201107731 t、發明說明： 【發明所屬之技術領域】 本發明有關於一種高亮度發光二極體壽命測試系 統及其方法，尤指一種用以測試發光二極體使用壽命 之高亮度發光二極體壽命測試系統及其方法。 【先前技術】 發光二極體（LED)具有尚免度、省電及哥命長等 優點，而被廣泛地運用在各式燈具的照明上，例如作 為道路照明之用的LED燈具即為其中一例。而發光二 極體在發光時會產生大量熱量，耐熱性較差，通常須 借助散熱裝置將所產生的熱量予以帶離，使發光二極 體能在適當的溫度下發光而不致於燒毁。故，溫度對 於LED燈具的使用壽命有著顯著的影響，溫度過高或 過低都會降低發光二極體的效能或使發光二極體燒 毁，一旦發光二極體燒毀，對於使用者而言，無疑是 種損失，甚至會造成危害。因此，在使用發光二極體 之前，使用者必須知道發光二極體的規格，以及發光 二極體在不同溫度下的使用壽命，才能防範未然，將 損失降低。 由於發光二極體在發光時會產生大量熱量，若要 準確測試出壽命，就必須控制發光二極體的溫度，使 發光二極體發光時維持一定溫。請參閱第一圖，習知 的發光二極體測試壽命方法通常係將發光二極體1 a 設置於散熱良好的散熱裝置2 a上，然後利用一照度 計3 a量取發光二極體1 a的照度，進而計算出壽 201107731 π〜散,，、、裝置2 a具有多數個散熱鰭 發光二極體1 a發光產生的熱量散發於 ^ 使 此種方法僅能降低溫度。若要在 广^中，但是 必須將發光二極體h置於烤箱則 但是此種方法僅能增加溫度，無法降溫 流風產生或發生燒毀的情形，加上益法利用對 時於烤箱中量取發光二極體丄 度计即 時間遞減）’勢必影響測試結果的準確^。’、、、度會1^者 緣是，本發明人有感於上述缺失之 潛心研究並配合學理之運用，終於提出一餘計= 且有效改善上述缺失之本發明。 【發明内容】 — 上之問題’本發明之主要目的為提供-種 呵免度發光二極體壽命測試系統及其方法，可 =體^度作即時監控及調整，使發光二極體錢 ί過程中維持一定温環境，且發光二極體可於不同的 ^溫壞境下接受測試’並能即時量取發光二極體的照 度’測試結果較準確。 發光為：2?土述之目的’本發明係提供一種高亮度 發先一極體哥命測試系統，包括··一測試裳置，盆包 =一測試模組、至少一發光二極體及一照度計了該 X光一極體設置於該測試模組上，該測試模組之内部 :於:f發光-極體設有-感測單元、-力口熱單元及 冷部單兀，該感測單元用以感測該發光二極體的溫 =、/亥加熱單元及該冷卻單元分別用以加熱及冷卻該 么光—極體，该照度計移動地設於該發光二極體之上 201107731 方，用以量取該些發光二極體之照度；一計算控制裝 置，其分別電性連接於該感測單元、該加熱單元、該 冷卻單元及該照度計，用以讀取該照度計的數值、控/ 制該加，單元及該冷卻單元，並計算該發光二極體的 參數及哥命；以及一操作端，其接收該發光二極體來 數及壽命之數據，並實際測試該發光二極體的性能: 將測δ式後所得到的結果及需求回饋給該測試裝置。 本發明另提供-種高亮度發光二極體壽命測試方 法，其步驟包括： 提供一測試裝置，其包含有一測試模組、至少— 發光二極體及-照度計，該發光二極體設置於該測試 杈組上，该照度計移動地設於該發光二極體之上方， 該測試模組之内部相對於該發光二極體㈣一感測單 元、一加熱單元及一冷卻單元； 以一疋電流啟動該發光二極體發光； 提供—計算控制裝置，讀取該感測單域測該發 :體的溫度’並控制該加鮮元及該冷卻單元， {該發光二極體維持在一定溫環境下；以及 二 没玎主该發光二極體的上方並量取該 壯：體：照度’將量取的照度數據傳送至該計算㈣ 亥發ί二極體持續發光一段時間後，由該計 ^二|袈置计异出該發光二極體的參數及壽命。 本發明具有以下有益的效果： 、、則覃-模組之内部相對於該發光二極體設有 别早兀、加埶單亓月人 _ ^ 产作即s/、、 冷卩早兀，可對發光二極體的: 度作即日守監控及調整 便i光一極體在發光過程中 201107731 持一定溫環境。 2、 使用者可利用該計算控制裝 作環境的條件設定，控制該加敎單 體 =降心使發光二極體能於不同的定溫環境下接受 測试，以提供各種測試結果作為操作端的參考。 3、 該照度計可即時量取發光二極 ，數據傳回至該計算控制裝置，測試結果較；二 【貫施方式】 笋光圖至第二圖，本發明提供-種高亮度 先一極體哥命測試系統，包括有：-測試裝置工、 —計算控制裝置2及一操作端3。 該測試裝置1包含有一測試模組丄 匕照度計13及一電源二：發 =換組1 1為散熱良好的金屬座體，發光二極體 ^ 2設於該賴模組i i上。^ 相對於發光二極體i 2設有一感 =元⑴及一冷卻單元113。該二二 1為溫度感測器，鄰近埋設於發光二極體丄2之 :;用以感測發光二極體1 2的溫度，且感測單元1 =電源線1 1 i i電性連接㈣電源供應器丄 泰、。在本實施财，該加熱單元1 1 2為電熱管，以 :源線1 1 2 1電性連接於該電源供應器工4。加敎 2設於發光二極體1 2之下方，用以提供執 =加熱發光二極體12。該冷卻單元113為冷& 二、，位於發光二極體丄2之下方.，冷卻單元1 为別連接有一第一插接端1131及一第二插接端丄 201107731 ^ $ 2二該第一插接端i 1 3 i連通第二插接端工工 2，冷水可經由第一插接端1 1 3 1進入冷卻單元 ^ a而後由第一插接端1 1 3 2排出，用以降溫。 月ί閱第四圖，在本實施例中，提供一具 個矩形容置槽1 5 1的機台1 5，該些容置槽工5丄 二矩陣的方式排列，多數個測試模組1 1及發光二極 體;12設於該機台1 5内（如第四圖所示），進行多組 測试。該機台1 5之内部設有管道（圖未示），機台工 !，：側設有-入水管1 6及-出水管工7，該：水 ^ 之％連接一冷水源（圖未示），冷水可由入水 吕^ 6進入機台丄5内，再分別被計算控制裝置2控 制流入指定的測試模組1 1中的冷卻單元i X 3冷^ 發光二極體1 2，並將帶有熱量的水由出水管丄^排 出。 一值得一提的是，該些發光二極體i 2為高亮度的 毛光一極肢，具有10瓦的高功率，在一般正常的環境 下，點亮電流大於100微安培（mini_A)可 6000小時。 x儿 ，該照度計1 3可以X方向及Y方向自由地於該些 發光二極體1 2上方移動（一般係利用軌道與移動 臂），用以量取該些發光二極體丄2之照度，且照度計 1 3電性連接於該計算控制裝置2 ( 一般係利電 線），用以將量取到的照度數據傳送至計算控制裝置 2 ° 在本實施例中，該計算控制裝置2為—個人電腦 (PC)’内建有可供使用者操作的軟體，使用者可透過 201107731 二極體12作環境的條件設定。* t裝ί2電性連接加熱單元1 1 2及冷卻.。 3，猎使控制加鮮元1 1 2及冷卻單元 升溫、降溫或維持定溫之動作。 3，作 括發光二極體工2的定严2 ^境的條件設定包 電流及發光時間等設定。在本實施例中二= 為45t:、L使用的電壓為:1=1 光二極體12發光-段時fr电流’並持續使發 ，些發光二極體i 2在發光的過程中 以=測:光二極體12的溫度，並傳： 加:以控。該計算控制裝置2控制 _:、、、早兀1 1 2及冷部早元工工3運作，可改變 日士12的定溫環境，並使發光二極體1 2在發光 =持該定溫環境。_，該照度計13量取發光二 ς版1 2的照度，並將數據傳回至計算控制裝置2， 體1 2持續發光一段時間後，由該計算控 ^置2依照發光二極體丄2照度的衰減程度，計算 「照度-時間」曲線圖，即代表發光二極體丄2的= ^則試結果（如第五A圖至第五“，發光二極體^ j分別於不同的定溫環境下接受測試），並顯示於計算 工制裝置2的螢幕上。另外’計算控制裝置2也可於 ^次測試中計算出發光二極體丄2的參數數值，例如 政熱係數' 溫度敏感係數(k-factor)及熱阻係數。 邊刼作端3接收發光二極體1 2參數及壽命的數 豕，以供參考。在本實施例中，該操作端3為客戶使 201107731 用％，插作端3實際於不同環境下測試發光二極體1 2的性能，例如於寒冷的環境中或酷熱的環境中測 試，並將測試後所得到的結果及實際使用的需求回饋 給該測試裝置1，以作進一步的修正及改良。 請參閱第六圖，本發明另提供一種高亮度發光二 極體壽命測試方法，其步驟包括： • k供一測試裝置1。其中該測試裝置 1包含有一測試模組1 1、至少一發光二極體1 2、 一照度計1 3及一電源供應器i 4，該測試模組工 1、發光二極體1 2、照度計1 3及電源供應器1 4 之結構大致與上述說明相同，在此本發明不再贅述。 S 8 0 3 :以一定電流啟動發光二極體丄2發光。 —S 8 0 5 :提供一計算控制裝置2，讀取該感測 單元1 1 1感測發光二極體1 2的溫度，並控制該加 熱單元112及冷卻單元113,使發光二極體12 維持f 一定溫環境（如45t、65ΐ或85。〇下發光。 該計算控制裝置2之結構錢與上賴明相同，在此 本發明不再贅述。使用者於此步驟中可利用内建於計 裝置2中的軟體對發光二極體1 2作環境的條 件汉疋’該環境的條件設定與上述說明大致相同。 S 8 0 7 :移動照度計2 3至發光二極體2 取，二極體12的照度，將量取的照度數 發井二ΐ彳异控制裝置2，待發光二極體1 2持續 " 奴％間後，由該計算控制裝置2計算出發光二 極體1 2的參數及备八笪：目卜士 ό士里 又 干;Γ可〒4式結果.，並將測試結果顯 不十异控職置2的螢幕上。該參數如散熱係數、 201107731 溫度敏感係數（k-fact〇r)及熱阻係數；壽命如 至第五C圖所示，與上述說明大 ：土圖 不再贅述。 纟此本發明 本發明高亮度發光二極體壽命測 法，具有下列優點： 予、、、死及其方 ]9=測試模組1 1之内部相對於該發光二極體 元1 1 3，可對發光二極體1 2 17#早 使發先二極體12在發光過程中維持—定溫環 2、使用者可利用於計算控制裝置2中的軟體 二，1 2作環境的條件設定’控制加熱單元1 1 2升溫或控制冷卻單元1 1 3降溫，使發光二極-12能於不同的定溫環境（如价、6物5;); 接受=試，㈣供各_試結果作為縣端3的參考。 声L广度计13可即時量取發光二極體12的昭 2準:將照度數據傳回至計算控制裝置2,測試結果 並非:t戶二者:僅為本發明*中的較佳實施例而已， Μ來限疋本發明的實施 專利範圍所做的均等變化纽I丨料&月申5月 圍所涵蓋。與修飾，皆為本發明專利範 【圖式簡單說明】 ::口 Γ!知發光二極體壽命卿置之示意圖。 ^圖為本發明高亮度發光二極.體壽命測試系統之示 201107731 第三圖為本發明高亮度發光二極體壽命測試系統之測 試裝置之示意圖9 第四圖為本發明高亮度發光二極體壽命測試系統多組 測試裝置之立體示意圖。 第五A圖為本發明高亮度發光二極體壽命測試系統於 45°C環境下計算出之照度-時間曲線圖。 第五B圖為本發明高亮度發光二極體壽命測試系統於 65°C環境下計算出之照度-時間曲線圖。 第五C圖為本發明高亮度發光二極體壽命測試系統於 85°C環境下計算出之照度-時間曲線圖。 第六圖為本發明高亮度發光二極體壽命測試方法之步 驟流程圖。 【主要元件符號說明】 [習知] 1 a發光二極體 2 a散熱裝置 2 1 a散熱鰭片 3 a照度計 [本發明] 1測試裝置 11測試模組 111感測單元 1111電源線 1 1 2加熱單元 1121電源線 1 1 3冷卻單元 12 201107731 1 1 3 1第一插接端 1 1 3 2第二插接端 1 2發光二極體 121電源線 1 3照度計 1 4電源供應器 1 5機台 151容置槽 1 6入水管 1 7出水管 2計算控制裝置 3操作端 13201107731 t, invention description: [Technical field of the invention] The present invention relates to a high-brightness light-emitting diode life test system and method thereof, and more particularly to a high-brightness light-emitting diode for testing the service life of a light-emitting diode Life test system and method therefor. [Prior Art] Light-emitting diodes (LEDs) have the advantages of affordability, power saving, and longevity, and are widely used in the illumination of various types of lamps, for example, as LED lamps for road lighting. An example. The light-emitting diode generates a large amount of heat when it emits light, and the heat resistance is poor. Usually, the heat generated by the heat-dissipating device is taken away, so that the light-emitting diode can emit light at an appropriate temperature without burning. Therefore, the temperature has a significant effect on the service life of the LED lamp. If the temperature is too high or too low, the performance of the LED or the LED will be burned. Once the LED is burned, for the user, Undoubtedly it is a kind of loss and even a hazard. Therefore, before using the light-emitting diode, the user must know the specifications of the light-emitting diode and the service life of the light-emitting diode at different temperatures to prevent the loss and reduce the loss. Since the light-emitting diode generates a large amount of heat when it emits light, in order to accurately test the life, it is necessary to control the temperature of the light-emitting diode to maintain a certain temperature while the light-emitting diode emits light. Referring to the first figure, the conventional LED life test method generally adopts the light-emitting diode 1 a on the heat-dissipating heat-dissipating device 2 a, and then uses a illuminometer 3 a to measure the light-emitting diode 1 The illuminance of a, in turn, calculates the life 201107731 π~scatter,,,, device 2a has a plurality of heat-dissipating fins, and the heat generated by the light-emitting diodes is emitted. In the case of wide, but the light-emitting diode h must be placed in the oven, but this method can only increase the temperature, can not cool the wind or the burning, and take advantage of the time to measure in the oven The light-emitting diode meter is time-decreasing) 'will inevitably affect the accuracy of the test results ^. The reason for the fact that the inventors felt that the above-mentioned deficiencies were studied with the use of the above-mentioned deficiencies, and finally the present invention was finally proposed to effectively improve the above-mentioned deficiencies. SUMMARY OF THE INVENTION - The problem of the present invention is to provide a light-emitting diode life test system and method thereof, which can be used for real-time monitoring and adjustment, so that the light-emitting diode money ί The process maintains a certain temperature environment, and the light-emitting diode can be tested under different temperature conditions and can accurately measure the illumination of the LED. The test result is more accurate. The illuminating is: 2? The purpose of the description 'The present invention provides a high-brightness first-polar body life test system, including a test skirt, a pot test = a test module, at least one light-emitting diode and The illuminance meter is disposed on the test module, and the inside of the test module is: f-light-polar body is provided with a sensing unit, a force hot unit and a cold unit, The sensing unit is configured to sense the temperature of the light-emitting diode, and the heating unit and the cooling unit are respectively configured to heat and cool the light-emitting body, and the illuminometer is movably disposed on the light-emitting diode And the illuminance of the illuminating diodes; The value of the illuminometer, the control unit, the unit and the cooling unit, and calculate the parameters and the sacred life of the illuminating diode; and an operation terminal, which receives the data of the number and lifetime of the illuminating diode, and Actually test the performance of the light-emitting diode: the result obtained after measuring the delta Demand back to the test apparatus. The invention further provides a high-brightness LED life test method, the method comprising: providing a test device comprising a test module, at least a light-emitting diode and an illuminometer, wherein the light-emitting diode is disposed on In the test set, the illuminometer is movably disposed above the light emitting diode, and the interior of the test module is opposite to the light emitting diode (4), a sensing unit, a heating unit and a cooling unit; The current starts the illuminating of the illuminating diode; providing a calculation control device, reading the sensing single field to measure the temperature of the body: and controlling the fresh element and the cooling unit, {the illuminating diode is maintained at a certain level In the warm environment; and the second is not above the light-emitting diode and measure the strong: body: illuminance 'to transfer the measured illuminance data to the calculation (four) Haifa ί diode continues to shine for a period of time, by The meter and the lifetime of the light-emitting diode are different. The invention has the following beneficial effects: 、, the interior of the 覃-module is provided with respect to the illuminating diode, and the 埶 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 Light-emitting diode: The degree of day-to-day monitoring and adjustment will be in the process of illuminating the light in the process of 201107731. 2. The user can use the calculation to control the condition setting of the installation environment, and control the twisting monomer=down centering so that the light emitting diode can be tested under different constant temperature environments to provide various test results as reference for the operation end. . 3. The illuminance meter can instantly measure the illuminating dipole, and the data is transmitted back to the calculation control device, and the test result is compared; the second [common application mode] the bamboo shoot light diagram to the second figure, the present invention provides a high brightness first pole The body life test system includes: a test device, a calculation control device 2, and an operation terminal 3. The test device 1 includes a test module 匕 illuminance meter 13 and a power source 2: hair = change group 1 1 is a metal seat with good heat dissipation, and the light-emitting diode ^ 2 is disposed on the slab module i i . ^ A sense element (1) and a cooling unit 113 are provided with respect to the light-emitting diode i 2 . The 221 is a temperature sensor, which is embedded in the illuminating diode 2: for sensing the temperature of the illuminating diode 12, and the sensing unit 1 = the power line 1 1 ii is electrically connected (4) Power supply 丄泰,. In the implementation of the present invention, the heating unit 112 is an electric heating tube, and the source line 1 1 2 1 is electrically connected to the power supply unit 4. The twisting 2 is disposed under the light-emitting diode 12 to provide a heating light-emitting diode 12. The cooling unit 113 is cold & second, located below the light-emitting diode 丄2. The cooling unit 1 is connected with a first plug end 1131 and a second plug end 丄201107731 ^ $ 2 A plug end i 1 3 i is connected to the second plug end worker 2, and the cold water can enter the cooling unit ^ a via the first plug end 1 1 3 1 and then be discharged by the first plug end 1 1 3 2 for temperature. In the fourth embodiment, in the embodiment, a machine 15 with a rectangular receiving slot 1 5 1 is provided, and the receiving slots are arranged in a matrix of 5丄2 matrix, and a plurality of test modules 1 are arranged. 1 and the light-emitting diode; 12 is arranged in the machine 15 (as shown in the fourth figure), and performs multiple sets of tests. The inside of the machine 15 is provided with a pipe (not shown), the machine is working!,: the side is provided with a water inlet pipe 16 and a water outlet pipe 7, and the water is connected to a cold water source (Fig. The cold water can be entered into the machine 丄5 by the water inlet ^6, and then controlled by the calculation control device 2 to flow into the cooling unit i X 3 cold light emitting diode 1 2 in the designated test module 1 1 and The water with heat is discharged by the outlet pipe. It is worth mentioning that the light-emitting diodes i 2 are high-intensity hair-light poles with a high power of 10 watts. In a normal environment, the lighting current is greater than 100 microamperes (mini_A) 6000. hour. x, the illuminance meter 13 can freely move above the light-emitting diodes 1 2 in the X direction and the Y direction (generally using a track and a moving arm) for measuring the light-emitting diodes 2 Illumination, and the illuminance meter 13 is electrically connected to the calculation control device 2 (generally a wire) for transmitting the measured illuminance data to the calculation control device 2 ° In the embodiment, the calculation control device 2 For the personal computer (PC)' built-in software for user operation, the user can use the 201107731 diode 12 as the environment condition setting. * t installed ί2 electrically connected heating unit 1 1 2 and cooling. 3, hunting control plus fresh element 1 1 2 and cooling unit to heat up, cool down or maintain a fixed temperature action. 3. Set the conditions such as current and lighting time for the condition setting of the illuminating diode 2 of the illuminating diode 2 . In the present embodiment, two = 45t:, L uses a voltage of: 1 = 1 photodiode 12 emits - segment fr current 'and continues to emit, some of the light-emitting diodes i 2 in the process of illuminating = Measurement: The temperature of the photodiode 12, and pass: Add: to control. The calculation control device 2 controls the operation of _:, ,, early 兀1 1 2 and the cold part 早元工3, which can change the constant temperature environment of the shishi 12 and make the illuminating diode 1 2 emit light Warm environment. _, the illuminance meter 13 measures the illuminance of the light-emitting diode version 12, and transmits the data back to the calculation control device 2, after the body 1 2 continues to emit light for a period of time, the calculation control device 2 is in accordance with the light-emitting diode 丄2 The degree of attenuation of illuminance, calculate the "illuminance-time" curve, which is the test result of the light-emitting diode 丄2 = ^ (such as the fifth A to fifth ", the light-emitting diodes ^ j are different The test is carried out in a constant temperature environment and displayed on the screen of the computing device 2. In addition, the 'calculation control device 2 can also calculate the parameter value of the light-emitting diode 丄2 in the test, for example, the thermal coefficient 'temperature Sensitivity coefficient (k-factor) and thermal resistance coefficient. The edge 3 receives the number of parameters and lifetime of the light-emitting diode 1 for reference. In this embodiment, the terminal 3 is used by the customer for 201107731. %, the insertion end 3 actually tests the performance of the light-emitting diode 12 in different environments, for example, in a cold environment or a hot environment, and feeds back the results obtained after the test and the actual use requirements to the Test device 1 for further correction and improvement. Referring to the sixth figure, the present invention further provides a high-brightness LED life test method, the steps of which include: • k for a test device 1. The test device 1 includes a test module 1 1 and at least one light-emitting diode. Body 1 2, an illuminometer 1 3 and a power supply i 4, the structure of the test module 1, the light-emitting diode 1, the illuminometer 13 and the power supply 14 are substantially the same as described above. The invention will not be described again. S 8 0 3 : The light-emitting diode 丄 2 is illuminated with a certain current. —S 8 0 5 : A calculation control device 2 is provided, and the sensing unit 1 1 1 is sensed to emit the light-emitting two The temperature of the polar body 12 is controlled, and the heating unit 112 and the cooling unit 113 are controlled to maintain the light-emitting diode 12 at a temperature of a certain temperature (for example, 45t, 65ΐ or 85. Under the illuminating light. The structure and control of the computing control device 2 The above is not described in detail in the present invention. In this step, the user can use the software built into the meter device 2 to make the condition of the environment of the light-emitting diode 12 as a condition of the environment. The above description is roughly the same. S 8 0 7 : Mobile illuminance meter 2 3 to illuminating two The body 2 takes the illuminance of the diode 12, and the measured illuminance number is sent to the well control device 2, and after the light-emitting diode 12 continues, the calculation control device 2 calculates The parameters of the light diode 1 2 and the preparation of the gossip: the eyes of the gentleman and the dry; the result of the type 4, and the test results are not on the screen of the control position 2. The parameters such as the heat dissipation coefficient , 201107731 Temperature sensitivity coefficient (k-fact〇r) and thermal resistance coefficient; life as shown in the fifth C diagram, and the above description is large: the soil map will not be described again. The present invention is a high-intensity light-emitting diode of the present invention The life test method has the following advantages: pre,, and dead and its square] 9=the inside of the test module 1 1 is relatively early with respect to the light emitting diode 1 1 3 , and can be used for the light emitting diode 1 2 17# The first diode 12 is maintained during the illumination process - the temperature control ring 2, the user can use the software 2 in the calculation control device 2, and the environment condition setting is set to 'control the heating unit 1 1 2 to raise the temperature or control the cooling unit. 1 1 3 cool down, so that the light-emitting diode-12 can be in different fixed temperature environment (such as price, 6 objects 5;); accept = test, (four) for each _ The test results are used as a reference for the county end 3. The sound L breadth meter 13 can accurately measure the illumination diode 12: the illuminance data is transmitted back to the calculation control device 2, and the test result is not: t households: only the preferred embodiment of the present invention* However, the equivalent changes made by the scope of the invention of the present invention are limited to the coverage of the May. And the modification, are the patents of the invention. [Simplified description of the diagram] :: mouth Γ! Know the schematic diagram of the life of the LED. The figure is the high-intensity light-emitting diode of the present invention. The body life test system is shown in 201107731. The third figure is the schematic diagram of the test device of the high-brightness light-emitting diode life test system of the present invention. The fourth figure is the high-brightness light-emitting diode of the present invention. Stereoscopic diagram of multiple sets of test devices for the body life test system. The fifth A is a illuminance-time graph calculated by the high brightness LED life test system of the present invention at 45 ° C. Fig. 5B is a graph showing the illuminance-time curve calculated by the high brightness LED life test system of the present invention at 65 °C. The fifth C is a illuminance-time graph calculated by the high brightness LED life test system of the present invention at 85 ° C. The sixth figure is a flow chart of the steps of the high brightness LED life test method of the present invention. [Main component symbol description] [Practical] 1 a light-emitting diode 2 a heat sink 2 1 a heat sink fin 3 a illuminometer [invention] 1 test device 11 test module 111 sensing unit 1111 power line 1 1 2 heating unit 1121 power line 1 1 3 cooling unit 12 201107731 1 1 3 1 first plug end 1 1 3 2 second plug end 1 2 light emitting diode 121 power cord 1 3 illuminometer 1 4 power supply 1 5 machine 151 accommodating tank 1 6 water inlet pipe 7 7 water outlet pipe 2 calculation control device 3 operation terminal 13