201040641 .六、發明說明： 【發明所屬之技術領域】 本發明係關於一種用於修復顯示裝置之亮點故障的設 備，且更特定而言，係關於一種用於修復顯示裝置之亮 點故障的設備，其能夠在整個雷射光束放射區域以均勻 能量密度放射一雷射光束。 〇 【先前技術】 近期液晶顯示裝置已成為下一代及進化的顯示裝置的 焦點，其具有低功率消耗、優秀的可攜性、技術精密特 性、且高附加價值。在液晶顯示裝置之中，一主動矩陣 類型液晶顯示裝置（包括能夠切換電壓應用至各像素的 一切換元件）’因為解析度及執行一移動圖像的能力而具 有最佳的吸引力。 〇 參照第1 ® -已知液晶面板500具有將一濾色器基 板（即’—前基板）及-薄膜電晶冑（TFT)陣列基板 別（即’-後基板）接合在一起的結構，使其面對面， 且具有一介電異向特性的一液晶層52〇形成於遽色器基 板及TFT陣列基板51〇之間。液晶面板5〇〇以操作一 tft 的方式驅動’透過用於選擇像素的位址線及施加電屢至 =相對應的像素而附加至數百數千個像素。此處，滤色 器基板匕括玻璃53 1、濾色器（例如RGB ) 532、黑色 矩陣533其各者形成於遽色器532之間、-被覆層534、 201040641 用於一通用電極的一 ITO層535、及一定向層536。一偏 光板537附加至玻璃531的一上表面。 同時’已揭露不同於上述，+包括被覆層或黑色矩陣 的一液晶面板，及一濾色器上陣列（c〇A)結構。為了 製造液晶面板’可實行一 TFT陣列基板處理、一濾色器 基板處理、一液晶晶格處理等等。 在TFT陣列基板處理中，重複實行一沈澱處理、一光 ¢) 刻處理、及一蝕刻處理，以在一玻璃基板上形成閘線、 資料線、TFTs、及像素電極。 在濾色器基板處理中，RGB濾色器以特定順序安排於 具有黑色矩陣的玻璃基板上且配置成執行經加工的顏 色。接著，對通用電極等等形成一 ϊτ〇層。 在液晶晶格處理中，TFT陣列基板及濾色器接合在一 起而具有一間隙於其之間。一液晶層藉由將液晶注入於 0 間隙而形成。再者，最近所揭露的一液晶滴入製程（〇加 Drop Filing ’ ODF)處理，其將液晶均勻塗抹於TFT陣 列基板上且將TFT陣列基板及濾色器基板接合在一起。 在測試液晶顯示裝置的一過程中，在液晶面板的一螢 幕上形成一測試圖案，且偵測是否存在一不良像素。若 測試的結果偵測到一不良像素，則實行修復不良像素的 任務。在液晶面板中，瑕疵可包括一點瑕疵、一線瑕疲、 及顯示不正常。點瑕疵係由在一 TFT元件、一像素電極、 • 及一濾色器線中的瑕疵所造成。線瑕疵係由一線的損 壞、短路、因為靜電而TFTs損壞、及連接至一驅動電路 201040641 的故障所造成。顯示不正常可因為晶格厚度的不正常、 液晶方向的不正常、TFT特性位置的分佈、及相對高的 時間常數線而產生。 一般而言，點瑕疵及線瑕疵的原因在於線的一瑕疵。 在先前技術中，當發現一損壞的線時，將損壞的部份連 接起來。當線短路時’相對應的線被切斷。 除了上述的瑕疵之外，包括灰塵、有機物、或金屬的 〇 雜質在製造液晶面板的程序中被吸收。若雜質被鄰近的 濾色器吸收，則產生一所謂的光漏現象，其中當驅動面 板時，一相對應的像素發射具有比一般像素高的亮度的 光。為了修復亮點故障，已作成使用一雷射的方法的研 究。 更特定而言’具有一亮點故障的一濾色器由放射一雷 射至濾色器而塗黑。 被塗黑的像素形成具有低的光透明度，且標示為里 ζ% 色’使其不傳送藉由顯示裝置的光源單元（一背光單元） 所產生的光’但吸收光，從而修復亮點故障。 因此’經放射的雷射必須具有低透明度的一波長（即， 具有一高吸收因子的一波長）以塗黑一相對應的像素。 此一波長參考第2圖中所顯示的濾色器的各波長的透明 度而選擇。 參照第3圖’ 一傳統的顯示裝置包括一雷射單元110、 一掃描器130,其用於掃描藉由雷射單元η〇所產生的 一雷射光束且放射至—面板ρ的濾色器、一監控單元14〇 6 201040641 及一照明器141 ’其用於即時檢查濾色器（或面板）、及 自動聚焦控制構件150及聚焦透鏡160，其用於控制雷 射光束的一焦點。用於控制光的路徑的數個反射鏡Ml 及M2進一步配置於顯示裝置中。 參照第4圖，一掃描器係已知構件。掃描器包括一 X 電流反射鏡132及一 Y電流反射鏡13ι，其用於改變一201040641. 6. Description of the Invention: [Technical Field] The present invention relates to an apparatus for repairing a bright spot failure of a display device, and more particularly to an apparatus for repairing a bright spot failure of a display device, It is capable of emitting a laser beam at a uniform energy density throughout the area of the laser beam radiation. 〇 [Prior Art] Recently, liquid crystal display devices have become the focus of next-generation and evolutionary display devices, which have low power consumption, excellent portability, technical precision, and high added value. Among the liquid crystal display devices, an active matrix type liquid crystal display device (including a switching element capable of switching a voltage applied to each pixel) has the best attraction because of the resolution and the ability to perform a moving image. 〇Reference 1 ® - The known liquid crystal panel 500 has a structure in which a color filter substrate (ie, a front substrate) and a thin film transistor (TFT) array substrate (ie, a 'back substrate') are joined together. A liquid crystal layer 52 having a dielectric anisotropy characteristic is formed between the color filter substrate and the TFT array substrate 51A. The liquid crystal panel 5 is driven to operate by a tft to transmit to hundreds of thousands of pixels through the address lines for selecting pixels and the corresponding pixels applied to the corresponding pixels. Here, the color filter substrate includes a glass 53 1 , a color filter (for example, RGB ) 532 , and a black matrix 533 , each of which is formed between the color pickers 532 , and the cladding layers 534 and 201040641 are used for one common electrode. The ITO layer 535 and the directed layer 536. A polarizing plate 537 is attached to an upper surface of the glass 531. At the same time, a liquid crystal panel comprising a cladding layer or a black matrix and a color filter array (c〇A) structure have been disclosed. In order to manufacture a liquid crystal panel, a TFT array substrate process, a color filter substrate process, a liquid crystal lattice process, and the like can be performed. In the TFT array substrate processing, a deposition process, a photo-etching process, and an etching process are repeatedly performed to form gate lines, data lines, TFTs, and pixel electrodes on a glass substrate. In the color filter substrate processing, RGB color filters are arranged in a specific order on a glass substrate having a black matrix and configured to perform processed colors. Next, a ϊτ〇 layer is formed for the general electrode or the like. In the liquid crystal lattice processing, the TFT array substrate and the color filter are joined together to have a gap therebetween. A liquid crystal layer is formed by injecting a liquid crystal into the 0 gap. Further, recently, a liquid crystal dropping process (Drop Filing' ODF) process is applied which uniformly applies liquid crystal on a TFT array substrate and bonds the TFT array substrate and the color filter substrate together. In the process of testing the liquid crystal display device, a test pattern is formed on a screen of the liquid crystal panel, and whether or not there is a defective pixel is detected. If the result of the test detects a bad pixel, the task of repairing a bad pixel is performed. In the LCD panel, the 瑕疵 can include a little 瑕疵, a line of fatigue, and the display is not normal. The dot is caused by defects in a TFT element, a pixel electrode, and a color filter line. The wire is caused by a line of damage, short circuit, damage to the TFTs due to static electricity, and failure to connect to a drive circuit 201040641. The display may be abnormal due to abnormal lattice thickness, abnormal liquid crystal direction, distribution of TFT characteristic positions, and a relatively high time constant line. In general, the reason for the point and the line is the glimpse of the line. In the prior art, when a damaged wire is found, the damaged portion is connected. When the line is short-circuited, the corresponding line is cut. In addition to the above ruthenium, ruthenium impurities including dust, organic matter, or metals are absorbed in the process of manufacturing a liquid crystal panel. If the impurities are absorbed by the adjacent color filters, a so-called light leakage phenomenon occurs in which a corresponding pixel emits light having a higher luminance than a normal pixel when the panel is driven. In order to repair the bright spot failure, research into a method using a laser has been made. More specifically, a color filter having a bright spot failure is blackened by radiation-emitting to a color filter. The blackened pixels are formed to have low light transparency, and are marked as 里% color' so that light generated by the light source unit (a backlight unit) of the display device is not transmitted but absorbs light, thereby repairing a bright spot failure. Therefore, the irradiated laser must have a wavelength of low transparency (i.e., a wavelength having a high absorption factor) to black out a corresponding pixel. This wavelength is selected with reference to the transparency of each wavelength of the color filter shown in Fig. 2. Referring to FIG. 3, a conventional display device includes a laser unit 110 and a scanner 130 for scanning a laser beam generated by a laser unit η 放射 and radiating to a panel ρ color filter. A monitoring unit 14〇6 201040641 and an illuminator 141' are used to instantly check the color filter (or panel), and the autofocus control member 150 and the focusing lens 160 for controlling a focus of the laser beam. A plurality of mirrors M1 and M2 for controlling the path of the light are further disposed in the display device. Referring to Figure 4, a scanner is a known component. The scanner includes an X current mirror 132 and a Y current mirror 13ι for changing one
〇 雷射光束及一掃描透鏡133的方向，以聚集具有由反射 鏡所改變的方向的雷射光束。 第5圖係顯現使用如上述構成的傳統修復設備而修復 具有一亮點故障的一濾色器的程序的一圖Q如第5圖所 顯現，掃描器以Z字型放射雷射光束，從而塗黑具有一 可能亮點故障的濾色器的整個區域。此處，於掃描的一 開始位置（一加速段）或一轉彎位置（一加速段或減速 段）以比平均速度較低的一速度掃描雷射光束。因此， 在開始位置或轉彎位置具有比其他段較高雷射能量密度 的問題。或者，雷射光束於轉彎位置彼此重疊。若如上 所述開始位置或轉f位置具有比其他段較高的雷射能量 密度，則置於濾色器之下的層被破壞，且液晶流至濾色 器層’導致-嚴重故障。加速段或減速段在滤色器⑴ 的兩側成為邊緣L1。 同時，第6圖係顯現—通用雷射光束Β&_剖面圖。 雷射光束首先#由雷射單元放射，”射單元具有一高 斯形式的-弧形段，且具有―能量聚中央區域。 因此’存在放射至各據色器的位置的不同能量密度的 7 201040641 一雷射光束的問題。 【發明内容】 因此’本發明的一態樣係提供一種用於修復一顯示裝 置的一凴點故障的設備，其能夠在整個雷射光束放射區 域上放射一均勻能量密度的一雷射光束。 依照本發明的一實施例，提供一種用於修復一亮點故 G 障的設備包括-雷射單元’其用於放射一雷射光束至具 有一壳點故障的濾色器；一掃描器，其用於在以雷射光 束放射的濾色器的一段中掃描該雷射光束；及光束處理 表面控制構件’其用於過濾經掃描的雷射光束，以避免 經掃描的雷射光束放射至一加速段或一減速段中的濾色 器。 光束處理表面控制構件可包含具有一對X轴葉片及一 〇 重"軸葉片的-光束狹縫。或者，光束處理表面控制構 件可包含具有一傳送單元形成於其中的一遮罩。同時， 較佳的該設備進一步包含驅動構件’其用於轉動該對X 軸葉片及該對Y轴葉片的至少任何一者。 較佳的設備進一步包含光束形狀控制構件，其用於過 濾具有一低能量密度的雷射光束的一區域，且僅用、 送一峰值區域，其中該雷射光束具有一高能量密度。；傳 較佳的光束形狀控制構件包含具有一對X.站签y 平田茶月及一 對Y軸葉片的一光束狹縫。 8 201040641 較佳的光束形狀控制構件包含具有一傳送單元形成於 其中的一遮罩》 較佳的設備進一步包含一光束強度控制單元，其用於 控制雷射光束的一強度，或一光束成形器，其用於擴展 雷射光束可被處理的一區域及藉由擴大具有一均勻能量 密度的雷射光束的一區域而平坦化雷射光束的一形式。 較佳的該設備的面板及雷射光束向相反方向移動，從 Ο 而修復該亮點故障。 較佳的該設備進一步包含一控制單元，其用於控制雷 射光束及待處理的一標靶的光輸入及光輸出特性。 較佳的該控制單元被配置於雷射單元及掃描器之間， 或掃描器及光束處理表面控制構件之間。 【實施方式】 〇 以下，將參照隨附圖式詳細說明本發明的實施例，使 其可由技藝人士無困難的執行。 以下，參照隨附圖式詳細敘述本發明的某些實施例。 本發明的實施例可以各種不同方式修改。本發明的範缚 不應被範例實施例限制。提供實施例給技藝人士，以便 更特定的敘述本發明。因此’在圖式中的各組成元件的 形狀等等可被誇大以便更清楚的強調說明。 參照第7圖’根據本發明的一第一實施例的一種用於 修復一亮點故障的設備200包括一雷射單元210、一卉 9 201040641 束強度控制單元220 ’其用於控制由雷射單元220所放 射的一雷射光束的強度、光束形狀控制構件270、一掃 描器230’其用於掃描在一面板p的濾色器的放射段中 的雷射光束、光束處理表面控制構件280、一監控單元 240及一照明器241，其用於即時檢查濾色器（或面板）、 及自動聚焦控制構件250及一聚焦透鏡26〇，其用於控 制雷射光束的一焦點。用於控制光的路徑的數個反光鏡 Ο M1及M2進一步配置於設備中。 掃描器230係為已知構件。掃描器包括一 X電流反射 鏡及一 Y電流反射鏡’其用於改變一雷射光束及一掃描 透鏡的方向，以聚集具有由反射鏡所改變的方向的雷射 光束。 特定而言’光束處理表面控制構件28〇過濾經掃描的 雷射光束，使其不放射至一加速段或一減速段中的濾色 0 器。過濾經掃描的雷射光束使其不被使用於加速段或減 迷段，因為在加速段或減速段及其他段之間存在不同的 雷射能量密度。因此’濾色器的整個放射區域可以一均 勻能量密度處理。 第8圖係顯現使用光束處理表面控制構件28〇的一狀 態的一圖。 參照第8圖’雷射光束藉由光束處理表面控制構件28〇 阻撞於加速段或減速段中，且不放射至一濾色器532， 但僅通過其他段（一平均速度段）的雷射光束被放射至 慮色器532。因此，可以一均勻能量密度處理濾色器的 201040641 整個區域。 第9圖顯現光束處理表面控制構件28〇的—範例。光 束處理表面控制構件28〇包括具有一對χ軸葉片Sb及 一對Y軸葉片Sa的一光束狹縫S。傳送單元〇1及〇2的 尺寸可由操作葉片以及sb而控制（參照第9圖的及 (b))。為了控制傳送單元〇1及〇2的尺寸，光束處理表面 控制構件280包括用於驅動x軸葉片Sb的—驅動馬達 〇 及用於驅動Y軸葉片Sa的一驅動馬達β 因此’雷射光束被阻擋於加速段或減速段，且不放射 至濾色器，但僅通過其他段（平均速度段）的雷射光束 被放射至濾色器。 第10圖顯現光束處理表面控制構件280的另一實施 例。光束處理表面控制構件280包括具有一傳送單元0 形成於其中的一遮罩Μ。具有不同尺寸及形狀的數個傳 g 送單元Ο可形成於遮罩Μ中。 第11圖係顯現本實施例中所放射的一雷射光束Β的一 剖面圖。雷射光束Β首先藉由雷射單元21〇放射，該雷 射單70具有一高斯形式的一弧形段且具有其能量聚集於 —中心區域❶然而，當通過光束形狀控制構件27〇時， 此-雷射光束形成一三角形或方形。換言之，光束形狀 控制構件270僅傳送一峰值區域Β2 (即，於第一弧形雷 • 射光束中心的一相對高能量區域），但阻擋邊緣Β3(即， 相對低能量區域）。目此，僅中心Β2 (即，峰值區域Β2 ) 具有一相對均勻能量分佈可被使用，該中心為具有一高 11 201040641 • 斯形式的能量分佈的雷射光束。 第12圖係顯現根據本發明的一第二實施例的一種用 於修復一亮點故障的設備300的一圖。如第12圖所顯 現，根據第二實施例的設備300具有根據第一實施例的 設備200相同的結構，除了其進一步包括一雷射成形器 391及驅動構件392。因此，多餘的組成元件的一說明被 省略。 〇 光束成形器391作用而擴大具有一均勻能量密度的一 區域，以便擴展一雷射光束可被處理的一區域且平坦化 雷射光束的形狀。 進一步’驅動構件392作用以同時轉動一對χ軸葉片 Sb或一對γ軸葉片Sa (組成光束處理表面控制構件） 之任何一者或兩者。因為如上所述的轉動葉片，傳送單 兀（參照第9圖中的h及〇2)可以各種形式形成。此 ◎ 舉係為了依照濾色器的形狀而控制傳送單元的形式。 舉例而言，在本發明的實施例中’如第13圖所顯現， 雷射光束B可以狹縫形式擴大，且可擴展可處理雷射光 束的一區域以便修復面板p。 在上述本發明的實施例中，說明移動雷射光束B於面 板p上且修復面板中的一亮點故障。然而，如第14圖所 顯現，面板P及雷射光束B可向相反方向移動以修復面 板。在此情況中，可減少修復面板所花的時間。 同時，雖然未顯現於圖式中，可進一步包括一控制單 兀（未顯現）於實施例中》控制單元可配置於雷射單元 12 201040641 210及掃描器23〇之間，或掃描器wo及光束處理表面 控制構件280之間。僅當—偏極盤安裝於液晶面板中 時’控制單元改變雷射光束的一偏極狀態，從而改善雷 射光束的均勻化。 根據本發明的實施例’一雷射光束的一能量密度可在 整個雷射光束放射區域成為均勻的係一益處。 因此’可避免在濾色器之下的層的損傷。 〇 再者，一雷射光束具有可使用的一相對均勻能量係為 一益處，因為僅使用具有一高斯分佈的一雷射光束的中 心 0 在參照範例實施例已顯現且說明本發明之後，技藝人 士將瞭解可作成各種改變及修改而不悖離如以下申請專 利範圍所定義的本發明的精神及範_。 【圖式簡單說明】 〇 本發明上述的其他態樣及特徵將從以下較佳實施例的 說明與隨附圖示一起而成為顯而易見的，其中： 第1圖一已知液晶顯示裝置的一橫剖面圖； 第2圖係顯現一濾色器的各波長的透明度的一圖； 第3圖係顯現用於修復一亮點故障的一傳統設備的一 圖， 帛4 係顯現裝設有帛3圖㈣現的修復設備的一掃 描器的一圖； 13 201040641 第5圖係顯現使用第3圖所顯現的修復設備的一狀態 的一圖； 第6圖係顯現藉由第3圖所顯現的修復設備所放射的 一雷射光束的一能量分佈的一圖； 第7圖係顯現根據本發明的一第一實施例的一修復設 備的一圖； 第8圖係顯現使用第7圖所顯現的修復設備的一狀態 ❹ 的一圖； 第9及10圖係顯現包含於第7圖所顯現的修復設備的 光束處理表面控制構件的一圖； 第11圖係顯現藉由第7圖所顯現的修復設備放射的一 雷射光束的一能量分佈的一圖； 第12圖係顯現根據本發明的一第二實施例的一修復 設備的一圖； 第13圖係顯現根據本發明的一狹縫形式的一光束的 〇 w 一圖；及 第14圖係顯現本發明的一第三實施例的一圖。 【主要元件符號說明】 B雷射光束 Ml反射鏡 S光束狹缝〇 110雷射單元 M2反射鏡 P面板 130掃描器 1 3 1 Y電流反射鏡 201040641 132 X電流反射鏡 133掃描透鏡 140監控單元 141照明器 150自動聚焦控制構件 160聚焦透鏡 200設備 〇 210雷射單元 220光束強度控制單元 230掃描器 240監控單元 • 241照明器 250自動聚焦控制構件 260聚焦透鏡 270光束形狀控制構件 〇 280光束處理表面控制構 件 391雷射成形器 392驅動構件 500液晶面板 5 1 0薄膜電晶體陣列基板 520液晶層 531玻璃 532濾色器 533黑色矩陣 534被覆層 535 ITO 層 536定向層 537偏光板 15〇 The direction of the laser beam and a scanning lens 133 to focus a laser beam having a direction changed by the mirror. Fig. 5 is a view showing a procedure for repairing a color filter having a bright spot failure using a conventional repairing apparatus constructed as described above. As shown in Fig. 5, the scanner radiates a laser beam in a zigzag pattern, thereby coating Black has the entire area of a color filter that may have a bright spot failure. Here, the laser beam is scanned at a starting position (an acceleration section) or a turning position (an acceleration section or a deceleration section) at a lower speed than the average speed. Therefore, there is a problem that the starting position or the turning position has a higher laser energy density than the other segments. Alternatively, the laser beams overlap each other at a turning position. If the start position or the turn f position has a higher laser energy density than the other segments as described above, the layer placed under the color filter is broken, and the liquid crystal flowing to the color filter layer 'causes - severe failure. The acceleration section or deceleration section becomes the edge L1 on both sides of the color filter (1). At the same time, Figure 6 shows the general-purpose laser beam amp &_ profile. The laser beam is first #radiated by the laser unit, the projecting unit has a Gaussian-arc-shaped segment and has an "energy-concentrated central region." Therefore, there are different energy densities that are radiated to the positions of the respective colorants 7 201040641 A problem with a laser beam. [Inventive] Thus, an aspect of the present invention provides an apparatus for repairing a defect of a display device capable of emitting a uniform energy over a region of the entire laser beam emission. A laser beam of density. According to an embodiment of the invention, there is provided a device for repairing a bright spot, comprising a laser unit for emitting a laser beam to a filter having a shell failure a scanner for scanning the laser beam in a section of the color filter radiated by the laser beam; and a beam processing surface control member for filtering the scanned laser beam to avoid scanning The laser beam is radiated to a color filter in an acceleration section or a deceleration section. The beam processing surface control member may comprise a beam having a pair of X-axis blades and a weight-of-axis blade Alternatively, the beam processing surface control member can include a mask having a transfer unit formed therein. Meanwhile, the apparatus further includes a drive member for rotating the pair of X-axis blades and the pair of Y-axis blades At least any one of the preferred devices further includes a beam shape control member for filtering a region of the laser beam having a low energy density and using only a peak region, wherein the laser beam has a High energy density. The preferred beam shape control member comprises a beam slit having a pair of X. station sign y Hirakata tea and a pair of Y-axis blades. 8 201040641 The preferred beam shape control member comprises a transmission A mask formed by the unit therein further includes a beam intensity control unit for controlling an intensity of the laser beam, or a beam shaper for expanding the laser beam that can be processed a region and a form of planarizing the laser beam by expanding a region of the laser beam having a uniform energy density. Preferred panels and thunder of the device The beam is moved in the opposite direction to repair the bright spot fault. Preferably, the apparatus further includes a control unit for controlling the light input and light output characteristics of the laser beam and a target to be processed. The control unit is disposed between the laser unit and the scanner, or between the scanner and the beam processing surface control member. [Embodiment] Hereinafter, an embodiment of the present invention will be described in detail with reference to the accompanying drawings. The embodiments of the present invention are described in detail herein with reference to the accompanying drawings. The embodiments are intended to describe the present invention more specifically. Therefore, the shapes and the like of the various constituent elements in the drawings may be exaggerated to more clearly emphasize the explanation. Referring to FIG. 7 'a first according to the present invention An apparatus 200 for repairing a bright spot fault of an embodiment includes a laser unit 210, a plant 9 201040641 beam intensity control unit 220 'for controlling The intensity of a laser beam emitted by the laser unit 220, the beam shape control member 270, and a scanner 230' for scanning a laser beam, a beam processing surface in a radiation segment of a color filter of a panel p A control member 280, a monitoring unit 240 and an illuminator 241 for instantly checking the color filter (or panel), and the autofocus control member 250 and a focusing lens 26 for controlling a focus of the laser beam . A plurality of mirrors Ο M1 and M2 for controlling the path of the light are further arranged in the apparatus. Scanner 230 is a known component. The scanner includes an X current mirror and a Y current mirror 'for changing the direction of a laser beam and a scanning lens to focus a laser beam having a direction changed by the mirror. In particular, the beam processing surface control member 28 filters the scanned laser beam so that it does not radiate to a color filter in an acceleration segment or a deceleration segment. The scanned laser beam is filtered so that it is not used in the acceleration or deceleration segments because of the different laser energy densities between the acceleration or deceleration segments and other segments. Therefore, the entire radiation area of the color filter can be processed at a uniform energy density. Fig. 8 is a view showing a state in which the surface control member 28 is processed using a light beam. Referring to Fig. 8, the laser beam is prevented from colliding with the acceleration section or the deceleration section by the beam processing surface control member 28, and is not radiated to a color filter 532, but only passes through other sections (an average speed section). The beam of light is emitted to the color filter 532. Therefore, the entire area of the color filter 201040641 can be processed at a uniform energy density. Figure 9 shows an example of a beam processing surface control member 28A. The beam processing surface control member 28 includes a beam slit S having a pair of x-axis blades Sb and a pair of Y-axis blades Sa. The sizes of the transport units 〇1 and 〇2 can be controlled by operating the blades and sb (refer to Figs. 9 and (b)). In order to control the sizes of the transfer units 〇1 and 〇2, the beam processing surface control member 280 includes a drive motor 用于 for driving the x-axis blade Sb and a drive motor β for driving the Y-axis blade Sa, so the 'laser beam is Blocking the acceleration or deceleration section and not radiating to the color filter, but only the laser beam passing through the other sections (average speed section) is radiated to the color filter. Figure 10 shows another embodiment of the beam processing surface control member 280. The beam processing surface control member 280 includes a mask 具有 having a transfer unit 0 formed therein. A plurality of transfer units 具有 having different sizes and shapes can be formed in the mask Μ. Fig. 11 is a cross-sectional view showing a laser beam 放射 emitted in the present embodiment. The laser beam Β is first radiated by a laser unit 21 having an arcuate section of a Gaussian form and having its energy concentrated in a central region, however, when passing through the beam shape control member 27, This - the laser beam forms a triangle or square. In other words, beam shape control member 270 transmits only a peak region Β2 (i.e., a relatively high energy region at the center of the first arcuate beam of rays), but blocks edge Β3 (i.e., a relatively low energy region). To this end, only the center Β 2 (i.e., peak region Β 2 ) has a relatively uniform energy distribution that can be used, which is a laser beam having a high energy distribution of the form 201004. Figure 12 is a diagram showing an apparatus 300 for repairing a bright spot failure in accordance with a second embodiment of the present invention. As shown in Fig. 12, the apparatus 300 according to the second embodiment has the same structure as the apparatus 200 according to the first embodiment except that it further includes a laser former 391 and a driving member 392. Therefore, a description of the redundant constituent elements is omitted. The beam shaper 391 acts to expand an area having a uniform energy density to expand a region where a laser beam can be processed and to flatten the shape of the laser beam. Further, the driving member 392 acts to simultaneously rotate either or both of the pair of y-axis blades Sb or the pair of γ-axis blades Sa (composed of the beam processing surface control members). Since the blade is rotated as described above, the transport unit (refer to h and 〇 2 in Fig. 9) can be formed in various forms. This is to control the form of the transfer unit in accordance with the shape of the color filter. For example, in an embodiment of the invention, as shown in Fig. 13, the laser beam B can be enlarged in the form of a slit, and an area of the laser beam that can be processed can be expanded to repair the panel p. In the above-described embodiment of the present invention, the movement of the laser beam B onto the panel p and repairing a bright spot failure in the panel will be described. However, as shown in Fig. 14, the panel P and the laser beam B can be moved in opposite directions to repair the panel. In this case, the time taken to repair the panel can be reduced. Meanwhile, although not shown in the drawings, a control unit (not shown) may be further included in the embodiment. The control unit may be disposed between the laser unit 12 201040641 210 and the scanner 23A, or the scanner and The beam is processed between the surface control members 280. Only when the polarizer is mounted in the liquid crystal panel, the control unit changes a polarization state of the laser beam, thereby improving the uniformity of the laser beam. An energy density of a laser beam according to an embodiment of the present invention may be a uniform benefit over the entire area of the laser beam radiation. Therefore, damage to the layer below the color filter can be avoided. Furthermore, it is a benefit that a laser beam has a relatively uniform energy system that can be used, since only the center 0 of a laser beam having a Gaussian distribution is used, after the example embodiment has been shown and the invention has been described, A person skilled in the art will recognize that various changes and modifications can be made without departing from the spirit and scope of the invention as defined by the following claims. BRIEF DESCRIPTION OF THE DRAWINGS Other aspects and features of the present invention will become apparent from the following description of the preferred embodiments together with the accompanying drawings in which: FIG. Sectional view; Figure 2 is a diagram showing the transparency of each wavelength of a color filter; Figure 3 is a diagram showing a conventional device for repairing a bright spot failure, and the 帛4 system is shown with a 帛3 diagram (d) A picture of a scanner of the current repairing device; 13 201040641 Figure 5 is a view showing a state of the repairing device revealed using Fig. 3; Fig. 6 is a view showing the repair manifested by Fig. 3. A diagram of an energy distribution of a laser beam emitted by the device; FIG. 7 is a view showing a repairing apparatus according to a first embodiment of the present invention; FIG. 8 is a view showing the use of FIG. A diagram of a state of the repair device; Figures 9 and 10 show a diagram of the beam processing surface control member of the repair device shown in Fig. 7; Fig. 11 shows the appearance of Fig. 7 Repairing a laser beam emitted by the device A diagram of an energy distribution; Fig. 12 is a view showing a repairing apparatus according to a second embodiment of the present invention; and Fig. 13 is a view showing a 光束w of a light beam in the form of a slit according to the present invention. And Fig. 14 is a view showing a third embodiment of the present invention. [Main component symbol description] B laser beam M1 mirror S beam slit 〇 110 laser unit M2 mirror P panel 130 scanner 1 3 1 Y current mirror 201040641 132 X current mirror 133 scanning lens 140 monitoring unit 141 Illuminator 150 Auto Focus Control Member 160 Focusing Lens 200 Device 〇 210 Laser Unit 220 Beam Intensity Control Unit 230 Scanner 240 Monitoring Unit • 241 Illuminator 250 Auto Focus Control Member 260 Focusing Lens 270 Beam Shape Control Member 〇 280 Beam Processing Surface Control member 391 laser shaper 392 drive member 500 liquid crystal panel 5 10 thin film transistor array substrate 520 liquid crystal layer 531 glass 532 color filter 533 black matrix 534 coating layer 535 ITO layer 536 orientation layer 537 polarizing plate 15