TW201212151A - Systems for treating a substrate - Google Patents

Systems for treating a substrate Download PDF

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Publication number
TW201212151A
TW201212151A TW100128730A TW100128730A TW201212151A TW 201212151 A TW201212151 A TW 201212151A TW 100128730 A TW100128730 A TW 100128730A TW 100128730 A TW100128730 A TW 100128730A TW 201212151 A TW201212151 A TW 201212151A
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TW
Taiwan
Prior art keywords
module
transfer
substrate
buffer station
processing
Prior art date
Application number
TW100128730A
Other languages
Chinese (zh)
Inventor
Ki-Sang Kim
Tae-Hyuk Ahn
Don-Ggun Park
Sang-Woun Lee
Bong-Sun Kim
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW201212151A publication Critical patent/TW201212151A/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67161Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
    • H01L21/67173Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The present inventive concept provides a substrate treating system. The substrate treating system has a plurality of process facilities and at least one buffer station. Each of the process facilities respectively includes a transfer module in which a transfer robot is provided and a treating module connected to the transfer module. A buffer station is located between each of adjacent transfer modules. The buffer stations are provided to transfer substrates between the transfer modules. The plurality of process facilities includes a first facility in which the treating module is located on a first side of an imaginary connection line provided along a direction in which the transfer modules and the buffer stations are arranged and a second facility in which the treating module is located on a second side of the imaginary connection line. The transfer module of the first facility further protrudes toward the first side of the imaginary connection line farther than the transfer module of the second facility.

Description

201212151 六、發明說明: 【發明所屬之技術領域】 本發明概念在本文中係關於處理一基材之系統,且更特 °係關於在包括一傳送模組之複數個製程設施之間 處理一基材之系統。 此美國非臨時專射請案根據35 usc § ιΐ9主張2〇1〇 月12日提出申請之韓國專利申請案第1〇_編.洲 號及20U年2月16日提出中請之韓國專利中請.案㈣.卜 0013853號之優先權 入本文中。 ,該等專利申請案以全文引用方式併 【先前技術】 在提供於諸如-清潔房間之清潔環境中之複數個製程設 施中執行半導體製程。製程設施中之每—者可包括—裝載 璋、一傳送模組及-處理模組。包括基材之―器皿係放置 於該裝載璋上。該傳送模㈣配置於該裝料與該處理模 組之間且可包括在放置於該裝料上之-器皿與該處理模 之間返回—基材之__傳送機器人。上文所闡述之製程設 ^ 實例係揭不於美國公開專利第2008/0255697號中, 該專利由本申諸牵之與諸,u /、又讓人共同擁有且以引用方式併入本 文中。 该等製程設施經配置 以在一清潔房間中彼此分離。一 皿上之基材係藉由一 間傳送。 返回襄置或一工人在該等製程設施 器 之 【發明内容】 157792.doc 201212151 本發明概念之實施例提供一種基材處理系統。該基材處 理系統包括複數個製程設施,該等製程設施分別包括其中 提供—傳送機器人之一傳送模組及連接至該傳送模組^一 處理模組。該基材處理系統亦包括一緩衝台站,其位於毗 鄰傳达模、组中之每一者之間且經提供以在該等傳送模組之 間傳送基材。該複數個製程設施包括:至少一個第一設 施,其中該處理模組係位於沿其中配置該等傳送模組及該 等緩衝台站之一方向提供之一假想連接線之一第一'側上; 及至少一個第二設施,其中該處理模組係位於該假想連接 線之-第二側上。該第一設施之傳送模組比該第二:施之 傳送模組向該假想連接線之該第一側突出地更遠。 本發明概念之實施例亦提供一種基材處理系統,其包 括:一第一傳送模組,其中提供一第一傳送機器人;一第 二傳送模組,其中提供一第二傳送機器人;一緩衝台站, 其安置於該第一傳送模組與該第二傳送模組之間且經提供 以在該第一與該第二模組之間傳送一基材;第-處理模 組:其與該第-傳送模組組合同時安置於一假想連接線之 一第一側上,其中該假想連接線沿其中配置該第一傳送模 組、該第一緩衝台站及該第二傳送模組之一方向延伸;一 第一處理模組,其與第二傳送模組組合同時安置於該假想 連接線之一第二側上。該第—傳送模組比該第二傳送模組 向該假想連接線之該第一側突出地更遠。 本發明概念之實施例亦提供一種基材處理系統,其包 含.一第一傳送模組;一第二傳送模組;一緩衝台站,其 驟.d〇c . 忘 201212151 間置於該第一與該第二傳送模組之間,其中該第一及該第 —傳送模組以及該緩衝台站係沿一假想線配置,該假想線 沿一第一軸線延伸;一第一處理模組,其安置於沿垂直於 忒第一軸線之一第二轴線之假想線之一第一側上;及一第 二處理模組,其安置於沿該第二軸線之假想線之一第二侧 上,其中位於該假想線之該第一側上且平行於該假想線延 伸之該第一傳送模組之—側比位於該假想線之該第一側上 且平行於该假想線延伸之該第二傳送模組之一側距該假想 線遠。 【實施方式】 如其中在本說明書之通篇中相同參考符號可指代相同或 類似部分之隨附圖式中所圖解說明,依據對本發明之態樣 之更特定闡述,本發明概念之前述及其他特徵將顯而易 見。在圖式中,為清楚起見,可放大層及區域之厚度。 下文將參考隨附圖式更詳細地闡述本發明概念之實施 例。然而’本發明概念之實施例可以不同形式體現且不應 被理解為限於本文中所闡明之實施例。在圖式中,為清楚 起見,可放大元件之形狀。在本文之通篇中,相同編號可 指代相同元件。 熟悉此項技術者將瞭解,本發明概念之態樣可體現為一 系統、方法或電腦程式產品。因此,本發明概念之態樣可 採取以下形式:一完全硬體實施例、—完全軟體實施例 (包括韌體、駐存軟體、微碼等)、或結合軟體與硬體態樣 之一實施例’本文中將該等軟體與硬體態樣統稱為一「電 157792.doc -6 - 201212151 路」模組」4「系統」。此外,本發明概念之態樣可採 取體現於或多個電腦可讀媒體中之—電腦程式產品的形 式,該-或多個電腦可讀媒體上面體現有電腦可讀程式 碼。 可利用-或多個電腦可讀媒體之任—組合。電腦可讀媒 體可係f細可項仏號媒體或一電腦可讀儲存媒體。一電 腦可讀儲存媒體可係(舉例而言,但不限於):一電子、磁 ':、、光學、電磁、紅外線或半導體系統、設備、或裝置或 =述物項之任適合組合。電腦可讀儲存媒體之更多具體 貫例(-非窮盡列表)將包括如下物項:具有一或多個金屬 導線之一電連接、一可攜式電腦磁片、-硬碟、-RAM、 R〇M、""可擦除可程式化唯讀記憶體(EPROM或快閃記 憶體)、一光纖、一可攜式光碟唯讀記憶體(CD-ROM)、- 光于儲存裝置、-磁性儲存装置或前述物項之任一適合組 合。在此文件之上下令由 下文中’一電腦可讀儲存媒體可係可含 有或儲存一程式以供-指令執行系統、設備或裝置使用或 者結合-指令執行系統、設備或裝置使用之任—有形媒 體。 一電腦可讀信號媒體可(例如)以基帶形式或作為一載波 之一部分包括其中體現有電腦可讀程式碼之—傳播資料信 號。此一傳播信號可採取多種形式中之任一者,包括但不 限於,電磁信號、光學信號或其任一適合組合。一電腦可 讀信號媒體可係任-如下電腦可讀媒體,其非係一電腦可 讀健存媒體且可通信、值播光仏.., 得播或輸达一程式以供一指令執行 157792.doc201212151 VI. Description of the Invention: [Technical Field] The present invention relates to a system for processing a substrate, and more particularly to processing a substrate between a plurality of process facilities including a transfer module Material system. This non-temporary special-purpose petition in the United States is based on the 35 usc § ιΐ9 claim that the Korean patent application filed on the 12th of January 1st, _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Please refer to the case (4). The priority of 0013853 is included in this document. The patent applications are hereby incorporated by reference in its entirety in its entirety in the the the the the the the the the the the the Each of the process facilities can include a load port, a transfer module, and a processing module. A vessel comprising a substrate is placed on the loading magazine. The transfer mold (4) is disposed between the charge and the processing module and may include a transfer robot that returns between the vessel placed on the charge and the processing mold. The process set forth above is not disclosed in U.S. Patent Application Publication No. 2008/0255697, which is incorporated herein by reference. The process facilities are configured to be separated from each other in a clean room. The substrate on one dish is transferred by one. Returning to a device or a worker at the process facility [Abstract] 157792.doc 201212151 An embodiment of the inventive concept provides a substrate processing system. The substrate processing system includes a plurality of process facilities, each of which includes a transfer module provided in the transfer robot and connected to the transfer module. The substrate processing system also includes a buffer station located between each of the adjacent communication modules, the group and provided to transport the substrate between the transfer modules. The plurality of process facilities includes: at least one first facility, wherein the processing module is located on a first side of one of the imaginary connecting lines provided along one of the transmitting modules and one of the buffer stations And at least one second facility, wherein the processing module is located on a second side of the imaginary connection line. The transmitting module of the first facility protrudes further from the first side of the imaginary connecting line than the second transmitting module. An embodiment of the inventive concept also provides a substrate processing system, including: a first transfer module, wherein a first transfer robot is provided; and a second transfer module, wherein a second transfer robot is provided; a buffer table a station disposed between the first transfer module and the second transfer module and configured to transfer a substrate between the first and the second module; a first processing module: the same The first-transmission module assembly is simultaneously disposed on a first side of an imaginary connection line, wherein the imaginary connection line is disposed along the first transmission module, the first buffer station, and the second transmission module The direction is extended; a first processing module is disposed on the second side of one of the imaginary connecting lines simultaneously with the second transmitting module. The first transmission module protrudes further from the first side of the imaginary connection line than the second transmission module. Embodiments of the present invention also provide a substrate processing system including: a first transfer module; a second transfer module; a buffer station, the step of which is d.c. And the second transmission module, wherein the first and the first transmission module and the buffer station are arranged along an imaginary line, the imaginary line extending along a first axis; a first processing module Disposed on a first side of one of imaginary lines perpendicular to a second axis of the first axis of the crucible; and a second processing module disposed one of the imaginary lines along the second axis On the side, the side of the first transfer module that is located on the first side of the imaginary line and extends parallel to the imaginary line is located on the first side of the imaginary line and extends parallel to the imaginary line One of the second transfer modules is laterally far from the imaginary line. [Embodiment] As used throughout the specification, the same reference numerals may be used to refer to the same or similar parts. Other features will be apparent. In the drawings, the thickness of layers and regions may be exaggerated for clarity. Embodiments of the inventive concept are explained in more detail below with reference to the accompanying drawings. However, the embodiments of the inventive concept may be embodied in different forms and should not be construed as being limited to the embodiments set forth herein. In the drawings, the shape of the elements may be exaggerated for clarity. Throughout the text, the same reference numerals may be used to refer to the same elements. Those skilled in the art will appreciate that aspects of the inventive concept can be embodied in a system, method, or computer program product. Therefore, aspects of the inventive concept may take the form of a complete hardware embodiment, a fully software embodiment (including firmware, resident software, microcode, etc.), or an embodiment combining soft and hard aspects. 'In this article, the software and hardware are collectively referred to as a "Electric 157792.doc -6 - 201212151 Road" module "4" system. Furthermore, aspects of the inventive concept may be embodied in the form of a computer program product embodied in or on a plurality of computer readable media having a computer readable code embodied thereon. Any combination of - or a plurality of computer readable media may be utilized. The computer readable medium can be a medium readable media or a computer readable storage medium. A computer readable storage medium can be, for example, but not limited to, any suitable combination of an electronic, magnetic ':, optical, electromagnetic, infrared, or semiconductor system, device, or device or item. More specific examples of computer readable storage media (-non-exhaustive lists) would include items that have one of one or more metal wires, a portable computer disk, a hard disk, a RAM, R〇M, "" erasable programmable read only memory (EPROM or flash memory), a fiber, a portable CD-ROM (CD-ROM), - light storage device - a magnetic storage device or any suitable combination of the foregoing. The above is a stipulation that the 'computer-readable storage medium may contain or store a program for use by the instruction execution system, device or device, or in combination with the instruction execution system, device or device. media. A computer readable signal medium can, for example, be a propagated data signal in the form of a baseband or as part of a carrier including an existing computer readable code therein. The propagated signal can take any of a variety of forms including, but not limited to, an electromagnetic signal, an optical signal, or any suitable combination thereof. A computer readable signal medium can be as follows - a computer readable medium, which is not a computer readable storage medium and can communicate, broadcast, or broadcast a program for execution of an instruction 157792 .doc

S 201212151 系統、設備或裝置使用或者結合一指令執行系統、設備或 裝置使用。 可使用任一適當媒體傳輸體現於一電腦可讀媒體上之程 式碼’該任一適當媒體包括但不限於:無線、有線、光纖 電纜、RF等或前述物項之任一適合組合。 用於針對本發明概念之態樣執行操作之電腦程式碼可以 一或多種程式化語言之任一組合寫入,該等程式化語言包 括諸如Java、Smalltalk、C++或類似物之一目標定向程式 化語言及諸如「C」程式化語言或類似程式化語言之習用 私序化程式化語言。該程式碼可完全執行於使用者之電腦 上、部分執行於使用者之電腦上、作為一獨立軟體封包部 分執行於使用者之電腦上且部分執行於一遠端電腦上或完 全執订於遠端電腦或伺服器上。在後一情形中,遠端電腦 了透過包括一區域網路(LAN)或一廣域網路(wan)之任一 類里之網路連接至使用者之電腦,或可連接至一外部電腦 (牛Ή而σ透過使用一網際網路服務提供商之網際網 路)。 w參考根據本發明概念之實施例之方法、設備(系統)及電 細程式產品之流程圖圖解及/或方塊圖闡述本發明概念之 態樣。將理解’該等流程圖圖解及/或方塊圖令之每一方 塊及該等流程圖圖解及/或方塊圖中之方塊之組合皆可由 電腦程式指令來實施。此等電腦程式指令可被提供至-通 用電腦、專用電腦或其他可程式化資料處理設備之一處理 器以產生一機器,從而使得該等指令(其等經由電腦或其 157792.doc 201212151 他可程式化資料處理設備之處理器執行)產生用於實施流 程圖及/或方塊圖方塊或方塊組中所規定的功能/行動之手 段。 此等電腦程式指令亦可儲存於一電腦可讀媒體中,該電 腦可讀媒體可引導-電腦、其他可程式化資料處理設備或 其他裝置以一特定方式運作,從而使得儲存於該電腦可讀 媒體中之指令產生-種製品,該製品包括實施流程圖及/ 或方塊圖方塊或方塊組中所規定的功能/行動之指令。 一亦可將該等電腦程式指♦載入至一電腦、其料程式化 資料處理設備或其他裝置上以引發一系列欲在該電腦、其 =程式化設備或其他農置上執行之操作步驟以產生一電 “貫施之1程’從而使得該等指令(其等在電腦或其他可 程式化⑤備上執行)提供用於實施流程圖及/或方塊圖方塊 或方塊組中所規定的功能/行動之製程。 該等圖中之流程圖及方塊圖根據本發明概念之各種實施 例圖解說明系統、方法及電腦程式產品之架構、 可能實施方#之桎栳 .LL ^ …刼作。在此方面,流程圖或方塊圖中之每 :方塊可表示—模組、段或程式碼之-部分,其包含用於 Γ施該⑷規定邏輯功m多個可執行指h亦應注 :三在某些替代實施方案中,方塊中所標注之功能可不按 “寻圖中所標注之次序出現。舉例而言,事實上,可端視 ^ft之功能’大致同時執行兩個連續顯示之方塊,或有 時可按相反次序勃彳 , &、 執仃忒寺方塊。亦應注意,該等方塊圖 及/或流程圖圖解φ #立 母—方塊及該等方塊圖及/或流程圖 157792.doc 201212151 圖解中之方塊之組合可由執行規定功能或動作之基於專用 硬體之系統或由專用硬體與電腦指令之組合來實施。 圖1係根據本發明概念之一實施例圖解說明一基材處理 系統1000之一透視圖。參考圖1,基材處理系統1〇〇〇包括 複數個製程設施1200及複數個缓衝台站。製程設施 1200中之每一者包括一裝載埠1220、一傳送模組124〇及_ 處理模組1260。根據一實施例,在製程設施丨2〇〇中,裝載 槔1220、傳送模組1240及處理模組1260係沿一直線順序配 置。屬於其他製程設施1200之傳送模組124〇係彼此沿一直 線配置。緩衝台站14〇〇係安置於毗鄰製程設施丨2^之傳送 模組1240之間。當自一平面俯視圖觀看時,在製程設施 1200中,其中配置裝載埠丨220、傳送模組124〇及處理模組 1260之一方向係垂直於其中配置傳送模124〇及緩衝台站 1400之一方向。參考圖!中之圖例,其中配置傳送模組 1240及緩衝台站14〇〇之方向係稱為一第一方向⑺且其中配 置裝載埠1220、傳送模組124〇及處理模組126〇之方向係稱 為一第二方向20。 在操作中,包括基材之一器孤3〇係放置於裝載埠 上。根據一實施例,藉由一返回裝置4〇(如同一高架傳送 機)裝載或卸載器孤30。可藉由一自動引導載具、一軌道 引導載具或一工人在裝載埠122〇上選擇性地裝載或卸載器 皿3 〇。可使用係一密閉型器盟之一前開式聯合莢形容器 (front open unified p〇d)作為器皿3〇。在每一製程設施u⑼ 中,提供一或複數個裝載埠122〇。在提供複數個裝載埠 157792.doc 201212151 1220之情形下,裝載埠122〇係沿著沿第一方向⑺之一線提 供。在圖1中,展示用於每一製程設施12〇〇之兩個裝載埠 1220。然而,提供給製程設施12〇〇中之每一者之裝載埠 1220的數量可係不同的。同樣,製程設施12〇〇可具有一彼 此不同數量之裝載埠1220。 傳送模組1240包括一外殼125〇及一傳送機器人1242。外 殼1250具有一大致矩形形狀β參考圖!及圖2,外殼125〇具 有一頂表面(圖2之1251)、一底表面(圖2之1252)、一第一 側1253、一第二側1254、一第三側1255及一第四側η%。 第一及第三側1253及1255面向彼此且第二及第四側1254及 1256面向彼此。第一側1253垂直於第二側1254。第一側 1253面向裝載埠122〇且第三側1255面向處理模組126〇。 在外殼1250之第一侧丨253處提供接達器皿3〇中之一基材 之一開口(未展示)及用於打開及關閉該開口之一門(未展 示)。在外殼1250之第三側1255處提供用於接達處理模組 1260中之基材之一開口(未展示)及用於打開及關閉該開 口之一門(未展示)。同樣,分別在外殼125〇之第二及/或第 四側上形成用於接達緩衝台站14〇〇中之一基材之開口(圖2 之1257)。在外殼125〇中提供用於打開器皿3〇之一門之一 開門器(未展示)。提供外殼125〇以使得外殼125〇之一内部 區域與外側隔離。在外殼1250之頂表面上提供一風機過濾 單元(未展示)且該風機過濾單元引導在外殼125〇中過渡的 空氣以使其沿自上而下之一方向流動。因此,可維持外殼 1250之内側比外殼1250之外側清潔。 157792.doc 5 -II · 201212151 傳送機器人1242在放置於裝載埠122〇上之器皿3〇與處理 模組1260之間、在裝載埠122〇與緩衝台站14〇〇之間且在處 理模組1260與緩衝台站丨400之間傳送一基材。在外殼以% 中平行於第一方向10提供一導執1246。傳送機器人1242係 位於導執1246上以沿導軌1246沿一直線移動。根據一實施 例,傳送機器人1242亦上下移動。傳送機器人1242之一手 1244可向前移動、向後移動且在一水平面上旋轉。可提供 一或多隻手丨244。在圖,展示具有兩隻手1244之傳送 機器人1242。 處理模組1260包括一裝載鎖定室1262、一傳送室1264及 一製程室1266。 當自一平面俯視圖觀看時,傳送室1264具有一大致多邊 形形狀。在圖1中,當自一平面俯視圖觀看時,圖解說明 傳送室1264具有一六邊形形狀。然而,傳送室1264之一形 狀並不限於此,且可改變。一傳送機器人1268係提供於傳 送室1%4中。傳送機器人1268可上下移動且傳送機器人 1268之一手1269可向前移動、向後移動且在一水平面上旋 轉。可提供一或多隻手1269。在圖!中,展示具有兩隻手 1269之傳送機器人1268 » 裝載鎖定室1262及製程室1266係提供於傳送室1264周 圍。裝載鎖定室1262係位於毗鄰於傳送模組124〇之傳送室 1264之側部分處。製程室1266係位於傳送室1264其他側部 分處。可提供一或多個裝載鎖定室1262。根據一實施例, 提供兩個裝载鎖定室1262。欲輸入處理模組126〇中以執行 157792.doc -12- 201212151 -製程之基材可暫時放置於裝載鎖定室i262中之一者中且 在-製程完成之後自處理模組126〇輸出之基材可暫時放置 於裝載鎖定室1262中之另一者中。在執行一製程之前及在 完成-製程之後的基材可放置於裝載鎖定室⑽中之每一 者中。傳送室題及製程室1266之内側係維持在一第一壓 力下,傳送模組mo之内側係維持在_第二壓力下且裝載 鎖定室1262之内側可在第-壓力與第二壓力之間變化。根 據一實施例,該第一壓力比該第二壓力低。舉例而言,該 第-壓力係-真空壓力且該第二壓力係一大氣壓力。 一製程室1266對-基材執行-狀製程。舉例而言,製 程室可執行諸如清潔、灰化、沈積、姓刻或量測之製 程可提供一或多個製程室1266。舉例而言,除了提供裳 載鎖疋室1262之傳送室1264之彼等侧部分以外,製程室 ⑽可提供至傳送室1264之其他側部分之全…部分。 在提供複數個製程室1266之情形下,製程室^⑽可對基材 騎-相同製程或不同製程。製程室⑽可具有在(例如) 一真空壓力下或在大氣壓力下對基材執行製程之結構。 緩衝台站1400係提供於毗鄰傳送模組(例如,124〇a、 4〇b)之間。圓2係圖解說明提供於傳送模組、 1240b)之間的一緩衝台站14〇〇之一實例之一圖式。圖3係 圖解說明圖2之一緩衝部件1440之一實例的一透視圖。參 考圖2及圖3 ’緩衝台站刚0包括-外殼1420及-緩衝部件 1440。根據一實施例,外殼142〇具有其中具有一空間之— 矩形容器形狀。外殼142〇之一端係與一第一傳送模組 157792.doc -13- 201212151 1240a組合且外殼1420之另一端係與一第二傳送模組124〇b 組合。外殼1420之一端及另一端係沿第一方向1〇彼此間隔 開且面向彼此。 根據一實施例’緩衝部件1440係固定安裝於外殼1420 中。緩衝部件1440包括一本體1442及複數個緩衝墊1444。 本體1442具有一矩形容器形狀且垂直於第一方向1〇之某些 側(办如,兩個側)係打開的。緩衝墊丨444係提供於本體 1442内側。緩衝墊1444係沿一上下方向彼此間隔開。缓衝 墊1444中之每一者包括支撐基材之一邊緣部分之兩個板 1444a及1444b。板1444a及1444b係沿第二方向20彼此間隔 開。一傳送機器人1242之一手1244沿板(1444a、1444b)之 間的一分離空間上下移動。位於緩衝台站14〇〇兩個側處之 傳送模組1240a、1240b之傳送機器人丨2U經提供以裝載或 卸載基材。根據一實施例,緩衝部件144〇可具有如同圖4 中所展示之一緩衝塾1445。 參考回至圖2’在傳送模組(丨240a、1240b)之外殼1250中 提供打開及關閉形成於面向緩衝台站丨4〇〇之—側上之各別 開口 1257之門1258。在製程設施丨2〇〇中之—者令出現一錯 誤之情形下,使用門12W關閉一開口 I257且每一製程設施 1200可獨立於其他製程設施丨2^使用。在此情形下―器 皿30中之基材在製程設施12〇〇之間的一傳送可透過高架傳 送機40執行。作為一替代方案,可使用一自動引導載具、 —軌道引導載具或一工人在製程設施12〇〇之間傳送包括基 材之器皿30。 157792.doc •14· 201212151 圖5係圖解說明一緩衝台站1401之另一實例之一圖式。 在圖5中’移除外殼1421以展示缓衝台站1401之内側。參 考圖5 ’緩衝台站14〇1包括一外殼14Z1、一緩衝部件Μ" 及一緩衝驅動部件1460。圖5中之外殼1421及緩衝部件 1441具有與圖2及圖3中之外殼1420及緩衝部件1440類似之 一結構。與圖2之外殼1420相比較,圖5之外殼1421沿第一 方向ίο具有一較大長度。在外殼1421中,緩衝驅動部件 1460沿第一方向1〇將緩衝部件1441自一第一位置移動至一 第二位置。該第一位置係毗鄰於位於緩衝台站14〇丨之一側 處之一傳送模組1240a(亦稱為「一第一傳送模組」)之一位 置且3亥第—位置係®比鄰於位於緩衝台站1401之另一側之另 傳送模組1240b(亦稱為「一第二傳送模組」)之一位置。 緩衝驅動部件1460包括一導執1461及一基座1462。導執 1461之一縱向係平行於第一方向10配置於外殼1421中且自 該第一位置延伸至該第二位置。基座1462係與導軌1461組 合以使其可藉由一驅動器(未展示)沿導軌1461移動。緩衝 部件1441係與基座1462固定組合以與基座1462—起移動。 當毗鄰傳送模組124〇&與1240b之間的一距離相對遠時,可 使用圖5之緩衝台站1401。 圖6係圖解說明一缓衝台站1402之另一實例之一平面俯 視圖。參考圖6,緩衝台站1402包括一外殼1422、一第一 緩衝部件1422a、一第二緩衝部件1442b及一返回部件 1480。圖6之外殼1422具有類似於圖2之外殼1420之一結 構。第一緩衝部件1442a及第二緩衝部件1442b具有類似於 s 157792.doc _ 201212151 圖3之緩衝部件1440之一結構。然而,與圖2之外殼142〇相 比較,圖6之外殼1422沿一第—方向1〇具有一較大長度。 第一緩衝部件1442a係毗鄰於安置於緩衝台站14〇2之一側 上之第傳送杈組1240a定位。第二緩衝部件14421?係毗鄰 於安置於緩衝台站之另_側上之第二傳送模組12桃 定位。返回部件1480在第一緩衝部件1442&與第二緩衝部 件1442b之間傳送一基材。返回部件148〇具有一導執Μ" 及一傳送機器人1482。導軌1481係安置於外殼1422中以使 得導軌1481之縱向平行於第一方向1〇。導轨^樹自毗鄰 於第一緩衝部件14 4 2 a之一位置延伸至毗鄰於第二緩衝部 件1442b之一位置。傳送機器人1482係與導軌1481組合以 使得了藉由驅動器(未展示)沿導軌1481傳送傳送機器人 1482。傳送機器人Mu將一基材自第一緩衝部件傳 送至第二緩衝部件1442b。傳送機器人MU具有一或複數 只手1483。舉例而言,傳送機器人1482可具有兩隻手或可 具有與可在第一緩衝部件1442a上裝載之基材之數目一樣 夕的手。當毗鄰傳送模組1240a、1240b之間的一距離比較 長時’可使用圖6之緩衝台站14〇2。 參考回至圖1 ’根據一實施例,緩衝台站1400與傳送模 、’且1240起係一單個本體。作為一替代方案,緩衝台站 1400可易於附接至傳送模組1240及自傳送模組1240拆卸。 根據實施例’以如下方式安裝基材處理系統丨000。順 序且重複安裝製程設施1200及缓衝台站1400直至安裝完最 後個製程设施1200。當安裝緩衝台站14〇〇時,將緩衝台 157792.doc 201212151 站1400安裝成與一毗鄰已安裝製程設施12〇〇之傳送模組 1240連接在一起,且當安裝製程設施12〇〇時將傳送模組 1240安裝成與一毗鄰已安裝緩衝台站14〇〇連接在一起。接 著,使用諸如(例如)一螺釘之一組合部件(未展示)固定傳 送模組1240及緩衝台站1400。 作為一替代方案,以如下方式安裝基材處理系統1〇〇〇。 首先,安裝製程設施1200以使得傳送模組124〇定位成彼此 以規則間隔間隔開。此後,使緩衝台站14〇〇位於傳送模組 124〇之間。根據一實施例,沿第一方向1〇之緩衝台站μ㈧ 之長度可係可調整的。在使緩衝台站14〇〇位於傳送模組 1240之間之後,調整(例如,增加)緩衝台站之一長度 以連接至一毗鄰傳送模組丨240。接著,使用諸如(例如)一 螺釘之一組合部件(未展示)固定傳送模組124〇及緩衝台站 1400 〇 圖7係圖解說明 —長度可調整之一緩衝台站1403的一實 例之一透視圖。 括一本體1423a 參考圖7,緩衝台站丨4〇3之一外殼1423包 、一風箱1423b及一組合板1423c。本體 1423a具有一結構或_材料以使得本體沿第一方向μ 之長度固疋。風箱1423b自本體1423a延伸且風箱1423b 之一長度可沿第—方向1〇改變。一組合板1423c係提供於 本體 1423a 之一姑 + .. ^處且提供於風箱1423b之一端處。為將缓 衝台站1403與傳送模组124〇組合,首先,在風箱14咖之 一長度減小之~~. U K At , . ^ , 狀癌、中,使緩衝台站14〇3位於傳送模組 1240之間。接荽 设考’將與本體1423a組合之組合板1423c連接 S. 157792.doc -17- 201212151 至傳送模組1240且使用一組合部件(未展示)將組合板1423c 與傳送模組1240彼此組合。接著,增加風箱1423b之一長 度以使得與風箱1423b組合之組合板1423 c連接至另一傳送 模組1240。接著,使用一組合部件(未展示)將組合板1423c 與另一傳送模組1240彼此組合。 作為一替代方案,不同於圖7,外殼可在本體之兩個側 上皆包括風箱。同樣,作為一替代方案,外殼之一整個區 域亦可形成為風箱。 圖8係圖解說明一長度可改變之一缓衝台站1404的另一 實例之一透視圖。參考圖8,一外殼1424可包括一第一本 體1424a、一第二本體1424b及一組合板1424c。第二本體 1424b係與第一本體1424a組合以使得第二本體1424b沿第 一方向10自第一本體1424a突出或插入至第一本體1424a 中。亦即,可藉由一伸縮方法沿第一方向10改變外殼1424 之一長度。在第一及第二本體1424a及1424b上之兩端處提 供組合板1424c。為將缓衝台站1404與傳送模組1240組 合,首先,在第二本體1424b插入至第一本體1424a中之一 狀態中,使缓衝台站1404位於傳送模組1240之間。接著, 將與第一本體1424a組合之組合板1424c連接至傳送模組 1240且使用一組合部件(未展示)將缓衝台站1404與傳送模 組1240彼此組合。此後,第二本體1424b自第一本體l424a 突出以使得提供於第二本體1424b之端部處之組合部件 1424c可連接至另一傳送模組1240,且接著使用一組合部 件(未展示)將緩衝台站1404與另一傳送模組1240彼此組 157792.doc -18- 201212151 合。 在圖7及圖8中,可將一密封部件(未展示)應用至組合板 1423c或1424c與傳送模組1240之間的一接觸表面以使得自 外側密封傳送模組1240之内側及緩衝台站14〇3或14〇4之外 殼1423或1424之内側。 參考回至圖1,根據一實施例,製程設施12〇〇具有彼此 相同的一結構。彼此連接之傳送模組丨24〇及緩衝台站丨4〇〇 可沿一假想線(稱為一連接線5〇)安置。根據一實施例,連 接線50係如同圖1中所展示之一直線。另一選擇係,連接 線50可具有各種形狀,諸如一大寫字母「L」或一大寫字 母「丁」。根據一實施例,製程設施12〇〇之處理模組126〇係 順序且交替地安置於連接線50之一第一側及一第二側處。 導軌42提供至連接線50之一第一側及一第二側以使得導軌 42面向連接線50之第一及第二側上之裝載埠122〇。諸如一 高架傳送機40之一返回裝置可沿導軌42移動。根據—實施 例,提供至連接線50之第一側之導執42係獨立於提供至連 接線50之第二側之導軌。作為一替代方案,提供至連接線 之第一側之導軌42及提供至連接線5〇之第二側之導軌42 係一個軌道之部分。 圖9係圖1中提供之三個製程設施及安置於該等製程設施 之間的緩衝台站之一放大圖式。 為便於闡述,在圖9中,提供至連接線5〇之一第—側之 一製程設施係稱為一第一設施12〇〇a。提供至第—設施 1200a之一裝載痒、一傳送模組及一處理模組係分別稱為 157792.doc S· -19· 201212151 一第一裝載埠l22〇a、一第一傳送模組124〇&及一第一處理 模組1260a ^提供至連接線50之一第二側之一製程設施係 稱為一第二設施1200b。提供至第二設施uoob之一裝載 埠、一傳送模組及一處理模組係分別稱為一第二裝載埠 1220b、一第二傳送模組1240b及一第二處理模組1260b。 如上文所闡述,第一處理模組126〇a係與第一傳送模組 1240a之一第三側壁1255a組合且第二處理模組126〇b係與 第二傳送模組1240b之一第三側壁1255b組合。與第二傳送 模組1240b之一第一側壁1253b相比較,第一傳送模組 1240a之第三側壁1255a自連接線50向第一處理模組126〇a 突出地更遠。與第一傳送模組1240a之一第一側壁1253a相 比較,第二傳送模組12401)之第三側壁12551?自連接線5〇向 第一處理模組1260b突出地更遠。 安置於第一傳送模組1240a與第二傳送模組124〇15之間的 一緩衝台站1400包括一第一側壁1453、一第二側壁1454、 一苐二側壁1455及一第四側壁1456。第一側壁1453與第二 侧壁1455面向彼此。第二側壁1454與第四側壁1456面向彼 此。第二側壁1454及第四側壁1456係分別與一第一傳送模 組1240a及一苐一傳送模組1240b組合。第一側壁1453係安 置於自第一傳送模組l240a之第一側壁I253a延伸之一平面 上。苐二側壁1455係安置於自第二傳送模組124〇b之第一 側壁12 5 3 b延伸之一平面上。 一第一服務空間1800a係由自第一傳送模組1240a突出之 一部分l7〇Oa、第二裝載埠1220b及一緩衝台站14〇〇環繞。 157792.doc -20· 201212151 第一服務空間1800a係當需要維護第一傳送模組1240a、第 一處理模組1260a之裝載鎖定室1262a、緩衝台站1400及第 二裝載埠1220b時一工人可位於其中之一空間。同樣,一 第二服務空間1800b係由自第二傳送模組1240b突出之一部 分1700b、第一裝載埠1220a及一缓衝台站1400環繞。第二 服務空間1800b係當需要維護第二傳送模組1240b、第二處 理模組1260b之裝載鎖定室1262b、緩衝台站1400及第一裝 載埠1220a時一工人可位於其中之一空間。 根據一實施例,製程設施1200a及1200b具有一相同大小 及一相同形狀。處理模組1260之平行於第一方向10之最大 寬度L1可比對應傳送模組1240之平行於第一方向10之最大 寬度L2大。 圖10係圖解說明一基材處理系統2000之另一實例之一圖 式。參考圖10,基材處理系統2000包括一製程設施2200, 該製程設施包括一傳送模組2240及提供於毗鄰傳送模組 2240之間的一缓衝台站2400。在圖10之基材處理系統2000 中,全部製程設施2200之處理模組2260係安置於傳送模組 2240及缓衝台站2400配置於其上之連接線50之一頂側或一 底側上,而非安置於連接線50之兩個側上。在此情形下, 相對於連接線50,僅在其上提供處理模組2260之侧的相對 側上提供一高架傳送機40及引導高架傳送機40之一移動之 一導軌42。出於圖解目的,圖10展示連接線50之兩個側上 之處理模組2260以展示該等處理模組將在連接線50之任一 側上的樣子。然而,應理解,該實施例係指全部處理模組 157792.doc -21 - 201212151 2260係安置於連接線50之一相同側上。 圖11係圖解說明一基材處理系統3000之另一實例之一圖 式。參考圖11,基材處理系統3000包括製程設施3200及 3201,該等製程設施包括傳送模組3240及提供於毗鄰傳送 模組3240之間的一缓衝台站3400。某些製程設施3201包括 兩個處理模組3262及3 264而無裝載埠3220。為便於闡述, 在圖11中,該兩個處理模組中之一者係稱為一第一處理模 組3262且該兩個處理模組中之另一者係稱為一第二處理模 組3264。第一及第二處理模組3262及3264可具有類似於圖 1之處理模組1260之一結構。第一及第二處理模組3262及 3264共用一傳送模組3240。第一處理模組3262、傳送模組 3240及第二處理模組3264係沿著沿第二方向2〇之一線順序 提供。第一及第二處理模組3262及3:264係相對於傳送模組 3240對稱地提供。在圖11中,圖解說明第一及第二處理模 組3262及3264具有一相同結構。然而,作為一替代方案’ 第一及第二處理模組3262及3264可具有彼此不同的一結 構。第一及第二處理模組3262及3 264可對基材執行一相同 製程。作為一替代方案,第一及第二處理模組3262及3264 可對基材執行彼此不同的一製程。 圖12係圖解說明一基材處理系統4000之另一實例之一圖 式》參考圖12,基材處理系統4000包括製程設施4201、 4202、4203及4204,該等製程設施包括傳送模組424〇及提 供於毗鄰傳送模組4240之間的缓衝台站4400 »製程設施 4201、4202 ' 4203 及 4204 之處理模組 4261、4262、4263 及 157792.doc -22- 201212151 4264具有彼此不同的結構。製程設施4201之處理模組4261 包括裝載鎖定室42 61a、一多邊形傳送室42 61b及複數個製 程室4261c。製程設施4202之處理模組4262具有其中一裝 載鎖定室4262a及一製程室4262c係與一傳送室4262b組合 且裝載鎖定室4262a、傳送室4262b及製程室4262c係沿著 沿第二方向20之一線順序提供之一結構。製程設施4203之 處理模組4263具有其中具有(例如)一正方形或矩形形狀之 一傳送室4263b係與安置於傳送室4263b周圍的裝載鎖定室 4263a及製程室4263c組合之一結構。製程設施4204之處理 模組4264具有一多邊形傳送室4264b及安置於傳送室4264b 周圍的複數個製程室4264c »傳送室4264b係與傳送模組 4244直接組合。圖12中所圖解說明之處理模組4261、 4262、4263及4264之結構係實例且處理模組可具有各種結 構。 在圖12之情形下,根據一實施例,製程設施、42〇2 及4203可在一真空狀態下對基材執行一製程且製程設施 4204可在一大氣壓力下對基材執行一製程。 在圖12中,處理模組4261、4262、4263及4264係提供於 緩衝台站4400以及傳送模組4240及4244配置於其上之連接 線50之兩個側上。然而,如上文結合圖1 〇所闡述’處理模 組4261、4262、4263及4264可提供於連接線50之一側上。 圖13係圖解說明一基材處理系統5000之另一實例之一圖 式。參考圖13,基材處理系統5000包括製程設施5200及 5201,該等製程設施包括傳送模組5240及提供於毗鄰傳送 157792.doc -23- 201212151 模組5240之間的緩衝台站5400。製程設施5201包括一傳送 模組5240及一處理模組5260而無裝載埠5220。 圖14係圖解說明一基材處理系統6000之另一實例之一圖 式。參考圖14,基材處理系統6000包括製程設施6201及 6202,該等製程設施包括傳送模組6240及提供於毗鄰傳送 模組6240之間的緩衝台站6400。裝載埠6220提供至包括安 置於傳送模組6240及緩衝台站6400配置於其上之連接線50 之一第一側上之一處理模組6260之製程設施6201,但裝載 埠6220不提供至安置於連接線50之一第二側上之製程設施 6202。在此情形下,僅在連接線50之第二側上提供一高架 傳送機40及引導高架傳送機40之一移動之一導軌42。 在圖13及圖14中,處理模組5200、5201、6201及6202具 有一相同結構。然而,根據一實施例,處理模組5200、 5201、6201及6202可具有如圖11中所圖解說明之彼此不同 的結構。作為一替代方案,在圖1 4中,安置於連接線50之 一相同側之處理模組可具有彼此相同的一結構,但具有與 安置於連接線50之另一側之處理模組不同的結構。舉例而 言,處理模組620 1可具有彼此相同的結構,且處理模組 6202可具有與處理模組6201不同的一結構,但具有彼此相 同的結構。 圖15係圖解說明一基材處理系統7000之另一實例之一圖 式。參考圖15,基材處理系統7000包括製程設施7200及 7201,該等製程設施包括傳送模組7240及提供於毗鄰傳送 模組7240之間的緩衝台站7400。基材處理系統7000進一步 157792.doc -24- 201212151 包括一製程處理裝置7800。製程處理裝置7800係與製程設 施7201之一裝載埠7220組合。製程處理裝置7800與其組合 之製程設施7201之一處理模組7260及製程處理裝置7800係 相對於連接線50位於相對側處。製程處理裝置7800係同時 與兩個製程設施7201之裝載埠7220組合。缓衝台站7400未 提供於與製程處理裝置7800組合之兩個製程設施7201之傳 送模組7240之間。兩個製程設施7201係彼此毗鄰。 根據一實施例,製程處理裝置7800可係對複數個基材同 時執行一製程之一批製程裝置。舉例而言,在製程處理裝 置7800中執行之一製程可係一清潔製程或一剝離製程。根 據一實施例,如同圖16,製程處理裝置7800可係具有類似 於或相同於美國公開專利第2004/01 65973號之圖10中所揭 示之裝置之一結構的一裝置,該公開專利係共同受讓與本 申請案之受讓人,且以引用方式併入本文中。 在製程處理裝置7800中提供根據製程處理裝置7800之一 内部結構旋轉包括一基材的一器皿30之一旋轉部件7820。 高架傳送機40將器孤30放在裝載埠7220上以使得器皿30之 一開口面向傳送模組7240。製程處理裝置7800將器皿30傳 送至製程處理裝置7800之内側,將器皿30旋轉180度,且 接著自器孤3 0卸載基材。作為一替代方案,旋轉器孤30之 該旋轉部件可提供於裝載埠7220或高架傳送機40上《根據 一實施例,器皿30在被放置於製程設施7201之裝載埠7220 上之後移動至製程處理裝置7800且在一製程於製程處理裝 置7800中完成之後移動至另一製程設施7201之裝載埠 157792.doc -25- 201212151 7220。作為一替代方案,基材可直接移動至製程處理裝置 7800,而器皿30仍停留在裝載埠7220上。 圖17係圖解說明一基材處理系統8000之另一實例之一圖 式。類似於圖15之基材處理系統7000,圖17之基材處理系 統8000包括製程設施8200及8201,該等製程設施包括傳送 模組8240、提供於毗鄰傳送模組8240之間的緩衝台站 8400、8401及製程處理裝置8800。在基材處理系統8000 中,緩衝台站8401係提供於製程處理裝置8800與其組合之 製程設施8201之傳送模組8240之間。根據一實施例,缓衝 台站8401具有類似於圖5或圖6之緩衝台站1401、1402之一 結構。 圖18係圖解說明一基材處理系統9000之另一實例之一圖 式。類似於圖15之基材處理系統7000,基材處理系統9000 包括製程設施9200及9201,該等製程設施包括傳送模組 9240、提供於毗鄰傳送模組9240之間的缓衝台站9400及製 程處理裝置9800、9801。在基材處理系統9000中,製程處 理裝置9801係與製程設施9201安置於其間之製程設施9200 之裝載埠9220組合。 圖19係圖解說明一基材處理系統10000之另一實例之一 圖式。類似於圖15之基材處理系統7000,基材處理系統 10000包括製程設施10200,該製程設施包括傳送模組 10240、提供於毗鄰傳送模組10240之間的緩衝台站10400 及製程處理裝置10800。在基材處理系統10000中,製程處 理裝置10800係與一個製程設施10200之一裝載埠10220組 157792.doc -26- 201212151 製程處理裝置10800可係執行一擴散製程 合。.舉例而言 之-裝置。舉例而言,如同圖2〇中所展示之製程處理裝置 1_可係具有類似於或相同於美國公開專利第應/ 0255697號之圖4中所揭示之裝置之一結構的—裝置,該公 開專利係共同受讓與本巾請案之受讓人,且以引用方式併 入本文中。 在製程處理裝置1〇800中提供根據製程處理裝置ι〇8〇〇之 一内部結構旋轉包括一基材的一器贩3〇之一旋轉部件 10820。旋轉部件1〇820旋轉器皿3〇以使得器皿⑽之一開口 方向轉18 0度。作為一替代方案,該旋轉組件可提供於 一裝載埠10200或一高架傳送機4〇處。 圖21係圖解說明一基材處理系統11〇〇〇之另一實例之一 圖式。基材處理系統11 〇〇〇包括製程設施1丨2〇丨及丨丨202, 該等製程設施包括傳送模組11241及11242及提供於毗鄰傳 送模組11241與11242之間的緩衝台站114〇〇及114〇1。基材 處理系統11 000中之傳送模組11241及11242以及緩衝台站 11401具有與圖1之傳送模組1240及緩衝台站1400不同的組 合結構。 製程設施11201及11202分別包括傳送模組Π241及11242 以及處理模組11261及11262。在製程設施1丨2〇1中,傳送 模組11241及處理模組11261係相對於彼此沿第二方向20提 供。在另一製程設施11202中,傳送模組11242及處理模組 1 1262係相對於彼此沿第一方向1〇提供。為便於闡述,在 圖21中,傳送模組11241係稱為一第一傳送模組且傳送模 157792.doc •27· 201212151 組11242係稱為一第二傳送模組。 根據一實施例,缓衝台站11401包括一外殼11420及一緩 衝部件11440。根據一實施例,緩衝部件1丨440具有類似於 或相同於圖2及圖3之緩衝部件1440之一結構。外殼11420 包括一頂表面(未展示)、一底表面(未展示)、一第一側 11423、一第二側11424、一第三側11425及一第四側 11426。根據一實施例,外殼11420具有一矩形形狀或一規 則六面體形狀。第一及第三侧11423及11425面向彼此且第 二及第四侧11424及11426面向彼此。第一側11423係垂直 於第二側11424。在第一側11423及第二側π424處提供基 材通過其之開口(未展示)以及打開及關閉該等開口之門(未 展示)。第一傳送模組11241係與第一侧U423組合且第二 傳送模組11242係與第二側11424組合。基材在第一傳送模 組11241與第二傳送模組11242之間的一傳送係透過安置於 第一與第二傳送模組11241與11242之間的緩衝台站U4〇1 完成。 圖22係圖解說明一基材處理系統12000之另一實例之一 圖式。參考圖22,類似於圖1之基材處理系統1000,基材 處理系統12000包括製程設施122〇〇,該製程設施包括傳送 模組12241、12242及提供於毗鄰傳送模組12241與12242之 間的緩衝台站12400。一裝載埠12220係與端部傳送模組 12241之一第二側壁UM4或一第四侧壁122S6組合,傳送 模組12241及12242係沿連接線提供。因此,在基材處理系 統12000之端部處各自提供裝載埠1222〇,且在裝载蜂 157792.doc 28- 201212151 12220之間順序且交替地提供傳送模組丨224丨及i2242以及 缓衝台站12400。提供經過裝載埠1222〇之一上部部分以面 向裝載埠12220之一導軌42且諸如一高架傳送機4〇之返回 器皿·之一返回裝置沿導軌42移動。儘管在圖22中未圖解 說明連接線,但根據一實施例,連接線與導軌42重疊。 圖23係圖解說明一基材處理系統13000之另一實例之一 圖式。參考圖23 ,類似於圖1之基材處理系統1〇〇〇,基材 處理系統13000包括製程設施132〇〇,該製程設施包括一傳 送模組13240、及提供於毗鄰傳送模組13240之間的緩衝台 站13400。同樣,處理模組1326〇係交替安置於連接線咒之 一第一側及一第二側上。毗鄰傳送模組1324〇中之一者之 一第一側壁13253及毗鄰傳送模組1324〇中之另一者之一第 三側壁13255可位於距連接線5〇之一相等距離處。同樣, 傳送模組Π240及緩衝台站134〇〇中之每一者可位於距連接 線50之一相等距離處。 在上文所闡述之基材處理系統中,闡述全部製程設施係 透過緩衝台站或基材處理裝置彼此連接。根據一實施例, 製紅没施可組織成群組,且屬於一群組之製程設施係透過 緩衝台站彼此連接。 舉例而言,根據一實施例,如圖24中所圖解說明,製程 設施1200可分組成一第一群組1〇〇〇a及一第二群組1〇〇〇b。 屬於第一群組l〇〇〇a之製程設施UOO係透過緩衝台站14〇〇 彼此連接且屬於第二群組i 000b之製程設施^⑽係透過緩 衝台站1400彼此連接。包括基材之一器皿可藉由諸如—高 ,57792,00 5 201212151 架傳送機'一自動引導載具及一軌道引導載具之一返回裝 置或一工人而在屬於第一群組l〇〇〇a之製程設施12〇〇之 間、在屬於第二群組1000b之製程設施12〇〇之間且在第一 群組1000a之製程設施丨2〇〇與第二群組i〇0〇b之製程設施 1200之間傳送。 如圖25中所圖解說明,一緩衝台站未連接至其之一或複 數個製程設施1209可獨立提供於第一群組1〇〇〇&與第二群 組1000b之間。 如圖26中所圖解說明’可提供諸如(例如)圖1或圖24之 彼等基材處理系統之複數個基材處理系統。該等基材處理 系統可沿一第二方向彼此平行且可彼此分離。 儘官在圖24至圖26中圖解說明具有與圖i之實施例相同 的結構之一基材處理系統,但如同圖24至圖26中所展示之 内容’其他實施例所圖解說明之基材處理系統可以群組安 置及/或與其他基材系統安置在一起。 參考圖27至圖29,闡述使用包括一緩衝台站之一基材處 理系統對基材執行一製程之方法之實例。為便於闡述,圖 2 7至圖2 9中所圖解說明之製程設施係自左至右分別順序地 稱為第一製程設施14201、15201及16201、第二製程設施 14202、15202及16202以及第三製程設施142〇3、152〇3及 16203。同樣’提供至第一製程設施14201、15201及16201 之一傳送模組之一傳送機器人以及第一製程設施142(H、 15201及16201之一處理模組係分別稱為第一傳送機器人 14271、15271 及 16271 以及第一處理模組 14261、15261及 157792.doc •30· 201212151 16261。提供至第二製程設施14202、15202及16202之一傳 送模組之一傳送機器人以及第二製程設施14202、15202及 16202之一處理模組係分別稱為第二傳送機器人14272、 15272及 16272 以及第二處理模組 14262、15262及 16262。 提供至第三製程設施14203、15203及16203之一傳送模組 之一傳送機器人以及第三製程設施14203、15203及16203 之一處理模組係分別稱為第三傳送機器人14273、15273及 16273以及第三處理模組14263、15263及16263。同樣,圖 27至圖29中所圖解說明之緩衝台站係自左至右分別順序地 稱為第一缓衝台站14401、15401及16401以及第二缓衝台 站14402、15402及16402。在圖29中,在該頁面之最右側 部分處所圖解說明之一額外製程設施係稱為一第四製程設 施16204。提供至第四製程設施16204之一傳送機器人及第 四製程設施1 6204之一處理模組係分別稱為一第四傳送機 器人16274及一第四處理模組16264。在該頁面之最右側部 分處所圖解說明之一缓衝台站係稱為一第三缓衝台站 16403 。 闡述二十五個基材放入一器皿30中之一情形作為一實 例,但基材之數目可多於或少於25。放入器皿30中之該二 十五個基材係順序地稱為一第一基材、一第二基材、...、 一第二十五基材。 圖27圖解說明基材處理系統14000中基材之一路線,其 中執行一相同製程之製程設施14201、14202及14203係透 過緩衝台站14401及14402彼此連接。四個製程室14266係 5 157792.doc -31 - 201212151 提供至第一製程設施14201、第二製程設施142〇2及第三製 程。又% 14203中之每-者且在四個製程室14266中之每一者 中執行相同製程。因此,在基材處理系統14刪中提供 執行-相同製程之十二個製程室14266。根據一實施例, 在該二十五個基材之中,在第—處理模組丨偏中執行針 對^至第四基材、第十三至第十六基材及第二十五基材 之製程。在第二處理模組14262中執行針對第五至第八 基材及第十七至第:十基材之—製程且在第三處理模植 i4263中執行針對第九至第十二基材及第二十一至第二十 四基材之一製程。在圖27中,“ ”2、&3及&4順序表示在 第一處理模組UMi _針對其執行一製程之基材之一路 線,…^㈣⑷嗔序表示在第二處理模組胸中針 對其執行-製程之基材之—路線Μ、e2n4順序表 示在處理模組!4263 t針對其執行—製程之基材之一路 線。 匕括基材之器皿3 〇係藉由高架傳送機如放置於第一製程 没施14201之—裝載崞14221上。 第一傳送機器人14271將將在第一處理模組14261中針對 其執行-製程之基材自器皿3G傳送至第—處理模組i426i 且將將在第二處理独14262及第三處理模中針對 其執行一製程之基材自器孤3〇傳送至第一緩衝台站 同樣,第一傳送機器人14271將已在第一處理模組 中針對其完成—製程之基材傳送至第—緩衝台站 14401 。 157792.doc -32· 201212151 根據一實施例’若全部基材皆被取出器皿30,則將器皿 3〇傳送至第三製程設施i4203之一裝載埠14223。 第二傳送機器人14272將將在第二處理模組14262中針對 其執行一製程之基材自第一緩衝台站144〇1傳送至第二處 理模組14262且將將在第三處理模組14263中針對其執行一 製程之基材自第一緩衝台站144〇1傳送至第二緩衝台站 14402。同樣,第一傳送機器人14272將已在第一處理模組 14261中針對其完成一製程之基材自第一緩衝台站^斗⑴傳 送至第二緩衝台站14402且將已在第二處理模組14262中針 對其完成一製程之基材自第二處理模組14262傳送至第二 緩衝台站14402。 第二傳送機器人14273將將在第三處理模組14263中針對 其執行一製程之基材自第二緩衝台站144〇2傳送至第三處 理模組14263。同樣,第三傳送機器人14273將已在第一處 理模組1426 1及第二處理模組丨4262中針對其完成一製程之 基材自第二緩衝台站144〇2傳送至放置於第三製程設施 14203之裝載埠14223上之器皿30。第三傳送機器人14273 將已在第三處理模組丨4 2 6 3中針對其完成一製程之基材自 第三處理模組14263傳送至放置於第三製程設施丨“们之裝 載埠14223上之器皿30。 當將基材自器皿30傳送至第一緩衝台站144〇1、自第一 緩衝台站14401傳送第二緩衝台站144〇2且自第二緩衝台站 14402傳送至器皿30時,第一、第二及第三機器人i427i、 14272及14273中之每一者可同時傳送複數個基材。 157792.doc 5 •33- 201212151 根據圖27之處理基材之方法,由於在複數個製程設施 142〇1、142〇2及142〇3中,可同時對指派給製程設施 142〇1、14202及14203中之每一者之基材執行製程,因此 可減少對k供至器皿30之全部基材執行一製程所需之時 間。 圖28圖解說明基材處理系統15〇〇〇中基材之一路線。製 程設施15201、15202及15203各自執行一不同製程,且係 透過緩衝台站15401及15402彼此連接》 第一製程設施15201、第二製程設施ls2〇2及第三製程設 施i52〇3對一基材順序執行製程。在圖28中,di、们、 d3、d4、d5及d6順序表示該等基材之一路線。在圖28之基 材處理系統15000中,在一第一處理模組15261、一第二處 理模組1 5262及一第三處理模組丨5263中對提供至器孤川之 基材順序執行一製程。 首先,藉由高架傳送機40將包括基材之器皿3〇放置於第 一製程設施lWOl之一裝載埠15221上。 一第一傳送機器人1 5271將基材自器皿3〇傳送至第一處 理模組15261。根據一實施例,若器皿3〇中之全部基材皆 第—處理模組15261 ’則藉由高架傳送機4〇將器 皿3〇傳送至第三製程設施152〇3之一裝載埠15223。首先藉 由第一傳送機器人15271將已在第—處理模組15261中針對 其完成一製程之基材傳送至第一緩衝台站ΐ54〇ι。一第二 傳送機器人15272將第一緩衝台站154〇1中之基材傳送至第 一處理模組15262。將已在第二處理模組15262中針對其完 157792.doc -34· 201212151 成一製程之基材傳送至第二缓衝台站15402。一第三傳送 機器人15273將第二缓衝台站15402中之基材傳送至第三處 理模組15263。將已在第三處理模組15263中針對其完成一 製程之基材傳送至器皿30。根據一實施例,某些基材可比 其他基材更快地穿過系統15000。因此,可先完成對該等 基材中之某些基材之處理之後再對其他基材進行處理。 根據圖28之處理基材之方法,由於可使用緩衝台站 15401及154〇2在製程設施i52〇1、mo2與i52〇3之間彼此 獨立地移動基材,因此無需等待直至對器孤3〇中之所有其 他基材完成一特定製程便可對一基材執行另一製程。同 樣,由於可透過緩衝台站15401及15402將基材獨立地傳送 至製程設施15201、15202及15203,因此與當使用高架傳 送機40在製程設施15201、15202與15203之間傳送基材時 相比較,可減小傳送基材所需之時間。 圖29圖解說明基材處理系統16〇〇〇中基材之一路線。製 程設施162〇1、162〇2、16203及16204執行彼此相同的製程 或彼此不同的製程且係透過缓衝台站164〇1、164〇2及 164〇3彼此連接。舉例而言,根據一實施例,第一及第三 製程設施16201及16203對基材執行彼此相同的一製程。第 二及第四製程設施16202及16204執行與第一及第三製程設 施彼此不同的一製程,且對基材執行彼此相同的一製程。 同樣’根據一實施例’第二製程設施162〇2對基材執行相 對於在第一製程設施16201中執行之製程係一後續製程的 一製程。 157792.doc 5 •35· 201212151 四個製程室16266係提佴$筮41 焚供至第—製程設施162〇1及第三製 程設施16203中之每一者。;加在丨 考兩個製裎室16267係提供至第二 製程設施⑽2及第四製程設施_4中之每—者。根據一 貫知例,對第二製程設施162()2之製程室祕7中之一個基 材執行一製程所需之—拄„ 高 時間可比對第一製程設施16201之 製程室16266中之—個基材執行—製程所需之—時間少。 在該二十五個基材之中,在第—處理模㈣繼及第二 處理模組16262中順序執行針對第-至第四基材、第九至 十土材冑十七至第二十基材及第二十五基材之一製 程。在第三處理模組14263及第四處理模組⑹“中順序執 行針對第五至第八基材、第十三至第十六基材及第二十一 至第二十四基材之一製程。在圖29中,el、e2、e3、e4、 e5及e6順序表不在第—處理模組⑹“及第二處理模組 16262中針對其執行-製程之基材之-路線且fl、f2、f3、 及f6順序表示在第三處理模組⑽认第四處理模組 16264中針對其執行一製程之基材之一路線。 包括基材之器皿3 0係藉由高架傳送機4〇放置於第一製程 設施16201之一裝載埠ι6221上。 第一傳送機器人16271將將在第一處理模組16261及第二 處理模組16262中針對其執行—製程之基材自器皿%傳送 至第一處理模組16261且將將在第三處理模組16263及第四 處理模組】6264中針對其執行—製程之基材自器皿%傳送 至第一緩衝台站164〇1。同樣,第一傳送機器人16271將已 在第一處理模組16261中針對其完成一製程之基材傳送至 157792.doc • 36 - 201212151 第一缓衝台站16401。 根據一實施例,若全部基材皆被取出器孤30,則將器皿 3 0傳送至第四製程設施16204之一裝載埠16224。 第二傳送機器人16272將將在第三處理模組16263及第四 處理模組1 6264中針對其執行一製程之基材自第一缓衝台 站16401傳送至第二缓衝台站16402。同樣,第二傳送機器 人16272將已在第一處理模組16261中針對其完成一製程之 基材自第一緩衝台站16401傳送至第二處理模組16262且將 已在第二處理模組1 6262中針對其完成一製程之基材自第 二處理模組16262傳送至第三缓衝台站16403。 第三傳送機器人16273將將在第三處理模組16263及第四 處理模組16264中針對其執行一製程之基材自第二緩衝台 站16402傳送至第三處理模組16263。同樣,第三傳送機器 人16273將已在第二處理模組16262中針對其完成一製程之 基材自第二缓衝台站16402傳送至第三緩衝台站16403。第 三傳送機器人16273將已在第三處理模組16263中針對其完 成一製程之基材傳送至第三緩衝台站16403。 第四傳送機器人16274將已在第三處理模組16263中針對 其完成一製程之基材自第三緩衝台站1 6403傳送至第四處 理模組16264。同樣,第四傳送機器人16274將已在第四處 理模組16264中針對其完成一製程之基材自第四處理模組 16264傳送至放置於第四製程設施16204之裝載埠16224上 之器孤30。第四傳送機器人16274將已在第二處理模組 16262中針對其完成一製程之基材自第三緩衝台站16403傳S 201212151 A system, device, or device is used or used in conjunction with an instruction to perform a system, device, or device. The program code embodied on a computer readable medium may be transmitted using any suitable medium, including but not limited to: wireless, wireline, fiber optic cable, RF, etc., or any suitable combination of the foregoing. Computer code for performing operations on aspects of the inventive concept may be written in any combination of one or more stylized languages, including one of a target oriented stylization such as Java, Smalltalk, C++, or the like. Languages and custom-ordered stylized languages such as "C" stylized languages or similar stylized languages. The code can be executed entirely on the user's computer, partially on the user's computer, as part of a separate software package, on the user's computer and partly on a remote computer or completely on the remote computer. On the computer or server. In the latter case, the remote computer is connected to the user's computer through a network including any one of a local area network (LAN) or a wide area network (wan), or can be connected to an external computer (burdock) And σ through the use of an Internet service provider's Internet). Reference is made to the flowchart illustrations and/or block diagrams of the method, device (system) and the It will be understood that each of the blocks of the flowchart illustrations and/or block diagrams and combinations of the blocks of the flowcharts and/or block diagrams can be implemented by computer program instructions. Such computer program instructions can be provided to a general purpose computer, a special purpose computer or one of the other programmable data processing devices to generate a machine, such that the instructions (such as via a computer or its 157792. Doc 201212151 The processor execution of the programmable data processing device generates means for implementing the functions/actions specified in the flowchart and/or block diagram or block. The computer program instructions can also be stored in a computer readable medium that can be booted - a computer, other programmable data processing device or other device that operates in a particular manner to make the computer readable The instructions in the media produce an article of manufacture that includes instructions for implementing the functions/acts specified in the flowcharts and/or block diagrams or blocks. The computer program can also be loaded onto a computer, its stylized data processing device or other device to initiate a series of steps to be performed on the computer, its = stylized device or other agricultural equipment. To generate an electrical "one pass" so that the instructions (which are executed on a computer or other programmable 5) are provided for implementing the flowchart and/or block diagrams or blocks specified in the block The flowcharts and block diagrams in the figures illustrate the architecture, possible implementations of the systems, methods, and computer program products in accordance with various embodiments of the inventive concepts. LL ^ ... action. In this regard, each of the blocks in the flowchart or block diagram may represent a module, segment, or portion of a code that includes a plurality of executable fingers for performing the (4) specified logic function. 3. In some alternative implementations, the functions noted in the blocks may not occur in the order noted in the search. For example, in fact, the function of the ^ft function can be performed substantially simultaneously with two consecutive displays. Squares, or sometimes in the opposite order, &, 仃忒 仃忒 方块 。. Also note that the block diagrams and / or flowchart illustration φ #立母-squares and the block diagrams and / or process Figure 157792. Doc 201212151 The combination of blocks in the diagram can be implemented by a dedicated hardware-based system that performs the specified functions or actions or by a combination of dedicated hardware and computer instructions. 1 is a perspective view illustrating a substrate processing system 1000 in accordance with an embodiment of the inventive concept. Referring to Figure 1, a substrate processing system 1 includes a plurality of process facilities 1200 and a plurality of buffer stations. Each of the process facilities 1200 includes a load magazine 1220, a transfer module 124, and a processing module 1260. According to one embodiment, in the process facility, the load cassette 1220, the transfer module 1240, and the processing module 1260 are arranged in a straight line sequence. The transfer modules 124 belonging to other process facilities 1200 are arranged along the line. The buffer station 14 is disposed between the transfer modules 1240 adjacent to the process facility. When viewed from a plan top view, in the process facility 1200, one of the loading magazine 220, the transport module 124, and the processing module 1260 is disposed perpendicular to the transport module 124 and the buffer station 1400. direction. Reference picture! In the illustration, the direction in which the transmission module 1240 and the buffer station 14 are arranged is referred to as a first direction (7), and the direction in which the load port 1220, the transfer module 124, and the processing module 126 are configured is called A second direction is 20. In operation, a substrate comprising a substrate is placed on the loading crucible. According to an embodiment, the loader 30 is loaded or unloaded by a return device 4 (e.g., the same overhead conveyor). The vessel 3 can be selectively loaded or unloaded on the loading magazine 122 by an automated guided vehicle, a track guiding vehicle or a worker. A front open unified p〇d can be used as the vessel 3〇. In each process facility u(9), one or more loads 埠 122〇 are provided. In providing multiple loads 埠 157792. In the case of doc 201212151 1220, the load port 122 is provided along one of the lines along the first direction (7). In Figure 1, two loading cassettes 1220 for each process facility 12 are shown. However, the number of load ports 1220 provided to each of the process facilities 12 can be different. Similarly, the process facility 12 can have a different number of load ports 1220. The transfer module 1240 includes a housing 125 and a transfer robot 1242. The outer casing 1250 has a substantially rectangular shape β reference map! 2, the outer casing 125 has a top surface (1251 of FIG. 2), a bottom surface (1252 of FIG. 2), a first side 1253, a second side 1254, a third side 1255, and a fourth side. η%. The first and third sides 1253 and 1255 face each other and the second and fourth sides 1254 and 1256 face each other. The first side 1253 is perpendicular to the second side 1254. The first side 1253 faces the load port 122 and the third side 1255 faces the processing module 126. An opening (not shown) of one of the substrates in the access vessel 3 is provided at a first side 丨 253 of the outer casing 1250 and a door (not shown) for opening and closing the opening. An opening (not shown) for accessing the substrate in the processing module 1260 and a door for opening and closing the opening (not shown) are provided at the third side 1255 of the housing 1250. Similarly, an opening for accessing one of the substrates of the buffer station 14 (1257 of Figure 2) is formed on the second and/or fourth side of the outer casing 125, respectively. A door opener (not shown) for opening one of the doors of the vessel 3 is provided in the outer casing 125A. The outer casing 125 is provided to isolate one of the inner regions of the outer casing 125 from the outer side. A fan filter unit (not shown) is provided on the top surface of the outer casing 1250 and the fan filter unit directs the air that has transitioned in the outer casing 125 to flow in one of the top-down directions. Therefore, the inner side of the outer casing 1250 can be maintained cleaner than the outer side of the outer casing 1250. 157792. Doc 5 -II · 201212151 The transfer robot 1242 is placed between the container 3〇 placed on the loading cassette 122 and the processing module 1260, between the loading cassette 122 and the buffer station 14〇〇, and between the processing module 1260 and A substrate is transferred between the buffer stations 400. A guide 1246 is provided in the housing parallel to the first direction 10 in %. Transfer robot 1242 is positioned on guide 1246 to move along the track 1246 in a straight line. According to an embodiment, the transfer robot 1242 also moves up and down. One of the hand 1244 of the transfer robot 1242 can move forward, move backward, and rotate on a horizontal plane. One or more handcuffs 244 are available. In the figure, a transfer robot 1242 having two hands 1244 is shown. The processing module 1260 includes a load lock chamber 1262, a transfer chamber 1264, and a process chamber 1266. The transfer chamber 1264 has a generally polygonal shape when viewed from a plan top view. In Fig. 1, when viewed from a plan top view, the transfer chamber 1264 is illustrated as having a hexagonal shape. However, the shape of one of the transfer chambers 1264 is not limited thereto and may be changed. A transfer robot 1268 is provided in the transfer chamber 1%4. The transfer robot 1268 can be moved up and down and one of the transfer robots 1268 can move forward, backward, and rotate on a horizontal plane. One or more hands 1269 can be provided. In the picture! In the case, a transfer robot 1268 having two hands 1269 is shown » a load lock chamber 1262 and a process chamber 1266 are provided around the transfer chamber 1264. The load lock chamber 1262 is located at a side portion of the transfer chamber 1264 adjacent to the transfer module 124A. The process chamber 1266 is located at the other side of the transfer chamber 1264. One or more load lock chambers 1262 may be provided. According to an embodiment, two load lock chambers 1262 are provided. To enter the processing module 126〇 to execute 157792. Doc -12-201212151 - The substrate of the process can be temporarily placed in one of the load lock chambers i262 and the substrate output from the process module 126A can be temporarily placed in the load lock chamber 1262 after the process is completed. In one. Substrates prior to performing a process and after completion-process can be placed in each of the load lock chambers (10). The inner side of the transfer chamber and the process chamber 1266 are maintained at a first pressure, the inner side of the transfer module mo is maintained at the second pressure and the inner side of the load lock chamber 1262 is between the first pressure and the second pressure. Variety. According to an embodiment, the first pressure is lower than the second pressure. For example, the first pressure system is a vacuum pressure and the second pressure is an atmospheric pressure. A process chamber 1266 performs a --process on the substrate. For example, the process chamber can perform one or more process chambers 1266 by performing processes such as cleaning, ashing, depositing, surging, or measuring. For example, in addition to providing the side portions of the transfer chamber 1264 carrying the lock chamber 1262, the process chamber (10) can be provided to all of the other side portions of the transfer chamber 1264. In the case where a plurality of process chambers 1266 are provided, the process chambers (10) can be mounted on the substrate - the same process or a different process. The process chamber (10) may have a structure for performing a process on the substrate under, for example, a vacuum pressure or at atmospheric pressure. The buffer station 1400 is provided between adjacent transfer modules (eg, 124〇a, 4〇b). Circle 2 illustrates a diagram of one of the examples of a buffer station 14 提供 provided between the transfer modules, 1240b). Figure 3 is a perspective view illustrating one example of a cushioning member 1440 of Figure 2. Referring to Figures 2 and 3, the buffer station just 0 includes a housing 1420 and a cushioning member 1440. According to an embodiment, the outer casing 142 has a rectangular container shape having a space therein. One end of the outer casing 142 is coupled to a first transfer module 157792. The doc -13-201212151 1240a combination and the other end of the outer casing 1420 is combined with a second transfer module 124〇b. One end and the other end of the outer casing 1420 are spaced apart from each other in the first direction 1 且 and face each other. According to an embodiment, the cushioning member 1440 is fixedly mounted in the outer casing 1420. The buffer component 1440 includes a body 1442 and a plurality of cushions 1444. The body 1442 has a rectangular container shape and is open on some sides (for example, both sides) perpendicular to the first direction 1 。. A cushion 丨 444 is provided inside the body 1442. The cushions 1444 are spaced apart from one another in an up and down direction. Each of the cushions 1444 includes two plates 1444a and 1444b that support one of the edge portions of the substrate. The plates 1444a and 1444b are spaced apart from one another in the second direction 20. A hand 1244 of a transfer robot 1242 moves up and down along a separation space between the plates (1444a, 1444b). Transfer robots 2U of transfer modules 1240a, 1240b located at both sides of the buffer station 14 are provided to load or unload the substrate. According to an embodiment, the cushioning member 144A may have a buffer 塾 1445 as shown in FIG. Referring back to Figure 2', a door 1258 is formed in the housing 1250 of the transfer module (丨 240a, 1240b) for opening and closing the respective openings 1257 formed on the side facing the buffer station. In the event of a mistake in the process facility, the door 12W is used to close an opening I257 and each process facility 1200 can be used independently of other process facilities. In this case, a transfer of the substrate in the vessel 30 between the process facilities 12A can be performed by the overhead conveyor 40. As an alternative, an automated guided vehicle, a track guiding vehicle or a worker can be used to transport the vessel 30 comprising the substrate between the process facilities 12A. 157792. Doc • 14· 201212151 FIG. 5 is a diagram illustrating one example of another example of a buffer station 1401. The outer casing 1421 is removed in Fig. 5 to show the inside of the buffer station 1401. Referring to Figure 5, the buffer station 14〇1 includes a housing 14Z1, a buffer unit Μ" and a buffer drive unit 1460. The outer casing 1421 and the cushioning member 1441 in Fig. 5 have a structure similar to that of the outer casing 1420 and the cushioning member 1440 of Figs. 2 and 3. The outer casing 1421 of Fig. 5 has a relatively large length in the first direction compared to the outer casing 1420 of Fig. 2. In the housing 1421, the buffer driving member 1460 moves the buffer member 1441 from a first position to a second position in the first direction 1?. The first position is adjacent to one of the transfer modules 1240a (also referred to as "a first transfer module") located at one side of the buffer station 14〇丨 and the 3H-position system® is adjacent to One of the other transmission modules 1240b (also referred to as "a second transmission module") located on the other side of the buffer station 1401. The buffer drive component 1460 includes a guide 1461 and a base 1462. One of the longitudinal directions of the guide 1461 is disposed in the outer casing 1421 parallel to the first direction 10 and extends from the first position to the second position. The base 1462 is combined with the rail 1461 to be movable along the rail 1461 by a drive (not shown). The cushioning member 1441 is fixedly coupled to the base 1462 to move with the base 1462. The buffer station 1401 of Figure 5 can be used when the distance between the adjacent transport modules 124 & and 1240b is relatively long. Figure 6 is a plan elevation view of one of the other examples of a buffer station 1402. Referring to Figure 6, the buffer station 1402 includes a housing 1422, a first buffer member 1422a, a second buffer member 1442b, and a return member 1480. The outer casing 1422 of Figure 6 has a structure similar to that of the outer casing 1420 of Figure 2 . The first buffering member 1442a and the second buffering member 1442b have a similar s 157792. Doc _ 201212151 One of the structures of the buffer component 1440 of FIG. However, compared to the outer casing 142 of Figure 2, the outer casing 1422 of Figure 6 has a relatively large length along a first direction. The first cushioning member 1442a is positioned adjacent to the first transport group 1240a disposed on one side of the buffer station 14A. The second buffering member 14421 is positioned adjacent to the second transport module 12 disposed on the other side of the buffer station. The return member 1480 transfers a substrate between the first buffer member 1442 & and the second buffer member 1442b. The return component 148 has a guide Μ " and a transfer robot 1482. The guide rails 1481 are disposed in the outer casing 1422 such that the longitudinal direction of the guide rails 1481 is parallel to the first direction 1 〇. The rails are extended from a position adjacent to the first cushioning member 14 4 2 a to a position adjacent to the second buffer member 1442b. The transfer robot 1482 is combined with the guide rail 1481 such that the transfer robot 1482 is transported along the guide rail 1481 by a driver (not shown). The transfer robot Mu transfers a substrate from the first buffer member to the second buffer member 1442b. The transfer robot MU has one or a plurality of hands 1483. For example, the transfer robot 1482 can have two hands or can have the same number of hands as the number of substrates that can be loaded on the first cushioning member 1442a. The buffer station 14〇2 of Fig. 6 can be used when a distance between adjacent transfer modules 1240a, 1240b is relatively long. Referring back to Figure 1 'According to an embodiment, buffer station 1400 and transfer mode, 'and 1240 are a single body. As an alternative, the buffer station 1400 can be easily attached to and detached from the transport module 1240. The substrate processing system 丨000 was mounted in the following manner according to the embodiment. The process facility 1200 and the buffer station 1400 are sequentially and repeatedly installed until the last process facility 1200 is installed. When the buffer station is installed 14 ,, the buffer station will be 157792. The doc 201212151 station 1400 is installed to be coupled to a transport module 1240 adjacent to the installed process facility 12, and the transport module 1240 is installed to be adjacent to an installed buffer station 14 when the process facility 12 is installed. 〇〇 Connected together. Next, the transfer module 1240 and the buffer station 1400 are fixed using a combination component (not shown) such as, for example, a screw. As an alternative, the substrate processing system 1 is mounted in the following manner. First, the process facility 1200 is installed such that the transfer modules 124 are positioned to be spaced apart from each other at regular intervals. Thereafter, the buffer station 14 is placed between the transport modules 124A. According to an embodiment, the length of the buffer station μ (eight) along the first direction may be adjustable. After the buffer station 14 is positioned between the transport modules 1240, one of the buffer stations is adjusted (e.g., increased) to connect to an adjacent transport module 240. Next, the transport module 124 and the buffer station 1400 are fixed using a combination of components such as, for example, a screw (not shown). FIG. 7 is a diagram illustrating an example of one of the length adjustable buffer stations 1403. Figure. Included in a body 1423a Referring to Figure 7, a buffer station 丨4〇3 has a housing 1423 package, a bellows 1423b, and a combination panel 1423c. The body 1423a has a structure or material such that the body is fixed in the length of the first direction μ. The bellows 1423b extends from the body 1423a and one of the lengths of the bellows 1423b can vary along the first direction. A combination plate 1423c is provided on the body 1423a. .  And is provided at one end of the bellows 1423b. In order to combine the buffer station 1403 with the transmission module 124, first, the length of the bellows 14 is reduced to ~~.  U K At , .  ^, the cancer, medium, and the buffer station 14〇3 is located between the transfer modules 1240. The connection test will be connected to the combination board 1423c combined with the body 1423a.  157792. Doc -17- 201212151 To the transfer module 1240 and using a combination component (not shown) to combine the combination panel 1423c with the transfer module 1240. Next, one of the lengths of the bellows 1423b is increased to connect the combination panel 1423c combined with the bellows 1423b to the other transfer module 1240. Next, the combination plate 1423c and the other transfer module 1240 are combined with each other using a combination member (not shown). As an alternative, unlike Figure 7, the housing may include a bellows on both sides of the body. Also, as an alternative, the entire area of one of the outer casings may also be formed as a bellows. Figure 8 is a perspective view of another example of a buffer station 1404 that can be changed in length. Referring to Figure 8, a housing 1424 can include a first body 1424a, a second body 1424b, and a combination panel 1424c. The second body 1424b is combined with the first body 1424a such that the second body 1424b projects or is inserted into the first body 1424a from the first body 1424a in the first direction 10. That is, one length of the outer casing 1424 can be varied in the first direction 10 by a telescoping method. A composite panel 1424c is provided at both ends of the first and second bodies 1424a and 1424b. To combine the buffer station 1404 with the transport module 1240, first, in a state in which the second body 1424b is inserted into the first body 1424a, the buffer station 1404 is positioned between the transport modules 1240. Next, the combination panel 1424c combined with the first body 1424a is coupled to the transfer module 1240 and the buffer station 1404 and the transfer module 1240 are combined with each other using a combination member (not shown). Thereafter, the second body 1424b protrudes from the first body l424a such that the combination component 1424c provided at the end of the second body 1424b can be coupled to another transfer module 1240 and then buffered using a combination component (not shown) Station 1404 and another transfer module 1240 are grouped 157792 with each other. Doc -18- 201212151. In FIGS. 7 and 8, a sealing member (not shown) may be applied to a contact surface between the combination plate 1423c or 1424c and the transfer module 1240 such that the inside of the transfer module 1240 and the buffer station are sealed from the outside. The inside of the outer casing 1423 or 1424 of 14〇3 or 14〇4. Referring back to Figure 1, according to an embodiment, the process facilities 12A have the same structure as one another. The transfer modules 丨24〇 and the buffer stations 丨4〇〇 connected to each other can be placed along an imaginary line (referred to as a connecting line 5〇). According to an embodiment, the wiring 50 is as a straight line as shown in FIG. Alternatively, the connecting line 50 can have various shapes, such as a capital letter "L" or a large letter "Ding". According to an embodiment, the processing modules 126 of the process facility 12 are sequentially and alternately disposed at one of the first side and the second side of the connecting line 50. Rails 42 are provided to one of the first side and a second side of the connecting line 50 such that the rails 42 face the loading pockets 122 on the first and second sides of the connecting line 50. A return device such as an overhead conveyor 40 is movable along the rail 42. According to an embodiment, the guide 42 provided to the first side of the connector 50 is independent of the rail provided to the second side of the connector 50. As an alternative, the rail 42 provided to the first side of the connecting line and the rail 42 provided to the second side of the connecting line 5 are part of a track. Figure 9 is an enlarged view of one of the three process facilities provided in Figure 1 and a buffer station disposed between the process facilities. For ease of explanation, in Fig. 9, a process facility provided to one of the first sides of the connecting line 5 is referred to as a first facility 12A. Provided to the first facility 1200a one of the loading itch, a transfer module and a processing module are respectively referred to as 157792. Doc S· -19· 201212151 A first loading module 、l22〇a, a first transfer module 124〇& and a first processing module 1260a^ are provided to one of the second side of the connecting line 50 It is called a second facility 1200b. One of the uoobs, a transport module and a processing module are respectively referred to as a second load port 1220b, a second transfer module 1240b and a second process module 1260b. As described above, the first processing module 126a is combined with the third side wall 1255a of the first transfer module 1240a and the second processing module 126b is connected to the third side wall of the second transfer module 1240b. 1255b combination. The third side wall 1255a of the first transfer module 1240a protrudes further from the connection line 50 toward the first processing module 126a from the first side wall 1253b of the second transfer module 1240b. The third side wall 12551 of the second transfer module 12401) protrudes further from the connecting line 5 to the first processing module 1260b than the first side wall 1253a of the first transfer module 1240a. A buffer station 1400 disposed between the first transfer module 1240a and the second transfer module 124A includes a first sidewall 1453, a second sidewall 1454, a second sidewall 1455, and a fourth sidewall 1456. The first side wall 1453 and the second side wall 1455 face each other. The second side wall 1454 and the fourth side wall 1456 face each other. The second side wall 1454 and the fourth side wall 1456 are combined with a first transfer module 1240a and a first transfer module 1240b, respectively. The first side wall 1453 is mounted on a plane extending from the first side wall I253a of the first transfer module 1240a. The second side wall 1455 is disposed on a plane extending from the first side wall 12 5 3 b of the second transfer module 124〇b. A first service space 1800a is surrounded by a portion l7〇Oa, a second load port 1220b, and a buffer station 14 that protrude from the first transfer module 1240a. 157792. Doc -20· 201212151 The first service space 1800a is a worker can be located when the first transfer module 1240a, the load lock chamber 1262a of the first process module 1260a, the buffer station 1400, and the second load port 1220b need to be maintained. A space. Similarly, a second service space 1800b is surrounded by a portion 1700b protruding from the second transfer module 1240b, the first load port 1220a, and a buffer station 1400. The second service space 1800b is a space in which a worker can be located when it is required to maintain the second transfer module 1240b, the load lock chamber 1262b of the second process module 1260b, the buffer station 1400, and the first load port 1220a. According to an embodiment, process facilities 1200a and 1200b have a same size and an identical shape. The maximum width L1 of the processing module 1260 parallel to the first direction 10 may be greater than the maximum width L2 of the corresponding transfer module 1240 that is parallel to the first direction 10. Figure 10 is a diagram illustrating one example of another example of a substrate processing system 2000. Referring to FIG. 10, substrate processing system 2000 includes a process facility 2200 that includes a transfer module 2240 and a buffer station 2400 disposed between adjacent transfer modules 2240. In the substrate processing system 2000 of FIG. 10, the processing modules 2260 of all the processing facilities 2200 are disposed on the top side or the bottom side of the connecting line 50 on which the transfer module 2240 and the buffer station 2400 are disposed. Instead of being placed on both sides of the connecting line 50. In this case, with respect to the connecting line 50, an overhead conveyor 40 and a guide rail 42 for guiding the movement of one of the overhead conveyors 40 are provided only on the opposite side of the side on which the processing module 2260 is provided. For purposes of illustration, Figure 10 shows the processing module 2260 on both sides of the connector 50 to show how the processing modules will be on either side of the connector 50. However, it should be understood that this embodiment refers to all processing modules 157792. Doc -21 - 201212151 2260 is placed on the same side of one of the connecting lines 50. Figure 11 is a diagram illustrating one example of another example of a substrate processing system 3000. Referring to Figure 11, substrate processing system 3000 includes process facilities 3200 and 3201, which include a transfer module 3240 and a buffer station 3400 provided between adjacent transfer modules 3240. Some process facilities 3201 include two processing modules 3262 and 3264 without a load port 3220. For ease of explanation, in FIG. 11, one of the two processing modules is referred to as a first processing module 3262 and the other of the two processing modules is referred to as a second processing module. 3264. The first and second processing modules 3262 and 3264 can have a structure similar to that of the processing module 1260 of FIG. The first and second processing modules 3262 and 3264 share a transfer module 3240. The first processing module 3262, the transmitting module 3240, and the second processing module 3264 are sequentially provided along one of the second directions 2〇. The first and second processing modules 3262 and 3:264 are symmetrically provided with respect to the transport module 3240. In Fig. 11, the first and second processing modules 3262 and 3264 are illustrated to have the same structure. However, as an alternative, the first and second processing modules 3262 and 3264 may have a different structure from each other. The first and second processing modules 3262 and 3 264 can perform the same process on the substrate. As an alternative, the first and second processing modules 3262 and 3264 can perform a different process from the substrate to the substrate. 12 is a diagram illustrating another example of a substrate processing system 4000. Referring to FIG. 12, a substrate processing system 4000 includes process facilities 4201, 4202, 4203, and 4204, which include a transfer module 424. And processing modules 4261, 4262, 4263 and 157792 provided in the buffer station 4400 » process facilities 4201, 4202 ' 4203 and 4204 between adjacent transmission modules 4240. Doc -22- 201212151 4264 has different structures from each other. The processing module 4261 of the process facility 4201 includes a load lock chamber 42 61a, a polygonal transfer chamber 42 61b, and a plurality of process chambers 4261c. The processing module 4262 of the process facility 4202 has one of the load lock chamber 4262a and a process chamber 4262c combined with a transfer chamber 4262b and the load lock chamber 4262a, the transfer chamber 4262b and the process chamber 4262c are along a line along the second direction 20. One structure is provided in order. The processing module 4263 of the process facility 4203 has a structure in which a transfer chamber 4263b having, for example, a square or rectangular shape is combined with a load lock chamber 4263a and a process chamber 4263c disposed around the transfer chamber 4263b. The process module 4264 has a polygonal transfer chamber 4264b and a plurality of process chambers 4264c disposed around the transfer chamber 4264b. The transfer chamber 4264b is directly combined with the transfer module 4244. The structural examples of the processing modules 4261, 4262, 4263, and 4264 illustrated in Figure 12 and the processing modules can have various configurations. In the case of Figure 12, in accordance with an embodiment, the process facility, 42〇2, and 4203 can perform a process on the substrate under vacuum and the process facility 4204 can perform a process on the substrate at atmospheric pressure. In Fig. 12, processing modules 4261, 4262, 4263, and 4264 are provided on both sides of the buffer station 4400 and the connection lines 50 on which the transfer modules 4240 and 4244 are disposed. However, the processing modules 4261, 4262, 4263, and 4264 as described above in connection with Fig. 1A can be provided on one side of the connecting line 50. Figure 13 is a diagram illustrating one example of another example of a substrate processing system 5000. Referring to Figure 13, a substrate processing system 5000 includes process facilities 5200 and 5201, which include a transfer module 5240 and are provided for adjacent transfer 157792. Doc -23- 201212151 Buffer station 5400 between modules 5240. The process facility 5201 includes a transfer module 5240 and a processing module 5260 without a load port 5220. Figure 14 is a diagram illustrating one example of another example of a substrate processing system 6000. Referring to Figure 14, substrate processing system 6000 includes process facilities 6201 and 6202, which include a transfer module 6240 and a buffer station 6400 provided between adjacent transfer modules 6240. The loading cassette 6220 is provided to a processing facility 6201 including a processing module 6260 disposed on a first side of one of the connecting lines 50 on which the transfer module 6240 and the buffer station 6400 are disposed, but the load cassette 6220 is not provided for placement. Process facility 6202 on a second side of one of the connection lines 50. In this case, only one of the overhead conveyor 40 and one of the guided overhead conveyors 40 is provided on the second side of the connecting line 50 to move one of the guide rails 42. In Figures 13 and 14, the processing modules 5200, 5201, 6201, and 6202 have the same structure. However, according to an embodiment, the processing modules 5200, 5201, 6201, and 6202 may have different structures from each other as illustrated in FIG. As an alternative, in FIG. 14, the processing modules disposed on the same side of one of the connecting lines 50 may have the same structure as each other, but have a different processing module from the other side disposed on the other side of the connecting line 50. structure. For example, the processing modules 620 1 may have the same structure as each other, and the processing module 6202 may have a different structure from the processing module 6201, but have the same structure as each other. Figure 15 is a diagram illustrating one example of another example of a substrate processing system 7000. Referring to Figure 15, substrate processing system 7000 includes process facilities 7200 and 7201, which include a transfer module 7240 and a buffer station 7400 provided between adjacent transfer modules 7240. Substrate processing system 7000 further 157792. Doc -24- 201212151 includes a process processing device 7800. The process processing device 7800 is combined with one of the process cartridges 7201. The processing module 7260 and the processing device 7800 of the process facility 7201 in combination with the processing device 7800 are located at opposite sides with respect to the connecting line 50. The process processing unit 7800 is combined with the load cassette 7220 of the two process facilities 7201 at the same time. The buffer station 7400 is not provided between the transfer modules 7240 of the two process facilities 7201 combined with the process processing device 7800. Two process facilities 7201 are adjacent to each other. According to one embodiment, the process processing device 7800 can perform a batch process for a plurality of substrates simultaneously. For example, one of the processes performed in the process processing device 7800 can be a cleaning process or a stripping process. According to an embodiment, as in FIG. 16, the process processing device 7800 can be a device having a structure similar to or identical to that of the device disclosed in FIG. 10 of U.S. Patent Publication No. 2004/0165973, the disclosure of which is common to The assignee of the present application is hereby incorporated by reference. A rotating member 7820 of a vessel 30 including a substrate is provided in the process processing device 7800 in accordance with an internal structure of one of the processing devices 7800. The overhead conveyor 40 places the orphan 30 on the magazine 7220 such that one of the openings of the vessel 30 faces the transfer module 7240. The process processing device 7800 transfers the vessel 30 to the inside of the process processing device 7800, rotates the vessel 30 by 180 degrees, and then unloads the substrate from the vessel. As an alternative, the rotating component of the rotator 30 can be provided on the loading cassette 7220 or the overhead conveyor 40. According to an embodiment, the vessel 30 is moved to process after being placed on the loading cassette 7220 of the processing facility 7201. The device 7800 is moved to a loading port 157792 of another process facility 7201 after completion in a process in the process processing device 7800. Doc -25- 201212151 7220. As an alternative, the substrate can be moved directly to the process processing unit 7800 while the vessel 30 remains on the load cassette 7220. Figure 17 is a diagram illustrating one example of another example of a substrate processing system 8000. Similar to the substrate processing system 7000 of FIG. 15, the substrate processing system 8000 of FIG. 17 includes process facilities 8200 and 8201, and the process facilities include a transfer module 8240, and a buffer station 8400 provided between adjacent transfer modules 8240. , 8401 and process processing device 8800. In the substrate processing system 8000, a buffer station 8401 is provided between the process processing unit 8800 and the transfer module 8240 of the process facility 8201 in combination therewith. According to an embodiment, the buffer station 8401 has a structure similar to that of the buffer stations 1401, 1402 of Fig. 5 or Fig. 6. Figure 18 is a diagram illustrating one example of another example of a substrate processing system 9000. Similar to the substrate processing system 7000 of FIG. 15, the substrate processing system 9000 includes process facilities 9200 and 9201, and the process facilities include a transfer module 9240, a buffer station 9400 provided between adjacent transfer modules 9240, and a process Processing devices 9800, 9801. In substrate processing system 9000, process processor 9801 is combined with load port 9220 of process facility 9200 with process facility 9201 disposed therebetween. Figure 19 is a diagram illustrating one example of another example of a substrate processing system 10000. Similar to the substrate processing system 7000 of FIG. 15, the substrate processing system 10000 includes a process facility 10200 that includes a transfer module 10240, a buffer station 10400 disposed between adjacent transfer modules 10240, and a process processing device 10800. In the substrate processing system 10000, the process processing device 10800 is loaded with a 10220 group of one of the process facilities 10200 157792. Doc -26- 201212151 Process processing device 10800 can perform a diffusion process. . For example - device. For example, the process processing apparatus 1_ as shown in FIG. 2A may be a device having a structure similar to or identical to that of the apparatus disclosed in FIG. 4 of US Laid-Open Patent Publication No. 0255697, the disclosure The patents are commonly assigned to the assignee of the present application and are hereby incorporated by reference. In the process processing apparatus 1800, a rotating member 10820 for rotating a unit including a substrate according to an internal structure of the process processing apparatus 提供8 is provided. The rotating member 1 820 rotates the vessel 3 to rotate the opening of one of the vessels (10) by 180 degrees. As an alternative, the rotating assembly can be provided at a loading cassette 10200 or an overhead conveyor 4". Figure 21 is a diagram showing one example of another example of a substrate processing system 11A. The substrate processing system 11 includes process facilities 1丨2〇丨 and 丨丨202, and the process facilities include transfer modules 11241 and 11242 and buffer stations 114 provided between adjacent transfer modules 11241 and 11242. 〇 and 114〇1. The transfer modules 11241 and 11242 and the buffer station 11401 in the substrate processing system 11 000 have a different combination structure from the transfer module 1240 and the buffer station 1400 of Fig. 1 . Process facilities 11201 and 11202 include transfer modules 241 and 11242 and processing modules 11261 and 11262, respectively. In the process facility 1102, the transfer module 11241 and the processing module 11261 are provided in the second direction 20 with respect to each other. In another process facility 11202, the transfer module 11242 and the process module 1 1262 are provided in a first direction relative to each other. For ease of explanation, in FIG. 21, the transmission module 11241 is referred to as a first transmission module and transmits a mode 157792. Doc •27· 201212151 Group 11242 is called a second transmission module. According to an embodiment, the buffer station 11401 includes a housing 11420 and a buffer member 11440. According to an embodiment, the cushioning member 1 440 has a structure similar to or identical to that of the cushioning member 1440 of Figs. 2 and 3. The housing 1142 includes a top surface (not shown), a bottom surface (not shown), a first side 11423, a second side 11424, a third side 11425, and a fourth side 11426. According to an embodiment, the outer casing 1142 has a rectangular shape or a regular hexahedral shape. The first and third sides 11423 and 11425 face each other and the second and fourth sides 11424 and 11426 face each other. The first side 11423 is perpendicular to the second side 11424. A door (not shown) through which the substrate passes and a door (not shown) that opens and closes the opening are provided at the first side 11423 and the second side π424. The first transfer module 11241 is combined with the first side U423 and the second transfer module 11242 is combined with the second side 11424. A transfer of the substrate between the first transfer module 11241 and the second transfer module 11242 is accomplished through a buffer station U4〇1 disposed between the first and second transfer modules 11241 and 11242. Figure 22 is a diagram illustrating one example of another example of a substrate processing system 12000. Referring to FIG. 22, similar to the substrate processing system 1000 of FIG. 1, the substrate processing system 12000 includes a process facility 122 that includes transfer modules 12241, 12242 and is provided between adjacent transfer modules 12241 and 12242. Buffer station 12400. A loading cassette 12220 is combined with a second side wall UM4 or a fourth side wall 122S6 of the end transfer module 12241, and the transfer modules 12241 and 12242 are provided along the connecting line. Therefore, the load 埠1222〇 is provided at the end of the substrate processing system 12000, and the bee 157792 is loaded. The transfer modules 丨224丨 and i2242 and the buffer station 12400 are sequentially and alternately provided between doc 28-201212151 12220. A returning device through one of the loading pockets 1222 is provided to face one of the rails 42 of the magazine 12220 and a return vessel such as an overhead conveyor 4 is moved along the rail 42. Although the connecting line is not illustrated in Fig. 22, according to an embodiment, the connecting line overlaps the guide rail 42. Figure 23 is a diagram illustrating one example of another example of a substrate processing system 13000. Referring to FIG. 23, similar to the substrate processing system 1 of FIG. 1, the substrate processing system 13000 includes a process facility 132, which includes a transfer module 13240, and is provided between adjacent transfer modules 13240. Buffer station 13400. Similarly, the processing module 1326 is alternately disposed on a first side and a second side of the connecting line. One of the first side wall 13253 adjacent to one of the transport modules 1324 and the third side wall 13255 of the other of the adjacent transport modules 1324 can be located at an equal distance from one of the connecting lines 5〇. Similarly, each of the transfer module 240 and the buffer station 134 can be located at an equal distance from one of the connections 50. In the substrate processing system set forth above, it is stated that all of the process facilities are connected to one another via a buffer station or substrate processing apparatus. According to an embodiment, the red packets are organized into groups, and the process facilities belonging to a group are connected to each other through a buffer station. For example, according to an embodiment, as illustrated in FIG. 24, the process facility 1200 can be grouped into a first group 1a and a second group 1b. The process facilities UOO belonging to the first group l〇〇〇a are connected to each other via the buffer station 14〇〇, and the process facilities (10) belonging to the second group i 000b are connected to each other via the buffer station 1400. One of the substrates including the substrate may be in the first group by a conveyor such as - high, 57792, 00 5 201212151, an automatic guiding vehicle and a track guiding vehicle, or a worker.制a's process facilities 12〇〇, between the process facilities belonging to the second group 1000b 12〇〇 and the process facilities of the first group 1000a丨2〇〇 and the second group i〇0〇b Transfer between process facilities 1200. As illustrated in Figure 25, a buffer station is not connected to one or a plurality of process facilities 1209 are independently provided between the first group 1 & and the second group 1000b. As illustrated in Figure 26, a plurality of substrate processing systems such as, for example, the substrate processing systems of Figure 1 or Figure 24 can be provided. The substrate processing systems can be parallel to one another in a second direction and can be separated from each other. A substrate processing system having the same structure as the embodiment of FIG. i is illustrated in FIGS. 24 to 26, but as shown in the other embodiments illustrated in FIGS. 24 to 26 The processing system can be placed in groups and/or placed with other substrate systems. Referring to Figures 27 through 29, an example of a method of performing a process on a substrate using a substrate processing system including a buffer station will be described. For ease of explanation, the process facilities illustrated in FIGS. 27 to 29 are sequentially referred to as first process facilities 14201, 15201, and 16201, second process facilities 14202, 15202, and 16202, and third, respectively, from left to right. Process facilities 142〇3, 152〇3 and 16203. Similarly, one of the transfer modules provided to one of the first process facilities 14201, 15201, and 16201 and the first process facility 142 (the processing modules of one of H, 15201, and 16201 are respectively referred to as first transfer robots 14271, 15271, respectively. And 16271 and the first processing modules 14261, 15261 and 157792. Doc •30· 201212151 16261. One of the transfer robots provided to one of the second process facilities 14202, 15202, and 16202 and one of the second process facilities 14202, 15202, and 16202 are referred to as second transfer robots 14272, 15272, and 16272, respectively. Two processing modules 14262, 15262 and 16262. One of the transfer robots provided to one of the third process facilities 14203, 15203, and 16203 and one of the third process facilities 14203, 15203, and 16203 are referred to as third transfer robots 14273, 15273, and 16273, respectively. Three processing modules 14263, 15263 and 16263. Similarly, the buffer stations illustrated in Figures 27 through 29 are sequentially referred to as first buffer stations 14401, 15401, and 16401 and second buffer stations 14402, 15402, and 16402, respectively, from left to right. In Fig. 29, one of the additional process facilities illustrated at the far right portion of the page is referred to as a fourth process facility 16204. One of the transfer robots provided to the fourth process facility 16204 and the process module of the fourth process facility 16204 are referred to as a fourth transfer robot 16274 and a fourth processing module 16264, respectively. One of the buffer stations illustrated at the far right portion of the page is referred to as a third buffer station 16403. One example of the twenty-five substrates placed in a vessel 30 is illustrated as an example, but the number of substrates may be more or less than 25. The twenty-five substrates placed in the vessel 30 are sequentially referred to as a first substrate, a second substrate, and a second substrate. . . , a twenty-fifth substrate. Figure 27 illustrates a route of a substrate in a substrate processing system 14000 in which process facilities 14201, 14202, and 14203 performing the same process are coupled to one another via buffer stations 14401 and 14402. Four process chambers 14266 are 5 157792. Doc -31 - 201212151 is provided to the first process facility 14201, the second process facility 142〇2, and the third process. The same process is performed in each of the four 14203s and in each of the four process chambers 14266. Thus, twelve process chambers 14266 that perform the same process are provided in the substrate processing system 14. According to an embodiment, among the twenty-five substrates, the fourth to the fourth substrate, the thirteenth to sixteenth substrates, and the twenty-fifth substrate are performed in the first processing module Process. Performing processes for the fifth to eighth substrates and the seventeenth to tenth substrates in the second processing module 14262 and performing the ninth to twelfth substrates in the third processing module i4263 and One of the twenty-first to twenty-fourth substrates. In FIG. 27, "2", & 3, and & 4 sequentially represent one of the substrates on which the first processing module UMi_ executes a process, ...^(4)(4) is sequentially indicated in the second processing module In the chest for the execution-process substrate - route Μ, e2n4 order is represented in the processing module! 4263 t One of the substrates for which the process-process is performed. The vessel 3 comprising the substrate is placed on the loading cassette 14221 by an overhead conveyor such as the first process. The first transfer robot 14271 transfers the substrate self-vehicle 3G for which execution is performed in the first processing module 14261 to the first processing module i426i and will be targeted in the second processing unit 14262 and the third processing mode. The substrate carrying the process is transferred from the device to the first buffer station. Similarly, the first transfer robot 14271 transfers the substrate that has been processed for the process in the first processing module to the first buffer station. 14401. 157792. Doc -32· 201212151 According to an embodiment, if all the substrates are taken out of the vessel 30, the vessel 3〇 is transferred to one of the third process facilities i4203 to load the crucible 14223. The second transfer robot 14272 transfers the substrate for which a process is executed in the second processing module 14262 from the first buffer station 144〇1 to the second processing module 14262 and will be at the third processing module 14263. The substrate for which a process is performed is transferred from the first buffer station 144〇1 to the second buffer station 14402. Similarly, the first transfer robot 14272 transfers the substrate for which a process has been completed in the first processing module 14261 from the first buffer station (1) to the second buffer station 14402 and will have been in the second processing mode. The substrate for group 1262 for which a process is completed is transferred from the second processing module 14262 to the second buffer station 14402. The second transfer robot 14273 transfers the substrate for which a process is executed in the third processing module 14263 from the second buffer station 144〇2 to the third processing module 14263. Similarly, the third transfer robot 14273 transfers the substrate for which a process has been completed in the first processing module 1426 1 and the second processing module 丨 4262 from the second buffer station 144 〇 2 to the third process. The vessel 14 of the facility 14203 is loaded on the crucible 14223. The third transfer robot 14273 transfers the substrate for which a process has been completed in the third process module 丨4 2 6 3 from the third process module 14263 to the third process facility 们 "the loader 14223" The vessel 30 is transported from the vessel 30 to the first buffer station 144〇1, from the first buffer station 14401 to the second buffer station 144〇2 and from the second buffer station 14402 to the vessel 30. Each of the first, second, and third robots i427i, 14272, and 14273 can simultaneously transmit a plurality of substrates. 157792. Doc 5 •33- 201212151 According to the method of processing the substrate of FIG. 27, in a plurality of process facilities 142〇1, 142〇2, and 142〇3, the process can be simultaneously assigned to the process facilities 142〇1, 14202, and 14203. The substrate of each of them performs the process, thereby reducing the time required to perform a process for supplying all of the substrate to the vessel 30. Figure 28 illustrates one of the routes of the substrate in the substrate processing system 15 . The process facilities 15201, 15202, and 15203 each perform a different process, and are connected to each other through the buffer stations 15401 and 15402. The first process facility 15201, the second process facility ls2〇2, and the third process facility i52〇3 are a substrate. The process is executed sequentially. In Fig. 28, di, 、, d3, d4, d5 and d6 sequentially represent one of the routes of the substrates. In the substrate processing system 15000 of FIG. 28, a first processing module 15261, a second processing module 15262, and a third processing module 丨 5263 are sequentially executed on the substrate provided to the device. Process. First, the vessel 3 including the substrate is placed on the loading port 15221 of the first process facility lWO1 by the overhead conveyor 40. A first transfer robot 1 5271 transfers the substrate from the vessel 3 to the first processing module 15261. According to an embodiment, if all of the substrates in the vessel 3 are processed by the first processing module 15261', the vessel 3 is transported by the overhead conveyor 4 to the loading chamber 15223 of the third process facility 152〇3. First, the substrate for which a process has been completed in the first processing module 15261 is transferred to the first buffer station ΐ54〇 by the first transfer robot 15271. A second transfer robot 15272 transfers the substrate in the first buffer station 154〇1 to the first processing module 15262. Will have been completed in the second processing module 15262 for it 157792. Doc -34· 201212151 The substrate of the integrated process is transferred to the second buffer station 15402. A third transfer robot 15273 transfers the substrate in the second buffer station 15402 to the third processing module 15263. The substrate for which a process has been completed in the third processing module 15263 is transferred to the vessel 30. According to one embodiment, certain substrates can pass through system 15000 faster than other substrates. Therefore, other substrates can be processed after processing the substrates in the substrates. According to the method of processing the substrate of Fig. 28, since the buffer stations 15401 and 154〇2 can be used to move the substrates independently of each other between the process facilities i52〇1, mo2 and i52〇3, there is no need to wait until the device is alone. All other substrates in the crucible can perform another process on a substrate by performing a specific process. Similarly, since the substrates can be independently transferred to the process facilities 15201, 15202, and 15203 through the buffer stations 15401 and 15402, as compared to when the overhead conveyor 40 is used to transfer substrates between the process facilities 15201, 15202, and 15203. , can reduce the time required to transfer the substrate. Figure 29 illustrates one of the routes of the substrate in the substrate processing system 16 . The process facilities 162〇1, 162〇2, 16203, and 16204 perform the same process as each other or processes different from each other and are connected to each other through the buffer stations 164〇1, 164〇2, and 164〇3. For example, according to an embodiment, the first and third process facilities 16201 and 16203 perform the same process for each other on the substrate. The second and fourth process facilities 16202 and 16204 perform a process different from the first and third process facilities, and perform the same process for the substrates. Also, according to an embodiment, the second process facility 162 对 2 performs a process for the substrate relative to the process performed in the first process facility 16201 for a subsequent process. 157792. Doc 5 •35· 201212151 Four process rooms 16266 are supplied to each of the first process facility 162〇1 and the third process facility 16203. Adding to the two systems 16267 is provided to each of the second process facility (10) 2 and the fourth process facility _4. According to a conventional example, one of the processes required to perform a process for one of the process chambers of the second process facility 162()2 is 拄„high time comparable to the process room 16266 of the first process facility 16201. The substrate is executed - the time required for the process is small. Among the twenty-five substrates, the first to the fourth substrate are sequentially executed in the first processing die (four) and the second processing module 16262. 9 to 10 soil materials, a process of one of the seventeenth to twentieth substrates and the twenty-fifth substrate. The fifth to eighth bases are sequentially executed in the third processing module 14263 and the fourth processing module (6) a material, a thirteenth to sixteenth substrate, and one of the twenty first to twenty-fourth substrates. In FIG. 29, the el, e2, e3, e4, e5, and e6 sequence tables are not in the first processing module (6) and the second processing module 16262 for the substrate-execution-process route and fl, f2. The f3, and f6 sequences represent one route of the substrate for which the third processing module (10) recognizes the fourth processing module 16264 for performing a process. The container including the substrate 30 is placed on the overhead conveyor 4 One of the first process facilities 16201 is loaded on the 埠ι 6221. The first transfer robot 16271 will transfer the substrate from the first process module 16261 and the second process module 16262 to the first process to the first process. The module 16261 will transfer the substrate-to-vehicle % for performing the process in the third processing module 16263 and the fourth processing module 6264 to the first buffer station 164〇1. Similarly, the first transfer robot 16271 will transfer the substrate in the first processing module 16261 for which a process is completed to 157792. Doc • 36 - 201212151 First buffer station 16401. According to one embodiment, if all of the substrate is detached by the extractor 30, the vessel 30 is transferred to one of the fourth process facilities 16204 for loading 埠 16224. The second transfer robot 16272 transfers the substrate for which a process is executed in the third processing module 16263 and the fourth processing module 1626 from the first buffer station 16401 to the second buffer station 16402. Similarly, the second transfer robot 16272 transfers the substrate for which a process has been completed in the first processing module 16261 from the first buffer station 16401 to the second processing module 16262 and will be in the second processing module 1 The substrate for which a process is completed in 6262 is transferred from the second processing module 16262 to the third buffer station 16403. The third transfer robot 16273 transfers the substrate for which a process is executed in the third processing module 16263 and the fourth processing module 16264 from the second buffer station 16402 to the third processing module 16263. Similarly, the third transfer robot 16273 transfers the substrate from which the process has been completed in the second processing module 16262 from the second buffer station 16402 to the third buffer station 16403. The third transfer robot 16273 transfers the substrate for which a process has been completed in the third processing module 16263 to the third buffer station 16403. The fourth transfer robot 16274 transfers the substrate for which a process has been completed in the third processing module 16263 from the third buffer station 1 6403 to the fourth processing module 16264. Similarly, the fourth transfer robot 16274 transfers the substrate for which a process has been completed in the fourth processing module 16264 from the fourth processing module 16264 to the load port 16224 placed on the fourth process facility 16204. . The fourth transfer robot 16274 transmits the substrate for which a process has been completed in the second processing module 16262 from the third buffer station 16403.

S 157792.doc -37- 201212151 送至放置於第四製程設施16204之裝載埠16224上之器皿 30 〇 根據本發明概念之實施例,可有效地執行製程設施之間 的一基材傳送。 根據本發明概念之實施例,可有效地使用其中安裝有複 數個製程設施之清潔房間之一有限空間。 儘管上文中已闡述本發明概念之例示性實施例,但應理 解’本發明概念並不限於此等實施例,而熟悉此項技術者 可在不背離本發明概念之精神及範疇之情形下做出修改。 【圖式簡單說明】 圖1係圖解說明一基材處理系統之一實例之一平面俯視 圖。 圖2係圖解說明一傳送模組及一缓衝台站之内部結構之 一剖視圖。 圖3係圖解說明圖2之一緩衝部件之一實例的一透視圖。 圖4係圖解說明圖2之緩衝部件之另一實例的一透視圖。 圖5係圖解說明圖1之一緩衝台站之一實例的一透視圖。 圖6係圖解說明圖!之緩衝台站之另一實例的一平面俯視 圖。 圖7及圖8係分別圖解說明圖1之緩衝台站之其他實例之 透視圖。 圖9係用於闡述一基材處理系統中之一傳送模組之一形 狀的一圖式。 圖10至圖15係分別圖解說明一基材處理系統之其他實例 157792.doc -38- 201212151 之平面俯視圖。 圖16圖解說明圖15之一基材處理裝置之一實例。 圖17至圖19係分別圖解說明一基材處理系統之其他實例 之平面俯視圖。 圖20係圖解說明圖19之一基材處理裝置之一實例的—圖 式。 圖21至圖23係圖解說明一基材處理系統之其他實例之平 面俯視圖。 圖24至圖26係圖解說明複數個基材處理系統之一實例之 平面俯視圖。 圖27至圖29分別圖解說明一基材處理系統中一基材之返 迴路線。 【主要元件符號說明】 30 器皿 40 返回裝置 42 導軌 50 連接線 1000 基材處理系統 1200 製程設施 1200a 第一設施 1200b 第二設施 1209 製程設施 1220 裝載埠 1220a 第一裝載埠 1220b 第二裝載埠S 157792.doc -37- 201212151 A vessel that is placed on a load magazine 16224 placed on a fourth process facility 16204. 30 In accordance with an embodiment of the inventive concept, a substrate transfer between process facilities can be efficiently performed. According to an embodiment of the inventive concept, a limited space of one of the clean rooms in which a plurality of process facilities are installed can be effectively used. Although the exemplary embodiments of the present invention have been described above, it should be understood that the concept of the present invention is not limited to the embodiments, and those skilled in the art can do without departing from the spirit and scope of the inventive concept. Make a change. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a plan view showing one of an example of a substrate processing system. Figure 2 is a cross-sectional view showing the internal structure of a transfer module and a buffer station. Figure 3 is a perspective view illustrating an example of one of the cushioning members of Figure 2. 4 is a perspective view illustrating another example of the cushioning member of FIG. 2. Figure 5 is a perspective view illustrating an example of one of the buffer stations of Figure 1. Figure 6 is a graphical illustration! A plan top view of another example of a buffer station. 7 and 8 are perspective views respectively illustrating other examples of the buffer station of Fig. 1. Figure 9 is a diagram for explaining the shape of one of the transfer modules in a substrate processing system. Figures 10 through 15 are plan top views each illustrating another example of a substrate processing system 157792.doc -38 - 201212151. Figure 16 illustrates an example of a substrate processing apparatus of Figure 15. 17 through 19 are plan top views respectively illustrating other examples of a substrate processing system. Figure 20 is a diagram showing an example of one of the substrate processing apparatuses of Figure 19. 21 to 23 are plan top views illustrating other examples of a substrate processing system. 24 through 26 are plan top views illustrating an example of a plurality of substrate processing systems. Figures 27 through 29 illustrate a return path for a substrate in a substrate processing system, respectively. [Main component symbol description] 30 Ware 40 Return device 42 Guide rail 50 Connection line 1000 Substrate processing system 1200 Process facilities 1200a First facility 1200b Second facility 1209 Process facilities 1220 Loading 埠 1220a First loading 埠 1220b Second loading 埠

S 157792.doc -39- 201212151 1240 傳送模組 1240a 第一傳送模組 1240b 第二傳送模組 1242 傳送機器人 1244 手 1246 導軌 1250 外殼 1251 頂表面 1252 底表面 1253 第一側 1253b 第一側壁 1254 第二側 1255 第三側 1255a 第三側壁 1255b 第三側壁 1256 第四側 1257 開口 1258 門 1260 處理模組 1260a 第一處理模組 1260b 第二處理模組 1262 裝載鎖定室 1262a 裝載鎖定室 1262b 裝載鎖定室 157792.doc -40- 201212151 1264 傳送室 1266 製程室 1268 傳送機器人 1269 手 1400 缓衝台站 1401 緩衝台站 1402 緩衝台站 1403 緩衝台站 1404 緩衝台站 1420 外殼 1421 外殼 1422 外殼 1423 外殼 1423a 本體 1423b 風箱 1423c 組合板 1424 外殼 1424a 第一本體 1424b 第二本體 1424c 組合板 1440 缓衝部件 1441 組合板 1442 本體 1442a 第一缓衝部件 157792.doc -41 - 201212151 1442b 第二緩衝部件 1444 緩衝墊 1444a 板 1444b 板 1445 緩衝墊 1453 第一側壁 1454 第二侧壁 1455 第三側壁 1456 第四側壁 1460 緩衝驅動部件 1461 導軌 1462 基座 1480 返回部件 1481 導軌 1482 傳送機器人 1483 手 1700a 一部分 1700b 一部分 1800a 第一服務空間 1800b 第二服務空間 2000 基材處理系統 2200 製程設施 2240 傳送模組 2400 緩衝台站 -42- 157792.doc 201212151 3000 基材處理系統 3200 製程設施 3201 製程設施 3220 裝載埠 3240 傳送模組 3262 第一處理模組 3264 苐二處理核組 3400 緩衝台站 4000 基材處理系統 4201 製程設施 4202 製程設施 4203 製程設施 4204 製程設施 4240 傳送模組 4244 傳送模組 4261 處理模組 4261a 載鎖室 4261b 多邊形傳送室 4261c 製程室 4262 處理模組 4262a 裝載鎖定室 4262b 傳送室 4262c 製程室 4263 處理模組 5 157792.doc -43- 201212151 4263a 裝載鎖定室 4263b 傳送室 4263c 製程室 4264 處理模組 4264b 多邊形傳送室 4264c 製程室 4400 缓衝台站 5000 基材處理系統 5200 製程設施 5201 製程設施 5220 裝載槔 5240 傳送模組 5260 處理模組 5400 緩衝台站 6000 基材處理糸統 6201 製程設施 6202 製程設施 6220 裝載埠 6240 傳送模組 6260 處理模組 6400 緩衝台站 7000 基材處理系統 7200 製程設施 7201 製程設施 157792.doc -44- 201212151 7220 裝載埠 7240 傳送模組 7260 處理模組 7400 緩衝台站 7800 製程處理裝置 7820 旋轉部件 8000 基材處理系統 8200 製程設施 8201 製程設施 8240 傳送模組 8400 缓衝台站 8401 緩衝台站 8800 製程處理裝置 9000 基材處理系統 9200 製程設施 9201 製程設施 9220 裝載埠 9240 傳送模組 9400 緩衝台站 9800 製程處理裝置 9801 製程處理裝置 10000 基材處理系統 10200 製程設施 10220 裝載埠 157792.doc -45- 201212151 10240 傳送模組 10400 缓衝台站 10800 製程處理裝置 10820 旋轉部件 11000 基材處理系統 11201 製程設施 11202 製程設施 11241 傳送模組 11242 傳送模組 11261 處理模組 11262 處理模組 11400 緩衝台站 11401 缓衝台站 11420 外殼 11423 第一側 11424 第二側 11425 第三側 11426 第四側 11440 緩衝部件 12000 基材處理系統 12200 製程設施 12220 裝載埠 12241 傳送模組 12242 傳送模組 157792.doc -46- 201212151 12254 第二側壁 12256 第四側壁 12400 缓衝台站 13000 基材處理系統 13200 製程設施 13240 傳送模組 13253 第一侧壁 13255 第三侧壁 13260 處理模組 13400 緩衝台站 14000 基材處理系統 14201 第一製程設施 14202 第二製程設施 14203 第三製程設施 14221 裝載埠 14223 裝載埠 14261 第一處理模組 14262 第二處理模組 14263 第三處理模組 14266 製程室 14271 第一傳送機器人 14272 第二傳送機器人 14273 第三傳送機器人 14401 第一緩衝台站 -47- 157792.doc 201212151 14402 第二缓衝台站 15000 基材處理系統 15201 第一製程設施 15202 第二製程設施 15203 第三製程設施 15221 裝載埠 15223 裝載埠 15261 第一處理模組 15262 第二處理模組 15263 第三處理模組 15271 第一傳送機器人 15272 第二傳送機器人 15273 第三傳送機器人 15401 第一缓衝台站 15402 第二缓衝台站 16000 基材處理系統 16201 第一製程設施 16202 第二製程設施 16203 第三製程設施 16204 第四製程設施 16221 裝載埠 16224 裝載埠 16261 第一處理模組 16262 第二處理模組 -48- 157792.doc 201212151 16263 第三處理模組 16264 弟四處理核組 16266 製程室 16267 製程室 16271 第一傳送機器人 16272 第二傳送機器人 16273 第三傳送機器人 16274 第四傳送機器人 16401 第一缓衝台站 16402 第二緩衝台站 16403 第三缓衝台站 157792.doc -49-S 157792.doc -39- 201212151 1240 Transfer Module 1240a First Transfer Module 1240b Second Transfer Module 1242 Transfer Robot 1244 Hand 1246 Rail 1250 Housing 1251 Top Surface 1252 Bottom Surface 1253 First Side 1253b First Side Wall 1254 Second Side 1255 third side 1255a third side wall 1255b third side wall 1256 fourth side 1257 opening 1258 door 1260 processing module 1260a first processing module 1260b second processing module 1262 load lock chamber 1262a load lock chamber 1262b load lock chamber 157792 .doc -40- 201212151 1264 Transfer Room 1266 Process Room 1268 Transfer Robot 1269 Hand 1400 Buffer Station 1401 Buffer Station 1402 Buffer Station 1403 Buffer Station 1404 Buffer Station 1420 Housing 1421 Housing 1422 Housing 1423 Housing 1423a Body 1423b Wind Box 1423c Combination plate 1424 Housing 1424a First body 1424b Second body 1424c Combination plate 1440 Buffer member 1441 Combination plate 1442 Body 1442a First cushioning member 157792.doc -41 - 201212151 1442b Second cushioning member 1444 Cushion 1444a Plate 1444b Board 1445 Punch pad 1453 first side wall 1454 second side wall 1455 third side wall 1456 fourth side wall 1460 buffer drive part 1461 rail 1462 base 1480 return part 1481 rail 1482 transfer robot 1483 hand 1700a part 1700b part 1800a first service space 1800b second Service Space 2000 Substrate Processing System 2200 Process Facilities 2240 Transfer Module 2400 Buffer Station - 42- 157792.doc 201212151 3000 Substrate Processing System 3200 Process Facilities 3201 Process Facilities 3220 Loading 埠 3240 Transfer Module 3262 First Processing Module 3264苐二处理核组3400 Buffer station 4000 Substrate processing system 4201 Process facility 4202 Process facility 4203 Process facility 4204 Process facility 4240 Transfer module 4244 Transfer module 4261 Processing module 4261a Load lock chamber 4261b Polygon transfer chamber 4261c Process chamber 4262 Processing module 4262a Load lock chamber 4262b Transfer chamber 4262c Process chamber 4263 Process module 5 157792.doc -43- 201212151 4263a Load lock chamber 4263b Transfer chamber 4263c Process chamber 4264 Processing module 4264b Polygon transfer 4264c Process Room 4400 Buffer Station 5000 Substrate Processing System 5200 Process Facilities 5201 Process Facilities 5220 Loading 240 5240 Transfer Module 5260 Processing Module 5400 Buffer Station 6000 Substrate Processing System 6201 Process Facilities 6202 Process Facilities 6220 Loading 埠 6240 Transfer Module 6260 Processing Module 6400 Buffer Station 7000 Substrate Processing System 7200 Process Facility 7201 Process Facilities 157792.doc -44- 201212151 7220 Loader 7240 Transfer Module 7260 Process Module 7400 Buffer Station 7800 Process Processor 7820 Rotation Parts 8000 Substrate Processing System 8200 Process Facilities 8201 Process Facilities 8240 Transfer Module 8400 Buffer Station 8401 Buffer Station 8800 Process Processing Unit 9000 Substrate Processing System 9200 Process Facilities 9201 Process Facilities 9220 Loading 埠 9240 Transfer Module 9400 Buffer Table Station 9800 Process Processing Device 9801 Process Processing Device 10000 Substrate Processing System 10200 Process Facilities 10220 Loading 埠 157792.doc -45- 201212151 10240 Transmission Module 10400 Buffer Station 10800 Process Processing Device 10820 Rotation 11000 Substrate Processing System 11201 Process Facilities 11202 Process Facilities 11241 Transfer Module 11242 Transfer Module 11261 Process Module 11262 Process Module 11400 Buffer Station 11401 Buffer Station 11420 Housing 11423 First Side 11424 Second Side 11425 Third Side 11426 Fourth side 11440 Buffer parts 12000 Substrate processing system 12200 Process facilities 12220 Loading 241 12241 Transfer module 12242 Transfer module 157792.doc -46- 201212151 12254 Second side wall 12256 Fourth side wall 12400 Buffer station 13000 Substrate processing System 13200 Process Facilities 13240 Transfer Module 13253 First Side Wall 13255 Third Side Wall 13260 Process Module 13400 Buffer Station 14000 Substrate Processing System 14201 First Process Facility 14202 Second Process Facility 14203 Third Process Facility 14221 Load 埠 14223 Loading cassette 14261 first processing module 14262 second processing module 14263 third processing module 14266 processing chamber 14271 first transfer robot 14272 second transfer robot 14273 third transfer robot 14401 first buffer station -47- 157792.doc 201212151 144 02 Second buffer station 15000 Substrate processing system 15201 First process facility 15202 Second process facility 15203 Third process facility 15221 Loading port 15223 Loading port 15261 First processing module 15262 Second processing module 15263 Third processing mode Group 15271 first transfer robot 15272 second transfer robot 15273 third transfer robot 15401 first buffer station 15402 second buffer station 16000 substrate processing system 16201 first process facility 16202 second process facility 16203 third process facility 16204 Fourth Process Facility 16221 Loading 埠16224 Loading 埠16261 First Processing Module 16262 Second Processing Module-48- 157792.doc 201212151 16263 Third Processing Module 16264 弟四处理核组16266 Process Room 16267 Process Room 16271 A transfer robot 16272 a second transfer robot 16273 a third transfer robot 16274 a fourth transfer robot 16401 a first buffer station 16402 a second buffer station 16403 a third buffer station 157792.doc -49-

Claims (1)

201212151 七、申請專利範圍: 1. 一種基材處理系統,其包含: 一第一傳送模組,其包括一第一傳送機器人; 一第二傳送模組,其包括一第二傳送機器人; 一第一緩衝台站,其安置於該第一傳送模組與該第二 傳送模組之間; 一第一處理模組,其與該第一傳送模組組合,其中該 第一處理模組係安置於沿其中配置該第一傳送模組、該 第一緩衝台站及該第二傳送模組之一方向延伸之一假想 線之一第一側上; 一第二處理模組,其與該第二傳送模組組合,其中該 第二處理模組係安置於該假想線之一第二側上, 其中該第一傳送模組比該第二傳送模組向該假想線之 該第一側突出地更遠。 2·如請求項1之基材處理系統’其進一步包含: 一第二傳送模組,其包括一第三傳送機器人,其中該 第二傳送模組係相對於該第二傳送模組而與該第一傳送 模組相對安置; 一第二緩衝台站,其安置於該第二傳送模組與該第三 傳送模組之間; 一第三處理模組,其安置於該假想線之該第一側上且 與該第三傳送模組組合, 其中該第三傳送模組比該第二傳送模組向該連接線之 該第一侧突出地更遠。 157792.doc 5 201212151 3.如請求項2之基材處理系統,其中該第二傳送模組比該 第一傳送模組及該第三傳送模組向該假想線之該第二侧 突出地更遠。 4.如凊求項3之基材處理糸統,其中該第一傳送模組比該 第一緩衝台站向該假想線之該第一側突出地更遠,且其 中該弟一傳送模組比該第一缓衝台站、該第二緩衝台 站 '該第一傳送模組及該第三傳送模組向該假想線之該 第二側突出地更遠》 5.如請求項4之基材處理系統,其中該第一傳送模組向該 假想線之該第二側突出之—距離等於該第一傳送模組向 該第一緩衝台站及該第二緩衝台站突出之一距離,且其 中该第二傳送模組向該假想線之該第一侧突出之一距離 等於該第二傳送模經向該第一緩衝台站及該第二緩衝台 站突出之一距離。 6. 如請求項2之基材處理系統,其進一步包含: 至少一個第一裝載埠,其位於該假想線之該第二侧 ^ ’其中該第—裝载埠係與該第—傳送模組組合且包括 一基材之—器皿係放置於該第一裝載埠上; 至;一#第三裝载埠,其位於該假想線之該第二侧 上—其中$第三裝载埠係與該第三傳送模組組合,且包 括基材之-H皿係放置於該第三裝載淳上; 女置以面向該第一裝載埠及該 裝載埠且弓丨導將肖括萁 〇〇 一 匕括基材之一盗皿傳送至該等第一 二裝載埠之—傳送裝置之移動。 157792.doc -2- 201212151 如請求項6之基材處理系統,其進一步包含·· 至少-個第二裝载埠’其位於該假想線之該第一側 上’其中該第二裝載埠係與該第二傳送模組組合且包 括一基材之一器皿係放置於該第二裝载埠上;及 -第二導軌’其經安置以面向該第二裝載璋且引導將 包括基材之-器皿傳送至該第二裝载埠之一傳送裝置之 移動》 8. 如請求項2之基材處理系統,其中該第二處理模組之一 寬度比該第二傳送模組之一寬度大。 9. 如請求項8之基材處理系統,其令該第一傳送模組、該 第二傳送模組及該第三傳送模組具有—相同大小及一相 同形狀,且其中該第一處理模組、該第二處理模組及該 第三處理模組具有一相同大小及一相同形狀。 10. 如睛求項2之基村處理系统,其中該第二處理模組之一 寬度比該第二傳送模組之—寬度、該第—緩衝台站之一 寬度及該第二緩衝台站之一寬度的總和大。 S 157792.doc201212151 VII. Patent application scope: 1. A substrate processing system, comprising: a first transfer module comprising a first transfer robot; a second transfer module comprising a second transfer robot; a buffer station disposed between the first transmission module and the second transmission module; a first processing module combined with the first transmission module, wherein the first processing module is disposed And a first processing module, wherein the first processing module, the first buffer station, and the second transmitting module extend one of the imaginary lines a second transmission module, wherein the second processing module is disposed on a second side of the imaginary line, wherein the first transmission module protrudes from the first side of the imaginary line than the second transmission module Farther away. 2. The substrate processing system of claim 1 further comprising: a second transfer module comprising a third transfer robot, wherein the second transfer module is associated with the second transfer module The first transfer module is disposed opposite to each other; a second buffer station is disposed between the second transfer module and the third transfer module; and a third processing module is disposed on the imaginary line And being combined with the third transmission module on one side, wherein the third transmission module protrudes farther from the first side of the connection line than the second transmission module. 157792.doc 5 201212151 3. The substrate processing system of claim 2, wherein the second transfer module protrudes more than the first transfer module and the third transfer module toward the second side of the imaginary line far. 4. The substrate processing system of claim 3, wherein the first transfer module protrudes farther from the first side of the imaginary line than the first buffer station, and wherein the first transfer module More than the first buffer station, the second buffer station 'the first transmission module and the third transmission module protrude further toward the second side of the imaginary line" 5. As claimed in claim 4 a substrate processing system, wherein the first transfer module protrudes toward the second side of the imaginary line - a distance equal to a distance from the first transfer module to the first buffer station and the second buffer station And wherein the distance from the second transmitting module to the first side of the imaginary line is equal to a distance from the second transmitting mode to the first buffer station and the second buffer station. 6. The substrate processing system of claim 2, further comprising: at least one first loading cassette located on the second side of the imaginary line, wherein the first loading cassette and the first transmitting module Combining and including a substrate - a vessel is placed on the first loading cassette; to; a #3 loading magazine on the second side of the imaginary line - wherein the third loading system is The third transfer module is combined, and the -H dish comprising the substrate is placed on the third loading cassette; the female is placed facing the first loading cassette and the loading cassette and the bow guide is The movement of one of the substrates is transmitted to the first two loading cassettes. The substrate processing system of claim 6, further comprising: And a second carrier coupled to the second transfer module and comprising a substrate disposed on the second loading cassette; and a second rail disposed to face the second loading cassette and guiding the substrate to be included - a movement of the vessel to the transport device of the second loading cassette. 8. The substrate processing system of claim 2, wherein one of the second processing modules has a width greater than a width of the second transport module . 9. The substrate processing system of claim 8, wherein the first transfer module, the second transfer module, and the third transfer module have the same size and an identical shape, and wherein the first processing mode The group, the second processing module and the third processing module have the same size and an identical shape. 10. The base village processing system of claim 2, wherein a width of one of the second processing modules is greater than a width of the second transfer module, a width of the first buffer station, and the second buffer station The sum of one width is large. S 157792.doc
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