201115594 六、發明說明: 【發明所屬之技術領域】 本發明係關於在透明塑膠薄膜所構成的基材上,將高 折射率層、低折射率層及透明導電性薄膜層依此順序積層 而成之透明導電性薄膜或透明導電性薄片(以下,亦簡稱透 明導電性薄膜)及使用該等而成之觸控面板。特別是作爲組 入高精細之液晶顯示器等顯示體的觸控面板之電極用薄膜 時,目視辨認性優異並且在觸控面板的框緣附近的筆滑動 耐久性優異,因此可擴展顯示區域之透明導電性薄膜及使 用它之觸控面板。 【先前技術】 在透明塑膠薄膜所構成的基材上,積層有透明且電阻 小的薄膜而成之透明導電性薄膜,係廣泛地被使用在利用 其導電性之用途,例如液晶顯示器或電激發光(有時略記EL) 顯示器等平面顯示器、或觸控面板之透明電極等電氣、電 子領域之用途。 近年來,觸控面板作爲輸入介面受到廣泛的認知,特 別是行動資訊終端機或數位攝影機、數位相機等行動終端 機,爲了省略操作鍵而在顯示器增加了用於搭載觸控面板 的殻體。另一方面,用於該等行動終端的液晶顯示器等顯 示體之高精細化日益進步,強烈地期待不會使組入在這種 顯示體的前面之觸控面板用電極薄膜之目視辨認性降低。 亦即,電極薄膜的透過率低時’液晶顯示器等顯示體 的亮度降低且顯示畫面變暗,因此顯變得不易觀看。而且 201115594 電極薄膜有著色時,液晶顯示器等的顯示色(特別是白色) 之色顯示改變,變得不易獲得鮮明之圖像。因此,期待電 極薄膜之透過率高且著色少。 另一方面,期待液晶顯示器等顯示體爲大畫面化。因 此,包含顯示用顯示器之框體區域(框緣)變得更狹窄,作 爲觸控面板也期待框緣更窄化,進一步觸控面板的框緣附 近不收納於框體内而形成存在於顯示區上之狀態。 觸控面板係將具有透明導電層的一對透明導電性基板 隔著間隔物配置成透明導電層相對向而構成。在觸控面板 進行筆輸入時,固定電極側的透明導電性薄膜和可動電極 (薄膜電極)側的透明導電性薄膜彼此接觸,但特別是在框 緣附近,於可動電極側的透明導電性薄膜被施加筆負荷造 成的較強的彎曲應力。因此,期望.有即使被施加筆負荷造 成的較強的彎曲應力,透明導電性薄膜也不會產生龜裂、 剝離等破壞'在框緣附近的筆滑動耐久性優異之透明導電 性薄膜。 爲了提高目視辨認性,提出有將防止反射加工等所用 的折射率相異之層加以積層,利用光干涉之方案。亦即, 提出有在透明導電膜和基材薄膜之間設置折射率相異之 層、利用光學干涉之方案(專利文獻1〜3 )。 [專利文獻1]日本特開平11-286066號公報 [專利文獻2]日本特許第3626624號公報 [專利文獻3]日本特開2006-346878號公報 但是,該等專利文獻1〜3記載的透明導電性薄膜係可改 201115594 善目視辨認性但環境穩定性或觸控面板框緣附近的筆滑動 耐久性有問題。亦即,如專利文獻1之實施例1所記載,將 真空槽排氣至高真空狀態之後形成的相對於銦之錫含有率 低之膜,用於作爲高折射率層時,在成膜中或觸控面板之 製造工程中,因相關之熱處理使ITO膜容易引起結晶化。將 具有將如此地經結晶化之ITO膜作爲高折射層或透明導電 層之透明導電性薄膜,用於作爲電極薄膜之觸控面板,則 在觸控面板框緣附近的筆滑動耐久性不佳。且,利用將專 利文獻2記載的氧化鈦膜作爲高折射層使用的透明導電性 薄膜之觸控面板,會產生在屋外使用時產生輸入位置偏移 之問題。且,將專利文獻3記載的含有氧化錫及氧化铈之氧 化銦膜用於作爲高折射率層時,由於含有氧化铈而變成硬 又脆之膜,因此觸控面板的框緣附近之筆滑動耐久性不 足,且成膜速度變慢故生產性降低》 【發明內容】 [發明所欲解決之課題] 即,本發明之目的係鑑於上述以往之問題點,提供一 透明導電性薄膜及使用它之觸控面板,作爲使用於高精細 之液晶顯示器等顯示體的前面之觸控面板用之電極薄膜用 時,目視辨認性優異,且生產性優異、且框緣附近的筆滑 動耐久性(邊緣耐久性)優異。 [解決課題之手段] 本發明係鑑於如上述之狀況而硏發者,可解決上述課 題之透明導電性薄膜、及觸控面板係由以下構成所成。 201115594 1. 一種透明導電性薄膜,係於透明塑膠薄膜所構成的基材 上,將高折射率層、低折射率層及透明導電性薄膜層依 此順序積層而成之透明導電性薄膜,其特徵爲高折射率 層係由氧化錫之含有率爲1〇~60質量%之非晶質銦-錫複 合氧化物所構成的無機薄膜,低折射率層係由折射率 1.3 0〜1.60之無機薄膜所構成,透明導電性薄膜層係由折 射率1.80〜2.20之無機薄膜所構成,且透明導電性薄膜之 分光透過率之峰値係存在於450〜530nm,且全部光線透過 率爲90%以上,色彩b値爲-2〜2。 2. 如前述1.之透明導電性薄膜,其中前述高折射率層之氧化 錫之含有率爲20~60質量%。 3. 如前述1.或2.之透明導電性薄膜,其中在由前述透明塑膠 薄膜所構成的基材之積層有透明導電性薄膜層的面之相 反面係經施行低反射處理。 4. —種透明導電性薄片,其特徵爲在 如前述1至3中任一項之透明導電性薄膜之積層有透明導 電性薄膜層的面之相反面,藉由黏合劑貼合著透明樹脂 薄片。 5. ~種觸控面板,係將具有透明導電性薄膜層的一對面 板,隔著間隔物配置成透明導電性薄膜層相對向而構成 的觸控面板,其特徵爲至少一方之面板係由如前述1至4 中任一項之透明導電性薄膜或透明導電性薄片所構成。 [發明之功效] 本發明之透明導電性薄膜係於透明塑膠薄膜所構成的 201115594 基材上,具有以高折射率層、低折射率層及透明導電性薄 膜層之順序積層而成的構成’由於透過率之峰値係存在特 定波長區域,因此即使配置於高精細之顯示體的前面,仍 可抑制目視辨認性降低。且,前述高折射率層係使用氧化 錫的含有率爲所定値之非晶質銦-錫複合氧化物所構成的 層,藉此可使生產性優異且提高對於彎曲之機械強度。因 此,在觸控面板框緣附近進行筆滑動實驗時,透明導電性 薄膜不易產生剝離及龜裂,具有可提高框緣附近的筆滑動 耐久性之優點。 【實施方式】 本發明之透明導電性薄膜係於透明塑膠薄膜所構成的 基材上,將高折射率層、低折射率層及透明導電性薄膜層 依此順序積層而成之透明導電性薄膜。以下,依各層別詳 細地説明。 (透明塑膠薄膜所構成的基材) 本發明中使用的透明塑膠薄膜所構成的基材,係將有 機高分子溶融壓出或溶液壓出後因應必要朝長度方向及/ 或寬方向施行延伸、冷卻、熱固定之薄膜。作爲有機高分 子,可舉出聚乙烯、聚丙烯、聚對苯二甲酸乙二酯、聚-2,6-萘二甲酸乙二酯、聚對苯二甲酸二丙酯、耐綸6、耐綸4、 耐綸66、耐綸12、聚醯亞胺、聚醯胺醯亞胺、聚醚硫、聚 醚醚酮、聚碳酸酯、聚芳酯、丙酸纖維素、聚氯乙烯、聚 偏二氯乙烯、聚乙烯醇、聚醚醯亞胺、聚苯硫醚、聚苯醚、 聚苯乙烯、間規聚苯乙烯、降冰片烯系聚合物等。 201115594 該等有機高分子之中,聚對苯二甲酸乙二酯、聚對苯 二甲酸二丙酯、聚-2,6 -萘二甲酸乙二酯、間規聚苯乙烯、 降冰片烯系聚合物 '聚碳酸酯、聚芳酯等較適合。且,該 等有機高分子可以和其他有機聚合體的單體少量共聚合, 混合其他有機高分子亦可。 本發明中使用的透明塑膠薄膜所構成的基材之厚度, 在超過ΙΟμιη、300μιη以下之範圍爲佳,上限値爲260μιη、下 限値爲7〇μιη特佳。塑膠薄膜之厚度爲1 〇μιη以下時機械強度 不足’特別是用於觸控面板時有對於筆輸入之變形變大之 傾向’容易變成耐久性不足。另一方面,若厚度超過 3 0 0 μ m ’則用於觸控面板時,爲了使薄膜變形,必須加大 筆負荷。因此’施加在透明導電性薄膜之負荷必然變大, 就透明導電性薄膜之耐久性而言不佳。 本發明中使用的透明塑膠薄膜所構成的基材只要在無 損於本發明之目的之範圍內,對前述薄膜施行電暈放電處 理、輝光放電處理、火燄處理、紫外線照射處理、電子束 照射處理、臭氧處理等表面活性化處理亦可。 且’本發明係以使基材和透明導電性薄膜層之密合性 提高、筆輸入耐久性、賦予耐藥性、防止寡聚物等低分子 量物析出爲目的’在基材和透明導電性薄膜層之間,設置 以硬化型樹脂爲主要構成成分之硬化物層亦可。 前述硬化型樹脂只要是藉由加熱、紫外線照射、電子 束照射等能量施加而硬化之樹脂,則無特別限定,可舉出 聚矽氧樹脂、丙烯酸樹脂 '甲基丙烯酸酯樹脂、環氧樹脂、 .201115594 三聚氰胺樹脂、聚酯樹脂、胺基甲酸酯樹脂等。從生產性 之觀點而言,以紫外線硬化型樹脂爲主成分之硬化型樹脂 爲佳。 作爲這種紫外線硬化型樹脂,例如可舉出如多元醇之 丙烯酸或甲基丙烯酸酯之多官能性丙烯酸酯樹脂、二異氰 酸酯、多元醇及丙烯酸或甲基丙烯酸之羥基烷基酯等所合 成之多官能性胺基甲酸酯丙烯酸酯樹脂等。因應必要,可 在該等多官能性樹脂加入單官能性單體,例如乙烯吡咯啶 酮、甲基丙烯酸甲酯、苯乙烯等使其共聚合。 且,爲了提高透明導電性薄膜和硬化物層之附著力, 將硬化物層予以表面處理爲有效。作爲具體方法,可舉出 利用照射輝光或電暈放電之放電處理法、增加羰基、羧基、 烴基之方法、利用酸或鹼處理之化學藥品處理法、增加胺 基、羥基、羰基等極性基之方法等。 紫外線硬化型樹脂通常被添加光聚合引發劑而使用。 作爲光聚合引發劑’可以不特別限定使用吸收紫外線產生 自由基之眾知之化合物,作爲這種光聚合引發劑,例如可 舉出各種苯偶姻類、苯酮類、二苯甲酮類等。光聚合引發 劑之添加量相對於紫外線硬化型樹脂1 〇 〇質量份而言,以 1〜5質量份爲佳。 塗布液中之樹脂成分濃度可以考慮配合塗布法之黏度 等而適當地選擇。例如’塗布液中紫外線硬化型樹脂、光 聚合引發劑之合計量所佔的比例通常爲20〜80質量%。且, 在該塗布液中,亦可配合必要添加其他眾知之添加劑,例201115594 6. Technical Field of the Invention The present invention relates to a method in which a high refractive index layer, a low refractive index layer, and a transparent conductive thin film layer are laminated in this order on a substrate made of a transparent plastic film. A transparent conductive film or a transparent conductive sheet (hereinafter also referred to as a transparent conductive film) and a touch panel using the same. In particular, when a thin film for a touch panel of a display body such as a high-definition liquid crystal display is incorporated, the visibility is excellent and the pen sliding durability in the vicinity of the frame edge of the touch panel is excellent, so that the transparent display area can be expanded. Conductive film and touch panel using the same. [Prior Art] A transparent conductive film in which a transparent and low-resistance film is laminated on a substrate made of a transparent plastic film is widely used for its use in conductivity, such as liquid crystal display or electric excitation. Light (sometimes slightly EL) Uses in the electrical and electronic fields, such as flat-panel displays such as displays, or transparent electrodes of touch panels. In recent years, touch panels have been widely recognized as input interfaces, and particularly mobile terminal devices such as mobile information terminals, digital cameras, and digital cameras, and a housing for mounting a touch panel has been added to the display in order to omit the operation keys. On the other hand, the display quality of liquid crystal displays and the like for such mobile terminals has been increasing, and it is strongly expected that the visibility of the electrode film for touch panels incorporated in front of such a display body will not be lowered. . In other words, when the transmittance of the electrode film is low, the brightness of the display body such as a liquid crystal display is lowered and the display screen is darkened, so that it becomes difficult to view. Moreover, when the electrode film of the 201115594 is colored, the display color of the display color (especially white) of the liquid crystal display or the like is changed, and it becomes difficult to obtain a clear image. Therefore, it is expected that the transmittance of the electrode film is high and the coloring is small. On the other hand, it is expected that a display body such as a liquid crystal display will be enlarged. Therefore, the frame area (frame edge) including the display for display is narrower, and the frame edge is also expected to be narrower as the touch panel, and the vicinity of the frame edge of the touch panel is not stored in the frame to form the display. The state of the district. In the touch panel, a pair of transparent conductive substrates having a transparent conductive layer are disposed such that a transparent conductive layer faces each other with a spacer interposed therebetween. When the pen input is performed on the touch panel, the transparent conductive film on the fixed electrode side and the transparent conductive film on the movable electrode (thin film electrode) side are in contact with each other, but in particular, in the vicinity of the frame edge, the transparent conductive film on the movable electrode side Strong bending stress caused by the applied pen load. Therefore, it is desired that the transparent conductive film does not cause cracking or peeling or the like, and the transparent conductive film having excellent pen sliding durability in the vicinity of the frame edge is not caused by the strong bending stress caused by the application of the pen load. In order to improve the visibility, it has been proposed to laminate a layer having a different refractive index for use in antireflection processing or the like, and to use optical interference. In other words, it has been proposed to provide a layer having a refractive index difference between the transparent conductive film and the base film, and to use optical interference (Patent Documents 1 to 3). [Patent Document 1] Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. The film system can be changed to 201115594. The visibility is good but the environmental stability or the pen sliding durability near the frame edge of the touch panel is problematic. In other words, as described in the first embodiment of Patent Document 1, a film having a low tin content with respect to indium formed after evacuating the vacuum chamber to a high vacuum state is used as a high refractive index layer in film formation or In the manufacturing process of the touch panel, the ITO film is likely to cause crystallization due to the related heat treatment. A transparent conductive film having an ITO film thus crystallized as a high refractive layer or a transparent conductive layer is used as a touch panel as an electrode film, and the pen sliding durability near the frame edge of the touch panel is poor. . Further, the touch panel of the transparent conductive film used as the high refractive layer of the titanium oxide film described in Patent Document 2 has a problem that an input position shift occurs when it is used outdoors. In addition, when the indium oxide film containing tin oxide and yttrium oxide described in Patent Document 3 is used as a high refractive index layer, since it contains a ruthenium oxide and becomes a hard and brittle film, the pen slip near the frame edge of the touch panel. Insufficient durability, and the film formation speed is slow, and the productivity is lowered. [Explanation] [Problems to be Solved by the Invention] That is, the object of the present invention is to provide a transparent conductive film and use the same in view of the above conventional problems. When used as an electrode film for a touch panel in front of a display body such as a high-definition liquid crystal display, the touch panel is excellent in visibility, excellent in productivity, and pen sliding durability near the frame edge (edge Excellent durability). [Means for Solving the Problem] The present invention has been made in view of the above circumstances, and the transparent conductive film and the touch panel which can solve the above problems are formed by the following constitution. 201115594 1. A transparent conductive film which is a transparent conductive film formed by laminating a high refractive index layer, a low refractive index layer and a transparent conductive film layer on a substrate made of a transparent plastic film. The high refractive index layer is an inorganic thin film composed of an amorphous indium-tin composite oxide having a tin oxide content of 1 〇 to 60% by mass, and the low refractive index layer is composed of an inorganic having a refractive index of 1.3 0 to 1.60. The transparent conductive film layer is composed of an inorganic film having a refractive index of 1.80 to 2.20, and the peak of the spectral transmittance of the transparent conductive film is 450 to 530 nm, and the total light transmittance is 90% or more. The color b値 is -2 to 2. 2. The transparent conductive film according to the above 1, wherein the high refractive index layer has a tin oxide content of 20 to 60% by mass. 3. The transparent conductive film according to the above 1. or 2. wherein the opposite surface of the surface of the substrate composed of the transparent plastic film laminated with the transparent conductive film layer is subjected to a low reflection treatment. 4. A transparent conductive sheet characterized in that the transparent conductive film of any one of the above-mentioned 1 to 3 is laminated on the opposite side of the surface of the transparent conductive film layer, and the transparent resin is bonded to the transparent resin Sheet. 5. A touch panel is a touch panel in which a pair of panels having a transparent conductive film layer are disposed with a transparent conductive film layer facing each other via a spacer, and at least one of the panels is characterized by The transparent conductive film or the transparent conductive sheet according to any one of the above 1 to 4. [Effect of the Invention] The transparent conductive film of the present invention is formed on a 201115594 substrate composed of a transparent plastic film, and has a structure in which a high refractive index layer, a low refractive index layer, and a transparent conductive thin film layer are laminated in order. Since the peak of the transmittance is in a specific wavelength region, even if it is disposed in front of the high-definition display, the deterioration of visibility can be suppressed. Further, the high refractive index layer is a layer composed of an amorphous indium-tin composite oxide having a predetermined content of tin oxide, whereby the productivity is excellent and the mechanical strength against bending is improved. Therefore, when the pen sliding test is performed in the vicinity of the frame edge of the touch panel, the transparent conductive film is less likely to be peeled and cracked, and has the advantage of improving the durability of the pen sliding in the vicinity of the frame edge. [Embodiment] The transparent conductive film of the present invention is a transparent conductive film in which a high refractive index layer, a low refractive index layer, and a transparent conductive thin film layer are laminated in this order on a substrate made of a transparent plastic film. . The following is a detailed description of each layer. (Substrate composed of a transparent plastic film) The substrate made of the transparent plastic film used in the present invention is required to be extended in the longitudinal direction and/or the width direction after the organic polymer is melted or extruded. Cooled, heat-fixed film. Examples of the organic polymer include polyethylene, polypropylene, polyethylene terephthalate, polyethylene-2,6-naphthalenedicarboxylate, polypropylene terephthalate, nylon 6, and resistant. Polyester 4, nylon 66, nylon 12, polyimine, polyamidamine, polyether sulfur, polyetheretherketone, polycarbonate, polyarylate, cellulose propionate, polyvinyl chloride, poly Partially dichloroethylene, polyvinyl alcohol, polyether phthalimide, polyphenylene sulfide, polyphenylene ether, polystyrene, syndiotactic polystyrene, norbornene-based polymer, and the like. 201115594 Among these organic polymers, polyethylene terephthalate, polybutylene terephthalate, polyethylene-2,6-naphthalenedicarboxylate, syndiotactic polystyrene, norbornene The polymer 'polycarbonate, polyarylate, etc. are suitable. Further, these organic polymers may be copolymerized with a small amount of monomers of other organic polymers, and other organic polymers may be mixed. The thickness of the base material composed of the transparent plastic film used in the present invention is preferably in the range of more than ΙΟμηη and 300 μmη, and the upper limit 値 is 260 μm, and the lower limit 値 is 7 〇 μηη. When the thickness of the plastic film is 1 〇μηη or less, the mechanical strength is insufficient. In particular, when the touch panel is used for a touch panel, the deformation of the pen input tends to be large, and it tends to be insufficient in durability. On the other hand, when the thickness exceeds 300 μm, when the touch panel is used, it is necessary to increase the pen load in order to deform the film. Therefore, the load applied to the transparent conductive film is inevitably increased, and the durability of the transparent conductive film is not good. The substrate made of the transparent plastic film used in the present invention is subjected to corona discharge treatment, glow discharge treatment, flame treatment, ultraviolet irradiation treatment, electron beam irradiation treatment, and the like, as long as the object of the present invention is not impaired. Surface activation treatment such as ozone treatment is also possible. In the present invention, the adhesion between the substrate and the transparent conductive thin film layer is improved, pen input durability, drug resistance, and prevention of precipitation of low molecular weight substances such as oligomers are performed. A cured layer containing a curable resin as a main component may be provided between the film layers. The curable resin is not particularly limited as long as it is cured by energy application such as heating, ultraviolet irradiation, or electron beam irradiation, and examples thereof include polyfluorene oxide resin, acrylic resin methacrylate resin, and epoxy resin. .201115594 Melamine resin, polyester resin, urethane resin, etc. From the viewpoint of productivity, a curable resin containing an ultraviolet curable resin as a main component is preferred. Examples of such an ultraviolet curable resin include a polyfunctional acrylate resin of acrylic acid or methacrylic acid ester of a polyhydric alcohol, a diisocyanate, a polyhydric alcohol, and a hydroxyalkyl ester of acrylic acid or methacrylic acid. A polyfunctional urethane acrylate resin or the like. If necessary, a monofunctional monomer such as vinylpyrrolidone, methyl methacrylate, styrene or the like may be added to the polyfunctional resin to be copolymerized. Further, in order to improve the adhesion between the transparent conductive film and the cured layer, it is effective to surface-treat the cured layer. Specific examples of the method include a discharge treatment method using irradiation of glow or corona discharge, a method of increasing a carbonyl group, a carboxyl group, or a hydrocarbon group, a chemical treatment method using an acid or a base treatment, and a polar group such as an amine group, a hydroxyl group, or a carbonyl group. Method, etc. The ultraviolet curable resin is usually used by adding a photopolymerization initiator. The photopolymerization initiator is not particularly limited, and a known compound which absorbs ultraviolet rays to generate a radical is used. Examples of such a photopolymerization initiator include various benzoin, benzophenone, and benzophenone. The amount of the photopolymerization initiator to be added is preferably 1 to 5 parts by mass based on 1 part by mass of the ultraviolet curable resin. The concentration of the resin component in the coating liquid can be appropriately selected in consideration of the viscosity of the coating method and the like. For example, the ratio of the total amount of the ultraviolet curable resin and the photopolymerization initiator in the coating liquid is usually 20 to 80% by mass. Further, in the coating liquid, it is also possible to add other well-known additives as necessary.
LSI -10- 201115594 如聚矽氧系界面活性劑、氟系界面活性劑等塗平劑等。 本發明中,經調製之塗布液被塗布於透明塑膠薄膜所 構成之基材上。對於塗布法並無特別限定,可使用硬塗法、 凹版印刷塗布法、逆向輥塗法等習知之方法。 且,硬化物層之厚度爲〇.1~15μηι之範圍爲佳。硬化物 層之厚度的下限値爲0.5 μιη更佳,特佳爲Ιμιη。且,硬化物 層之厚度的上限値爲ΙΟμιη更佳,特佳爲8μπι。硬化物層之 厚度爲未達0.1時,由於無法充份地形成經交聯之構造,因 此筆輸入耐久性或耐藥品性容易降低,也容易引起寡聚物 等的低分子量造成之密合性降低。另一方面,硬化物層之 厚度爲超過15μηι時,有生產性降低之傾向。 (高折射率層) 本發明中之高折射率層係由氧化錫之含有率爲10〜6 0 質量%之非晶質銦-錫複合氧化物所構成的無機薄膜。更佳 爲氧化錫之含有率爲20~50質量%,又更佳爲30〜45質量%。 高折射率層係至少具有較低折射率層(折射率爲 1.3 0-1.60)高的折射率之層。藉由將具有較低折射率層高的 折射率之層形成於透明塑膠薄膜基材,可獲得光之干涉效 果。 —般而言,作爲高折射率層係使用Ti02、Nb2 05、 Ιη203。但是例如藉由濺鍍法形成Ti02、Nb20 5膜時,成膜 速度慢、生產性降低。因此從生產性之觀點來看,作爲高 折射率層以銦氧化物爲佳。 但是,形成Ιιι203或氧化錫含有率低的銦-錫複合氧化 [Si -11- 201115594 膜時’雖然生產性優異但因爲施行於濺鍍成膜中或觸控面 板製造工程中之熱處理,而使高折射率層結晶化。使用高 折射率層結晶化之透明導電性薄膜製作的觸控面板中,框 緣附近的筆滑動耐久性差。因而,高折射率層中不存在結 晶粒爲佳。具體而言,實施例之欄記載的測量中未觀測到 結晶粒者爲佳。 因此,在本發明中所用的高折射率層,就生產性之觀 點而言爲銦-錫複合氧化物所構成,氧化錫的含有率爲 10~60質量%。氧化錫的含有率爲未達1〇質量%時,難以抑 制關於成膜中或觸控面板製造工程中之熱處理所造成的結 晶化。另一方面,氧化錫的含有率爲超過6 0質量%時,難 以使標靶密度提高,生產中容易產生異常放電,就生產性 之觀點而Μ不佳。 此外,即使氧化錫的含有率爲1〇~60質量%之範圍,在 氧化錫的含量低的區域仍有因製膜條件.而結晶化的情形。 特別是水分壓對惰性氣體之比低時,容易結晶化。在這種 氧化錫的含量低的情形下(例如20質量%以下),特別是藉 由提高水分壓對惰性氣體之比,可抑制結晶化。較佳之水 分壓對惰性氣體之比係根據氧化錫的含有率量而異,但例 如錫含有率爲10質量%時,3x1 0_3以上爲佳。爲了提高水 分壓對惰性氣體之比,藉由調整製膜前的真空暴露條件, 可舉出提高薄膜之含水量的方法、製膜時使薄膜溫度較高 的方法、蓄意地導入水蒸氣的方法等任意方法。其他,由 於會受到使用的基材薄膜之水分含有率左右,因此必須考 [S1 -12- 201115594 慮此點決定適當條件。且,藉由降低氧的分壓比也可抑制 結晶化。 作爲本發明中所用的高折射率層之膜厚,以35~50nm 爲佳,更佳爲38~48nm。超過50nm時,高折射率層在成膜 中或加熱處理後容易結晶化。且,未達35nm時,難以改善 透明導電性薄膜之光學特性。此外,高折射率層之折射率 爲1.70-2.50爲佳,更佳爲1.90〜2.30,特佳爲1.90〜2.10。 作爲本發明中的高折射率層之成膜方法,已知有真空 蒸鍍法、濺鍍法、CVD法、離子電鍍法、噴霧法等,可配 合需要之膜厚適當地使用前述方法 > 但是從降低膜厚不均 的觀點而言,以濺鍍法爲佳。 濺鍍法中,一般有從金屬標靶導入反應性氣體製作金 屬氧化物之反應性濺鍍法、和從氧化物標靶製作金屬氧化 物之方法。爲了抑制膜厚之不均,使用氧化物標靶爲佳。 爲了抑制對隔著低折射率層積層之透明導電性薄膜之 導電性的影響,本發明中所使用之高折射率層係以絕緣體 爲佳。具體而言爲1Μ06Ω/□以上。因此形成銦-錫複合氧 化物層時,將反應性氣體設定爲表面電阻値爲最小値時之 氣體流量的1.5〜5倍流量爲佳。未達1.5倍時,難以將表面電 阻値設定爲上述範圍。且,若流過超過5.0倍之氣體流量, 則膜中被攙入化學計量比以上之氧、或容易形成因氧負離 子過剩之生成所形成之損傷大的膜,由於形成不穩定的 膜,降低環境實驗後透明導電性薄膜之穩定性》 因此爲了獲得在高溫、高濕環境下(85 °C、85% RH、1000 r > L ^ i -13- 201115594 小時)的穩定性,將氣體流量設定爲表面電阻値成爲最小値 的氣體流量之1.5 ~3倍爲佳,因此氧化錫的含有率爲20~60 質量%爲佳。未達20質量%時,上述氣體流量難以使表面 電阻値達到1Xι〇6ω/□以上。 (低折射率層) 本發明中的低折射率層之折射率爲1.30〜1.60爲佳,更 佳爲1.4 0-1.50»具體可舉出Si 02、Α12〇3等透明金屬氧化 物、或Si02-Al203等複合金屬氧化物所構成之層》折射率 爲未達1.30時,低折射率層變成多孔之膜,將阻礙其上方 形成的透明導電性薄膜層之電氣特性。另一方面,折射率 爲超過1.60時,難以滿足前述光學特性。 低折射率層之膜厚只要滿足本申請案之發明範圍的分 光透過率、全光線透過率及色彩値,即可適當選擇。例如 Si〇2薄膜的情形爲45〜60nm較佳,更佳爲50〜58nm。超過 6 0nm時,透明導電性薄膜的光線透過率提高,但是產生著 色而使分光透過率和色彩b値偏離目標。另一方面,未達 4 5 nm的情形下,難以獲得目標之全光線透過率。 作爲本發明中的低折射率層之成膜方法,已知有真空 蒸鍍法、濺鍍法、CVD法 '離子電鍍法、噴霧法等,可配 合需要之膜厚適當地使用前述方法,從減少膜厚不均的觀 點而言,以濺鍍法爲佳。一般以濺鍍形成時係使用反應性 DC或AC濺鍍法。爲了提高成膜速度,使用控制反應性氣體 流量之電阻控制以使DC或AC電源的電壓値保持爲一定,或 使用控制反應性氣體流量之電漿放射法以使特定元素之電 m -14- 201115594 漿中的發光強度保持爲一定。 (透明導電性薄膜層) 本發明中的透明導電性薄膜層係由折射率爲1 .80〜2.20 之無機薄膜所構成。較佳爲1.9 0〜2.10之無機薄膜’更佳爲 1.93〜2.05之無機薄膜。透明導電性薄膜的折射率爲未達 1.8 0時,難以形成導電性良好之透明導電性薄膜層。另一 方面,折射率爲超過2.20時,亦難以形成導電性良好之透 明導電性薄膜層,進一步,在空氣和透明導電性薄膜層之 界面的反射變大,難以滿足前述光學特性。 具體而言,可舉出氧化銦、氧化錫、氧化鋅、銦-錫複 合氧化物、錫-銻複合氧化物、鋅-鋁複合氧化物 '銦-鋅複 合氧化物等。且,爲了調整折射率,亦可適當添加金屬氧 化物。該等之中,從環境穩定性和電路加工性之觀點而言, 以銦-錫複合氧化物較適合。 本發明中,積層透明導電性薄膜層,藉由將透明導電 性薄膜的表面電阻値較佳設爲50~5 000Ω/□,更佳設爲 100〜2000Ω/□的方式,可將透明導電性薄膜使用在觸控面 板等。表面電阻値爲未達100Ω/□時,觸控面板的位置辨識 精確度變差,而超過2000Ω/□時,會有必須提高施加在觸 控面板的電極間之電壓的情形,因而不佳。 且,從生產性之觀點而言,透明導電性薄膜和高折射 率層爲相同素材,例如銦-錫組成爲佳。組成相異時,必須 有高折射率用、透明導電性薄膜用之各自之標靶及陰極, 設備方面也變成龐大的裝置。 [S1 -15- •201115594 透明導電性薄膜之層構造爲單層構造亦可,爲2層以上 之積層構造亦可》於具有2層以上之積層構造之透明導電性 薄膜的情形下,構成各層之前述金屬氧化物爲相同亦可, 爲相異亦可。 透明導電性薄膜之膜厚爲4〜2 5 nm之範圍較佳,特佳爲 5~20nm,更佳爲8~18 urn。透明導電性薄膜之膜厚未達4nm 時’難以形成連續之薄膜,因而難以獲得良好的導電性。 另一方面,透明導電性薄膜之膜厚爲較25 nm更厚時,透明 性容易降低,並且難以獲得具有可承受觸控面板的框緣附 近之彎曲應力的機械強度之膜。 作爲本發明中的透明導電性薄膜之成膜方法,眾知有 真空蒸鍍法 '濺鍍法、CVD法、離子電鍍法、噴塗法等, 配合必要之膜厚可適當使用前述方法。 例如濺鍍法的情形,係利用使用氧化物標靶之通常的 濺鍍法、或使用金屬標靶之反應性濺鍍法等》此時,作爲 反應性氣體,可導入氧、氮等、或倂用臭氧添加、電漿照 射、離子輔助等手段。且,在無損本發明之目的的範圍, 亦可於基板施加直流、交流、高頻等偏壓。 (透明導電性薄膜之光學特性) 本發明之透明導電性薄膜係於由上述透明塑膠薄膜所 構成的基材上,依高折射率層、低折射率層及透明導電性 薄膜層之順序積層而成之構成,由於在特定波長區域存在 透過率之峰値,即使配置於高精細之顯示體的前面仍可抑 制目視辨認性降低。 [S1 -16 * 201115594 本發明之透明導電性薄膜的分光透過率之峰値係存在 於45 0〜5 3 Onm,因此著色極少且透過率優異,所以將本發 明之透明導電性薄膜使用於觸控面板等構件時,目視辨認 性優異。較佳之分光透過率之峰値爲460〜520nm,更佳之 分光透過率之峰値爲470~510nm。 且,本發明之透明導電性薄膜的全光線透過率爲90% 以上,因此將本發明之透明導電性薄膜使用於觸控面板等 構件時,可抑制液晶顯示器等的亮度降低。 再者,由於本發明之透明導電性薄膜的色彩b値爲 -2〜2,因此將本發明之透明導電性薄膜使用於觸控面板等 構件時,可抑制損壞液晶顯示器等顯示體之顯示色。較佳 .之色彩b値爲-1 .0〜1 .5,更佳爲0~1 .5。 (防止牛頓環產生) 且,當作觸控面板時,以防止牛頓環產生爲目的,在 透明塑膠薄膜之説明中記載的硬化物層,以中心線平均粗 度(Ra)爲0.1~0.5μιη之範圍的方式含有粒子爲佳。Ra爲未達 0.1時,難以防止牛頓環產生。另一方面,Ra爲超過0.5μΐη 時,透明導電性薄膜表面過粗,筆滑動耐久性有變差之傾 向。 作爲含於硬化物層之粒子並無特別限定,但可例示無 機粒子(例如二氧化矽、碳酸鈣等)' 耐熱性有機粒子(例如 聚矽氧粒子、PTFE粒子、聚醯亞胺粒子等)、交聯高分子粒 子(交聯PS粒子、交聯丙烯酸系粒子等)。該等粒子之平均 粒徑(根據電子顯微鏡法)爲〇.5~5μπι爲佳。且,含有於硬化 LSi -17- 201115594 物層中的粒子之含量爲0.01〜10質量%爲佳。 (硬塗層) 且,爲了進一步改善作爲觸控面板時的最外層(筆輸入 面)之耐擦傷性,在透明塑膠薄膜的形成有透明導電性薄膜 之表面的相反面(作爲觸控面板時的最外層之筆輸入面), 設有硬塗層爲佳。前述硬塗層之硬度係鉛筆硬度2H以上爲 佳。未達2H之硬度時,作爲透明導電性薄膜之硬塗層,於 耐擦傷性之處不夠充分。 前述硬塗層之厚度爲0.5〜10 μιη爲佳。厚度爲未達0.5 μιη 時,容易變成耐擦傷性不足,比ΙΟμιη更厚時,從生產性之 觀點而言不佳。 使用於前述硬塗層之硬化型樹脂組成物係具有丙烯酸 酯系官能基之樹脂爲佳,例如可舉出較低分子量的聚酯樹 脂、聚醚樹脂、丙烯酸樹脂、環氧樹脂、胺基甲酸酯樹脂、 醇酸樹脂、螺縮醛(Spiroacetal)樹脂、聚丁二烯樹脂、多硫 醇多烯樹脂、多元醇等多官能性化合物之(甲基)丙烯酸酯 等寡聚物或預聚物等。 且’作爲反應性稀釋劑,係使用較多量地含有(甲基) 丙嫌酸乙酯、(甲基)丙烯酸乙基己酯、苯乙烯、甲基苯乙 嫌、N-乙烯吡咯啶酮等單官能單體以及多官能單體者,例 如三經甲基丙烷三(甲基)丙烯酸酯、己二醇(甲基)丙烯酸 酯、三丙二醇二(甲基)丙烯酸酯、二乙二醇二(甲基)丙烯酸 醋、新戊四醇三(甲基)丙烯酸酯、雙新戊四醇六(甲基)丙烯 酸醋、1,6-己二醇二(甲基)丙烯酸酯、新戊二醇二(甲基)丙 201115594 烯酸酯等》 本發明中,作爲寡聚物,混合氨酯丙烯酸酯、作爲單 體混合六(甲基)丙烯酸雙新戊四醇酯等爲佳。 且,作爲使用於前述硬塗層之硬化型樹脂組成物,聚 酯丙烯酸酯和聚胺基甲酸酯丙烯酸酯之混合物特別適合。 聚酯丙烯酸酯係塗膜非常硬,適合作爲硬塗層。但是,聚 酯丙烯酸酯單獨之塗膜時,有耐衝撃性低且容易變脆之問 題。因此,爲了在塗膜賦予耐衝撃性及柔軟性,倂用聚胺 基甲酸酯丙烯酸酯爲佳。亦即,藉由在聚酯丙烯酸酯倂用 聚胺基甲酸酯丙烯酸酯,可維持塗膜作爲硬塗層之硬度, 並具備耐衝撃性及柔軟性之機能。 兩者之配合比例相對於聚酯丙烯酸酯樹脂100質量份 而言,聚胺基甲酸酯丙烯酸酯樹脂爲3 0質量份以下爲佳。 聚胺基甲酸酯丙烯酸酯樹脂之添加比例爲超過30質量份 時,塗膜過軟而有耐衝撃性不足之傾向。 前述硬化型樹脂組成物之硬化方法可使用通常之硬化 方法,亦即藉由加熱、電子束或紫外線照射而硬化之方法。 例如電子束硬化之情形,係利用由考瓦(Cockcroft-Walton) 型、范德格雷夫氏(Van de Graaff)型、共振變壓型、絕緣 核芯變壓器型、直線型、地那米(^^1^11^^〇11)型、高頻型等 各種電子束加速器所放出之具有50~1 000keV、較佳爲 100〜3 00keV能量之電子束等。且,於紫外線硬化之情形可 利用由超高壓水銀燈、高壓水銀燈、低壓水銀燈、碳弧、 氙弧、金屬鹵素燈等光線發出之紫外線等》 -19- 201115594 再者’於電離放射線硬化之情形,使前述硬化型樹脂 組成物中含有光聚合引發劑或光增感劑爲佳。作爲光聚合 引發劑可舉出苯乙酮類、二苯甲酮類、米氏苯甲酸予醋 (Michler-Benzoyl benzoate)、α-阿米羅基酯(α-Amyloxim ester)、一硫化四甲基秋蘭姆(Tetramethyithiuram monosulfide)、硫雜蒽酮類等。且,作爲光增感劑係正-丁 胺、三乙胺、三正丁膦等爲佳。 爲了賦予硬塗層防眩性,將CaC03或Si02等無機粒子分 散至硬化型樹脂之方法、或在硬塗層的表面形成凹凸狀之 方法爲有效。例如爲了形成凹凸,在含有硬化型樹脂組成 物之塗液塗敷後,將表面具有凸狀之賦形薄膜積層,從該 賦形薄膜上照射紫外線使硬化型樹脂硬化後,藉由僅剝離 賦形薄膜而獲得。 前述賦型薄膜可使用在具有脫模性之聚對苯二甲酸乙 二酯(以下有時簡稱PET)等基材薄膜上設有所要的凸狀 者、或者在PET等基材薄膜上形成有纖細之凸層者等。其凸 層之形成,例如可藉由使用無機粒子和黏合劑樹脂所構成 的樹脂組成物塗敷於基材薄膜上而獲得。 作爲前述黏合劑樹脂係例如使用經聚異氰酸酯交聯之 丙烯酸多元醇,作爲無機粒子可使用CaC03或Si02等。且, 其他在製造PET時亦可使用混入有Si02等無機粒子之粗糙 (mat)型 PET。 將該賦型薄膜積層於紫外線硬化型樹脂之塗膜後,照 射紫外線使塗膜硬化時、賦型薄膜爲將PET作爲基材之薄膜 -20- 201115594 時,紫外線之短波長側被吸收到該薄膜,而有紫外線硬化 型樹脂之硬化不足的缺點。因而,必須使用積層於紫外線 硬化型樹脂之塗膜的賦型薄膜之全光線透過率爲20%以上 者。 且,使用於觸控面板時’由於可視光線之透過率進一 步提高,因此在硬塗層上施行低反射處理亦可。該低反射 處理係將具有與硬塗層之折射率相異的折射率之材料積層 單層或2層以上爲佳。 單層構造時,使用比硬塗層具有更小的折射率之材料 爲佳。且,若是2層以上之多層構造時,鄰接硬塗層之層係 使用比硬塗層具有更大的折射率之材料,在其上之層選用 具有較其小的折射率之材料爲佳。作爲構成這種低反射處 理之材料,不論有機材料或無機材料只要是滿足上述折射 率關係則不受特別限定。例如使用CaF2、MgF2、NaAlF4、 Si02、 ThF4、 Zr02、 Nd203、 Sn〇2、 Ti02、 Ce02、 ZnS、 In2〇3 等介電質爲佳。 該低反射處理爲真空蒸鑛法、擺鑛法、CVD法、離子 電鍍法等乾式塗布法、或凹版印刷塗布方式、逆向輥塗方 式、模塗方式等濕式塗布法。 再者’該低反射處理層積層之前,作爲前處理,亦可 在硬塗層施行電暈放電處理、電漿處理、濺鍍鈾刻處理、 電子束照射處理、^*外線照射處理、底層塗料處理(primer treatment)、易接合處理等眾知之表面處理。 (透明導電性薄片) [Si -21- 201115594 本發明之透明導電性薄片,係於本發明之透明導電性 薄膜之積層有透明導電性薄膜層之面的相反面,藉由黏合 劑貼合透明樹脂薄片積層所得。本發明之透明導電性薄片 可使用在觸控面板之固定電極。亦即,將觸控面板之固定 電極之基板從玻璃變更爲本發明之透明樹脂薄片,藉此可 製作輕量且不易裂開的觸控面板。 前述黏合劑只要是具有透明性者則無特別限定,但例 如丙烯酸系黏合劑、聚矽氧系黏合劑、橡膠系黏合劑等較 合適。該黏合劑之厚度並無特別限定,但通常期望設定在 1〜ΙΟΟμιη之範圍。黏合劑之厚度爲未達Ιμηι之厚度時,難以 獲得實用上沒有問題之接著性,超過100 μιη之厚度時,從 生產性之觀點而言不佳。 此藉由黏合劑貼合之透明樹脂薄片係爲了賦予與玻璃 同等的機械強度而使用者,厚度爲〇.〇5~5腦之範圍爲佳。 前述透明樹脂薄片之厚度爲未達〇.〇5 mm時,機械強度較玻 璃不足。另一方面,厚度爲超過5 mm時,過厚而不適於使用 在觸控面板。且,該透明樹脂薄片之材質可使用與前述透 明塑膠薄膜同樣者。 (觸控面板) 觸控面板係將具有透明導電性薄膜層的一對透明導電 性基板(薄膜、玻璃、薄片任一種),隔著間隔物配置成透 明導電性薄膜層呈相對向。藉由筆輸入文字時,由於筆的 推壓使呈相對向之透明導電性薄膜彼此接觸,電源成爲ON 狀態,而可檢測出觸控面板上之筆位置。藉由連續且正確 -22- 201115594 地檢測出該筆位置之方式,可從筆的軌跡辨識文字。 本發明之觸控面板係至少在一方之透明導電性基板使 用上述本發明之透明導電性薄膜者。此時,若筆接觸側的 可動電極係使用本發明之透明導電性薄膜,則即使組入於 高精細之液晶顯示器等顯示體,目視辨認性亦不會降低., 且由於筆滑動耐久性優異而能夠成爲長期穩定之觸控面 板。於第1圖顯示使用本發明之透明導電性薄膜的觸控面板 之例。 且,於第2圖顯示使用本發明之透明導電性薄膜及透明 導電性薄片所得之不使用玻璃基板的塑膠製觸控面板之剖 視圖。由於該塑膠製觸控面板不使用玻璃,因此非常輕且 不會因爲衝撃而裂開。 [實施例] 以下根據實施例進一步詳細地説明本發明,但本發明 並非受該等實施例限定者。此外,透明導電性薄膜之性能 及高折射率層、透明導電性薄膜之結晶性、觸控面板之筆 滑動耐久性實驗係藉由下述方法測量。 (1)全光線透過率 根據JIS-K7136,利用日本電色工業(股)製 NDH-1001DP測量光線透過率。 (2 )表面電阻値 根據JIS-K7 194,以4端子法測量》測量機係使用三菱 油化(股)製 Lotest AMCP-T4 00。 (3)色彩(a値、b値) -23- 201115594 根據JIS-K7 105,利用色差計(日本電色工業製' ZE-2 0 0 0),以標準光C/2測量色彩a値、b値。 (4) 分光透過率之峰値波長 利用分光光度計(日立U-3500型),於380~780nm之範圍 在透明導電性薄膜側照射光,測量室内空氣作爲透過率之 參照來測定。根據測量結果以透過率爲最大値之波長作爲 峰値波長。 (5) 高折射率層、透明導電性薄膜之結晶性 將積層有高折射率層、透明導電性薄膜之薄膜試料片切 成300μιηχ300μηι之正方形,於超薄切片機(Ultramicrotome) 的試料保持具,將薄膜面固定於前方。接著,以能獲得具 有Ιμιη xl μιη以上之目的觀察部位之切片的程度,將小刀對 薄膜面設置成極銳角,以設定厚度7〇nm切削。 在該切片之導電性薄膜表面側且薄膜沒有顯著損傷之 部位,確保Ιμιη χ1 μπι之觀察視野,利用透過型電子顯微鏡 (JEOL公司製、JEM-2010),以加速電壓200kV、明視野觀 察倍率5萬倍進行照相攝影,評價結晶性。 (6) 框緣附近之筆滑動耐久性實驗 從觸控面板的貼合部内側偏離1 .5 mm之位置以聚縮醛 製之筆(前端形狀:0.8晒R)施加2.5N之負荷,在觸控面板 進行1萬次(往復5 000次)直線滑動實驗。此時之滑動距離爲 30醜、滑動速度爲60關/秒。再者,觸控面板的上下基板的 間隙爲15〇μιη。此滑動耐久性實驗後,首先目視觀察滑動 部是否白化。且,以顯微鏡觀察滑動部位附近,觀察有無 [Si -24- 201115594 龜裂產生。再者,測量以筆負荷1. ON推壓滑動部時之ON電 阻(可動電極(薄膜電極)和固定電極接觸時之電阻値)。 (7) 筆滑動耐久性實驗 ’ 乂 以聚縮醛製之筆(前端形狀:〇.8mmR)施加2.5N之負 荷,在觸控面板進行10萬次(往復5萬次)直線滑動實驗。此 時之滑動距離爲30圆、滑動速度爲60mi /秒。此滑動耐久性 實驗後,首先目視觀察滑動部是否白化。再者,以筆負荷 0.5N施加在上述滑動部,將20隨0之記號〇印記做筆記,評 價觸控面板是否能正確地讀取此紀錄。再者,測量以筆負 荷0.5N推壓滑動部時之ON電阻(可動電極(薄膜電極)和固 定電極接觸時之電阻値)。 (8) 高溫•高濕下之環境實驗 利用NAGANO(股)科學機械製作所製之LH43-12P,在 8 5°C、85% RH的環境下將透明導電性薄膜暴露1 000小時。 該處理後測量表面電阻値、光線透過率、色彩。 (9) 高折射率層、低折射率層、透明導電性薄膜層之膜厚 將積層有高折射率層、低折射率層、透明導電性薄膜 層之薄膜試料片切成1麵xl〇nim之大小,包埋於電子顯微鏡 用環氧樹脂。將其固定在超薄切片機(Ultramicro to me)的試 料保持具,製作平行於經包埋的試料片之短邊的斷面薄切 片。接著,在該切片之薄膜沒有顯著損傷的部位,利用透 過型電子顯微鏡(JEOL公司製、JEM-2010),以加速電壓 200kV、明視野觀察倍率1萬倍進行照片攝影,從所獲得的 照片求出膜厚》 -25- 201115594 (ίο)高折射率層、低折射率層、透明導電性薄膜層之折射率 針對在矽晶圓上將各層分別以相同的成膜條件製作而 成的試料,利用分光光譜儀(Ellipsometer)(大塚電子股份有 限公司製、FE- 5 0 0 0),評價5 5 0nm之折射率。且,利用光學 模擬軟體對設有各層之薄膜的分光透過率測量資料進行擬 合(Fitting),算出折射率。此時,各層之膜厚係使用前述 膜厚評價方法所評價之値。進一步確認如此地算出之各層 折射率和矽晶圓上各層折射率沒有太大的差異。 〔實施例1〕 在含有光聚合引發劑之1〇〇質量份的丙烯酸系樹脂(大 日精化工業公司製、Seikabeam EXF-0 1 J),.加入作爲溶劑 的甲苯/MEK(80/20 :質量比)之混合溶劑,至固體分濃度成 爲50質量%,攪拌且均等地溶解,調製成塗布液。 在兩面具有易接合層之二軸配向透明PET薄膜(東洋紡 績公司製、A43 40、厚度188μιη),使用邁耶棒(Meyer Bar) 塗布經調製之塗布液形成塗膜厚度形成5μιη。以80°C進行1 分鐘乾燥後,利用紫外線照射裝置(Eye Graphics公司製、 UB042-5AM-W型)照射紫外線(光量:300mJ/cm2),使塗膜 硬化。接著,針對反面也同樣地塗設塗膜後,以1 80 °C施行 1分鐘加熱處理,進行減少揮發成分。 且,爲了將積層有該硬化物層之二軸配向透明PET薄膜 進行真空暴露,因此在真空處理室中進行反捲處理。此時 的壓力爲〇.〇〇2Pa,暴露時間爲20分鐘。且,中央輥的溫度 爲 4 0 °C 。 -26- 201115594 接著,在該硬化物層上將銦-錫複合氧化物所構成的高 折射率層成膜。此時,將濺鍍前的壓力設定爲0.0001Pa, 利用含有36質量%氧化錫之氧化銦(住友金屬鑛山公司 製、密度6.9g/cm3)作爲標靶,施加2W/cm2之DC電力。且, 將Ar氣體以130sccm、02氣體以表面電阻値爲最小時之〇2 流量的3倍流速流過,在〇.4Pa之大氣下利用DC磁控濺鍍法 成膜。但是,並非通常的DC,爲了防止電弧放電,利用日 本ENI製RPG-100,以50kHz周期施加5μs寬之脈衝。且,中 央輥溫度爲〇°C,進行濺鍍。 , 且,以濺鍍製程監視器(LEYBOLD INFICON公司製、 XPR2)長時觀測大氣之氧分壓,反饋到氧氣之流量計及DC 電源,使銦·錫複合氧化物薄膜中的氧化度成爲一定。如以 上方式,堆積成厚度4 5 nm之銦-錫複合氧化物所構成的高折 射率層。如此地獲得之高折射率層之表面電阻値爲 1 X 1 06Ω/□以上。 再者,爲了在前述高折射層上形成Si02薄膜作爲低折 射率層,而用矽作爲標靶,利用直流磁控濺鍍法、真空度 爲0.27Pa、作爲氣體之Ar氣體爲500sccm、02氣體爲80sccm 之流速流過。且,在基板的背面設有〇°C之冷卻輥,將透明 塑膠薄膜冷卻。對此時的標靶供給7.8W/cm 2之電力,動態 率爲23nm. m /分。 且,一面長時觀測成膜中的電壓値,一面反饋到氧氣 之流量計,使電壓値成爲一定。如以上方式’堆積成厚度 5 5 nm、折射率1.46之低折射率層。 -27- 201115594 接著,在該低折射率層上將銦-錫複合氧化物所構成的 透明導電性薄膜成膜。此時,將濺鑛前的壓力設定爲 O.OOOlPa,利用含有36質量%氧化錫之氧化銦(住友金屬鑛 山公司製、密度6.9g/cm3)作爲標靶,施加2W/cm2之DC電 力》且,以Ar氣體爲130sccm、02氣體以表面電阻値爲最小 時之流速流過、在〇.4Pa之大氣下利用DC磁控濺鍍法成膜。 但是,並非通常之DC,爲了防止電弧放電,使用日本ENI 製RPG-100,以50kHz周期施加5ps寬之脈衝》且,中央輥 溫度爲10 °C,進行濺鍍。 且,利用濺鍍製程監視器(LEYBOLD INFICON公司 製、XPR2)長時觀測大氣之氧分壓,並反饋到氧氣的流量計 及DC電源,使銦-錫複合氧化物薄膜中的氧化度成爲一定。 如以上方式,堆積厚度15nm、折射率1.96之銦-錫複合氧化 物所構成的透明導電性薄膜。 <觸控面板之製作> 將該透明導電性薄膜作爲一方之面板使用,作爲另一 方之面板,係於玻璃基板上使用以電漿CVD法、厚度爲20nm 之銦-錫複合氧化物薄膜(氧化錫含量·_ 1〇質量% )所構成的 透明導電性薄膜(曰本曹達公司製、S5 00)。使該2枚面板隔 著直徑30μιη之環氧化物珠配置成透明導電性薄膜爲相對 向,製作成觸控面板。 〔實施例2〕 實施例1中,作爲製作高折射率層之標靶係含有丨〇質量 %氧化錫之氧化銦(住友金屬鑛山公司製、密度7.lg/cm 3), [Si -28- 201115594 〇2氣體流量係表面電阻値爲最小時之流量的5倍以外,與實 施例1同樣地製作成透明導電性薄膜。所獲得之高折射率層 的表面電阻値爲1 X 106Ω/□以上。再者,使用該透明導電性 薄膜,與實施例1同樣地製作成觸控面板。此外,水分壓對 惰性氣體之比爲5xl(T3。 〔比較例1〕 實施例1中,作爲製作高折射率層之標靶,除了是含有 5質量%氧化錫之氧化銦(三井金屬鑛業公司製、密度7.1 g/ cm 3)以外,與實施例1同樣地製作成透明導電性薄膜。再 者,使用該透明導電性薄膜,與實施例1同樣地製作成觸控 面板。 〔比較例2〕 實施例1中,除了低折射率層之膜厚爲70 nm以外,與實 施例1同樣地製作成透明導電性薄膜。再者,使用該透明導 電性薄膜,與實施例1同樣地製作成觸控面板。 〔比較例3〕 實施例1中’除了低折射率層之膜厚爲4 Onm以外,與實 施例1同樣地製作成透明導電性薄膜。再者,使用該透明導 電性薄膜,與實施例1同樣地製作成觸控面板。 〔實施例3〕 與實施例1同樣地製作由硬塗層/二軸配向透明PET薄 膜所構成的基材/硬化物層/高折射率層/低折射率層/透明 導電性薄膜層所構成的積層體,接著在該硬塗層上順序地 積層Ti02薄膜層(折射率:2.30、膜厚15nm)、Si〇2薄膜層(折LSI -10- 201115594 A coating agent such as a polysiloxane surfactant or a fluorine surfactant. In the present invention, the prepared coating liquid is applied onto a substrate composed of a transparent plastic film. The coating method is not particularly limited, and a conventional method such as a hard coating method, a gravure coating method, or a reverse roll coating method can be used. Further, the thickness of the cured layer is preferably in the range of 〇.1 to 15 μη. The lower limit 厚度 of the thickness of the cured layer is preferably 0.5 μηη, particularly preferably Ιμιη. Further, the upper limit of the thickness of the cured layer is preferably ΙΟμηη, particularly preferably 8 μm. When the thickness of the cured layer is less than 0.1, since the crosslinked structure cannot be formed sufficiently, the pen input durability or chemical resistance is liable to be lowered, and the adhesion due to the low molecular weight of the oligomer or the like is likely to occur. reduce. On the other hand, when the thickness of the cured layer exceeds 15 μm, the productivity tends to decrease. (High refractive index layer) The high refractive index layer in the present invention is an inorganic thin film composed of an amorphous indium-tin composite oxide having a tin oxide content of 10 to 60% by mass. More preferably, the content of tin oxide is 20 to 50% by mass, and more preferably 30 to 45% by mass. The high refractive index layer has at least a layer having a refractive index of a lower refractive index layer (refractive index of 1.3 to 1.60). The interference effect of light can be obtained by forming a layer having a refractive index of a lower refractive index layer on a transparent plastic film substrate. In general, TiO 2 , Nb 2 05, and 203 203 are used as the high refractive index layer. However, when a film of TiO 2 and Nb 20 5 is formed by sputtering, for example, the film formation rate is slow and the productivity is lowered. Therefore, from the viewpoint of productivity, indium oxide is preferred as the high refractive index layer. However, indium-tin composite oxidation [Si -11-201115594 film] having a low content of Ιι 203 or tin oxide is formed, although it is excellent in productivity, but is subjected to heat treatment in sputtering film formation or touch panel manufacturing engineering. The high refractive index layer is crystallized. In a touch panel manufactured using a transparent conductive film crystallized with a high refractive index layer, the pen sliding durability in the vicinity of the frame edge is poor. Therefore, it is preferred that no crystal grains are present in the high refractive index layer. Specifically, it is preferred that no crystal grains are observed in the measurement described in the column of the examples. Therefore, the high refractive index layer used in the present invention is composed of an indium-tin composite oxide in terms of productivity, and the content of tin oxide is 10 to 60% by mass. When the content of tin oxide is less than 1% by mass, it is difficult to suppress crystallization due to heat treatment in film formation or in a touch panel manufacturing process. On the other hand, when the content of tin oxide is more than 60% by mass, it is difficult to increase the target density, and abnormal discharge is likely to occur during production, which is not preferable from the viewpoint of productivity. In addition, even if the content of tin oxide is in the range of 1 〇 to 60% by mass, there is a case where crystallization occurs due to film formation conditions in a region where the content of tin oxide is low. In particular, when the ratio of the water pressure to the inert gas is low, crystallization is easy. In the case where the content of the tin oxide is low (e.g., 20% by mass or less), in particular, by increasing the ratio of the water pressure to the inert gas, crystallization can be suppressed. The ratio of the water partial pressure to the inert gas is preferably in accordance with the content of the tin oxide. However, for example, when the tin content is 10% by mass, 3x1 0_3 or more is preferable. In order to increase the ratio of the water pressure to the inert gas, the method of increasing the water content of the film by adjusting the vacuum exposure conditions before film formation, the method of making the film temperature high during film formation, and the method of intentionally introducing water vapor are mentioned. Any method. In addition, since the moisture content of the base film to be used is about the same, it is necessary to take the test [S1 -12-201115594 to determine the appropriate conditions. Further, crystallization can be suppressed by lowering the partial pressure ratio of oxygen. The film thickness of the high refractive index layer used in the present invention is preferably 35 to 50 nm, more preferably 38 to 48 nm. When it exceeds 50 nm, the high refractive index layer is easily crystallized during film formation or after heat treatment. Further, when it is less than 35 nm, it is difficult to improve the optical characteristics of the transparent conductive film. Further, the refractive index of the high refractive index layer is preferably from 1.70 to 2.50, more preferably from 1.90 to 2.30, particularly preferably from 1.90 to 2.10. As a film forming method of the high refractive index layer in the present invention, a vacuum vapor deposition method, a sputtering method, a CVD method, an ion plating method, a spray method, or the like is known, and the above method can be suitably used in accordance with the required film thickness. However, from the viewpoint of reducing film thickness unevenness, sputtering is preferred. In the sputtering method, there are generally a reactive sputtering method in which a reactive gas is introduced from a metal target to form a metal oxide, and a method of producing a metal oxide from an oxide target. In order to suppress the unevenness of the film thickness, it is preferred to use an oxide target. In order to suppress the influence on the conductivity of the transparent conductive film interposed between the low refractive index laminated layers, the high refractive index layer used in the present invention is preferably an insulator. Specifically, it is 1 Μ 06 Ω/□ or more. Therefore, when the indium-tin composite oxide layer is formed, it is preferred to set the reactive gas to a flow rate of 1.5 to 5 times the gas flow rate when the surface resistance 値 is the minimum 。. When it is less than 1.5 times, it is difficult to set the surface resistance 値 to the above range. In addition, when a gas flow rate exceeding 5.0 times is passed, a film having a stoichiometric ratio or higher in the film or a film having a large damage due to generation of an excess of oxygen anion is likely to be formed, and an unstable film is formed, which is lowered. Stability of transparent conductive film after environmental experiment" Therefore, in order to obtain stability in high temperature and high humidity environment (85 °C, 85% RH, 1000 r > L ^ i -13 - 201115594 hours), the gas flow rate It is preferable to set the surface resistance 値 to 1.5 to 3 times the gas flow rate which is the minimum enthalpy, and therefore the content of the tin oxide is preferably 20 to 60% by mass. When the amount is less than 20% by mass, the above gas flow rate is difficult to achieve a surface resistance 1 of 1 × 〇 6 ω / □ or more. (Low Refractive Index Layer) The refractive index of the low refractive index layer in the present invention is preferably from 1.30 to 1.60, more preferably from 1.4 to 1.50. Specifically, a transparent metal oxide such as Si 02 or Α12〇3, or SiO 2 may be mentioned. When the refractive index of the layer composed of the composite metal oxide such as Al203 is less than 1.30, the low refractive index layer becomes a porous film, and the electrical properties of the transparent conductive thin film layer formed thereon are inhibited. On the other hand, when the refractive index is more than 1.60, it is difficult to satisfy the above optical characteristics. The film thickness of the low refractive index layer can be appropriately selected as long as it satisfies the spectral transmittance, total light transmittance, and color 范围 of the scope of the invention of the present application. For example, the case of the Si〇2 film is preferably 45 to 60 nm, more preferably 50 to 58 nm. When the thickness exceeds 60 nm, the light transmittance of the transparent conductive film is improved, but coloring occurs to cause the spectral transmittance and the color b値 to deviate from the target. On the other hand, in the case of less than 45 nm, it is difficult to obtain the total light transmittance of the target. As a film forming method of the low refractive index layer in the present invention, a vacuum vapor deposition method, a sputtering method, a CVD method, an ion plating method, a spray method, and the like are known, and the above method can be suitably used in accordance with the required film thickness. From the viewpoint of reducing film thickness unevenness, sputtering is preferred. Reactive DC or AC sputtering is generally used when forming by sputtering. In order to increase the film formation speed, resistance control for controlling the flow rate of the reactive gas is used to keep the voltage 値 of the DC or AC power source constant, or plasma irradiation method for controlling the flow rate of the reactive gas is used to make the electric element of the specific element m - 14 - 201115594 The luminous intensity in the slurry remains constant. (Transparent Conductive Thin Film Layer) The transparent conductive thin film layer of the present invention is composed of an inorganic thin film having a refractive index of 1.80 to 2.20. An inorganic film of 1.9 0 to 2.10 is more preferably an inorganic film of 1.93 to 2.05. When the refractive index of the transparent conductive film is less than 1.8, it is difficult to form a transparent conductive thin film layer having good conductivity. On the other hand, when the refractive index is more than 2.20, it is difficult to form a transparent conductive thin film layer having good conductivity, and further, the reflection at the interface between the air and the transparent conductive thin film layer becomes large, and it is difficult to satisfy the optical characteristics described above. Specific examples thereof include indium oxide, tin oxide, zinc oxide, indium-tin complex oxide, tin-bismuth composite oxide, and zinc-aluminum composite oxide 'indium-zinc composite oxide. Further, in order to adjust the refractive index, a metal oxide may be added as appropriate. Among these, an indium-tin composite oxide is suitable from the viewpoint of environmental stability and circuit processability. In the present invention, the transparent conductive film layer can be transparently conductive by setting the surface resistance 値 of the transparent conductive film to 50 to 5 000 Ω/□, more preferably 100 to 2000 Ω/□. The film is used in a touch panel or the like. When the surface resistance 値 is less than 100 Ω/□, the position recognition accuracy of the touch panel is deteriorated, and when it exceeds 2000 Ω/□, there is a case where it is necessary to increase the voltage applied between the electrodes of the touch panel, which is not preferable. Further, from the viewpoint of productivity, the transparent conductive film and the high refractive index layer are made of the same material, for example, an indium-tin composition is preferable. When the composition is different, it is necessary to have a target and a cathode for the high refractive index and the transparent conductive film, and the device is also a bulky device. [S1 -15- • 201115594 The layer structure of the transparent conductive film may be a single layer structure, and the laminated structure of two or more layers may be formed in the case of a transparent conductive film having a laminated structure of two or more layers. The metal oxides described above may be the same or different. The film thickness of the transparent conductive film is preferably 4 to 25 nm, more preferably 5 to 20 nm, still more preferably 8 to 18 urn. When the film thickness of the transparent conductive film is less than 4 nm, it is difficult to form a continuous film, and thus it is difficult to obtain good conductivity. On the other hand, when the film thickness of the transparent conductive film is thicker than 25 nm, the transparency is liable to be lowered, and it is difficult to obtain a film having mechanical strength capable of withstanding the bending stress near the frame edge of the touch panel. As a method of forming a transparent conductive film in the present invention, a vacuum deposition method such as a sputtering method, a CVD method, an ion plating method, a spray method, or the like is known, and the above method can be suitably used in accordance with the film thickness required. For example, in the case of a sputtering method, a general sputtering method using an oxide target or a reactive sputtering method using a metal target, etc., in this case, oxygen, nitrogen, or the like may be introduced as a reactive gas, or倂 Add ozone, plasma irradiation, ion assist and other means. Further, a bias voltage such as direct current, alternating current, or high frequency may be applied to the substrate insofar as the object of the present invention is not impaired. (Optical Characteristics of Transparent Conductive Film) The transparent conductive film of the present invention is formed by laminating a high refractive index layer, a low refractive index layer, and a transparent conductive thin film layer on a substrate composed of the above transparent plastic film. In the configuration, since there is a peak of transmittance in a specific wavelength region, it is possible to suppress a decrease in visibility even if it is disposed in front of a high-definition display. [S1 -16 * 201115594 The peak of the spectral transmittance of the transparent conductive film of the present invention is present at 45 0 to 5 3 Onm, so that the coloring is extremely small and the transmittance is excellent. Therefore, the transparent conductive film of the present invention is used for touch. When components such as a control panel are used, the visibility is excellent. Preferably, the peak transmittance of the spectral transmittance is 460 to 520 nm, and more preferably, the peak of the light transmittance is 470 to 510 nm. Further, since the transparent conductive film of the present invention has a total light transmittance of 90% or more, when the transparent conductive film of the present invention is used for a member such as a touch panel, it is possible to suppress a decrease in luminance of a liquid crystal display or the like. Further, since the color b 本 of the transparent conductive film of the present invention is -2 to 2, when the transparent conductive film of the present invention is used for a member such as a touch panel, it is possible to suppress damage to the display color of a display such as a liquid crystal display. . Preferably, the color b値 is -1.0 to 1.5, more preferably 0 to 1.5. (Preventing the generation of Newton's ring) In addition, for the purpose of preventing the generation of Newton's ring, the cured layer described in the description of the transparent plastic film has a center line average roughness (Ra) of 0.1 to 0.5 μm. The range of the method contains particles as well. When Ra is less than 0.1, it is difficult to prevent the Newton's ring from being generated. On the other hand, when Ra is more than 0.5 μΐη, the surface of the transparent conductive film is too thick, and the pen sliding durability is deteriorated. The particles to be contained in the cured layer are not particularly limited, and examples thereof include inorganic particles (for example, ceria, calcium carbonate, etc.), and heat-resistant organic particles (for example, polysiloxane particles, PTFE particles, polyimine particles, etc.). And crosslinked polymer particles (crosslinked PS particles, crosslinked acrylic particles, etc.). The average particle diameter of the particles (according to electron microscopy) is preferably 5 to 5 μm. Further, the content of the particles contained in the layer of the hardened LSi-17-201115594 is preferably 0.01 to 10% by mass. (hard coating) Further, in order to further improve the scratch resistance of the outermost layer (pen input surface) when the touch panel is used, on the opposite side of the surface of the transparent plastic film on which the transparent conductive film is formed (as a touch panel) The outermost pen input surface), preferably with a hard coat. The hardness of the hard coat layer is preferably 2H or more in pencil hardness. When the hardness is less than 2H, the hard coat layer as a transparent conductive film is insufficient in scratch resistance. The thickness of the hard coat layer is preferably 0.5 to 10 μm. When the thickness is less than 0.5 μm, it tends to be insufficient in scratch resistance, and when it is thicker than ΙΟμηη, it is not preferable from the viewpoint of productivity. The curable resin composition used for the hard coat layer is preferably a resin having an acrylate functional group, and examples thereof include a polyester resin having a lower molecular weight, a polyether resin, an acrylic resin, an epoxy resin, and an amine group. Oligomers or prepolymers such as (meth) acrylates of polyfunctional compounds such as acid ester resins, alkyd resins, spiroacetal resins, polybutadiene resins, polythiol polyene resins, and polyhydric alcohols Things and so on. And 'as a reactive diluent, a large amount of ethyl (meth) acrylate, ethyl hexyl (meth) acrylate, styrene, methyl benzene, N-vinyl pyrrolidone, etc. are used in a large amount. Monofunctional monomers and polyfunctional monomers, such as trimethyl methoxide tri (meth) acrylate, hexane diol (meth) acrylate, tripropylene glycol di (meth) acrylate, diethylene glycol II (Meth)acrylic acid vinegar, pentaerythritol tri(meth)acrylate, dipentaerythritol hexa(meth)acrylate vinegar, 1,6-hexanediol di(meth)acrylate, neopentyl Alcohol di(methyl)propene 201115594 enoate or the like. In the present invention, it is preferred to mix urethane acrylate as an oligomer, and to mix bis(penta) pentaerythritol pentoxide as a monomer. Further, as a hardening type resin composition used for the above hard coat layer, a mixture of a polyester acrylate and a polyurethane acrylate is particularly suitable. The polyester acrylate coating film is very hard and is suitable as a hard coat layer. However, when the polyester acrylate is coated alone, it has a problem that the punching resistance is low and it is easy to become brittle. Therefore, in order to impart impact resistance and flexibility to the coating film, it is preferred to use a polyurethane acrylate. In other words, by using polyurethane acrylate in polyester acrylate, the hardness of the coating film as a hard coat layer can be maintained, and the function of punching resistance and flexibility can be maintained. The blending ratio of the two is preferably 30 parts by mass or less based on 100 parts by mass of the polyester acrylate resin. When the addition ratio of the polyurethane acrylate resin is more than 30 parts by mass, the coating film is too soft and the punching resistance tends to be insufficient. The hardening method of the above-mentioned hardening type resin composition can be carried out by a usual hardening method, that is, a method of hardening by heating, electron beam or ultraviolet irradiation. For example, the case of electron beam hardening is based on Cockcroft-Walton type, Van de Graaff type, resonant transformer type, insulated core transformer type, linear type, and dinam (^ An electron beam having an energy of 50 to 1 000 keV, preferably 100 to 300 keV, which is emitted by various electron beam accelerators such as a type 1 and a high frequency type. Moreover, in the case of ultraviolet curing, ultraviolet rays emitted from light such as an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a low pressure mercury lamp, a carbon arc, a xenon arc, a metal halide lamp, etc. may be used. -19- 201115594 In addition, in the case of ionizing radiation hardening, It is preferred to contain a photopolymerization initiator or a photosensitizer in the curable resin composition. Examples of the photopolymerization initiator include acetophenones, benzophenones, Michler-Benzoyl benzoate, α-Amyloxim ester, and tetrasulfide tetrasulfide. Tetramethyithiuram monosulfide, thioxanthone, etc. Further, as the photosensitizer, n-butylamine, triethylamine, tri-n-butylphosphine or the like is preferred. In order to impart anti-glare property to the hard coat layer, a method of dispersing inorganic particles such as CaC03 or SiO 2 to a curable resin or a method of forming irregularities on the surface of the hard coat layer is effective. For example, in order to form irregularities, after coating with a coating liquid containing a curable resin composition, a film having a convex shape on the surface is laminated, and ultraviolet rays are irradiated from the shaped film to harden the hardening resin, and only the peeling is performed. Obtained as a film. The above-mentioned shaped film can be formed by providing a desired convex shape on a base film such as polyethylene terephthalate having a release property (hereinafter sometimes referred to as PET) or on a base film such as PET. Slim convex layer, etc. The formation of the convex layer can be obtained, for example, by applying a resin composition composed of inorganic particles and a binder resin to a base film. As the binder resin, for example, an acrylic polyol crosslinked with a polyisocyanate is used, and as the inorganic particles, CaC03, SiO 2 or the like can be used. Further, other types of mat type PET in which inorganic particles such as SiO 2 are mixed may be used in the production of PET. When the coating film is laminated on the coating film of the ultraviolet curable resin, and the coating film is cured by irradiation with ultraviolet rays, and the film is a film having PET as a substrate -20-201115594, the short-wavelength side of the ultraviolet ray is absorbed. The film has the disadvantage of insufficient hardening of the ultraviolet curable resin. Therefore, it is necessary to use a coating film laminated on the coating film of the ultraviolet curable resin to have a total light transmittance of 20% or more. Further, when it is used in a touch panel, since the transmittance of visible light is further increased, it is also possible to perform low reflection treatment on the hard coat layer. This low reflection treatment is preferably a single layer or a layer of two or more layers having a refractive index different from the refractive index of the hard coat layer. In the case of a single layer structure, it is preferred to use a material having a smaller refractive index than the hard coat layer. Further, in the case of a multilayer structure of two or more layers, a layer adjacent to the hard coat layer is made of a material having a larger refractive index than the hard coat layer, and a layer having a smaller refractive index is preferably used as the layer thereon. As the material constituting such a low reflection treatment, the organic material or the inorganic material is not particularly limited as long as it satisfies the above refractive index. For example, a dielectric such as CaF2, MgF2, NaAlF4, SiO2, ThF4, Zr02, Nd203, Sn?2, Ti02, Ce02, ZnS, In2?3 is preferably used. The low-reflection treatment is a dry coating method such as a vacuum distillation method, a pendulum method, a CVD method, or an ion plating method, or a wet coating method such as a gravure coating method, a reverse roll coating method, or a die coating method. Furthermore, before the low-reflection treatment layer is laminated, corona discharge treatment, plasma treatment, sputtering uranium engraving treatment, electron beam irradiation treatment, external radiation treatment, primer coating may be performed on the hard coating layer. Surface treatment such as primer treatment, easy bonding treatment, and the like. (Transparent Conductive Sheet) [Si-21-201115594 The transparent conductive sheet of the present invention is bonded to the opposite side of the surface of the transparent conductive film of the present invention in which the transparent conductive film layer is laminated, and is adhered and transparent by a binder. The resin sheet was laminated. The transparent conductive sheet of the present invention can be used as a fixed electrode of a touch panel. That is, the substrate of the fixed electrode of the touch panel is changed from glass to the transparent resin sheet of the present invention, whereby a lightweight and non-cleavable touch panel can be produced. The binder is not particularly limited as long as it has transparency. For example, an acrylic binder, a polyoxynene binder, a rubber binder, or the like is suitable. The thickness of the binder is not particularly limited, but it is usually desirably set in the range of 1 to ΙΟΟμηη. When the thickness of the adhesive is less than the thickness of Ιμηι, it is difficult to obtain a practically non-problem adhesive property, and when it exceeds the thickness of 100 μm, it is not preferable from the viewpoint of productivity. The transparent resin sheet to be bonded by the adhesive is preferably used in a thickness of 〇. 5 to 5 in order to impart mechanical strength equivalent to that of glass. When the thickness of the transparent resin sheet is less than 〇5 mm, the mechanical strength is insufficient compared to the glass. On the other hand, when the thickness is more than 5 mm, it is too thick to be used in a touch panel. Further, the material of the transparent resin sheet can be the same as that of the above transparent plastic film. (Touch Panel) The touch panel is a pair of transparent conductive substrates (any of a film, a glass, and a sheet) having a transparent conductive film layer, and the transparent conductive film layers are disposed to face each other with a spacer interposed therebetween. When the characters are input by the pen, the opposing transparent conductive films are brought into contact with each other by the push of the pen, and the power source is turned ON, and the position of the pen on the touch panel can be detected. The text can be recognized from the trajectory of the pen by detecting the position of the pen continuously and correctly -22-201115594. In the touch panel of the present invention, the transparent conductive film of the present invention is used in at least one of the transparent conductive substrates. In this case, when the transparent conductive film of the present invention is used as the movable electrode of the present invention, the visibility is not lowered even if it is incorporated in a display such as a high-definition liquid crystal display, and the pen sliding durability is excellent. It can be a long-term stable touch panel. Fig. 1 shows an example of a touch panel using the transparent conductive film of the present invention. Further, Fig. 2 is a cross-sectional view showing a plastic touch panel which does not use a glass substrate, which is obtained by using the transparent conductive film of the present invention and a transparent conductive sheet. Since the plastic touch panel does not use glass, it is very light and does not crack due to smashing. [Examples] Hereinafter, the present invention will be described in further detail based on examples, but the present invention is not limited by the examples. Further, the properties of the transparent conductive film, the crystallinity of the high refractive index layer, the transparent conductive film, and the pen sliding durability test of the touch panel were measured by the following methods. (1) Total light transmittance The light transmittance was measured by NDH-1001DP manufactured by Nippon Denshoku Industries Co., Ltd. according to JIS-K7136. (2) Surface resistance 値 According to JIS-K7 194, the measurement system is measured using the Mitsubishi Oil Chemical Co., Ltd. Lotest AMCP-T4 00. (3) Color (a値, b値) -23- 201115594 According to JIS-K7 105, the color is measured by the standard light C/2 using a color difference meter (Japan Electric Industrial Co., Ltd. 'ZE-2 0 0 0) b値. (4) Peak-wavelength of spectral transmittance The light is irradiated on the side of the transparent conductive film in the range of 380 to 780 nm by a spectrophotometer (Hitachi U-3500 type), and the measurement of indoor air as a transmittance is measured. According to the measurement result, the wavelength at which the transmittance is the largest is used as the peak wavelength. (5) Crystallinity of High Refractive Index Layer and Transparent Conductive Film A film sample sheet in which a high refractive index layer and a transparent conductive film are laminated is cut into a square of 300 μm χ 300 μm, and a sample holder for an ultramicrotome (Ultramicrotome) is used. Fix the film side to the front. Next, the knives were placed at an extremely acute angle with respect to the film surface of the observation site having a target of Ιμιη xl μιη or more, and cut at a thickness of 7 〇 nm. On the surface side of the conductive film of the slice and the portion where the film was not significantly damaged, the observation field of Ιμιη χ1 μπι was secured, and the transmission electron microscope (JE-2010, JEM-2010) was used to accelerate the voltage at 200 kV and the bright field observation magnification was 5 Photographic photography was performed 10,000 times to evaluate crystallinity. (6) The pen sliding durability test near the edge of the frame is offset from the inside of the bonding portion of the touch panel by a distance of 1.5 mm. A pen of polyacetal (front end shape: 0.8 sunning R) is applied with a load of 2.5 N. The touch panel was subjected to a linear sliding test of 10,000 times (reciprocating 5,000 times). At this time, the sliding distance is 30 ug and the sliding speed is 60 sec/sec. Furthermore, the gap between the upper and lower substrates of the touch panel is 15 〇 μηη. After this sliding durability test, first, it was visually observed whether or not the sliding portion was whitened. Further, the vicinity of the sliding portion was observed with a microscope to observe the presence or absence of [Si -24-201115594 crack generation. Further, the ON resistance (the resistance 可 when the movable electrode (thin film electrode) and the fixed electrode are in contact with each other when the sliding portion is pressed by the pen load 1. ON is measured. (7) Pen sliding durability test ’ 施加 A 2.5N load was applied to a pen made of polyacetal (front end shape: 〇.8mmR), and a linear sliding test was performed on the touch panel 100,000 times (reciprocating 50,000 times). At this time, the sliding distance is 30 circles and the sliding speed is 60 mi / sec. After this sliding durability test, first, it was visually observed whether or not the sliding portion was whitened. Further, a pen load of 0.5 N is applied to the sliding portion, and 20 is marked with a mark of 0 to evaluate whether the touch panel can correctly read the record. Further, the ON resistance (the resistance 値 when the movable electrode (thin film electrode) and the fixed electrode are in contact with each other when the sliding portion is pressed with a pen load of 0.5 N) is measured. (8) Environmental test under high temperature and high humidity LH43-12P manufactured by NAGANO Scientific Machinery Co., Ltd. was used to expose the transparent conductive film for 1,000 hours at 85 ° C and 85% RH. After the treatment, the surface resistance 値, the light transmittance, and the color were measured. (9) Film thickness of the high refractive index layer, the low refractive index layer, and the transparent conductive thin film layer The thin film sample sheet in which the high refractive index layer, the low refractive index layer, and the transparent conductive thin film layer are laminated is cut into one surface xl〇nim The size is embedded in an epoxy resin for electron microscopy. This was attached to a sample holder of an ultramicrotome to prepare a thin section slice parallel to the short side of the embedded sample piece. Then, a photograph was taken by a transmission electron microscope (JE-2010, manufactured by JEOL Co., Ltd.) at an acceleration voltage of 200 kV and a bright field observation magnification of 10,000 times in a portion where the film of the slice was not significantly damaged, and the photograph was obtained from the obtained photograph. Film thickness: -25- 201115594 (ίο) The refractive index of the high refractive index layer, the low refractive index layer, and the transparent conductive thin film layer is prepared for each layer on the tantalum wafer under the same film forming conditions. The refractive index of 550 nm was evaluated by an Ellipsometer (manufactured by Otsuka Electronics Co., Ltd., FE-500). Further, the spectral transmittance measurement data of the film provided with each layer was subjected to fitting using an optical simulation software to calculate the refractive index. At this time, the film thickness of each layer was evaluated by the above-mentioned film thickness evaluation method. Further, it was confirmed that the refractive index of each layer thus calculated and the refractive index of each layer on the germanium wafer were not greatly different. [Example 1] Toluene/MEK (80/20: as a solvent) was added to an acrylic resin (Seikabeam EXF-0 1 J, manufactured by Daisei Seiki Co., Ltd.) containing 1 part by mass of a photopolymerization initiator. The mixed solvent of the mass ratio was 50% by mass of the solid content, and the mixture was stirred and uniformly dissolved to prepare a coating liquid. A biaxially oriented transparent PET film (manufactured by Toyobo Co., Ltd., A43 40, thickness: 188 μm) having an easy-to-bond layer on both sides was coated with a Meyer Bar to form a coating film thickness to form 5 μm. After drying at 80 ° C for 1 minute, ultraviolet rays (light quantity: 300 mJ/cm 2 ) were irradiated by an ultraviolet irradiation device (manufactured by Eye Graphics Co., Ltd., UB042-5AM-W type) to cure the coating film. Next, the coating film was applied to the reverse side in the same manner, and then heat-treated at 1 80 ° C for 1 minute to reduce the volatile component. Further, in order to vacuum-expose the biaxially aligned transparent PET film in which the cured layer is laminated, the rewinding treatment is performed in the vacuum processing chamber. The pressure at this time was 〇.〇〇2Pa, and the exposure time was 20 minutes. Moreover, the temperature of the center roll is 40 °C. -26- 201115594 Next, a high refractive index layer composed of an indium-tin composite oxide is formed on the cured layer. At this time, the pressure before the sputtering was set to 0.0001 Pa, and DC power of 2 W/cm 2 was applied using indium oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density: 6.9 g/cm 3 ) containing 36% by mass of tin oxide as a target. Further, Ar gas was flowed at a flow rate of 3 times the flow rate of 〇2 at a surface resistance 値 of 130 sccm and 02 gas, and a film was formed by DC magnetron sputtering in an atmosphere of 〇.4 Pa. However, it is not a normal DC, and in order to prevent arc discharge, a pulse of 5 μs width is applied at a cycle of 50 kHz using the RPG-100 manufactured by Japan ENI. Further, the center roll temperature was 〇 ° C and sputtering was performed. Furthermore, the oxygen partial pressure of the atmosphere is observed for a long time by a sputtering process monitor (manufactured by LEYBOLD INFICON Co., Ltd., XPR2), and is fed back to the oxygen flow meter and the DC power source to make the oxidation degree in the indium-tin composite oxide film constant. . As in the above manner, a high refractive index layer composed of an indium-tin composite oxide having a thickness of 45 nm is deposited. The surface resistivity 高 of the high refractive index layer thus obtained is 1 X 1 06 Ω/□ or more. Further, in order to form a SiO 2 film as a low refractive index layer on the high refractive layer, and use yttrium as a target, a DC magnetron sputtering method, a vacuum degree of 0.27 Pa, an Ar gas as a gas of 500 sccm, and 02 gas are used. Flowed at a flow rate of 80 sccm. Further, a chill roll of 〇 ° C was placed on the back surface of the substrate to cool the transparent plastic film. The target was supplied with power of 7.8 W/cm 2 at this time, and the dynamic rate was 23 nm.m / min. Further, when the voltage 値 in the film formation is observed for a long period of time, the flow meter is fed back to the oxygen gas to make the voltage 値 constant. As described above, a low refractive index layer having a thickness of 5 5 nm and a refractive index of 1.46 was deposited. -27-201115594 Next, a transparent conductive film made of an indium-tin composite oxide is formed on the low refractive index layer. At this time, the pressure before the splashing was set to 0.000 lPa, and the indium oxide containing 36% by mass of tin oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density 6.9 g/cm 3 ) was used as a target, and DC power of 2 W/cm 2 was applied. Further, a film was formed by a DC magnetron sputtering method in which an Ar gas was 130 sccm and a gas flow rate of the 02 gas was minimized at a surface resistance 値. However, it is not a normal DC, and in order to prevent arc discharge, a pulse of 5 ps width is applied at a cycle of 50 kHz using a RPG-100 manufactured by ENI, Japan, and a center roll temperature of 10 ° C is used for sputtering. In addition, the oxygen partial pressure of the atmosphere is observed for a long time by a sputtering process monitor (XPR2 manufactured by LEYBOLD INFICON Co., Ltd.), and the oxygen flow meter and the DC power source are fed back to make the oxidation degree in the indium-tin composite oxide film constant. . As described above, a transparent conductive film composed of an indium-tin composite oxide having a thickness of 15 nm and a refractive index of 1.96 was deposited. <Production of Touch Panel> The transparent conductive film is used as one of the panels, and the other panel is an indium-tin composite oxide film having a thickness of 20 nm by plasma CVD on the glass substrate. A transparent conductive film (manufactured by Sakamoto Co., Ltd., S5 00) made of (tin oxide content·_1% by mass). The two panels were placed in a transparent conductive film with a diameter of 30 μm epoxide beads interposed therebetween to form a touch panel. [Example 2] In Example 1, as a target for producing a high refractive index layer, indium oxide containing bismuth by mass of tin oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density: 7.lg/cm 3 ), [Si - 28-201115594 A transparent conductive film was produced in the same manner as in Example 1 except that the gas flow rate was five times the flow rate at which the surface resistance 値 was the smallest. The surface resistivity 高 of the obtained high refractive index layer was 1 X 106 Ω/□ or more. Further, using this transparent conductive film, a touch panel was produced in the same manner as in Example 1. Further, the ratio of the water pressure to the inert gas was 5 x 1 (T3. [Comparative Example 1] In Example 1, as a target for producing a high refractive index layer, in addition to indium oxide containing 5 mass% of tin oxide (Mitsui Metal Mining Co., Ltd. A transparent conductive film was produced in the same manner as in Example 1 except that the density was 7.1 g/cm 3 . Further, a transparent touch film was used to prepare a touch panel in the same manner as in Example 1. [Comparative Example 2 In the first embodiment, a transparent conductive film was produced in the same manner as in Example 1 except that the film thickness of the low refractive index layer was 70 nm. Further, the transparent conductive film was used in the same manner as in Example 1. [Comparative Example 3] A transparent conductive film was produced in the same manner as in Example 1 except that the film thickness of the low refractive index layer was 4 Onm in Example 1. Further, the transparent conductive film was used. A touch panel was produced in the same manner as in Example 1. [Example 3] A substrate/cured layer/high refractive index layer composed of a hard coat layer/biaxially oriented transparent PET film was produced in the same manner as in Example 1. Low refractive index layer / transparent conductive thin Layer laminate composed, on the hard coat layer is then sequentially laminated Ti02 film layer (refractive index: 2.30, thickness of 15nm), a thin film layer Si〇2 (off
Si -29- 201115594 射率:1.46、膜厚29nm)、Ti〇2薄膜層(折射率·· 2.30、膜厚 109nm)、Si02薄膜層(折射率·· 1.46、膜厚87nm),藉此形 成反射防止處理層》爲了形成Ti02薄膜層,用鈦作爲標靶, 利用直流磁控濺鑛法、真空度爲0.2 7Pa、作爲氣體之Ar氣 體爲5 00sccm、02氣體爲80sccm之流速流過。且,在基板背 面設有表面溫度爲0°C之冷卻輥,冷卻了透明塑膠薄膜。對 此時之標靶供給7.8W/cm2之電力,動態率爲23nm. m/分。 爲了形成Si02薄膜,用矽作爲標靶,利用直流磁控濺 鍍法、以真空度爲〇.27Pa、作爲氣體之Ar氣體爲50〇SCCm、 〇2氣體爲80sccm之流速流過。且,在基板背面設有〇°C之冷 卻輥,冷卻了透明塑膠薄膜。對此時之標靶供給7.8 W/on 2 之電力,動態率爲23nm . m/分。再者,將該透明導電性薄 膜作爲一方之面板使用,與與實施例1同樣地製作成觸控面 板。 〔實施例4〕 將與實施例1同樣地製作成的透明導電性薄膜,藉由丙 烯酸系黏合劑,貼合於厚度爲1.0IM1之聚碳製薄片,製作成 透明.導電性積層薄片。將該透明導電性積層薄片作爲固定 電極使用,將實施例1之透明導電性薄膜用於可動電極,與 實施例1同樣地製作成觸控面板。 〔實施例5〕 實施例1中,作爲低折射率層,除了將氟化鎂(MgF2) 所構成的薄膜成膜以外,與實施例1同樣地形成了透明導電 性薄膜。Si -29-201115594 Emissivity: 1.46, film thickness: 29 nm), Ti〇2 film layer (refractive index · 2.30, film thickness: 109 nm), SiO 2 film layer (refractive index · 1.46, film thickness: 87 nm), thereby forming In order to form a TiO 2 film layer, titanium was used as a target, and a DC magnetron sputtering method was used, and a flow rate of 0.27 Pa, a gas of Ar gas of 500 sccm, and a gas of 02 gas of 80 sccm flowed. Further, a cooling roll having a surface temperature of 0 ° C was provided on the back surface of the substrate to cool the transparent plastic film. The power of 7.8 W/cm2 was supplied to the target at this time, and the dynamic rate was 23 nm.m/min. In order to form a SiO 2 film, ruthenium was used as a target, and a DC magnetron sputtering method was used to flow at a flow rate of 27.27 Pa, a gas of Ar gas of 50 〇SCCm, and a gas of 〇2 of 80 sccm. Further, a cooling roller of 〇 ° C was provided on the back surface of the substrate to cool the transparent plastic film. At this time, the target supplies 7.8 W/on 2 of power with a dynamic rate of 23 nm.m/min. Further, this transparent conductive film was used as one of the panels, and a touch panel was produced in the same manner as in the first embodiment. [Example 4] A transparent conductive film produced in the same manner as in Example 1 was bonded to a polycrystalline carbon sheet having a thickness of 1.0 IM1 by an acrylic adhesive to prepare a transparent, electrically conductive laminated sheet. The transparent conductive laminated sheet was used as a fixed electrode, and the transparent conductive film of Example 1 was used for a movable electrode, and a touch panel was produced in the same manner as in Example 1. [Example 5] A transparent conductive film was formed in the same manner as in Example 1 except that a film made of magnesium fluoride (MgF2) was formed as a film of the low refractive index.
[S -30- 201115594 此時,將濺鍍前的壓力設定爲O.OOOlPa,作爲標靶係 使用氣化鎂(三井金屬製),施加2W /cm2之13·56ΜΗζ高頻電 力,利用磁控濺鍍法、真空度爲0.2 7Pa、作爲氣體之Ar氣 體係以50〇SCCm之流速流過,進行成膜。且,長時觀測成膜 中的電壓値,並反饋到氧氣的流量計使電壓値成爲一定。 如以上方式,堆積成厚度60nm、折射率1.36之低折射率層。 再者,使用該透明導電性薄膜,與實施例1同樣地製作 成觸控面板。 〔實施例6〕 實施例1中,除了在硬化物層上將鋁-矽複合氧化物 (Al 203-Si02)所構成的薄膜予以成膜作爲低折射率層以 外,與實施例1同樣地形成了透明導電性薄膜。 此時,將濺鍍前的壓力設定爲O.OOOlPa,用Al-Si(50: 50wt% )(三井金屬製)作爲標靶,施加2W/cm 2之DC電力, 利用磁控濺鍍法、真空度爲〇.27Pa、作爲氣體之Ar氣體係 以500sccm、02氣體係以80sccm之流速流過,進行成膜。且, 長時觀測成膜中的電壓値,並反饋到氧氣的流量計使電壓 値成爲一定。如以上方式,堆積成厚度50nm、折射率1.55 之低折射率層。再者,使用該透明導電性薄膜,與實施例1 同樣地製作成觸控面板。 [實施例7〕 實施例1中,作爲製作高折射率層之標靶,係含有2 0 質量%氧化錫之氧化銦(住友金屬鑛山公司製、密度7.0 g/ era3),除了 〇2氣體流量係表面電阻値爲最小時的流量之4倍 IS1 -31 - 201115594 以外,與實施例1同樣地製作成透明導電性薄膜。獲得之高 折射率層的表面電阻値爲1χ 106Ω/□以上。再者,使用該透 明導電性薄膜,與實施例1同樣地製作成觸控面板。 〔實施例8〕 實施例1中,除了將經摻雜鎵之氧化鋅薄膜用於作爲透 明導電性薄膜以外,與實施例1同樣地製作成透明導電性薄 膜。作爲標靶係使用含有5質量%氧化鎵之氧化鋅(東曹公 司製),施加有2W/cm2之DC電力。且,Ar氣體爲130sccm' 〇2氣體係以表面電阻値成爲最小時之流速流過,〇.4Pa之雰 圍下,利用DC磁控濺鍍法成膜,獲得厚度14nm、折射率2.05 的透明導電性薄膜。再者,使用該透明導電性薄膜、與實 施例1同樣地製作成觸控面板。 〔實施例9〕 除了高折射率層之厚度爲40 nm以外,與實施例1同樣地 製作成透明導電性薄膜及觸控面板。 〔實施例1 〇〕 除了低折射率層之厚度爲5 Onm以外,與實施例1同樣地 製作成透明導電性薄膜及觸控面板。 〔實施例1 1〕 除了透明導電性薄膜之厚度爲1 Onm以外,與與實施例1 同樣地製作成透明導電性薄膜及觸控面板。 〔實施例1 2〕 除了透明導電性薄膜之厚度爲2 2 nm以外,與實施例1 同樣地製作成透明導電性薄膜及觸控面板。[S -30- 201115594 At this time, the pressure before the sputtering is set to 0.0000 PaPa, and the target system is made of magnesium carbide (manufactured by Mitsui Metals Co., Ltd.), and the high frequency power of 13·56 2 of 2 W /cm 2 is applied, and the magnetic control is utilized. The sputtering method and the degree of vacuum were 0.27 Pa, and the Ar gas system as a gas was flowed at a flow rate of 50 〇SCCm to form a film. Moreover, the voltage 値 in the film formation is observed for a long time, and the flow meter fed back to the oxygen makes the voltage 値 constant. As described above, a low refractive index layer having a thickness of 60 nm and a refractive index of 1.36 was deposited. Further, a touch panel was produced in the same manner as in Example 1 using this transparent conductive film. [Example 6] Example 1 was formed in the same manner as in Example 1 except that a film made of an aluminum-bismuth composite oxide (Al 203-SiO 2 ) was formed as a low refractive index layer on the cured layer. A transparent conductive film. At this time, the pressure before the sputtering was set to 0.001 lPa, and Al-Si (50: 50 wt%) (manufactured by Mitsui Metals Co., Ltd.) was used as a target, and DC power of 2 W/cm 2 was applied, by magnetron sputtering, The degree of vacuum was 〇.27 Pa, and the Ar gas system as a gas was flowed at a flow rate of 80 sccm at a flow rate of 500 sccm and an 02 gas system to form a film. Moreover, the flow rate 値 in the film formation for a long time and the flow meter fed back to the oxygen makes the voltage 値 constant. As described above, a low refractive index layer having a thickness of 50 nm and a refractive index of 1.55 was deposited. Further, a touch panel was produced in the same manner as in Example 1 using this transparent conductive film. [Example 7] In Example 1, as a target for producing a high refractive index layer, indium oxide containing 20% by mass of tin oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density 7.0 g/era3), except for 〇2 gas A transparent conductive film was produced in the same manner as in Example 1 except that the flow rate was 4 times the flow rate at which the surface resistance 値 was the smallest. The surface resistance 値 of the obtained high refractive index layer was 1 χ 106 Ω/□ or more. Further, using this transparent conductive film, a touch panel was produced in the same manner as in Example 1. [Example 8] A transparent conductive film was produced in the same manner as in Example 1 except that a gallium-doped zinc oxide film was used as the transparent conductive film. As the target system, zinc oxide containing 5% by mass of gallium oxide (manufactured by Tosoh Corporation) was used, and DC power of 2 W/cm 2 was applied. Further, the Ar gas is a 130 sccm' 〇 2 gas system, and the surface resistance 値 becomes the minimum flow rate, and a film is formed by DC magnetron sputtering in an atmosphere of 4. 4 Pa to obtain a transparent conductive layer having a thickness of 14 nm and a refractive index of 2.05. Film. Further, a touch panel was produced in the same manner as in Example 1 using this transparent conductive film. [Example 9] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the high refractive index layer was 40 nm. [Example 1] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the low refractive index layer was 5 Onm. [Example 1 1] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the transparent conductive film was 1 Onm. [Example 1 2] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the transparent conductive film was 2 2 nm.
LSI •32- 201115594 〔實施例1 3〕 實施例1中,作爲製作高折射率層之標靶,除了含有55 質量%氧化錫之氧化銦(住友金屬鑛山公司製、密度6.7 g/ cm 3)、〇2氣體流量係表面電阻傅爲最小時之流量的2.5倍以 外,與實施例1同樣地製作成透明導電性薄膜。獲得之高折 射率層的表面電阻値爲1χΐ〇6Ω/□以上。再者,使用該透明 導電性薄膜,與實施例1同樣地製作成觸控面板: 〔比較例4〕 實施例1中,除了將锆氧化-矽複合氧化物(Zr02-Si02) 所構成的薄膜予以成膜作爲低折射率層以外,與實施例1 同樣地形成了透明導電性薄膜。 此時,將濺鍍前的壓力設定爲O.OOOlPa,使用ZrSi2(三 井金屬製)作爲標靶,施加2W/cm 2之DC電力,利用直流磁控 濺鍍法、真空度爲〇.27Pa、作爲氣體之Ar氣體係以 500sccm、〇2氣體係以80sccm之流速流過,進行成膜。且, 長時觀測成膜中的電壓値,並反饋到氧氣的流量計使電壓 値成爲一定。如以上方式,堆積成厚度45nm、折射率1.75 之低折射率層。 〔比較例5〕 實施例2中,除了使製膜前之重繞時的壓力進一步提高 1位爲0.0 0 0 2 P a以外,與實施例2同樣地製作成透明導電性 薄膜。此時的水分壓對惰性氣體之比爲1χ1〇_3。再者’使 用該透明導電性薄膜,與實施例1同樣地製作成觸控面板。 〔比較例6〕 r r- I ^ -33- 201115594 實施例1中,作爲製作高折射.率層之標靶,係含有75 質量%氧化錫之氧化銦(住友金屬鑛山公司製、密度5.8 g/ cm 3),02氣體流量係表面電阻値爲最小時之流量的2倍。但 是,濺鍍中經常發生異常放電,無法將高折射率層成膜。 〔比較例7〕 實施例1中,除了將摻雜有鈦及錫之氧化銦薄膜使用於 透明導電性薄膜以外,與與實施例1同樣地製作成透明導電 性薄膜。作爲標靶係使用氧化銦:氧化錫:氧化鈦=6 0 : 10: 30重量%(住友金屬鑛山公司製),施加2W/cm2之DC電 力。且,Ar氣體係以130sccm、02氣體係以表面電阻値爲最 小時之流速流過,在0.4Pa之大氣下利用DC磁控濺鍍法成 膜,獲得厚度15nm、折射率2.25之透明導電性薄膜。 再者,使用該透明導電性薄膜,與實施例1同樣地製作 成觸控面板。 〔比較例8〕 實施例1中,將摻雜有矽及錫之氧化銦薄膜使用於透明 導電性薄膜以外,與實施例1同樣地製作成透明導電性薄 膜。作爲標靶係使用氧化銦:氧化錫:氧化矽=60 : 1 0 : 30重量%(住友金屬鑛山公司製),施加2W/cm 2之DC電力。 且,Ar氣體係以130sccm、02氣體係以表面電阻値爲最小時 之流速流過,在0.4 Pa之雰圍下利用DC磁控濺鍍法成膜,獲 得厚度18nm、折射率1.75之透明導電性薄膜。再者,使用 該透明導電性薄膜,與實施例1同樣地製作成觸控面板。 iSl -34- 201115594 〔比較例9〕 除了高折射率層之厚度爲3 0nm以外’與實施例1同樣地 製作成透明導電性薄膜及觸控面板。 〔比較例1 〇〕 除了高折射率層之厚度爲60nm以外,與與實施例1同樣 地製作成透明導電性薄膜及觸控面板。 〔比較例1 1〕 除了透明導電性薄膜之厚度爲30nm以外,與實施例1 同樣地製作成透明導電性薄膜及觸控面板。LSI • 32-201115594 [Example 1 3] In Example 1, as a target for producing a high refractive index layer, indium oxide containing 55 mass% of tin oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density 6.7 g/cm 3 ) In the same manner as in Example 1, a transparent conductive film was produced in the same manner as in Example 1 except that the gas flow rate was 2.5 times the flow rate at which the surface resistance was the smallest. The surface resistance 値 of the obtained high refractive index layer is 1 χΐ〇 6 Ω / □ or more. Further, a touch panel was produced in the same manner as in Example 1 using the transparent conductive film: [Comparative Example 4] A film composed of zirconium oxide-ruthenium composite oxide (Zr02-SiO 2 ) was used in Example 1. A transparent conductive film was formed in the same manner as in Example 1 except that a film was formed as a low refractive index layer. At this time, the pressure before the sputtering was set to 0.001 Pa, and ZrSi 2 (manufactured by Mitsui Metals Co., Ltd.) was used as a target, and DC power of 2 W/cm 2 was applied, and the DC magnetron sputtering method was used, and the degree of vacuum was 2727 Pa. The Ar gas system as a gas was flowed at a flow rate of 80 sccm at a flow rate of 500 sccm and a helium gas system to form a film. Moreover, the flow rate 値 in the film formation for a long time and the flow meter fed back to the oxygen makes the voltage 値 constant. As described above, a low refractive index layer having a thickness of 45 nm and a refractive index of 1.75 was deposited. [Comparative Example 5] A transparent conductive film was produced in the same manner as in Example 2 except that the pressure at the time of rewinding before film formation was further increased by one bit to 0.00 2 P P a . The ratio of the water pressure to the inert gas at this time was 1χ1〇_3. Further, using the transparent conductive film, a touch panel was produced in the same manner as in the first embodiment. [Comparative Example 6] r r- I ^ -33- 201115594 In Example 1, as a target for producing a high refractive index layer, indium oxide containing 75 mass% of tin oxide (manufactured by Sumitomo Metal Mining Co., Ltd., density 5.8) g/cm 3), 02 gas flow rate is twice the flow rate when the surface resistance 値 is the minimum. However, abnormal discharge often occurs during sputtering, and the high refractive index layer cannot be formed into a film. [Comparative Example 7] A transparent conductive film was produced in the same manner as in Example 1 except that the indium oxide film doped with titanium and tin was used for the transparent conductive film. As the target system, indium oxide: tin oxide: titanium oxide = 60: 10: 30% by weight (manufactured by Sumitomo Metal Mining Co., Ltd.) was used, and DC power of 2 W/cm 2 was applied. Further, the Ar gas system was flowed at a flow rate of the surface resistance 値 at a minimum of 130 sccm and an 02 gas system, and a film was formed by DC magnetron sputtering at an atmosphere of 0.4 Pa to obtain a transparent conductivity of 15 nm in thickness and 2.25 in refractive index. film. Further, a touch panel was produced in the same manner as in Example 1 using this transparent conductive film. [Comparative Example 8] A transparent conductive film was produced in the same manner as in Example 1 except that the indium oxide film doped with antimony and tin was used for the transparent conductive film. Indium oxide: tin oxide: yttrium oxide = 60:10: 30% by weight (manufactured by Sumitomo Metal Mining Co., Ltd.) was used as a target system, and DC power of 2 W/cm 2 was applied. Further, the Ar gas system was flowed at a flow rate of a surface resistance 値 of 130 sccm and an 02 gas system, and a film was formed by DC magnetron sputtering in an atmosphere of 0.4 Pa to obtain a transparent conductive layer having a thickness of 18 nm and a refractive index of 1.75. film. Further, a touch panel was produced in the same manner as in Example 1 using the transparent conductive film. iSl-34-201115594 [Comparative Example 9] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the high refractive index layer was 30 nm. [Comparative Example 1] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the high refractive index layer was 60 nm. [Comparative Example 1 1] A transparent conductive film and a touch panel were produced in the same manner as in Example 1 except that the thickness of the transparent conductive film was 30 nm.
表面舰率 (0/□> (%) 彩色 _ $値波严 高折曲率層之 結晶狀態 道明導霉性Ml之 a b 實棚1 9 2 0 9 1 -1.8 1. 1 490 iw霣 油貢 *棚2 9 2 0 9 1 -1. 4 r 0. 6 485 ΙΜΚ 胙AH 比ft例i 9 2 0 9 1 —1 . 6 0. 5 480 繪Alt 卵All 9 2 0 94 -3. 1 5. 3 545 卵ΛΙΙ 卵AH 9 20 88 -0. 7 -1. 2 440 非Α資 舴AK 9 2 0 9 5 -1. 5 0. 8 50 0 沖A寅 μαχ " Stt例4 9 2 0 9 1 —K 5 1. 3 490 •MM 非ΑΚ SUM 5 9 20 9 1 -1. 5 1. 0 490 鲊All 非Alt 黄嫌916 9 2 0 Θ 1 -έ; ο 1. 3 4Θ0 非IM 非A黄 寅 ΑύΝ / 9 2 0 9 1 -1.6 ο. β 490 并龜賣 穽A霣 食蝴8 15 0 0 9 1 -1. 9 1· 2 490 非AH 非<1貴 贾 _019 9 2 0 9 1 -2. 0 1. 0 485 辟AH 典AH 1 u 9 2 0 9 1 -1. 9 1. 0 ABB ntM »A«( 貢A例1 1 15 0 0 9 2 -1. 3 0. 7 480 難AIK 弗Alt 員I z 6 0 0 90 -1. 2 t. 6 500 穽Alt 弗A資 貴Us例1 12 00 d 1 -1. d 1, 2 490 典A質 非ah lUtt供 4 9 2 0 90 -2. 7 2. 5 49 0 拌鼴霣 非A貧 比I&M5 咏拥6 6 5 0 9 1 —1. 4 * 0. 8 485 弗Μ 比較例7 1 0 0 0 0 89 -3. 4 2. d 490 難Μ 弗晶黄 比較例8 2 0 0 0 0 9 2 -1. 1 0. 7 490 珅軀ft 典蜃黄 9 2 0 89 -2. 9 -2. 1 440 非IM 非AH iUft例 1 v 9 2 0 92 -0. 8 2. 8 5 5 0 拌鼴質 非A黄 1 1 3 5 0 8 β -0. 7 3. S 580 非鼴貢 穽A霣 U1 -35 201115594 【表2】 高溫•高濕s驗 筆滑動耐久性 酿附近之SE滑動耐久性 (Q/D) a»* {%) 毳 b 滑動部分之 龜裂 初期 0Ν阻抗値 (kQ) 實雛 ONP刪直 (KQ) 滑動部分之 龜裂 初期 ON咖値 (ΚΩ) 實難 ONpiStft (ka) 實脚1 &20 9 1 —1. 8 1. 1 钿 2 2 無 Γ 2 2 f 16912 105 0 9 1 -2. 1 1 . 5 無 2 2 無 2 2 比較例1 82 0 9 1 -1. 6 0. 5 m 2 2 有 2 >1 000 比蛟例2 820 94 — 3.1 5. 3 無 2 2 無. 2 2 比較例3 82 0 K8 -0.7 -1. 2 無 2 2 無 2 2 實細《3 820 9 5 -1; 5 0. 8 無 2 2 無 2 2 飾例4 820 9 1 —1. 5 1.3 無 2 2 無 2 2 實脚5 820 9 1 -1. 5 1.0 無 2 2 無 2 2 雜例β 820 9 1 -2. 0 1. 3 無 2 i 無 2 2 雜例7 820 9 1 -1. β 0. 9 無 2 2 無 2 2 飾例Β t 500 9 1 -2. 1 1.5 Μ 2 2 無 2 2 宜娜 820 9 1 -2. 0 1.0 無 2 2 無 2 2 亩旛拥1 0 82 0 9 1 -1.9 1. ό ^ - 2 2 .無 2 2 實蝴1 1 82 0 9 2 — 1.3 0. 7 無 2 2 無 2 2 實»拥1 2 8 2 0 90 -1. 2 1. 5 無 2 2 無 2 2 實κηι 3 820 9 1 -1. β 1. 2 無 2 2 無 2 2 mm a 820 9〇1 -2· 7 2. 5 無 2 2 無 2 2 tiJSfflS 7 50 9 1 —1. β 1.0 無 2 2 有. 2 >1 000 比較供β — — — — 一 — — — — — 比較例7 1 8000 89 —3. 9 3. 3 無 200 3 000 無 2 0 0 500 比較例8 30000 9 2 -2. 1 1.3 無 S00 4000 無 500 800 比校019 820 89 -Ζ. 9 -2. 1 無 2 2 無 2 2 城例Ί 0 820 92 . —0. 8 2. 8 無 2 2 無 2 2 比較例11 300 8 8 -0. 7 3. S -無 2 2 .無 2 2 根據表1、2之結果,滿足本申請案發明的範圍之使用 實施例1~13記載的透明導電性薄膜或透明導電性薄片之觸 控面板,係目視辨認性優異,且在框緣附近對聚縮醛製筆 (前端形狀:0.8麵R)施加2.5N之負荷,進行1萬次滑動實驗 後,仍不會產生剝離或龜裂,ON電阻亦無異常。 另一方面,使用高折射率層爲結晶質之比較例1記載的 透明導電性薄膜或透明導電性薄片之觸控面板,係在框緣 附近對聚縮醛製筆(前端形狀:〇.8imR)施加2.5N之負荷, 進行1萬次滑動實驗後,ON電阻產生異常。再者’以顯微 鏡評價筆滑動部分時,看見透明導電性薄膜剝離或龜裂。 透明導電性薄膜爲結晶質之比較例5也同樣》 -36- 201115594 且,低折射率層或高折射率層或透明導電性薄膜之膜 厚厚〔比較例2、1〇、11〕係全光線透過率爲本申請案發明 之範圍外、透明性差,低折射率層或高折射率層之膜厚薄 〔比較例3、9〕係色彩b値爲本申請案發明之範圍外、色彩 差,使用該等透明導電性薄膜之觸控面板係目視辨認性差 者。比較例4、比較例7係因低折射率層或透明導電性薄膜 之折射率高,因此色彩b値爲本申請案發明之範圍外、色彩 差。 比較例7、8係表面電阻過高,不適於觸控面板用途。 再者,比較例6係氧化錫對氧化銦的比例過多、異常放電 多,濺鍍中的異常放電多,無法進行成膜。 [產業上之可利用性] 本發明之透明導電性薄膜或透明導電性薄片,當用於 配置在高精細之液晶顯示器等顯示體的前面之觸控面板 時’目視辨認性優異並且即使在觸控面板的框緣附近亦不 會產生剝離、龜裂等,筆滑動耐久性優異,且位置檢測精 確度和顯示品位亦優異,因此可對應觸控面板之窄框緣 化’用於行動資訊終端、數位攝影機、數位相機等,強烈 要求記錄媒體小型化和顯示器大畫面化之觸控面板特別合 適。 【圖式簡單說明】 第1圖係本發明之使用透明導電性薄膜之觸控面板的 説明圖。 第2圖係本發明之使用透明導電性薄膜之不使用玻璃 -37- 201115594 基板的觸控面板之説明圖。 【主要元件符號說明】 1 〇 :透明導電性薄膜 1 1 :透明塑膠薄膜(基材) 1 2 :硬化物層 1 3 :高折射率層 1 4 :低折射率層 1 5 :透明導電性薄膜層 1 6 :硬塗層 20 :珠 3 0 :玻璃板 40 :透明導電性薄片 4 1 :黏合劑 42 :透明樹脂薄片 -38-Surface ship rate (0/□> (%) Color _ $ 値 严 高 高 高 曲率 曲率 曲率 导 导 导 导 导 1 1 1 1 1 1 1 1 1 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 * Shed 2 9 2 0 9 1 -1. 4 r 0. 6 485 ΙΜΚ 胙 AH than ft example i 9 2 0 9 1 -1 . 6 0. 5 480 Painted Alt Egg All 9 2 0 94 -3. 1 5 3 545 Egg yolk Egg AH 9 20 88 -0. 7 -1. 2 440 Non-financial 舴 AK 9 2 0 9 5 -1. 5 0. 8 50 0 冲 A寅μαχ " Stt example 4 9 2 0 9 1 —K 5 1. 3 490 •MM Non-ΑΚ SUM 5 9 20 9 1 -1. 5 1. 0 490 鲊All Non-Alt Yellow 916 9 2 0 Θ 1 -έ; ο 1. 3 4Θ0 Non-IM Non A 寅ΑύΝ 寅ΑύΝ / 9 2 0 9 1 -1.6 ο. β 490 and turtle selling 穽A 霣 蝴 8 8 15 0 0 9 1 -1. 9 1· 2 490 Non-AH Non-<1贵贾_019 9 2 0 9 1 -2. 0 1. 0 485 AH AH 1 u 9 2 0 9 1 -1. 9 1. 0 ABB ntM »A« (Gong A case 1 1 15 0 0 9 2 -1. 3 0 7 480 Difficult AIK F. Alt member I z 6 0 0 90 -1. 2 t. 6 500 穽Alt A A expensive Us example 1 12 00 d 1 -1. d 1, 2 490 A quality non-ah lUtt for 4 9 2 0 90 -2. 7 2. 5 49 0 Mixing non-A lean ratio I&M5 66 6 5 0 9 1 —1. 4 * 0. 8 485 Μ Μ Compare Example 7 1 0 0 0 0 89 -3. 4 2. d 490 Difficult to see Fu Jing Huang Comparative Example 8 2 0 0 0 0 9 2 -1. 1 0. 7 490 珅 ft 典 蜃 9 9 9 9 89 2. 9 -2. 1 440 Non-IM Non-AH iUft Example 1 v 9 2 0 92 -0. 8 2. 8 5 5 0 Mixing non-A yellow 1 1 3 5 0 8 β -0. 7 3. S 580 鼹 穽 穽 霣 霣 霣 1 1 1 1 1 1 1 1 1 1 1 1 1 1 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 Initial 0Νimpedance値(kQ) Realized chick ONP straightening (KQ) Sliding part of crack initial ON curry (ΚΩ) Really difficult ONpiStft (ka) Solid foot 1 &20 9 1 —1. 8 1. 1 钿2 2 无Γ 2 2 f 16912 105 0 9 1 -2. 1 1 . 5 No 2 2 No 2 2 Comparative Example 1 82 0 9 1 -1. 6 0. 5 m 2 2 There are 2 > 1 000 Comparative Examples 2 820 94 — 3.1 5. 3 No 2 2 No. 2 2 Comparative example 3 82 0 K8 -0.7 -1. 2 No 2 2 No 2 2 Real detail “3 820 9 5 -1; 5 0. 8 No 2 2 No 2 2 Decoration 4 820 9 1 —1. 5 1.3 No 2 2 No 2 2 Solid foot 5 820 9 1 -1. 5 1.0 No 2 2 No 2 2 Hybrid β 820 9 1 -2. 0 1. 3 None 2 i No 2 2 Hybrid 7 820 9 1 -1. β 0. 9 No 2 2 No 2 2 Decoration Β t 500 9 1 -2. 1 1.5 Μ 2 2 No 2 2 Yi Na 820 9 1 -2. 0 1.0 No 2 2 No 2 2 Mu 1 1 0 82 0 9 1 -1.9 1. ό ^ - 2 2 . 2 2 Real Butterfly 1 1 82 0 9 2 — 1.3 0. 7 No 2 2 No 2 2 Real » 1 2 8 2 0 90 -1. 2 1. 5 No 2 2 No 2 2 Real κηι 3 820 9 1 - 1. β 1. 2 no 2 2 no 2 2 mm a 820 9〇1 -2· 7 2. 5 no 2 2 no 2 2 tiJSfflS 7 50 9 1 —1. β 1.0 no 2 2 yes. 2 >1 000 Comparison for β — — — — — — — — — Comparative Example 7 1 8000 89 —3. 9 3. 3 No 200 3 000 No 2 0 0 500 Comparative Example 8 30000 9 2 -2. 1 1.3 No S00 4000 No 500 800 019 820 89 -Ζ. 9 -2. 1 No 2 2 No 2 2 City example 0 820 92 . —0. 8 2. 8 No 2 2 No 2 2 Comparative Example 11 300 8 8 -0 7 - S = No 2 2 . No 2 2 According to the results of Tables 1 and 2, the transparent conductive film or the transparent conductive sheet touch panel described in Examples 1 to 13 which satisfies the scope of the invention of the present application. It is excellent in visual recognition, and applies a load of 2.5N to the polyacetal pen (front end shape: 0.8 surface R) near the frame edge, and after 10,000 sliding experiments, it will not Peeling or cracking occurred, and the ON resistance was not abnormal. On the other hand, a touch panel of a transparent conductive film or a transparent conductive sheet described in Comparative Example 1 in which the high refractive index layer is crystalline is used to form a polyacetal pen near the frame edge (front end shape: 〇.8imR) When a load of 2.5 N was applied and the sliding test was performed for 10,000 times, the ON resistance was abnormal. Further, when the pen sliding portion was evaluated by a microscope, peeling or cracking of the transparent conductive film was observed. Comparative Example 5 in which the transparent conductive film is crystalline is also the same as -36-201115594, and the film thickness of the low refractive index layer or the high refractive index layer or the transparent conductive film is relatively large [Comparative Examples 2, 1 and 11] The light transmittance is outside the range of the invention of the present application, and the transparency is poor, and the film thickness of the low refractive index layer or the high refractive index layer is relatively thin [Comparative Examples 3 and 9], and the color b is outside the scope of the invention of the present application, and the color is poor. A touch panel using these transparent conductive films is visually inferior. In Comparative Example 4 and Comparative Example 7, since the refractive index of the low refractive index layer or the transparent conductive film was high, the color b 値 was outside the range of the invention of the present application, and the color was poor. Comparative Examples 7 and 8 have excessive surface resistance and are not suitable for touch panel applications. Further, in Comparative Example 6, the ratio of tin oxide to indium oxide was too large, abnormal discharge was large, and abnormal discharge was excessive during sputtering, and film formation was impossible. [Industrial Applicability] The transparent conductive film or the transparent conductive sheet of the present invention is excellent in visual visibility and is even in contact when used for a touch panel disposed in front of a display body such as a high-definition liquid crystal display. There is no peeling or cracking near the frame edge of the control panel, and the pen sliding durability is excellent, and the position detection accuracy and display quality are also excellent, so that the narrow frame edge of the touch panel can be used for the mobile information terminal. A digital camera, a digital camera, etc., and a touch panel that strongly requires recording media miniaturization and a large display screen is particularly suitable. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is an explanatory view of a touch panel using a transparent conductive film of the present invention. Fig. 2 is an explanatory view of a touch panel using a transparent conductive film of the present invention without using a glass-37-201115594 substrate. [Description of main component symbols] 1 〇: transparent conductive film 1 1 : transparent plastic film (substrate) 1 2 : cured layer 1 3 : high refractive index layer 1 4 : low refractive index layer 1 5 : transparent conductive film Layer 1 6 : Hard coat layer 20 : Beads 3 0 : Glass plate 40 : Transparent conductive sheet 4 1 : Adhesive 42 : Transparent resin sheet - 38-