TW201102275A - Nozzle geometry for organic vapor jet printing - Google Patents

Nozzle geometry for organic vapor jet printing Download PDF

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Publication number
TW201102275A
TW201102275A TW099108732A TW99108732A TW201102275A TW 201102275 A TW201102275 A TW 201102275A TW 099108732 A TW099108732 A TW 099108732A TW 99108732 A TW99108732 A TW 99108732A TW 201102275 A TW201102275 A TW 201102275A
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Taiwan
Prior art keywords
nozzle
orifice
gas
gas source
print head
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TW099108732A
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Chinese (zh)
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TWI520854B (en
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Stephen R Forrest
Gregory Mcgraw
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Univ Michigan
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/228Gas flow assisted PVD deposition
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

A first device is provided. The device includes a print head. The print head further includes a first nozzle hermetically sealed to a first source of gas. The first nozzle has an aperture having a smallest dimension of 0.5 to 500 microns in a direction perpendicular to a flow direction of the first nozzle. At a distance from the aperture into the first nozzle that is 5 times the smallest dimension of the aperture of the first nozzle, the smallest dimension perpendicular to the flow direction is at least twice the smallest dimension of the aperture of the first nozzle.

Description

201102275 六、發明說明: 【發明所屬之技術領域】 本發明係關於藉由一列印頭沈積有機材料。本申請案主 張2009年3月25日申請之題目為compact OVJP Print Head 之序列號為61/2 1 1,002之美國臨時申請案之優先權及權 益。 本發明係根據由能源部授予之DE-FC26-04NT42273在政 府支援下做出的。政府對本發明具有一定權利。 所主張之發明係由、代表及/或接合一聯合大學協作研 九協疋(joint university corporation research agreement)的 以下各方中之一方或多方所做出:密歇根大學校董會 (Regents of the University 〇f Michigan)、普林斯頓大學 (Princeton University)、南加州大學(The University 〇f Southern California)及通用顯示器公司(Universal Dispiay Corporation)。該協定在做出所主張之發明之日期時及其 之前有效,且所主張之發明係作為在該協定之範疇内所採 取之活動的一結果而做出。 【先前技術】 右干原因使得使用有機材料之光電裝置變得越來越理 想。用於製成此等裝置之諸多材料價格相對低廉,因此有 機光電裝置較無機裝置具有成本優勢之潛力。另外,有機 材料之固有性質(例如其撓性)可使其十分適用於特定應 用’例如於撓性基板上之製作。有機光電裝置之實例包: 有機發光裝置(〇LED)、有機光電晶體、有機光伏打電池 147306.doc 201102275 及有機光偵測器。 關於OLED之更多細,節可在第7 279 7〇4號美國專利中拽 到,該美國專利以全文引用的方式併入本文中。 已知沈積詩製作有機襄置之有機材料之各種方式,例 如真空熱蒸發、溶液處理、有機氣相沈積及有機蒸氣嘴射 印刷。 【發明内容】 本發明之某些態樣係關於適用於有機蒸氣噴射印刷之〜 噴嘴幾何形狀。 在一個實施例中,提供一第一裝置。該裝置包含一列印 頭。該列印頭進一步包含氣密密封至一第一氣體源之〜第P 一噴嘴。该第一噴嘴具有一孔口,該孔口在與該第一噴嘴 流動方向垂直的方向具有0.5至500微米之最小尺寸。在自 該孔口進入至該第一喷嘴中係該第一喷嘴之該孔口之該最 小尺寸5倍的一距離處,垂直於該流動方向之最小尺寸係 該第一喷嘴之該孔口之該最小尺寸之至少兩倍。 該列印頭可包含氣密密封至該第一氣體源之複數個第— 喷嘴。 該列印頭可包含一第二喷嘴’其氣密密封至不同於該第 一氣體源之一第二氣體源。該第二噴嘴具有一孔口,該孔 口具有沿垂直於該第二噴嘴之一流動方向的一方向之— 0.5至500微米之最小尺寸。在自該孔口進入至該第二噴嘴 中係該第二噴嘴之該孔口之該最小尺寸5倍的一距離處, 垂直於該流動方向之最小尺寸係該苐二噴嘴之該孔口之今 147306.doc -4 - 201102275 最小尺寸之至少兩倍。 該列印頭可包含一第三噴嘴,其氣密密封至不同於該第 一氣體源及該第二氣體源之—第三氣體源。該第三噴嘴具 有-孔口,該孔口具有沿垂直於該第三嘴嘴之一流動方: 的一方向之一 〇.5至500微来之最小尺寸。纟自該孔口進入 至該第三喷嘴中係該第三喷嘴之該孔口之該最小尺寸% 的一距離處,垂直於該流動方向之最小尺寸係該第三噴嘴 之該孔口之該最小尺寸之至少兩倍。 該列印頭可包括氣密密封至該第一氣體源之複數個第一 喷嘴、乳抗密封至該第二氣體源之複數個第二喷嘴及/或 氣岔岔封至該第三氣體源之複數個第三喷嘴。 存在一喷嘴可滿足上文所論述之幾何形狀考量之若干不 同方式。第一噴嘴可自孔口至自孔口進入至該第__喷嘴中 之一距離具有一恒定剖面,該距離係第一噴嘴之孔口之最 小尺寸的2倍。對於處於第一喷嘴沿垂直於第一噴嘴之一 流動方向的一方向之最小尺寸的〇倍至2倍之範圍中之距 離’第-嗔嘴之孔口之最小尺寸可隨自第一噴嘴之孔口之 距離連續地增加。對於處於第一噴嘴沿垂直於第一噴嘴之 -流動方向的-方向之最小尺寸的Q倍至2倍之範圍中之距 離’第-噴嘴之孔口之最小尺寸可隨自第一噴嘴之孔口之 距離線性地增加。. 該噴嘴可係由各種材料形成。特定而言,石夕係較佳的。 金屬及陶瓷亦係較佳的。 第-喷嘴之孔口沿垂直於第—噴嘴之一流動方向的一方^ 147306.doc 201102275 〆· 向之最小尺寸之較佳範圍包含100至500微米、20至100微 米及0.5至20微米。 第喷嘴之垂直於第一喷嘴之該流動方向之剖面之較佳 形狀包含圓形及矩形。 第々裝置可與可攜载不同有機材料之多個氣體流一起使 用第冑置較佳包含第一及第二氣體源以及設置於列印 頭與該第-氣體源及該第二氣體源之間的一熱障壁。較佳 也為列印頭、第一氣體源及第二氣體源中之每一者 可獨立控制熱源。 八 第-裝置可與可在每-氣體流中攜載多種有機材料之若 I氣體流一起使用’其中可在具有獨立溫度控制 中昇華不同有機材料。較佳地,第—氣體源包含曰 華室及一第二昇華官。楚 ^ ^ 汁 第m之心 源可藉由設置於列印頭與 頭熱障壁而與列印頭分離。可為列印 熱源。 母者楗供可獨立控制 第一裝置可用於自第一喷嘴 流。 ’、他賀薄射出一氣體射 當第-裝置正用於自該等嘴嘴射 在列印頭以及第一、笛 右干矾肢射流時,可 苐一及7或第三氣體源處維持不η日 可獨立控制之溫度。在一個實 不问且 之氣體包含具有-第m之中 >弟—亂體源所提供 二氣體源所提供之氣體包含:;:一有機材料,且第 材料具有與該第-有機材料之 4 —有機 爭,皿度相差至少攝氏10 147306.doc 201102275 度之一第二昇華溫度。 本發明之某些態樣係關於適用 、用於有機蒸氣噴射印刷之一 微流體列印頭。 在一個實施例中,提供-第-裝置。該第-裝置包含一 列印頭及氣密密封至該列印頭之—第—氣體源。該列 進一步包含一第一層1第—層進—步包括複數個孔口, 每-孔口具有-0.5至微米之最小尺寸。一第二層接合 至該第-層。該第二層包含與該第—氣體源及該等孔口中 之至少-者流體連通之-第—通孔。該第二層係由—絕緣 材料製成。 第-裝置之第-層可包含一通道,該通道在第一層内提 供第二層之第-通孔與第—層之孔口之間的流體連通。第 -裂置之第二層亦可(或替代地)包含—通道,該通道在第 二層内提供第二層之第一通孔與第一層之孔口之間的流體 連通。第一層及/或第二層可進一步包含一熱源。201102275 VI. Description of the Invention: [Technical Field to Which the Invention Is Ascribed] The present invention relates to depositing an organic material by a row of print heads. The priority of this application is the priority and benefit of the US Provisional Application Serial No. 61/2 1 1,002, which is filed on March 25, 2009. The present invention was made with government support under DE-FC26-04NT42273 awarded by the Department of Energy. The government has certain rights in the invention. The claimed invention is made by, by, and/or by one or more of the following parties to a joint university corporation research agreement: Regents of the University 〇f Michigan), Princeton University, The University 〇f Southern California, and Universal Dispiay Corporation. The agreement is effective at the time of the date on which the claimed invention is made and the claimed invention is made as a result of the activities taken within the scope of the agreement. [Prior Art] The right-hand cause makes optoelectronic devices using organic materials more and more desirable. Many of the materials used to make such devices are relatively inexpensive, so that organic optoelectronic devices have the potential to cost advantage over inorganic devices. In addition, the inherent properties of organic materials, such as their flexibility, make them well suited for use in specific applications, such as on flexible substrates. Examples of organic optoelectronic devices: organic light-emitting devices (〇LED), organic photoelectric crystals, organic photovoltaic cells 147306.doc 201102275 and organic photodetectors. For a more detailed description of OLEDs, the U.S. Patent No. 7,279, issued to U.S. Pat. Various ways of depositing organic materials for organic materials are known, such as vacuum thermal evaporation, solution processing, organic vapor deposition, and organic vapor nozzle printing. SUMMARY OF THE INVENTION Certain aspects of the present invention pertain to nozzle geometry suitable for organic vapor jet printing. In one embodiment, a first device is provided. The device contains a column of print heads. The printhead further includes a first nozzle to a first gas source that is hermetically sealed. The first nozzle has an orifice having a minimum dimension of 0.5 to 500 μm in a direction perpendicular to the flow direction of the first nozzle. At a distance from the orifice into the first nozzle that is 5 times the minimum dimension of the orifice of the first nozzle, the smallest dimension perpendicular to the flow direction is the orifice of the first nozzle At least twice the minimum size. The printhead can include a plurality of first nozzles hermetically sealed to the first gas source. The printhead can include a second nozzle' that hermetically seals to a second source of gas other than the first source of gas. The second nozzle has an orifice having a minimum dimension of -0.5 to 500 microns in a direction perpendicular to the flow direction of one of the second nozzles. At a distance from the orifice into the second nozzle which is 5 times the minimum dimension of the orifice of the second nozzle, the smallest dimension perpendicular to the flow direction is the orifice of the second nozzle Today 147306.doc -4 - 201102275 At least twice the minimum size. The printhead can include a third nozzle that is hermetically sealed to a third gas source that is different from the first gas source and the second gas source. The third nozzle has an orifice having a minimum dimension of one to five to five micrometers in a direction perpendicular to one of the third nozzles. a distance from the orifice into the minimum dimension % of the orifice of the third nozzle in the third nozzle, the smallest dimension perpendicular to the flow direction being the orifice of the third nozzle At least twice the minimum size. The print head may include a plurality of first nozzles hermetically sealed to the first gas source, a plurality of second nozzles that are resistant to sealing to the second gas source, and/or a gas seal to the third gas source a plurality of third nozzles. There are several different ways in which a nozzle can satisfy the geometric considerations discussed above. The first nozzle may have a constant cross-section from the orifice to the orifice into one of the first nozzles, the distance being twice the smallest dimension of the orifice of the first nozzle. For a distance in the range of 〇 times to 2 times the smallest dimension of the first nozzle in a direction perpendicular to the flow direction of one of the first nozzles, the minimum size of the orifice of the first nozzle may be from the first nozzle The distance of the orifice is continuously increased. For the distance in the range of Q times to 2 times the minimum dimension of the first nozzle in the - direction perpendicular to the flow direction of the first nozzle, the minimum size of the orifice of the first nozzle may follow the hole from the first nozzle The distance of the mouth increases linearly. The nozzle can be formed from a variety of materials. In particular, Shi Xi is preferred. Metals and ceramics are also preferred. The orifice of the first nozzle is along a direction perpendicular to the flow direction of one of the first nozzles. 147306.doc 201102275 较佳 The preferred range of minimum dimensions includes 100 to 500 micrometers, 20 to 100 micrometers, and 0.5 to 20 micrometers. The preferred shape of the cross section of the first nozzle perpendicular to the flow direction of the first nozzle comprises a circle and a rectangle. The first device can be used with a plurality of gas streams carrying different organic materials. Preferably, the first device includes first and second gas sources and is disposed on the print head and the first gas source and the second gas source A thermal barrier between the two. Preferably, the heat source is also independently controllable for each of the print head, the first gas source, and the second gas source. The eight-device can be used with a stream of I gas that can carry a variety of organic materials in each gas stream, where different organic materials can be sublimed in independent temperature control. Preferably, the first gas source comprises a chamber and a second sublimation officer. Chu ^ ^ Juice The source of the mth can be separated from the print head by being disposed on the print head and the head thermal barrier. It can print a heat source. The parent device can be independently controlled. The first device can be used to flow from the first nozzle. ', He Heyan shot a gas shot when the - device is being used to maintain the jet head and the first, right-hand dry limb jet from the mouth, and can be maintained at the first and third or third gas sources The temperature can be independently controlled without η. The gas provided by the two gas sources provided by the gas containing the -mth middle-disorder source includes:: an organic material, and the first material has the same as the first organic material 4 - Organic competition, the difference in the degree of the dish is at least 10 147,306.doc 201102275 degrees one of the second sublimation temperature. Some aspects of the invention are directed to a microfluidic printhead suitable for use in organic vapor jet printing. In one embodiment, a --device is provided. The first device includes a print head and a first gas source hermetically sealed to the print head. The column further includes a first layer 1 first layer step comprising a plurality of apertures, each aperture having a minimum dimension of -0.5 to micrometers. A second layer is bonded to the first layer. The second layer includes a first through hole in fluid communication with at least one of the first gas source and the orifices. The second layer is made of an insulating material. The first layer of the first device may include a channel that provides fluid communication between the first through hole of the second layer and the orifice of the first layer in the first layer. The second layer of the first-split may also (or alternatively) comprise a channel that provides fluid communication between the first via of the second layer and the orifice of the first layer in the second layer. The first layer and/or the second layer may further comprise a heat source.

第一裝置可包含設置於第一層與第二層之間且接合至第 一層及第二層之一第三層。該第三層可包含一通道,該通 遏提供第二層之第一通孔與第一層之孔口之間的流體連 .通。3亥弟二層可進一步包含一熱源D 複數個孔口可與第一氣體源流體連通。 第一裝置可進一步包含氣密密封至列印頭之一第二氣體 源。第二層之第一通孔可與第一層之一第一群組孔口流體 連通。第二層可進一步包含與該第二氣體源及第一層之一 第二群組孔口流體連通之一第二通孔。第一裝置可進一步 147306.doc 201102275 包含氣密密封至列印頭之一第三氣體源。第二層可進一步 包含與該第三氣體源及第一層之一第三群組孔口流體連通 之一第三通孔。 一氣體源(例如第一氣體源或任一其他氣體源)可包含多 個有機源。連接至不同氣體源之多個通孔可與相同孔口流 體連通,從而導致該孔口處之一氣體混合。舉例而言,第 一通孔可與一第一有機源流體連通,而一第二通孔可與一 第二有機源流體連通。第-通孔與第二通孔兩者皆可與第 二層之-第—群組孔π流體連通。列印頭、第—有機源及 第二有機源各自具有可獨立控制熱源。 第-裝置可進一步包含用於控制第一有機源之氣流之一 第大一閥及用於控制第二有機源之氣流之一第二間。該第一 及第二閥可與熱源熱絕緣。 第一層較佳係由矽形成。 第一層較佳係藉由使用選自由 曰田以下各項組成之群組的一 至第二層:―融合接合、冷烊、-陽極接合及 。若列印頭中存在額外層(例如—第三層或其 層》在-個實施例中,較佳的:二°來接合㈣額外 第m思士 乂佳的係錯由使用-陽極接合來使 乐層及第二層彼此接合 一第二 在另一貫轭例中,較佳的係將 入桩人七 層之間,藉助一共晶接合或融 &接&來接合第一層盘第 - 來接合苐-μw 較佳地藉助-陽極接合 弟二層與第二層。 歹J印頭可進一步包含—微泰 电開關,該微機電開關經調 147306.doc 201102275 適以相依於該開關之肤能二 之狀態而阻擋或允許第—通孔盥孔 之至少一者之間的流體連通。 可在來自列印頭之—突出部中形成至少-個孔口。 列印頭之厚度較佳介於50微米與5〇〇微 【實施方式】 一高清晰度顯示器之像素 〜 ,、了由为30 μιη丸之經圖案化紅 色仏、綠色條帶及藍色條帶 條▼組成。不同色彩條帶之邊緣 可僅…_。對於有機像素,較佳的係圖案具有約5 _之-銳度以避免因過嗔所致的不合意材料重疊。此等 尺寸亦可適用於其他有播驻要 .,, 械裝置’例如有機電晶體或其他裝 置0 -種沈積在一高清晰度顯示器或使用有機材料之盆他裝 置中使用之有機材料之方式係有機蒸氣噴射沈積(〇vjp)。 為成為-可行顯示器製造技術,較佳的係有機蒸氣喷射印 刷能夠以5 _銳度圖案化有機膜。亦較佳的係㈣p過程 能夠同時沈積多個m时嘴係—種心達成同時沈積 多個線之方式。 使用直接模擬蒙特卡羅(DSMC)技術對用於30 μιη尺度特 徵之有機蒸氣喷射印刷過程建模已展示出,假定一噴嘴孔 =寬度為20 μηι,則需要< 5 μηι之一喷嘴孔口至基板間隔 來達成所期望特徵銳度。此估計係由先前〇vjp研究中所 觀察到之一經驗法則支援:印刷解析度隨著喷嘴至基板間 隔按比例縮放。 然而’先前技術可能不十分適於產生經設計以在5 147306.doc -9- 201102275 基板内操作之-20㈣喷嘴陣列。首先,具有符合—光學 上平坦基板之高度公差之—噴嘴板對於跨越合理數目個同 時沈積之線在此等尺寸下操作係合意的,以提供最佳可能 高度公差。先前技術可能已不十分適於提供此一喷嘴板。 對於-多個喷嘴陣列’較佳地在—相對大區域上維持平坦 度。其次,較佳地在0VJP期間將喷嘴板保持為熱,因此 在30CTC以内仍維持其強度之材料係合意的。另外,熱膨 腹可影響維持此等緊密公差,因此抵㈣膨脹或不因执膨 脹而導致變形之材料係合意的。最後,喷嘴_基板系統之 氣體動力學指示一三維結構係較佳的。 矽微機械加工或更一般而言半導體微機械加工提供滿足 此等苛刻規範之-方式。可在高度抛光晶圓上執行製作步 驟’從而消除高度變化。祕〇2系統跨越有機蒸氣沈積之 適用溫度範圍係穩定的。矽亦具有比大多數金屬低得多的 -熱膨脹係數。可使用各向異性㈣劑來製作錐形喷嘴且 可使用絕緣體上矽晶圓及晶圓接合技術來製作多層結構。 此等技術在微流體領域中已得到充分開發。微流體係微製 作技術至液體及蒸氣輸送系統之應用且已用於噴墨印刷領 域中。類似技術亦可應用於金屬及陶曼。 將一微製作裝置與外部世界介接呈現出額外問題。在 OVJP之情形下,在高於300〇c之溫度下操作之期望提出諸 多其他領域中不存在的甚至更多問題。一OVJP系統可具 有一使用者可用蒸氣產生系統,此意味著將一有機材料儲 存於既耐用又宏觀之一結構中。而此又意味著可使用相對 147306.doc 10- 201102275 ,=金“將錢线輸送至料ι如本文 述,糟由使用精選之中間材料;已證明,可在一全] 與一石夕噴嘴板之間提供-可烘烤氣密㈣^ e 本發明之某些態樣係關於—種適 之喷嘴幾何形狀。 種適用於有機蒸氣喷射印刷 在-個實施例中,提供—種第一裝置1裝置包含—列 p頭。該列印頭進:步包含氣密密封至—第一氣體源之一 ^喷嘴。5亥第—贺嘴具有—孔口,該孔。在與該第-嘴 ^動方向垂直的方向具有〇.5至5〇〇微米之最小尺寸。在 自該孔D進人至該第-喷嘴中係該第—喷嘴之該孔口之最 小尺寸之5倍的一距離處,垂直.於該流動方向之最小尺寸 係該第-喷嘴之該孔口之最小尺寸之至少兩倍。 圖1圖解說明先前照片中所涉及之尺寸以及滿;1準列之 某些幾何形狀。本申請案通篇中之圖未必按比例繪製。圖 ^顯示四個不同喷嘴幾何形狀之剖面,其中剖面係沿平行 於噴嘴中之氣流之-方向且亦沿在嗔嘴孔口處顯示一最小 尺寸之-方向截取。在每一幾何形狀中,一孔口具有沿垂 直於噴嘴之流動方向之一方向的一最小尺寸ι〇ι。該「孔 口」係由此取小尺寸達到—最小值所在的點界定’亦即, 穿過該嘴嘴之氣流在該點中受到最大收縮。每一喷嘴亦具 有自該孔口進入至該噴嘴中係該孔口之最小尺寸之5倍的 距離102。母一喷嘴亦具有係在自該孔口進入至該第一 噴嘴中之距離102處垂直於流動方向之最小尺寸之一尺寸 103。如所圖解說明,尺寸1〇3係尺寸1〇1之至少兩倍。噴? 147306.doc 201102275 嘴1 u在《^孔π處到達-點之傾斜側。噴嘴〗在該嘴 嘴之一大部分内具有傾斜側,但該等側在該孔口處之—小 距離内係垂直的。在此情形下,當沿該喷嘴之流動方向存 在最小尺寸在其内達到一最小值之一有限距離時,該「孔 口」係最罪近於基板之點,最小尺寸在該點處為最小值。 喷嘴120可具有較好機械強度,其可因一致孔口大小而比 噴嘴110更易於製作。喷嘴130具有到達一點但在到達噴嘴 130之底部之前稍微向外加寬之傾斜側。噴嘴13〇圖解說明 孔口未必係在該噴嘴之最靠近於基板之點處。噴嘴14〇具 有垂直側,其中正當氣流噴出噴嘴時顯著變窄。其他噴嘴 幾何形狀亦可滿足先前照片之準則。 圖2顯示沿垂直於氣流之—方向在孔口處所截取的四個 不同噴嘴幾何形狀之剖面。圖2中截取其剖面之噴嘴未必 對應於圖丨之彼等噴嘴。每—孔口中之箭頭表示該孔口之 「最小尺寸」。在數學術語中,於最小尺寸處,箭頭長度 相對於整個箭頭沿垂直於箭頭之一方向之平移係在一局部 最大值處(對於圓形、橢圓形及三角形)或係恒定的(對於矩 形),且在上述情形發生時,「最小」尺寸係最小局部最 大值或恒定的。圖2顯示分別具有圓形、橢圓形、矩形及 三角形剖面之孔口 210、220、23〇及24〇之剖面。一矩形孔 口係用於沈積線之最佳形狀,且亦係相對容易在以矽蝕刻 之噴嘴中獲得之一形狀。然而,可使用其他形狀。 "玄列印頭可包含氣密密封至該第一氣體源之複數個第一 噴嘴。 147306.doc -12· 201102275 該列印頭可包含_第二噴嘴’其氣密密封至不同於該第 一氣體源之—第二氣體源。該第二噴嘴具有-孔Π,該孔 口具有沿垂直於該第二嗔嘴之—流動方向的—方向之一 0.5至500微米之最小尺寸。纟自該孔口進 *係該第二喷嘴之該孔口之最小尺寸之5倍的一= 垂直於該流動方向之最小尺寸係該第二喷嘴之該孔口之最 小尺寸之至少兩倍。 該列印頭可包含一第三喷嘴,其氣密密封至不同於該第 -氣體源及該第二氣體源之—第三氣體源。該第三喷嘴具 有一孔口’該孔口具有沿垂直於該第三喷嘴之一流動方向 的-方向之-0.5至500微米之最小尺寸。在自該孔口進入 至該第三喷嘴中係該第三嘴嘴之該孔口之最小尺寸之5倍 的一距離處,垂直於該流動方向之最小尺寸係該第三喷嘴 之5亥孔口之最小尺寸之至少兩倍。 ㈣印頭可包括氣密密封至該第—氣體源之複數個第一 喷嘴氣逸在封至该第二氣體源之複數個第二喷嘴及/或 乳密密封至該第三氣體源之複數個第三喷嘴。 存在-喷嘴可滿足上文所論述之幾何形狀考量之若干不 同方式。第-喷嘴可自孔口至自孔口進入至該第一喷嘴中 之-距離具有一恒定剖面,該距離係第一噴嘴之孔口之最 J尺寸的2倍。對於處於第一喷嘴沿垂直於第一喷嘴之一 机動方向的一方向之最小尺寸的〇倍至2倍之範圍中之距 離’第-喷嘴之孔口之最小尺寸可隨自第一嗔嘴之孔口之 距離連續地增加。對於處於第—噴嘴沿垂直於第—噴嘴 147306.doc -13- 201102275 一流動方向的一方向之最小尺寸的〇倍至2倍之範圍中之距 離’第一喷嘴之孔口之最小尺寸可隨自第一喷嘴之孔口之 距離線性地增加。 該喷嘴可係由各種材料形成。矽為較佳的。 第一喷嘴之孔口沿垂直於第一喷嘴流動方向的方向之最 小尺寸的較佳範圍包含100至500微米、2〇至1〇〇微米及〇 5 至2 0微米。 第一噴嘴垂直於第一喷嘴流動方向之剖面之較佳形狀包 含圓形及矩形。 第一裝置可與可攜載不同有機材料之多個氣體流一起使 用。第一裝置較佳包含第一及第二氣體源以及設置於列印 頭與第一及第二氣體源之間的一熱障壁。較佳地,為列印 頭、第一氣體源及第二氣體源中之每一者提供可獨立控制 熱源。 第一裝置可與可在每一氣體流中攜載多種有機材料之若 干氣體流一起使用,其中可在具有獨立溫度控制之不同室 中昇華不同有機材料^較佳地,第一氣體源包含一第一昇 華室及-第二昇華室。第—氣體源可藉由設置於列印頭與 第一氣體源之間的一熱障壁而與列印頭分離。可為列印 頭、第-昇華室及第二昇華室中之每—者提供可獨立控^ 熱源。可使用各種熱源。舉例而言’可使用位於列印頭表 面上之電阻板,或可將熱源併入至列印頭之層内,舉例t 言作為嵌入於該列印頭之一個或多個層中之電阻元件 第裝置可用於自苐一喷嘴以及其他嘴嘴射出一5 μ 氣體射 147306.doc -14 - 201102275 流0 裝置正用於自該等嘖嘴射 在列印頭以及第―、第一及;干氣體射流時,可 可獨立押制/ 第三氣體源處維持不同且 τ獨立控制之溫度。在一個實施例 π且 之氣體包含罝右筮曰# ώ 乱體源所提供 體… 第—有機材料,且第… 體源所k供之氣體包含第二有機材料, 乳 有與該第一有機〃弟一有機材料具 昇華溫度。昇華、,声夕…“ -攝氏10度之第二 計更容“座 明之實施例可比其他設 十更4易相但抑本發明之實 之一特徵Ha „ jk、他%樣亚非必需 不总曰I 1 5 ’單獨源允許昆合連續變化之材料, 不管升華溫度類似還是不同。 β 本發明之某些態樣係關於一種 之微流體列印頭。 、用於有機㈣贺射印刷 二:置可進一步包含用於控制第一有機源之氣流之一 第 閥及用於控制第-古 及第-… 氣流之一第二閥。該第- 及第一閥可與熱源熱絕緣。 第一層較佳係由矽形成。 ^層較佳係使用選自由以下各項組成之群組的一接合 曰接1至第二層:一融合接合、冷烊、-陽極接合及-丑 ::;若列印頭中存在額外層(例如一第三層或其他 :一 佳地使用此等類型之接合來接合該等額外層。 個只施例中,較佳的係使用一陽極接合來使第一層盘 !彼此接合。在另—實施例中,較佳的係將-第三層 置於弟一居^ — S.. S ^之間,藉助一共晶接合或融合接合來_ [ό ] 147306.doc -15- 201102275 接合第一層與第三層,且較佳地藉助一陽極接合來接合第 三層與第二層。 列印頭可進一步包含一微機電開關,該微機電開關經調 適以相依於該開關之狀態而阻擋或允許第一通孔與該等孔 口中之至少一者之間的流體連通。 可在來自列印頭之一突出部中形成至少一個孔口。 列印頭之厚度較佳係介於50微米與5〇〇微米之間。列印 頭之厚度包含自一第一層至且包含一第二層之所有層,該 第一層包含噴嘴,該第二層包含通孔。 在-個實施例中,提供一有機蒸氣喷射沈積系統3〇〇。 圖3顯示OVJP系統3〇〇(包含列印頭31〇及支架)之一透視 圖已實際製成並操作系統300。系統3〇〇包含—列印頭 31〇’該歹,J印頭含有在圖4至6中t詳細地圖解說明之流動 ^道及喷嘴陣列。六個有機蒸氣源32()(亦稱為「氣體源」) 焊接至歧官33〇,該歧管然後氣密密封至該列印頭。圖 17中更詳細地圖解說明一蒸氣源之一個結構”支管咖較 ^由在列印頭操作溫度下維持其形狀之—材料(例如科 ova,控膨脹鋼)製作而成。列印頭3ι〇可係夾持至歧 I、彳用一高溫全氟彈性體塾片來密封,以達成有機 瘵虱源320與列印頭31〇之 一氣穷宓鉍轧在在封。亦可使用達成 〜他方法,例如將列印頭陽極接合至一科伏 内,此在I 雷射焊接至科伐歧管之經加熱管 機γ 7中可較佳地看到。有機蒸氣源320由包封有 機源…經加熱管組成。此總成係附加至用作 147306.doc -16· 201102275 件及一氣體饋通裝置兩者之一8"英寸c〇nflat凸緣(歧管 33〇)。蒸氣產生器經由經焊接不銹鋼波紋管34〇連接至歧 :330上之埠。波紋管340充當膨脹接頭。由於有機蒸氣源 320在被加熱時可膨脹,因此在歧管33〇與蒸氣產生.器 之間而要一撓性耦合件以避免可傳輸至列印頭3丨〇且使其 變形之熱應力。 、蒸氣產生器320、波紋管340、歧管33〇及相關聯配件形 成自歧管330之頂部伸展至列印頭3 1〇之一暢通〇 3英寸内 ,管道。有機㈣係置於位於一玻璃#之端處且插入至該 官這中之-有排氣孔之囊中。#插人—棒時,使其所含納 之有機材料處於經加熱蒸氣產生器内。然後使用一世偉洛 克(Swagelok)納乇(UUrat〇rr)配件將管道之頂部密封至該玻 璃棒之外徑。穿過該玻璃棒之内徑之-熱電偶提供蒸氣產 生益内之溫度讀數。載體氣體係、經由該饋通裝置與納毛配 件之間的一貫通式丁形配接器饋送至管道中。可在圖17中 更清晰地看到此等特徵。 顯示列印頭之—分解圖。該列印頭之-第-層410包 3複數個孔口 ’該等孔口較佳具有相對於圖a]所閣述之 :、第層410較佳係由矽製成,其可易於藉助(例如)在 半導體處理之背景中開發之習知技術來圖案化以包含所期 望噴嘴幾何形狀。[層41〇包含其中圖案化有若干孔口 :複數個喷嘴415。第_層41()接合至第二層42()。較佳接 D方法包含一合接合、陽極接合、冷焊及共晶接合。第二 曰〇車乂佳φ 、絕緣材料製成,以限制自氣體源之熱傳導[ 147306.doc -17- 201102275 且使得能夠獨n氣體源之溫度而控制第一層4ι〇之溫 度第一層420接合至第一層410。第二層420包含與喷嘴 415流體連通之通孔422。如所圖解說明,蝕刻至第二層 420中之通道424提供通孔竹2與喷嘴415之間的流體連通。 在第一層410之刖部上方蒸發歐姆觸點44〇以允許藉由一加 熱電流定址喷嘴板。 在已貫際製作且用作一沈積系統之一部分之一列印頭 中第層41 〇係一矽晶圓,第二層42〇係一硼矽酸鹽晶 圓,且藉由陽極接合來接合該兩個層。圖5顯示已實際製 作之—第—層510及一第二層520之照片。 替代或除第二層420中之通道以外,第一層41〇可包含在 第層内提供通孔422與噴嘴41 5之間的流體連通之通道。 第層410可進一步包含一熱源,例如加熱觸點44〇。 第二層(未顯示)可設置於第一層410與第二層42〇之 2且接合至第一層410及第二層420 〇較佳接合方法如先 =奴落中所闡述。在此情形下,第一層410將被視為「接 。至」第二層420。替代或除層410及/或420中之通道以 卜為第二層可包含提供通孔422與喷嘴415之間的流體連 通之一通道。該第三層可進一步包含一熱源。 圖4中所圖解說明’複數個喷嘴4丨5可與一單個氣體 (例如—笛 # 同、 氣體源)流體連通。一種達成此情形之方式係 吏通道將一通孔連接至複數個噴嘴。 圖6顯示包含通道610及通孔620之一遮罩600之一校樣。 舉例而士 σ ’圖6之結構可應用於一硼矽酸鹽晶圓且用作圖4 147306.doc 201102275 之第二層420。避免銳角以 賦予其平緩曲率以進疋向通道610且 l 進一步減小應力集中。通道610开4 = 奴體線路。線路612允 一 同摻雜w ,、旧體㈣巾之兩種不 ” |饋达至早獨噴嘴陣列t。線路614允許主 ,、摻雜劑材料在自一 ’、 來白—… 賀角陴歹;射出之則混合。線路616將 早固源之材料饋送至一喷嘴陣列。 如可自圖4中看到’多個氣體源可氣密密封至一列印 ^如可自圖6中看到,通道可用於以各種各樣之方式自 夕個源投送氣體。舉例而言’氣密密封至一列印頭之第一 及第二氣體源或第一、第二及第三氣體源可各自與其本身 的單獨喷嘴陣列流體連通。舉例而言,若調整圖6之結構 以包含類似於線路616之三個線路,則此情形將發生。在 此it形下,第一裝置可進一步包含氣密密封至列印頭之一 第二氣體源。f二層之第一通孔可與第一層之一第一群組 孔口流體連通。第二層可進一步包含與該第二氣體源及第 層之—第二群組孔口流體連通之一第二通孔。第一裝置 可進—步包含氣密密封至列印頭之一第三氣體源。第二層 了進步包含與5亥弟二氣體源及第一層之一第三群組孔口 流體連通之一第三通孔。 連接至不同氣體源之多個通孔可與相同孔口流體連通, 從而導致在該孔口處之一氣體混合。如線路61;2、614及 616所圖解說明,可以此方式混合來自不同源之一種、兩 種、二種或更多種氣體。舉例而言,第一通孔可與一第一 有機源流體連通,而一第二通孔係與一第二有機源流體連 147306.doc •19- 201102275 通孩第通孔與该第二通孔兩者皆可與第一層之一第— 群組孔口流體連通。列印頭、第一有機源及第二有機源各 自具有可獨立控制熱源。 除在列印頭之線路令混合來自不同源之氣體以外,-氣 體源(例如第一氣體源或任一苴 ” + 其他乳體源)亦可包含來自相 同蒸發至或不同装發宫夕夕# 士 ',,、^至之多種有機材料。然而,在列印 中進行混合允許單獨控制其令昇華有機材料之每—室中之 參數(例如溫度及氣流)方面之最大靈活性。舉例而言,此 有機材料具有明顯不同之昇華溫度之情形下可係極 為曰思的。昇華速率可更易於控m卜 著不同之情形下,昇華一種妯粗%又頌 升畢種材枓所需要之一溫度可對一 同材料不利。 圖7顯示已實際製作之一矩形喷嘴74〇之一剖面· 嘴增係製作於切製成之—第—層7附。用於形成第」 層川之石夕晶圓開始時厚於5〇微米以考慮到突出部,作且 有50微米之一最終厚度。喷嘴740具有—孔口 73〇,該孔口、 位於來自第一層710之-突出部720中。孔口 73〇具有一 2〇 微米之取小尺寸。突出部72〇自第一層71〇突出微米。意 奴在非常接近於-基板之處使用嘴嘴74〇,以使得喷嘴某 板間隔距離係約5微米。突出部㈣允許自嘴嘴排出之氣^ 無需订進穿過-5微米厚空間而一直逸散至第—層川之邊 緣。賀嘴壁與第一層71〇之平面之間的角度係Μ 74度苴 易於使用涉及藉由K0H來選擇性触刻以之<1〇〇>平:之習 知㈣刻技術來達成。圖7亦顯示影像75〇,其顯示在一掃 147306.doc •20- 201102275 描電子顯微鏡下所觀看到的蝕刻至以中之喷嘴入口。 圖8顯示完成之列印頭之喷嘴側之一照片綱。喷嘴陣列 8〇2係妝片中心之咼縱橫比矩形之陣列。凸塊8⑽顯現為黑 色正方形。較大凸塊較遠離噴嘴陣列而定位,而較小凸塊 接近喷嘴陣列802而定位且與喷嘴陣列8〇2散置。凸塊8〇4 有助於在沈積期間維持—所期望基板_喷嘴間隔。凸塊, 適用於-實驗室背景中,但可或可不出現於一商用實施例 申,亦顯不位移感測器窗80ό。位移感測器窗8〇6提供用 以當噴嘴在使用中時相基板及(舉例而言)量測基板/喷嘴 隔或基於基板上之對準標記或其他特徵來定位喷嘴之 :方式。圖8亦顯示噴嘴陣列謝之一部分之一掃描電子顯 微照片(SEM)820。圖8亦顯示喷嘴陣列8〇2之一噴嘴孔口之 一 SEM。 已實際製作圖5至8中所圖解說明及所拍攝之結構。列印 頭係由兩個接合晶圓(第-層及第二層)構成。最底部晶圓 係1〇〇 μΐΏ厚矽之噴嘴板,其顯示於圖7及8中。總共128個 噴嘴韻刻至該板中。該等嘴嘴具有尺寸為2q ㈣之 7底部孔口,其中長軸對應於基板行進方向以便產生窄 泉此等孔口之最小尺寸係2〇 μηι。該等喷嘴配置成四個 ㈣32個噴嘴’該等排中之每一者與某一者相對於彼此偏 移以允許多個並排條帶之印刷。該等排中之每一者可同時 沈積不同有機蒸氣調配物。各向異性餘刻產生比該出口寬 得多的-喷嘴人π。對料頭之底側(面向基板之側)進行 回钱以使得㈣线及其他特徵被抬高而超出晶圓表 147306.doc -21 - 201102275 抬高之喷嘴尖端允許使喷嘴靠近於基板同時仍允許載體氣 體容易在列印頭與基板之間的間隙中逸散。噴嘴周圍之二 隆起凸塊網保護喷嘴尖端以免撞到基板上。給嘴嘴板配備 埠而具有光學窗以允許併入—光學位移感測器以量測相對 於基板之位置。 圖5及6中所顯示之通道及絕緣體層(第二層)係由5〇〇 厚侧石夕酸鹽玻璃製成。藉由㈣至面向嘴嘴板之玻璃晶圓 之側中之100至2〇〇,深流體通道為該等喷嘴饋送流體。 經由延伸穿過晶圓之厚度的通孔為此等通道饋送流體。當 接合通道層與絕緣體層時,形成—組三個流體獨立流體: 路。蒸氣可經饋送穿過六個通孔中之任—者且將自喷嘴冒 出,如由線路佈局所決定。 圖5至8中所圖解說明之列印頭係併入至圖3中所圖解說 明之-有機蒸氣噴射印刷I统中。如相對於圖3所閣 述’列印頭擱置於-科伐歧管上。該列印頭係藉助一定制 切副橡勝塾片密封至該歧管且藉助不錄鋼及因康錄合金 (i_el)爽具固持於適當位置中。高溫橡膠(例如全i醚 (Kalrez)橡膠)可用於該墊片。可使用其他封裝策略,例如 將列印頭陽極接合至一科伐背板。據信,一金屬背板將為 列印頭提供一較強韌密封表面。 可對噴t及列印頭至基板間隙之效應進行數學建模。可 使用對不可I缩黏性流之潤滑近似對載體氣體穿過列印頭 至2板間隙之流動進行建模。忽略所有非徑向流動分量。 界定流動之特性長度係列印頭至基板間隙h。此長度上之 147306.doc •22- 201102275 壓力變化係可忽略不計’且可使用理想氣體定律來近似徑 向尺寸上之氣體膨脹。藉由EqILA·丨給出蒸氣流動之平均 速度。μ係黏纟’ P係壓力’ τ係溫度,R係理想氣體常 數,r係半徑,且j係摩爾流率。The first device can include a third layer disposed between the first layer and the second layer and bonded to the first layer and the second layer. The third layer can include a channel that provides a fluid connection between the first via of the second layer and the orifice of the first layer. The 3D layer may further comprise a heat source D. The plurality of orifices may be in fluid communication with the first gas source. The first device can further comprise a second gas source hermetically sealed to one of the printheads. The first via of the second layer can be in fluid communication with a first group of apertures of the first layer. The second layer can further include a second through hole in fluid communication with the second gas source and the second group of orifices of the first layer. The first device can further 147306.doc 201102275 includes a third gas source that is hermetically sealed to one of the printheads. The second layer can further include a third through hole in fluid communication with the third gas source and the third group of orifices of the first layer. A source of gas (e.g., a first source of gas or any other source of gas) can comprise a plurality of organic sources. A plurality of through holes connected to different gas sources can be in fluid communication with the same orifice, resulting in gas mixing at one of the orifices. For example, the first via may be in fluid communication with a first organic source and a second via may be in fluid communication with a second organic source. Both the first through hole and the second through hole may be in fluid communication with the -th group hole π of the second layer. The print head, the first organic source, and the second organic source each have an independently controllable heat source. The first means may further comprise one of a first valve for controlling the flow of the first organic source and a second chamber for controlling the flow of the second organic source. The first and second valves are thermally insulated from the heat source. The first layer is preferably formed of tantalum. The first layer is preferably formed by using one to two layers selected from the group consisting of: fused joints, cold heading, - anodic bonding, and the like. If there is an additional layer in the print head (eg, the third layer or layer thereof), in one embodiment, it is preferred that: two to join (four) the extra m-th. Engaging the layer and the second layer with each other in a second yoke, preferably between the seven layers of the pile, joining the first layer by means of a eutectic bonding or fusion & - the bonding 苐-μw is preferably bonded to the second layer and the second layer by means of an anode. The 歹J printing head may further comprise a micro-electrical switch which is adapted to the switch 147306.doc 201102275 The skin can block or allow fluid communication between at least one of the first through-hole pupils. At least one aperture can be formed in the protrusion from the print head. Between 50 micron and 5 micro [implementation] A high-definition display pixel ~, and consists of a patterned red 仏, green strip and blue strip strip of 30 μιη pill. Different colors The edge of the strip can only be..._. For organic pixels, the preferred pattern has 5 _ - sharpness to avoid undesired material overlap caused by over-twisting. These dimensions can also be applied to other broadcast stations., mechanical devices such as organic transistors or other devices are deposited in one High-definition displays or organic materials used in potting devices using organic materials are organic vapor-jet deposition (〇vjp). To become a viable display manufacturing technology, the preferred organic vapor-jet printing can be 5 _ sharp Degree-patterned organic film. It is also preferred that the (IV) p process can simultaneously deposit multiple m-mouth systems - the centroid achieves the simultaneous deposition of multiple lines. Using direct analog Monte Carlo (DSMC) technology for 30 μιη scale Modeling of the characteristic organic vapor jet printing process has been shown to assume that a nozzle orifice = width of 20 μηι requires one nozzle aperture of < 5 μηι to substrate spacing to achieve the desired feature sharpness. This estimate is from the previous One of the rule of thumb observations observed in the 〇vjp study: print resolution scaled from nozzle to substrate spacing. However, 'previous techniques may not be well suited to produce designs 5 147306.doc -9- 201102275 -20 (four) nozzle array for operation in the substrate. First, with the height tolerance of the optically flat substrate - the nozzle plate is suitable for operating at these dimensions across a reasonable number of simultaneously deposited lines. To provide the best possible height tolerance. The prior art may not be well suited to provide such a nozzle plate. For a plurality of nozzle arrays, it is preferred to maintain flatness over a relatively large area. Secondly, preferably The nozzle plate is kept hot during 0VJP, so it is desirable to maintain the strength of the material within 30 CTC. In addition, thermal expansion can affect the maintenance of these tight tolerances, and therefore (4) expansion or no deformation due to expansion It is desirable. Finally, the gas dynamics of the nozzle-substrate system is indicative of a three-dimensional structure.矽Micromachining or, more generally, semiconductor micromachining provides a way to meet these demanding specifications. The fabrication step can be performed on a highly polished wafer to eliminate height variations. The applicable temperature range for the Peru 2 system across organic vapor deposition is stable. Tantalum also has a much lower coefficient of thermal expansion than most metals. An anisotropic (tetra) agent can be used to make a tapered nozzle and a multilayer structure can be fabricated using a silicon-on-insulator wafer and wafer bonding technique. These techniques have been fully developed in the field of microfluidics. Microfluidic microfabrication technology is used in liquid and vapor delivery systems and has been used in inkjet printing. Similar techniques can also be applied to metals and Tauman. Interfacing a microfabrication device with the outside world presents additional problems. In the case of OVJP, the expectation of operating at temperatures above 300 〇c raises even more problems that do not exist in many other fields. An OVJP system can have a user-usable vapor generation system, which means that an organic material is stored in one of a durable and macroscopic structure. And this means that you can use the relative 147306.doc 10- 201102275, = gold "transfer the money line to the material ι as described in this article, using a selection of intermediate materials; it has been proven that it can be used in a full] and a stone yo nozzle plate Provided between - can be airtight (four) ^ e Some aspects of the invention relate to a suitable nozzle geometry. Suitable for organic vapor jet printing - in one embodiment, a first device 1 is provided The device comprises a column head. The step comprises: a gas-tight seal to one of the first gas sources ^ nozzle. The 5th head - the mouth has an orifice, the hole. The direction perpendicular to the moving direction has a minimum dimension of 〇.5 to 5 〇〇 micrometers. At a distance from the hole D into the first nozzle which is 5 times the minimum size of the orifice of the first nozzle Vertical. The minimum dimension in the direction of flow is at least twice the minimum dimension of the orifice of the first nozzle. Figure 1 illustrates the dimensions involved in the previous photograph and some of the geometry of the full scale; The drawings in the entire application are not necessarily drawn to scale. Figure ^ shows four different nozzles a profile of a shape in which the profile is taken along a direction parallel to the airflow in the nozzle and also along a direction showing a minimum dimension at the orifice of the nozzle. In each geometry, an orifice has a perpendicular a minimum dimension ι〇ι in one of the directions of flow of the nozzle. The "orifice" is thus defined by the point at which the small dimension reaches the minimum value, that is, the airflow passing through the nozzle is subjected to the point at which Maximum contraction. Each nozzle also has a distance 102 from the orifice into the nozzle that is five times the smallest dimension of the orifice. The female one nozzle also has a dimension 103 that is one of the smallest dimensions perpendicular to the flow direction at a distance 102 from the orifice into the first nozzle. As illustrated, the size 1〇3 is at least twice the size of 1〇1. spray? 147306.doc 201102275 Mouth 1 u arrives at the "hole π" - the inclined side of the point. The nozzle has an inclined side in a majority of one of the nozzles, but the sides are perpendicular to the aperture at a small distance. In this case, when there is a minimum dimension within the flow direction of the nozzle within which a finite distance is reached, the "hole" is the closest to the point of the substrate, and the minimum dimension is the minimum at that point. value. Nozzle 120 can have better mechanical strength, which can be made easier than nozzle 110 due to uniform orifice size. Nozzle 130 has a sloped side that reaches a point but widens slightly outward before reaching the bottom of nozzle 130. Nozzle 13 〇 illustrates that the orifice is not necessarily at the point of the nozzle closest to the substrate. The nozzle 14 has a vertical side in which the airflow is significantly narrowed as it is ejected from the nozzle. Other nozzle geometries can also meet the guidelines of previous photographs. Figure 2 shows a section of four different nozzle geometries taken at the orifice in a direction perpendicular to the direction of the gas flow. The nozzles whose cross-sections are taken in Fig. 2 do not necessarily correspond to the nozzles of the figure. The arrow in each orifice indicates the "minimum size" of the orifice. In mathematical terms, at the smallest dimension, the length of the arrow relative to the entire arrow in a direction perpendicular to one of the arrows is at a local maximum (for circles, ellipses, and triangles) or constant (for rectangles). And when the above situation occurs, the "minimum" size is the minimum local maximum or constant. Figure 2 shows sections of apertures 210, 220, 23 and 24, respectively, having circular, elliptical, rectangular and triangular cross-sections. A rectangular aperture is used for the optimum shape of the deposition line and is also relatively easy to obtain in one of the nozzles that are etched by ruthenium. However, other shapes can be used. The "line print head can comprise a plurality of first nozzles hermetically sealed to the first gas source. 147306.doc -12· 201102275 The print head may include a second nozzle 'which is hermetically sealed to a second gas source different from the first gas source. The second nozzle has a bore having a minimum dimension of one of 0.5 to 500 microns in a direction perpendicular to the flow direction of the second nozzle. The enthalpy from the orifice is one of five times the smallest dimension of the orifice of the second nozzle = the smallest dimension perpendicular to the flow direction is at least twice the smallest dimension of the orifice of the second nozzle. The print head can include a third nozzle that is hermetically sealed to a third gas source that is different from the first gas source and the second gas source. The third nozzle has an orifice 'the orifice having a minimum dimension of -0.5 to 500 microns in a direction perpendicular to the direction of flow of one of the third nozzles. At a distance from the orifice into the third nozzle which is 5 times the minimum size of the orifice of the third nozzle, the smallest dimension perpendicular to the flow direction is the 5 hole of the third nozzle At least twice the smallest size of the mouth. (4) The print head may include a plurality of first nozzles hermetically sealed to the first gas source, a plurality of second nozzles sealed to the second gas source, and/or a plurality of first sealed to the third gas source a third nozzle. The presence-nozzle can satisfy several different ways of considering the geometry discussed above. The first nozzle can enter the first nozzle from the orifice to the first nozzle - the distance has a constant profile which is twice the J dimension of the orifice of the first nozzle. For a distance in the range of 〇 times to 2 times the smallest dimension of the first nozzle in a direction perpendicular to the maneuvering direction of one of the first nozzles, the minimum size of the orifice of the first nozzle may be from the first nozzle The distance of the orifice is continuously increased. For a distance in the range of 〇 times to 2 times the minimum dimension of the first nozzle in a direction perpendicular to the flow direction of the first nozzle 147306.doc -13- 201102275, the minimum size of the orifice of the first nozzle may follow The distance from the orifice of the first nozzle increases linearly. The nozzle can be formed from a variety of materials. It is better. A preferred range of the smallest dimension of the orifice of the first nozzle in a direction perpendicular to the flow direction of the first nozzle comprises 100 to 500 μm, 2 to 1 μm, and 〇 5 to 20 μm. The preferred shape of the cross section of the first nozzle perpendicular to the flow direction of the first nozzle comprises a circle and a rectangle. The first device can be used with a plurality of gas streams that can carry different organic materials. The first device preferably includes first and second gas sources and a thermal barrier disposed between the print head and the first and second gas sources. Preferably, an independently controllable heat source is provided for each of the printhead, the first gas source, and the second gas source. The first device can be used with several gas streams that can carry a plurality of organic materials in each gas stream, wherein different organic materials can be sublimed in different chambers with independent temperature control. Preferably, the first gas source comprises a The first sublimation room and the second sublimation room. The first gas source may be separated from the print head by a thermal barrier disposed between the print head and the first gas source. An independently controllable heat source can be provided for each of the print head, the first sublimation chamber, and the second sublimation chamber. Various heat sources can be used. For example, a resistive plate on the surface of the print head can be used, or a heat source can be incorporated into the layer of the print head, for example as a resistive element embedded in one or more layers of the print head. The first device can be used to shoot a 5 μ gas jet from a nozzle and other nozzles. 147306.doc -14 - 201102275 Flow 0 device is being used to shoot the print head from the print head and the first, first and In the case of a gas jet, the cocoa is independently controlled/the third gas source maintains a different and τ independently controlled temperature. In one embodiment, the gas includes 罝 right 筮曰# ώ the source provided by the disorder source... the first organic material, and the first... the gas supplied by the body source contains the second organic material, and the milk has the first organic A younger organic material has a sublimation temperature. Sublimation, sound eve..." - The second measure of 10 degrees Celsius is more accommodating. "The embodiment of the seat can be more easy than the other ten. But one of the characteristics of the invention is Ha „ jk, he is not necessary. The total 曰I 1 5 'separate source allows the material to be continuously changed, regardless of whether the sublimation temperature is similar or different. β Some aspects of the invention relate to a microfluidic print head. For organic (four) white prints II The set may further include a valve for controlling the flow of the first organic source and a second valve for controlling the first and second gas flows. The first and first valves may be thermally insulated from the heat source. One layer is preferably formed of tantalum. The layer preferably uses a joint splicing 1 to a second layer selected from the group consisting of: a fusion joint, a cold head, an anodic joint, and an ugly:: If there are additional layers in the print head (eg a third layer or other: a good use of these types of joints to join the additional layers. In the case of only one embodiment, an anode is preferably used to make The first layer of discs are joined to each other. In another embodiment, the preferred layer is placed - the third layer Between the two brothers, S..S^, by means of a eutectic bonding or fusion bonding _ [ό] 147306.doc -15- 201102275 bonding the first layer and the third layer, and preferably by means of an anodic bonding Engaging the third layer and the second layer. The print head can further include a microelectromechanical switch adapted to block or allow at least one of the first via and the apertures depending on a state of the switch Between the fluid communication, at least one aperture may be formed in one of the protrusions from the print head. The thickness of the print head is preferably between 50 micrometers and 5 micrometers. The thickness of the printhead includes A first layer to and including all layers of a second layer, the first layer comprising a nozzle, the second layer comprising a via. In one embodiment, an organic vapor jet deposition system 3 is provided. A perspective view showing one of the OVJP system 3〇〇 (including the print head 31〇 and the bracket) has been actually made and the operating system 300. The system 3〇〇 contains the print head 31〇', and the J print head contains the map. 4 to 6 in detail to illustrate the flow channel and nozzle array. Six organic vapor sources 32() (also known as "gas source") is welded to the manifold 33〇, which is then hermetically sealed to the print head. Figure 17 shows in more detail a structure of a vapor source. ^ Made of material (such as ova, controlled expansion steel) that maintains its shape at the operating temperature of the print head. The print head 3 〇 can be clamped to the I, and a high temperature perfluoroelastomer 塾The sheet is sealed to achieve one of the organic tantalum source 320 and the print head 31. The method can also be used to achieve the method of, for example, bonding the print head to a corona, which is I can be better seen in the heated tube machine γ 7 of laser welding to the Kovar manifold. The organic vapor source 320 is composed of an encapsulated organic source ... via a heating tube. This assembly is attached to the 8"inch c〇nflat flange (manifold 33〇) used as one of 147306.doc -16· 201102275 and a gas feedthrough. The steam generator is connected to the crucible on the manifold 330 via a welded stainless steel bellows 34. The bellows 340 acts as an expansion joint. Since the organic vapor source 320 is expandable when heated, a flexible coupling is required between the manifold 33 and the vapor generator to avoid thermal stress that can be transmitted to the print head 3 and deformed. . The steam generator 320, the bellows 340, the manifold 33, and associated fittings are formed to extend from the top of the manifold 330 to one of the printheads 3 1 畅 within 3 inches of the conduit. The organic (four) is placed in the sump with the vent hole at the end of a glass # and inserted into the official. #插人-棒, the organic material contained in it is in the heated steam generator. The top of the pipe is then sealed to the outer diameter of the glass rod using a Swagelok® UUrat(R) fitting. A thermocouple that passes through the inner diameter of the glass rod provides a temperature reading within the vapor generating benefit. The carrier gas system is fed into the conduit via a consistent, butt-shaped adapter between the feedthrough and the nanofiber fitting. These features can be seen more clearly in Figure 17. Display the exploded view of the print head. The first to fourth layers of the printhead 410 are provided with a plurality of apertures. The apertures preferably have a shape relative to that of FIG. a: the first layer 410 is preferably made of tantalum, which can be easily utilized. Conventional techniques developed, for example, in the context of semiconductor processing, are patterned to include the desired nozzle geometry. [Layer 41 〇 includes a plurality of apertures patterned therein: a plurality of nozzles 415. The first layer 41() is bonded to the second layer 42(). Preferably, the D method comprises a combination of bonding, anodic bonding, cold bonding, and eutectic bonding. The second brake 乂 φ, made of insulating material, to limit the heat conduction from the gas source [ 147306.doc -17- 201102275 and to enable the temperature of the first gas source to control the temperature of the first layer 4 〇 第一 the first layer 420 is bonded to the first layer 410. The second layer 420 includes a through hole 422 in fluid communication with the nozzle 415. As illustrated, the channel 424 etched into the second layer 420 provides fluid communication between the via 2 and the nozzle 415. An ohmic contact 44A is vaporized over the crotch portion of the first layer 410 to allow the nozzle plate to be addressed by a heating current. The first layer of the first layer of the printing head is used as one of the deposition systems, and the second layer 42 is a borosilicate wafer, and the anode is bonded by anodic bonding. Two layers. Figure 5 shows a photograph of the first layer 510 and a second layer 520 which have been actually produced. Instead of or in addition to the channels in the second layer 420, the first layer 41A can include channels that provide fluid communication between the vias 422 and the nozzles 415 within the first layer. The first layer 410 can further include a heat source, such as a heating contact 44A. A second layer (not shown) may be disposed between the first layer 410 and the second layer 42 and joined to the first layer 410 and the second layer 420. Preferably, the bonding method is as described above. In this case, the first layer 410 will be considered to be "connected to" the second layer 420. Alternatively or in addition to the channels in layers 410 and/or 420 being a second layer may include providing one of the fluid communication between the vias 422 and the nozzles 415. The third layer can further comprise a heat source. As illustrated in Figure 4, the plurality of nozzles 4丨5 can be in fluid communication with a single gas (e.g., the same, gas source). One way to achieve this is for the channel to connect a via to a plurality of nozzles. FIG. 6 shows a proof of one of the masks 600 including the channel 610 and the via 620. For example, the structure of FIG. 6 can be applied to a boron borate wafer and used as the second layer 420 of FIG. 4 147306.doc 201102275. Avoid sharp corners to impart a gentle curvature to the tunnel 610 and further reduce stress concentrations. Channel 610 is open 4 = slave line. Line 612 allows for the same doping w, the old body (four) towel two not "|feed to the early single nozzle array t. Line 614 allows the main, dopant material in a ', come white -...射; the shot is mixed. Line 616 feeds the material of the early solid source to a nozzle array. As can be seen from Figure 4, 'multiple gas sources can be hermetically sealed to a column ^ as seen in Figure 6 The channel can be used to deliver gas from a variety of sources in a variety of ways. For example, the first and second gas sources that are hermetically sealed to a print head or the first, second, and third gas sources can each This is in fluid communication with its own separate array of nozzles. For example, if the structure of Figure 6 is adjusted to include three lines similar to line 616, this will occur. In this form, the first device may further comprise airtightness. Sealing to a second gas source of the printing head. The first through hole of the second layer of f may be in fluid communication with the first group of orifices of the first layer. The second layer may further comprise the second gas source and the second Layer - the second group of orifices is in fluid communication with one of the second through holes. The first device can enter - A third gas source comprising a hermetically sealed seal to the printhead. The second layer of progress includes a third through hole in fluid communication with the fifth gas source and the third group of orifices of the first layer. A plurality of through holes to different gas sources may be in fluid communication with the same orifice, resulting in a gas mixing at the orifice. As illustrated by lines 61; 2, 614, and 616, mixing from different sources may be performed in this manner. One, two, two or more gases. For example, the first through hole may be in fluid communication with a first organic source and the second through hole is in fluid communication with a second organic source 147306.doc • 19- 201102275 Both the through hole and the second through hole are in fluid communication with one of the first layer of the first layer. The print head, the first organic source and the second organic source are each independently separable Controlling the heat source. In addition to the gas on the print head that mixes gases from different sources, the gas source (eg, the first gas source or any of the helium) + other sources of milk may also contain the same evaporation to or from different sources. Gong Xi Xi #士',,,^ to a variety of organic materials. However, mixing in the print allows for maximum control of the maximum flexibility in terms of parameters (e.g., temperature and gas flow) in each chamber of the sublimed organic material. For example, this organic material can be extremely imaginative in the case of significantly different sublimation temperatures. The rate of sublimation can be more easily controlled. In different situations, the temperature required to sublimate a type of 妯 颂 颂 种 种 种 种 种 种 种 种 种 种 种 种 种 种 种 种 种 。 。 。 。 。 。 。 。 Fig. 7 shows a section of a rectangular nozzle 74 which has been actually produced. The nozzle is made in a cut-to-layer 7 joint. The wafer used to form the first layer is thicker than 5 μm at the beginning to take into account the protrusions and has a final thickness of 50 μm. The nozzle 740 has an orifice 73, which is located in the projection 720 from the first layer 710. The orifice 73 has a small size of 2 μm. The protrusion 72 protrudes from the first layer 71 to protrude by a micrometer. The slave uses the mouth 74 在 very close to the substrate so that the nozzle is spaced about 5 microns apart. The protrusion (4) allows the gas discharged from the mouth of the mouth to pass through the -5 micron thick space and escape to the edge of the first layer. The angle between the wall of the mouthpiece and the plane of the first layer 71〇 is 74 degrees. It is easy to use and involves the selective touch of K0H to achieve the following (4) technique: . Figure 7 also shows image 75〇, which shows the etched to the nozzle inlet in the 147306.doc • 20-201102275 electron microscope. Figure 8 shows a photograph of the nozzle side of the finished print head. Nozzle array 8〇2 is an array of rectangular aspect ratio rectangles in the center of the makeup piece. The bump 8 (10) appears as a black square. The larger bumps are positioned further away from the nozzle array, while the smaller bumps are positioned proximate to the nozzle array 802 and are interspersed with the nozzle array 8A2. The bumps 8〇4 help to maintain the desired substrate_nozzle spacing during deposition. The bumps are suitable for use in a laboratory setting, but may or may not be present in a commercial embodiment and also exhibit a displacement sensor window 80. Displacement sensor window 〇6 provides a means for locating the nozzle when the nozzle is in use and when, for example, measuring the substrate/nozzle or based on alignment marks or other features on the substrate. Figure 8 also shows a scanning electron micrograph (SEM) 820 of one of the nozzle arrays. Figure 8 also shows an SEM of one of the nozzle orifices of the nozzle array 8〇2. The structures illustrated and photographed in Figures 5 through 8 have been actually fabricated. The print head is composed of two bonded wafers (the first layer and the second layer). The bottommost wafer is a 1 〇〇 μΐΏ thick nozzle plate, which is shown in Figures 7 and 8. A total of 128 nozzles were engraved into the board. The nozzles have a bottom aperture of size 2q (four), wherein the major axis corresponds to the direction of travel of the substrate to produce a narrow spring having a minimum dimension of 2 〇 μηι. The nozzles are configured in four (four) 32 nozzles. Each of the rows is offset relative to one another to allow for printing of a plurality of side-by-side strips. Each of the rows can simultaneously deposit different organic vapor formulations. The anisotropic residue produces a nozzle body π that is much wider than the exit. Returning the bottom side of the material head (the side facing the substrate) so that the (four) line and other features are raised beyond the wafer table 147306.doc -21 - 201102275. The raised nozzle tip allows the nozzle to be close to the substrate while still The carrier gas is allowed to easily escape in the gap between the print head and the substrate. The raised bump network around the nozzle protects the nozzle tip from impinging on the substrate. The mouthpiece is equipped with a helium and has an optical window to allow for incorporation - an optical displacement sensor to measure the position relative to the substrate. The channel and insulator layer (second layer) shown in Figures 5 and 6 are made of 5 Å thick side silicate glass. The deep fluid channel feeds the nozzles by (iv) 100 to 2 inches into the side of the glass wafer facing the nozzle plate. The channels are fed with fluid through vias extending through the thickness of the wafer. When the channel layer and the insulator layer are joined, a set of three fluid independent fluids is formed: the road. Vapor can be fed through any of the six through holes and will emerge from the nozzle as determined by the layout of the circuit. The heads illustrated in Figures 5 through 8 are incorporated into the organic vapor jet printing system illustrated in Figure 3. As indicated in relation to Figure 3, the print head is placed on the - Kovar manifold. The print head is sealed to the manifold by means of a custom cut rubber sheet and held in place by means of a non-recorded steel and an i_el. High temperature rubber (e.g., Kalrez rubber) can be used for the gasket. Other packaging strategies can be used, such as anodic bonding the print head to a kovar backsheet. It is believed that a metal backing will provide a stronger tough sealing surface for the print head. Mathematical modeling of the effects of spray t and print head to substrate gap can be performed. The flow of carrier gas through the printhead to the 2-plate gap can be modeled using a lubrication approximation of the non-I-reducible flow. All non-radial flow components are ignored. Defining the flow characteristic length series of print head to substrate gap h. This length is 147306.doc •22- 201102275 The pressure change is negligible and the ideal gas law can be used to approximate the gas expansion in the radial dimension. The average velocity of the vapor flow is given by EqILA·丨. The μ system is a 'P system pressure' τ system temperature, R is an ideal gas constant, a r system radius, and a j system molar flow rate.

方程式 II.A.1 (y)=z£^. J RT dr 2τώΓ~Ρ 可將此表達為微分方程式Eq ILA 2&求解。丨及〇下標指 示輸入及輸出條件。 方程式 Π.Α.2 = _ d2 _ 12々成7\ f r \Γί . 饭疋外半徑為50 mm,且内半徑為10 mm,載體氣體 黏度為2.5X10·5 kg/m*s,—摩爾流率等於2 s_,且列印 頭之外部邊緣處之壓力可忽略不計,則該圓盤之内部上之 壓力係大約3500 pa。 直觀地,取大壓力降將出現於喷嘴之下尖端與基板之間 的門隙中之間。作又定此間隙之下游端係處於3,湖,則 内P氣體刀子將具有3 ·5 μιη之-平均自由路徑。微粒對壁 ^碰撞在此狀況中將可能處於支配地位,因此可將其視為 一克努森流(Knudsen flow)。使用 】VacEquation II.A.1 (y)=z£^. J RT dr 2τώΓ~Ρ This expression can be solved as the differential equation Eq ILA 2&. The 丨 and 〇 subscripts indicate the input and output conditions. The equation Π.Α.2 = _ d2 _ 12々成7\ fr \Γί . The outer radius of the rice cooker is 50 mm, and the inner radius is 10 mm, and the carrier gas viscosity is 2.5×10·5 kg/m*s. The flow rate is equal to 2 s_ and the pressure at the outer edge of the print head is negligible, and the pressure on the inside of the disc is approximately 3500 pa. Intuitively, a large pressure drop will occur between the tip of the nozzle and the door gap between the substrate. The downstream end of the gap is at 3, the lake, then the P gas knife will have a -5 μηη-average free path. Particle-to-wall collisions may be dominant in this situation, so they can be considered as a Knudsen flow. Use 】Vac

Sci.Tech 8 636_46之轉移概率方法,藉由^ιια3給出兩 個區域之間的分子流率,其中J係分子流率,T及P係溫度 及壓力’m係載體氣體之分子f量,讀管之面積且评係一 傳輸概率。如她1* D. J.及 Boeckman J. Vac Sci kh.A 9 (4) 8 Jul/Aug 1991針對具有4:i之一長度對高度 比之一寬矩形管道計算出w=〇 533。 147306.doc •23· 201102275 方程式Π.Α.3The transfer probability method of Sci.Tech 8 636_46, which gives the molecular flow rate between two regions by ^ιια3, wherein the molecular flow rate of the J system, the temperature of the T and P systems, and the molecular weight of the m-m carrier gas, The area of the tube is read and evaluated as a transmission probability. For example, she 1* D. J. and Boeckman J. Vac Sci kh. A 9 (4) 8 Jul/Aug 1991 calculates w = 533 533 for a rectangular pipe having a length of 4: i and a height ratio. 147306.doc •23· 201102275 Equation Π.Α.3

Aw I~~8, 丁—A) =0.0023^^ (針對平行 之間隙) 藉由直接模擬蒙特卡羅技術對可能嘴嘴設計之—研究表 明,具有-内部錐形及外部錐形之一喷嘴設計產生用於高 解析度沈積之最佳流型。流阻與上文之分析模型十分吻 σ從而預測〇.〇021 Sccm/Pa之流導。推薦剖面為 μ μΠ1之矩形喷嘴尖端。所推薦之喷嘴至基板間隔 係3至5 μΐη。可使32個此種噴嘴或更多個此種噴嘴處於一 =列中。一大噴嘴陣列係、有^的,此乃因其減小蒸氣產生 器/、基板之間的壓力差。預期所產生之沈積輪廓具有^ 8 μηι之一帛峰全寬。予員冑沈積降低至其4"爪之中心線值之 10%,從錢得其能夠準確地沈積在以3G㈣為邊界之一 3〇 pm像素内而不顯著強加於相鄰像素。對於具有2〇興寬 孔口及5㈣尖端至基板間隙之一雙錐形噴嘴,所預期沈積 輪廓在圖9中顯示為一實線。高度以任意單位皆可。具有 等於像素寬度之輪廓平均值之高度的—理想像素填充沈積 輪廓係以虛線顯示。 圖員示針對具有20 4!„寬孔口及5 μιη尖端至基板間隙 之經建模壓力輪廓1〇1〇及一經建模溫度輪廊由嗔 嘴本體所形成之障壁係剖面十之黑暗區域。該等輪廊係對 稱的,因此僅顯示嗔嘴之一半即可捕獲相關資訊。 可在噴嘴上之一外部錐形不匹配噴嘴之内部錐形之情形 下達成7人滿思的沈積輪廓,然而此由於經模擬喷嘴結構 147306.doc • 24- 201102275 之傳導性降低五分夕m 列印頭之诗丨 ❿係較不佳的。-旦考量自喷嘴至 yj丨頌之減小之翁辦 ,豆贺出路徑,該效應即變得更為明顯。 強』望流率所需之壓力稀釋蒸氣流中之有機物且增 【列:頭與基板之間的熱傳遞。此導致-不理想操作狀 且,’’、、而不具有底側錐形之列印頭已證明係有效沈積工 ,、’且可由於其比具有—錐形底側之—列印頭更容易製作 而加以使用。 若去除内部錐形,則操作壓力增加,但並不嚴重。然 有趣地’尤積輪廓呈現一雙峰結構(顯示於圖9中)。可 Up 瑕佳化以產生一最佳化臺面狀沈積輪廊係可能 的。可使用電漿蝕刻來製作各式各樣之幾何形狀。 亦可對穿過蒸氣產生器及通道陣列之流動進行數學建 核。使用自不可壓縮納維耳•史托克斯(Navier_st〇kes)方 矛°式導出之eq.II.Β.ι來計算具有短剖面尺寸匕及較大剖面尺 寸w之一矩形管道之體積流率。然後使用理想氣體定律將 其轉換為一摩爾流率。μ係黏度且X係通道之軸向尺寸且沿 下游方向為正。ρ、Τ係通道中之壓力及溫度。尺係理想氣 體常數。 方程式 Π.ΒΙ 〇 _ PdPh5w_ dP2 h\v dxllM ^ ~ ΚΓάχ\1μ~ ~ώ^2Α^ 可藉由將喷嘴陣列分成若干段且應用類似於基爾霍夫電 流定律之推理來對其加以分析。穿過一喷嘴之一可壓縮層 流通常根據Qm〇1〜p2按比例縮放。然而,由於極小長度尺 度’整個喷嘴本身隨著p線性地按比例縮放。已使用一直 接模擬蒙特卡羅碼估計sec I.B.2中所禁止之幾何形狀之喷[s ] 147306.doc •25· 201102275 m〇l/(pa*s)。圖u顯示用於一 —模型。已估計流阻且甚至已 之分佈。 嘴的一損失因數C=5.4xl〇-H 喷嘴陣列之一線路分析中之 驗證陣列中蒸氣至所有嘴嘴 方程式 Π.Β.2 °° L 方程式 II.Β.3Aw I~~8, D-A) = 0.0023^^ (for parallel gaps) By direct simulation of Monte Carlo techniques for possible nozzle design - studies have shown that one nozzle with internal cone and outer cone The design produces the optimum flow pattern for high resolution deposition. The flow resistance is very close to the analytical model above and thus predicts the conductance of 〇.〇021 Sccm/Pa. Rectangular nozzle tips with a profile of μ μΠ1 are recommended. The recommended nozzle to substrate spacing is 3 to 5 μηη. It is possible to have 32 such nozzles or more such nozzles in a = column. A large nozzle array is provided because it reduces the pressure difference between the vapor generator/substrate. The resulting deposition profile is expected to have a full width of one of the peaks of ^ 8 μηι. The 胄 deposition is reduced to 10% of the centerline value of its 4" claws, which can be accurately deposited in the 3 〇 pm pixel of 3G (4) as a boundary without significantly imposing on adjacent pixels. For a biconical nozzle having a 2 〇 wide opening and a 5 (four) tip to substrate gap, the expected deposition profile is shown in Figure 9 as a solid line. Height can be in any unit. The ideal pixel fill deposition profile having a height equal to the contour average of the pixel width is shown in dashed lines. The figure shows a modeled pressure profile 1〇1〇 with a 20 4′′ wide orifice and a 5 μιη tip to the substrate gap and a dark zone of the barrier profile formed by the mouthpiece body of the modeled temperature gallery. The wheel corridors are symmetrical, so that only one and a half of the nozzles can be displayed to capture relevant information. A 7-person thinking contour can be achieved in the case where one of the outer tapers on the nozzle does not match the internal taper of the nozzle. However, due to the reduced conductivity of the simulated nozzle structure 147306.doc • 24- 201102275, the poems of the five-point m-printing head are less good. The effect is more pronounced. The pressure required to force the flow rate dilutes the organic matter in the vapor stream and increases [column: heat transfer between the head and the substrate. This leads to - unsatisfactory operation The printhead, which has a '', without a bottom taper, has proven to be an effective depositer,' and can be used because it is easier to manufacture than a printhead having a tapered bottom side. If the internal cone is removed, the operating pressure increases, but Not serious. However, it is interesting that 'European outline presents a double-peak structure (shown in Figure 9). It can be upgraded to produce an optimized mesa-like deposition wheel corridor. It can be fabricated using plasma etching. A wide variety of geometries. Mathematical nucleation of flows through the vapor generator and channel array is also possible. The eq is derived from the incompressible Navier_st〇kes equation. .II.Β.ι calculates the volumetric flow rate of a rectangular pipe having a short cross-sectional dimension 匕 and a larger cross-sectional dimension w. It is then converted to a molar flow rate using the ideal gas law. μ-viscosity and X-channel The axial dimension is positive in the downstream direction. ρ, the pressure and temperature in the lanthanide channel. The ideal gas constant of the rule system. Equation Π.ΒΙ 〇_ PdPh5w_ dP2 h\v dxllM ^ ~ ΚΓάχ\1μ~ ~ώ^2Α^ The nozzle array can be analyzed by dividing it into segments and applying a reasoning similar to Kirchhoff's current law. The compressible laminar flow through one of the nozzles is typically scaled according to Qm〇1~p2. Due to the extremely small length scale 'the whole spray It is itself scaled linearly with p. A direct analog Monte Carlo code has been used to estimate the geometry of the sec IB2 prohibited spray [s ] 147306.doc •25· 201102275 m〇l/(pa*s) Figure u shows for a model. The flow resistance has been estimated and even distributed. A loss factor for the mouth C = 5.4xl 〇 -H One of the nozzle arrays in the line analysis verifies the vapor in the array to all the mouth equationsΠ .Β2°° L Equation II.Β.3

Qn^Cf(Pn,PT)方程式 Π Β 4 在32個段之後,預期有小於〇2%之一壓力改變。預期驅 動流穿過該等噴嘴之壓力沿該陣列係恒定的。 。可藉由eq ΙΙ.Β.5近似蒸氣產生速率,其中ρ係蒸氣產生 單兀之壓力P係單兀中有機材料之平衡蒸氣壓力,q待 載體氣體之流率及離開單元之有機材料量。丫係指示自轰 生器流出之蒸氣之飽和度之_效率參數。此對於—設計良 好之系統接近於1。可根據先前〇VJp工作估計〇led材剩 之二氣C力 先刖糸統使用在8托下之5 seem之載體氣 體將飽和CBP蒸氣朝肖噴嘴掃出源單元。該儀器能夠達成 一2000 A/s沈積速率,此表明大約2χ1〇14分子/s之一蒸氣彦 生速率及800微托之一 CBP蒸氣壓力。 eq.II.B.5 j = y~-q 假定在40托之一操作壓力下穿過CBp蒸氣產生器之一載 體氣體流動為4 seem,則將產生大約3.3 xl〇〗3分子/s ^此在 育嘴孔口下方轉變為900 A/s之一沈積速率。此又預測〇.6 mm/s之一寫入速度。載體氣體流率已自此等所估計條件顯 著減小’其中典型的係1 seem之流動及低於1 〇托之壓力。 儘管發生此改變’但已觀察到約1 mm/s之相當寫入速度。 147306.doc 26· 201102275 ::氣產生器中之有機物舟皿之建模假定有機物係儲存 氣r而:=囊',且係藉由在排氣孔上方移動之载體 二: 在此情形下’有機蒸氣與載體氣體混合 單猶::ί生器處於,飽和狀態中。預期載體氣體之 μ動亚非係冑有機材料向下游前進所必需的。此 外,根據摩爾分數(〜0.004%)有機蒸氣已係非常稀釋的。 進一步稀釋可僅增加I力降而不改良效能。 若允許穿過有機蒸氣源單元之流動停滞,則有機材料可 精由將向上游遷移至包封源單元的管之較冷區域而回流。 假疋將有機蒸氣源單元維持處於4 sccm、4〇托及则。C, 則根據C〇MSOL中之建模一 5⑽經加熱區足以防止有機材 枓回流。操作條件可與此等初始預測條件顯著不同,然而 並未觀察到有機材料之嚴重回流。 亦可執行1分析以對整個有機蒸氣喷射沈積系統中之 溫度建模。 可對列印頭之溫度建模。可藉由使用大面積觸點施加一 歐姆加熱電流直接穿過該列印頭來達成均勻加熱。若需 要,,則可藉由施加至該列印頭底側之丁丨或犯之一額外薄層 來、、充/、傳^性。〜係一良好熱導體,且删矽酸鹽層幫助 減:至金屬月板之熱傳遞。經驗已顯示,對於已實際製作 之幾何形狀’列印㈣要約4()至6() w之加熱以在非常接近 於、、二冷凍基板時達到300。(:之—操作溫度。在多個點處 對歹」P碩恤度之直接量測尚不可行,但在空氣中之較低功 率量測表明跨越列印頭溫度係均勻的。藉由具有連續 147306.doc -27- 201102275 輸出之一經隔離DC電力供應源來驅動用於列印頭之加熱 電流此已證明對於消除由接通/關斷控制所導致的時域 熱應力與因一未隔離電力供應源所致的電弧放電之危險兩 者係合意的。 為進行良好近似,藉助Comsol之建模指示,亦預期沿著 通道所對的區域中之剖面溫度係均勻的。 亦可對基板之溫度建模。發明人在實驗室中對一溫度受 控基板卡盤上之OLED生長所做的先前未公開之研究顯 示,可在約360K之溫度下生長膜而所產生之裝置中無嚴重 效能損失。此可被視為用於基板表面之一近似最大合意溫 度規範。基於建模,在圖12中顯示在一 2〇 mm寬嘴嘴附近 之一基板上之熱傳遞輪廓。用於計算之噴嘴係具有⑺ 寬孔口及5 μπι尖端至基板間隙之一雙錐形噴嘴。距離係自 喷嘴中心線開始。模型結果與分析估計十分吻合。 如可在圖12中看到,噴嘴本身產生具有4〇 w/em2熱通量 之熱點。此比得上15 W/cm2之一平均熱通量。由於此等熱 點相對小,因此與周圍基板(其充當一散熱片)相比僅存在 -適度溫度增加。COMSOL中之建模預測—熱點中僅約 2〇K之一穩定狀態溫度增加。雖然此等個別熱點易於管 理’但來自諸多此等熱點之總體熱負載係高的。液氮冷卻 可係較佳以穿過一玻璃基板驅動足夠熱傳遞以保持該基板 之表面低於職。為此目的,〇Vjp系統已裝備有能夠將 基板托架冷束至聰及以下之—叫饋送系統。藉助此配 置達成之在低基板溫度下沈積有機材料具有減少材料遷移 147306.doc -28- 201102275 及改良特徵銳度之進一步優點。 亦可對蒸氣產生器中之熱傳遞建模。蒸氣產生器之熱傳 遞建模具有固體分量與流體分量兩者。在載體氣體與產生 器之基底處之有機源舟皿接觸之前,較佳將該載體氣體快 速加熱至有機物昇華溫度。藉助C〇ms〇i之建模指示,此由 於短特性長度與減小之壓力下氣體之相對高熱傳導性之組 合而極快地發生。假定周圍環境與源單元之經加熱區域之 間存在壁溫度之一銳轉變,則加熱氣體需要僅4爪爪之一轉 變長度。 熱傳遞問題之固體分量涉及量化此轉變之銳度。可將源 單凡管作為一維問題來建模。由於管具有薄壁,因此徑向 溫度梯度係最小的。進-步假定該管之内含物具有最小熱 貝里,其係由載體氣體之短熱轉變長度支援之一假定。藉 由eq.II.C.l給出用於此等假定且計及黑體輻射之熱方程 式。 方程式 H.CU kT^ = <^r,T:)+h[T_Tc) 其中k係金屬管之熱傳導性,㈠系管厚度,且Tc係室溫 度。 /假定30毫托之-室背景壓力,則源單元將具有一熱傳遞 係數纟中殘餘至氣體為h=5 4 。在線性化黑體輪 射項之後’ eqJLC]可變換成方程式叫1(:2。此方程式 之特性長度係2 cm ’且給出對蒸氣產生器管中經加熱區域 與未加熱區域(間的溫度梯度之長度之一粗略估計。因 此在氣體机動經過-有機蒸氣源之前使該氣體升溫需要[ 147306.doc -29- 201102275 一最小長度之經加熱管。 方程式II.C·2 dx V m) 亦可對一列印頭之機械變形建模。已識別列印頭變形之 兩個可能原因。因不均勻加熱及熱膨脹之差異所致的熱誘 發應力可致使列印頭翹曲。跨越形成通道基底的噴嘴板之 刀可存在一相對大壓力差。正確地估計此等變形之長产 且進行設計以使其等最小化係合意的以獲得在印刷期間保 持平坦(此對於準確印刷又係合意的)之一列印頭。 據信,迄今為止,最顯著變形係因列印頭晶圓堆疊中之 熱應力而產生。使用COMSOL中之河£河!5熱,結構交互作用 封裝來對因熱應力所致的垂直偏轉建模。以圓柱座標對晶 圓堆疊建模。假定室溫下之完全平坦度,—旦啟動薄膜加 熱益,則經計算晶圓堆疊向下彎曲以使得板之中心低於外 部邊緣20 μιη。在一 Flexus薄膜應力量測設備上對—列印頭 原型之量測展示翹曲以使得晶圓之中心高於外部邊緣丨〇 p。 圖13顯示隨溫度而變的一晶圓之中心相對於外部邊緣之 高度的一曲線圖13 10以及用於獲得資料之設置之一示意圖 1320。一單個晶圓之資料係顯示為正方形,且一列印頭= 疊之資料係顯示為菱形。示意圖132〇顯示一侧矽酸睡層 !324及-_ 1322。雖然大約1G μιη之—位移相對於喷^ 間距係顯著的,但預期噴嘴陣列本身上之平坦产係 約2 μη!。較低數目係由於噴嘴在接近基板之中心處相對靠 近在一起且當晶圓變形時作為一群組移動。由於喷嘴陣5 將向下彎曲,因此板將不阻礙噴嘴定位,且可使噴嘴任音 I47306.doc -30· 201102275 地靠近》可將噴嘴本身置於死點以最小化基板彎曲。一旦 經適當校準,則一非接觸高度感測器可量測在操作溫度下 喷嘴尖端與基板之間的相對距離。預期熱翹曲係最大誤差 源’但係可保持於可管理水平下之一誤差源。 對於圖3中所顯示之系統,預期蒸氣產生器本身回應於 力,、’、而延長夕達2〇〇 。為防止此使列印頭扭曲,可藉由 圖3中所圖解說明之波紋管將蒸氣產生器連接至凸緣。此 防止凸緣推撞列印頭。 亦考量壓力差對晶圓變形之效應。藉由eq II D 2(其係基 ;Moore J.H. ^ Davis ' C.C. A M.A. Coplan ^ Building ⑽(西方觀點出版社;第三版(2〇〇2))給出 在短軸剖®中一膜片回應於一均勻分佈負載之最大折腎。 此亦係雙調和應力方程式之—結果。如前所述,W係垂直 位移,P係麼力負載,且E係揚氏模數,且t係板厚度。L係 板之寬度。預期一 5〇 μιη厚' i _寬之Si膜片回應於 1〇,〇00 Pa之-最壞情形跨膜片壓力差而向外彎曲 此亦非係一顯著變形,然而,變形對膜片厚度之立方反比 相依性意味著膜月對於—較薄剛性喷嘴板可變形較大。但 預期此等變形將亦係可管理的。 方程式 II.D.2 ν»- Pl4 _ 32^3 戈口上又所提及 之位置’此乃因跨越一相對小噴嘴陣列之變形甚至在跨越 列印頭之剩餘部分存在較大f形時亦可係小的。為此目 的,獲得-刚⑽RZ_25演示模型且對照一 ιτ〇玻璃目標⑴ 147306.doc -31 · 201102275 對其進行測試。該感測器由—束光纖組成。某些纖維發射 光而其他纖維接收光。藉由該束與—反射目標之間的距離 來確疋發射纖維與接收纖維之間的耗合程度。Rz串聯感測 器之特徵料行操作以對目標反射率之差異進行校正之兩 個單獨束。 信號穩定至1 mV,且假設〇._ ν/μιη之一線性回應,則 可獲仔- 250 nm之精度。廣告精度係鹰nm。感測器之線 I·生1巳圍明顯文ιτο之透明度及來自遠表面之反射之強度限 制。若ITQ目標坐落於—反射表面上,則感測器並不正常 工作。若ITO目標係安裝於一無光澤黑色表面上,則線性 範圍延伸大約300 Mme此係廣告值的約一半。當自一不透 明目^ $測時可獲得全線性範圍。可使用其他量測技術來 對此等問題進行補償。雖然感測器之範圍係有限的,但 3〇〇 μηι對於台抬高之精細控制係綽綽有餘。—非反射基板 托架係較佳的。圖14顯示針對一 ΙΤ〇目標上之一 RZ 25位移感測器之校準的位移對電壓之一曲線圖。 圖15顯不用於針對微製作來製備矽及硼矽酸鹽晶圓之一 衣程机耘。可自UUrasil公司(加利福尼亞州海沃德市)獲得 絕緣體上石夕(S〇i)晶圓151〇。s〇I晶圓151〇可用於製成喷嘴 板在接收到時’晶圓係100 mm直徑,其中—100 μηι厚Si 裝置層1516藉由—1至3 pm si〇2氧化物層ι514而與一315 μηι厚Si處置層1512分離。自w也犷(馬薩諸塞州 人布裏奇市)獲得雙側拋光(Dsp)1〇〇 直徑、$⑽pm厚硼 矽酸鹽玻璃晶圓155〇。 147306.doc •32· 201102275 使用LNF遮罩製造器及用於顯影鉻遮罩之s〇p來產生用 於所有四個光微影界定之圖案之遮罩。在開始光微影處理 之前,在SOI晶圓上方於兩個側上生長一LpcvD以以4硬 遮罩層1522,如晶圓1520所圖解說明。類似地,在硼矽酸 鹽玻璃晶圓之每一側上沈積20 nm Cr/5〇〇 Au/ 2〇 nm Cr/ 500 nm Au之一硬遮罩層1562以為蝕刻作準備,如晶圓 1560所圖解說明。 圖16顯示用於製作一列印頭之以及硼矽酸鹽處理之步 驟。Qn^Cf(Pn, PT) Equation Π Β 4 After 32 segments, a pressure change of less than 〇2% is expected. The pressure of the drive stream through the nozzles is expected to be constant along the array. . The vapor generation rate can be approximated by eq ΙΙ.Β.5, where ρ-system vapor produces a pressure of a single enthalpy P, an equilibrium vapor pressure of the organic material in the unitary enthalpy, q the flow rate of the carrier gas, and the amount of organic material leaving the unit. The lanthanum indicates the efficiency parameter of the saturation of the vapor from the bomber. This is good for a well-designed system close to 1. According to the previous 〇VJp work, it is estimated that the remaining gas C force of the 材led material is used to sweep the saturated CBP vapor toward the oscillating nozzle out of the source unit using the carrier gas of 5 seem under 8 Torr. The instrument is capable of achieving a deposition rate of 2000 A/s, which indicates a vaporization rate of about 2 χ 1 〇 14 molecules/s and a CBP vapor pressure of 800 μTorr. eq.II.B.5 j = y~-q Assuming that the carrier gas flow through one of the CBp vapor generators at 4 operating pressure is 4 seem, then approximately 3.3 xl 〇 3 molecules/s ^ will be produced. This translates to a deposition rate of 900 A/s below the mouth of the mouth. This in turn predicts a write speed of 〇.6 mm/s. The carrier gas flow rate has been significantly reduced from such estimated conditions as the typical flow of 1 seem and the pressure below 1 Torr. Despite this change', a comparable write speed of about 1 mm/s has been observed. 147306.doc 26· 201102275: The modeling of the organic boat in the gas generator assumes that the organic matter stores the gas r:: = sac, and is carried by the carrier 2 above the vent: in this case 'The organic vapor is mixed with the carrier gas. The water is in the saturated state. It is expected that the carrier gas of the carrier gas is necessary for the organic material to advance downstream. In addition, organic vapors have been very diluted according to the mole fraction (~0.004%). Further dilution can only increase the I force drop without improving the performance. If the flow through the organic vapor source unit is allowed to stagnate, the organic material can be reflowed by migrating upstream to the cooler region of the tube enclosing the source unit. The false hydrazine maintains the organic vapor source unit at 4 sccm, 4 Torr and then. C, then according to the modeling in C〇MSOL, a 5(10) heated zone is sufficient to prevent the organic material from flowing back. Operating conditions can be significantly different from these initial prediction conditions, however, no significant reflux of organic materials has been observed. An analysis can also be performed to model the temperature in the entire organic vapor spray deposition system. The temperature of the print head can be modeled. Uniform heating can be achieved by applying an ohmic heating current directly through the print head using a large area contact. If necessary, it can be charged, transferred, or transferred by applying a thin layer to the bottom side of the print head. ~ is a good thermal conductor, and the silicate layer helps to reduce: heat transfer to the metal moon. Experience has shown that for the actually fabricated geometry 'printing (iv), heating of about 4 () to 6 () w is required to reach 300 when it is very close to, and two frozen substrates. (:--Operating temperature. Direct measurement of P-degrees at multiple points is not feasible, but lower power measurements in air indicate uniform temperature across the print head. Continuous 147306.doc -27- 201102275 One of the outputs is driven by an isolated DC power supply to drive the heating current for the print head. This has been proven to eliminate the time domain thermal stress caused by the on/off control. The risk of arcing due to the power supply is both desirable. For a good approximation, it is also expected that the profile temperature in the region along the channel will be uniform with the modeling indication of Comsol. Temperature Modeling. Previous inventive studies by the inventors in the laboratory of OLED growth on a temperature controlled substrate chuck showed that the device can be grown at temperatures of about 360 K without serious effects in the device produced. Loss. This can be considered as an approximate maximum desired temperature specification for one of the substrate surfaces. Based on modeling, the heat transfer profile on one of the substrates near a 2 mm wide nozzle is shown in Figure 12. nozzle A double-cone nozzle with (7) wide aperture and 5 μπι tip to the substrate gap. The distance starts from the nozzle centerline. The model results are in good agreement with the analytical estimates. As can be seen in Figure 12, the nozzle itself has 4 turns. W/em2 heat flux hotspot. This compares to an average heat flux of 15 W/cm2. Since these hot spots are relatively small, there is only a moderate temperature increase compared to the surrounding substrate (which acts as a heat sink). Modeling prediction in COMSOL—only one of the hotspots in the hot spot has a steady state temperature increase. Although these individual hotspots are easy to manage, the overall thermal load from many of these hotspots is high. Liquid nitrogen cooling can be compared. It is preferred to drive sufficient heat transfer through a glass substrate to keep the surface of the substrate below the job. For this purpose, the 〇Vjp system has been equipped with a so-called feed system capable of cold-bundling the substrate holder to the following. The configuration of the deposited organic material at low substrate temperatures has the further advantage of reducing material migration 147306.doc -28- 201102275 and improved feature sharpness. The heat transfer in the steam generator can also be modeled. The heat transfer modeling of the steam generator has both a solid component and a fluid component. Preferably, the carrier gas is rapidly heated to the organic sublimation temperature prior to contacting the carrier gas with the organic source boat at the base of the generator. The modeling indication of ms〇i, which occurs very quickly due to the combination of the short characteristic length and the relatively high thermal conductivity of the gas under reduced pressure. It is assumed that there is one of the wall temperatures between the surrounding environment and the heated region of the source unit. For sharp transitions, heating the gas requires only one of the four claws to transform the length. The solid component of the heat transfer problem involves quantifying the sharpness of this transition. The source tube can be modeled as a one-dimensional problem. Since the tube has a thin wall, Therefore, the radial temperature gradient is minimal. The step-by-step assumes that the contents of the tube have a minimum of heat, which is assumed by one of the short thermal transition lengths of the carrier gas. The thermal equations for these assumptions and accounting for blackbody radiation are given by eq. II.C.l. Equation H.CU kT^ = <^r,T:)+h[T_Tc) where k is the thermal conductivity of the metal tube, (i) the thickness of the tube, and the Tc is the room temperature. / Assuming a 30 mTorr-chamber background pressure, the source cell will have a heat transfer coefficient 纟 residual to gas of h = 5 4 . After the linearized black body firing term, 'eqJLC' can be transformed into an equation called 1 (: 2. The characteristic length of this equation is 2 cm ' and gives the heated and unheated regions in the vapor generator tube (between One of the lengths of the gradient is roughly estimated. Therefore, it is necessary to heat the gas before it is moved through the organic vapor source [147306.doc -29- 201102275 a minimum length of heated tube. Equation II.C·2 dx V m) Modeling the mechanical deformation of a print head. Two possible causes of deformation of the print head have been identified. Thermally induced stress due to differences in uneven heating and thermal expansion can cause the print head to warp. The nozzle plate knife may have a relatively large pressure differential. Properly estimate the prolonged production of such deformations and design to minimize it to achieve flatness during printing (this is desirable for accurate printing) One of the print heads. It is believed that the most significant deformation to date has been due to the thermal stress in the stack of wafers in the print head. Use the river in COMSOL! 5 heat, structural interaction package to Modeling of vertical deflection due to thermal stress. Modeling the wafer stack with cylindrical coordinates. Assuming complete flatness at room temperature, once the film heating benefit is initiated, the wafer stack is calculated to bend downwards to center the board 20 μιη below the outer edge. The measurement of the printhead prototype on a Flexus film stress measurement device shows warpage so that the center of the wafer is higher than the outer edge 丨〇p. Figure 13 shows the temperature change A graph 13 10 of the height of the center of a wafer relative to the outer edge and a schematic diagram 1320 for setting the data. The data of a single wafer is displayed as a square, and the data of one column = stack is displayed. It is a diamond shape. The schematic diagram 132〇 shows one side of the citrate sleep layer! 324 and -_ 1322. Although the displacement of about 1G μηη is significant with respect to the spray spacing, it is expected that the flat line on the nozzle array itself is about 2 μη! The lower number is due to the nozzles being relatively close together near the center of the substrate and moving as a group when the wafer is deformed. Since the nozzle array 5 will bend downward, the plate will not hinder nozzle positioning, The nozzle can be placed at the dead center to minimize the bending of the substrate. Once properly calibrated, a non-contact height sensor can be measured at the operating temperature. The relative distance between the nozzle tip and the substrate. It is expected that the thermal warpage is the largest source of error 'but can be maintained at one of the manageable levels. For the system shown in Figure 3, the vapor generator itself is expected to respond to the force. , , and, for an extension of 2 〇〇. To prevent this from twisting the print head, the steam generator can be attached to the flange by the bellows illustrated in Figure 3. This prevents the flange from colliding with the print Head. Also consider the effect of pressure difference on wafer deformation. A diaphragm in the short-axis section® is given by eq II D 2 (the basis of which; Moore JH ^ Davis ' CC A MA Coplan ^ Building (10) (Western Perspectives Press; Third Edition (2〇〇2)) Respond to the maximum distribution of the load of the uniform distribution of the kidney. This is also the result of the double-tuned stress equation. As mentioned above, W is the vertical displacement, P is the force load, and the E system is the Young's modulus, and the t-plate Thickness. The width of the L-series plate. It is expected that a 5 〇μιη thick 'i _ wide Si diaphragm responds to 1 〇, 〇 00 Pa - the worst case cross-film pressure difference and outward bending is not a significant Deformation, however, the inverse inverse dependence of the deformation on the thickness of the diaphragm means that the membrane is more deformable for thinner rigid nozzle plates, but it is expected that such deformations will also be manageable. Equation II.D.2 ν» - Pl4 _ 32^3 The position mentioned on the Gekou' is due to the fact that the deformation across a relatively small nozzle array can be small even when there is a large f-shape across the remainder of the print head. , get the - just (10) RZ_25 demo model and compare it with a ιτ〇 glass target (1) 147306.doc -31 · 201102275 Line test. The sensor consists of a bundle of fibers. Some fibers emit light while others receive light. The distance between the beam and the reflection target is used to determine the degree of depletion between the emission fiber and the receiving fiber. The characteristic line of the Rz series sensor operates with two separate beams that correct for the difference in target reflectance. The signal is stable to 1 mV, and assuming a linear response of 〇._ ν/μιη, it can be obtained - Accuracy of 250 nm. The accuracy of the advertisement is eagle nm. The line of the sensor I·1 is clearly defined by the transparency of the ιτο and the intensity of the reflection from the far surface. If the ITQ target is located on the reflective surface, then the sensing The ITO target is not working properly. If the ITO target is mounted on a matt black surface, the linear range extends approximately 300 Mme to approximately half of the advertising value. A full linear range is available when measured from an opaque target. Other measurement techniques are used to compensate for these problems. Although the range of the sensor is limited, 3〇〇μηι is more than enough for the fine control system of the table height. The non-reflective substrate holder is preferred. 14 significant A plot of the displacement vs. voltage for one of the RZ 25 displacement sensors on a target. Figure 15 is not intended for use in microfabrication to prepare one of the tantalum and borosilicate wafers. UUrasil (Hayward, Calif.) obtained 151 Å on insulator S 〇 ) 〇 〇 〇 晶圆 晶圆 晶圆 晶圆 晶圆 晶圆 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 喷嘴 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' The -100 μηι thick Si device layer 1516 is separated from a 315 μη thick Si treatment layer 1512 by a -1 to 3 pm si〇2 oxide layer ι514. A two-side polished (Dsp) 1 inch diameter, $(10) pm thick boron bismuth silicate glass wafer was obtained from W. (Bridge, MA). 147306.doc •32· 201102275 Use the LNF mask maker and s〇p for developing the chrome mask to create a mask for all four photolithographically defined patterns. Prior to the start of photolithography, an LpcvD is grown on both sides over the SOI wafer to form a 4 hard mask layer 1522, as illustrated by wafer 1520. Similarly, a hard mask layer 1562 of 20 nm Cr/5 〇〇Au / 2 〇 nm Cr / 500 nm Au is deposited on each side of the borosilicate glass wafer to prepare for etching, such as wafer 1560 Illustrated. Figure 16 shows the steps for making a print head and borosilicate treatment.

Si處理如下。藉助使用spR 220光阻劑之喷嘴入口遮罩 圖案化來自圖15之上覆於S〇I晶圓之以川4層。然後藉助一 150s深反應性離子蝕刻將喷嘴入口上方之“山#層蝕刻掉。 然後在一 85 C之50 wt% K0H:溶液中蝕刻晶圓達100分鐘以 形成喷嘴之内部錐形表面。此步驟之結果顯示於晶圓163〇 中。此時亦切割喷嘴板中用於位移感測及光學對準之窗 (未顯不)。SOI晶圓之絕緣體層形成界定每一噴嘴之出口 的一蝕刻停止件。然後藉助一反應性離子蝕刻或熱磷酸蝕 刻來移除81^4層。此步驟之結果顯示於晶圓丨64〇中。Si treatment is as follows. The nozzle entrance mask using spR 220 photoresist was patterned to form a layer of 4 layers from the S〇I wafer on top of FIG. The "Mountain # layer" is then etched away by a 150s deep reactive ion etch. The wafer is then etched in a 85 C 50 wt% K0H: solution for 100 minutes to form the internal tapered surface of the nozzle. The result of the step is shown in the wafer 163. The window for displacement sensing and optical alignment in the nozzle plate is also cut (not shown). The insulator layer of the SOI wafer forms one of the outlets defining each nozzle. The stop is etched. The 81^4 layer is then removed by a reactive ion etch or hot phosphoric acid etch. The results of this step are shown in the wafer 丨64〇.

删石夕酸鹽處理如下’且係改編自Ciprian IHescu,F. E. HDephosphorized acid salt is treated as follows' and is adapted from Ciprian IHescu, F. E. H

Tay 及 J. Miao Sens. Act. A. 2 (133),395-400 (2007)。將來 自圖15之金屬化棚矽酸鹽玻璃晶圓在兩個側上塗佈1〇 AZ-9260抗蝕劑且以光微影方式在一個側上圖案化通道圖 案而在另一側上圖案化通孔圖案。然後藉助交替浸入 Transene GE-8148金|虫刻劑達4分鐘及Cyantek⑶七鉻姓Tay and J. Miao Sens. Act. A. 2 (133), 395-400 (2007). The metallized shed silicate glass wafer from Figure 15 was coated with 1 Å AZ-9260 resist on both sides and patterned on one side in a photolithographic pattern and patterned on the other side. Through hole pattern. Then alternately immersed in Transene GE-8148 gold | insect engraving for 4 minutes and Cyantek (3) seven chrome surname

L 147306.doc -33- 201102275 刻劑達3G秒將金屬硬遮罩姓刻掉。此等步驟之結果顯示於 晶圓1610中。藉助石蟻將晶圓之通孔側附加至-襯背晶圓 、保。蔓其S又姓刻劑影響。曝露通道側。然後將晶圓浸沒 於49% HF命液中直至將通道餘刻至_㈣為止。使用— 觸針式輪廓測定儀來驗祕刻深度。在約15 ―内達成所 期望蝕刻量。晶圓係自其背部移除且藉助熱三氯乙烯清 洗然後藉助蠟將通迢側附加至襯背晶圓且使用HF溶液來 姓刻通孔。此蚀刻穿過晶圓。在約_小時内達成所期望餘 刻里然後藉助熱二氣乙烯清洗晶圓且藉助金及鉻蝕刻劑 移除金屬遮罩。此等步驟之結果顯示於晶圓丨62〇中。應瞭 解’所圖解說明之剖面顯示在每—端處具有通孔之—通 道,且存在其中無通道、通孔或其兩者的晶圓之其他區 域。 使用陽極接合來結合列印頭之不同層。所闡述之接合次 序因陽極接合過程之電化學性質而對於此特定實施例係較 佳的。陽極接合可用於將一含鈉玻璃結合至一金屬或半導 體。一旦被加熱至30(TC至40(TC,玻璃中之Na+即變成可 移動的。將約1000 V之一電位自金屬層下方之一陽極施加 至玻璃上方之一陰極。玻璃中之移動載體移動遠離介面從 而留下一帶相反電荷之空乏區域。陽離子之運動使得玻璃 中之懸空氧原子自由以氧化金屬介面,從而在兩種材料之 間形成一化學接合。陽極接合闡述於K M Kn〇wles等人之 G. Wallis, Field Assisted Glass Sealing, 2(1),L 147306.doc -33- 201102275 The engraving of the metal hard mask surname is 3G seconds. The results of these steps are shown in wafer 1610. The through-hole side of the wafer is attached to the backing wafer by means of stone ants. The vine's S is also affected by the engraving. Exposure channel side. The wafer is then immersed in 49% HF liquid until the channel is left to _ (four). Use the stylus profilometer to examine the depth of the engraving. The desired amount of etching is achieved within about 15 ―. The wafer was removed from its back and cleaned with hot trichloroethylene and then the wax side was attached to the backing wafer with wax and the HF solution was used to name the through holes. This etch passes through the wafer. The desired time is reached in about _ hours and the wafer is then cleaned with hot ethylene gas and the metal mask is removed with gold and chromium etchant. The results of these steps are shown in the wafer 丨62〇. It should be understood that the illustrated cross section shows a via having a via at each end, and there are other regions of the wafer in which there are no vias, vias, or both. An anodic bond is used to bond the different layers of the printhead. The bonding sequence illustrated is preferred for this particular embodiment due to the electrochemical nature of the anodic bonding process. Anodic bonding can be used to bond a sodium-containing glass to a metal or semiconductor. Once heated to 30 (TC to 40 (TC, Na+ in the glass becomes movable. One of the potentials of about 1000 V is applied from one of the anodes below the metal layer to one of the cathodes above the glass. The moving carrier moves in the glass Leaving the interface away from the depleted region with opposite charges. The movement of the cation allows the suspended oxygen atoms in the glass to freely form a chemical bond between the two materials. The anodic bonding is described in KM Kn〇wles et al. G. Wallis, Field Assisted Glass Sealing, 2(1),

Electrocomponent Science and Tech, 1975 > Anodic 147306.doc -34- 201102275 bonding, 51(5),International Materials Rev.,2006 中。 晶圓接合步驟如下。製備硼矽酸鹽及si晶圓以用於藉助 一 Piranha清洗進行接合。隨後,將Si晶圓浸入稀釋HF中以 移除表面氧化物。然後視覺對準晶圓且然後將其等置於一 Suss SB-6接合器中。藉由施加1〇〇〇 v之一電壓達2〇分鐘 而在真空中於400t之一溫度下接合該等晶圓。此步驟之 結果顯示於晶圓堆疊丨65〇中。將正電位施加至以側。在一 個實施例中’可使用陽極接合將硼矽酸鹽層之背側接合至 一科伐背板。此可給列印頭提供一較強韌密封表面。 一旦接合,即移除Si晶圓之處置層。藉助石蠟將晶圓安 裝至一紹卡盤。然後將該等晶圓沉浸於90% ΗΝ03、9.5% HF及0.5% CHsCOOH儲備溶液之一三部曲餘刻劑中。連續 旋轉晶圓且用N2來使蝕刻槽通氣以確保一均勻蝕刻。在約 50分鐘内達成所期望蝕刻量,且允許蝕刻繼續進行直至看 得見Si〇2姓刻停止件為止。由於三部曲钱刻劑對以〇2上方 之Si的不良選擇性,較佳迅速停止蝕刻。自卡盤移除晶圓 且藉助二氯乙烯溶解剩餘蝶。由於三部曲蝕刻劑對Si〇2上 方之Si不具有強烈選擇性,因此一更具選擇性之修整步驟 係較佳的。藉助深反應性離子蝕刻(DRIE)來移除Si02蝕刻 停止件上之剩餘Si。DRIE並不用於移除所有Si,此乃因其 顯著慢於三部曲蝕刻劑。 在處置層移除之後,用AZ-9260光阻劑塗佈晶圓之覆蓋 有Si〇2之底側且對其進行圖案化以使得用抗触劑覆蓋在過 私結束時將隆起之區域。藉助一反應性離子蝕刻(RIE)來Electrocomponent Science and Tech, 1975 > Anodic 147306.doc -34- 201102275 bonding, 51(5), International Materials Rev., 2006. The wafer bonding step is as follows. Boron silicate and si wafers were prepared for bonding by means of a Piranha purge. Subsequently, the Si wafer is immersed in the diluted HF to remove the surface oxide. The wafer is then visually aligned and then placed in a Suss SB-6 adapter. The wafers are bonded in vacuum at a temperature of 400 t by applying a voltage of 1 〇〇〇 v for 2 〇 minutes. The result of this step is shown in the wafer stack 丨65〇. A positive potential is applied to the side. In one embodiment, the backside of the borosilicate layer can be bonded to a Kovar backsheet using anodic bonding. This provides the printhead with a stronger tough seal surface. Once bonded, the disposal layer of the Si wafer is removed. Install the wafer to a chuck with paraffin. The wafers were then immersed in a tripartite remnant of 90% ΗΝ03, 9.5% HF, and 0.5% CHsCOOH stock solution. The wafer is continuously rotated and N2 is used to vent the etch bath to ensure a uniform etch. The desired amount of etching is achieved in about 50 minutes and the etching is allowed to continue until the Si 〇 2 surname stop is visible. It is preferable to stop the etching quickly because of the poor selectivity of the trilogy of money engraving to Si above 〇2. The wafer is removed from the chuck and the remaining butterfly is dissolved by means of dichloroethylene. Since the triad etchant does not have a strong selectivity for Si above Si 〇 2, a more selective trimming step is preferred. The remaining Si on the SiO 2 etch stop is removed by deep reactive ion etching (DRIE). DRIE is not used to remove all Si because it is significantly slower than the triad etchant. After the disposal layer was removed, the bottom side of the wafer was coated with AZ-9260 photoresist and patterned to cover the area where the bump would end at the end of the privacy with an anti-contact agent. By means of a reactive ion etching (RIE)

I S 147306.doc •35- 201102275 移除曝露之Si02。此步驟之結果顯示於晶圓堆疊1660中。 然後错由DRIE姓刻未隆起部分40至50 μηι。藉由輪廓測定 法來監控此餘刻之完成。此步驟之結果顯示於晶圓堆疊 1670 中。 隨後,剝除光阻劑且藉助RIE移除剩餘Si〇2硬遮罩。此 步驟之結果顯示於晶圓堆疊1680中。將由8〇〇 nm A1、50 nm Pt及500 nm Au組成之歐姆觸點蒸發至晶圓之相對側上 以允許藉由一加熱電流來定址晶圓。若原生Si不具有充足 傳導性而達成良好加熱,則可在噴嘴板上方添加一額外薄 %覆式Τι塗層。最後,藉助向溫傳導性環氧樹脂將Cu箔引 線附加至電極。 所製作之OVJP列印頭及蒸氣產生器之大體結構如下。 有機源係儲存於插入至延伸至一真空室中且在其等遠端處 被加熱之管中之玻璃杆之端處。此系統消除了為再填充材 料而必須斷開一高溫密封件或拆開一複雜總成之問題。 OVJP以比_高得多的壓力及低得多的流率操作,此可 導致-較高蒸氣滞留時間。有機蒸氣源與喷嘴陣列之間的 體積保持盡可能短以消除不Μ之體積。建模指示單獨源 及稀釋流在此長度尺度下係無幫助的H雖然可易於 添加此等特徵,但並不明確提供該等特徵。 在一個實施例中,OVTP会ρ 糸、、先之形狀因數允許將其附接 至一 8"ConFlat蜂。 藉由具有一 Cotronics RpcL」^ nd 919高溫陶瓷黏合劑之薄 塗層之弟一塗佈不錄鋼營制彳七也 S衣作熱保護罩。經塗佈區域係2 147306.doc -36 - 201102275 7寸見且自官之尖端G125處開始。此塗層提供在其上纏 繞撓性鎳絡合金導線之一電阻表面。纏繞達㈣之— 〇曹直”線將賦予加熱器義之—電阻。在纏繞之 後,㈣另-Resb〇nd 919之塗層來密封加熱器並使其固 化仪。右期望減小發射率,則可給該等管鍍覆Ag。此等 國產加熱器係緊宗日% μ μ ^ 強效的,且不像玻璃纖維絕緣熱帶那 才水產生微粒。不同於高g勒趙 产 商用熱帶,一旦固化,陶甍即不會漏 氣0 圖17顯示-㈣p饋通裝置之—分解圖。為便於圖解說 明,圖解說明兩個有機蒸氣源,但可使用更大數目個源, 例如圖3中所顯示之六個或甚至更多個。歧管㈣充當一 饋通裝置’氣體經由該饋通裝置行進至列印頭,且可在不 斷開熱密封件之情形下經由該饋通裝置容易地且方便地移 除並替換在沈積期間極靠近於列印頭定位之有機源舟皿。 如圖3中所圖解說明,通向列印頭之管172〇自歧管】則延 伸。氣體饋送裝置可附接至管172〇。氣體饋送裝置 ⑽可包含用於氣體之蟑以及允許源舟皿通過之[納毛 配件1740附接至氣體饋送裝置1730,且提供源舟皿可穿過 之-可容易斷開及替換之氣密密封件。有機源舟皿㈣設 置於杆湖上。杆可插入穿過㈣配件⑽、氣體饋 送裝置㈣、管㈣及歧管1710,且進一步延伸穿過(例 如)圖3之波紋管3 4 0及相關營·吉5 .、β a 汉相砌g直至源舟皿1?5〇非常接近於 一列印頭為止。納乇配件丨74〇提供一密封件。 用於製作-瞻系統之具體非限制性材料及尺寸如⑴ 147306.doc -37- 201102275 下。來自歧管1710之0.375"鋼管172〇端接有世偉洛克了形 官配件(氣體饋送裝置1730)。世偉洛克納七配件174〇係夾 持至T形配件之遠結合處中。在其尖端處含納一有機舟皿 175〇之7長玻璃杆176〇插入穿過納乇配件174〇。杆丨7的一 直延伸至列印帛。載體氣體係、自T形管配件之中間連接處 饋送至蒸氣產生器中。 較佳地,提供—電動x_y運動台用以使基板相對於喷嘴 陣列移動以使用OVJP繪製經圖案化有機膜。喷嘴陣列與 基板之平面較佳保持$可能接近於平行以使系統有效土 =°為達成最佳結果,基板托架較佳具有大於每⑽線性行 ί Ιμηι之+坦度。基板托架移動所依靠的軸承較佳係 置於該托架下面。最簡單配置將係、將兩個完整堆疊線性致 動器放入室㈣。此等致動器可坐落於用於精細水平調整 之-雙斜台之頂部上。此控制可係手動的,此乃因可在排 空至之則進行對準。然而,ζ調整較佳係電動式以提供高 度控帝卜由於室内部之空間極為珍貴,因此較佳將一續 動器與-真空線性定位器併入在一起且安裝於室外部。可 類似地將一手動旋轉調整件安裝於室外部。 真空製 藉由藉 垂直於 〇VJP系統較佳配備有電動x_y運動台。可藉由一 備Aer〇techATS_50台提供平行於線定向之運動。可 助-定制致動ϋ修改之—新港(Newp。邮學台提供 線定向之運動。 基板托架可係由紹製 非接觸高度感測器相容 成’其頂部上經陽極氧化拋光以與 。其坐落於一銅冷卻塊頂部上,經 147306.doc •38- 201102275 由撓性官為該銅冷卻塊饋送液氮冷卻劑。可經由一毗鄰手 套箱移除該托架以允許在一非氧化環境中裝载及卸載樣 本。可藉助SPI Apezon冷油脂之薄塗層來增強基板、托架 及冷卻塊之熱接觸。 一 PhilTech RZ-25光學位移感測器可經由列印頭中之一 窗進行觀察以量測至基板之距離。該感測器由具有發射器 纖維及接收器纖維之一光纖束組成。兩種纖維類型之間的 耦合相依於束尖端與一反射表面之間的距離。藉由一光纖 托架來固持感測器尖端,該光纖托架又附接至將列印頭連 接至凸緣之極點中之一者。感測器信號係藉由一光纖束穿 過一真空饋通裝置傳輸至該室外部之一感測器。 與基板上之焊盤標記(丨andmark)對準係達成定位以改寫 基板上之特徵之一較佳方式。列印頭較佳具有允許光學對 準之單獨固至可裝配有CCD相機、適當透鏡、照明設備 及軟體以允許對準。當前設計中並不存在此等特徵,但此 等特徵係眾所習知且可易於併入一 〇VJp系統。 圖1 8顯示裝設有對準光學裝置及高度感測器之一 〇vjp 系統之一組態。該0VJP系統具有圖17中所圖解說明之相 同特徵中之諸多特徵。另外,圖18i〇VJp系統包含適用 ;光于對準之一相機系統。該相機系統包含一相機181 〇、 投影透鏡1812及物鏡1814。可易於在歧管及列印頭中提供 適當開口。圖18之猜系統亦包含一高度感測器182〇。 圖18之組態並未實際付諸實踐,但基於本文中之揭示内容 147306.doc -39- 201102275 該OVJP系統可操作如下。 可使噴嘴垂直於基板平面並校準高度感測器。在列印頭 處於至酿下且至具有排氣孔之情形下使列印頭之平面與基 板之平面重合°使用在基板台背部之-雷射水平儀及-鏡 來執灯則後對準。可使用一測隙規來使基板每一側上之列 印頭至基板間隙相等而實施左右對準。 用廷將有機材料g至一硼矽酸鹽玻璃杆之尖端處之—源 舟皿中。將-熱電偶穿過該杆之内徑至將該杆與舟皿分離 且上緊於適當位置中之結構。將該杆插入穿過沈積室頂部 處之納七配件。使該杆前進直至其#端在列印頭之3 mm内 為止。較佳地,預先量測停止位置以防止對列印 壞。 貝 將-基板置於有排氣孔之室中。使氣體饋送管線通向— 旁路「歐斯塔奇(Eustachian)」管,其使列印頭通孔與室之 間的壓力相等。將室排$,且將ovjp緩慢加熱至操作溫 =° :旦0VJP處於高真空’即建立了至基板台之一 LN2 机。取後,自歐斯塔奇管密封氣體饋送管線。 在調平以後,降低該台以料喷嘴用以在列印頭加 向下移動之空間。然後使列印頭及蒸氣產生器達到摔_ 可基於列印頭之熱負載之—突然增加或藉由當列印: =使用中時有機源單元壓力之—突然增加來推斷列印頭盘 土板之間的硬接觸。現在可將高度感測器之讀數調零/、 將,力1 seem之載體氣體饋送至每一沈積源中。應# 部材料將有機蒸氣源加熱至2啊至⑽。c。將列印: I47306.doc 201102275 至300°C。使噴嘴尖端到達距基板1G㈣處。可將_精細z 調整件與高度感測器(尚未併入)一起鎖定至一回饋迴路 中。系統現在正在沈積,且圖案決定於乂及7台馬達之運 動。一旦印刷圖案,沈積即可終止載體氣體流且再開啟通 向歐斯塔奇管之氣體饋送管線。 在沈積之後,降低基板使其遠離列印頭。緩慢地冷卻列 印頭與有機源單元兩者。在使室排氣之前,所有此等裝置 較佳低於1 〇〇 C。亦使經冷凍台升溫至高於〇它。 較佳操作條件包含小於丨毫托之一室壓力及冷凍至_ loo c之一基板托架。藉由惰性氣體之1至托之一壓力以 母源通孔每分1標準立方公分之一流率將有機蒸氣壓送至 歹J卩頭中可藉由與其他源之流動組合來混合或稀釋蒸 氣。列印頭係維持距基板表面約10微米。基板在列印頭;^ 面以0.5至2 mm/s之一速率移動。圖19中顯示35 厚師_ 羥基喹啉)銘線之光學顯微照片。在較佳操作條件下,列 印頭可繪製約20 μιη寬之連續有機材料線。圖19以兩個不 同放大率顯示使用〇VJp列印頭繪製之35⑽厚侧叁(8羥 基喹啉)鋁)線之光學顯微照片(影像191〇及192〇卜此等線 在每—側上係由經估計不大於1〇 μιη寬之外來沈積區所環 繞。此係藉由掃描電子顯微鏡(SEM)及原子力顯微鏡 (AFM)影像支援。圖2〇以兩個不同放大率顯示使用〇v㈣ 印頭繪製之35 1^厚aiq線之SEM影像(影像2〇丨〇及2〇2〇)。 圖21顯示藉助0VJP繪製之Μ 1^厚八丨9線之原子力顯微照 片包3其中藉由灰階來顯示高度之一二維視圖(影像 [S ] 147306.doc -41 - 201102275 2110)及使用AFM顯示垂直於線之主軸之厚度的一軌跡(影 像2120)。可根據剖面AFM軌跡來估計線之寬度與厚度兩 者0 為提供多色彩OLED陣列之高解析度圖案化,〇Vjp較佳 能夠將材料沈積成嚴格界定之線,而線之間具有最小色料 滲出(bleeding)。已執行對線之間區域中之有機材料之過 喷之間接量測。 在一個測試中,藉由使台在列印頭下面緩慢移動來生長 極厚線。雖然此等特徵比用於實際電子裝置中之彼等特徵 厚得多,但生長此等線允許將細微特徵(例如過喷拖尾)放 大成足以可量測。然後藉由輪廓測定法來評估此等線之厚 度。!面。在其中期望沈積之區域中沈積具有高達2⑽〇〇埃 (2 nm)之一厚度的線。在所量測之2〇 線寬度以外,量 測到看似延伸超出線邊緣達1〇 μηΐ21〇〇 nm或更小之過喷 拖尾。此等特徵比將在0LED中發現之彼等特徵厚約ι〇〇 倍。假疋過喷厚度與特徵厚度成比例,則此將暗示可預期 在所繪製線附近有! nm或更小過噴。圖22顯示此等線之影 像包3 一光學顯微照片22 1 0及一輪廓測定儀軌跡222〇。 使用^間解析光致發光來探測薄膜線之間的區域中之過 喷:在-專門構造之線掃描顯微鏡上進行厚度校準量測。 此系統具有A1Q示縱劑之約5㈣之—解析度及約2請之_ 偵測臨限值。-初始掃描展示出約5 nm之一背景過喷。本 趣地’過噴之高度衫看似與自-線之㈣或最近線之清 义相關此表明,過喷係在啟動時而非在實際印刷期間相 147306.doc •42· 201102275 減輕且可藉由改良啟動程序來最小化。對於有機材料原 更下游之喷嘴,線之厚度顯著降低。據信此係因製作具有 較淺流體通道之一特定列印頭以改良抗裂性所致,且可# 由使用較大通道容易地消除該效應。線掃描資料顯示於^ 23中。圖23顯示來自A1Q之OVJP繪製樣本之厚度校正線^ 描資料。 使用密歇根大學(UniVersity 〇f Michigan)之顯微鏡及影 像分析實驗室之一Zeiss共焦落射螢光顯微鏡來以較高空= 解析度探測過喷。此顯微鏡具有類似於線掃描儀之一偵測 臨限值但在別的方面更具能力。圖24顯示使用此系統分: 之OVJP沈積線之一區域。在線之間偵測到少量信號或未 债測到信號,從而表明3 nm或更小之一過喷厚度^缺較 佳藉助已知膜厚度之樣本校準來自此工具之輪出,但不存 在來自線之間的區域之信號表明,少量(若有的話)材料沉 澱於此等區域中。圖24顯示A1Q之〇VJp纷製線之一共焦落 射螢光顯微照片。影像2410係具有藉由灰階顯示之營光、強 度之-二维影像。垂直箭頭顯示影像如时所圖解說明之 ^度輪廓掃描之方向,影像242〇顯示沿該線隨距離而變的 勞光強度。 應瞭解,本文令所闡述各 合裡貫靶例僅用於舉例說明, 且並不意欲限制本發明之範缚。 之m“舉例而吕,本文中所闡述 之堵夕材料及結構可由其他材 發明之精神。本文中_ + t構曰代而並不背離本 r^ 4中所蘭述之發明性嗔嘴幾何形狀可用於 除本文中所圖解說明之且 只施例以外的各種各樣的fI S 147306.doc •35- 201102275 Remove the exposed SiO2. The results of this step are shown in wafer stack 1660. Then the error is left by the DRIE surname 40 to 50 μm. The completion of this remainder is monitored by profilometry. The results of this step are shown in wafer stack 1670. Subsequently, the photoresist is stripped and the remaining Si〇2 hard mask is removed by means of RIE. The results of this step are shown in wafer stack 1680. An ohmic contact consisting of 8 〇〇 nm A1, 50 nm Pt, and 500 nm Au is evaporated onto the opposite side of the wafer to allow the wafer to be addressed by a heating current. If the native Si does not have sufficient conductivity to achieve good heating, an additional thin % Τ 涂层 coating can be added over the nozzle plate. Finally, a Cu foil lead is attached to the electrode by means of a temperature conductive epoxy. The general structure of the manufactured OVJP print head and vapor generator is as follows. The organic source is stored at the end of the glass rod inserted into a tube that extends into a vacuum chamber and is heated at its distal ends. This system eliminates the problem of having to break a high temperature seal or disassemble a complex assembly for refilling material. OVJP operates at much higher pressures and much lower flow rates, which can result in higher vapor residence times. The volume between the organic vapor source and the nozzle array is kept as short as possible to eliminate the volume. Modeling indicates that the separate source and dilution streams are not helpful at this length scale. Although these features can be easily added, these features are not explicitly provided. In one embodiment, OVTP will ρ 糸 , and the shape factor first allows it to be attached to an 8"ConFlat bee. With a thin coating of a Cotronics RpcL" nd 919 high temperature ceramic adhesive, the coating is not coated with steel. The coated area is 2 147306.doc -36 - 201102275 7 inches and begins at the tip of the official G125. This coating provides a resistive surface on which a flexible nickel alloy wire is wound. Winding up to (4) - 〇 曹直" line will give the heater the right - resistance. After winding, (4) another -Resb〇nd 919 coating to seal the heater and make it cure. Right to reduce the emissivity, then These tubes can be plated with Ag. These domestic heaters are tighter than the % μ μ ^ strong, and unlike the glass fiber insulation, the tropical water produces particles. Unlike the high-g Le Zhao production commercial tropical, once Curing, the pottery will not leak 0 Figure 17 shows the - (iv) p feedthrough device - exploded view. For ease of illustration, two organic vapor sources are illustrated, but a larger number of sources can be used, such as in Figure 3. Six or even more are shown. The manifold (four) acts as a feedthrough device through which the gas travels to the printhead and can be easily and via the feedthrough without disconnecting the heat seal The organic source boat positioned very close to the print head during deposition is conveniently removed and replaced. As illustrated in Figure 3, the tube 172 leading to the print head extends from the manifold. Attached to tube 172. Gas feed device (10) can be packaged A gas seal for gas and a gas seal that allows the source boat to pass [the nano-fitting fitting 1740 is attached to the gas feed device 1730 and provides a source boat that can be easily broken and replaced. The dish (4) is disposed on the rod lake. The rod can be inserted through the (4) fitting (10), the gas feeding device (4), the tube (4) and the manifold 1710, and further extended through, for example, the bellows 3 4 0 of FIG. 3 and the related camp·ji 5 ., β a Han phaseg until the source boat 1?5〇 is very close to a row of print heads. The Nayong fittings 丨74〇 provides a seal. The specific non-limiting materials and dimensions used in the production-view system are as follows. (1) 147306.doc -37- 201102275. The 0.375"tube 172〇 from the manifold 1710 is terminated with a Swagelok fitting (gas feed unit 1730). The Swagelok seven-part 174 夹持 is clamped to At the far end of the T-shaped fitting, a 7-long glass rod 176〇 containing an organic boat 175〇 at its tip is inserted through the nano-ticket fitting 174. The rod 丨7 extends all the way to the printing 帛. Feeding from the intermediate connection of the T-tube fitting to the steam generator. Preferably, An electro-x_y motion stage is used to move the substrate relative to the nozzle array to draw the patterned organic film using OVJP. The nozzle array and the plane of the substrate preferably remain close to parallel to make the system effective soil = ° for optimal As a result, the substrate carrier preferably has a +degree of greater than (10) linear lines. The bearing on which the substrate carrier moves is preferably placed underneath the carrier. The simplest configuration will tie the two complete stacks linearly. The actuator is placed in the chamber (4). These actuators can be placed on top of the double ramp for fine level adjustment. This control can be manual, as it can be aligned after emptying However, the ζ adjustment is preferably an electric type to provide a high degree of control. Since the space inside the room is extremely precious, it is preferable to incorporate a continuator and a vacuum linear positioner and mount it outside. A manual rotation adjustment member can be similarly mounted to the outdoor portion. The vacuum system is preferably equipped with an electric x_y motion stage by means of a vertical VJP system. Motion parallel to the line orientation can be provided by a separate Aer〇techATS_50 station. Helpable - Customized actuation ϋ modified - Newport (Newp. The postal station provides line oriented motion. The substrate carrier can be compatible with the non-contact height sensor made by its anodized polishing on the top) It is located on top of a copper cooling block and is fed by a flexible officer to the copper cooling block via a 147306.doc •38- 201102275. The bracket can be removed via an adjacent glove box to allow for a non- Loading and unloading samples in an oxidizing environment. Thermal coating of SPI Apezon cold grease can be used to enhance thermal contact between the substrate, the carrier and the cooling block. A PhilTech RZ-25 optical displacement sensor can be used via one of the print heads. The window is observed to measure the distance to the substrate. The sensor consists of a bundle of fibers having one of the emitter fibers and the receiver fibers. The coupling between the two fiber types depends on the distance between the beam tip and a reflective surface. The sensor tip is held by a fiber holder that is in turn attached to one of the poles that connect the print head to the flange. The sensor signal is passed through a bundle of fibers Vacuum feedthrough is transmitted to the One of the external sensors. A preferred way of locating the pad marks on the substrate to align the features on the substrate. The print head preferably has a separate optical lens that allows for optical alignment. It is equipped with a CCD camera, suitable lens, illumination and software to allow alignment. These features are not present in current designs, but these features are well known and can be easily incorporated into a VJp system. Figure 1 8 shows One of the 〇vjp systems equipped with one of the alignment optics and the height sensor. The 0VJP system has many of the same features as illustrated in Figure 17. In addition, Figure 18i〇VJp system includes; The camera system includes a camera 181 〇, a projection lens 1812, and an objective lens 1814. The appropriate opening can be easily provided in the manifold and the print head. The guessing system of Fig. 18 also includes a height sensing. The configuration of Figure 18 has not actually been put into practice, but based on the disclosure herein 147306.doc -39- 201102275 The OVJP system can operate as follows. The nozzle can be perpendicular to the substrate plane and the height sensor can be calibrated. The plane of the print head is coincident with the plane of the substrate with the print head in the squirt and to the venting opening. The laser level and mirror are used on the back of the substrate table to align the light. A gap gauge can be used to make the head-to-substrate gap on each side of the substrate equal to the left and right alignment. The organic material is used to feed the organic material to the tip of the boron bismuth silicate glass rod. Passing a thermocouple through the inner diameter of the rod to a structure that separates the rod from the boat and is tightened in place. The rod is inserted through the seven fittings at the top of the deposition chamber. Its # end is within 3 mm of the print head. Preferably, the stop position is pre-measured to prevent damage to the print. The shell-substrate is placed in a chamber with a vent. Pass the gas feed line to - bypass the "Eustachian" tube, which equalizes the pressure between the printhead through hole and the chamber. The chamber is drained by $, and the ovjp is slowly heated to the operating temperature = °: 0VJP is at high vacuum, ie one of the LN2 machines to the substrate table is established. After taking it, seal the gas feed line from the Ostarc tube. After leveling, lower the space in which the nozzle is used to move the print head down. Then the print head and the steam generator are brought to a drop _ based on the thermal load of the print head - a sudden increase or by inferring the print head: = when the print: = sudden increase in the pressure of the organic source unit during use Hard contact between the boards. The height sensor readings can now be zeroed, and a carrier gas of force 1 could be fed into each deposition source. The organic vapor source should be heated to 2 to (10). c. Will print: I47306.doc 201102275 to 300 °C. The nozzle tip is brought to the side of the substrate 1G (four). The _fine z adjustment can be locked into a feedback loop along with the height sensor (not yet incorporated). The system is now being deposited and the pattern is determined by the movement of the seven motors. Once the pattern is printed, the deposition terminates the carrier gas stream and reopens the gas feed line to the Oostaki tube. After deposition, the substrate is lowered away from the print head. Slowly cool both the print head and the organic source unit. All such devices are preferably less than 1 〇〇 C prior to venting the chamber. It also raises the temperature through the freezer to above it. Preferred operating conditions include a chamber pressure of less than 丨 millitorr and freezing to one of the substrate holders. The organic vapor is sent to the crucible at a flow rate of 1 standard cubic centimeter per minute of the parent source via 1 to a pressure of the inert gas, and the vapor can be mixed or diluted by combining with the flow of the other source. . The print head is maintained at approximately 10 microns from the surface of the substrate. The substrate is on the print head; the surface is moved at a rate of 0.5 to 2 mm/s. An optical micrograph of the 35 thick _ quinolinol line is shown in Figure 19. Under preferred operating conditions, the printhead can draw a continuous line of organic material approximately 20 μm wide. Figure 19 shows optical micrographs of 35 (10) thick side 8 (8-hydroxyquinoline) aluminum lines drawn using a 〇VJp printhead at two different magnifications (images 191〇 and 192〇) on each side The upper system is surrounded by a deposition area estimated to be no more than 1 〇μιη wide. This is supported by scanning electron microscopy (SEM) and atomic force microscopy (AFM) images. Figure 2 shows the use of 〇v (4) at two different magnifications. The SEM image of the 35 1^ thick aiq line drawn by the print head (image 2〇丨〇 and 2〇2〇). Figure 21 shows the atomic force micrograph of the 1^ thick gossip 9 line drawn by 0VJP. A two-dimensional view of the height is displayed by gray scale (image [S ] 147306.doc -41 - 201102275 2110) and a track (image 2120) showing the thickness perpendicular to the main axis of the line using AFM. According to the profile AFM trajectory Estimating both the width and thickness of the line 0 To provide high resolution patterning of the multi-color OLED array, 〇Vjp is better able to deposit the material into a strictly defined line with minimal toner bleeding between the lines. Execution between the overspray of organic material in the area between the lines In a test, a very thick line is grown by slowly moving the stage below the print head. Although these features are much thicker than those used in actual electronic devices, they are grown. Allows fine-grained features (such as over-smearing) to be magnified enough to be measurable. The thickness of the lines is then evaluated by profilometry. The deposition has up to 2 (10) 〇〇 in the area where deposition is desired ( A line of thickness of 2 nm). Beyond the measured width of the 2 〇 line, an overspray that appears to extend beyond the edge of the line by 1〇μηΐ21〇〇nm or less is measured. The features found in the OLED are about ι times thicker. The false 疋 overspray thickness is proportional to the feature thickness, which would suggest that there is an ! nm or smaller overspray near the line drawn. Figure 22 shows this Isoline image pack 3 an optical micrograph 22 1 0 and a profilometer trace 222 〇. Inter-analytical photoluminescence is used to detect overspray in the area between the film lines: in a specially constructed line scan Thickness calibration measurement on the microscope. This system has A 1Q of the vertical agent is about 5 (four) - resolution and about 2 please _ detection threshold. - The initial scan shows a background overspray of about 5 nm. This interesting 'overspray height shirt looks like - The line (4) or the nearest line is related. This indicates that the overspray is reduced at startup rather than during actual printing. 147306.doc • 42· 201102275 is mitigated and can be minimized by a modified start-up procedure. Further downstream nozzles, the thickness of the wire is significantly reduced. It is believed that this is due to the fabrication of a particular printhead having a shallower fluid channel to improve crack resistance, and the effect can be easily eliminated by using larger channels. Line scan data is displayed in ^ 23. Figure 23 shows thickness correction line data for OVJP plots from A1Q. The Zeiss confocal epifluorescence microscope, one of the microscope and image analysis laboratories at the University of Michigan (UniVersity 〇f Michigan), was used to detect overspray at higher altitude = resolution. This microscope has a detection threshold similar to one of the line scanners but is otherwise more capable. Figure 24 shows an area of the OVJP deposition line using this system: A small amount of signal or un-debted signal is detected between the lines, indicating that one of the 3 nm or less overspray thicknesses is preferably calibrated from the tool by means of a sample of known film thickness, but there is no Signals between the lines indicate that a small amount, if any, of material is deposited in these areas. Figure 24 shows a confocal projection fluorescence micrograph of one of the VJp lines of A1Q. The image 2410 has a camper-light, intensity-two-dimensional image displayed by gray scales. The vertical arrow shows the direction of the outline scan as illustrated by the image, and the image 242 shows the intensity of the light along the line as a function of distance. It is to be understood that the various examples are intended to be illustrative only and are not intended to limit the scope of the invention. m "Examples and Lv, the material and structure of the essays described in this article can be invented by other materials. In this paper, the _ + t structure is degenerated without departing from the inventive nozzle geometry described in this r ^ 4 Shapes can be used for a variety of fs other than those illustrated in this article and only for example

L a J I47306.doc -43. 201102275 ovjp系統組態及列印頭中。類似地,本文中所闡述之發 明性列印頭概念可用於除本文中所圖解說明之具體實施例 以外的各種各樣的〇VjP系統組態中。因此,如熟悉此項 技術者將明瞭,所主張之本發明可包含本文中所闡述述之 特定貫例及較佳實施例之變型。應理解,關於本發明為何 可行之各種理淪及具體組態之建模並不意欲具有限制性。 【圖式簡單說明】 圖1顯示四個不同噴嘴幾何形狀之剖面。 圖2顯示沿垂直於萆洎夕__ 士 a 、孔/瓜之方向截取之四個不同噴嘴幾 何形狀之剖面。 圖3顯示一 OVJP列印頭及支架之一透視圖。 圖4顯示列印頭之一分解圖。 圖5顯示一列印頭之各部分之照片。 圖6顯示包含通道及通孔之一遮罩之一校樣。 圖7顯示.已實際製作之-矩形喷嘴之—剖面以及 Sl中之喷嘴入口之-掃描電子顯微鏡照片。 圖8顯示完成之列印頭之嘴嘴側之一照片以及噴 〇2之-部分之—掃描電子顯微照片⑽μ)及—噴嘴孔口 圖9顯示一經建模沈積輪廓。 圖1〇顯示經建模壓力及溫度輪廓。 圖11顯示用於 估計流阻且甚至 佈。 已驗證蒸氣至該陣列令之所有噴嘴 147306.doc -44· 201102275 圖12顯示一 20 mm寬喷嘴附近之一經建模熱傳遞輪廓。 圖13顯示隨溫度而變的一晶圓之中心相對於外部邊緣之 咼度的一曲線圖以及用於獲得資料之設置之一示意圖。 圖14顯示針對一 ιτο目標上之一 philTech RZ-25位移感測 器之校準的位移對電壓之一曲線圖。 圖15顯示用於針對微製作來製備矽及硼矽酸鹽晶圓之製 程流程。 圖16顯示用於製作一列印頭之si及硼矽酸鹽處理之步 驟。 圖17顯示一 〇VjP饋通裝置之一分解圖。 圖1 8顯示裝設有對準光學裝置及高度感測器之一 〇vjp 系統之一組態。 圖19顯示使用0VJP列印頭繪製之35 1^厚A1Q(叁(8_羥基 唾琳)紹)線之光學顯微照片。 圖2〇顯示使用一 〇VJP列印頭繪製之35 nm厚A1Q線之 SEM影像。 之35 nm厚A1Q線之原 之一厚材料線之光學 圖21顯示使用一 〇vjp列印頭繪製 子力顯微照片影像。 圖22顯示使用一 OVJP列印碩綠製 顯微照片及輪廓測定儀影像。 圖23顯示來自使用 資料。 一0VJP列印頭繪製之A1Q線之線掃描 圖24顯示使用 光顯微照片。 一OVJP列印頭繪製 之線之一共焦落射L a J I47306.doc -43. 201102275 ovjp system configuration and print head. Similarly, the inventive printhead concept set forth herein can be used in a wide variety of 〇VjP system configurations in addition to the specific embodiments illustrated herein. Thus, it will be apparent to those skilled in the art that the present invention may be embodied in the specific embodiments and the preferred embodiments described herein. It should be understood that the various aspects of the invention and the specific configuration of the invention are not intended to be limiting. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 shows a cross section of four different nozzle geometries. Figure 2 shows a section of four different nozzle geometry taken along the direction perpendicular to the ___士士, hole/瓜瓜. Figure 3 shows a perspective view of an OVJP print head and holder. Figure 4 shows an exploded view of the print head. Figure 5 shows a photograph of various portions of a print head. Figure 6 shows a proof of one of the masks including the channel and the via. Figure 7 shows a scanning electron micrograph of the cross section of the actually fabricated rectangular nozzle and the nozzle inlet in Sl. Figure 8 shows a photograph of one of the mouth sides of the finished print head and a portion of the squirt 2 - scanning electron micrograph (10) μ) and nozzle orifices. Figure 9 shows a modeled deposition profile. Figure 1 shows the modeled pressure and temperature profiles. Figure 11 shows the estimated flow resistance and even the cloth. Vapor has been verified to all nozzles of the array 147306.doc -44· 201102275 Figure 12 shows a modeled heat transfer profile near a 20 mm wide nozzle. Figure 13 is a graph showing the temperature of the center of a wafer with respect to the temperature of the outer edge as a function of temperature and a setting for obtaining data. Figure 14 shows a plot of displacement vs. voltage for calibration of one of the philTech RZ-25 displacement sensors on a target. Figure 15 shows a process flow for preparing germanium and borosilicate wafers for microfabrication. Figure 16 shows the steps for the si and borosilicate treatment of a print head. Figure 17 shows an exploded view of a 〇VjP feedthrough. Figure 18 shows one of the 〇vjp systems with one of the alignment optics and the height sensor. Figure 19 shows an optical micrograph of a 35 1 thick A1Q (叁(8_hydroxysalina)) line drawn using a 0VJP printhead. Figure 2 shows an SEM image of a 35 nm thick A1Q line drawn using a 〇VJP printhead. The original of a thick material line of the 35 nm thick A1Q line Figure 21 shows the use of a 〇vjp print head to create a sub-force photomicrograph. Figure 22 shows the use of an OVJP to print a green photomicrograph and profilometer image. Figure 23 shows the data from the use. A line scan of the A1Q line drawn by a 0VJP print head. Figure 24 shows the use of light micrographs. One of the lines drawn by an OVJP print head is confocal

147306.doc •45- 201102275 【主要元件符號說明】 110 喷嘴 120 喷嘴 130 喷嘴 140 喷嘴 210 孔σ 220 孔口 230 孔口 240 孔口 300 有機蒸氣喷射沈積系統 310 列印頭 320 有機蒸氣源 330 歧管 340 波紋管 410 第一層 415 喷嘴 420 第二層 422 通孔 424 通道 440 歐姆觸點 510 第一層 520 第二層 610 通道 612 線路 147306.doc -46- 201102275 614 線路 616 線路 620 通孔 700 剖面 710 第一層 720 突出部 730 孔口 740 噴嘴 800 照片 802 喷嘴陣列 804 凸塊 806 位移感測器窗 820 掃描電子顯微照片(SEM) 1322 Si層 1324 硼矽酸鹽層 1510 絕緣體上矽(SOI)晶圓 1512 Si處置層 1514 Si02氧化物層 1516 Si裝置層 1520 晶圓 1522 LPCVD Si3N4硬遮罩層 1550 硼矽酸鹽玻璃晶圓 1560 晶圓 1562 硬遮罩層 147306.doc -47- 201102275 1610 晶圓 1620 晶圓 1630 晶圓 1640 晶圓 1650 晶圓堆疊 1660 晶圓堆疊 1670 晶圓堆疊 1680 晶圓堆疊 1710 歧管 1720 管 1730 氣體饋送裝置 1740 納乇配件 1750 源舟孤 1760 杆 1810 相機 1812 投影透鏡 1814 物鏡 1910 影像 1920 影像 2010 影像 2020 影像 2110 影像. 2120 影像 2410 影像 2420 影像 147306.doc -48-147306.doc •45- 201102275 [Main component symbol description] 110 Nozzle 120 Nozzle 130 Nozzle 140 Nozzle 210 Hole σ 220 Orifice 230 Orifice 240 Orifice 300 Organic vapor jet deposition system 310 Print head 320 Organic vapor source 330 Manifold 340 bellows 410 first layer 415 nozzle 420 second layer 422 through hole 424 channel 440 ohmic contact 510 first layer 520 second layer 610 channel 612 line 147306.doc -46- 201102275 614 line 616 line 620 through hole 700 profile 710 First layer 720 protrusion 730 aperture 740 nozzle 800 photo 802 nozzle array 804 bump 806 displacement sensor window 820 scanning electron micrograph (SEM) 1322 Si layer 1324 borosilicate layer 1510 insulator 矽Wafer 1512 Si Disposal Layer 1514 Si02 Oxide Layer 1516 Si Device Layer 1520 Wafer 1522 LPCVD Si3N4 Hard Mask Layer 1550 Borosilicate Glass Wafer 1560 Wafer 1562 Hard Mask Layer 147306.doc -47- 201102275 1610 Wafer 1620 Wafer 1630 Wafer 1640 Wafer 1650 Wafer Stack 1660 Wafer Stack 1670 Wafer Stack 1680 Crystal Round Stack 1710 Manifold 1720 Tube 1730 Gas Feeder 1740 Labet Accessories 1750 Source Boat Lone 1760 Rod 1810 Camera 1812 Projection Lens 1814 Objective 1910 Image 1920 Image 2010 Image 2020 Image 2110 Image. 2120 Image 2410 Image 2420 Image 147306.doc -48 -

Claims (1)

201102275 七、申請專利範圍: 1. 一種第一裝置,其包括: -列印頭,其進一步包括氣密 -第一喷嘴; 卞至《-氣體源之 其中該第一喷嘴具有一孔口, 及孔口在與該第一嘖噔 之〜動方向垂直的方向具有 、嘴 寸; 八有〇·5Μ未至5〇〇微米之最小尺 孔=最口進入至該第—喷嘴内為該第-噴嘴 ,小尺寸的5倍之距離處,垂直於該流動方向之 取小尺寸係該第-喷嘴孔口之最小尺寸的至少兩倍。 2. 如請求項1之第一裝置,盆中兮别如A ,、中該列印頊包括氣密密封至 5亥第一軋體源之複數個第一喷嘴。 3. 如明求項1之第一裝置,其中該列印頭進一步包括 二喷嘴,該第二喷嘴氣密密封至不同一 -第二氣體源, 體,原之 ^中该第二噴嘴具有—孔口,該孔口在與該第二 之饥動方向垂直的方向具有〇 5微米至5〇〇微米之最 寸; 』、尺 其中^在自該孔口進入至該第二噴嘴内為該第二喷嘴 孔口之最小尺寸的5倍之距離處,垂直於該流動方向之 最小尺寸係該第二噴嘴孔口之最小尺寸的至少兩倍。 4. 如叫求項3之第一裝置,其中該列印頭進一步包括一第 二噴嘴,該第三噴嘴氣密密封至不同於該第一氣體源 該第二氣體源之-第三氣體源, 及 147306.doc 201102275 其中該第三喷嘴旦古_ 有孔口,該孔口在與該第三噴嘴 之流動方向垂首的士人^ 向八有0.5微米至5〇〇微米之最小 寸; 八 其中:在自該孔。進入至該第三噴嘴内為該第三噴嘴 ?口之取小尺寸的5倍之距離處,番直於該流勤方向之 取广尺寸係該第三噴嘴孔口之最小尺寸的至少兩倍。 月长項4之第一裝置,其中該列印頭包括氣密密封至 該第-氣體源之複數個第一喷嘴、氣密密封至該第二氣 體源之複數個第-啥趣^ Λ 弟一噴嘴及氣密密封至該第三氣體源之複 數個第三噴嘴。 | 6.如請求項1之第一裝置,其中該第-喷嘴自該孔口至自 該孔口進入至該第一噴嘴中之一距離具有一恒定剖面, 該距離係該第-喷嘴之該孔口之該最小尺寸的2倍。 7·如明求項1之第一裝置,其中對於處於該第一喷嘴沿垂 直於該第-喷嘴流動方向#方向之該最小尺寸的〇倍至2 七之範圍中之距離,該第_噴嘴孔口之該最小尺寸隨自 «亥第噴嘴之该孔口之距離連續地增加。 8·如凊求項1之第一裝置,其中對於處於該第一喷嘴與該 第一噴嘴流動方向垂直的方向之該最小尺寸的〇倍至2倍 之範圍中之距離,該第一噴嘴之該孔口之該最小尺寸隨 自該第一噴嘴之該孔口之距離線性地增加。 9. 如請求項丨之第一裝置,其中該第一喷嘴係由一金屬或 一陶瓷形成。 10. 如請求項丨之第一裝置,其中該第一喷嘴係由矽形成。 147306.doc -2- 201102275 11. 12. 13. 14. 15. 16. 17. 如明求項1之第一裝置,其中該第一噴嘴具有一孔口, 該孔口在與該第一喷嘴流動方向垂直的方向具有1〇〇微 米至500微米之最小尺寸。 如請求項1之第一裝置,其中該第一噴嘴具有一孔口, 乂孔在與該第一噴嘴流動方向垂直的方向具有2〇微米 至100微米之最小尺寸。 如請求項1之第一裝置,其中該第一喷嘴具有一孔口, °亥孔口在與該第一喷嘴流動方向垂直的方向具有0.5微米 至20微米之最小尺寸。 如請求項1之第一裝置,其中該第一噴嘴垂直於該第一 喷鳴流動方向之剖面係圓形。 如請求項1之第一裝置,其中該第一噴嘴垂直於該第一 喷嘴流動方向之該剖面係矩形。 如請求項3之第一裝置,其中該第一裝置進一步包括: 5亥第—氣體源及該第二氣體源, —熱障壁’其設置於該列印頭與該第一氣體源及該第 二氣體源之間,及 可獨立控制之熱源,其用於該列印頭、該第一氣體源 及°亥弟一氣體源中之每一者。 如請求項1之第一裝置,其中該第一裝置進一步包括: s亥第一氣體源,該第一氣體源進一步包括一第一昇華 至及—第二昇華室; —熱障壁,其設置於該列印頭與該第一氣體源之間; 可镯立控制熱源’其用於該列印頭、該第一昇華室及& 147306.doc 201102275 18. 其中孔口係形成於來自該列印 該第二昇華室中之每一者 如請求項!之第一裝置, 頭之—突出部中。 其包括: 19. 一種方法, 提供-第-裝置,該第一裝置包括: 列印碩,其進一步包括氣密密封至一第一氣體源 之—第—噴嘴; /、中該第一喷嘴具有一孔口,該孔口在與該第一噴 觜仇動方向垂直的方向具有0.5微米至500微米之最小 尺寸; 一中,在自該孔口進入至該第一喷嘴中係該第—噴 =之該孔口之該最小尺寸5倍的一距離處,垂直於該 α動方向之最小尺寸係該第一嘴嘴孔口之最小尺寸之 至少兩倍; 自該第一噴嘴射出一氣體射流。 20‘如請求項19之方法, 其中該列印頭進一步包括: —第二喷嘴’其氣密密封至不同於該第-氣體源之 一第二氣體源, 其中該第二噴嘴具有一孔口’該孔口具有沿垂直於 該第二喷嘴之一流動方向的一方向卜〇5微米至5〇〇 微米之最小尺寸; 第二喷嘴中係該第二喷 的一距離處,垂直於該 其中,在自該孔口進入至該 嘴之該孔口之該最小尺寸5倍 147306.doc -4. 201102275 孤勒万句之該歲小尺寸俜兮 即嗓第二嗜 小尺寸之至少兩倍;且 、 口之該最 其中該方法進一步包括在該 j卩頭、該第一 該第二氣體源處維持不同且可 、源及 词1L控制之溫度。 2 1.如請求項20之方法,其中: 由該第-氣體源提供之該氣體包含具有一第—昇華溫 度之一第一有機材料; 狐 由該第二氣體源提供之該氣體包含一第二有機材料, s亥第二有機材料具有與該第一有機材料之該昇華溫度相 差至少攝氏10度之一第二昇華溫度。 147306.doc201102275 VII. Patent application scope: 1. A first device comprising: - a print head, further comprising a gas-tight first nozzle; a gas source wherein the first nozzle has an orifice, and The orifice has a mouth dimension in a direction perpendicular to the moving direction of the first weir; a minimum taper of eight 〇·5Μ to 5 〇〇 micrometers = the most mouth enters into the first nozzle - the first The nozzle, at a distance of 5 times the small size, has a small dimension perpendicular to the flow direction that is at least twice the smallest dimension of the first nozzle orifice. 2. In the first device of claim 1, the bowl is identified as A, and the print cartridge comprises a plurality of first nozzles hermetically sealed to the first source of the mill. 3. The first device of claim 1, wherein the print head further comprises two nozzles, the second nozzle being hermetically sealed to a different one-second gas source, the body, wherein the second nozzle has - An orifice having a maximum diameter of 5 μm to 5 μm in a direction perpendicular to the second hunger direction; wherein the ruler enters the second nozzle from the orifice At a distance five times the smallest dimension of the second nozzle orifice, the smallest dimension perpendicular to the flow direction is at least twice the smallest dimension of the second nozzle orifice. 4. The first device of claim 3, wherein the print head further comprises a second nozzle that hermetically seals to a third gas source different from the first gas source and the second gas source And 147306.doc 201102275 wherein the third nozzle has an orifice, the orifice having a minimum of 0.5 micrometer to 5 micrometers in the direction of the flow of the third nozzle; Eight of them: in the hole. Entering into the third nozzle is a distance of 5 times the small size of the third nozzle port, and the wide dimension straight to the flow direction is at least twice the minimum size of the third nozzle orifice . The first device of the month length item 4, wherein the print head comprises a plurality of first nozzles hermetically sealed to the first gas source, and a plurality of first and second gas sources sealed to the second gas source a nozzle and a plurality of third nozzles hermetically sealed to the third gas source. 6. The first device of claim 1, wherein the first nozzle has a constant profile from the orifice to a distance from the orifice into the first nozzle, the distance being the first nozzle 2 times the minimum size of the orifice. 7. The first device of claim 1, wherein the _ nozzle is in a range of 〇 times to 2 七 of the minimum dimension of the first nozzle in a direction perpendicular to the first nozzle flow direction # direction This minimum dimension of the orifice continuously increases with the distance from the orifice of the «Hay nozzle. 8. The first device of claim 1, wherein the first nozzle is in a range of 〇 to 2 times the minimum dimension of the first nozzle in a direction perpendicular to the flow direction of the first nozzle The minimum dimension of the orifice increases linearly with distance from the orifice of the first nozzle. 9. The first device of claim 1, wherein the first nozzle is formed from a metal or a ceramic. 10. The first device of claim 1, wherein the first nozzle is formed by a crucible. 147306.doc -2- 201102275 11. 12. 13. 14. 15. 16. 17. The first device of claim 1, wherein the first nozzle has an orifice, the orifice being in the first nozzle The direction in which the flow direction is perpendicular has a minimum size of from 1 μm to 500 μm. The first device of claim 1, wherein the first nozzle has an orifice having a minimum dimension of from 2 μm to 100 μm in a direction perpendicular to a flow direction of the first nozzle. The first device of claim 1, wherein the first nozzle has an orifice having a minimum dimension of from 0.5 micrometers to 20 micrometers in a direction perpendicular to a flow direction of the first nozzle. The first device of claim 1, wherein the first nozzle is circular in cross section perpendicular to the flow direction of the first squirting flow. The first device of claim 1, wherein the first nozzle is rectangular in cross section perpendicular to the flow direction of the first nozzle. The first device of claim 3, wherein the first device further comprises: a 5th gas source and a second gas source, wherein the thermal barrier is disposed at the print head and the first gas source and the first Between the two gas sources, and an independently controllable heat source for each of the print head, the first gas source, and the gas source. The first device of claim 1, wherein the first device further comprises: a first gas source, the first gas source further comprising a first sublimation and a second sublimation chamber; a thermal barrier disposed at Between the print head and the first gas source; a control heat source can be bundled for the print head, the first sublimation chamber, and & 147306.doc 201102275 18. wherein the orifice is formed from the column Each of the second sublimation chambers is printed, such as the first device of the request item, in the head-protrusion. The method comprises: 19. A method, providing a -th device, the first device comprising: a print master, further comprising a gas-tight seal to a first gas source - a nozzle; /, wherein the first nozzle has An orifice having a minimum dimension of from 0.5 micrometers to 500 micrometers in a direction perpendicular to the first squirting direction; wherein the first nozzle is inserted into the first nozzle from the orifice a distance of 5 times the minimum dimension of the orifice, the smallest dimension perpendicular to the alpha direction being at least twice the smallest dimension of the first nozzle orifice; ejecting a gas jet from the first nozzle . The method of claim 19, wherein the printhead further comprises: a second nozzle that is hermetically sealed to a second gas source different from the first gas source, wherein the second nozzle has an orifice 'The orifice has a minimum dimension of 5 micrometers to 5 micrometers in a direction perpendicular to the flow direction of one of the second nozzles; the second nozzle is at a distance from the second jet, perpendicular to the middle , the minimum size of the opening from the orifice to the mouth is 5 times 147306.doc -4. 201102275 The size of the small size of the one-year-old is at least twice the size of the second small size; And wherein the method further comprises maintaining a temperature at which the source and the word 1L are controlled at the j-head, the first source of the second gas. 2. The method of claim 20, wherein: the gas supplied by the first gas source comprises a first organic material having a first sublimation temperature; the gas provided by the second gas source comprises a first The second organic material, the second organic material, has a second sublimation temperature that differs from the sublimation temperature of the first organic material by at least 10 degrees Celsius. 147306.doc
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