之調 配量為5質量。/〇〜5 0質量%。 11. 一種感光性樹脂積層體’其係將包含如請求項1至10中 任一項之感光性樹脂組合物之感光性樹脂層積層於支撐 膜上而成。 12. —種形成有抗蝕劑圖案之基板之製造方法,其包括如下 步驟:將如請求項11之感光性樹脂積層體積層於基板上 之積層步驟、經由掩模對該感光性樹脂積層體進行曝光 之曝光步驟、及去除未曝光部分之顯影步驟。 13. —種電路基板之方法,其係藉由對利用如請求項12之方 法所製造之基板進行蝕刻或電鍍而形成電路基板。 160046.doc 4 S 201232173 四、指定代表圖: (一) 本案指定代表圖為:(無) (二) 本代表圖之元件符號簡單說明: 五、本案若有化學式時,請揭示最能顯示發明特徵的化學式: 0 r2 II I CH2=C—C -0-(-A-O^—(-B-0 )^f A-0 C—C=CH2IV) {wherein R5 and R_6 are independent hydrogen atoms or methyl groups, respectively, n1〇~ni2 are independent integers from 1 to 30} [H5] H °\ Re H2C=C - C-0-fc3H6-〇t (c2H4-〇tfc3H6-〇7-U-i=CH2 (7) {wherein R5 and R6 are each independently a hydrogen atom or a sulfhydryl group, and η! 0~n! 2 are each independently an integer of 1 to 30}. The photosensitive resin composition according to any one of claims 1 to 8, wherein the compound having the ethylenically unsaturated double bond as the above (C) further contains a compound having an isocyanuric acid group in the molecule. The photosensitive resin composition according to any one of claims 1 to 9, wherein the amount of the (A) alkali-soluble polymer is adjusted when the total solid content of the photosensitive resin composition is 100 mass 〇/0. When the mass of the total solid content of the photosensitive resin composition is 100% by mass, the amount of the photopolymerization initiator (B) is 0.1% by mass, and the amount of the photopolymerization initiator is 0.1% by mass. ~20% by mass, and when the total solid content of the photosensitive resin composition is set to 1% by mass, the above (C) has B The compounding amount of the compound of the unsaturated double bond is 5 mass% / 〇 〜 50% by mass. 11. A photosensitive resin laminate which will contain the photosensitive resin combination according to any one of claims 1 to 10. A photosensitive resin layer is laminated on a support film. 12. A method of manufacturing a substrate having a resist pattern, comprising the steps of: laminating a photosensitive resin layer as claimed in claim 11 on a substrate a step of laminating, an exposing step of exposing the photosensitive resin laminate to a mask, and a developing step of removing the unexposed portion. 13. A method of using a circuit board by using the method of claim 12 The manufactured substrate is etched or plated to form a circuit substrate. 160046.doc 4 S 201232173 IV. Designation of representative drawings: (1) The representative figure of the case is: (none) (2) The symbol of the symbol of the representative figure is simple: If there is a chemical formula in this case, please reveal the chemical formula that best shows the characteristics of the invention: 0 r2 II I CH2=C—C -0-(-AO^—(-B-0 )^f A-0 C—C=CH2 160046.doc160046.doc
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