TW201035241A - Resin composition and display device using the same - Google Patents

Resin composition and display device using the same Download PDF

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Publication number
TW201035241A
TW201035241A TW099101926A TW99101926A TW201035241A TW 201035241 A TW201035241 A TW 201035241A TW 099101926 A TW099101926 A TW 099101926A TW 99101926 A TW99101926 A TW 99101926A TW 201035241 A TW201035241 A TW 201035241A
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Taiwan
Prior art keywords
acid
resin composition
group
film
compound
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TW099101926A
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Chinese (zh)
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TWI464214B (en
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Kazuto Miyoshi
Mika Koshino
Masao Tomikawa
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Toray Industries
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Publication of TWI464214B publication Critical patent/TWI464214B/en

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B1/00Optical elements characterised by the material of which they are made; Optical coatings for optical elements
    • G02B1/04Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of organic materials, e.g. plastics
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/10Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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    • C08G73/00Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
    • C08G73/06Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
    • C08G73/22Polybenzoxazoles
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    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
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    • C08K5/13Phenols; Phenolates
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    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
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    • C08K5/17Amines; Quaternary ammonium compounds
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    • C08L79/00Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
    • C08L79/04Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
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    • C09K11/00Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/06Luminescent, e.g. electroluminescent, chemiluminescent materials containing organic luminescent materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
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    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/032Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
    • G03F7/037Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polyamides or polyimides
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
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    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
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    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/12Light sources with substantially two-dimensional radiating surfaces
    • H05B33/14Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/86Arrangements for improving contrast, e.g. preventing reflection of ambient light
    • H10K50/865Arrangements for improving contrast, e.g. preventing reflection of ambient light comprising light absorbing layers, e.g. light-blocking layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
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    • H10K59/38Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
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    • C09K2211/00Chemical nature of organic luminescent or tenebrescent compounds
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    • C09K2211/00Chemical nature of organic luminescent or tenebrescent compounds
    • C09K2211/10Non-macromolecular compounds
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    • C09K2323/00Functional layers of liquid crystal optical display excluding electroactive liquid crystal layer characterised by chemical composition
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    • C09K2323/00Functional layers of liquid crystal optical display excluding electroactive liquid crystal layer characterised by chemical composition
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    • C09K2323/00Functional layers of liquid crystal optical display excluding electroactive liquid crystal layer characterised by chemical composition
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    • C09K2323/035Ester polymer, e.g. polycarbonate, polyacrylate or polyester
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    • C09K2323/06Substrate layer characterised by chemical composition
    • C09K2323/061Inorganic, e.g. ceramic, metallic or glass
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0005Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
    • G03F7/0007Filters, e.g. additive colour filters; Components for display devices
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/40Treatment after imagewise removal, e.g. baking
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
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    • H10K59/12Active-matrix OLED [AMOLED] displays
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    • H10K59/8791Arrangements for improving contrast, e.g. preventing reflection of ambient light
    • H10K59/8792Arrangements for improving contrast, e.g. preventing reflection of ambient light comprising light absorbing layers, e.g. black layers

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  • Chemical & Material Sciences (AREA)
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  • Polymers & Plastics (AREA)
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Abstract

The present invention provides a resin composition comprising (a) polyimide, polybenzoxazole, polyimide precursor, or polybenzoxazole precursor; (b) 1,5-dihydroxynaphth naphthalene, 1,6- dihydroxynaphth naphthalene, 1,7- dihydroxynaphth naphthalene, or 2,3- dihydroxynaphth naphthalene; and c a hot crosslink agent with specific structure. In view of the resin composition of the present invention, the resin composition is capable of keeping transmittance of the resin film before curing, at the same time, it capable of reducing transmittance of the curing film in the visible light region.

Description

201035241 六、發明說明: 【發明所屬之技術領域】 本發明係有關於一種樹脂組成物。更詳言之,係有關 於一種樹脂組成物,其係適合半導體元件的表面保護膜或 層間絕緣膜' 有機電致發光(Electroluminescence:以下記 載爲EL)元件的絕緣層、使用有機EL元件之顯示裝置的驅 動用薄膜電晶體(Thin Film Transistor:以下記載爲TFT) q 基板的平坦化膜、電路基板的配線保護絕緣膜、固態攝影 元件的晶片上微透鏡(on-chip microlens)或各種顯示器、固 態攝影元件用平坦化膜、電路基板用防焊阻劑等的用途。 【先前技術】 使含有聚醯亞胺或聚苯并噚唑的組成物硬化而得到的 硬化膜被廣泛地使用於半導體元件或顯示裝置的絕緣膜或 保護膜、平坦化膜等。特別是顯示裝置時,例如在有機EL 顯示器的絕緣層或液晶顯示器的黑色矩陣等的用途,爲了 〇 提升對比而要求降低硬化膜的透射率。又,爲了防止因光 線進入顯示裝置的驅動用TFT所引起的誤動作、或是漏泄 電流等,對於有機EL顯示器的絕緣層或是在有機EL顯示 器的TFT基板上所設置的平坦化膜,亦要求降低透射率。 在硬化膜,作爲降低比波長400奈米大的可見光區域的透 射率之技術,例如在液晶顯示器用黑色矩陣材料或RGB糊 材料等所觀察到的,可舉出在樹脂組成物添加碳黑或有 機、無機顔料、染料等的著色劑之方法。因爲含有該等著 201035241 色劑之樹脂組成物係在400〜45 0奈米的曝光區域具有吸 收,使用作爲使光線到達膜底部而感光化之正型感光性樹 脂組成物係困難的,通常係使用作爲使膜從表面光硬化之 負型感光性樹脂組成物。 在正型感光性樹脂組成物,作爲降低硬化膜的透射率 之技術,係例如一種正型放射性樹脂組成物(例如參照專利 文獻1 ),其係含有鹼可溶性樹脂、醌二疊氮化合物及無色 ^ 色料與顯色劑等的發色組成物;一種感光性樹脂(例如參照 〇 專利文獻2),其係預先添加加熱時會變爲黑色的感熱性材 料;及一種正型感光性樹脂組成物(例如參照專利文獻3), 其係含有鹼可溶性樹脂、醌二疊氮化合物、因加熱而發色 且在350奈米以上、700奈米以下顯示吸收極大之熱發色 性化合物及在3 5 0奈米以上、小於500奈米未顯示吸收極 大之化合物而在500奈米以上、750奈米以下顯示吸收極 大之化合物。該等係藉由使用因熱等的能量而發色之發色 〇 性化合物,能夠在將硬化前的樹脂膜在曝光波長區域之透 射率保持爲較高的同時,降低硬化膜的透射率之技術。因 此,能夠賦予樹脂組成物正型、負型雙方的感光性,泛用 性高。 先前技術文獻 專利文獻 專利文獻1 :特開2008-122501號公報 專利文獻2 :特開平1 0- 1 707 1 5號公報 201035241 專利文獻3 :美國專利申請公開第2 004/ 1 97703號說明書 【發明內容】 發明所欲解決之課題 發色性化合物係其本身因熱而產生分子內結構變化, 而在特定波長區域顯現吸收者。最近,爲了進一步提高泛 用性,希望有一種樹脂組成物,其不只是藉由發色性化合 物,亦能夠藉由其他手段在曝光波長區域顯現吸收。因此, 本發明之目的係提供一種樹脂組成物,藉由組合特定化合 ' 物,能夠在維持硬化前的樹脂膜之透射率之同時,降低硬 化膜在可見光區域之透射率。 解決課題之手段 亦即,本發明係一種樹脂組成物,其特徵係含有:(a) 聚醯亞胺、聚苯并嗶唑、聚醯亞胺前驅物或聚苯并噚唑前 驅物’(b)l,5-二羥基萘、1,6-二羥基萘、1,7-二羥基萘或2,3-二羥基萘及(c)具有下述通式(1)所示的結構之熱交聯劑或 Q 是具有下述通式(2)所示的基之熱交聯劑。201035241 VI. Description of the Invention: TECHNICAL FIELD OF THE INVENTION The present invention relates to a resin composition. More specifically, it relates to a resin composition which is suitable for a surface protective film or an interlayer insulating film of a semiconductor element, and an insulating layer of an organic electroluminescence (Electroluminescence: EL) element, and a display using an organic EL element. A thin film transistor for driving a device (Thin Film Transistor: hereinafter referred to as TFT) q a planarization film of a substrate, a wiring protective insulating film for a circuit board, on-chip microlens of a solid-state imaging device, or various displays, Uses for flattening films for solid-state imaging devices, solder resists for circuit boards, and the like. [Prior Art] A cured film obtained by curing a composition containing polyimine or polybenzoxazole is widely used for an insulating film, a protective film, a planarizing film, or the like of a semiconductor element or a display device. In particular, in the case of a display device, for example, in the use of an insulating layer of an organic EL display or a black matrix of a liquid crystal display, it is required to lower the transmittance of the cured film in order to improve the contrast. Further, in order to prevent malfunction due to light entering the driving TFT of the display device or leakage current, it is also required for the insulating layer of the organic EL display or the planarizing film provided on the TFT substrate of the organic EL display. Reduce the transmittance. In the cured film, as a technique for lowering the transmittance of a visible light region having a wavelength greater than 400 nm, for example, a black matrix material for a liquid crystal display or an RGB paste material, etc., it is possible to add carbon black or a resin composition. A method of a coloring agent for organic, inorganic pigments, dyes, and the like. Since the resin composition containing the 201035241 toner has absorption in an exposed region of 400 to 45 nm, it is difficult to use a positive photosensitive resin composition which is photo-sensitized to reach the bottom of the film. A negative photosensitive resin composition which is a photocuring film from the surface is used. In the positive-type photosensitive resin composition, a technique of reducing the transmittance of the cured film is, for example, a positive-type radioactive resin composition (for example, see Patent Document 1), which contains an alkali-soluble resin, a quinonediazide compound, and a colorless color. a coloring composition such as a coloring material and a color developing agent; a photosensitive resin (for example, refer to Patent Document 2), which is a heat sensitive material which is black when heated; and a positive photosensitive resin composition (for example, refer to Patent Document 3), which contains an alkali-soluble resin, a quinonediazide compound, a color-developing compound which is colored by heating and exhibits absorption greatly at 350 nm or more and 700 nm or less, and 3 A compound which absorbs a maximum of 50 nm or more and less than 500 nm does not exhibit a maximum absorption, and exhibits an absorption maximum of 500 nm or more and 750 nm or less. By using a chromonic compound which is colored by energy such as heat, it is possible to lower the transmittance of the cured film while maintaining the transmittance of the resin film before curing in the exposure wavelength region. technology. Therefore, it is possible to impart sensitivity to both the positive and negative types of the resin composition, and the versatility is high. CITATION LIST Patent Literature Patent Literature 1: JP-A-2008-122501 Patent Document 2: Japanese Laid-Open Patent Publication No. Hei No. Hei. Contents to be Solved by the Invention The color-developing compound itself undergoes an intramolecular structural change due to heat, and exhibits an absorption in a specific wavelength region. Recently, in order to further improve the general versatility, it is desirable to have a resin composition which can exhibit absorption in the exposure wavelength region by other means not only by a color-developing compound. Accordingly, an object of the present invention is to provide a resin composition capable of reducing the transmittance of a hardened film in a visible light region while maintaining a transmittance of a resin film before curing by combining a specific compound. Means for Solving the Problem That is, the present invention is a resin composition characterized by: (a) polyimine, polybenzoxazole, polyimine precursor or polybenzoxazole precursor' b) 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene, and (c) having the structure represented by the following formula (1) The thermal crosslinking agent or Q is a thermal crosslinking agent having a group represented by the following formula (2).

上述通式(1)中,R係表示2〜4價的連結基。R1係表 示碳數爲1〜20之1價的有機基、Cl、Br、I或F,R2及 201035241 R3係表示CH2OR5(R5係表示氫原子或碳數爲1〜6之1價 的烴基)。R4係表示氫原子、甲基或乙基。s係表示0〜2 的整數,u係表示2〜4的整數。 -N(CH2OR6),(H)v (2) 上述通式(2)中,R6係表示氫原子或碳數爲1〜6之1 價的烴基。t係表示1或2,v係表示0或1。但是,t + v係 1或2。 發明之效果 ❹ 依照本發明,能夠得到一種樹脂組成物,能夠在維持 硬化前的樹脂膜之透射率之同時,降低硬化膜在可見光區 域之透射率。 【實施方式】 本發明的樹脂組成物係含有:(a)聚醯亞胺、聚苯并曙 唑 '聚醯亞胺前驅物或聚苯并噚唑前驅物,(b)l,5-二羥基 萘、1,6-二羥基萘、1,7-二羥基萘或2,3-二羥基萘及(c)具有 〇 下述通式(1)所示的結構之熱交聯劑或是具有下述通式(2) 所示的基之熱交聯劑。藉由對(a)成分的樹脂組合(b)成分及 (c)成分,使硬化膜在400〜4 5 0奈米發色,能夠能夠大幅 度地降低在可見光區域之透射率。缺少(a)〜(c)中三者成分 的任一者,作爲目標之在400〜450奈米發色係困難的。在 以下,說明各成分。 本發明的樹脂組成物係含有(a)聚醯亞胺、聚苯并噚 哩、聚醯亞胺前驅物或聚苯并噚唑前驅物。該等亦可含有 201035241 2種以上,且亦含有具有該等2種以上的重複單位 物。 聚醯亞胺及聚苯并曙唑係在主鏈具有醯亞胺環 環的環狀結構之樹脂。重複單位的重複次數以1 〇〜 爲佳。 聚醯亞胺能夠藉由使四羧酸或對應的四羧酸二 氯化四羧酸二酯等與二胺或對應的二異氰酸酯化合 甲基矽烷基化二胺等反應來得到,具有四羧酸殘基 〇 殘基。例如,能夠藉由將使四羧酸二酐與二胺反應 的聚醯胺(聚醯亞胺前驅物之一),使用加熱處理或 理進行脫水閉環來得到。加熱處理時,亦可添加間 等與水共沸的溶劑。又,亦可添加弱酸性的羧酸化 在1 0 0 °c以下的低溫進行加熱處理。作爲化學處理 的閉環觸媒,可舉出羧酸酐或二環己基碳化二亞胺 水縮合劑、或三乙胺等的鹼等。關於聚醯亞胺前驅 〇 述。 聚苯并噚唑能夠藉由使雙胺基苯酚化合物與二 對應的二羧醯氯、二羧酸活性酯等反應來得到,具 酸殘基及雙胺基苯酚殘基。例如’能夠藉由將使雙 酚化合物與二羧酸反應而得到的聚羥基醯胺(聚苯 前驅物之一),使用加熱處理或化學處理進行脫水閉 到。加熱處理時,亦可添加間二甲苯等與水共沸的 又,亦可添加酸性化合物並在200°C以下的低溫進 之共聚 或噚唑 100000 酐、二 物、三 及二胺 而得到 化學處 二甲苯 合物並 所使用 等的脫 物係後 羧酸或 有β羧 胺基苯 并噚唑 環來得 溶劑。 行加熱 201035241 處理。作爲化學處理所使用的閉環觸媒,可舉出磷酸酐、 鹼、碳化二亞胺等。關於聚苯并噚唑前驅物係後述。 在本發明,從對鹼性水溶液的溶解性之觀點,聚醯亞 胺以在四羧酸殘基或二胺殘基具有 OR7、S03R7、 CONR7R8、COOR7、S〇2NR7R8等的酸性基或酸性基衍生物 爲佳’以具有羥基爲更佳。又,聚苯并噚唑以在二羧酸殘 基或雙胺基苯酚殘基具有0R7、S03R7、CONR7R8、COOR7、 S02NR7R8等的酸性基或酸性基衍生物爲佳,以具有羥基爲 f) 更佳。R7及R8係表示氫原子或碳數爲1〜20之1價的有機 基。又’酸性基係指R7或R8全部爲氫原子時,酸性基衍 生物係指在R7或R8含有碳數爲1〜20之1價的有機基時。 在本發明,作爲聚醯亞胺的四羧酸殘基及聚苯并噚唑 的二羧酸殘基(以下,將該等合倂稱爲酸殘基)之較佳結 構,可舉出以下的結構、或是將該等的氫原子使用碳數爲 1〜20的烷基、氟烷基、烷氧基、酯基、硝基、氰基、氟 Q 原子、氯原子取代1〜4個而成的結構等。亦可使用該等2 種以上。 201035241In the above formula (1), R represents a linking group having a valence of 2 to 4. R1 is a monovalent organic group having a carbon number of 1 to 20, Cl, Br, I or F, and R2 and 201035241 R3 are CH2OR5 (R5 represents a hydrogen atom or a monovalent hydrocarbon group having a carbon number of 1 to 6). . R4 represents a hydrogen atom, a methyl group or an ethyl group. s represents an integer of 0 to 2, and u represents an integer of 2 to 4. -N(CH2OR6), (H)v (2) In the above formula (2), R6 represents a hydrogen atom or a monovalent hydrocarbon group having a carbon number of 1 to 6. The t system represents 1 or 2, and the v system represents 0 or 1. However, t + v is 1 or 2. EFFECT OF THE INVENTION According to the present invention, it is possible to obtain a resin composition capable of reducing the transmittance of the cured film in the visible light region while maintaining the transmittance of the resin film before curing. [Embodiment] The resin composition of the present invention contains: (a) polyimine, polybenzoxazole 'polyimine precursor or polybenzoxazole precursor, (b) 1,5-two Hydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene, and (c) a thermal crosslinking agent having a structure represented by the following formula (1) or A thermal crosslinking agent having a group represented by the following formula (2). When the cured film is colored at 400 to 450 nm by the resin combination (b) component and the component (c) of the component (a), the transmittance in the visible light region can be greatly reduced. Any one of the three components (a) to (c) is difficult, and it is difficult to use a coloring system of 400 to 450 nm as a target. Hereinafter, each component will be described. The resin composition of the present invention contains (a) a polyimine, a polybenzopyrene, a polyimide precursor or a polybenzoxazole precursor. These may also contain two or more types of 201035241, and also include two or more types of repeating units. Polyimine and polybenzoxazole are resins having a cyclic structure of a quinone ring in the main chain. The number of repetitions of the repeating unit is preferably 1 〇. The polyimine can be obtained by reacting a tetracarboxylic acid or a corresponding tetracarboxylic acid dicarboxylic acid dicarboxylic acid diester with a diamine or a corresponding diisocyanate, a methyl hydrazine alkylated diamine or the like, and having a tetracarboxylic acid. Acid residue 〇 residue. For example, it can be obtained by subjecting polyamine (one of the polyimide precursors) for reacting tetracarboxylic dianhydride with a diamine by heat treatment or dehydration ring closure. In the case of heat treatment, a solvent which azeotropes with water may be added. Further, it is also possible to add a weakly acidic carboxylate to heat treatment at a low temperature of 10 ° C or lower. The chemically treated ring-closing catalyst may, for example, be a carboxylic anhydride or a dicyclohexylcarbodiimide water condensing agent or a base such as triethylamine. About the precursor of polyimine. The polybenzoxazole can be obtained by reacting a bisaminophenol compound with a corresponding dicarboxylic acid chloride, a dicarboxylic acid active ester or the like, and has an acid residue and a bisaminophenol residue. For example, polyhydroxyguanamine (one of polyphenylene precursors) obtained by reacting a bisphenol compound with a dicarboxylic acid can be dehydrated by heat treatment or chemical treatment. In the heat treatment, it may be added with azeotropy such as m-xylene or water, or an acidic compound may be added and copolymerized at a low temperature of 200 ° C or lower or carbazole 100,000 anhydride, di-, tri-, and diamine to obtain a chemical. The solvent is obtained by using a decarboxylate carboxylic acid or a β-carboxyaminobenzoxazole ring. Line heating 201035241 treatment. Examples of the ring-closing catalyst used in the chemical treatment include phosphoric anhydride, a base, and carbodiimide. The polybenzoxazole precursor system will be described later. In the present invention, from the viewpoint of solubility in an aqueous alkaline solution, the polyimine has an acidic group or an acidic group such as OR7, S03R7, CONR7R8, COOR7, S〇2NR7R8 or the like at a tetracarboxylic acid residue or a diamine residue. Derivatives are preferred as having a hydroxyl group. Further, the polybenzoxazole preferably has an acidic group or an acidic group derivative such as 0R7, S03R7, CONR7R8, COOR7, S02NR7R8 or the like in the dicarboxylic acid residue or the bisaminophenol residue, and has a hydroxyl group as f). good. R7 and R8 represent a hydrogen atom or a monovalent organic group having a carbon number of 1 to 20. Further, the 'acid group' means that when all of R7 or R8 is a hydrogen atom, the acid group derivative means when R7 or R8 contains a monovalent organic group having a carbon number of 1 to 20. In the present invention, as a preferred structure of a tetracarboxylic acid residue of polyimine and a dicarboxylic acid residue of polybenzoxazole (hereinafter referred to as an acid residue), the following structures are mentioned The structure or the hydrogen atom is substituted with an alkyl group having 1 to 20 carbon atoms, a fluoroalkyl group, an alkoxy group, an ester group, a nitro group, a cyano group, a fluorine Q atom, and a chlorine atom in place of 1 to 4 The structure is formed. These two or more types can also be used. 201035241

Ον .0 \/ ΟΟν .0 \/ Ο

^ ^<3〇χ /V^ \^\ ❹^ ^<3〇χ /V^ \^\ ❹

201035241201035241

ch3Ch3

cf3Cf3

-10- 201035241 其中,j係表示直接鍵結、-coo-、-CONH-、-CH2-、 C2H4-、-〇、-C3H6-、-S02_、-s-、-Si(CH3)2-、-0-Si(CH3)2 -0-、-C6H4-、-C6H4-O-C6H4-、-C6H4-C3H6_C6H4 -或-C 6 H 4 C3F6-C6H4-。 在本發明’作爲聚醯亞胺的二胺殘基及聚苯并噚唑的 雙胺基苯酣殘基(以下’將該等合倂稱爲胺殘基)之較佳結 構’可舉出以下的結構、或是將該等的氫原子使用碳數爲 1〜20的烷基、氟烷基、烷氧基、酯基、硝基、氰基、氟 原子、氯原子取代1〜4個而成的結構等。亦可使用該等2 種以上。-10- 201035241 where j is a direct bond, -coo-, -CONH-, -CH2-, C2H4-, -〇, -C3H6-, -S02_, -s-, -Si(CH3)2-, -0-Si(CH3)2-0-, -C6H4-, -C6H4-O-C6H4-, -C6H4-C3H6_C6H4- or -C6H4C3F6-C6H4-. In the present invention, a preferred structure of a diamine residue of a polyimine and a bisaminobenzoquinone residue of polybenzoxazole (hereinafter referred to as an amine residue) is exemplified. The following structure or the hydrogen atom is substituted with 1 to 4 alkyl groups, fluoroalkyl groups, alkoxy groups, ester groups, nitro groups, cyano groups, fluorine atoms, and chlorine atoms having a carbon number of 1 to 20; The structure is formed. These two or more types can also be used.

-11- 201035241-11- 201035241

-12 - 201035241-12 - 201035241

rvRv

OH 〇 认,0^°ηολ>_OH 〇 recognition, 0^°ηολ>_

NH =0NH =0

C00R7C00R7

0R7 R7 其中,J係表示直接鍵結、-COO-、-CONH-、-CH2-、 -C2H4- 、 -〇- 、 -C3H6- 、 -S〇2- 、 -s- 、 -Si(CH3)2-、 -0-Si(CH3)2-0-、-C6H4-、-C6H4-0-C6H4-、-C6H4-C3H6- C6H4-或_C6H4-C3F6-C6H4^R7係表示氫原子或碳數爲1〜20之1 -13 - 201035241 價的有機基。 在本發明所使用的(a)成分之中,聚醯亞胺前驅物、聚 苯并噚唑前驅物係在主鏈具有醯胺鍵之樹脂,藉由加熱處 理或化學處理而進行脫水閉環,成爲前述的聚醯亞胺、聚 苯并曙唑。重複單位的重複次數以10〜10000爲佳。作爲 聚醯亞胺前驅物,可舉出聚醯胺酸、聚醯胺酸酯、聚醯胺 酸醯胺、聚異醯亞胺等,以聚醯胺酸、聚醯胺酸酯爲佳。 0 作爲聚苯并噚唑前驅物,可舉出聚羥基醯胺、聚胺基醯胺、 聚醯胺、聚醯胺醯亞胺等,以聚羥基醯胺爲佳。從對鹼性 水溶液的溶解性而言,聚醯亞胺前驅物及聚苯并噚唑前驅 物以在酸殘基或胺殘基具有 OR7、S03R7、CONR7R8、 COOR7、S02NR7R8等的酸性基或酸性基衍生物爲佳,以具 有羥基爲更佳。R7及R8係表示氫原子或碳數爲1〜20之1 價的有機基。又,酸性基係指R7或R8全部爲氫原子時, 酸性基衍生物係指在R7或R8含有碳數爲1〜20之1價的 D 有機基時。 作爲構成聚醯亞胺前驅物及聚苯并噚唑前驅物的酸殘 基之酸成分,二羧酸的例子可舉出對酞酸、異酞酸、二苯 基醚二羧酸、雙(羧苯基)六氟丙烷、聯苯基二羧酸、二苯 基酮二羧酸、三苯基二羧酸等。三羧酸的例子可舉出1,2,4-苯三甲酸、1,3,5-苯三甲酸、二苯基醚三羧酸、聯苯基三羧 酸等。四羧酸的例子可舉出焦蜜石酸、3,3’,4,4’-聯苯基四 羧酸、2,3,3’,4’-聯苯基四羧酸、2,2’,3,3’-聯苯基四羧酸、 3,3’,4,4’-二苯基酮四羧酸、2,2’,3,3’-二苯基酮四羧酸、2,2- -14- 201035241 ,1雙 (3、、 雙烷烷 院 丙 氟 六 \ny 基 苯 竣 二 雙 烷 ί 乙雙 ) 、 基烷 苯)φ 羧基 一)苯 4 竣 (3二 雙 4 雙 羧 丙乙 4 氟s)o 丄i I本雙 基殘 苯二甲 羧3-} 二2’基 苯 雙 、 碾 基 苯 羧 基 苯 隻 啶羧 吡四 .6-,^ 5) 丁 3,或 2 、 酸 羧 四 族 香 芳 的 等 酸 羧 四 萘 醚羧 四酸 酸 環 、 酸 4 酸羧,3, 羧四1,2 四茈>1 萘0-酸 6-9,1竣 ,5,4,四 2 3 院 丁 環戊烷四羧酸、環己烷四羧酸、雙環[2.2.1·]庚烷四竣酸、 ()雙環[3.3.1·]庚院四竣酸、雙環[3.1.1·]庚-2-嫌-四殘酸、雙 環[2.2 _2·]辛烷四羧酸、金剛烷四羧酸等的脂肪族四羧酸 等。該等亦能夠使用2種以上。又,以將上述所例示的二 羧酸、三羧酸或四羧酸的氫原子,使用 OR7、S03R7、 C〇NR7R8、COOR7、S02NR7R8等的酸性基或酸性基衍生物、 較佳是羥基或磺酸基、磺醯胺基、磺酸酯基等取代1〜4個 而成者爲更佳。 該等的酸可直接或是作爲酸酐或活性酯而使用。 〇 又,藉由使用二甲基矽烷二酞酸、1,3-雙(酞酸)四甲基 二矽氧烷等含矽原子的四羧酸,能夠提高對基板的黏著 性、或對洗淨等所使用的氧電漿、UV臭氧處理之耐性。該 等含矽原子的四羧酸以使用總酸成分的1〜3 0莫耳%爲佳。 作爲構成聚醯亞胺前驅物及聚苯并噚唑前驅物的胺殘 基之二胺成分的例子,可舉出雙〇-胺基-4-羥苯基)六氟丙 烷、雙(3-胺基-4-羥苯基)颯、雙(3-胺基-4-羥苯基)丙烷、 雙(3-胺基-4-羥苯基)亞甲基、雙(3-胺基-4-羥苯基)醚、雙 (3-胺基-4-羥基)聯苯、雙(3-胺基-4-羥苯基)莽等含羥基的 -15- 201035241 二胺、3,5-二胺基苯甲酸、3-羧基-4,4’ -二 含羧基的二胺、3-磺酸-4,4’-二胺基二苯基 胺、二硫羥基伸苯二胺、3,4’-二胺基二苯 基二苯基醚、3,4’-二胺基二苯基甲烷、4,. 甲烷、3,4’-二胺基二苯基颯、4,4’-二胺基 二胺基二苯基硫醚、4,4’-二胺基二苯基硫 基苯氧基)苯、苯炔、間伸苯二胺、對伸苯 0 胺、2,6-萘二胺、雙(4-胺基苯氧基苯基)颯 基苯基)楓、雙(4-胺基苯氧基)聯苯、雙{4 苯基}醚、1,4-雙(4-胺基苯氧基)苯、2,2’-二 基聯苯、2,2’-二乙基-4,4’-二胺基聯苯、3 二胺基聯苯、3,3’-二乙基-4,4’-二胺基聯 甲基-4,4’-二胺基聯苯、3,3’,4,4’-四甲基 苯、2,2’-二(三氟甲基)-4,4’-二胺基聯苯、 香族環的氫原子的一部分,使用烷基或鹵 Ο 之化合物、或環己基二胺、亞甲雙環己基 二胺等。而且,該等二胺亦可被甲基、乙 10的烷基、三氟甲基等碳數爲1〜10的I Br、I等的基取代。該等亦可使用2種以上 途時,芳香族二胺以使用二胺全體的50| 又,上述所例示的二胺以具有OR7、SO: COOR7、S02NR7R8等的酸性基或酸性基衍 有羥基爲更佳。 該等二胺可直接或是作爲對應的二異 胺基二苯基醚等 醚等含磺酸的二 基酸、4,4 ’ -二胺 4’_二胺基二苯基 二苯基颯' 3,4’ -醚、1,4-雙(4-胺 5 二胺、1,5-萘二 、雙(3-胺基苯氧 -(4-胺基苯氧基) 二甲基-4,4’-二胺 ,3 -—甲基-4,4’_ 苯、2,2,,3,3,-四 二胺基聯 或是將該等的芳 素原子取代而成 二胺等的脂肪族 基等碳數爲i〜 ft 烷基、F、C1、 :。要求耐熱性用 I耳%以上爲佳。 3R7、CONR7R8、 :生物爲佳,以具 氰酸酯化合物或 -16 - 201035241 三甲基砍院基化二胺而使用》 又’作爲二胺成分藉由使用1,3 -雙(3 -胺丙基)四甲基二 矽氧烷、1,3-雙(4-苯胺基)四甲基二矽氧烷等含矽原子的二 胺,能夠提高對基板的黏著性、或對洗淨等所使用的氧電 漿、UV臭氧處理之耐性。該等含矽原子的二胺以使用總二 胺成分的1〜3 0莫耳%爲佳。 又,以將聚醯亞胺、聚苯并曙唑、聚醯亞胺前驅物、 ζ) 聚苯并噚唑前驅物的末端,使用具有羥基、羧基、磺酸基 或硫醇基之一元胺、酸酐、醯氯或一元羧酸封止爲佳。該 等亦可使用2種以上。藉由在樹脂末端具有前述的基,能 夠容易地將樹脂對鹼性水溶液之溶解速度調整在較佳範 圍。 作爲一元胺的較佳例子,可舉出5-胺基-8-羥基喹啉、 1-羥基-7-胺基萘、1-羥基-6-胺基萘、卜羥基-5-胺基萘、1-羥基-4-胺基萘、2-羥基-7-胺基萘、2-羥基-6-胺基萘、2-^ 羥基-5-胺基萘、1-羧基-7-胺基萘、1-羧基·6-胺基萘、1-羧基-5-胺基萘、2-羧基-7-胺基萘、2-羧基-6-胺基萘、2-羧基-5-胺基萘、2-胺基苯甲酸、3-胺基苯甲酸、4-胺基苯 甲酸、4-胺基柳酸、5-胺基柳酸、6-胺基柳酸、2-胺基苯磺 酸、3-胺基苯磺酸、4-胺基苯磺酸' 3-胺基_4,6-二羥基嘧 啶、2-胺基苯酚、3-胺基苯酚、4-胺基苯酚、2_胺基苯硫酚、 3-胺基苯硫酚、4-胺基苯硫酚等。 作爲酸酐、單醯氯、一元羧酸、單活性酯化合物的較 佳例子,可舉出酞酸酐、順丁烯二酸酐、那迪克酸(nadic -17- 201035241 acid)、環己烷二羧酸酐、3_羥基酞酸酐等的酸酐、3_羧基 苯酚、4-羧基苯酚、3-羧基苯硫酚、4-羧基苯硫酚、1-羥基 -7-羧基萘、1-羥基-6-羧基萘、1-羥基-5-羧基萘、1-氫硫基 -7 -羧基萘、1-氫硫基-6-羧基萘、1-氫硫基-5-羧基萘' 3-羧基苯磺酸、4-羧基苯磺酸等的一元羧酸類及該等羧基醯 氯化而成之單醯氯化合物、對酞酸、酞酸、順丁烯二酸、 環己烷二羧酸、1,5-二羧基萘、1,6-二羧基萘、1,7-二羧基 萘、2,6 -一殘基萘等的二殘酸類之只有一個殘基酿氯化而 成之單醯氯化合物、藉由單醯氯化合物與N-羥基苯并三唑 或N-羥基-5-降萡烯-2,3-二羧醯亞胺反應所得到的單活性 酯化合物等。 上述的一元胺、酸酐、醯氯、一元羧酸等的封端劑之 含量’以構成酸殘基的酸成分單體或構成二胺殘基的二胺 成分單體之添加莫耳數的0.1〜60莫耳%之範圍爲佳,以5 〜50莫耳%爲更佳。藉由設爲該範圍,塗布樹脂組成物時 〇的黏性適當,且能夠得到具有優良的膜物性之樹脂組成物。 又,亦可在樹脂的末端具有聚合性官能基。聚合性官 能基的例子可舉出乙烯性不飽和鍵基、乙炔基、羥甲基、 烷氧基甲基等。 在樹脂中所導入的封端劑能夠容易地使用以下的方法 來檢測。例如,藉由將導入有封端劑之樹脂溶解於酸性溶 液’來分解成爲樹脂的構成單位亦即胺成分及酸成分,並 將其進行氣體層析儀(GC)或NMR測定,能夠容易地檢測封 端劑。此外,能夠將導入有封端劑之樹脂直接使用熱分解 -18 - 201035241 氣體層析(PGC)或紅外線光譜及13CNMR光譜測定來檢測。 在本發明,作爲(a)成分,以聚醯亞胺前驅物或聚苯并 噚唑前驅物爲佳,以聚醯亞胺前驅物爲更佳。聚醯亞胺前 驅物係藉由在約200 °C之硬化焙燒,醯胺酸部位進行閉環 之醯亞胺化反應,而聚苯并噚唑前驅物係藉由在約3 00 〇C 之硬化焙燒,羥基醯胺部位進行閉環之曙唑化反應,耐藥 品性大幅度地提升。藉此,聚醯亞胺前驅物在更低溫度的 0 焙燒溫度能夠得到耐藥品性。又,使用硬化焙燒時具有體 積收縮的性質之該等前驅物樹脂而成之感光性樹脂組成 物,在藉由曝光、顯像步驟得到微細圖案後,藉由焙燒能 夠得到順錐狀圖案。該順錐狀圖案使用作爲有機EL元件的 絕緣膜時,上部電極的被覆性優良,能夠防止斷線來提高 元件的信賴性。 本發明的樹脂組成物亦可含有(a)成分以外的鹼可溶 性樹脂。鹼可溶性樹脂係指具有可溶於鹼的酸性基之樹 ^ 脂,具體上’可舉出具有丙烯酸之自由基聚合性單體、苯 酚酚醛清漆樹脂、聚羥基苯乙烯、聚矽氧烷等。又,亦可 保護該等樹脂的酸性基而調節鹼溶解性。此種樹脂係除了 溶解於氫氧化四甲銨的水溶液以外、有溶解於膽鹼、三乙 胺、二甲胺基吡啶、一乙醇胺、二乙胺基乙醇、氫氧化鈉、 氫氧化鉀、碳酸鈉等的鹼性水溶液者。該等樹脂亦可含有 2種以上’但是在含有(a)成分的樹脂全體所佔有的比率以 5 0重量%以下爲佳。 本發明的樹脂組成物係含有(b) 1,5 -二羥基萘、1,6 -二 -19- 201035241 羥基萘、1,7-二羥基萘或2,3-二羥基萘。該等亦可含有2 種以上。藉由具有2個羥基,相較於具有1個羥基的情況’ 鹼顯像性優良’能夠提升敏感度。又,縮合多環結構之萘 結構相較於單環化合物,電子密度高,藉由具有2個羥基’ 電子密度進一步提高,能夠有效地產生後述之(Ο熱交聯劑 的親電子加成反應。又’因爲在交聯反應形成後,π電子 的共軛係在2方向以上擴展而容易著色’所以藉由與後述 0 之(c)熱交聯劑組合,能夠大幅度地降低硬化膜在可見光區 域之透射率。此種效果以在1,5-位置、1,6-位置、1,7-位置 或2,3-位置具有羥基時特別顯著。而且,藉由(〇熱交聯劑 與前述(a)成分交聯反應,能夠使(b)成分的化合物固定在耐 熱性優良的(a)成分,能夠提升硬化膜的耐藥品性。 本發明的樹脂組成物除了含有(b)l,5-二羥基萘、1,6-二羥基萘、1,7-二羥基萘或2,3 -二羥基萘以外’亦可含其他 有具有2個以上的羥基之縮合多環芳香族化合物。 〇 作爲具有2個以上的羥基之縮合多環芳香族化合物的 骨架結構,可舉出戊搭烯(pentalene)、茚、萘、葜、庚搭 烯、辛搭烯等的碳縮合二環系、as-苯并二茚、s-苯并二茚、 伸聯苯、苊烯、莽、菲、蒽等的碳縮合三環系、三節 (trindene)、登蒽(fluoranthene)、醋菲、醋恵嫌、二鄰亞苯、 东、孫、四芬(tetraphene)、稠四苯等的碳縮合四環系、匹 (picene)、茄(perylene)、五芬、稠五苯、四伸苯等的碳縮 合五環系等。又,亦可以是雜環結構,該雜環結構係含有 氮、硫或氧原子來代替前述碳縮合多環芳香族化合物之一 -20- 201035241 部分的碳原子。作爲縮合多環芳香族雜環化合物可舉出苯 并呋喃、苯并噻吩、吲哚、苯并咪唑、苯并噻唑、嘌呤、 喹啉、異嗤啉、啐啉、喹噚啉等的縮合雜二環系、二苯并 呋喃、咔唑、吖啶、1,1 0 -啡啉等的縮合雜三環系等。作爲 具有2個以上的羥基之縮合多環芳香族化合物,以具有上 面例示的骨架之化合物的氫原子的一部分使用2個以上的 羥基取代而成者爲佳。 0 具有2個以上的羥基之縮合多環芳香族化合物的具體 例,可舉出1,4 -二羥基萘、2,6-二羥基萘、2,7 -二羥基萘、 1,8二羥基萘、2,4-二羥基喹啉、2,6-二羥基唾啉、2,3 -二 羥基喹曙啉、蒽-1,2,10-三元醇、蒽-1,8,9-三元醇等。 在本發明的樹脂組成物,(b) 1,5-二羥基萘、1,6-二羥 基萘、1,7-二羥基萘或2,3-二羥基萘的含量,係相對於100 重量份(a)成分的樹脂,以5重量份以上爲佳,以10重量 份以上爲更佳。又,以1 20重量份以下爲佳,以1 00重量 Ο 份以下爲更佳。(b)成分的含量爲5重量份以上時,能夠更 降低硬化膜在可見光區域之透射率。又,120重量份以下 時,能夠維持硬化膜的強度且降低吸水率。又,含有2種 以上(a)成分或(b)成分時,以該等的總量係在上述範圍爲 佳。 本發明的樹脂組成物係含有(c)下述通式(1)所示的結 構之熱交聯劑或是具有下述通式(2)所示的基之熱交聯 劑。該等亦可含有2種以上。(c)成分的熱交聯劑係交聯於 (a)聚醯亞胺、聚苯并噚唑、聚醯亞胺前驅物或聚苯并噚唑 -21 - 201035241 前驅物及(b)l,5-二羥基萘、1,6-二羥基萘、1,7-二羥基萘或 2,3-二羥基萘之各自藉由連接(a)、(b)、(c)的3成分,能夠 大幅度地降低可見光區域的透射率。又,藉由交聯反應, 能夠提升硬化膜的耐藥品性。0R7 R7 where J is a direct bond, -COO-, -CONH-, -CH2-, -C2H4-, -〇-, -C3H6-, -S〇2-, -s-, -Si(CH3) 2-, -0-Si(CH3)2-0-, -C6H4-, -C6H4-0-C6H4-, -C6H4-C3H6-C6H4- or _C6H4-C3F6-C6H4^R7 represents a hydrogen atom or a carbon number The organic base for the price of 1~20-1 -13 - 201035241. Among the components (a) used in the present invention, the polyimine precursor and the polybenzoxazole precursor are resins having a guanamine bond in the main chain, and are subjected to dehydration ring closure by heat treatment or chemical treatment. It becomes the aforementioned polyimine and polybenzoxazole. The number of repetitions of the repeating unit is preferably from 10 to 10,000. Examples of the polyimine precursor include polylysine, polyphthalate, polyamidamine, polyisodecimide, and the like, and polyglycolic acid or polyphthalate is preferred. Examples of the polybenzoxazole precursor include polyhydroxyguanamine, polyamine amide, polyamine, polyamidimide, and the like, and polyhydroxyguanamine is preferred. From the solubility in an aqueous alkaline solution, the polyimide precursor and the polybenzoxazole precursor have an acidic group or acidity such as OR7, S03R7, CONR7R8, COOR7, S02NR7R8 or the like at the acid residue or the amine residue. The base derivative is preferred, and it is more preferred to have a hydroxyl group. R7 and R8 represent a hydrogen atom or an organic group having a carbon number of from 1 to 20 carbon atoms. Further, the acidic group means that when all of R7 or R8 are a hydrogen atom, the acidic group derivative means a case where R7 or R8 contains a monovalent D organic group having a carbon number of 1 to 20. The acid component of the acid residue constituting the polyimide precursor and the polybenzoxazole precursor, examples of the dicarboxylic acid include citric acid, isodecanoic acid, diphenyl ether dicarboxylic acid, and bis ( Carboxyphenyl) hexafluoropropane, biphenyldicarboxylic acid, diphenylketone dicarboxylic acid, triphenyldicarboxylic acid, and the like. Examples of the tricarboxylic acid include 1,2,4-benzenetricarboxylic acid, 1,3,5-benzenetricarboxylic acid, diphenylethertricarboxylic acid, and biphenyltricarboxylic acid. Examples of the tetracarboxylic acid include pyroic acid, 3,3',4,4'-biphenyltetracarboxylic acid, 2,3,3',4'-biphenyltetracarboxylic acid, 2,2 ',3,3'-biphenyltetracarboxylic acid, 3,3',4,4'-diphenyl ketone tetracarboxylic acid, 2,2',3,3'-diphenyl ketone tetracarboxylic acid, 2,2- -14- 201035241 ,1 double (3,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, 4 dicarboxypropyl ethyl 4 fluoro s) o 丄 i I bis-base residual benzocarboxylate 3-} 2 2 phenyl bis, benzoyl carboxy carboxy pyridine carboxypyrene 4. 6-, ^ 5) butyl 3 , or 2, acid carboxylic acid, tetra-fragrant, etc., acid carboxytetra-naphthyl ether carboxylic acid ring, acid 4 acid carboxylic acid, 3, carboxytetra 1,2 tetraterpene > 1 naphthalene 0-acid 6-9, 1 竣, 5,4,4 2 3 butyl cyclopentane tetracarboxylic acid, cyclohexane tetracarboxylic acid, bicyclo [2.2.1·] heptane tetradecanoic acid, ()bicyclo[3.3.1·] Gengyuan tetradecanoic acid An aliphatic tetracarboxylic acid such as bicyclo [3.1.1·]hept-2-iso-tetraresidic acid, bicyclo[2.2 _2·]octanetetracarboxylic acid or adamantanetetracarboxylic acid. These can also be used in 2 or more types. Further, in the hydrogen atom of the above-exemplified dicarboxylic acid, tricarboxylic acid or tetracarboxylic acid, an acidic group or an acidic group derivative such as OR7, S03R7, C〇NR7R8, COOR7 or S02NR7R8, preferably a hydroxyl group or It is more preferable that the sulfonic acid group, the sulfonylamino group, the sulfonate group or the like is substituted with 1 to 4 pieces. These acids can be used either directly or as anhydrides or active esters. Further, by using a ruthenium atom-containing tetracarboxylic acid such as dimethyl decanedioic acid or 1,3-bis(decanoic acid) tetramethyldioxane, the adhesion to the substrate can be improved or washable. Resistance to oxygen plasma and UV ozone treatment used in the net. The tetracarboxylic acid containing such a halogen atom is preferably from 1 to 30 mol% of the total acid component. Examples of the diamine component constituting the amine residue of the polyimine precursor and the polybenzoxazole precursor include bis-indenyl-amino-4-hydroxyphenyl)hexafluoropropane and bis(3- Amino-4-hydroxyphenyl)indole, bis(3-amino-4-hydroxyphenyl)propane, bis(3-amino-4-hydroxyphenyl)methylene, bis(3-amino- Hydroxy-containing -15-201035241 diamine, 3,5, 4-hydroxyphenyl)ether, bis(3-amino-4-hydroxy)biphenyl, bis(3-amino-4-hydroxyphenyl)hydrazine -diaminobenzoic acid, 3-carboxy-4,4'-dicarboxyl-containing diamine, 3-sulfonic acid-4,4'-diaminodiphenylamine, dithiol phenylenediamine, 3 , 4'-diaminodiphenyldiphenyl ether, 3,4'-diaminodiphenylmethane, 4,. methane, 3,4'-diaminodiphenylanthracene, 4,4' -diaminodiaminodiphenyl sulfide, 4,4'-diaminodiphenylthiophenoxy)benzene, benzyne, meta-phenylenediamine, p-benzoic acid, 2,6 -naphthalenediamine, bis(4-aminophenoxyphenyl)nonylphenyl) maple, bis(4-aminophenoxy)biphenyl, bis{4phenyl}ether, 1,4-double (4-Aminophenoxy)benzene, 2,2'-diylbiphenyl, 2,2 -diethyl-4,4'-diaminobiphenyl, 3 diaminobiphenyl, 3,3'-diethyl-4,4'-diaminobimethyl-4,4'-di Aminobiphenyl, 3,3',4,4'-tetramethylbenzene, 2,2'-bis(trifluoromethyl)-4,4'-diaminobiphenyl, a hydrogen atom of an aromatic ring As a part, a compound of an alkyl group or a halogen halide, or a cyclohexyldiamine, methylenebiscyclohexyldiamine or the like is used. Further, these diamines may be substituted with a group such as I Br or I having a carbon number of 1 to 10 such as a methyl group, an alkyl group of 10 or a trifluoromethyl group. When two or more kinds of these may be used, the aromatic diamine may be 50% using the entire diamine. Further, the diamine exemplified above may have a hydroxyl group or an acidic group having an OR7, SO:COOR7, S02NR7R8 or the like. For better. The diamine may be directly or as a corresponding sulfonic acid-containing dibasic acid such as an ether such as diisoaminodiphenyl ether or 4,4′-diamine 4′-diaminodiphenyldiphenylphosphonium. '3,4'-ether, 1,4-bis(4-amine5-diamine, 1,5-naphthalene di, bis(3-aminophenoxy-(4-aminophenoxy) dimethyl- 4,4'-diamine, 3-methyl-4,4'-benzene, 2,2,3,3,-tetradiamine or a substituted aryl atom to form a diamine The carbon number such as an aliphatic group is i ft alkyl, F, C1: : It is preferable that heat resistance is 1% or more. 3R7, CONR7R8, : Bio is preferable, and cyanate compound or-16 - 201035241 Trimethyl cleavage of diamines used" and 'as a diamine component by using 1,3 -bis(3-aminopropyl)tetramethyldioxane, 1,3-double (4 A halogen-containing diamine such as an anilino group such as tetramethyldioxane can improve adhesion to a substrate or resistance to oxygen plasma or UV ozone treatment used for washing or the like. Preferably, the diamine is used in an amount of from 1 to 30 mol% of the total diamine component. The end of the polybenzoxazole precursor, which is blocked with a hydroxyl, carboxyl, sulfonic or thiol monoamine, anhydride, hydrazine or monocarboxylic acid, is used as the end of the polybenzoxazole precursor. Two or more of these may be used. By having the above-mentioned group at the resin terminal, the dissolution rate of the resin to the alkaline aqueous solution can be easily adjusted to a preferred range. As a preferred example of the monoamine, 5-amino-8-hydroxyquinoline, 1-hydroxy-7-aminonaphthalene, 1-hydroxy-6-aminonaphthalene, hydroxy-5-aminonaphthalene, 1-hydroxy-4-aminonaphthalene, 2-hydroxy-7-aminonaphthalene, 2-hydroxy-6-aminonaphthalene, 2-^hydroxy-5-aminonaphthalene, 1-carboxy-7-aminonaphthalene, 1-carboxy-6-aminonaphthalene , 1-carboxy-5-aminonaphthalene, 2-carboxy-7-aminonaphthalene, 2-carboxy-6-aminonaphthalene, 2-carboxy-5-aminonaphthalene, 2-aminobenzoic acid, 3- Aminobenzoic acid, 4-aminobenzoic acid, 4-aminosarric acid, 5-aminosalic acid, 6-aminosalicylic acid, 2-aminobenzenesulfonic acid, 3-aminobenzenesulfonic acid, 4 -aminobenzenesulfonic acid '3-amino-4,6-dihydroxypyrimidine, 2-aminophenol, 3-aminophenol, 4-aminophenol, 2-aminothiophenol, 3-amine Preferred examples of the acid anhydride, monoterpene chlorine, monocarboxylic acid, and mono-active ester compound include decanoic anhydride, maleic anhydride, and nadic acid ( Nadic -17- 201035241 acid), an acid anhydride such as cyclohexanedicarboxylic anhydride or 3-hydroxyindole anhydride, 3-carboxyphenol, 4-carboxyphenol, 3-carboxythiophenol, 4-carboxythiophenol, 1- Hydroxy-7-carboxynaphthalene, 1-hydroxy-6-carboxynaphthalene, 1-hydroxy-5-carboxynaphthalene, 1-hydrothio-7-carboxynaphthalene, 1-hydrothio-6-carboxynaphthalene, 1-hydrogen a monocarboxylic acid such as thio-5-carboxynaphthalene '3-carboxybenzenesulfonic acid or 4-carboxybenzenesulfonic acid; and a monoterpene chlorinated compound obtained by chlorinating the carboxy ruthenium, p-citric acid, citric acid, and cis-butyl The diacids of enedic acid, cyclohexanedicarboxylic acid, 1,5-dicarboxynaphthalene, 1,6-dicarboxynaphthalene, 1,7-dicarboxynaphthalene, 2,6-residyl naphthalene, etc. A monoterpene chlorine compound obtained by chlorination of a residue, by reaction of a monoterpene chlorine compound with N-hydroxybenzotriazole or N-hydroxy-5-northene-2,3-dicarboxylimenimine The obtained single active ester compound or the like. The content of the terminal blocking agent of the above-mentioned monoamine, acid anhydride, hydrazine chloride, monocarboxylic acid or the like is 0.1 in terms of the number of added moles of the acid component monomer constituting the acid residue or the diamine component monomer constituting the diamine residue. The range of ~60 mol% is better, preferably 5 to 50 mol%. By setting it as such a range, when a resin composition is apply|coated, the adhesiveness of the ruthenium is appropriate, and the resin composition which has the outstanding film physical property can be obtained. Further, it may have a polymerizable functional group at the terminal of the resin. Examples of the polymerizable functional group include an ethylenically unsaturated bond group, an ethynyl group, a methylol group, an alkoxymethyl group and the like. The blocking agent introduced into the resin can be easily detected by the following method. For example, by dissolving a resin in which a terminal blocking agent is introduced in an acidic solution to decompose into an amine component and an acid component which are constituent units of a resin, and performing gas chromatograph (GC) or NMR measurement, it can be easily Check the blocking agent. Further, the resin into which the terminal blocking agent is introduced can be directly detected by thermal decomposition -18 - 201035241 gas chromatography (PGC) or infrared spectroscopy and 13 C NMR spectroscopy. In the present invention, as the component (a), a polyimine precursor or a polybenzoxazole precursor is preferred, and a polyimine precursor is more preferred. The polyimine precursor is subjected to a ring-shaped ruthenium imidization reaction by a hardening at about 200 ° C, and the polybenzoxazole precursor is hardened at about 300 ° C. Roasting, the hydroxy guanamine site undergoes a closed-loop carbazole reaction, and the chemical resistance is greatly improved. Thereby, the polyimide precursor can obtain chemical resistance at a lower temperature of 0 calcination temperature. Further, a photosensitive resin composition obtained by using these precursor resins having a property of shrinkage during hardening baking can obtain a smooth pattern by firing after obtaining a fine pattern by exposure and development steps. When the insulating film is used as the organic EL element in the forward tapered pattern, the coverage of the upper electrode is excellent, and the disconnection can be prevented to improve the reliability of the element. The resin composition of the present invention may contain an alkali-soluble resin other than the component (a). The alkali-soluble resin is a resin having an acidic group soluble in a base, and specific examples thereof include a radical polymerizable monomer having acrylic acid, a phenol novolac resin, polyhydroxystyrene, polyoxyalkylene or the like. Further, the acidity of the resins can be protected to adjust the alkali solubility. The resin is dissolved in choline, triethylamine, dimethylaminopyridine, monoethanolamine, diethylaminoethanol, sodium hydroxide, potassium hydroxide, carbonic acid, in addition to the aqueous solution of tetramethylammonium hydroxide. An alkaline aqueous solution such as sodium. These resins may contain two or more kinds, but the ratio of the resin contained in the component (a) is preferably 50% by weight or less. The resin composition of the present invention contains (b) 1,5-dihydroxynaphthalene, 1,6-di-19-201035241 hydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene. These may also contain two or more types. By having two hydroxyl groups, the sensitivity is improved as compared with the case where one hydroxyl group is excellent in alkali visibility. Further, the naphthalene structure of the condensed polycyclic structure has a higher electron density than that of the monocyclic compound, and the electron density of the two hydroxyl groups is further improved, and the electrophilic addition reaction of the ruthenium crosslinking agent can be efficiently produced. In addition, since the conjugated system of π electrons expands in the two directions or more and is easily colored after the formation of the crosslinking reaction, the combination of the thermal crosslinking agent of (c) described below can greatly reduce the cured film. Transmittance in the visible light region. This effect is particularly pronounced when having a hydroxyl group at the 1,5-position, 1,6-position, 1,7-position or 2,3-position. Moreover, by means of a thermal crosslinking agent By crosslinking the component (a), the compound of the component (b) can be fixed to the component (a) having excellent heat resistance, and the chemical resistance of the cured film can be improved. The resin composition of the present invention contains (b) , other than 5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene, may also contain other condensed polycyclic aromatic compounds having two or more hydroxyl groups. 〇 as a condensed polycyclic aromatic compound having two or more hydroxyl groups The skeleton structure may, for example, be a carbon condensed bicyclic system of pentalene, anthracene, naphthalene, anthracene, heptene or octene, as-benzodioxime, s-benzodioxime, or Carbon condensed tricyclic system of benzene, decene, anthracene, phenanthrene, anthracene, etc., trindene, fluoranthene, vinegar phenanthrene, vinegar, bismuth subphenylene, east, sun, tetraphene a carbon condensed pentacyclic ring system such as a carbon tetracondensed tetracyclic system, picene, perylene, penfen, pentacene or tetraphenylene, etc. Further, it may be a heterocyclic structure. The heterocyclic ring structure contains a nitrogen, sulfur or oxygen atom in place of the carbon atom of one of the carbon condensed polycyclic aromatic compounds -20- 201035241. Examples of the condensed polycyclic aromatic heterocyclic compound include benzofuran and benzene. a condensed heterobicyclic system such as thiophene, anthracene, benzimidazole, benzothiazole, anthracene, quinoline, isoporphyrin, porphyrin or quinoxaline, dibenzofuran, carbazole, acridine, 1, a condensed heterocyclic ring system such as phenanthroline or the like. The condensed polycyclic aromatic compound having two or more hydroxyl groups has the above examples. It is preferred that a part of the hydrogen atom of the compound of the skeleton is substituted with two or more hydroxyl groups. 0 Specific examples of the condensed polycyclic aromatic compound having two or more hydroxyl groups include 1,4 -dihydroxyl Naphthalene, 2,6-dihydroxynaphthalene, 2,7-dihydroxynaphthalene, 1,8-dihydroxynaphthalene, 2,4-dihydroxyquinoline, 2,6-dihydroxys-pipeline, 2,3-dihydroxyquinoline Porphyrin, indole-1,2,10-triol, indole-1,8,9-triol, etc. In the resin composition of the present invention, (b) 1,5-dihydroxynaphthalene, 1,6 The content of dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene is preferably 5 parts by weight or more, and 10 parts by weight or more based on 100 parts by weight of the resin of the component (a). Better. Further, it is preferably 1 part by weight or less, more preferably 1 part by weight or less. When the content of the component (b) is 5 parts by weight or more, the transmittance of the cured film in the visible light region can be further lowered. Further, when the amount is 120 parts by weight or less, the strength of the cured film can be maintained and the water absorption rate can be lowered. Further, when two or more components (a) or (b) are contained, it is preferred that the total amount is in the above range. The resin composition of the present invention contains (c) a thermal crosslinking agent having a structure represented by the following formula (1) or a thermal crosslinking agent having a group represented by the following formula (2). These may also contain two or more types. The thermal crosslinking agent of component (c) is crosslinked to (a) polyimine, polybenzoxazole, polyimine precursor or polybenzoxazole-21 - 201035241 precursor and (b)l , 5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene are each bonded by the three components of (a), (b), (c), The transmittance in the visible light region can be greatly reduced. Moreover, the chemical resistance of the cured film can be improved by the crosslinking reaction.

上述通式(1)中,R係表示2〜4價的連結基,Ri係表 不碳數爲1〜20之1價的有機基、cl、Br、I或F,作爲碳 數爲1〜20之1價的有機基,以甲基、乙基、丙基、丁基、 戊基、己基、環戊基、環己基等碳原子數1〜6之丨價的烴 基爲佳。R2及R3係表示CH2〇R5(R5係氫原子或碳數爲1 〜6的烴基)。R4係表示氫原子、甲基或乙基。s係表示〇 〇〜2的整數,11係表示2〜4的整數。複數的尺1〜!^係各自 可以相同亦可以不同。連結基R的例子係如以下所示。 -22- 201035241 R9 Ic—In the above formula (1), R represents a 2 to 4 valent linking group, and Ri represents an organic group having a monovalent number of carbon atoms of 1 to 20, cl, Br, I or F, and has a carbon number of 1 to 1. The 20-valent organic group is preferably a hydrocarbon group having a carbon number of 1 to 6 such as a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a cyclopentyl group or a cyclohexyl group. R2 and R3 represent CH2〇R5 (a R5-based hydrogen atom or a hydrocarbon group having 1 to 6 carbon atoms). R4 represents a hydrogen atom, a methyl group or an ethyl group. The s system represents an integer of 〇 〇 2, and the 11 system represents an integer of 2 to 4. Plural ruler 1~! ^ Each can be the same or different. Examples of the linking group R are as follows. -22- 201035241 R9 Ic—

C-R11C-R11

I R10 s- 〇2I R10 s- 〇2

-23- 201035241 上述式中’ R9〜R2 7係表示氫原子、碳數爲1 價的有機基、Cl、Br、I或h作爲碳數爲^20 有機基’以甲基、乙基、丙基、丁基、戊基、己 基、環己基、苄基、萘基等爲佳。 -N(CH2〇R6)t(H)v (2) 上述通式(2)中’R6係表示氫原子或碳數爲J 價的烴基。t係表示1或2,V係表示〇或1。{J 〇 係1或2。 上述通式(1)中’ R2及R3係表示熱交厢 CH2OR5(R5係氫原子或碳數爲1〜6之1價的烴3 殘留適當的反應性且保存安定性優良,R5以碳· 之1價的烴基爲佳。又,在含有光酸產生劑或光 劑等之感光性樹脂組成物,R5以甲基或乙基爲更 在通式(1)所示之熱交聯劑,在一分子中所佔 劑的官能基數爲4〜8。官能基數小於4時,無法 〇的樹脂組成物適當地著色,無法降低硬化膜在可 之透射率。另一方面,官能基數大於8時,難以 度且化合物本身的安定性或在樹脂組成物的保存 低。 具有通式(1)所示的結構之化合物的純度,以 爲佳,以85%以上爲更佳。純度爲85%以上時, 性優良且能夠充分地進行樹脂組成物的交聯反應 化後的著色性優良,能夠更降低硬化膜在可見光 .射率。又,因爲能夠減少成爲吸水性基之未反應 〜20之1 之1價的 基、環戊 〜6之1 Ϊ 是,t+v 务劑亦即 £ )。因爲 【爲1〜4 聚合引發 佳。 有熱交聯 將硬化後 見光區域 得到高純 安定性降 75%以上 保存安定 ,而且硬 區域之透 基,能夠 -24- 201035241 降低樹脂組成物的吸水性。得到高純度的熱交聯劑之方法 可舉出再結晶、蒸餾等。熱交聯劑的純度能夠藉由液體層 析法來求取。 具有通式(1)所示的結構之熱交聯劑之較佳例子係如 下述所示。 Ο ❹-23- 201035241 In the above formula, 'R9 to R2 7' represents a hydrogen atom, an organic group having a carbon number of 1 or more, Cl, Br, I or h as a carbon number of ^20 organic group' with a methyl group, an ethyl group, and a C group. A group, a butyl group, a pentyl group, a hexyl group, a cyclohexyl group, a benzyl group, a naphthyl group and the like are preferred. -N(CH2〇R6)t(H)v (2) In the above formula (2), 'R6' represents a hydrogen atom or a hydrocarbon group having a carbon number of J. The t system represents 1 or 2, and the V system represents 〇 or 1. {J 〇 1 or 2. In the above formula (1), 'R2 and R3' represent a hot junction CH2OR5 (a hydrogen atom of R5 or a monovalent hydrocarbon 3 having a carbon number of 1 to 6 has an appropriate reactivity and is excellent in storage stability, and R5 is carbon· The monovalent hydrocarbon group is preferred. Further, in the photosensitive resin composition containing a photoacid generator or a light agent, R5 is a methyl or ethyl group as a thermal crosslinking agent represented by the formula (1). The number of functional groups of the agent in one molecule is 4 to 8. When the number of functional groups is less than 4, the resin composition which cannot be kneaded is appropriately colored, and the transmittance of the cured film cannot be lowered. On the other hand, when the number of functional groups is more than 8, It is difficult to maintain the stability of the compound itself or the storage of the resin composition. The purity of the compound having the structure represented by the formula (1) is preferably 85% or more, and the purity is 85% or more. It is excellent in the coloring property after the crosslinking reaction of the resin composition is sufficient, and the visible light transmittance of the cured film can be further reduced. Further, the unreacted amount of the water-absorbing group can be reduced. The monovalent base, cyclopentane ~ 6 of 1 Ϊ is, t + v agent is also known as £). Because [for 1 to 4 polymerization is preferred. There is thermal cross-linking. After hardening, the light-receiving area is obtained. The high-purity stability is reduced by more than 75%. The stability and the permeability of the hard region can be reduced to -24-201035241 to reduce the water absorption of the resin composition. A method of obtaining a high-purity thermal crosslinking agent may be recrystallization, distillation or the like. The purity of the thermal crosslinking agent can be determined by liquid chromatography. Preferred examples of the thermal crosslinking agent having the structure represented by the formula (1) are shown below. Ο ❹

H2Cr-〇CH3 C3H7〇—CH2 OC2H5OH <j)C2H5 -CH,H2Cr-〇CH3 C3H7〇—CH2 OC2H5OH <j)C2H5 -CH,

H,JC—〇CH3 C2H5〇-CH OH HH,JC—〇CH3 C2H5〇-CH OH H

H2C-〇CH3 〇C2Hg-CHH2C-〇CH3 〇C2Hg-CH

?C3H7?H (j)C3H7 H20\?C3H7?H (j)C3H7 H20\

h2o—OC3H7 (j)C4H9OH OC4H9 H2C^ /L /CH,h2o—OC3H7 (j)C4H9OH OC4H9 H2C^ /L /CH,

OCH, OH OCH, I I I H2C\/^/CH2OCH, OH OCH, I I I H2C\/^/CH2

;—och3 c4h9o—ςΗ2;—och3 c4h9o—ςΗ2

OH HI h2c~〇ch3 c4h9o—ch2 -25- 201035241OH HI h2c~〇ch3 c4h9o—ch2 -25- 201035241

通式(2)中,R6係氫原子或碳數爲1〜6之1價的烴基, 以碳數爲1〜4之1價的烴基爲佳。又,從化合物的安定性 或在樹脂組成物的保存安定性之觀點’在含有光酸產生劑 或光聚合引發劑之感光性樹脂組成物,R6以甲基或乙基爲 佳,在化合物中所含有的(CH2OR6)基之數目,以8以下爲 佳。 具有通式(2)所示的基之熱交聯劑之較佳例子係如下 述所示。In the formula (2), R6 is a hydrogen atom or a monovalent hydrocarbon group having 1 to 6 carbon atoms, and preferably a monovalent hydrocarbon group having 1 to 4 carbon atoms. Further, from the viewpoint of the stability of the compound or the storage stability of the resin composition, in the photosensitive resin composition containing a photoacid generator or a photopolymerization initiator, R6 is preferably a methyl group or an ethyl group in the compound. The number of (CH2OR6) groups contained is preferably 8 or less. Preferred examples of the thermal crosslinking agent having a group represented by the formula (2) are as follows.

N-CH2OCH3 H3COH2C-NAN-CH2OCH3 h3C〇H2C—n\|-CH2OCH Ν—CH20CH Η h3co och3 h3coh2c-n^n-ch2och3 Ο 〇-< Η n-ch2och2ch3 n-ch2och2ch3 H3CH2COH2C-rj^N-CH2OCH2CH3 H3CH2CO OCH2CH3 h3ch2coh2c h3ch2coh2cN-CH2OCH3 H3COH2C-NAN-CH2OCH3 h3C〇H2C—n\|-CH2OCH Ν—CH20CH Η h3co och3 h3coh2c-n^n-ch2och3 Ο 〇-< Η n-ch2och2ch3 n-ch2och2ch3 H3CH2COH2C-rj^N-CH2OCH2CH3 H3CH2CO OCH2CH3 h3ch2coh2c h3ch2coh2c

N-CH2OCH3N-CH2OCH3

ch2och2ch3 lrN-CH2OCH2CH3 O H3COH2C-jJ-CH2h3c〇h2c;^nJCn:i h3coh2c ch2och3 ch2och3Ch2och2ch3 lrN-CH2OCH2CH3 O H3COH2C-jJ-CH2h3c〇h2c;^nJCn:i h3coh2c ch2och3 ch2och3

h3coh2c H3COH2C N/CH2OCH: ch2och; h3ch2coh2c-n-ch2och2ch;H3coh2c H3COH2C N/CH2OCH: ch2och; h3ch2coh2c-n-ch2och2ch;

h3coh2c-nh H3CH2COHAi h3ch2coh2c rCH2OCH2CH3 、CH2OCH2CH3 201035241 (c)具有通式(1)所示的結構之熱交聯劑或是具有通式 (2)所示的結構之熱交聯劑之含量,係相對於1〇〇重量份(a) 成分的樹脂’以5重量份以上爲佳,以1 0重量份以上爲更 佳。又’以1 2 0重量份以下爲佳,以丨〇 〇重量份以下爲更 佳。(c)成分的含量爲5重量份以上時,能夠更降低硬化膜 在可見光區域之透射率。又,120重量份以下時,硬化膜 0的強度高且樹脂組成物的保存安定性亦優良。而且,含有 2種以上的(a)成分或(c)成分之情況,以該等的總量在上述 範圍爲佳。 本發明的樹脂組成物亦可進一步含有(d)光酸產生劑 或(e)光聚合引發劑及(f)含有2個以上的乙烯性不飽和鍵之 化合物,能夠賦予正型或負型的感光性。 藉由在本發明的樹脂組成物含有(d)光酸產生劑,在光 照射部產生酸,光照射部對鹼性水溶液的溶解性增加,能 ^ 夠得到光照射部溶解之正型浮凸圖案。又,藉由含有(d)光 酸產生劑及環氧化合物,在光照射部所產生的酸促進環氧 化合物的反應,能夠得到光照射部不溶解之負型浮凸圖案。 作爲(d)光酸產生劑,可舉出醌二疊氮化合物、鏑鹽、 鐵鹽、重氮鎗鹽、碘鑰鹽等》 作爲醌二疊氮化合物,可舉出醌二疊氮的磺酸在多羥 基化合物以酯鍵結而成者、醌二疊氮的磺酸在多胺基化合 物磺醯胺鍵結而成者、醌二疊氮的磺酸在多羥基多胺基化 合物酯鍵結及/或磺醯胺鍵結而成者等。該等多羥基化合物 -27 - 201035241 或多胺基化合物以官能基全體的50莫耳%以上被醌二疊氮 取代爲佳。又,(d)光酸產生劑亦可含有2種以上,能夠得 到高敏感度的感光性樹脂組成物。 在本發明’醌二疊氮化合物以使用具有5_萘酷二疊氮 磺醯基、4 -蔡酿一疊氮擴醯基的任一者爲佳。4 -萘醌二疊 氮磺醯基酯化合物係在水銀燈的i射線區域具有吸收,適 合於i射線曝光。5萘醌二疊氮磺醯基酯化合物係在水銀燈 0 的g射線區域具有吸收,適合於g射線曝光。在本發明, 以依照曝光波長來選擇4-萘醌二疊氮磺醯基酯化合物、5_ 萘醌二疊氮磺醯基酯化合物爲佳。又,亦可含有在同一分 子中具有4-萘醌二疊氮磺醯基、5·萘醌二疊氮磺醯基之萘 醌二疊氮磺醯基酯化合物,亦可含有4 -萘醌二疊氮磺醯基 酯化合物及5-萘醌二疊氮磺醯基酯化合物。 (d)光酸產生劑之中,因爲能夠適當地使曝光所產生的 酸成分安定化,以鏑鹽、鱗鹽、重氮鑰鹽爲佳,其中以鏑 Ο 鹽爲佳。 在本發明,從高敏感度化之觀點,(d)光酸產生劑的含 量係相對於100重量份(a)成分的樹脂,以0.01〜50重量份 爲佳。其中,醌二疊氮化合物以3〜40重量份的範圍爲佳。 又,鏑鹽、鱗鹽、重氮鎗鹽的總量以0.5〜20重量份的範 圍爲佳。必要時亦可進一步含有敏化劑等。又,含有2種 以上的(d)成分之情況,該等的總量以上述範圍爲佳。 在本發明的感光性樹脂組成物,亦可含有(e)光聚合引 發劑及(f)含有2個以上的乙烯性不飽和鍵之化合物。在光 -28- 201035241 照射部所產生的活性自由基使乙烯性不飽和鍵進行自由基 聚合,能夠得到光照射部不溶解之負型浮凸圖案。 作爲(e)光聚合引發劑,可舉出二乙氧基乙醯苯、2-羥 基-2-甲基-1-苯基丙烷-1-酮、苄基二甲基縮酮、1-(4-異丙 基苯基)-2-羥基-2-甲基丙烷-1-酮、4-(2-羥基乙氧基)苯基 •(2-羥基-2-丙基)酮、1-羥基環己基-苯基酮、1-苯基-1,2-丙烷-2-(鄰乙氧基羰基)肟、2-甲基-[4-(甲硫基)苯基]-2-味 0 啉丙烷-1-酮、2-苄基-2-二甲胺基-1-(4-味啉苯基)-丁酮-1、 苯偶姻、苯偶姻甲基醚、苯偶姻乙基醚、苯偶姻異丙基醚、 苯偶姻異丁基醚、二苯基酮、鄰苯甲醯苯甲酸甲酯、4-苯 基二苯基酮、4,4-二氯二苯基酮、羥基二苯基酮、4-苯偶姻 -4’-甲基-二苯基硫醚、烷基化二苯基酮、3,3’,4,4’-四(第三 丁基過氧羰基)二苯基酮、4-苯甲醯-N,N-二甲基·Ν-[2-(1-側氧基-2-丙烯氧基)乙基]苯溴化氫氧化四甲銨 (methanaminium)、(4-苯甲酿基节基)氯化三甲鞍、一水合 Ο 2-羥基- 3-(4-苯甲醯基苯氧基-N,N,N-三甲基-1-丙基氯化 銨、2-異丙基-9-氧硫咄唱(thioxanthone)、2,4-二甲基-9-氧硫卩山喔、2,4 -二乙基-9 -氧硫卩山喔、2,4 -二氯-9 -氧硫卩山嗶、 2-羥基-3-(3,4-二甲基-9-側氧基-9H-硫卩山唱-2-基-氧 基)-N,N,N-三甲基-1-丙基氯化銨、2,4,6-三甲基苯甲醯基苯 基氧化膦、1,2-辛二酮-1-[4-(苯硫基)-2-(0-苯甲醯肟)]、 1-[9-乙基- 6-(2-甲基苯甲醯基)-9H-咔哩-3-基]-乙酮-1-(0-乙醯肟)、2,2’-雙(鄰氯苯基)-4,5,4’,5’-四苯基-1,2-二咪 唑、10-丁基-2-氯吖啶酮、2-乙基蒽醌、苯偶醯、9, 10-菲 -- 201035241 醌、樟腦醌、甲基苯基乙醛酸酯、π 5 ·環戊二烯基-η6-異丙 苯基-鐵(1+)-六氟磷酸鹽ο-)、二苯基硫酸衍生物、雙 (η5-2,4-環戊二烯-1-基)-雙(2,6-二氟- 3- (1Η -吡咯-1-基)-苯 基)鈦、4,4-雙(二甲胺基)二苯基酮、4,4·雙(二乙胺基)二苯 基酮' 9 -氧硫卩til嗶、2 -甲基-9 -氧硫_噃、2 -氯-9 -氧硫_嘎、 4-苯甲醯基-4-甲基苯基酮、二苄基酮、莽酮、2,3-二乙氧基 乙酿苯、2,2 -二甲氧基-2-苯基-2-苯基乙醯苯、2 -經基-2-甲 0基丙醯苯、對第三丁基二氯乙醯苯、苄基甲氧基乙基縮醛、 蒽醌、2 -第三丁基蒽醌、2 -胺基蒽醌、/5-氯蒽醌、蒽酮、 苯并蒽酮、二苯并環庚酮、亞甲基蒽酮、4-疊氮亞苄基乙醯 苯、2,6-雙(對疊氮亞苄基)環己烷、2,6-雙(對疊氮亞苄基)-4-甲基環己酮、2-苯基-1,2-丁二酮- 2-(鄰甲氧基羰基)肟、1,3-二苯基丙烷三酮-2-(鄰乙氧基羰基)肟、萘磺醯氯、喹啉磺 醯氯、N-苯基苯硫基吖啶酮、4,4-偶氮雙異丁腈、苯并噻唑 二硫醚、三苯基膦、四溴化碳、三溴苯基楓、過氧化苯甲 ❸醯及曙紅、亞甲藍等的光還原性色料與抗壞血酸、三乙醇 胺等的還原劑之組合等。該等亦可含有2種以上。 在本發明,(〇光聚合引發劑的含量係相對於1〇〇重量 份(a)成分的樹脂’以〇·1〜20重量份爲佳。0.1重量份以上 時’藉由光照射產生充分的自由基,敏感度提升。又,20 重量份以下時’不會有因爲產生過度的自由基致使光未照 射部硬化’鹼顯像性提升。又,含有2種以上的(e)成分時, 該等的總量以在上述範圍爲佳。 作爲(f)含有2個以上的乙烯性不飽和鍵之化合物,可 201035241 舉出乙二醇二甲基丙烯酸酯、乙二醇二丙烯酸酯、二伸乙 甘醇二甲基丙烯酸酯、三羥甲基丙烷三丙烯酸酯、乙氧基 化雙酚A二甲基丙烯酸酯、甘油二甲基丙烯酸酯、三伸丙 二醇二甲基丙烯酸酯、丁二醇二甲基丙烯酸酯、甘由三丙 烯酸酯、新戊四醇三丙烯酸酯、新戊四醇四丙烯酸酯、二 新戊四醇六丙烯酸酯、乙氧基化新戊四醇四丙烯酸酯、乙 氧基化異三聚氰酸三丙烯酸酯等的丙烯酸單體。該等亦可 ¢) 含有2種以上。 在本發明,(f)含有2個以上的乙烯性不飽和鍵之化合 物的含量係相對於1 〇〇重量份(a)成分的樹脂,以1重量份 以上爲佳,以5重量份以上爲更佳。又,以1 00重量份以 下爲佳,以50重量份以下爲更佳。又,含有(f)成分2種以 上時,該等的總量以在上述範圍爲佳。 又,爲了調整溶解性等,相對於1〇〇重量份(a)成分的 樹脂,亦可含有1〜50重量份之只具有1個乙烯性不飽和 0 鍵之化合物。此種化合物可舉出例如丙烯酸、甲基丙烯酸、 丙烯酸甲酯、甲基丙烯酸甲酯、丙烯酸丁酯、丙烯酸羥基 乙酯、甲基丙烯酸羥基乙酯、二甲基丙烯醯胺、甲基丙烯 酸二甲基胺基乙酯、丙烯醯基味啉、α-氯丙烯酸1-羥基乙 酯、甲基丙烯酸2-羥基乙酯、丙烯酸2-羥基乙酯、α -氯丙 烯酸2-羥基乙酯、甲基丙烯酸1-羥基丙酯、丙烯酸1-羥基 丙酯、α-氯丙烯酸卜羥基丙酯、甲基丙烯酸2-羥基丙酯、 丙烯酸2-羥基丙酯、α-氯丙烯酸2-羥基丙酯、甲基丙烯酸 3 -羥基丙酯、丙烯酸3 -羥基丙酯、〇:-氯丙烯酸3 -羥基丙 -31 - 201035241 酯、甲基丙烯酸1-羥基-1-甲基乙酯、丙烯酸1-羥基-1-甲 基乙酯、氯丙烯酸1-羥基_丨-甲基乙酯、甲基丙烯酸2-羥基-1-甲基乙酯、丙烯酸2-羥基-1-甲基乙酯、ct-氯丙烯 酸2 -羥基-1-甲基乙酯、甲基丙烯酸1-羥基丁酯、丙烯酸 1-羥基丁酯、α-氯丙烯酸1-羥基丁酯、甲基丙烯酸2-羥基 丁酯、丙烯酸2-羥基丁酯、α -氯丙烯酸2 _羥基丁酯、甲基 丙烯酸3-羥基丁酯、丙烯酸3-羥基丁酯、氯丙烯酸3-0 羥基丁酯、甲基丙烯酸4_羥基丁酯、丙烯酸4-羥基丁酯、 α-氯丙烯酸4-羥基丁酯、甲基丙烯酸1-羥基-1-甲基丙酯、 丙烯酸1-羥基-1-甲基丙酯、氯丙烯酸1-羥基-1-甲基丙 酯、甲基丙烯酸2 -羥基-1-甲基丙酯、丙烯酸2 -羥基-1-甲 基丙酯、α-氯丙烯酸2 -羥基-1-甲基丙酯、甲基丙烯酸1-羥基-2-甲基丙酯、丙烯酸1-羥基-2-甲基丙酯、α-氯丙烯 酸卜羥基-2-甲基丙酯、甲基丙烯酸2-羥基-2-甲基丙酯、 丙烯酸2-羥基-2-甲基丙酯、α-氯丙烯酸2-羥基-2-甲基丙 Ο 酯、甲基丙烯酸2-羥基-1,1-二甲基乙酯、丙烯酸2-羥基 -1,1-二甲基乙酯、α-氯丙烯酸2-羥基-1,1-二甲基乙酯、 甲基丙烯酸1,2 -二羥基丙酯、丙烯酸1,2 -二羥基丙酯、ct-氯丙烯酸1,2·二羥基丙酯、甲基丙烯酸2,3-二羥基丙酯、 丙烯酸2,3 -二羥基丙酯、〇:-氯丙烯酸2,3 -二羥基丙酯、甲 基丙烯酸2,3-二羥基丁酯、丙烯酸2,3-二羥基丁酯、α-氯 丙烯酸2,3-二羥基丁酯、對羥基苯乙烯、對異丙烯基苯酚、 甲基丙烯酸苯乙酯、丙烯酸苯乙酯、α-氯丙烯酸苯乙酯、 Ν -羥甲基丙嫌醯胺、Ν -羥甲基甲基丙烯醯胺、α-氯丙烯 -32- 201035241 酸、巴豆酸、4·戊烯酸、5_己烯酸、6-庚烯酸、7-辛烯酸、 8 -壬酸、9 -癸酸、10-Η--碳嫌酸、十三院二酸、蓖麻醇酸、 異氰酸2-(甲基丙烯醯氧基)乙酯、異氰酸2_(丙烯醯氧基) 乙酯、異氰酸2-(α-氯丙烯醯氧基)乙酯等。該等亦可含有 2種以上。 本發明的樹脂組成物亦可進一步含有(g)熱酸產生 劑。(g)熱酸產生劑係藉由後述的顯像後加熱產生酸,除了 0 能夠促進(a)成分的樹脂與(c)成分的熱交聯劑之交聯反應 以外,亦能夠促進(a)成分的樹脂的醯亞胺環、噚唑環之環 化。因此,硬化膜的耐藥品性提升,且能夠降低膜減量。 從(g)熱酸產生劑所產生的酸以強酸爲佳,例如以對甲苯磺 酸、苯磺酸等的芳基磺酸、甲磺酸、乙磺酸、丁磺酸等的 烷基磺酸等爲佳。在本發明,熱酸產生劑以通式(4)或(5) 所示之脂肪族磺酸化合物爲佳,該等亦可含有2種以上。H3coh2c-nh H3CH2COHAi h3ch2coh2c rCH2OCH2CH3, CH2OCH2CH3 201035241 (c) The content of the thermal crosslinking agent having the structure represented by the formula (1) or the thermal crosslinking agent having the structure represented by the formula (2) is relative to The resin '(a) component is preferably 5 parts by weight or more, more preferably 10 parts by weight or more. Further, it is preferably 1 part by weight or less, more preferably 5% by weight or less. When the content of the component (c) is 5 parts by weight or more, the transmittance of the cured film in the visible light region can be further lowered. Further, when the amount is 120 parts by weight or less, the strength of the cured film 0 is high and the storage stability of the resin composition is also excellent. Further, in the case where two or more kinds of the component (a) or the component (c) are contained, the total amount is preferably in the above range. The resin composition of the present invention may further contain (d) a photoacid generator, (e) a photopolymerization initiator, and (f) a compound containing two or more ethylenically unsaturated bonds, which can impart a positive or negative type. Photosensitive. When the resin composition of the present invention contains (d) a photoacid generator, an acid is generated in the light-irradiating portion, and the solubility of the light-irradiating portion in the alkaline aqueous solution is increased, and the positive embossing in which the light-irradiating portion is dissolved can be obtained. pattern. In addition, by containing the (d) photoacid generator and the epoxy compound, the acid generated in the light-irradiating portion promotes the reaction of the epoxy compound, whereby a negative-type relief pattern in which the light-irradiating portion is insoluble can be obtained. Examples of the (d) photoacid generator include a quinonediazide compound, a phosphonium salt, an iron salt, a diazo gun salt, an iodine salt, etc., and as a quinonediazide compound, a sulfonate of quinonediazide may be mentioned. The acid is bonded to the polyhydroxy compound by an ester, the sulfonic acid of the quinonediazide is bonded to the polyamine compound sulfonamide, and the sulfonic acid of the quinonediazide is in the polyhydroxypolyamine compound ester bond. Knots and / or sulfonamide bonded and so on. Preferably, the polyhydroxy compound -27 - 201035241 or the polyamine compound is substituted with 50% by mole of the entire functional group by quinonediazide. Further, (d) the photoacid generator may be contained in two or more types, and a highly sensitive photosensitive resin composition can be obtained. In the present invention, the quinonediazide compound is preferably one having a 5-naphthoquinonediazidesulfonyl group and a 4-carotene azide-expanding group. The 4-naphthoquinone diazide sulfonate compound absorbs in the i-ray region of a mercury lamp and is suitable for i-ray exposure. The 5-naphthoquinonediazidesulfonyl ester compound has absorption in the g-ray region of the mercury lamp 0 and is suitable for g-ray exposure. In the present invention, it is preferred to select a 4-naphthoquinonediazidesulfonyl ester compound or a 5-naphthoquinonediazidesulfonyl ester compound in accordance with the exposure wavelength. Further, it may contain a naphthoquinonediazidesulfonyl ester compound having a 4-naphthoquinonediazidesulfonyl group or a 5-naphthoquinonediazidesulfonyl group in the same molecule, and may also contain 4-naphthoquinone. A diazanesulfonyl ester compound and a 5-naphthoquinonediazidesulfonyl ester compound. (d) Among the photoacid generators, since the acid component generated by the exposure can be appropriately stabilized, a phosphonium salt, a scale salt or a diazo salt is preferred, and an anthracene salt is preferred. In the present invention, from the viewpoint of high sensitivity, the content of the (d) photoacid generator is preferably 0.01 to 50 parts by weight based on 100 parts by weight of the resin of the component (a). Among them, the quinonediazide compound is preferably in the range of 3 to 40 parts by weight. Further, the total amount of the onium salt, the scale salt, and the diazo gun salt is preferably in the range of 0.5 to 20 parts by weight. Further, a sensitizer or the like may be further contained as necessary. Further, when two or more types of component (d) are contained, the total amount of these is preferably in the above range. The photosensitive resin composition of the present invention may further comprise (e) a photopolymerization initiator and (f) a compound containing two or more ethylenically unsaturated bonds. In the light -28-201035241, the living radical generated by the irradiation unit radically polymerizes the ethylenically unsaturated bond, and a negative embossed pattern in which the light-irradiated portion is insoluble can be obtained. Examples of the (e) photopolymerization initiator include diethoxyacetamidine, 2-hydroxy-2-methyl-1-phenylpropan-1-one, benzyldimethylketal, and 1-( 4-isopropylphenyl)-2-hydroxy-2-methylpropan-1-one, 4-(2-hydroxyethoxy)phenyl•(2-hydroxy-2-propyl)one, 1- Hydroxycyclohexyl-phenyl ketone, 1-phenyl-1,2-propane-2-(o-ethoxycarbonyl)anthracene, 2-methyl-[4-(methylthio)phenyl]-2-flavor 0 phenylpropan-1-one, 2-benzyl-2-dimethylamino-1-(4-morpholinylphenyl)-butanone-1, benzoin, benzoin methyl ether, benzoin Ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, diphenyl ketone, methyl phthalic acid benzoate, 4-phenyl diphenyl ketone, 4,4-dichloro bis Phenyl ketone, hydroxydiphenyl ketone, 4-benzoin-4'-methyl-diphenyl sulfide, alkylated diphenyl ketone, 3,3', 4,4'-tetra (third Butyl peroxycarbonyl)diphenyl ketone, 4-benzylidene-N,N-dimethyl-indole-[2-(1-o-oxy-2-propenyloxy)ethyl]benzene bromide Methanaminium, (4-benzylidene), trimethyl saddle, hydrazine monohydrate, 2-hydroxy-3-(4-benzhydryl) Oxy-N,N,N-trimethyl-1-propylammonium chloride, 2-isopropyl-9-oxothene, 2,4-dimethyl-9-oxopurine Hawthorn, 2,4-diethyl-9-oxosulfonium, 2,4-dichloro-9-oxosulfonium, 2-hydroxy-3-(3,4-dimethyl-9 -Sideoxy-9H-thioxanthene-2-yl-oxy)-N,N,N-trimethyl-1-propylammonium chloride, 2,4,6-trimethylbenzamide Phenyl phenylphosphine oxide, 1,2-octanedione-1-[4-(phenylthio)-2-(0-benzamide)], 1-[9-ethyl-6-(2- Methylbenzylidene)-9H-indol-3-yl]-ethanone-1-(0-acetamidine), 2,2'-bis(o-chlorophenyl)-4,5,4' , 5'-tetraphenyl-1,2-diimidazole, 10-butyl-2-chloroacridone, 2-ethyl hydrazine, benzoin, 9, 10-phenanthrene - 201035241 醌, camphor , methylphenylglyoxylate, π 5 ·cyclopentadienyl-η6-isopropylphenyl-iron (1+)-hexafluorophosphate ο-), diphenylsulfate derivative, double (η5 -2,4-cyclopentadien-1-yl)-bis(2,6-difluoro-3-(1Η-pyrrol-1-yl)-phenyl)titanium, 4,4-bis(dimethylamine) Diphenyl ketone, 4,4 bis(diethylamino)diphenyl ketone ' 9 -oxopurine til哔, 2 - Methyl-9-oxosulfuryl-indole, 2-chloro-9-oxosulfuryl-indole, 4-benzylidene-4-methylphenyl ketone, dibenzyl ketone, fluorenone, 2,3-diethyl Oxyethyl benzene, 2,2-dimethoxy-2-phenyl-2-phenyl acetophenone, 2-carbyl-2-methylpropenylbenzene, p-tert-butyldichloroethane Toluene, benzyl methoxyethyl acetal, hydrazine, 2-tert-butyl fluorene, 2-amino hydrazine,/5-chloropurine, anthrone, benzoxanone, dibenzo Cycloheptanone, methylene fluorenone, 4-azidobenzylidene benzene, 2,6-bis(p-azidobenzylidene)cyclohexane, 2,6-bis(p-azidobenzylidene) )-4-methylcyclohexanone, 2-phenyl-1,2-butanedione-2-(o-methoxycarbonyl)anthracene, 1,3-diphenylpropanetrione-2-(o-B Oxycarbonyl) anthracene, naphthalenesulfonium chloride, quinoline sulfonium chloride, N-phenylphenylthioacridone, 4,4-azobisisobutyronitrile, benzothiazole disulfide, triphenylphosphine A combination of a photoreducible coloring material such as carbon tetrabromide, tribromophenyl maple, benzoyl peroxide, eosin or methylene blue, and a reducing agent such as ascorbic acid or triethanolamine. These may also contain two or more types. In the present invention, (the content of the photopolymerization initiator is preferably from 1 to 20 parts by weight based on 1 part by weight of the resin of the component (a). When 0.1 part by weight or more, it is sufficient by light irradiation. In addition, when the amount is less than 20 parts by weight, 'there is no excessive radical generation, and the light is not irradiated, and the alkali developability is improved. When two or more types of (e) components are contained, The total amount of these is preferably in the above range. (f) A compound containing two or more ethylenically unsaturated bonds, and 201035241 may be ethylene glycol dimethacrylate or ethylene glycol diacrylate. Diethylene glycol dimethacrylate, trimethylolpropane triacrylate, ethoxylated bisphenol A dimethacrylate, glycerol dimethacrylate, tri-propylene glycol dimethacrylate, D Diol dimethacrylate, glyceryl triacrylate, neopentyl alcohol triacrylate, neopentyl alcohol tetraacrylate, dipentaerythritol hexaacrylate, ethoxylated neopentyl alcohol tetraacrylate Ethoxylated iso-cyanuric acid triacrylate, etc. Acrylic monomer. These may also be ¢) containing two or more kinds. In the present invention, (f) the content of the compound containing two or more ethylenically unsaturated bonds is preferably 1 part by weight or more, and more preferably 5 parts by weight or more based on 1 part by weight of the resin of the component (a). Better. Further, it is preferably 100 parts by weight or less, more preferably 50 parts by weight or less. Further, when two or more kinds of the component (f) are contained, the total amount of these is preferably in the above range. Further, in order to adjust the solubility and the like, the resin of the component (a) may be contained in an amount of 1 to 50 parts by weight per 1 part by weight of the compound having only one ethylenically unsaturated 0 bond. Such a compound may, for example, be acrylic acid, methacrylic acid, methyl acrylate, methyl methacrylate, butyl acrylate, hydroxyethyl acrylate, hydroxyethyl methacrylate, dimethyl acrylamide, methacrylic acid Methylaminoethyl ester, propylene sulfhydryl porphyrin, 1-hydroxyethyl α-chloroacrylate, 2-hydroxyethyl methacrylate, 2-hydroxyethyl acrylate, 2-hydroxyethyl α-chloroacrylate, A 1-hydroxypropyl acrylate, 1-hydroxypropyl acrylate, hydroxypropyl α-chloroacrylate, 2-hydroxypropyl methacrylate, 2-hydroxypropyl acrylate, 2-hydroxypropyl α-chloroacrylate, 3-hydroxypropyl methacrylate, 3-hydroxypropyl acrylate, 〇:-chloroacrylic acid 3-hydroxypropyl-31 - 201035241 ester, 1-hydroxy-1-methyl methacrylate, 1-hydroxy acrylate 1-methylethyl ester, 1-hydroxy-indole-methyl ethyl chloroacrylate, 2-hydroxy-1-methylethyl methacrylate, 2-hydroxy-1-methylethyl acrylate, ct-chloroacrylic acid 2-hydroxy-1-methylethyl ester, 1-hydroxybutyl methacrylate, 1-hydroxybutyl acrylate, α-chloroacrylic acid 1-hydroxyl Butyl ester, 2-hydroxybutyl methacrylate, 2-hydroxybutyl acrylate, 2-hydroxybutyl acrylate, 3-hydroxybutyl methacrylate, 3-hydroxybutyl acrylate, chloroacrylic acid 3-0 Hydroxybutyl ester, 4-hydroxybutyl methacrylate, 4-hydroxybutyl acrylate, 4-hydroxybutyl α-chloroacrylate, 1-hydroxy-1-methylpropyl methacrylate, 1-hydroxy-1 acrylate -Methyl propyl ester, 1-hydroxy-1-methylpropyl chloroacrylate, 2-hydroxy-1-methylpropyl methacrylate, 2-hydroxy-1-methylpropyl acrylate, α-chloroacrylic acid 2 -hydroxy-1-methylpropyl ester, 1-hydroxy-2-methylpropyl methacrylate, 1-hydroxy-2-methylpropyl acrylate, hydroxy-2-methylpropyl α-chloroacrylate, 2-Hydroxy-2-methylpropyl methacrylate, 2-hydroxy-2-methylpropyl acrylate, 2-hydroxy-2-methylpropionate α-chloroacrylate, 2-hydroxy-1 methacrylate ,1-dimethylethyl ester, 2-hydroxy-1,1-dimethylethyl acrylate, 2-hydroxy-1,1-dimethylethyl α-chloroacrylate, 1,2-dimethacrylate Hydroxypropyl ester, 1,2-dihydroxypropyl acrylate, ct-chloroacrylic acid 1,2·2 Propyl propyl ester, 2,3-dihydroxypropyl methacrylate, 2,3-dihydroxypropyl acrylate, 2:3-dihydroxypropyl chloroacetate, 2,3-dihydroxy butyl methacrylate Ester, 2,3-dihydroxybutyl acrylate, 2,3-dihydroxybutyl α-chloroacrylate, p-hydroxystyrene, p-isopropenylphenol, phenylethyl methacrylate, phenylethyl acrylate, α- Phenylethyl chloroacrylate, hydrazine-hydroxymethyl propyl decylamine, hydrazine-hydroxymethyl methacrylamide, α-chloropropene-32- 201035241 acid, crotonic acid, 4-pentenoic acid, 5-hexene Acid, 6-heptenoic acid, 7-octenoic acid, 8-decanoic acid, 9-decanoic acid, 10-indole-carbon suspected acid, thirteen-acid diacid, ricinoleic acid, isocyanic acid 2-( Methyl propylene oxime) ethyl ester, isocyanate 2-(propylene methoxy) ethyl ester, isocyanate 2-(α-chloropropenyloxy) ethyl ester, and the like. These may also contain two or more types. The resin composition of the present invention may further contain (g) a thermal acid generator. (g) The thermal acid generator generates an acid by heating after development as described later, and in addition to 0, it can promote the crosslinking reaction of the resin of the component (a) and the thermal crosslinking agent of the component (c), and can also promote (a). The cyclization of the quinone ring and the carbazole ring of the resin of the component. Therefore, the chemical resistance of the cured film is improved, and the film reduction can be reduced. The acid produced by the (g) thermal acid generator is preferably a strong acid, for example, an alkylsulfonic acid such as p-toluenesulfonic acid or benzenesulfonic acid, an alkylsulfonic acid such as methanesulfonic acid, ethanesulfonic acid or butanesulfonic acid. Acid is preferred. In the present invention, the thermal acid generator is preferably an aliphatic sulfonic acid compound represented by the formula (4) or (5), and these may also contain two or more kinds.

上述通式(4)及(5)中,R3G〜R3 2係表示碳數爲1〜10的 院基或碳數爲7〜12之1價的芳香族基。烷基及芳香族基 亦可被取代,作爲取代基,可舉出烷基、羰基等。 -33- 201035241 通式(4)所述的化合物之具體例可舉出以下的化合物。In the above formulae (4) and (5), R3G to R3 2 represent a group having a carbon number of 1 to 10 or a monovalent aromatic group having a carbon number of 7 to 12. The alkyl group and the aromatic group may be substituted, and examples of the substituent include an alkyl group and a carbonyl group. -33-201035241 Specific examples of the compound of the formula (4) include the following compounds.

〇 通式(5)所述的化合物之具體例可舉出以下的化合物。Specific examples of the compound of the formula (5) include the following compounds.

從更促進交聯反應的觀點,(g)熱酸產生劑的含量係相 對於100重量份(a)成分的樹脂,以0.1重量份以上爲佳, 〇 · 3重量份以上爲較佳,以〇. 5重量份以上爲更佳。另一方 ^面,從硬化膜的電絕緣性之觀點,以2 0重量份以下爲佳, 以15重量份以下爲較佳,以1〇重量份以下爲更佳。又, 含有2種以上的(g)成分時’該等的總量以上述範圍爲佳。 在本發明的樹脂組成物,亦可含有(h)塡料。藉由含有 (h)塡料’將本發明的樹脂組成物使用作爲電路基板用的防 焊阻劑時,在藉由網版印刷進行塗布、乾燥的範圍,能夠 顯現流動減黏性(thixotrophy),具有將圖案保持在規定尺 寸之效果。而且,亦能夠期待抑制熱硬化的收縮之效果。 (h)塡料之中,作爲絕緣性塡料可舉出例如碳酸鈣、二 201035241 氧化矽、氧化鋁、氮化鋁、氧化鈦、二氧化矽氧化鈦複合 粒子等’以二氧化矽、氧化鈦、二氧化矽氧化鈦複合粒子 爲佳。導電性塡料可舉出例如金、銀、銅、鎳、鋁、碳等, 以銀爲佳。亦可依照用途而含有該等2種以上。(h)塡料 的含量係相對於1 0 0重量份(a)成分,以5〜5 0 0重量份的 範圍爲佳。(h)塡料的數量平均粒徑以1 〇微米以下爲佳, 以2微米以下爲更佳。又,從賦予觸變性、緩和應力的觀 0 點,以將不同數量平均粒徑的塡料混合2種以上而使用爲 佳。 又,藉由使用數量平均粒徑爲1 00奈米以下的粒子亦 即奈米粒子作爲(h)塡料,能夠在維持光的透射率之同時, 調整折射率等的物性。特別是藉由使用高折射率的奈米粒 子,能夠同時顯現高透射率及高折射率。藉由混合此種奈 米粒子,能夠適合使用作爲固態攝影元件的晶片上微透鏡 或各種顯示器、固態攝影元件用平坦化膜等的低溫硬化性 Ο 光學薄膜。作爲上述目的之適合的粒子,可舉出氧化錫-氧 化鋁複合粒子、氧化锆-氧化鋁複合粒子、氧化銷-氧化矽 複合粒子、氧化錫粒子、氧化锆-氧化錫複合粒子、氧化鈦 粒子、氧化錫-氧化欽複合粒子、氧化砂-氧化欽複合粒子、 氧化鉻-氧化鈦複合粒子、氧化锆粒子等。又’亦可使用其 他物質被覆粒子表面。上述粒子可以是粉末狀亦可以是糊 狀,從容易分散等而言,以糊狀爲較佳。從透射率的觀點’ 奈米粒子的數量平均粒徑以5 0奈米以下爲佳,以3 0奈米 以下爲更佳。 - 201035241 塡料的數量平均粒徑能夠藉由各種微粒計數器來測 定。又,奈米粒子的平均粒徑能夠藉由氣體吸附法或動態 光散射法、χ射線小角散射法、透射型電子顯微鏡直接測 定粒徑之方法等來測定。在該等測定法所得到的粒徑有體 積平均或質量平均等之情況,能夠將粒子形狀假設爲球形 而換算成爲數量平均分子量。 在本發明的樹脂組成物,亦能夠含有藉由加熱發色, 〇並在350奈米以上、700奈米以下顯示吸收極大之熱發色 性物化合物、或在3 5 0奈米以上、小於5 0 0奈米未顯示吸 收極大而在500奈米以上、750奈米以下顯示吸收極大之 有機顏料或染料。熱發色性化合物的發色溫度以120 °C以 上爲佳,以1 5 0 °c以上爲更佳。熱發色性化合物的發色溫 度越高時,在高溫條件下的耐熱性越優良’又’不會因長 時間照射紫外線-可見光線而退色,耐光性優良。 作爲熱發色性化合物,可舉出感熱色料、感壓色料或 〇具有三芳基甲烷骨架之含羥基化合物等。 本發明的樹脂組成物亦可含有黏附改良劑。作爲黏附 改良劑可舉出乙烯基三甲氧基矽烷、乙烯基三乙氧基矽 烷、環氧環己基乙基三甲氧基矽烷、3-環氧丙氧基丙基三 甲氧基矽烷、3-環氧丙氧基丙基三乙氧基矽烷、對苯乙烯 基三甲氧基矽烷、3 -胺丙基三甲氧基矽烷、3 -胺丙基三乙 氧基矽烷、N -苯基-3-胺丙基三甲氧基矽烷等的矽烷偶合 劑、鈦偶合劑、鋁偶合劑、芳香族胺化合物及含烷氧基的 矽化合物。該等亦可含有2種以上。藉由含有該等黏附改 -36-From the viewpoint of further promoting the crosslinking reaction, the content of the (g) thermal acid generator is preferably 0.1 parts by weight or more, more preferably 3% by weight or more, based on 100 parts by weight of the resin of the component (a). 〇. 5 parts by weight or more is more preferable. The other surface is preferably 20 parts by weight or less, more preferably 15 parts by weight or less, even more preferably 1 part by weight or less, from the viewpoint of electrical insulating properties of the cured film. Further, when two or more kinds of (g) components are contained, the total amount of these is preferably in the above range. The resin composition of the present invention may further contain (h) a dip. When the resin composition of the present invention is used as a solder resist for a circuit board, the range of coating and drying by screen printing can be exhibited, and visuotrophy can be exhibited. It has the effect of keeping the pattern at a predetermined size. Moreover, the effect of suppressing shrinkage of thermosetting can also be expected. (h) In the case of the insulating material, for example, calcium carbonate, two 201035241 cerium oxide, aluminum oxide, aluminum nitride, titanium oxide, cerium oxide titanium oxide composite particles, etc., are oxidized by cerium oxide. Titanium and cerium oxide titanium oxide composite particles are preferred. The conductive material may, for example, be gold, silver, copper, nickel, aluminum, carbon or the like, and silver is preferred. These two or more types may be contained according to the use. The content of the (h) dip is preferably in the range of 5 to 500 parts by weight based on 100 parts by weight of the component (a). (h) The number average particle diameter of the dip material is preferably 1 μm or less, more preferably 2 μm or less. In addition, it is preferable to mix two or more kinds of dips of different numbers and average particle diameters from the viewpoint of imparting thixotropy and stress relaxation. Further, by using particles having a number average particle diameter of 100 nm or less, that is, nanoparticles, as the (h) pigment, it is possible to adjust the physical properties such as the refractive index while maintaining the transmittance of light. In particular, by using nanoparticles having a high refractive index, high transmittance and high refractive index can be simultaneously exhibited. By mixing such nanoparticles, it is possible to suitably use a microlens on a wafer as a solid-state imaging element or a low-temperature curable Ο optical film such as a flattening film for a solid-state imaging element. Examples of suitable particles for the above-mentioned object include tin oxide-alumina composite particles, zirconia-alumina composite particles, oxidation pin-yttria composite particles, tin oxide particles, zirconia-tin oxide composite particles, and titanium oxide particles. , tin oxide-oxidized composite particles, oxidized sand-oxidized composite particles, chromium oxide-titanium oxide composite particles, zirconia particles, and the like. Also, other materials may be used to coat the surface of the particles. The particles may be in the form of a powder or a paste, and are preferably in the form of a paste from the viewpoint of easy dispersion or the like. From the viewpoint of transmittance, the number average particle diameter of the nanoparticles is preferably 50 nm or less, more preferably 30 nm or less. - 201035241 The number average particle size of the dip can be determined by various particle counters. Further, the average particle diameter of the nanoparticles can be measured by a gas adsorption method, a dynamic light scattering method, a X-ray small angle scattering method, or a method of directly measuring the particle diameter by a transmission electron microscope. When the particle diameters obtained by these measurement methods have a volume average or a mass average, etc., the particle shape can be assumed to be spherical and converted into a number average molecular weight. In the resin composition of the present invention, it is also possible to contain a thermochromic compound which exhibits a large absorption by heating by a coloring of 350 nm or more and 700 nm or less, or less than 350 nm or less. The 500 nm nanometer showed no absorption of an extremely large organic pigment or dye which was extremely absorbed above 500 nm and below 750 nm. The color development temperature of the thermochromic compound is preferably 120 ° C or more, more preferably 150 ° C or more. When the color development temperature of the thermochromic compound is higher, the heat resistance under high temperature conditions is more excellent, and the color resistance is not deteriorated by irradiation of ultraviolet light-visible light for a long period of time, and the light resistance is excellent. The thermochromic compound may, for example, be a thermosensitive colorant, a pressure sensitive colorant or a hydroxyl group-containing compound having a triarylmethane skeleton. The resin composition of the present invention may also contain an adhesion improver. Examples of the adhesion improver include vinyl trimethoxy decane, vinyl triethoxy decane, epoxy cyclohexylethyl trimethoxy decane, 3-glycidoxypropyl trimethoxy decane, and 3-ring. Oxypropoxypropyltriethoxydecane, p-styryltrimethoxydecane, 3-aminopropyltrimethoxydecane, 3-aminopropyltriethoxydecane, N-phenyl-3-amine A decane coupling agent such as propyltrimethoxydecane, a titanium coupling agent, an aluminum coupling agent, an aromatic amine compound, and an alkoxy group-containing hydrazine compound. These may also contain two or more types. By including these adhesions -36-

201035241 良劑,在將感光性樹脂膜顯像時等,能夠提高與 ITO、Si02、氮化矽等的基底基材之黏附性。又, 對洗淨等所使用的氧電漿、UV臭氧處理之耐性。 劑的含量係相對於1〇〇重量份(a)成分的樹脂,_! 重量份爲佳。 本發明的樹脂組成物亦可含有黏著改良劑。 改良劑可舉出含烷氧基矽烷的芳香族胺化合物、 胺化合物或未含芳香族的矽烷化合物等。該等功 種以上。藉由含有該等化合物,能夠提升硬化核 的黏著性。含烷氧基矽烷的芳香族胺化合物及芙 化合物的具體例如以下所示。此外,使芳香族遐 含烷氧基的矽化合物反應而得到的化合物亦可, 如芳香族胺化合物與具有環氧基、氯甲基等和辟 基之烷氧基矽烷化合物反應而得到之化合物等。 砂晶圓、 能夠提高 黏附改良 ‘ 0 . 1 〜1 0 作爲黏著 芳香族醯 可含有2 之與基材 香族醯胺 化合物與 可舉出例 基反應的201035241 A good agent can improve the adhesion to a base substrate such as ITO, SiO 2 or tantalum nitride when the photosensitive resin film is developed. Moreover, it is resistant to oxygen plasma and UV ozone treatment used for washing or the like. The content of the agent is preferably _! by weight based on 1 part by weight of the resin of the component (a). The resin composition of the present invention may also contain an adhesion improver. The modifier may, for example, be an alkoxydecane-containing aromatic amine compound, an amine compound or an aromatic-free decane compound. More than these skills. By containing these compounds, the adhesion of the hardened core can be improved. Specific examples of the alkoxydecane-containing aromatic amine compound and the fluorene compound are shown below. Further, a compound obtained by reacting an aromatic fluorene-containing alkoxy group oxime compound may be, for example, a compound obtained by reacting an aromatic amine compound with an alkoxy decane compound having an epoxy group, a chloromethyl group or the like. Wait. Sand wafers, which can improve the adhesion improvement ‘ 0 . 1 ~1 0 as the adhesive aromatic 醯 can contain 2 and the base quinone amide compound and can be exemplified

(j)CH3 H2N>li^1^^-〇CH3 h2N OCH3 <j>CH3 1-OCH3 〇CH3(j)CH3 H2N>li^1^^-〇CH3 h2N OCH3 <j>CH3 1-OCH3 〇CH3

0CH2CH3 ?CHs 乂 甲-〇CH2CH3 CH3CONH^^^i-〇CH3 OCH2CH3 OCH3 yCH2CH3 (pCH2CH0CH2CH3 ?CHs 乂 A-〇CH2CH3 CH3CONH^^^i-〇CH3 OCH2CH3 OCH3 yCH2CH3 (pCH2CH

Cj)CH2CH3 气 i—〇CH2CH3 HJ OCH2CH3Cj)CH2CH3 gas i—〇CH2CH3 HJ OCH2CH3

CH3CONH 9〇h3 i-〇CH3 OCH3 /=\ 丫_2^_ _3 丫 (j)CH3 Cj)CH3CH3CONH 9〇h3 i-〇CH3 OCH3 /=\ 丫_2^_ _3 丫 (j)CH3 Cj)CH3

CH3CONH ^rOCH2CH3 CH3CONH· OCH2CH3CH3CONH ^rOCH2CH3 CH3CONH· OCH2CH3

och2ch3 OCH3 OCH3 nh2 〇CH3 -s|-^γΝΗ000Η3 CH3CONH OCH3Och2ch3 OCH3 OCH3 nh2 〇CH3 -s|-^γΝΗ000Η3 CH3CONH OCH3

NHCOCH3 OCH3 0CH3 (j)CH3 〒CH3 T〇~sr~~fyi 〇ch3 〇ch3 ^5¾¾^NHCOCH3 OCH3 0CH3 (j)CH3 〒CH3 T〇~sr~~fyi 〇ch3 〇ch3 ^53⁄43⁄4^

9CH3 CH3CONHy^_Ii_〇. OCH3 CH3CONH9CH3 CH3CONHy^_Ii_〇. OCH3 CH3CONH

NHCOCH3 0CH3 〇CH3 -37- 201035241 作爲未含芳香族的矽烷化合物,可舉出乙烯基三甲氧 基矽烷、乙烯基三乙氧基矽烷、乙烯基三氯矽烷、乙烯基 參(Θ-甲氧基乙氧基)矽烷等的乙烯基矽烷化合物、3-甲基 丙烯醯氧基丙基三甲氧基矽烷、3 -丙烯醯氧基丙基三甲氧 基矽烷、對苯乙烯基三甲氧基矽烷、3 -甲基丙烯醯氧基丙 基甲基二甲氧基矽烷、3-甲基丙烯醯氧基丙基甲基二乙氧 基矽烷等含碳-碳不飽和鍵的矽烷化合物等。該等之中,以 0 乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷爲佳。 含烷氧基矽烷的芳香族胺化合物、芳香族醯胺化合物 或未含芳香族的矽烷化合物的總含量,相對於100重量份 U)成分的樹脂以0.01〜15重量份爲佳。 本發明的樹脂組成物亦可含有界面活性劑,能夠提升 與基板的沾滿性。 作爲界面活性劑,可舉出Fur〇rad(商品名、住友3M(股) 製)、MEGAFAC(商品名、DIC(股)製)、Sulfron(商品名、旭 硝子(股)製)等的氟系界面活性劑、KP3 41 (商品名、信越化 學工業(股)製)、DBE(商品名、CHISSO(股)製)、 POLYFLOW、GRANOL(商品名、共榮社化學(股)製)、 BYK(BYK-Chemie(股)製)等的丙烯酸聚合物界面活性劑等。 本發明的樹脂組成物以含有溶劑爲佳。作爲溶劑,可 舉出N-甲基-2-吡咯啶酮、r-丁內酯、N,N-二甲基甲醯胺、 N,N-二甲基乙醯胺、二甲基亞颯等的極性非質子性溶劑、 四氫呋喃、二噚烷、丙二醇一甲基醚、丙二醇一乙基醚等 的醚類、丙嗣、甲基乙基酮、二異丁基酮、二丙酮醇等的 -38- 201035241 酮類、乙酸乙酯、乙酸丁酯、乙酸異丁酯、乙酸丙酯、丙 二醇一甲基醚乙酸酯、丙酸3_甲基-3-甲氧基丁酯等的酯 類、乳酸乙酯、乳酸甲酯、二丙酮醇、3_甲基_3·甲氧基丁 醇等的醇類、甲苯、二甲苯等的芳香族烴類等。該等亦可 含有2種以上。溶劑的含量係相對於100重量份(a)成分的 樹脂以100〜2000重量份爲佳。 本發明的樹脂組成物係以硬化前的樹脂膜的透射率高 0 且硬化膜在可見光區域之透射率低爲佳。亦即’厚度爲3.0 微米的膜,其硬化前後在4 5 0奈米的透射率之變化量以20% 以上爲佳。在此,在450奈米的透射率係可見光區域的透 射率之指標。更具體地,從將樹脂組成物塗布在基板’並 以120 °C熱處理2分鐘所得到厚度3.0微米的膜(硬化前)在 波長450奈米之透射率,及將硬化前的膜’進而在氮氣流 下以23(TC熱處理30分鐘所得到厚度3.0微米的膜(硬化前) 在波長45 0奈米之透射率’依照下式所求取的透射率變化 ❹ 量以2 0 %以上爲佳。依照本發明’能夠容易地實現如此的 透射率變化量。 透射率變化量(%卜硬化前透射率(%)_硬化後透射率 (%) 將本發明的樹脂組成物使用作爲感光性樹脂時’硬化 前的樹脂膜的透射率以較高爲佳。具體上’硬化前的樹脂 膜在450奈米的透射率以70%以上爲佳,以90%以上爲更 佳。硬化膜在可見光區域的透射率以較低爲佳。具體上’ 硬化膜在450奈米的透射率以70%以下爲佳’以60%以下 201035241 爲更佳。藉由降低硬化膜的透射率,將本發明的樹脂組成 物使用於顯示裝置的平坦化膜或絕緣層時,能夠防止因光 線進入驅動用TFT所引起之誤動作或漏泄電流。因此,硬 化前後在4 5 0奈米的透射率之變化量以2 0 %以上、1 0 0 %以 下爲佳’以3 0 %以上、1 0 0 %以下爲更佳。 隨後,說明本發明的樹脂組成物之製造方法。例如, 能夠使前述(a)〜(c)成分及按照必要之(d)〜(h)成分、熱發 0 色成分、黏附改良劑、黏著改良劑或界面活性劑等溶解於 溶劑,來得到樹脂組成物。溶解方法可舉出攪拌或加熱。 加熱時,加熱溫度以設定在不損害樹脂組成物的性能的範 圍爲佳,通常爲室溫〜8 0 °C。又,各成分的溶解順序沒有 特別限定,例如從溶解性低的化合物依照順序使其溶解之 方法。又,對於界面活性劑或一部分的黏附改良劑等攪拌 溶解時容易產生氣泡之成分,藉由將其他成分溶解後於最 後添加,能夠防止因產生氣泡所引起其他成分的溶解不良。 〇 所得到的樹脂組成物,以使用過濾器過濾來除去塵埃 或粒子爲佳。過濾器孔徑係例如有0.5微米、0.2微米、0.1 微米、0.05微米等,但是未限定於該等。過濾器的材質有 聚丙烯(PP)、聚乙烯(PE)、耐綸(NY)、聚四氟乙烯(PTFE) 等’以聚乙烯或耐綸爲佳。在樹脂組成物中含有(h)塡料 時’以使用比該等的粒徑大的孔徑之過濾器爲佳。 隨後’說明使用本發明的樹脂組成物之硬化膜的製造 方法。將本發明的樹脂組成物使用旋轉塗布法、狹縫塗布 法、浸漬塗布法、噴霧塗布法、印刷法等塗布,來得到樹 -4U- 201035241 脂組成物。亦可在塗布之前,預先將塗布樹脂組 材,使用前述的黏附改良劑進行前處理。例如使 改良劑以〇·5〜20重量%使其溶解於異丙醇、乙酉 水、四氫呋喃、丙二醇一甲基醚乙酸酯、丙二醇一 乳酸乙酯、己二酸二乙酯等的溶劑而成之溶液, 材表面之方法。作爲基材表面的處理方法,可舉 布、狹縫塗布、棒塗布、浸漬塗布、噴霧塗布、 〇 等之方法。可按照必要,藉由施行減壓乾燥處理 °C〜30(TC的熱處理,能夠使基材與黏附改良劑進 藉由加熱處理所得到的樹脂組成物,能夠 膜。可舉出例如在230 °C加熱處理60分鐘之方法 〜400 °C加熱處理1分鐘〜10小時之方法;添加 等並在室溫〜100 °c左右的低溫加熱處理之方法 音波或電磁波處理,並在室溫〜10 0 °c左右的低溫 之方法等。 ^ 本發明的樹脂組成物係具有感光性時,藉由 脂組成物膜部分性地照射紫外線等的活性光線, 像液進行顯像處理,能夠得到負型或正型的浮凸 使本發明的樹脂組成物硬化而得到的硬化膜 使用作爲配線的絕緣膜或保護膜。可舉出例如 胺、陶瓷等的薄膜或基板上,使用銅、鋁等形成 刷基板的配線之絕緣膜或保護膜用途及用以將配 地焊錫焊接之保護膜用途。又,樹脂組成物含有 料時,亦能夠使用作爲配線材料。 成物之基 用將黏附 ί、甲醇、 甲基醚、 來處理基 出旋轉塗 蒸氣處理 ,隨後50 :行反應。 得到硬化 :;在 120 硬化觸媒 及藉由超 進行硬化 對前述樹 並使用顯 圖案。 ,係適合 在聚醯亞 配線之印 線部分性 導電性塡 -41 - 201035241 又,使本發明的樹脂組成物硬化而得到的硬化膜 夠適合作爲依照以下順序具有··形成有TFT的基板、 化膜、絕緣層及顯示元件之顯示裝置的平坦化膜或 層。作爲此種構成的顯示裝置,可舉出液晶顯示裝置 機EL顯示裝置等。主動矩陣型的顯示裝置係在玻璃等 板上具有TFT及配線,該配線係位於TFT的側方部且與 連接,並在其上面以覆蓋凹凸的方式具有平坦化膜, Q 在平坦化膜上設置有顯示元件。顯示元件與配線係透 平坦化膜所形成的接觸洞連接。第1圖係形成有平坦 及絕緣層之TFT基板之剖面圖。在基板6上,底部閘 或頂部閘極型的TFT 1係行列狀地設置,並以覆蓋該 的狀態形成絕緣膜3。又,在該絕緣膜3的下方,設 連接TFT1而成之配線2。而且在絕緣膜3上,設置: 洞7,其係將配線2開口;及平坦化膜4,其係以將該 入的狀態設置。在平坦化膜4,係以到達配線2的接觸 Ο 之方式設置有開口部。而且,透過該接觸洞7,以連 線2的狀態在平坦化膜4上形成ITO(透明電極)5。在 IT05係成爲顯示元件(例如有機EL元件)的電極。而 以覆蓋IT05的周邊之方式形成絕緣層8。該有機EL 可以是從基板6的相反側放出發光光線之頂部發射型 可以是從基板6側取出光線之底部發射型。如此進行 夠得到連接TFT 1而成之主動矩陣型的有機EL顯示裝 該TFT1係用以驅動各有機EL元件。 又,使本發明的樹脂組成物硬化而得到的硬化膜 ,能 平坦 絕緣 或有 的基 TFT 進而 過在 化膜 極型 TFT1 置有 接觸 等埋 3洞7 接配 此, 且’ 元件 ,亦 ,能 -· I-M4 ί置, ,係 -42- 201035241 適合使用作爲依照以下順序具有:形成有TFT的基板、絕 緣層及顯示元件之顯示裝置的平坦化膜或絕緣層。作爲此 種構成的顯示裝置,可舉出有機EL顯示裝置等。主動矩陣 型的顯示裝置係在玻璃等的基板上具有TFT及配線,該配 線係位於TFT的側方部且與TFT連接。顯示元件與配線係 透過在絕緣膜所形成的接觸洞連接。第2圖係形成有絕緣 層之TFT基板之剖面圖。在基板6上,底部閘極型或頂部 0 聞極型的TFT1係行列狀地設置,並以覆蓋該TFT1的狀態 形成絕緣膜3。又,在該絕緣膜3的下方,設置有連接TFT 1 而成之配線2。而且在絕緣膜3上,以將配線2開口的方 式設置有接觸洞7。而且,透過該接觸洞7,以連接配線2 的狀態形成ITO (透明電極)5。在此,IT05係成爲顯示元件 (例如有機EL元件)的電極。而且,以覆蓋IT05的周邊、 TFT及配線的段差之方式形成絕緣層8。該有機EL元件可 以是從基板6的相反側放出發光光線之頂部發射型,亦可 0 以是從基板6側取出光線之底部發射型。如此進行,能夠 得到連接TFT 1而成之主動矩陣型的有機EL顯示裝置,該 TFT1係用以驅動各有機EL元件。 例如,使用以非晶矽、微晶矽或In-Ga-Zn-0等爲代表 的氧化物半導體等所構成的TFT之有機EL顯示裝置時, 由於比較高能量的藍色發光光線進入,會有產生漏泄電流 或光有機電流等不良現象之情形。因爲由本發明的樹脂組 成物所得到的硬化膜在450奈米附近具有適當的吸收,藉 由在此種有機EL顯示裝置使用絕緣層或平坦化膜等,能夠 -43- 201035241 防止產生漏泄電流、光誘發電流等,來得到安定的驅動、 發光特性。 而且,使本發明的樹脂組成物硬化而得到的硬化膜, 能夠適合使用於LSI等半導體元件的表面保護膜、層間絕 緣膜、將元件封入封裝時之黏著劑或底部塡料、防止銅移 行之覆蓋劑、固態攝影元件的晶上微透鏡或各種顯示器、 固態攝影元件用平坦化膜等的用途。 0 實施例 以下,舉出實施例來說明本發明,但是本發明未限定 於該等例子。又,實施例中的樹脂組成物之評價係依照以 下方法進行。 (1)透射率的評價 在5英吋四方的玻璃基板上,將樹脂組成物(以下稱爲 清漆)旋轉塗布,並在120 °C熱處理2分鐘(預烘烤)’來製 造膜厚度爲3.0微米的預烘烤膜。又’將清漆以硬化後膜 〇 厚度爲3.0微米的方式旋轉塗布,並使用光洋Thermos System(股)製惰性烘箱INH-21 CD,在氮氣流下(氧濃度爲 20ppm以下)、23(TC進行熱處理30分鐘,來製造硬化膜。 又,預烘烤膜及硬化膜的膜厚度係使用SURFCOM 1 400D(東洋精機製作所(股)製)來測定。對如此進行而得到 的預烘烤膜及硬化膜,使用紫外線可見分光光度計 MultiSpec-1500(島津製作所(股)製)測定波長300奈米〜 7 00奈米的透射光譜,來測定波長450奈米的透射率。從 硬化前(==預烘烤膜)及硬化後卜硬化膜)的透射率,依照下述 -44 - 201035241 式來求取透射率變化量。 透射率變化量(%)=硬化前透射率(%)-硬化後透射率(%) 能夠將透射率變化量爲20%以上時判斷爲良好,30% 以上時爲極良好。 (2) 敏感度的評價 將實施例4〜11及比較例5〜6所製造的清漆,在6英 吋矽晶圓上旋轉塗布,隨後,使用熱板(Mark-7)熱處理3 0 分鐘,來製造厚度爲4.0微米的預烘烤膜。預烘烤溫度係 實施例4〜9及比較例5〜6爲120 °C,實施例10〜11爲100 °C。將所得到的預烘烤膜,使用i射線步進機(GCA製 DSW-8000),採用 0 〜5 0 0mJ/cm2 的曝光量並以 25mJ/cm2 步進曝光。曝光所使用的線與間隙係1、2、3、4、5、6、 7、 8、 9、 10、 20、 30、 50、 100 微米。實施例 10〜11 係 在曝光後,在100 °C加熱1分鐘。實施例4〜9係在曝光後、 實施例1 〇〜1 1係在曝光後加熱後’在2 · 3 8重量%的四甲銨 Ο (TMAH)水溶液(三菱GAS化學(股)製、ELM-D)顯像60秒, 隨後,使用純水沖洗,來得到顯像後的膜。正型的清漆時, 係將曝光部分在顯像完全溶出而消失之曝光量作爲敏感 度。負型的清漆時,係測定顯像後的膜之膜厚度,並將預 烘烤膜的膜厚度的90 %在顯像後殘留之曝光量作爲敏感 度。又,預烘烤後及顯像後的膜厚度係使用大日本SCREEN 製造(股)製Lamda Ace STM-602’並以折射率1.63測定。 (3) 耐藥品性的評價 (i)將實施例1〜3及比較例1〜4所製造的清漆,在6 -45 - 201035241 英吋矽晶圓上旋轉塗布,並使用熱板熱處_ 3分鐘’來製 造厚度爲4.0微米的預烘烤膜。又,實施例4〜11及比較 例5〜6所製造的清漆’係依照上述(2)所記載的方法製造 顯像後的膜。將所得到的預烘烤膜及顯像後的膜’使用光 洋Thermos System(股)製惰性烘箱INH-21CD’在氮氣流下 (氧濃度爲20ppm以下)、230 °C進行熱處理30分鐘’來製 造硬化膜。 0 將所得到的硬化膜在東京應化工業(股)製剝離液 1 0 6,於7 0 °C浸漬1 〇分鐘。 使用大日本SCREEN製造(股)製LambdaAceTM-602’ 並以折射率1 . 6 4測定剝離液處理前後的硬化膜的膜厚度並 求取膜減量。膜減量以〇 . 2 5微米以下爲佳’以0.1 5微米以 下爲較佳,以0 . 1 0微米以下爲更佳。 (Π)使用在實施例4〜11及比較例5〜6所製造的清 漆,並使用上述(i)所記載之方法製造硬化膜。將所得到的 〇 硬化膜於7〇°C在東京應化工業(股)製剝離液1〇6浸漬10分 鐘。使用20倍的光學顯微鏡觀察剝離液處理後的硬化膜, 來評價圖案有無剝落。將圖案未剝落之最小圖案作爲殘留 圖案。因爲越微細的圖案越容易剝落,殘留圖案爲20微米 以下時判定爲良好,5微米以下時爲非常良好。 合成例1含羥基的二胺化合物之合成 使18.3克(〇.〇5莫耳)2,2-雙(3-胺基-4-羥苯基)六氟丙 烷(CENTRAL硝子(股)製、BAHF)溶解於100毫升丙酮、17.4 克(0.3莫耳)環氧丙烷(東京化成(股)製),並冷卻至_15°C。 -46- 201035241 在此,滴入使20.4克(0.11莫耳)3 -硝基苯甲醯氯(東京化成 (股)製)溶解於100毫升丙酮而成的溶液。滴入結束後,在 -1 5 °C攪拌4小時,隨後,回復至室溫。過濾分開析出的白 色固體,並在50 °C真空乾燥。 將30克所得到的白色固體放入3 00毫升的不鏽鋼高壓 釜’使其分散於2 5 0毫升甲基賽路蘇,並添加2克的5%鈀 -碳(和光純藥工業(股)製)。在此使用氣球導入氫氣,在室 Q溫進行還原反應,約2小時後,確認氣球未繼續洩氣而使 反應結束。反應結束後,過濾而除去觸媒亦即鈀化合物, 並使用旋轉蒸發器濃縮,來得到下述式所示之含羥基的二 胺化合物。NHCOCH3 0CH3 〇CH3 -37- 201035241 Examples of the non-aromatic decane compound include vinyl trimethoxy decane, vinyl triethoxy decane, vinyl trichloro decane, and vinyl quinone (Θ-methoxy group). Vinyl decane compound such as ethoxy)decane, 3-methacryloxypropyltrimethoxydecane, 3-propenyloxypropyltrimethoxydecane, p-styryltrimethoxydecane, 3 a decane compound containing a carbon-carbon unsaturated bond such as methacryloxypropylmethyldimethoxydecane or 3-methylpropenyloxypropylmethyldiethoxydecane. Among these, 0 vinyl trimethoxy decane and vinyl triethoxy decane are preferred. The total content of the alkoxydecane-containing aromatic amine compound, the aromatic guanamine compound or the aromatic-free decane compound is preferably 0.01 to 15 parts by weight based on 100 parts by weight of the resin of the U) component. The resin composition of the present invention may contain a surfactant, and the adhesion to the substrate can be improved. Fluoride (product name, Sumitomo 3M Co., Ltd.), MEGAFAC (trade name, DIC), and Sulfron (trade name, Asahi Glass Co., Ltd.) are used as the surfactant. Surfactant, KP3 41 (trade name, Shin-Etsu Chemical Co., Ltd.), DBE (trade name, CHISSO (share) system), POLYFLOW, GRANOL (trade name, Kyoeisha Chemical Co., Ltd.), BYK ( An acrylic polymer surfactant such as BYK-Chemie Co., Ltd., or the like. The resin composition of the present invention preferably contains a solvent. Examples of the solvent include N-methyl-2-pyrrolidone, r-butyrolactone, N,N-dimethylformamide, N,N-dimethylacetamide, and dimethylammonium. Equivalent aprotic solvents, ethers such as tetrahydrofuran, dioxane, propylene glycol monomethyl ether, propylene glycol monoethyl ether, propionate, methyl ethyl ketone, diisobutyl ketone, diacetone alcohol, etc. -38- 201035241 Esters of ketones, ethyl acetate, butyl acetate, isobutyl acetate, propyl acetate, propylene glycol monomethyl ether acetate, 3-methyl-3-methoxybutyl propionate An alcohol such as ethyl lactate, methyl lactate, diacetone alcohol or 3-methyl-3-methylbutanol, or an aromatic hydrocarbon such as toluene or xylene. These may also contain two or more types. The content of the solvent is preferably 100 to 2000 parts by weight based on 100 parts by weight of the resin of the component (a). The resin composition of the present invention preferably has a high transmittance of the resin film before curing and a low transmittance of the cured film in the visible light region. That is, the film having a thickness of 3.0 μm preferably has a change in transmittance of 450 nm before and after hardening of 20% or more. Here, the transmittance at 450 nm is an index of the transmittance in the visible light region. More specifically, a film having a thickness of 3.0 μm (before hardening) at a wavelength of 450 nm, and a film before curing, are applied from a resin composition coated on a substrate 'and heat-treated at 120 ° C for 2 minutes. Under the nitrogen flow, the film having a thickness of 3.0 μm (before curing) obtained by heat treatment for 30 minutes at TC for 30 minutes at a wavelength of 45 0 nm has a transmittance change of 20% or more as determined by the following formula. According to the present invention, the amount of change in transmittance can be easily achieved. The amount of change in transmittance (% before transmittance after hardening (%) - transmittance after hardening (%) When the resin composition of the present invention is used as a photosensitive resin The transmittance of the resin film before hardening is preferably higher. Specifically, the transmittance of the resin film before hardening is preferably 70% or more at 450 nm, more preferably 90% or more. The cured film is in the visible light region. The transmittance is preferably lower. Specifically, the transmittance of the cured film at 450 nm is preferably 70% or less, and more preferably 60% or less, 201035241. By reducing the transmittance of the cured film, the present invention is Resin composition used in display device When the film or the insulating layer is planarized, it is possible to prevent malfunction or leakage current caused by light entering the driving TFT. Therefore, the amount of change in transmittance at 450 nm before and after hardening is 20% or more and 100%. In the following, it is more preferable that it is 30% or more and 100% or less. Next, a method of producing the resin composition of the present invention will be described. For example, the components (a) to (c) described above can be used as necessary ( d) The component (h), the heat-generating component, the adhesion improver, the adhesion improver, or the surfactant are dissolved in a solvent to obtain a resin composition. The dissolution method may be stirring or heating. The range is not particularly limited to the performance of the resin composition, and is usually room temperature to 80 ° C. Further, the order of dissolution of each component is not particularly limited, and for example, a method of dissolving a compound having low solubility in order is dissolved. Further, when a surfactant or a part of an adhesion improver is dissolved and dissolved, the component which is likely to generate bubbles is dissolved, and after the other component is dissolved and added at the end, it is possible to prevent other components caused by the generation of bubbles. The resin composition obtained by the ruthenium is preferably filtered by a filter to remove dust or particles. The filter pore size is, for example, 0.5 μm, 0.2 μm, 0.1 μm, 0.05 μm, or the like, but is not limited thereto. The filter is made of polypropylene (PP), polyethylene (PE), nylon (NY), polytetrafluoroethylene (PTFE), etc. It is preferably polyethylene or nylon. It is contained in the resin composition (h) In the case of the dip, it is preferable to use a filter having a pore diameter larger than the particle diameter. Hereinafter, a method for producing a cured film using the resin composition of the present invention will be described. The resin composition of the present invention is subjected to a spin coating method, Coating with a slit coating method, a dip coating method, a spray coating method, a printing method, or the like to obtain a tree-4U-201035241 lipid composition. It is also possible to pre-treat the coated resin composition in advance using the above-mentioned adhesion improver before coating. For example, the modifier is dissolved in a solvent such as isopropyl alcohol, ethylhydrazine water, tetrahydrofuran, propylene glycol monomethyl ether acetate, propylene glycol monoethyl lactate or diethyl adipate at a concentration of 5 to 20% by weight. The solution into the surface of the material. As a method of treating the surface of the substrate, a method such as slit coating, bar coating, dip coating, spray coating, or ruthenium may be mentioned. The film can be obtained by subjecting the substrate and the adhesion improver to a resin composition obtained by heat treatment by subjecting the base material and the adhesion improver to heat treatment by a heat treatment under reduced pressure, if necessary, for example, at 230 °. C heat treatment for 60 minutes method ~400 °C heat treatment 1 minute ~ 10 hours method; add and soak at room temperature ~100 °c low temperature heat treatment method sound wave or electromagnetic wave treatment, and at room temperature ~ 10 0 When the resin composition of the present invention has photosensitivity, the lipid film is partially irradiated with active light such as ultraviolet rays, and the image liquid is subjected to development processing to obtain a negative type or The positive type embossing uses the insulating film obtained by curing the resin composition of the present invention as an insulating film or a protective film for wiring. For example, a film or a substrate such as an amine or a ceramic is used, and a brush substrate is formed using copper, aluminum or the like. The use of the insulating film or the protective film for the wiring and the protective film for soldering the ground solder. When the resin composition contains the material, it can also be used as the wiring material. ί, methanol, methyl ether, to treat the base by spin-coating steam treatment, followed by 50: row reaction. Hardening:; hardening the catalyst in 120 and hardening the tree by super hardening and using a pattern. In the case of the printed circuit of the present invention, the cured film obtained by curing the resin composition of the present invention is suitable as a substrate, a film, and an insulation having TFTs formed in the following order. The planarization film or layer of the display device of the layer and the display device. The display device having such a configuration includes a liquid crystal display device EL display device, etc. The active matrix display device has TFT and wiring on a glass or the like. The wiring is located on the side of the TFT and is connected to the upper surface of the TFT so as to cover the unevenness, and has a flattening film. Q is provided on the planarizing film with a display element. The display element and the wiring system are formed by a flattening film. The contact hole is connected. Fig. 1 is a cross-sectional view of a TFT substrate on which a flat and insulating layer is formed. On the substrate 6, the bottom gate or the top gate type TFT 1 is arranged in a row. The insulating film 3 is formed to cover the state. Further, under the insulating film 3, a wiring 2 in which the TFT 1 is connected is provided. Further, on the insulating film 3, a hole 7 is provided which opens the wiring 2; And the planarizing film 4 is provided in a state in which it is placed in. The planarizing film 4 is provided with an opening so as to reach the contact 配线 of the wiring 2. Further, the contact hole 7 is passed through the connection hole 2 In the state, an ITO (transparent electrode) 5 is formed on the planarizing film 4. The IT 05 is an electrode of a display element (for example, an organic EL element), and the insulating layer 8 is formed so as to cover the periphery of the IT 05. The organic EL may be a substrate. The top emission type in which the illuminating light is emitted from the opposite side of 6 may be a bottom emission type in which light is taken out from the side of the substrate 6. In this way, an active matrix type organic EL display device in which the TFT 1 is connected is obtained. The TFT 1 is used to drive each organic EL element. Further, the cured film obtained by curing the resin composition of the present invention can be flat-insulated or partially formed by the TFTs of the TFT-type TFT1, and is placed in contact with the buried TFT 3, and the components are also bonded. Energy--I-M4 ί, , -42- 201035241 It is suitable to use a planarizing film or an insulating layer which has a display device in which a TFT substrate, an insulating layer, and a display element are formed in the following order. An organic EL display device or the like is exemplified as the display device having such a configuration. The active matrix display device has a TFT and a wiring on a substrate such as glass, and the wiring is located at a side portion of the TFT and is connected to the TFT. The display element and the wiring system are connected through a contact hole formed in the insulating film. Fig. 2 is a cross-sectional view showing a TFT substrate on which an insulating layer is formed. On the substrate 6, the bottom gate type or the top 0 type TFT 1 is arranged in a matrix, and the insulating film 3 is formed in a state of covering the TFT 1. Further, under the insulating film 3, a wiring 2 in which the TFT 1 is connected is provided. Further, on the insulating film 3, a contact hole 7 is provided in such a manner that the wiring 2 is opened. Further, ITO (transparent electrode) 5 is formed through the contact hole 7 in a state in which the wiring 2 is connected. Here, IT05 is an electrode of a display element (for example, an organic EL element). Further, the insulating layer 8 is formed so as to cover the periphery of the IT05, the step of the TFT, and the wiring. The organic EL element may be a top emission type in which light emitted from the opposite side of the substrate 6 is emitted, or 0 may be a bottom emission type in which light is taken out from the side of the substrate 6. In this way, an active matrix type organic EL display device in which the TFTs 1 are connected to each of the organic EL elements can be obtained. For example, when an organic EL display device using a TFT composed of an oxide semiconductor such as amorphous germanium, microcrystalline germanium or In-Ga-Zn-0 or the like is used, since a relatively high-energy blue light ray enters, There are cases where a leakage current or a photo organic current is generated. Since the cured film obtained from the resin composition of the present invention has an appropriate absorption in the vicinity of 450 nm, by using an insulating layer or a planarizing film or the like in such an organic EL display device, it is possible to prevent a leakage current from occurring at -43 to 201035241, The light induces a current or the like to obtain stable driving and luminescent characteristics. In addition, the cured film obtained by curing the resin composition of the present invention can be suitably used for a surface protective film of a semiconductor element such as an LSI, an interlayer insulating film, an adhesive or a bottom coating for sealing an element in a package, and preventing copper from moving. A coating agent, an on-crystal microlens of a solid-state imaging element, or a display for a flattening film for a solid-state imaging element. EXAMPLES Hereinafter, the present invention will be described by way of examples, but the invention is not limited to the examples. Further, the evaluation of the resin composition in the examples was carried out in the following manner. (1) Evaluation of Transmittance A resin composition (hereinafter referred to as varnish) was spin-coated on a glass substrate of 5 inches square, and heat-treated at 120 ° C for 2 minutes (prebaking) to produce a film thickness of 3.0. Micron pre-baked film. Further, 'the varnish was spin-coated with a film thickness of 3.0 μm after hardening, and an inert oven INH-21 CD manufactured by Koyo Thermos System was used, and heat treatment was performed under a nitrogen stream (oxygen concentration of 20 ppm or less) and 23 (TC). The film thickness of the pre-baked film and the cured film was measured using SURFCOM 1 400D (manufactured by Toyo Seiki Seisakusho Co., Ltd.) for 30 minutes. The prebaked film and cured film obtained in this manner were obtained. The transmission spectrum of a wavelength of 300 nm to 700 nm was measured using an ultraviolet-visible spectrophotometer MultiSpec-1500 (manufactured by Shimadzu Corporation) to measure the transmittance at a wavelength of 450 nm. The transmittance of the baked film and the hardened film after curing is determined by the following formula -44 - 201035241. Transmittance change amount (%) = transmittance before curing (%) - transmittance after curing (%) When the amount of change in transmittance is 20% or more, it is judged to be good, and when it is 30% or more, it is extremely good. (2) Evaluation of Sensitivity The varnishes produced in Examples 4 to 11 and Comparative Examples 5 to 6 were spin-coated on a 6-inch wafer, and then heat-treated with a hot plate (Mark-7) for 30 minutes. A prebaked film having a thickness of 4.0 μm was produced. Prebaking temperature Examples Examples 4 to 9 and Comparative Examples 5 to 6 were 120 °C, and Examples 10 to 11 were 100 °C. The obtained prebaked film was subjected to stepwise exposure at 25 mJ/cm 2 using an i-ray stepper (DSW-8000 manufactured by GCA) using an exposure amount of 0 to 500 mJ/cm 2 . The lines and gaps used for exposure are 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 20, 30, 50, 100 microns. Examples 10 to 11 After the exposure, the mixture was heated at 100 ° C for 1 minute. Examples 4 to 9 are after exposure, and Example 1 〇 〜1 1 is heated after exposure to '2 3.8 % by weight of tetramethylammonium ruthenium (TMAH) aqueous solution (Mitsubishi GAS Chemical Co., Ltd., ELM) -D) Development for 60 seconds, followed by rinsing with pure water to obtain a developed film. In the case of a positive varnish, the exposure amount at which the exposed portion is completely dissolved and disappeared is taken as the sensitivity. In the case of a negative varnish, the film thickness of the film after development is measured, and the exposure amount remaining after 90% of the film thickness of the prebaking film is taken as the sensitivity. Further, the film thickness after prebaking and after development was measured using a Lamada Ace STM-602' manufactured by Nippon SCREEN Co., Ltd. and having a refractive index of 1.63. (3) Evaluation of chemical resistance (i) The varnishes produced in Examples 1 to 3 and Comparative Examples 1 to 4 were spin-coated on a 6-45 - 201035241 inch wafer, and hot plate heat was used. A pre-baked film having a thickness of 4.0 μm was produced in 3 minutes. Further, the varnishes produced in Examples 4 to 11 and Comparative Examples 5 to 6 were produced by developing the film in accordance with the method described in the above (2). The obtained prebaked film and the developed film 'manufactured by using a Kosher Thermos System inert oven INH-21CD' under a nitrogen stream (oxygen concentration: 20 ppm or less) and heat treatment at 230 ° C for 30 minutes were used. Hardened film. 0 The obtained cured film was immersed at 70 ° C for 1 〇 in a stripping solution of Tokyo Chemical Industry Co., Ltd. at 0 0 °C. Lambda AceTM-602' manufactured by Nippon SCREEN Co., Ltd. was used, and the film thickness of the cured film before and after the peeling liquid treatment was measured with a refractive index of 1.64 to obtain a film reduction. The film reduction is preferably 0.25 μm or less, preferably 0.15 μm or less, and more preferably 0.1 μm or less. (Π) Using the varnishes produced in Examples 4 to 11 and Comparative Examples 5 to 6, a cured film was produced by the method described in the above (i). The obtained ruthenium hardened film was immersed at 1 〇 6 in Tokyo Toka Chemical Industry Co., Ltd. at 7 ° C for 10 minutes. The cured film after the peeling liquid treatment was observed using a 20-fold optical microscope to evaluate whether or not the pattern was peeled off. The smallest pattern in which the pattern is not peeled off is taken as a residual pattern. The finer the pattern is, the more easily it peels off. When the residual pattern is 20 μm or less, it is judged to be good, and when it is 5 μm or less, it is very good. Synthesis Example 1 Synthesis of a hydroxyl group-containing diamine compound 18.3 g of (2,2-bis(3-amino-4-hydroxyphenyl)hexafluoropropane (central) BAHF) was dissolved in 100 ml of acetone, 17.4 g (0.3 mol) of propylene oxide (manufactured by Tokyo Chemical Co., Ltd.), and cooled to -15 °C. -46-201035241 Here, a solution obtained by dissolving 20.4 g (0.11 mol) of 3-nitrobenzimid chloride (manufactured by Tokyo Chemicals Co., Ltd.) in 100 ml of acetone was added dropwise. After the completion of the dropwise addition, the mixture was stirred at -1 5 ° C for 4 hours, and then returned to room temperature. The precipitated white solid was separated by filtration and dried under vacuum at 50 °C. 30 g of the obtained white solid was placed in a 300 ml stainless steel autoclave to disperse it in 250 ml of methyl sarcolo and 2 g of 5% palladium-carbon (Wako Pure Chemical Industries Co., Ltd.) system). Here, hydrogen gas was introduced using a balloon, and a reduction reaction was carried out at room temperature. After about 2 hours, it was confirmed that the balloon did not continue to deflate and the reaction was completed. After completion of the reaction, the palladium compound, which is a catalyst, was removed by filtration, and concentrated using a rotary evaporator to obtain a hydroxyl group-containing diamine compound represented by the following formula.

❾ 合成例2 醌二疊氮化合物的合成 乾燥氮氣流下,使21.22克(0.05莫耳)TrisP-PA(商品 名、本州化學工業(股)製)及26.8克(0.1莫耳)5-萘醌二疊 氮磺醯氯(東洋合成(股)製、NAC-5),溶解於450克1,4-二 噚烷並使其爲室溫。在此,將與50克1,4-二噚烷混合而成 之1 2.6 5克三乙胺,以系統內不會3 5 °C以上的方式滴入。 滴入後於4 0 °C攪拌2小時。將三乙胺鹽過濾,並將濾液投 入水中。隨後,過濾並集中析出的沈澱,進而使用1升1% -47 - 201035241 鹽酸水洗淨。隨後,進而使用2升水洗淨2次。使用真空 乾燥機將該沈澱乾燥,來得到下述式所示之含羥基的二胺 化合物。❾ Synthesis Example 2 Synthesis of quinonediazide compound Under dry nitrogen flow, 21.22 g (0.05 mol) of TrisP-PA (trade name, manufactured by Honshu Chemical Industry Co., Ltd.) and 26.8 g (0.1 mol) of 5-naphthoquinone were obtained. Bismuth sulfonium chloride (manufactured by Toyo Kogyo Co., Ltd., NAC-5) was dissolved in 450 g of 1,4-dioxane and allowed to stand at room temperature. Here, 1 2.6 5 g of triethylamine mixed with 50 g of 1,4-dioxane was dropped in such a manner that it did not exceed 35 ° C in the system. After the dropwise addition, the mixture was stirred at 40 ° C for 2 hours. The triethylamine salt was filtered and the filtrate was poured into water. Subsequently, the precipitate which was precipitated was collected and concentrated, and further washed with 1 liter of 1% -47 - 201035241 hydrochloric acid water. Subsequently, it was further washed twice with 2 liters of water. The precipitate was dried using a vacuum dryer to obtain a hydroxyl group-containing diamine compound represented by the following formula.

合成例3 含院氧基甲基的化合物(A-1)之合成 (1) 使103.2克(0.4莫耳)1,1,1_參(4-羥苯基)乙烷(本州 化學工業(股)製、TrisP-HAP)溶解於使80克(2.0莫耳)氫氧 化鈉溶解於8 00克純水而成之溶液。完全溶解後,在20〜 2 5 °C以2小時將6 8 6克3 6〜3 8重量%的福馬林水溶液滴 入。隨後,在2 0〜2 5 °C攪拌1 7小時。在此,添加9 8克硫 Ο 酸及5 5 2克水來進行中和,並在該狀態放置2天。過濾集 中放置後在溶液所產生的針狀白色結晶,並以100毫升水 洗淨。在50 °c將該白色結晶真空乾燥48小時。藉由島津 製作所(股)製的高速液體層析儀,並使用ODS作爲柱、乙 腈/水=7 0/3 0作爲展開溶劑,並以254奈米分析乾燥後的白 色結晶時,得知起始原料係完全消失,純度爲9 2 %。而且, 使用DMSO-d6作爲重溶劑,並藉由NMR(日本電子(股)製、 GX-270)分析時,得知係六羥甲基化之TrisP-HAP。 (2) 隨後,使如此進行所得到的化合物溶解於300毫升 -48- 201035241 甲醇,並添加2克硫且在室溫攪拌24小時。在該溶液添加 15克陰離子型離子交換樹脂(Rohm and Hass公司製、 AMBER LY ST IRA96SB)並攪拌1小時,且藉由過濾來除去 離子交換樹脂。隨後,添加500毫升乳酸乙酯’並藉由旋 轉蒸發器除去甲醇而成爲乳酸乙酯溶液。將該溶液放置在 室溫2天時,產生白色結晶。將所得到的白色結晶依照高 速液體層析法分析時,得知係下述式所示之純度爲99%的 0 TrisP-HAP的六甲氧基甲基化合物(含烷氧基甲基的化合物 (A-1))。Synthesis Example 3 Synthesis of Compound (A-1) Containing Oxyl Methyl Group (1) 103.2 g (0.4 mol) of 1,1,1-g (4-hydroxyphenyl)ethane (Honori Chemical Industry ( The product, TrisP-HAP) was dissolved in a solution obtained by dissolving 80 g (2.0 mol) of sodium hydroxide in 800 g of pure water. After complete dissolution, 686 g of 3 6 to 38 wt% aqueous solution of formalin was added dropwise at 20 to 25 ° C for 2 hours. Subsequently, it was stirred at 20 to 2 5 ° C for 1 hour. Here, 98 g of sulfuric acid and 552 g of water were added for neutralization, and left in this state for 2 days. The needle-like white crystals produced in the solution after being placed in the filtration set were washed with 100 ml of water. The white crystals were dried under vacuum at 50 ° C for 48 hours. The high-speed liquid chromatograph manufactured by Shimadzu Corporation was used, and ODS was used as a column, acetonitrile/water = 70/30 as a developing solvent, and the dried white crystal was analyzed at 254 nm. The starting material system completely disappeared and the purity was 92%. Further, when DMSO-d6 was used as a heavy solvent and analyzed by NMR (manufactured by JEOL Ltd., GX-270), hexamethylolated TrisP-HAP was known. (2) Subsequently, the thus obtained compound was dissolved in 300 ml of -48-201035241 methanol, and 2 g of sulfur was added and stirred at room temperature for 24 hours. To the solution, 15 g of an anionic ion exchange resin (manufactured by Rohm and Hass, AMBER LY ST IRA96SB) was added and stirred for 1 hour, and the ion exchange resin was removed by filtration. Subsequently, 500 ml of ethyl lactate was added and the methanol was removed by a rotary evaporator to become an ethyl lactate solution. When the solution was allowed to stand at room temperature for 2 days, white crystals were produced. When the obtained white crystal was analyzed by high-speed liquid chromatography, it was found that a hexamethoxymethyl compound (an alkoxymethyl group-containing compound) of 0 TrisP-HAP having a purity of 99% represented by the following formula was obtained. A-1)).

合成例4 含烷氧基甲基的化合物(A-2)之合成 (1)除了使用169.6克(0.4莫耳)4,4’-[1-[4-[1-(4-羥苯 基-1)-1-甲基乙基]苯基]亞乙基]雙酚(本州化學工業(股) 製、TrisP-PA)代替103.2克(0.4莫耳羥苯基) 乙院(本州^[匕學工業(股)製、T r i s P - H A P)以外,與合成例3 (i) 同樣地進行來得到白色結晶。將其與合成例3 (丨)同樣地使 用高速液體層析儀分析時,得知起始原料係完全消失,純 度爲8 8 %。而且,與合成例3 (1)同樣地進行並N M r分析時, -49- 201035241 得知係六羥甲基化之TrisP-PA。 (2)隨後,除了使用上述方法所得到的六羥甲基化之 TrisP-PA代替六羥甲基化之TrisP-HAP以外,與合成例3(2) 同樣地進行來得到白色結晶。將所得到的白色結晶依照高 速液體層析法分析時,得知係下述式所示之純度爲99%的 TrisP-PA的六甲氧基甲基化合物(含烷氧基甲基的化合物 (A-2))。Synthesis Example 4 Synthesis of alkoxymethyl group-containing compound (A-2) (1) In addition to using 169.6 g (0.4 mol) of 4,4'-[1-[4-[1-(4-hydroxyphenyl) -1)-1-methylethyl]phenyl]ethylidene]bisphenol (Chenzhou Chemical Industry Co., Ltd., TrisP-PA) instead of 103.2 g (0.4 moles of hydroxyphenyl) The white crystals were obtained in the same manner as in Synthesis Example 3 (i) except for the production of the product (Trisp-HAP). When this was analyzed by a high-speed liquid chromatograph in the same manner as in Synthesis Example 3 (丨), it was found that the starting material was completely disappeared, and the purity was 8 8 %. Further, when N M r analysis was carried out in the same manner as in Synthesis Example 3 (1), hexamethylolated TrisP-PA was known from -49 to 201035241. (2) Subsequently, white crystals were obtained in the same manner as in Synthesis Example 3 (2) except that the hexamethylolated TrisP-PA obtained by the above method was used instead of the hexamethylated TrisP-HAP. When the obtained white crystal was analyzed by high-speed liquid chromatography, it was found that a hexamethoxymethyl compound (alkoxymethyl group-containing compound (A) having a purity of 99% of TrisP-PA represented by the following formula was obtained. -2)).

合成例5 含烷氧基甲基的化合物(A-3)之合成 (1) 與合成例3 ( 1)同樣地進行,得到純度爲9 2 %的六羥 甲基化之TrisP-HAP。 (2) 隨後,除了使用300毫升乙醇代替300毫升甲醇以 外,與合成例3 (2)同樣地進行,來得到白色結晶。將所得 到的白色結晶依照高速液體層析法分析時,得知係下述式 所示之純度爲98 %的TrisP-HAP的乙氧基甲基化合物(含烷 氧基甲基的化合物(A-3))。 201035241Synthesis Example 5 Synthesis of alkoxymethyl group-containing compound (A-3) (1) In the same manner as in Synthesis Example 3 (1), hexamethylmethylated TrisP-HAP having a purity of 92% was obtained. (2) Subsequently, white crystals were obtained in the same manner as in Synthesis Example 3 (2) except that 300 ml of ethanol was used instead of 300 ml of methanol. When the obtained white crystal was analyzed by high-speed liquid chromatography, an ethoxymethyl compound (alkoxymethyl group-containing compound (A) having a purity of 98% of TrisP-HAP represented by the following formula was obtained. -3)). 201035241

合成例6 黏著改良劑(B - 1 )之合成 使36.6克(0_1莫耳)BAHF(CENTRAL硝子(股)製)溶解 於100克的乳酸乙酯(武藏野化學工業(股)製、EL)。隨後, 在該溶液添加55.6克(0.2莫耳)3 -環氧丙氧基丙基丙基三 乙氧基矽烷(KBE-4 03、信越化學:3:業(股)製),且在50°C攪 拌6小時,來得到黏著改良劑(B-1) ^ 在實施例、比較例所使用之其他熱交聯劑及酸產生劑 係如以下。Synthesis Example 6 Synthesis of Adhesion Modifier (B-1) 36.6 g (0_1 mol) of BAHF (manufactured by CENTRAL Co., Ltd.) was dissolved in 100 g of ethyl lactate (made by Musashino Chemical Industry Co., Ltd., EL) . Subsequently, 55.6 g (0.2 mol) of 3-glycidoxypropylpropyltriethoxydecane (KBE-4 03, Shin-Etsu Chemical: 3: manufactured by Kokusai Co., Ltd.) was added to the solution, and at 50 The mixture was stirred at ° C for 6 hours to obtain an adhesion improving agent (B-1). The other thermal crosslinking agents and acid generating agents used in the examples and comparative examples are as follows.

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甲基·第 .MX-270Methyl · MX-270

0 實施例1 乾燥氮氣流下,使32.9克(0.09莫耳)BAHF溶解於500 克 N -甲基吡咯啶酮(NMP)。在此,將 31.0克(0_1莫 耳)3,3’,4,4’-二苯基醚四羧酸二酐(MANAC(股)製、〇DPA) 與50克NMP同時添加,並在30 °C攪拌2小時。隨後,添 加2.18克(0.02莫耳)3-胺基苯酣(東京化成(股)製)且在4〇 °C攪拌2小時。而且,將5克吡啶(東京化成(股)製)稀釋於 甲苯(東京化成(股)製)並添加至溶液,安裝冷卻管並邊使水 與甲苯一同共沸而往系統外除去,邊使溶液的溫度爲12〇 -52- 201035241 °C並維持2小時,進而在1 8 0 °C使其反應2小時。使該溶 液的溫度降低至室溫,並將溶液投入3升水,來得到白色 的粉體。過濾收集該粉體,進而以水進行3次洗淨。洗淨 後,使用5(TC的真空乾燥機使白色粉體乾燥72小時,來 得到聚醯亞胺。 在10克該聚醯亞胺,添加4克1,5-二羥基萘(東京化 成(股)製)、5克合成例3所得到之含甲氧基甲基的化合物 0 (A-1)及40克r -丁內酯(三菱化學(股)製、GBL)而得到聚醯 亞胺樹脂組成物的清漆。使用該清漆所得到之硬化前後的 膜在4 5 0奈米之透射率,係硬化前爲9 5 %,硬化後爲6 1 %。 因此,透射率變化量爲34%。又,評價硬化膜的耐藥品性 時,膜減量爲〇·1〇微米以下,乃是非常良好的。 比較例1 除了添加5克2,6-二甲氧基甲基-第三丁基苯酚(本州 化學工業(股)製)代替在合成例3所得到之含甲氧基甲基的 〇 化合物(A-1)以外,與實施例1同樣地進行而得到聚醯亞胺 樹脂組成物的清漆。使用該清漆所得到之硬化前後的膜在 450奈米之透射率,係硬化前爲96%,硬化後爲85%。因此’ 透射率變化量爲1 1 %。又,評價硬化膜的耐藥品性時,膜 係完全溶解。 比較例2 在500毫升的燒瓶,添加5克2,2’-偶氮雙(異丁腈)、 200克四氫呋喃(TFT)。隨後,添加35克甲基丙烯酸甲酯 (MM)、30克甲基丙烯酸第三丁酯(t-BM)及35克甲基丙烯 -- 201035241 酸(ΜΑ),在室溫暫時攪拌並將燒瓶內氮取代後,在室溫攪 拌40小時。在此,追加3 00克丙二醇一甲基醚並攪拌。攪 拌結束後,將溶液投入2升水,過濾收集聚合物固體的沈 澱。進而以2升水進行3次洗淨,將所收集的聚合物固體, 使用5 0 °C的真空乾燥機乾燥72小時,來得到丙烯酸樹脂。 在所得到的1〇克丙烯酸樹脂,添加4克1,5-二羥基萘 (東京化成(股)製)、5克合成例3所得到之含烷氧基甲基的 ◎ 化合物(A-1)及40克丙二醇一甲基醚乙酸酯(KURARAY(股) 製、PMA)而得到丙烯酸樹脂組成物的清漆。使用該清漆所 得到之硬化前後的膜在4 5 0奈米之透射率,係硬化前爲 97%,硬化後爲93%。因此,透射率變化量爲4%。又,評 價硬化膜的耐藥品性時,膜係完全溶解。 實施例2 乾燥氮氣流下,將57.4克(0.095莫耳)在合成例1所得 到之含羥基的二胺、1.24克(0.005莫耳)1,3-雙(3-胺丙基) ϋ 四甲基二曙烷(SiDA)溶解於200克ΝΜΡ。在此,添加3 1.0 克(0.1莫耳)〇DPA,並在40°C攪拌2小時。隨後,將使用 5克NMP稀釋7.14克(0.06莫耳)二甲基甲醯胺二甲基縮醛 (三菱RAYON(股)製、DFA)而成的溶液,以1〇分鐘滴入。 滴入後,在40 °C繼續攪拌2小時。攪拌結束後,將溶液投 入2升水,過濾收集聚合物固體的沈澱。進而以2升水進 行3次洗淨,將所收集的聚合物固體,使用5 (TC的真空乾 燥機乾燥7 2小時,來得到聚醯胺酸。 計量10克如此進行所得到的聚醯胺酸、2克1,6-二羥 -54- 201035241 基萘(東京化成(股)製)、4克MW-30HM(三和CHEMICAL(股) 製)並使其溶解於20克EL、20克GBL而得到聚醯亞胺前 驅物組成物的清漆。使用該清漆所得到之硬化前後的膜在 45 0奈米之透射率,係硬化前爲94%,硬化後爲40%。因此, 透射率變化量爲54%。硬化前後的透射光譜係如第3圖所 示。得知因硬化而使在400奈米〜550奈米的透射率降低, 在可見光區域明確地著色。又,評價硬化膜的耐藥品性時, 0膜減量爲〇.1〇微米以下,乃是非常良好的。 實施例3 除了添加1 〇克在實施例1所得到的聚醯亞胺粉體代替 聚醯胺酸以外,與實施例2同樣地進行而得到聚醯亞胺樹 脂組成物的清漆。進行評價時,硬化前後的膜在450奈米 之透射率,係硬化前爲95%,硬化後爲45%。因此,透射 率變化量爲50%。又,評價硬化膜的耐藥品性時,膜減量 爲0.1微米以下,乃是非常良好的。 〇比較例3 除了使用10克酚醛清漆樹脂PSF2808(群榮化學(股) 製)代替聚醯胺酸以外,與實施例2同樣地進行而得到酚醛 清漆樹脂組成物的清漆。進行評價時,硬化前後的膜在450 奈米之透射率,係硬化前爲9 7 %,硬化後爲8 8 %。因此, 透射率變化量爲9%。硬化前後的透射光譜係如第4圖所 示。得知硬化後在400奈米以上的區域,透射率係幾乎未 降低,在可見光區域未著色。又,評價硬化膜的耐藥品性 時,膜係完全溶解。 -55 - 201035241 比較例4 除了使用10克聚羥基苯乙烯樹脂MARUKALYNCUR S-2(商品名、九善石油化學(股)製)代替聚醯胺酸以外,與 實施例2同樣地進行而得到聚羥基苯乙烯樹脂組成物的清 漆。進行評價時,硬化前後的膜在45 0奈米之透射率,係 硬化前爲97%,硬化後爲9 1 %。因此,透射率變化量爲6%。 又,評價硬化膜的耐藥品性時,膜係完全溶解。 0實施例4 在實施例1的清漆進而使4克在合成例2所得到的醌 二疊氮化合物溶解而得到正型感光性聚醯亞胺樹脂組成物 的清漆。使用所得到的清漆並如前述進行硬化前後之膜的 透射率評價、耐藥品性評價及敏感度評價。在450奈米之 透射率,係硬化前爲95%,硬化後爲60%。因此,透射率 變化量爲35%。敏感度爲150m〗/cm2。膜減量爲0.10微米 以下。又,10微米以上的圖案殘留。 1) 實施例5 計量1 〇克在實施例2所得到的聚醯胺酸、4克1,7 -二 羥基萘(東京化成(股)製)、5克在合成例4所得到之含烷氧 基甲基的化合物(A-2)、4克在合成例2所得到的醌二疊氮 化合物並使其溶解於20克EL、20克GBL而得到正型感光 性聚醯亞胺前驅物組成物的清漆。使用所得到的清漆並如 前述進行硬化前後之膜的透射率評價、耐藥品性評價及敏 感度評價。在45 0奈米之透射率,係硬化前爲9 0%,硬化 後爲59%。因此,透射率變化量爲31%。敏感度爲 -56- 201035241 15 0mJ/cm2。膜減量爲〇·15微米。又’ 10微米以上的圖案 殘留。 比較例5 除了使用1-萘酚代替1,7 -二羥基萘以外’與實施例5 同樣地進行而得到正型感光性聚醯亞胺前驅物的清漆。進 行評價時,硬化前後的膜在450奈米之透射率’係硬化前 爲90%,硬化後爲77%。因此,透射率變化量爲1 3%。膜 0減量爲0.20微米。敏感度爲300mJ/cm2。又’20微米以上 的圖案殘留。 比較例6 除了使用2,7-二羥基萘代替1,7-二羥基萘以外’與實 施例5同樣地進行而得到正型感光性聚醯亞胺前驅物的清 漆。進行評價時,硬化前後的膜在450奈米之透射率’係 硬化前爲90%,硬化後爲74%。因此’透射率變化量爲1 6%。 膜減量爲0.15微米。敏感度爲150mJ/cm2。又’ 10微米以 Ο 上的圖案殘留。 實施例6 在實施例5的清漆,進而使0.5克作爲熱酸產生劑之 5-丙基磺醯氧基亞胺基- 5H -噻吩-2-甲基苯基-乙腈(商品名 PAG-103、CIBA SPECIALTY CHEMICALS(股)製)溶解,而 得到正型感光性聚醯亞胺前驅物組成物的清漆。使用所得 到的清漆並如前述進行硬化前後之膜的透射率評價、耐藥 品性評價及敏感度評價。在4 5 0奈米之透射率’係硬化前 爲9 0 %,硬化後爲5 9 %。因此,透射率變化量爲3 1 %。敏 -57- 201035241 感度爲150mJ/cm2。膜減量爲〇·1〇微米。又,10微米以上 的圖案殘留。 實施例7 在實施例5的清漆進而使〇·5克在合成例6所得到的 黏著改良劑(Β -1)溶解而得到正型感光性聚醯亞胺前驅物 組成物的清漆。使用所得到的清漆並如前述進行硬化前後 之膜的透射率評價、耐藥品性評價及敏感度評價。在450 0 奈米之透射率,係硬化前爲90%,硬化後爲59%。因此, 透射率變化量爲31%。敏感度爲150mJ/cm2。膜減量爲〇·15 微米以下。又,3微米以上的圖案殘留^ 實施例8 計量1 〇克實施例2所得到的聚醯胺酸、4克2,3 -二羥 基萘(東京化成(股)製)、5克合成例4所得到之含烷氧基甲 基的化合物(Α-2)及4克合成例2所得到的醌二疊氮化合物 並使其溶解於20克EL、20克GBL而得到正型感光性聚醯 亞胺前驅物組成物的清漆。使用所得到的清漆並如前述進 行硬化前後之膜的透射率評價、耐藥品性評價及敏感度評 價。在4 5 0奈米之透射率,係硬化前爲9 3 %,硬化後爲6 3 %。 因此’透射率變化量爲30%。膜減量爲0.15微米。敏感度 爲200 mJ/cm2。又,1〇微米以上的圖案殘留。 實施例9 乾燥氮氣流下’使18_3克(〇.〇5莫耳)BAHF溶解於50 克NMP、26.4克(0.3莫耳)環氧丙基甲基醚,並將溶液的溫 度冷卻至-1 5 °C °在此’以內部溫度不高於〇。〇的方式滴入 201035241 使7.4克(0.025莫耳)二苯基醚二羧醯二氯(日本農藥(股) 製)、5.1克(0.025莫耳)異酞醯氯(東京化成(股)製)溶解於 25克GBL而成之溶液。滴入結束後,在-15 °C繼續攪拌6 小時。反應結束後,將溶液投入含有1 0重量%甲醇之3升 水中並收集白色沈澱。過濾收集該沈澱並以水洗淨3次 後,使用50°C的真空乾燥機乾燥72小時,來得到聚羥基 醯胺。 0 在10克EL、30克GBL,使所得到的10克聚羥基醯 胺、4克1,5-二羥基萘、2克合成例2的醌二疊氮化合物、 0.5克 WPAG-3 14(商品名、和光純藥工業(股)製)、5克 MX-2 70而得到正型感光性聚苯并噚唑前驅物組成物的清 漆。使用所得到的清漆並如前述進行硬化前後之膜的透射 率評價、耐藥品性評價及敏感度評價。在450奈米之透射 率,係硬化前爲92%,硬化後爲6 1 %。因此,透射率變化 量爲31%。膜減量爲〇.25微米。敏感度爲16〇111>1/〇1112。又, Ο 20微米以上的圖案殘留。 實施例1 0 使10克實施例9所得到的聚羥基醯胺、1.5克1,7二 羥基萘、0.5克WPAG-314(商品名、和光純藥工業(股)製)、 0.5克作爲熱酸產生劑之5-丙基磺醯氧基亞胺基-5H-噻吩 -2 -甲基苯基-乙腈(商品名 PAG-103、CIBA SPECIALTY CHEMICALS(股)製)、2 克 MW-30HM 溶解於 40 克 GBL 而 得到負型感光性聚苯并噚唑前驅物組成物的清漆。使用所 得到的清漆並如前述進行硬化前後之膜的透射率評價、耐 -59- 201035241 藥品性評價及敏感度評價。在450奈米之透射率,係硬化 前爲9 5 %,硬化後爲5 7 %。因此,透射率變化量爲3 8 %。 膜減量爲0.25微米。敏感度爲200 mJ/cm2。又,20微米以 上的圖案殘留。 實施例1 1 在10克實施例1所得到的聚醯亞胺,添加5克1,7二 羥基萘、4克合成例5所得到之含烷氧基甲基的化合物 0 (A-3)、2克環氧乙烷改性雙酚A二甲基丙烯酸酯(新中村化 學工業(股)製、NKESTERBPE-100)、0·5克三羥甲基丙烷 三丙烯酸酯、0.1克1,2-辛二酮-1-[4-(苯硫基)-2-(0-苯甲醯 肟)](CIBA SPECIALTY CHEMICALS 公司製)、20 克 EL 及 20克GBL而得到負型感光性聚醯亞胺樹脂成物的清漆。使 用所得到的清漆並如前述進行硬化前後之膜的透射率評 價、耐藥品性評價及敏感度評價。在450奈米之透射率, 係硬化前爲94%,硬化後爲66%。因此,透射率變化量爲 〇 28%。膜減量爲0.1微米。敏感度爲200 mJ/cm2。又,10 微米以上的圖案殘留。 實施例1〜1 1及比較例1〜6的組成及評價結果係如表 1〜3所示。 -60- 2010352410 Example 1 Under dry nitrogen flow, 32.9 g (0.09 mol) of BAHF was dissolved in 500 g of N-methylpyrrolidone (NMP). Here, 31.0 g (0_1 mol) of 3,3',4,4'-diphenyl ether tetracarboxylic dianhydride (manufactured by MANAC Co., Ltd., 〇DPA) was simultaneously added with 50 g of NMP, and at 30 Stir at °C for 2 hours. Subsequently, 2.18 g (0.02 mol) of 3-aminophenylhydrazine (manufactured by Tokyo Chemical Industry Co., Ltd.) was added and stirred at 4 ° C for 2 hours. Furthermore, 5 g of pyridine (manufactured by Tokyo Chemicals Co., Ltd.) was diluted with toluene (manufactured by Tokyo Chemical Co., Ltd.) and added to the solution, and a cooling tube was attached thereto, and the water was azeotroped together with toluene to be removed to the outside of the system. The temperature of the solution was 12 〇 - 52 - 2010 35241 ° C and maintained for 2 hours, and further reacted at 180 ° C for 2 hours. The temperature of the solution was lowered to room temperature, and the solution was poured into 3 liters of water to obtain a white powder. The powder was collected by filtration and washed three times with water. After washing, the white powder was dried by using a vacuum dryer of 5 (TC) for 72 hours to obtain a polyimine. In 10 g of the polyimine, 4 g of 1,5-dihydroxynaphthalene was added (Tokyo Kasei ( ))), 5 g of the methoxymethyl group-containing compound 0 (A-1) obtained in Synthesis Example 3, and 40 g of r-butyrolactone (manufactured by Mitsubishi Chemical Corporation, GBL) to obtain polyfluorene. A varnish of an amine resin composition. The transmittance of the film before and after curing obtained by using the varnish is 550 nm, which is 9.5 % before hardening and 61% after hardening. Therefore, the transmittance change amount is 34. Further, when the chemical resistance of the cured film was evaluated, the film amount was 〇·1 μm or less, which was very good. Comparative Example 1 In addition to adding 5 g of 2,6-dimethoxymethyl-third A phenol (manufactured by Honshu Chemical Co., Ltd.) was used in the same manner as in Example 1 except that the methoxymethyl group-containing hydrazine compound (A-1) obtained in Synthesis Example 3 was used to obtain a polyimine resin composition. The varnish of the material. The transmittance of the film before and after curing obtained by using the varnish is 96% before curing, and 85% after hardening. Therefore, The amount of change in the rate of change was 11%. Further, when the chemical resistance of the cured film was evaluated, the film system was completely dissolved. Comparative Example 2 In a 500 ml flask, 5 g of 2,2'-azobis(isobutyronitrile) was added. 200 g of tetrahydrofuran (TFT). Subsequently, 35 g of methyl methacrylate (MM), 30 g of t-butyl methacrylate (t-BM) and 35 g of methacrylic acid - 201035241 acid (ΜΑ) were added. After temporarily stirring at room temperature and substituting nitrogen in the flask, the mixture was stirred at room temperature for 40 hours. Here, 300 g of propylene glycol monomethyl ether was added and stirred. After the stirring was completed, the solution was poured into 2 liters of water, and the polymer solid was collected by filtration. The precipitate was further washed three times with 2 liters of water, and the collected polymer solid was dried by a vacuum dryer at 50 ° C for 72 hours to obtain an acrylic resin. The obtained acrylic resin was added. 4 g of 1,5-dihydroxynaphthalene (manufactured by Tokyo Chemical Industry Co., Ltd.), 5 g of the alkoxymethyl group-containing compound (A-1) obtained in Synthesis Example 3, and 40 g of propylene glycol monomethyl ether acetate A varnish of an acrylic resin composition obtained from an ester (made by KURARAY Co., Ltd., PMA). The varnish is obtained by using the varnish. The transmittance of the film before and after curing at a temperature of 450 nm is 97% before hardening and 93% after hardening. Therefore, the amount of change in transmittance is 4%. Further, when evaluating the chemical resistance of the cured film, the film The solution was completely dissolved.Example 2 Under a dry nitrogen stream, 57.4 g (0.095 mol) of the hydroxyl-containing diamine obtained in Synthesis Example 1, 1.24 g (0.005 mol) of 1,3-bis(3-aminopropyl) ϋ Tetramethyldioxane (SiDA) was dissolved in 200 g of hydrazine. Here, 3 1.0 g (0.1 mol) of hydrazine DPA was added and stirred at 40 ° C for 2 hours. Subsequently, a solution of 7.14 g (0.06 mol) of dimethylformamide dimethyl acetal (manufactured by Mitsubishi Rayon Co., Ltd., DFA) was diluted with 5 g of NMP, and dropped in 1 minute. After the dropwise addition, stirring was continued at 40 ° C for 2 hours. After the end of the stirring, the solution was poured into 2 liters of water, and a precipitate of the polymer solid was collected by filtration. Further, the mixture was washed three times with 2 liters of water, and the collected polymer solid was dried by a vacuum dryer of 5 (TC) for 72 hours to obtain polylysine. 10 g of the obtained polylysine was measured. 2 g of 1,6-dihydroxy-54-201035241 naphthalene (manufactured by Tokyo Chemical Industry Co., Ltd.), 4 g MW-30HM (manufactured by Sanwa Chemical Co., Ltd.) and dissolved in 20 g of EL, 20 g of GBL The varnish of the composition of the polyimide precursor was obtained. The transmittance of the film before and after curing obtained by using the varnish was 94% before curing, and 40% after hardening. Therefore, the transmittance was changed. The amount of transmission was 54%. The transmission spectrum before and after curing was as shown in Fig. 3. It was found that the transmittance at 400 nm to 550 nm was lowered by hardening, and it was clearly colored in the visible light region. In the case of chemical resistance, the film reduction of 0 is less than 0.1 μm, which is very good. Example 3 In addition to the addition of 1 g of the polyimine powder obtained in Example 1, instead of polylysine, A varnish of a polyimide composition was obtained in the same manner as in Example 2. When evaluated, it was hard. The transmittance of the film before and after is about 95% before hardening and 45% after hardening. Therefore, the change in transmittance is 50%. Also, when the chemical resistance of the cured film is evaluated, the film is reduced to 0.1 μm. In the following, it was very good. 〇Comparative Example 3 A novolak resin composition was obtained in the same manner as in Example 2 except that 10 g of a novolac resin PSF 2808 (manufactured by Kyoei Chemical Co., Ltd.) was used instead of polyglycine. The varnish. When evaluated, the transmittance of the film before and after hardening was 74% before hardening, and 78% after hardening. Therefore, the change in transmittance was 9%. Transmission spectrum before and after hardening As shown in Fig. 4, it was found that in the region of 400 nm or more after hardening, the transmittance was hardly lowered, and it was not colored in the visible light region. Further, when the chemical resistance of the cured film was evaluated, the film system was completely dissolved. - 201035241 Comparative Example 4 Polyhydroxybenzene was obtained in the same manner as in Example 2, except that 10 g of a polyhydroxystyrene resin, MARUKALYN CUR S-2 (trade name, manufactured by Nippon Petrochemical Co., Ltd.) was used instead of polyamic acid. Vinyl composition Paint. When evaluated, the transmittance of the film before and after hardening at 45 nm was 97% before hardening and 91% after hardening. Therefore, the change in transmittance was 6%. In the case of the drug, the film system was completely dissolved. Example 4 In the varnish of Example 1, 4 g of the quinonediazide compound obtained in Synthesis Example 2 was dissolved to obtain a positive photosensitive polyimide resin composition. The varnish was used, and the transmittance of the film before and after hardening, the evaluation of chemical resistance, and the sensitivity evaluation were performed using the obtained varnish. The transmittance at 450 nm was 95% before hardening and 60% after hardening. Therefore, the amount of change in transmittance is 35%. The sensitivity is 150m〗/cm2. The film reduction is 0.10 μm or less. Moreover, the pattern of 10 micrometers or more remains. 1) Example 5 Measurement 1 The polyglycine obtained in Example 2, 4 g of 1,7-dihydroxynaphthalene (manufactured by Tokyo Chemical Industry Co., Ltd.), and 5 g of the alkane obtained in Synthesis Example 4 The oxymethyl compound (A-2), 4 g of the quinonediazide compound obtained in Synthesis Example 2, and dissolved in 20 g of EL and 20 g of GBL to obtain a positive photosensitive polyimide precursor Varnish of the composition. Using the obtained varnish, the transmittance evaluation, chemical resistance evaluation, and sensitivity evaluation of the film before and after curing were performed as described above. The transmittance at 45 nm was 90% before hardening and 59% after hardening. Therefore, the amount of change in transmittance was 31%. The sensitivity is -56- 201035241 15 0mJ/cm2. The membrane reduction was 〇·15 μm. Also, the pattern of 10 μm or more remains. Comparative Example 5 A varnish of a positive photosensitive polyimide precursor was obtained in the same manner as in Example 5 except that 1-naphthol was used instead of 1,7-dihydroxynaphthalene. In the evaluation, the film before and after hardening had a transmittance of 450 nm before the hardening was 90%, and after hardening, it was 77%. Therefore, the amount of change in transmittance is 13.3%. The membrane 0 reduction was 0.20 micron. The sensitivity is 300mJ/cm2. Also, patterns of more than 20 microns remain. Comparative Example 6 A varnish of a positive photosensitive polyimide precursor was obtained in the same manner as in Example 5 except that 2,7-dihydroxynaphthalene was used instead of 1,7-dihydroxynaphthalene. In the evaluation, the film before and after curing had a transmittance of 450 nm, which was 90% before hardening and 74% after hardening. Therefore, the amount of change in transmittance was 16.6%. The membrane reduction was 0.15 microns. The sensitivity is 150mJ/cm2. Also, the pattern on the 10 10 μm remains on the Ο. Example 6 In the varnish of Example 5, 0.5 g of 5-propylsulfonyloxyimino-5H-thiophene-2-methylphenyl-acetonitrile (trade name PAG-103) was further used as a thermal acid generator. A CIBA SPECIALTY CHEMICALS (manufactured by CIBA) was dissolved to obtain a varnish of a positive photosensitive polyimide precursor composition. The obtained varnish was used, and the transmittance evaluation, drug resistance evaluation, and sensitivity evaluation of the film before and after hardening were performed as described above. The transmittance at 450 nm is 90% before hardening and 59% after hardening. Therefore, the amount of change in transmittance is 31%. Min -57- 201035241 The sensitivity is 150mJ/cm2. The membrane reduction is 〇·1 μm. Further, a pattern of 10 μm or more remains. Example 7 The varnish of Example 5 was further dissolved in 5 g of the adhesion improver (Β-1) obtained in Synthesis Example 6 to obtain a varnish of a positive photosensitive polyimide precursor composition. Using the obtained varnish, the transmittance evaluation, chemical resistance evaluation, and sensitivity evaluation of the film before and after curing were performed as described above. The transmittance at 450 0 nm is 90% before hardening and 59% after hardening. Therefore, the amount of change in transmittance was 31%. The sensitivity is 150mJ/cm2. The film reduction is 〇·15 μm or less. Further, pattern retention of 3 μm or more was carried out. Example 8 Measurement 1 The polylysine obtained in Example 2, 4 g of 2,3-dihydroxynaphthalene (manufactured by Tokyo Chemical Industry Co., Ltd.), and 5 g of Synthesis Example 4 were measured. The obtained alkoxymethyl group-containing compound (Α-2) and 4 g of the quinonediazide compound obtained in Synthesis Example 2 were dissolved in 20 g of EL and 20 g of GBL to obtain a positive photosensitive polypeptone. A varnish of the imine precursor composition. The obtained varnish was used, and the transmittance evaluation, chemical resistance evaluation, and sensitivity evaluation of the film before and after hardening were carried out as described above. The transmittance at 450 nm is 93% before hardening and 63% after hardening. Therefore, the amount of change in transmittance is 30%. The membrane reduction was 0.15 microns. The sensitivity is 200 mJ/cm2. Moreover, the pattern of 1 〇 micrometer or more remains. Example 9 Under a dry nitrogen stream, '18 gram of BAHF was dissolved in 50 grams of NMP, 26.4 grams (0.3 moles) of propylene glycol methyl ether, and the temperature of the solution was cooled to -1 5 °C ° at this 'with internal temperature is not higher than 〇. 〇 〇 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 2010 A solution prepared by dissolving in 25 g of GBL. After the completion of the dropwise addition, stirring was continued at -15 ° C for 6 hours. After the end of the reaction, the solution was poured into 3 liters of water containing 10% by weight of methanol and a white precipitate was collected. The precipitate was collected by filtration and washed three times with water, and then dried using a vacuum dryer at 50 ° C for 72 hours to obtain polyhydroxy decylamine. 0 10 g of polyhydroxydecalamine, 4 g of 1,5-dihydroxynaphthalene, 2 g of the quinonediazide compound of Synthesis Example 2, 0.5 g of WPAG-3 14 (10 g of EL, 30 g of GBL) A varnish of a positive photosensitive polybenzoxazole precursor composition was obtained by the trade name, Wako Pure Chemical Industries Co., Ltd., and 5 g of MX-2 70. The obtained varnish was used, and the transmittance evaluation, chemical resistance evaluation, and sensitivity evaluation of the film before and after hardening were performed as described above. The transmittance at 450 nm is 92% before hardening and 61% after hardening. Therefore, the amount of change in transmittance is 31%. The membrane reduction was 〇.25 μm. The sensitivity is 16〇111>1/〇1112. Also, 图案 20 microns or more remains. Example 1 10 g of the polyhydroxydecalamine obtained in Example 9, 1.5 g of 1,7-dihydroxynaphthalene, 0.5 g of WPAG-314 (trade name, manufactured by Wako Pure Chemical Industries, Ltd.), and 0.5 g were used as heat. Acid generator 5-1,4-sulfonyloxyimido-5H-thiophene-2-methylphenyl-acetonitrile (trade name: PAG-103, manufactured by CIBA SPECIALTY CHEMICALS), 2 g MW-30HM dissolved A varnish of a negative photosensitive polybenzoxazole precursor composition was obtained at 40 g of GBL. The obtained varnish was used to evaluate the transmittance of the film before and after the hardening as described above, and the evaluation of the drug resistance and the sensitivity of the -59-201035241. The transmittance at 450 nm is 95% before hardening and 57% after hardening. Therefore, the amount of change in transmittance is 38%. The membrane reduction was 0.25 microns. The sensitivity is 200 mJ/cm2. Also, the pattern remains above 20 microns. Example 1 1 In 10 g of the polyimine obtained in Example 1, 5 g of 1,7-dihydroxynaphthalene and 4 g of the alkoxymethyl group-containing compound 0 (A-3) obtained in Synthesis Example 5 were added. 2 g of ethylene oxide modified bisphenol A dimethacrylate (manufactured by Shin-Nakamura Chemical Co., Ltd., NKESTER BPE-100), 0.5 g of trimethylolpropane triacrylate, 0.1 g 1,2 -Nindione-1-[4-(phenylthio)-2-(0-benzamide)] (manufactured by CIBA SPECIALTY CHEMICALS), 20 g of EL and 20 g of GBL to obtain negative photosensitive polypeptone A varnish of imine resin. The obtained varnish was used, and the transmittance evaluation, chemical resistance evaluation, and sensitivity evaluation of the film before and after hardening were performed as described above. The transmittance at 450 nm is 94% before hardening and 66% after hardening. Therefore, the amount of change in transmittance is 〇 28%. The membrane reduction was 0.1 micron. The sensitivity is 200 mJ/cm2. Also, patterns of 10 microns or more remain. The compositions and evaluation results of Examples 1 to 1 1 and Comparative Examples 1 to 6 are shown in Tables 1 to 3. -60- 201035241

G r—i s Φ 溶劑 GBL (40 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) 〇导 '—✓ EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) 其他 j 1 1 1 1 PAG-103 (〇·5 克) 黏著改 良劑 B-1 (0.5 克) 1 ΚΜα ^ -N ii α遛w κ- dbK ώ 1 1 t 1 1 1 1 1 1 光聚合引發劑 (添加量) 1 1 1 1 1 1 1 1 1 題 m axt m 光酸產生劑 (添加量) 1 1 1 合成例2 (4克) 合成例2 (4克) 合成例2 (4克) 1 合成例2 (4克) 合成例2 (4克) 合成例2(2克) WPAG-314 (0.5 克) 熱交聯劑 (添加量) A-1 (5克) MW-30HM (4克) MW-30HM (4克) A-1 (5克) A-2 (5克) Α-2 (5克) 1 A-2 (5克) A-2 (5克) MX-270 (5克) S ^ m 11 £i 5籠 1,5-二羥基萘 (4克) 1,6-二羥基萘 (2克) 1,6-二羥基萘 (2克) 1,5-二羥基萘 (4克) 1,7-二羥基萘 (4克) 1,7-二羥基萘 (4克) 1,7-二羥基萘 (4克) 2,3二羥基萘 (4克) 1,5-二羥基萘 (4克) 樹脂 (添加量) 聚醯亞胺 (10 克) 聚醯胺酸 (10 克) 聚醯亞胺 (10 克) 聚醯亞胺 (10 克) 聚醯胺酸 (10 克) 聚醯胺酸 (10 克) 觀Π 戡职 m 2 m - 聚醯胺酸 (10 克) 聚羥基醯胺 (10 克) 實施例1 實施例2 . 1 實施例3 實施例4 實施例5 實施例6 實施例7 實施例8 實施例9G r-is Φ Solvent GBL (40 g) EL/GBL (20 g / 20 g) EL/GBL (20 g / 20 g) ''-✓ EL/GBL (20 g / 20 g) EL/GBL ( 20 g / 20 g) EL/GBL (20 g / 20 g) EL / GBL (20 g / 20 g) EL / GBL (20 g / 20 g) Other j 1 1 1 1 PAG-103 (〇 · 5 g Adhesion improver B-1 (0.5 g) 1 ΚΜα ^ -N ii α遛w κ- dbK ώ 1 1 t 1 1 1 1 1 1 Photopolymerization initiator (addition amount) 1 1 1 1 1 1 1 1 1 Problem m axt m Photoacid generator (addition amount) 1 1 1 Synthesis Example 2 (4 g) Synthesis Example 2 (4 g) Synthesis Example 2 (4 g) 1 Synthesis Example 2 (4 g) Synthesis Example 2 (4 g Synthesis Example 2 (2 g) WPAG-314 (0.5 g) Thermal crosslinker (addition amount) A-1 (5 g) MW-30HM (4 g) MW-30HM (4 g) A-1 (5 g) ) A-2 (5g) Α-2 (5g) 1 A-2 (5g) A-2 (5g) MX-270 (5g) S ^ m 11 £i 5 cage 1,5-two Hydroxynaphthalene (4 g) 1,6-dihydroxynaphthalene (2 g) 1,6-dihydroxynaphthalene (2 g) 1,5-dihydroxynaphthalene (4 g) 1,7-dihydroxynaphthalene (4 g) 1,7-dihydroxynaphthalene (4 g) 1,7-dihydroxynaphthalene (4 g) 2,3 dihydroxynaphthalene (4 g) 1,5-dihydroxy (4g) Resin (addition amount) Polyimine (10g) Polyglycine (10g) Polyimine (10g) Polyimine (10g) Polyglycine (10g) Poly Proline (10 g) Guanlan M 2 m - Polyglycine (10 g) Polyhydroxyguanamine (10 g) Example 1 Example 2 1 Example 3 Example 4 Example 5 Example 6 Embodiment 7 Embodiment 8 Embodiment 9

VO 201035241 樹脂組成物成分 溶劑 GBL (40 克) EL/GBL (20 克/20 克) GBL (40 克) 1 ΡΜΑ (40 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) EL/GBL (20 克/20 克) 其他 PAG-103 (0.5 克) 1 〜遐w ^ K- 1 11磙fe < c<] |1| 粼氍1£ s 翠獎_餾 稍fc fr氍 贓诫1翻 II! 1 1 1 1 1 1 光聚合引發劑 (添加量) 1 匾渥£砝 J1 tls S ΦέΙ 1 1 1 1 1 1 蘅^ 刼_| W 氍滕 米w WPAG‘314 (〇_5 克) 1 t 1 1 1 合成例2 (4克) 合成例2 (4克) 熱交聯劑 (添加量) MW-30HM (2克) A-3 (4克) ρπ_ «π 擎 Γ] ^ 1 1 ΠΙ !ώ ^ Α-1 (5克) MW-30HM (4克) MW-30HM (4克) A-2 (5克) A-2 (5克) |1^ 5 ^ Μ a ^ ^ l|i 5酱 1,7-二羥基萘 (1_5 克) 1,7-二羥基萘 (5克) 1,5-二羥基萘 (4克) 1,5-二羥基萘 (4克) 1,6-二羥基萘 (2克) 1,6-二羥基萘 (2克) 1-萘酚 (4克) 2,7二羥基萘 (5克) 樹脂 (添加量) 聚羥基醯胺 (1〇 克) 聚醯亞胺 (10 克) 聚醯亞胺 (10 克) 丙烯酸樹脂 (10 克) 酚醛清漆樹 脂 (10 克) 梢· 较 勧芑 聚醯胺酸 (10 克) 聚醯胺酸 (10 克) 實讓10 實施例π 比較例1 比較例2 比較例3 比較例4 比較例5 比較例6 201035241VO 201035241 Resin composition solvent GBL (40 g) EL/GBL (20 g / 20 g) GBL (40 g) 1 ΡΜΑ (40 g) EL/GBL (20 g / 20 g) EL/GBL (20 g / 20 g) EL/GBL (20 g / 20 g) EL/GBL (20 g / 20 g) Other PAG-103 (0.5 g) 1 ~遐w ^ K- 1 11磙fe <c<] |1|粼氍1£ s 翠奖_分分 slightly fc fr氍赃诫1 flip II! 1 1 1 1 1 1 Photopolymerization initiator (addition amount) 1 匾渥£砝J1 tls S ΦέΙ 1 1 1 1 1 1 蘅^刼_| W 氍滕米w WPAG'314 (〇_5 g) 1 t 1 1 1 Synthesis Example 2 (4 g) Synthesis Example 2 (4 g) Thermal crosslinking agent (addition amount) MW-30HM (2 g A-3 (4g) ρπ_ «π Γ Γ ^ ^ 1 1 ΠΙ !ώ ^ Α-1 (5g) MW-30HM (4g) MW-30HM (4g) A-2 (5g) A -2 (5g) |1^ 5 ^ Μ a ^ ^ l|i 5 Sauce 1,7-dihydroxynaphthalene (1_5 g) 1,7-dihydroxynaphthalene (5 g) 1,5-dihydroxynaphthalene ( 4 g) 1,5-dihydroxynaphthalene (4 g) 1,6-dihydroxynaphthalene (2 g) 1,6-dihydroxynaphthalene (2 g) 1-naphthol (4 g) 2,7 dihydroxynaphthalene (5 g) Resin (addition amount) Polyhydroxyguanamine (1 g) Polyimine (10 g) Polyimine (10 g) Acrylic resin (10 g) Novolak resin (10 g) Tip · Compared with poly-proline (10 g) Poly-proline (10 g) Really 10 Example π Comparative Example 1 Comparative Example 2 Comparative Example 3 Comparative Example 4 Comparative Example 5 Comparative Example 6 201035241

[表3] 透射率 敏感度 耐藥品性 在450奈米 之硬化前的 透射率 在450奈米 之硬化後的 透射率 在450奈米 之透射率變 化量 膜減量 殘留 圖案 實施例1 95% 61% 34% _ ^O.lO^m _ 實施例2 94% 40% 54% - ^0.10//m _ 實施例3 95% 45% 50% ^O.lO/zm 實施例4 95% 60% 35% 150mJ/cm2 ^ΟΛΟμτη ΙΟμχη 實施例5 90% 59% 31% 150mJ/cm2 ΙΟβπι 實施例6 90% 59% 31% l50mJ/cm2 ^0.10//m ΙΟμνη 實施例7 90% 59% 31% 150mJ/cm2 0.15//m 3 βτη 實施例8 93% 63% 30% 200mJ/cm2 0.15#m ΙΟβχη 實施例9 92% 61% 31% 160mJ/cm2 0.25//m 20 μ m 實施例10 95% 57% 38% 200mJ/cm2 0.25 β m 20 μ m 實施例11 94% 66% 28% 200mJ/cm2 0.10/m ΙΟμπι 比較例1 96% 85% 11% 全溶解 - 比較例2 97% 93% 4% _ 全溶解 - 比較例3 97% 88% 9% 全溶解 比較例4 97% 91% 6% - 全溶解 _ 比較例5 90% 77% 13% 300mJ/cm2 0.20 M m 20 μ γη 比較例6 90% 74% 16% 150mJ/cm2 0Λ5 βτα 10/im 實施例1 2 在玻璃基板上,形成底部閘極型的TFT,並形成連接 TFT之配線(高度爲1.0微米)。以覆蓋該TFT及配線之狀 態形成由Si3N4所構成的絕緣膜。隨後,在該絕緣膜形成 接觸洞。 而且,爲了將TFT及配線的凹凸平坦化,在絕緣膜形 成平坦化膜。在絕緣膜形成平坦化膜係藉由在基板上旋轉 -63 - 201035241 塗布法在實施例5所得到的感光性聚醯亞胺前驅物組成物 的清漆,並在熱板上於12(TC預烘烤3分鐘後,曝光、顯 像並且在空氣流動下於2 5 0 °C加熱焙燒處理6 0分鐘來進 行。在塗布清漆時之塗布性良好,認定在曝光、顯像及焙 燒後所得到的硬化膜未產生皴紋或裂縫。又,配線的平均 段差爲5 00奈米,所製造的平坦化膜之膜厚度爲2000奈米。 隨後,在所得到的平坦化膜上,形成頂部發射型的有 機EL元件。首先,在平坦化膜上,使其透過接觸洞而連接 f) 配線並藉由濺鍍來形成由ITO所構成的下部電極。隨後, 塗布光阻劑並預烘烤,且透過需要的光罩進行曝光、顯像。 將該光阻圖案作爲遮罩,藉由使用ITO蝕刻劑之濕式蝕刻 來進行圖案加工。隨後,使用光阻剝離液(一乙醇胺及DM SO 的混合液)將該光阻圖案剝離。如此進行所得到的下部電極 係相當於有機EL元件的陽極。 隨後,以覆蓋下部電極的周邊之方式形成絕緣層。絕 Q 緣層係同樣地使用在實施例5所得到之感光性聚醯亞胺前 驅物組成物的清漆。藉由設置該絕緣層,能夠防止下部電 極與在隨後步驟所形成的上部電極之間的短路。將絕緣層 圖案化,並於250 °C進行加熱處理60分鐘,來形成在450 奈米附近具有適當的吸收之絕緣層。 而且,在真空蒸鍍裝置內透過需要的圖案遮罩依照順 序蒸鍍正電洞輸送層、紅色、綠色、藍色的有機發光層、 電子輸送層。隨後,在基板上方的全面形成由A1所構成的 -64 - 201035241 上部電極。其相當於有機EL元件的陰極。將所得到的上述 基板從蒸鑛機取出,並使用密封用玻璃基板及紫外線硬化 型環氧樹脂貼合並密封。 如以上進行,能夠得到由用以驅動各有機EL元件之 TFT連接而構成之主動式矩陣型的有機EL顯示裝置。當透 過驅動電路施加電壓時,顯示良好的發光。 實施例1 3 在玻璃基板上,形成底部閘極型的T F T,並形成連接 〇 一 TFT之配線(高度爲1.0微米)。以覆蓋該TFT及配線之方 式形成由Si3N4所構成的絕緣膜。隨後,在該絕緣膜形成 接觸洞。該配線係用以連接TFT之間、或連接隨後步驟所 形成的有機EL元件與TFT。 隨後,使其透過接觸洞而連接配線並藉由濺鍍來形成 由I TO所構成的下部電極。隨後,塗布光阻劑並預烘烤, 且透過需要的光罩進行曝光、顯像。將該光阻圖案作爲遮 Ο 罩,藉由使用ITO蝕刻劑之濕式蝕刻來進行圖案加工。隨 後,使用光阻剝離液(一乙醇胺及DMSO的混合液)將該光 阻圖案剝離。如此進行所得到的下部電極係相當於有機E L 元件的陽極。 隨後,以覆蓋下部電極的周邊、T F T及配線的段差之 方式形成絕緣層,絕緣層係同樣地在基板上旋轉塗布在實 施例5所得到之感光性聚醯亞胺前驅物組成物的清漆。隨 後減壓乾燥,並藉由熱板於120 °C預烘烤3分鐘後,進行 201035241 曝光、顯像,並且在氮氣流動下於2 5 0 °C進行加熱焙燒處 理60分鐘。將清漆旋轉塗布時之塗布性良好,認定在曝 光、顯像及焙燒後所得到的硬化膜未產生皴紋或裂縫。又, 配線的平均段差爲500奈米,所製造的平坦化膜之膜厚度 爲2000奈米。藉由設置該絕緣層,能夠防止下部電極與在 隨後步驟所形成的上部電極之間的短路。如此進行來形成 在45 0奈米附近具有適當的吸收之絕緣層。 而且,在真空蒸鍍裝置內透過需要的圖案遮罩依照順 ❹ 序蒸鍍正電洞輸送層、紅色、綠色、藍色的有機發光層、 電子輸送層。隨後,在基板上方的全面形成由A1所構成的 上部電極。其相當於有機EL元件的陰極。將所得到的上述 基板從蒸鍍機取出,並使用密封用玻璃基板及紫外線硬化 型環氧樹脂貼合並密封。 如以上進行,能夠得到由用以驅動各有機EL元件之 TFT連接而構成之主動式矩陣型的有機EL顯示裝置。當透 Q 過驅動電路施加電壓時,顯示良好的發光。 產業上之利用可能性 本發明的樹脂組成物係適合使用於半導體元件的表面 保護膜或層間絕緣膜、有機電EL元件的絕緣層、使用有機 EL元件之顯示裝置的驅動用薄膜電晶體基板的平坦化 膜、電路基板的配線保護絕緣膜、固態攝影元件的晶片上 微透鏡或各種顯示器、固態攝影元件用平坦化膜、電路基 板用防焊阻劑、底部塡充劑、防止銅移行之覆蓋劑等的用 -bb- 201035241 途。 【圖式簡單說明】 第1圖係形成有平坦化膜及絕緣層之TFT基板之剖面 圖。 第2圖係形成絕緣層之TFT基板之剖面圖。 第3圖係實施例2的樹脂組成物的硬化前後之透射光 譜。 第4圖係實施例3的樹脂組成物的硬化前後之透射光 譜。 【主要元件符號說明】 2 3 4 5[Table 3] Transmittance sensitivity Chemical resistance Transmittance before hardening of 450 nm Hardening after curing at 450 nm Transmittance change at 450 nm Film reduction residual pattern Example 1 95% 61 % 34% _ ^O.lO^m _ Example 2 94% 40% 54% - ^0.10//m _ Example 3 95% 45% 50% ^O.lO/zm Example 4 95% 60% 35 % 150mJ/cm2 ^ΟΛΟμτη ΙΟμχη Example 5 90% 59% 31% 150mJ/cm2 ΙΟβπι Example 6 90% 59% 31% l50mJ/cm2 ^0.10//m ΙΟμνη Example 7 90% 59% 31% 150mJ/cm2 0.15//m 3 βτη Example 8 93% 63% 30% 200 mJ/cm 2 0.15 #m ΙΟβχη Example 9 92% 61% 31% 160 mJ/cm 2 0.25//m 20 μ m Example 10 95% 57% 38% 200 mJ/cm 2 0.25 β m 20 μ m Example 11 94% 66% 28% 200 mJ/cm 2 0.10/m ΙΟμπι Comparative Example 1 96% 85% 11% Total dissolution - Comparative Example 2 97% 93% 4% _ Total dissolution - Comparative Example 3 97% 88% 9% Total dissolution Comparative Example 4 97% 91% 6% - Total dissolution _ Comparative Example 5 90% 77% 13% 300 mJ/cm2 0.20 M m 20 μ γη Comparative Example 6 90% 74% 16 % 150mJ/cm2 0Λ5 βτα 10/im Example 1 2 Formed on a glass substrate The bottom gate type TFT is formed and connected to the TFT wiring (having a height of 1.0 μm). An insulating film made of Si3N4 is formed in a state of covering the TFT and the wiring. Subsequently, a contact hole is formed in the insulating film. Further, in order to planarize the unevenness of the TFT and the wiring, a planarizing film is formed on the insulating film. Forming a planarizing film on the insulating film is a varnish of the photosensitive polyimide precursor precursor composition obtained in Example 5 by a coating method on the substrate by -63 - 201035241, and on a hot plate at 12 (TC pre- After baking for 3 minutes, it was exposed, developed, and heated and calcined at 250 ° C for 60 minutes under air flow. The coating property was good when the varnish was applied, and it was confirmed that it was obtained after exposure, development, and baking. The cured film did not produce crepe or cracks. Further, the average section difference of the wiring was 500 nm, and the film thickness of the produced planarizing film was 2000 nm. Subsequently, a top emission was formed on the obtained planarized film. A type of organic EL device. First, a planarizing film is passed through a contact hole to connect f) wiring, and a lower electrode made of ITO is formed by sputtering. Subsequently, the photoresist is coated and pre-baked, and exposed and developed through a desired mask. The photoresist pattern was used as a mask, and patterning was performed by wet etching using an ITO etchant. Subsequently, the photoresist pattern was peeled off using a photoresist stripping solution (a mixture of monoethanolamine and DM SO). The lower electrode obtained in this manner corresponds to the anode of the organic EL device. Subsequently, an insulating layer is formed in such a manner as to cover the periphery of the lower electrode. The varnish of the photosensitive polyimide intermediate precursor composition obtained in Example 5 was similarly used for the absolute Q layer. By providing the insulating layer, it is possible to prevent a short circuit between the lower electrode and the upper electrode formed in the subsequent step. The insulating layer was patterned and heat-treated at 250 ° C for 60 minutes to form an insulating layer having an appropriate absorption near 450 nm. Further, the positive hole transport layer, the red, green, and blue organic light-emitting layers and the electron transport layer are vapor-deposited in the vacuum vapor deposition apparatus through a desired pattern mask. Subsequently, an upper electrode of -64 - 201035241 composed of A1 is formed over the substrate. This corresponds to the cathode of the organic EL element. The obtained substrate was taken out from the smelting machine, and sealed with a sealing glass substrate and an ultraviolet curable epoxy resin. As described above, an active matrix type organic EL display device constituted by connecting TFTs for driving the respective organic EL elements can be obtained. When a voltage is applied through the driving circuit, good light emission is exhibited. Example 1 3 On the glass substrate, a bottom gate type T F T was formed, and a wiring (a height of 1.0 μm) connected to the TFT was formed. An insulating film made of Si3N4 is formed to cover the TFT and the wiring. Subsequently, a contact hole is formed in the insulating film. This wiring is used to connect the organic EL elements and TFTs formed between the TFTs or the subsequent steps. Subsequently, the wiring is connected through the contact hole, and the lower electrode composed of I TO is formed by sputtering. Subsequently, the photoresist is coated and pre-baked, and exposed and developed through a desired mask. This photoresist pattern was used as a mask to perform pattern processing by wet etching using an ITO etchant. Subsequently, the photoresist pattern was peeled off using a photoresist stripping solution (a mixture of monoethanolamine and DMSO). The lower electrode obtained in this manner corresponds to the anode of the organic EL element. Subsequently, an insulating layer was formed so as to cover the periphery of the lower electrode, the TF T and the step of the wiring, and the insulating layer was similarly applied to the varnish of the photosensitive polyimide intermediate precursor composition obtained in Example 5 on the substrate. Thereafter, it was dried under reduced pressure, and prebaked at 120 ° C for 3 minutes by a hot plate, subjected to exposure to 201035241, developed, and subjected to a heat baking treatment at 250 ° C for 60 minutes under a nitrogen gas flow. When the varnish was spin-coated, the coating property was good, and it was confirmed that the cured film obtained after exposure, development, and baking did not cause crepe or cracks. Further, the average section difference of the wiring was 500 nm, and the film thickness of the produced planarizing film was 2000 nm. By providing the insulating layer, it is possible to prevent a short circuit between the lower electrode and the upper electrode formed in the subsequent step. This was carried out to form an insulating layer having an appropriate absorption near 45 nm. Further, in the vacuum vapor deposition apparatus, the positive hole transport layer, the red, green, and blue organic light-emitting layers and the electron transport layer are vapor-deposited in accordance with the pattern mask. Subsequently, an upper electrode composed of A1 is formed over the entire substrate. This corresponds to the cathode of the organic EL element. The obtained substrate was taken out from the vapor deposition machine, and sealed with a sealing glass substrate and an ultraviolet curable epoxy resin. As described above, an active matrix type organic EL display device constituted by connecting TFTs for driving the respective organic EL elements can be obtained. Good light is emitted when a voltage is applied through the drive circuit. Industrial Applicability The resin composition of the present invention is suitable for use in a surface protective film or an interlayer insulating film of a semiconductor element, an insulating layer of an organic electric EL element, or a driving thin film transistor substrate using a display device using an organic EL element. Flattening film, wiring protective insulating film for circuit board, on-wafer microlens or various displays for solid-state imaging devices, planarization film for solid-state imaging devices, solder resist for circuit boards, underlying ruthenium, and prevention of copper migration For the use of agents, etc. -bb- 201035241. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing a TFT substrate on which a planarizing film and an insulating layer are formed. Fig. 2 is a cross-sectional view showing a TFT substrate on which an insulating layer is formed. Fig. 3 is a transmission spectrum before and after curing of the resin composition of Example 2. Fig. 4 is a transmission spectrum before and after curing of the resin composition of Example 3. [Main component symbol description] 2 3 4 5

TFT 配線 絕緣膜 平坦化膜 ITO 基板 接觸洞 絕緣層 -67-TFT wiring Insulation film Planing film ITO substrate Contact hole Insulation layer -67-

Claims (1)

201035241 七、申請專利範圍: 1. 一種樹脂組成物’其特徵係含有:(a)聚醯亞胺、聚苯并 噚唑、聚醯亞胺前驅物或聚苯并噚唑前驅物,(b)l,5-二 羥基萘、1,6-二羥基萘、1,7-二羥基萘或2,3-二羥基萘及 (c)具有下述通式(1)所示的結構之熱交聯劑或是具有下 述通式(2)所示的基之熱交聯劑,201035241 VII. Patent application scope: 1. A resin composition's characteristics include: (a) polyimine, polybenzoxazole, polyimine precursor or polybenzoxazole precursor, (b l,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,7-dihydroxynaphthalene or 2,3-dihydroxynaphthalene, and (c) heat having a structure represented by the following formula (1) a crosslinking agent or a thermal crosslinking agent having a group represented by the following formula (2), (上述通式(1)中’ R係表示2〜4價的連結基,R1係表示 碳數爲1〜20之1價的有機基、Cl、Br、I或F,R2及 R3係表示CH2OR5(R5係表示氫原子或碳數爲1〜6之1 價的烴基),R4係表示氫原子、甲基或乙基,s係表示0 〜2的整數,u係表示2〜4的整數), -N(CH2OR6)t(H)v (2) (上述通式(2)中,R6係表示氫原子或碳數爲1〜6之1價 的烴基,t係表示1或 2,v係表示〇或1,但是,t + v 係1或2)。 2 . —種正型感光性樹脂組成物,其係在如申請專利範圔第1 項之樹脂組成物,進一步含有(d)光酸產生劑。 201035241 3 . —種負型感光性樹脂組成物,其係在如申請專利範圍第1 項之樹脂組成物,進一步含有(e)光聚合引發劑及(f)具有 2個以上的乙烯性不飽和鍵之化合物。 4. 如申請專利範圍第1至3項中任一項之樹脂組成物,其 中在厚度爲3·〇微米的膜,硬化前後之波長450奈米的光 線的透射率變化量爲20%以上。 5. —種顯不裝置,其係依照以下順序具有:形成有薄膜電 晶體之基板,使如申請專利範圍第丨至4項中任一項之 樹fe組成物硬化而得到的平坦化膜及/或絕緣層;及顯示 元件。 6 ·如申請專利範圍帛5項之顯示裝置,其中該顯示元件係 有機電致發光元件。(In the above formula (1), 'R represents a 2 to 4 valent linking group, R1 represents a monovalent organic group having a carbon number of 1 to 20, Cl, Br, I or F, and R2 and R3 represent CH2OR5. (R5 represents a hydrogen atom or a monovalent hydrocarbon group having 1 to 6 carbon atoms), R4 represents a hydrogen atom, a methyl group or an ethyl group, s represents an integer of 0 to 2, and u represents an integer of 2 to 4) -N(CH2OR6)t(H)v (2) (In the above formula (2), R6 represents a hydrogen atom or a monovalent hydrocarbon group having a carbon number of 1 to 6, and t represents 1 or 2, v is a system. Indicates 〇 or 1, but t + v is 1 or 2). 2. A positive type photosensitive resin composition which is a resin composition as in the first aspect of the patent application, and further contains (d) a photoacid generator. 201035241 3 . A negative photosensitive resin composition which is a resin composition as in the first aspect of the patent application, further comprising (e) a photopolymerization initiator and (f) having two or more ethylenic unsaturations The compound of the bond. 4. The resin composition according to any one of claims 1 to 3, wherein the film having a thickness of 3 μm or less has a transmittance change of 20 nm or more of a wavelength of 450 nm before and after curing. 5. A device for forming a flattening film obtained by curing a substrate of a thin film transistor and hardening the composition of the tree according to any one of claims 4 to 4, and / or insulating layer; and display components. 6. A display device as claimed in claim 5, wherein the display element is an organic electroluminescent element. -69 --69 -
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