TW201207613A - IEEE1394 interface tester - Google Patents

Abstract

An IEEE1394 interface tester includes an IEEE1394 chip, an IEEE1394 plug, an IEEE1394 outlet, a switch module, and a test head. The plug, the outlet, and the chip each include two pairs of differential signal pins. The test head includes two pairs of differential signal test holes. The two pairs of differential signal pins of the chip are connected to the two pairs of differential signal test holes. The switch module is connected between the chip and the plug, the outlet, to selectively connect the two pairs of differential signal pins of the chip to the two pairs of differential signal pins of the plug or the outlet.

Description

201207613 VI. Description of the Invention: [Technical Field of the Invention] [0001] The present invention relates to a test apparatus, particularly a test apparatus for testing an IEEE 1394 interface on an electronic product. [0002] [Prior Art] At present, many electronic products have an IEEE1 394 interface, which is a serial interface standard, which is developed by the IEEE---Institute of Electrical and Electronics Engineers, the Institute of Electrical and Electronics Engineers. This standard is the 1394 standard document of the Association, so it is called IEEE1394. In the electronic product development phase or pre-shipment testing phase, the IEEE1 394 interface on the electronic product needs to be tested to verify compliance with the IEEE1 394 specification. [0003] The usual test method is to purchase an IEEE1394 device conforming to the IEEE1394 specification (such as IEEE1394 hard disk). The IEEE1394 interface of the electronic device to be tested is connected to the IEEE1394 interface of the IEEE1394-compliant IEEE1394 device through a test card. Get up, then squat on the test card to lead out the IEEE1394tTl line, do a ground loop, and then use the probe of the test instrument to detect. However, the above method requires the purchase of an IEEE1394 device conforming to the IEEE1394 specification in advance, so the test cost is high. In addition, a long line is required between the IEEE1394 interface for testing the electronic device to be tested and the IEEE 1394 device conforming to the IEEE 1394 specification. Only when connected, there may be signal reflections that may result in inaccurate testing. [0004] In view of the above, it is necessary to provide a high precision and low cost 099126397 Form No. A0101 Page 3 / Total 12 Page 0992046318-0 201207613 IEEE1 394 interface test device. [0005] An IEEE1394 interface test apparatus includes an IEEE1394 chip, an IEEE1394 plug, an IEEE1 394 socket, a switch module, and at least one test head. The IEEE1 394 plug 'IEEE1 394 socket and IEEE 13 94 chip each include one The grounding pin, the two pairs of differential signal pins, and one power pin, the test head includes at least one grounding test jack, two pairs of differential signal test jacks, a power signal test jack, the IEEE1394 plug, the IEEE1394 socket, and the IEEE1394 The grounding pin on the chip and the grounding test jack on the test head are connected to each other, and the IEEE1394 plug, the IEEE1394 socket, the power pin on the IEEE1394 chip, and the power signal test jack on the test head are connected to each other, and the two pairs of the IEEE1 394 chip are connected. The differential signal pin is connected to two pairs of differential signal test jacks of the test head ,, and the switch module is connected between the ΙΕΕΕ1 394 chip and the ΙΕΕΕ1394 plug and the ΙΕΕΕ1 394 socket for selectively using the IEEE Two pairs of differential signal pins on a 1394 chip and two pairs of differential signals on the IEEE 1 394 plug or IEEE 1394 socket The pins are connected. [0006] Compared with the prior art, the IEEE 13 IH interface test device of the present invention selectively connects to the IEEE 1394 plug and the IEEE 1 394 socket through the IEEE 1394 chip and the switch module, and leads the test signal through the test head. Since there is no need to purchase an IEEE 1 394 device that complies with the IEEE 1 3 94 specification, the test cost can be greatly saved. [Embodiment] Please refer to FIG. 1. The preferred embodiment of the IEEE1 394 interface test apparatus 100 of the present invention includes an IEEE1394 chip U1, an IEEE1394 plug J1, an IEEE1 394 socket J2, a switch module K, and a third. Test heads 099126397 Form number A0101 Page 4 of 12 0992046318-0 201207613 Ο J3-J5. All of the above components are disposed on a circuit board body, and the specific position is not limited to the convenience of testing. The test head J3 includes four test jacks 'two ground test jacks G, a first pair of differential signal test jacks Α + and Α-, and the test head J4 includes four test jacks, respectively two ground test Jack G, the second pair of differential signal test jacks Β + and Β-, the test head J5 includes two test jacks respectively for the power signal test jack VP and the ground test jack G. The test jacks above allow easy insertion of probes from external test equipment such as oscilloscopes. The switch module Κ can be a dial switch. Each of the two pairs of differential signal test jacks '+ 'A-, Β+, Β- and power signal test jacks VP is disposed adjacent to one of the ground test jacks g on the board body. 10, to facilitate the test of the two probes of the external test equipment. Referring to FIG. 2, the ΙΕΕΕ1 394 plug J1, the ΙΕΕΕ1394 socket J2, and the ΙΕΕΕ1394 wafer U1 each include a grounding pin G, a first pair of differential signal pins ΤΡΒ+ and ΤΡΒ--the second pair of differential signals Pins ΤΡΑ + and ΤΡΑ-, a power pin VP, are used to ground, transmit two pairs of differential signals [0009], transmit power signals. The switch module Κ includes four single-pole double-throws: ·· . . . · · Switches Κ1-Κ4, these single-pole double-throw switches Κ1-Κ4 include two throwing points 1, 2 and a knife part 3. The ΙΕΕΕ1394 plug J1, the ΙΕΕΕ1394 socket J2, the pin G on the 1394 chip U1, and the jack G on the test head J3-J5 are connected to each other. The ΙΕΕΕ1394 plug J1, the ΙΕΕΕ1 394 socket J2, the pin VP on the 1394 chip U1, and the jack VP of the test head J5 are connected to each other. The pins ΤΡΒ+, ΤΡΒ-, ΤΡΑ+, ΤΡΑ- on the ΙΕΕΕ1394 plug J1 are respectively connected to the throwing points 1 of the single-pole double-throw switches Κ1-Κ4, the ΙΕΕΕ1394 socket J2 099126397 Form No. 1010101 Page 5 of 12 The pins TPB+, ΤΡΒ-, TPA+, TPA- on page 0992046318-0 201207613 are respectively connected to the throwing points 2 of the single-pole double-throw switches Κ1-Κ4. The blade portion 3 of the single-pole double-throw switch κ is connected to the test jack Β+ of the test head J4 and the bow ΤΡΒ+ of the ΙΕΕΕ1 394 wafer U1, and the blade portion 3 of the single-pole double-throw switch Κ2 is connected to the test head 14 The test jack Β-and the pin ΤΡΒ of the 1394 chip U1, the blade portion 3 of the single-pole double-throw switch Κ3 is connected to the test socket Α of the test head J3 and the pin ΤΡΑ+ of the ΙΕΕΕ1394 wafer U1, the single-pole The blade portion 3 of the double-throw switch Κ 4 is connected to the test socket of the test head 】 3 and the pin ΤΡΑ- of the 1] £1 1394 chip 1]1. .: ... .......

[0010] During the test, if it is a near-end test, the switch module 拨 is toggled so that the single-pole double-throw switch π - Κ 4 is in a state in which the blade 3 is in electrical contact with the throwing point 1 at this time. The ΙΕΕΕ1394 plug J1 is electrically connected to the ΙΕΕΕ1394 wafer U1. Insert the ΙΕΕΕ1394 plug J1 directly into the ΙΕΕΕ1394 interface of the electronic device to be tested, and insert the probe of the test instrument directly into the test socket to be detected in the test head J3-J5 according to the test requirements, since the test point is very close to the electronic device to be tested. With the preparation, the reflected signal interference is small, which improves the test accuracy. [0011] If it is a remote test, the toggle switch module κ is toggled so that the single-pole double-throw switch Π-Κ4 is in a state in which the blade 3 is in electrical contact with the throwing point 2, at which time The £1394 socket 12 is electrically connected to the 1st £1394 wafer 111. Connect the IEEE1394 socket J2 to the IEEE1 394 interface of the electronic device to be tested through an IEEE1394 data cable. Similarly, according to the test requirements, the probe of the test instrument can be directly inserted into the test socket of the test head j3-J5 to be detected. The test is very convenient. In addition, the IEEE 1394 interface test apparatus 1 of the present invention does not require the purchase of an IEEE 1394 device conforming to the IEEE1394 099126397 form number A0101 page 6 / page 12 0992046318-0 201207613 specification, thereby greatly reducing the test cost. [0012] In summary, the present invention complies with the requirements of the invention patent, and submits a patent application according to law. However, the above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art of the present invention should be included in the following claims. BRIEF DESCRIPTION OF THE DRAWINGS [0013] FIG. 1 is a schematic illustration of a preferred embodiment of an IE E E1 3 94 interface test apparatus of the present invention. 2 is a circuit diagram of a preferred embodiment of the IEEE 1 394 interface test apparatus of the present invention. ❹ [Main component symbol description] 099126397 [0015] IEEE1394 interface test device: 100 [0016] Circuit board body: 10 [0017] IEEE1394 chip: U1 [0018] IEEE1394 plug: J1 [0019] IEEE1394 socket: J2 [0020] Switching Switch Module: K [0021] Test Head: J3-J5 [0022] Test Jack: G, A+, A-, B+, B [0023] Pins: G, TPB + , TPB-, TPA+ [0024] Single Cut Double throw switch: K1-K4 7 Form No. A0101 Page 7 / Total 12 Page 0992046318-0 201207613 [0025] Throw point: 1, 2 [0026] Knife: 3 099126397 Form No. A0101 Page 8 / Total 12 Page 0992046318 -0

Claims (1)

201207613 VII. Patent application scope: 1. An IEEE1394 interface test device 'includes an IEEE1394 chip, 〇2. ❹ IEEE1 394 plug, an IEEE1 394 socket, a switch module, at least one test head, the IEEE1394 plug, IEEE1394 socket And the IEEE 1394 chip includes a ground pin, two pairs of differential signal pins, and a power pin. The test head includes at least one ground test jack, two pairs of differential signal test jacks, and a power signal test jack, the IEEE 1394. The plug, the IEEE 1394 socket, the ground pin on the IEEE1394 chip, and the ground test jack on the test head are connected to each other. The IEEE1 394 plug, the IEEE 1 394 socket, the power pin on the IEEE 1394 chip, and the power signal test jack on the test head. Connected to each other, two pairs of differential signal pins of the chip are correspondingly connected with the south pair differential signal test socket on the test head, and the switch module is connected between the IEEE1394 chip and the IEEE1394 plug and the IEEE1394 socket for selecting Optionally pairing the two pairs of differential signal pins of the IEEE 1394 chip with the IEEE 1394 plug or the IEEE 1394 socket Fen difference signals corresponding to two pairs of pins connected. The IEEE 1394 interface test apparatus according to claim 1, wherein the IEEE 1394 chip, the IEEE 1394 plug, the IEEE 1394 socket, the switch module, and the test head are all disposed on a circuit board body. 3. The IEEE 1394 interface test device of claim 2, wherein each of the two pairs of differential signal test jacks and power signal test jacks are disposed adjacent to a ground test jack in the circuit 4. The 2 IEEE 1394 interface test device according to claim 1, wherein the test head includes first to third test heads. The first test head is provided with two 099126397 form numbers A0101, page 9 / total 12 pages 0992046318-0 201207613 The ground test jack and one of the two pairs of differential signal test jacks, the second test head is provided with two of the ground test jacks and the two pairs of differential signal test jacks In another pair, the first test head is provided with the ground test jack and the power signal test jack. 5. The IEEE 1 394 interface test apparatus of claim 1, wherein the switch module comprises four single pole double throw switches, each comprising a knife portion, first and second throw points, and the IEEE 1 394 wafer Two pairs of differential signal pins are respectively connected to the blades of the four single-pole double-throw switches, and two pairs of differential signal pins of the IEEE1 394 plug are respectively connected to the first throwing points of the four single-pole double-throw switches, the IEEE1394 socket The two pairs of differential signal pins are respectively connected to the second throwing points of the four single-pole double-throw switches. 099126397 Form No. A0101 Page 10 of 12 0992046318-0