M377586 五、新型說明： 【新型所屬之技術領域】 本創作係有關於一種高亮度發光二極體壽命測試 裝置，尤指一種用以測試發光二極體使用壽命之高亮 度發光二極體筹命測試裝置。 【先前技術】 發光二極體（LED)具有南免度、省電及署命長等 優點，而被廣泛地運用在各式燈具的照明上，例如作為 道路照明之用的LED燈具即為其中一例。而發光二極體 在發光時會產生大量熱量，财熱性較差，通常須借助散 熱裝置將所產生的熱量予以帶離，使發光二極體能在適 當的溫度下發光而不致於燒毀。故，溫度對於LED燈具 的使用壽命有著顯著的影響，溫度過高或過低都會降低 發光二極體的效能或使發光二極體燒毀，一旦發光二極 體燒毁，對於使用者而言，無疑是種損失，甚至會造成 危害。因此，在使用發光二極體之前，使用者必須知道 發光二極體的規格，以及發光二極體在不同溫度下的使 用壽命，才能防範未然，將損失降低。 由於發光二極體在發光時會產生大量熱量，若要準 確測試出壽命，就必須控制發光二極體的溫度，使發光 二極體發光時維持一定溫。請參閱第一圖，習知的發光 二極體測試壽命方法通常係將發光二極體1 a設置於 散熱良好的散熱裝置2 a上，然後利用一照度計3 a量 取發光二極體1 a的照度，進而計算出壽命。該散熱裝 置2 a具有多數個散熱鰭片2 1 a，使發光二極體1 a 3 M377586 發光產生的熱量散發於大氣中，但是此種方法僅能降低 溫度。若要在高溫環境中測試，則必須將發光二極體1 a置於烤箱（圖未示）中加熱，但是此種方法僅能增加 溫度，無法降溫，且容易有對流風產生或發生燒毀的情 形，加上無法利用照度計即時於烤箱中量取發光二極體 1 a的照度（照度會隨著時間遞減），勢必影響測試結 果的準確性。 緣是，本創作人有感於上述缺失之可改善，乃特 潛心研究並配合學理之運用，終於提出一種設計合理 且有效改善上述缺失之本創作。 【新型内容】 本創作之主要目的，係提供一種高亮度發光二極 體壽命測試裝置，其結構設計可對發光二極體的溫度作 即時監控及調整，使發光二極體在發光過程中維持一定 溫環境，且發光二極體能於不同的定溫環境下接受測 試，並能即時量取發光二極體的照度，測試結果較準確。 為了達成上述之目的，本創作提供一種高亮度發 光二極體壽命測試裝置，包括有：一測試模組，其内部 設有一感測單元、一加熱單元及一冷卻單元；一發光二 極體，其設置於該測試模組上，該感測單元鄰近該發光 二極體；一照度計，其移動地設於該發光二極體之上 方；以及 一計算控制裝置，其分別電性連接於該感測單元、該加 熱單元、該冷卻單元及該照度計。 本創作具有以下有益的效果： 4 單元匕=模組之内部相對於該發光二極體設有感測 即時d:單元，可對發光二極體的溫度作 =控n，使發光二極體在發光過程中維持 >皿味支兄。 、 s 2、使用者可彻該計算控g置對發光二極體作 ㈣的條件設定，控制該加熱單元升溫或控制冷卻單元 降溫’使發光二極體能於不同㈣溫環境下接受測試。 3、該照度計可即時量取發光二極體的照度，並 照度數據傳回至該計算控制裝置，測試結果較準確。 為使更進一步了解本創作之特徵及技術内容，言主 2以下有關於本創作之詳細說明與附圖，然而所附 f式僅供參考與說明用，並非用來對本創作加以限制 者。 【實施方式】M377586 V. New Description: [New Technology Field] This creation is about a high-brightness LED life test device, especially a high-brightness light-emitting diode used to test the life of a light-emitting diode. Test device. [Prior Art] Light-emitting diodes (LEDs) have the advantages of southness, power saving, and longevity, and are widely used in the illumination of various types of lamps, for example, as LED lamps for road lighting. An example. The light-emitting diode generates a large amount of heat when it emits light, and the heat is poor. Usually, the heat generated by the heat-dissipating device is taken away, so that the light-emitting diode can emit light at an appropriate temperature without burning. Therefore, the temperature has a significant effect on the service life of the LED lamp. If the temperature is too high or too low, the performance of the LED or the LED will be burned. Once the LED is burned, for the user, Undoubtedly it is a kind of loss and even a hazard. Therefore, before using the light-emitting diode, the user must know the specifications of the light-emitting diode and the service life of the light-emitting diode at different temperatures to prevent the loss and reduce the loss. Since the light-emitting diode generates a large amount of heat when it emits light, in order to accurately test the life, it is necessary to control the temperature of the light-emitting diode to maintain a certain temperature while the light-emitting diode emits light. Referring to the first figure, the conventional LED life test method generally uses the light-emitting diode 1 a on the heat-dissipating heat sink 2 a, and then uses a illuminometer 3 a to measure the light-emitting diode 1 The illuminance of a, in turn, calculates the life. The heat dissipating device 2a has a plurality of fins 2 1 a, so that the heat generated by the light emitting diodes 1 a 3 M377586 is emitted to the atmosphere, but this method can only lower the temperature. In order to test in a high temperature environment, the LED 1a must be placed in an oven (not shown) for heating, but this method can only increase the temperature, can not cool down, and is prone to convective wind or burnt. In the case, it is impossible to measure the illuminance of the light-emitting diode 1 a in the oven immediately by the illuminance meter (the illuminance will decrease with time), which will inevitably affect the accuracy of the test result. The reason is that this creator feels that the above-mentioned deficiencies can be improved. He has devoted himself to researching and cooperating with the application of theory, and finally proposed a creation that is reasonable in design and effective in improving the above-mentioned defects. [New content] The main purpose of this creation is to provide a high-brightness LED life test device, which is designed to monitor and adjust the temperature of the LED, so that the LED can be maintained during the illumination process. The temperature is constant, and the light-emitting diode can be tested under different constant temperature environments, and the illumination of the light-emitting diode can be measured instantly, and the test result is more accurate. In order to achieve the above object, the present invention provides a high-brightness LED life testing device, comprising: a test module having a sensing unit, a heating unit and a cooling unit; and a light emitting diode; The sensing unit is disposed adjacent to the light emitting diode; an illuminometer is movably disposed above the light emitting diode; and a computing control device electrically connected to the a sensing unit, the heating unit, the cooling unit, and the illuminometer. The creation has the following beneficial effects: 4 unit 匕=the inside of the module is provided with sensing instant d: unit relative to the illuminating diode, and the temperature of the illuminating diode can be controlled to n, so that the illuminating diode Maintain > s 2. The user can calculate the condition setting of the light-emitting diode (4), control the temperature of the heating unit or control the cooling unit to cool down, so that the light-emitting diode can be tested under different (four) temperature environments. 3. The illuminance meter can instantly measure the illuminance of the illuminating diode, and the illuminance data is transmitted back to the calculation control device, and the test result is more accurate. In order to further understand the characteristics and technical content of this creation, the following is a detailed description of the creation and the drawings, but the accompanying f is for reference and explanation only, and is not intended to limit the creation. [Embodiment]
請參閱第二圖，本創作係提供一種高亮度笋光二 極體壽命測試裝置，包括有：—測試模組1、-料I 照度計3、-計算控制裝置4及一電源供; 該測試模組1為散熱良好的金屬座體，該測試模組 1之内部相對於發光二極體1 2設有-感測單元工 1 .、二加熱單元12及一冷卻單元1 3。該感測單元1 1為溫度感測器，鄰近埋設於發光二極體2之下方，用 以感測發光二極體2的溫度，且感測單元丄丄以電源線 1 1 土電性連接於該電源供應器5。在本實施例=、該 加熱單2為電熱管，以電源線丨2 i電性連接於該 M377586 電源供應器5。加熱單元1 2設於發光二極體2之下 方’用以提供熱源，加熱發光二極體2。該冷卻單元工 3為冷水管道，位於發光二極體2之下方，冷卻單元工 ^分別連接有-第-插接端i 3 i及—第二插接端丄 2，該第一插接端1 3 i連通第二插接端丄3 2，冷 經由第-插接端i 3 1進人冷卻單元工3，而後由 第一插接知1 3 2排出，帶走熱量，用以降溫。 忒發光二極體2為高亮度的發光二極體，具有 瓦的高功率，在—般正常的環境下，點亮電流大於1〇〇 微安培（mini-A)可持續發亮6〇〇〇小時。 係以螺絲鎖設於測試模組！之頂部，其固定方法並不以 此為限。 該照度計3可以X方向及丫方向自由地於該發光二 極體2上方移動（一般係利用執道與移動臂），用以量 ，發光二極體1 2之照度’且照度計3電性連接於該 算控制裝置4 (-般係利用電線），用以將量取到的^ 度數據傳送至計算控制裝置4進行分析計算。 "、、 該計算控制裝置4為一個人電腦（PC)，内建 供使用者操作的軟體，㈣者可透祕軟體對發光； ，2作環境的條件設定。計算控難置4電性連接加熱 單元1 2及冷卻單元1 3，藉使控制加熱單元1 2及二 卻單元1 3，作升溫、降溫或維持定溫之動作。該: 的條件设定包括發光二極體2的定溫環境、使 = 壓、使用的電流及發光時間等設定。在本實施 2 試的定溫環境分別設定為45°C、65。「、 85 C，使用的電 ，設^為48伏特之高電壓’使用的電流設定為玉安培的 定電流，並持續使發光二極體2發光一段時間。口 第三圖’本創作進—步提供—具有多數個矩 /今置钇6 1的機台6，該些容置槽6丄的外形相對應 =測試模組！，且以矩陣的方式排列。多數個測試模 ，·且1及發光二極體2容設於該些容置槽6 1内，進行多 組測試。該機台6之内部設有管道（圖未示），機台6 之一側設有,入水管6 2及-出水管6 3，該入水；6 2及出水官6 3上分別設有一用以控制開關的控制閥 6 4。該入水管6 2之一端連接一冷水源（圖未示）， 冷水可由人水管6 2進人機台6内，再分別被計算控制 裝置4控制流入指定的測試模組1中的冷卻單元工3 冷卻發光二極體2，並將帶有熱量的水由出水管6 3排 出。 、發光二極體2在發光的過程中，該感測單元丄即時 感測發光二極體2的溫度，並傳回至計算控制裝置4， 用以監控。該計算控制裝置4控制加熱單元丄2及冷卻 單兀1 3運作，可改變發光二極體2的定溫環境，並使 發光二極體2在發光時維持該定溫環境。同時，該照度 計3量取發光二極體2的照度，並將數據傳回至計算控 制裝置4，待發光二極體2持續發光一段時間後，由該 計算控制裝置4依照發光二極體2照度的衰減程度，計 异出照度-時間」曲線圖，即代表發光二極體2的壽命 測試結果（如第四A圖至第四〇圖，發光二極體2分別 於不同的定溫環境下接受測試），並可顯示於計算控制 MJ77586 裝置4 =螢幕上。另外，計算控制裝置4也可於此次測 或中计异出發光二極體2的參數數值，例如散熱係數、 溫度敏感係數(k-factor)及熱阻係數。 本創作高亮度發光二極體壽命賴裝置，具有下列 優點： 1、該測試模組1之内部相對於發光二極體2有 感測單元1 1、加熱單元1 2及冷卻單元丄3，可對發 f二極體2的溫度作即時監控及職，使發光二極體 在發光過程中維持一定溫環境。 使用者可利用於計异控制裝置4中的軟體對發 光二極體2作環境的條件設定， 或控制冷卻單元]备、、w你旅上，…早儿12升皿 … 早701 3降使發先二極體2能於不同的 〇皿壞境^如45Χ：、机或饥）下接受測試。 3知、度计3可即時量取發光二極體2的照度， 將照度數據傳回至計算控職置4 ’職結果較準確。 惟，以上所述為本創作之較佳可行實施例，非因 金IS本作之專利範圍’故舉凡運用本創作說明 創作之範圍内，合予陳明。 』里“於本 【圖式簡單說明】 圖為習知發光二極體壽命測試裝置之示意圖。 意^圖為本創作高亮度發光二極體壽命測試裝置之示 本創作高亮度發光二極體壽命測試裝置之立 通·不忍圖。 第四A圖為本創作高亮度發光二極體壽命測試裝置於 45 c環境下測試出之照度·時間曲線圖。 第四B圖為本創作高亮度發光二極體壽命測試裝置於 65°C環境下測試出之照度_時間曲線圖。 第四C圖為本創作高亮度發光二極體壽命測試裝置於 85°c環境下測試出之照度-時間曲線圖。 【主要元件符號說明】 [習知j 1 a發光二極體 2 a散熱裝置 2 1 a散熱鰭片 3 a照度計 [本創作] 1測試模組 1 1感測單元 1 1 1電源線 1 2加熱單元 121電源線 1 3冷卻單元 131第一插接端 1 3 2第二插接端 2發光二極體 2 1電源線 3照度計 4計算控制裝置 9 M377586 5電源供應器 6機台 6 1容置槽 6 2入水管 6 3出水管 6 4控制閥Referring to the second figure, the present invention provides a high-brightness bamboo light diode life testing device, comprising: a test module 1, a material I illuminometer 3, a calculation control device 4, and a power supply; The group 1 is a metal seat with good heat dissipation. The interior of the test module 1 is provided with a sensing unit 1 , a second heating unit 12 and a cooling unit 13 with respect to the light-emitting diode 1 2 . The sensing unit 11 is a temperature sensor, which is embedded under the LED 2 for sensing the temperature of the LED 2, and the sensing unit is electrically connected by the power line 1 1 At the power supply 5. In this embodiment, the heating unit 2 is an electric heating tube, and is electrically connected to the M377586 power supply unit 5 by a power line 丨2 i . The heating unit 12 is disposed under the light-emitting diode 2 to provide a heat source for heating the light-emitting diode 2. The cooling unit 3 is a cold water pipe located below the light-emitting diode 2, and the cooling unit is respectively connected with a first-plug-in terminal i 3 i and a second plug-in terminal ,2, the first plug-end end 1 3 i is connected to the second plug end 丄 3 2, and the cold enters the cooling unit 3 through the first plug end i 3 1 , and then discharged by the first plug and the 133, and takes away heat for cooling.忒Lighting diode 2 is a high-brightness light-emitting diode with high power of watts. In a normal environment, the lighting current is greater than 1 〇〇 micro-amperes (mini-A) can be continuously brightened 6〇〇 Hour. It is screwed to the test module! At the top, the fixing method is not limited to this. The illuminometer 3 can freely move above the light-emitting diode 2 in the X direction and the 丫 direction (generally using the obedience and moving arm) for measuring the illuminance of the light-emitting diode 12 and the illuminance meter 3 The data is connected to the calculation control device 4 (usually using electric wires) for transmitting the measured data to the calculation control device 4 for analysis and calculation. ",, the computing control device 4 is a personal computer (PC), built-in software for the user to operate, (4) can be transparent to the soft body; 2, environmental conditions. The calculation control device 4 electrically connects the heating unit 12 and the cooling unit 13 to control the heating unit 1 2 and the unit 1 3 to perform the functions of raising or lowering the temperature or maintaining the constant temperature. The condition setting of this: includes the constant temperature environment of the light-emitting diode 2, the setting of the voltage, the current used, and the light-emitting time. The constant temperature environment in this test 2 was set to 45 ° C and 65, respectively. ", 85 C, the electricity used, set the voltage to be a high voltage of 48 volts' is set to the constant current of the jade amperage, and continue to make the light-emitting diode 2 emit light for a period of time. The third picture of the mouth - this creation into - Steps provide - a machine 6 with a plurality of moments / current set 钇 6 1 , the shape of the accommodating slots 6 相对 corresponds = test module!, and arranged in a matrix. Most test dies, and 1 And the light-emitting diode 2 is accommodated in the accommodating grooves 61 to perform a plurality of tests. The inside of the machine 6 is provided with a pipe (not shown), one side of the machine 6 is provided, and the water inlet pipe 6 is provided. 2 and - the outlet pipe 6 3, the water inlet; 6 2 and the water discharge officer 6 3 are respectively provided with a control valve 64 for controlling the switch. One end of the water inlet pipe 6 2 is connected to a cold water source (not shown), cold water The human water pipe 6 2 can be entered into the human machine 6 and then controlled by the calculation control device 4 to cool the cooling unit 3 in the designated test module 1 to cool the light-emitting diode 2, and the water with heat is taken out of the water outlet pipe 6 3 discharge. In the process of illuminating the LED 2, the sensing unit 丄 senses the temperature of the illuminating diode 2 and transmits it. Returning to the calculation control device 4 for monitoring. The calculation control device 4 controls the operation of the heating unit 丄2 and the cooling unit ,1, can change the constant temperature environment of the light-emitting diode 2, and make the light-emitting diode 2 emit light. At the same time, the illuminance meter 3 measures the illuminance of the light-emitting diode 2, and transmits the data back to the calculation control device 4. After the light-emitting diode 2 continues to emit light for a period of time, the calculation is controlled by the calculation. The device 4 calculates the illuminance-time curve according to the degree of attenuation of the illuminance of the illuminating diode 2, that is, the life test result of the illuminating diode 2 (such as the fourth A to the fourth , diagram, the illuminating diode) 2 Tested under different constant temperature conditions), and can be displayed on the calculation control MJ77586 device 4 = screen. Further, the calculation control device 4 can also calculate the parameter values of the light-emitting diode 2, such as the heat dissipation coefficient, the temperature sensitivity coefficient (k-factor), and the thermal resistance coefficient, in this measurement or in the middle. The present invention has the following advantages: 1. The interior of the test module 1 has a sensing unit 1 1 , a heating unit 12 and a cooling unit 相对 3 with respect to the LED 2 . The temperature of the ferrite diode 2 is monitored and monitored in real time, so that the light-emitting diode maintains a certain temperature environment during the illumination process. The user can use the software in the metering control device 4 to set the conditions of the environment for the light-emitting diode 2, or control the cooling unit, prepare, travel, ..., 12 liters in the morning... Early 701 3 The first diode 2 can be tested under different conditions such as 45 Χ:, machine or hunger. 3 knowing and measuring the meter 3, the illuminance of the light-emitting diode 2 can be measured immediately, and the illuminance data is transmitted back to the calculation control position. However, the above is a preferred and feasible embodiment of the creation, and the scope of the patent for the non-investigation of the IS is the same as the scope of the creation of this creation. 』"" This is a simple diagram of the schematic diagram of the light-emitting diode life test device. The life test device's Litong·can't bear the picture. The fourth picture A is the illuminance and time curve tested by the high-intensity light-emitting diode life test device in 45 c environment. The fourth B picture is the creation of high-brightness light. The illuminance-time curve of the diode life test device tested at 65 ° C. The fourth C chart is the illuminance-time curve tested in the 85 ° C environment of the high-brightness LED life test device. Fig. [Explanation of main component symbols] [Learn j 1 a light-emitting diode 2 a heat sink 2 1 a heat sink fin 3 a illuminometer [this creation] 1 test module 1 1 sensing unit 1 1 1 power cord 1 2 heating unit 121 power line 1 3 cooling unit 131 first plug end 1 3 2 second plug end 2 light emitting diode 2 1 power line 3 illuminometer 4 calculation control device 9 M377586 5 power supply 6 machine 6 1 accommodating tank 6 2 inlet pipe 6 3 outlet pipe 6 4 control