CN105486491B - A kind of LED lamplight parameter test device and test method - Google Patents

A kind of LED lamplight parameter test device and test method Download PDF

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Publication number
CN105486491B
CN105486491B CN201610038213.2A CN201610038213A CN105486491B CN 105486491 B CN105486491 B CN 105486491B CN 201610038213 A CN201610038213 A CN 201610038213A CN 105486491 B CN105486491 B CN 105486491B
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heating
cooling mechanism
lamp holder
temperature
cooling
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CN105486491A (en
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刘栓庆
滕金金
阳琳
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Radio And Tv Measurement And Testing Group Co ltd
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Guangzhou GRG Metrology and Test Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Arrangement Of Elements, Cooling, Sealing, Or The Like Of Lighting Devices (AREA)

Abstract

The invention discloses a kind of LED lamplight parameter test devices, including integrating sphere, heating and cooling mechanism and lamp holder, temperature controller and temperature inductor.Holder is installed in integrating sphere.Heating and cooling mechanism is located at lamp holder in integrating sphere, and heating and cooling mechanism is connected with holder.Lamp holder is connected with heating and cooling mechanism, and heating and cooling mechanism is used to carry out heating and cooling processing to lamp holder, and lamp holder is for installing LED light to be measured.Temperature inductor is used to incude the temperature of lamp holder, and temperature controller is electrically connected with the heating and cooling mechanism, temperature inductor, and temperature controller is used to sense the temperature control heating and cooling mechanism heating and cooling of lamp holder according to temperature inductor, so that lamp holder, which is maintained at, waits for testing temperature.LED lamp holder part is locally heated to and waits for testing temperature by apparatus of the present invention so that LED light to be measured more closing to reality working condition, obtained optical parameter test data more true and accurate.Secondly, the energy consumption during LED lamplight parameter testing reduces, and working efficiency greatly improves.

Description

A kind of LED lamplight parameter test device and test method
Technical field
The present invention relates to LED lamplight parameter detecting technical field, more particularly, to a kind of LED lamplight parameter test device and Test method.
Background technology
For LED light (including LED integrated lamps and LED light engine) optical parameter (including luminous flux, light efficiency, color and Service life) test, be currently that LED light is arranged in integrating sphere, then use heating and cooling device to the whole region of integrating sphere Heating and cooling processing is carried out, so that the temperature to LED light accurately controls, and is surveyed by integrating sphere under the conditions of equilibrium temperature Try the related optical parameter of LED light.
Prior art test method there are following defects:First, use heating and cooling device to integrating sphere whole region Heating and cooling are carried out, i.e., heating and cooling are carried out to the illuminator of LED light and lamp cap, then the optical parameter of re-test LED lamps, the party Method is the LED light parameter tested out under pure theory state, and the temperature of lamp holder is higher than the temperature of lamp body in LED light actual working state Degree, i.e., the LED light parameter that not LED light tests out under actual working state;Secondly, entire integrating sphere region is heated, wave Take the energy so that testing cost is higher;Secondly, the heating and cooling when test of optical parameter are carried out in different temperatures for LED light to imitate Rate is low so that the testing time is longer.
Invention content
Based on this, the invention reside in overcoming the deficiencies of existing technologies, a kind of LED lamplight parameter test device and test are provided Method, it can obtain optical parameter of the LED light under actual working state, and test energy consumption is relatively low, and testing efficiency is high.
Its technical solution is as follows:
A kind of LED lamplight parameter test device, including:Integrating sphere is installed with holder in the integrating sphere;Heating and cooling mechanism With lamp holder, the heating and cooling mechanism is located at the lamp holder in the integrating sphere, and the heating and cooling mechanism is connected with the holder, The lamp holder is connected with the heating and cooling mechanism, and the heating and cooling mechanism is used to carry out heating and cooling processing to the lamp holder, described Lamp holder is for installing LED light to be measured;And temperature inductor, the temperature inductor are used to incude the temperature of the lamp holder;Temperature control Device, the temperature controller are electrically connected with the heating and cooling mechanism, the temperature inductor, and the temperature controller is used for according to the temperature Degree inductor senses that the temperature of the lamp holder controls heating and cooling mechanism heating and cooling action.
The present invention also provides a kind of LED lamplight parameter test methods, it uses above-mentioned LED lamplight parameter testing dress It sets, includes the following steps:LED light to be measured is installed up in the lamp holder of integrating sphere;The lamp holder is heated up by heating and cooling mechanism Or it is cooled to and waits for testing temperature;The actual temperature of lamp holder is obtained by temperature inductor, and the actual temperature is fed back into temperature control Device, the temperature controller controls the heating and cooling mechanism heating according to actual temperature or cooling is handled, to realize the reality of the lamp holder Border temperature waits for that testing temperature is identical with described.
The heating and cooling mechanism includes heating-up mechanism and cooling mechanism, the heating-up mechanism in one of the embodiments, Be connected with the cooling mechanism, the heating-up mechanism be used for the lamp holder carry out heating treatment, the cooling mechanism for pair The lamp holder cooling processing.
The heating-up mechanism includes heating cylinder in one of the embodiments, and the heating cylinder both ends are separately connected There are first end cover and second end cover, the lamp holder to be installed in the first end cover and in the heating cylinder;The drop Warm mechanism includes interior cooling mechanism and outer cooling mechanism, and the interior cooling mechanism is located inside the heating cylinder, described outer scattered Heat engine structure is located at outside the heating cylinder, and the interior cooling mechanism, the outer cooling mechanism are connect with the second end cover.
The interior cooling mechanism includes inner radiator and internal fan in one of the embodiments, the internal fan and institute It states inner radiator to be connected, the inner radiator is connect with second end cover;The outer cooling mechanism includes outer radiator and external fan, The external fan is connected with the outer radiator, and the outer radiator is connect with second end cover.
The inner radiator and/or the outer radiator include several silicon-controlled heat dissipations in one of the embodiments, Piece is stacked to be formed.
In one of the embodiments, cooling piece is provided between the outer radiator and the second end cover.
The outer radiator includes radiating outside the first outer radiator being set up in parallel and second in one of the embodiments, Device, the external fan are arranged between the described first outer radiator and the second outer radiator.
The described first outer radiator and the described second outer radiator include that several are silicon-controlled in one of the embodiments, Cooling fin is stacked to be formed, and the first outer radiator, the second outer radiator are respectively connected with heat-conducting copper pipe, the heat-conducting copper pipe Through silicon-controlled cooling fin described in several, the heat-conducting copper pipe is connected with silicon-controlled cooling fin described in several.
The described first outer radiator, the second outer radiator are all connected with there are two heat conduction in one of the embodiments, Copper pipe, two heat-conducting copper pipes are set up in parallel, and the heat-conducting copper pipe takes the shape of the letter U shape.
The principle of the present invention, effect are further illustrated with reference to above-mentioned technical proposal:
1, above-mentioned LED lamplight parameter test device carries out lamp holder by heating and cooling mechanism to be heated to waiting for testing temperature, lamp Sitting toilet is heated to the driving of LED light and driving adjacent component to wait for testing temperature, compared with the existing technology to LED light Omnidirectional heating Mode, the present invention, when carrying out optical parameter detection, only are heated to waiting for testing temperature to LED light to be measured to LED light cap part, There is no heated for LED light light projector face part.In addition, since the optical parameter of LED light to be measured is largely by LED junction temperature It influences, and LED junction temperature is related to heat source, heat source is often the rectification circuit of LED light cap part or adjacent other assemblies Caused by circuit.It, can be so that LED to be measured so as it can be seen that LED lamp holder part is locally heated to by apparatus of the present invention waits for testing temperature Lamp more closing to reality working condition, the optical parameter test data more true and accurate obtained by integrating sphere.Secondly as this Invention comprehensive mode of heating compared with the existing technology, local heating mode is carried out using to lamp holder, can be so that heating and cooling sky Between become smaller, the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, working efficiency is significantly It improves.
2, heating-up mechanism and cooling mechanism are provided separately, and incude the temperature of lamp holder in real time by temperature sensor, are passed through Temperature controller controls corresponding to the cooling mechanism heating and cooling of heating-up mechanism, just can fast implement and adjust the temperature of lamp holder to waiting for thermometric Degree, working efficiency are higher.
3, lamp holder is installed in first end cover and in heating cylinder, interior cooling mechanism is set in heating cylinder Portion, outer cooling mechanism is set to outside the heating cylinder, and interior cooling mechanism, outer cooling mechanism are connect with second end cover.In this way, When heating cylinder electrified regulation acts, just the lamp holder in first end cover is heated up;It radiates when cooling mechanism is powered When, interior cooling mechanism and outer cooling mechanism just synchronization action reduce the temperature of lamp holder.As it can be seen that the present invention will heat up machine Structure is combined with cooling mechanism, and structure is relatively simple, and can facilitate the heating and cooling processing for realizing lamp holder.
Description of the drawings
Fig. 1 is LED lamplight parameter test device structural schematic diagram described in the embodiment of the present invention;
Fig. 2 is the connection circuit of LED lamplight parameter test device temperature controller and heating and cooling mechanism described in the embodiment of the present invention Figure;
Fig. 3 is the structural schematic diagram of the heating and cooling mechanism of LED lamplight parameter test device described in the embodiment of the present invention;
Fig. 4 is the axial, cross-sectional view of the heating and cooling mechanism of LED lamplight parameter test device described in the embodiment of the present invention;
Fig. 5 is the flow chart of LED lamplight parameter test method described in the embodiment of the present invention.
Reference sign:
10, integrating sphere, 11, holder, 20, heating and cooling mechanism, 21, heating-up mechanism, 211, heating cylinder, 22, cooler Structure, 221, interior cooling mechanism, 2211, inner radiator, 2212, internal fan, 222, outer cooling mechanism, 2221, outer radiator, 2221a, the first outer radiator, 2221b, the second outer radiator, 2222, external fan, 2223, heat-conducting copper pipe, 23, first end cover, 24, second end cover, 25, cooling piece, 26,12V input terminals, 27,220V input terminals, 28, connecting rod, 281, mounting hole, 30, lamp Seat, 40, temperature controller, 41, mains electricity input end, 42,12V output ends, 43,220V output ends, 44, K-type incoming end, 50, temperature sense Answer device.
Specific implementation mode
The embodiment of the present invention is described in detail below:
As shown in Figure 1, LED lamplight parameter test device of the present invention, including integrating sphere 10, heating and cooling mechanism 20 with Lamp holder 30, temperature controller 40 and temperature inductor 50.
Holder 11 is installed in the integrating sphere 10.The heating and cooling mechanism 20 is located at the integrating sphere with the lamp holder 30 In 10, the heating and cooling mechanism 20 is connected with the holder 11.The lamp holder 30 is connected with the heating and cooling mechanism 20, the liter Cooling mechanism 20 is used to carry out heating and cooling processing to the lamp holder 30, and the lamp holder 30 is for installing LED light to be measured.The temperature Inductor 50 is used to incude the temperature of the lamp holder 30.The temperature controller 40 and the heating and cooling mechanism 20, the temperature sense Device 50 is electrically connected, and temperature controller 40 is used to sense that the temperature of the lamp holder 30 controls the liter according to the temperature inductor 50 20 heating and cooling of cooling mechanism, so that the lamp holder 30 is maintained at and waits for testing temperature.
Above-mentioned LED lamplight parameter test device carries out being heated to waiting for testing temperature by heating and cooling mechanism 20 to lamp holder 30, Lamp holder 30 just is heated to the driving of LED light and driving adjacent component to wait for testing temperature, comprehensive to LED light compared with the existing technology Portion of LED light lamp head branch office, when carrying out optical parameter detection, only is heated to waiting for by mode of heating, the present invention to LED light to be measured Testing temperature, there is no heated for LED light light projector face part.In addition, due to LED light to be measured optical parameter largely by The influence of LED junction temperature, and LED junction temperature is related to heat source, heat source is often the rectification circuit or adjacent of LED light cap part Caused by other assemblies circuit.It, can be so that waiting for so as it can be seen that apparatus of the present invention are heated to LED lamp holder part to wait for testing temperature Survey LED light more closing to reality working condition, the optical parameter test data more true and accurate obtained by integrating sphere 10.Its It is secondary, due to the present invention comprehensive mode of heating compared with the existing technology, local heating mode is carried out using to lamp holder 30, is made It obtains heating and cooling space to become smaller, the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, work It is greatly improved as efficiency.
Referring to Fig. 2, the heating and cooling mechanism 20 includes heating-up mechanism 21 and cooling mechanism 22.The heating-up mechanism 21 with The cooling mechanism 22 is connected, and the heating-up mechanism 21 is used to carry out heating treatment, the cooling mechanism to the lamp holder 30 22 for handling 30 cooling of the lamp holder.Cooling mechanism 22 is equipped with 12V input terminals 26, and heating-up mechanism 21 is inputted equipped with 220V End 27 is correspondingly provided with mains electricity input end 41,12V output ends 42,220V output ends 43 on temperature controller 40 and is used for and temperature sense The K-type incoming end 44 for answering device 50 connected.12V output ends 42 and 12 input terminals are electrical connected respectively by conducting wire, 220V outputs End 43 is electrical connected with 220V input terminals 27, and K-type incoming end 44 is connected with temperature inductor 50, and temperature controller 40 just can be given respectively Heating-up mechanism 21, cooling mechanism 22 are powered, and 30 temperature of lamp holder sensed according to temperature inductor 50, accordingly control warming machine 21 heating treatment of structure or control 22 cooling of cooling mechanism processing.As it can be seen that heating-up mechanism 21 is provided separately with cooling mechanism 22, and The temperature for incuding lamp holder 30 in real time by temperature sensor controls heating-up mechanism 21 and 22 phase of cooling mechanism by temperature controller 40 Heating and cooling are answered, just can fast implement and adjust the temperature of lamp holder 30 to waiting for that testing temperature, working efficiency are higher.
Fig. 3 and 4 is please referred to, the heating-up mechanism 21 includes heating cylinder 211.211 both ends of the heating cylinder connect respectively It is connected to first end cover 23 and second end cover 24.It is connected with connecting rod 28 on 211 side wall of heating cylinder, is provided in connecting rod 28 Mounting hole 281 for being connected with holder 11.The lamp holder 30 is installed in the first end cover 23 and is located at the cartridge heater In body 211.The cooling mechanism 22 includes interior cooling mechanism 221 and outer cooling mechanism 222.The interior cooling mechanism 221 is located at Inside the heating cylinder 211, the outer cooling mechanism 222 is located at outside the heating cylinder 211, the interior cooling mechanism 221, the outer cooling mechanism 222 is connect with the second end cover 24.When 211 electrified regulation of heating cylinder acts, just can Lamp holder 30 in first end cover 23 is heated up;When cooling mechanism 22, which is powered, to radiate, interior cooling mechanism 221 with it is outer The just synchronization action of cooling mechanism 222 reduces the temperature of lamp holder 30.As it can be seen that the present invention will heat up mechanism 21 and cooling mechanism 22 combine, and structure is relatively simple, and can facilitate the heating and cooling processing for realizing lamp holder 30.
Wherein, the interior cooling mechanism 221 includes inner radiator 2211 and internal fan 2212.The internal fan 2212 with The inner radiator 2211 is connected, and the inner radiator 2211 is connect with second end cover 24.If the inner radiator 2211 includes Dry silicon-controlled cooling fin is stacked to be formed.The outer cooling mechanism 222 includes outer radiator 2221 and external fan 2222, described outer Fan 2222 is connected with the outer radiator 2221, and the outer radiator 2221 is connect with second end cover 24.The outer radiator 2221 include the first outer outer radiator 2221b of radiator 2221a and second being set up in parallel.The external fan 2222 is arranged in institute It states between the first outer radiator 2221a and the second outer radiator 2221b.The first outer radiator 2221a and described the Two outer radiator 2221b, which include that several silicon-controlled cooling fins are stacked, to be formed.
In addition, the first outer radiator 2221a, the second outer radiator 2221b are respectively connected with heat-conducting copper pipe 2223. The heat-conducting copper pipe 2223 runs through several described silicon-controlled cooling fins, and the heat-conducting copper pipe 2223 is described controllable with several Silicon cooling fin is connected.The first outer radiator 2221a, the second outer radiator 2221b are all connected with there are two heat-conducting copper pipe 2223, two heat-conducting copper pipes 2223 are set up in parallel, and the heat-conducting copper pipe 2223 takes the shape of the letter U shape.The outer radiator 2221 Cooling piece 25 is provided between the second end cover 24.In this way, being easy to implement heat by inside heating cylinder 211 Cooling mechanism 221 is transmitted to the outer cooling mechanism 222 outside heating cylinder 211, can be by the heat Quick diffusing of lamp holder 30.
Referring to Fig. 5, the present invention also provides a kind of LED lamplight parameter test method, it uses above-mentioned LED lamplight Parameter test device includes the following steps:
Step S101, LED light to be measured is installed up in the lamp holder 30 of integrating sphere 10;
Step S102, it heats up or cools down by heating and cooling mechanism 20, the lamp holder 30 is heated up or is cooled to and waits for thermometric Degree;
Step S103, the actual temperature of lamp holder 30 is obtained by temperature inductor 50, and the actual temperature is fed back to Temperature controller 40;
Step S104, the temperature controller 40 judges whether actual temperature is identical as testing temperature is waited for, if it is different, then entering step S102 enters step S105 if identical;
Step S105, the optical parameter of the LED light in the case where covering temperature to be measured is obtained by integrating sphere 10.
Above-mentioned LED lamplight parameter test method carries out being heated to waiting for testing temperature by heating and cooling mechanism 20 to lamp holder 30, Lamp holder 30 just is heated to the driving of LED light and driving adjacent component to wait for testing temperature, comprehensive to LED light compared with the existing technology Mode of heating, when carrying out optical parameter detection, only portion of LED light lamp head branch office is heated to waiting for thermometric present invention LED light to be measured Degree, LED light light projector face part is not heated so that LED light to be measured more closing to reality working condition, passes through integrating sphere 10 The optical parameter test data more true and accurate of acquisition.Secondly, the present invention is used carries out local heating mode to lamp holder 30 so that Heating and cooling space becomes smaller, and the energy consumption of such LED lamplight parameter testing reduces, and convenient for LED light rapid temperature rise and drop to be measured, work Efficiency greatly improves.
Each technical characteristic of embodiment described above can be combined arbitrarily, to keep description succinct, not to above-mentioned reality It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited In contradiction, it is all considered to be the range of this specification record.
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention Range.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.

Claims (8)

1. a kind of LED lamplight parameter test device, which is characterized in that including:
Integrating sphere is installed with holder in the integrating sphere;
Heating and cooling mechanism and lamp holder, the heating and cooling mechanism are located at the lamp holder in the integrating sphere, the heating and cooling mechanism It is connected with the holder, the lamp holder is connected with the heating and cooling mechanism, and the heating and cooling mechanism is used to carry out the lamp holder Heating and cooling are handled, and the lamp holder is for installing LED light to be measured;And
Temperature inductor, the temperature inductor are used to incude the temperature of the lamp holder;
Temperature controller, the temperature controller are electrically connected with the heating and cooling mechanism, the temperature inductor, and the temperature controller is used for root Sense that the temperature of the lamp holder controls heating and cooling mechanism heating and cooling action according to the temperature inductor;The heating and cooling machine Structure includes heating-up mechanism and cooling mechanism, and the heating-up mechanism is connected with the cooling mechanism, and the heating-up mechanism is used for institute It states lamp holder and carries out heating treatment, the cooling mechanism is used to handle the lamp holder cooling;The heating-up mechanism includes cartridge heater Body, the heating cylinder both ends are connected separately with first end cover and second end cover, the lamp holder is installed in the first end cover, And in the heating cylinder;The cooling mechanism includes interior cooling mechanism and outer cooling mechanism, the interior cooling mechanism position Inside the heating cylinder, the outer cooling mechanism is located at outside the heating cylinder, the interior cooling mechanism, it is described it is outer dissipate Heat engine structure is connect with the second end cover.
2. LED lamplight parameter test device according to claim 1, which is characterized in that the interior cooling mechanism includes interior Radiator and internal fan, the internal fan are connected with the inner radiator, and the inner radiator is connect with second end cover;It is described outer Cooling mechanism includes outer radiator and external fan, and the external fan is connected with the outer radiator, the outer radiator and second End cap connects.
3. LED lamplight parameter test device according to claim 2, which is characterized in that the inner radiator and/or described Outer radiator, which includes that several silicon-controlled cooling fins are stacked, to be formed.
4. LED lamplight parameter test device according to claim 2, which is characterized in that the outer radiator and described the It is provided with cooling piece between two end caps.
5. LED lamplight parameter test device according to claim 2, which is characterized in that the outer radiator includes arranged side by side The the first outer radiator and the second outer radiator being arranged, the external fan are arranged outside the described first outer radiator and described second Between radiator.
6. LED lamplight parameter test device according to claim 5, which is characterized in that the first outer radiator and institute Stating the second outer radiator, to include that several silicon-controlled cooling fins are stacked form, the first outer radiator, heat dissipation outside described second Device is respectively connected with heat-conducting copper pipe, and the heat-conducting copper pipe runs through several described silicon-controlled cooling fins, the heat-conducting copper pipe with it is several A silicon-controlled cooling fin is connected.
7. LED lamplight parameter test device according to claim 6, which is characterized in that the first outer radiator, described Second outer radiator is all connected with there are two heat-conducting copper pipe, and two heat-conducting copper pipes are set up in parallel, and the heat-conducting copper pipe takes the shape of the letter U Shape.
8. a kind of LED lamplight parameter test method, which is characterized in that use LED as described in any one of claim 1 to 7 Lighting programmers test device, includes the following steps:
LED light to be measured is installed up in the lamp holder of integrating sphere;
The lamp holder is heated up or is cooled to by heating and cooling mechanism and waits for testing temperature;
The actual temperature of lamp holder is obtained by temperature inductor, and the actual temperature is fed back into temperature controller, the temperature controller The heating and cooling mechanism heating or cooling processing are controlled according to actual temperature, to realize that the actual temperature of the lamp holder is waited for described Testing temperature is identical.
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Address after: No. 8 Qishan Road, Shiqi Town, Panyu District, Guangzhou City, Guangdong Province, 510000, 150

Patentee after: Radio and TV Measurement and Testing Group Co.,Ltd.

Address before: 510656 Guangdong city of Guangzhou province Whampoa Avenue Tianhe District Xiping Yun Road No. 163

Patentee before: GUANGZHOU GRG METROLOGY & TEST Co.,Ltd.