TW200936983A - Method and apparatus for measuring surface shape profile - Google Patents

Method and apparatus for measuring surface shape profile Download PDF

Info

Publication number
TW200936983A
TW200936983A TW097143276A TW97143276A TW200936983A TW 200936983 A TW200936983 A TW 200936983A TW 097143276 A TW097143276 A TW 097143276A TW 97143276 A TW97143276 A TW 97143276A TW 200936983 A TW200936983 A TW 200936983A
Authority
TW
Taiwan
Prior art keywords
light
light source
shape
incident
sheet
Prior art date
Application number
TW097143276A
Other languages
English (en)
Chinese (zh)
Inventor
Xin Chen
Anping Liu
Naiyue Zhou
Original Assignee
Corning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc filed Critical Corning Inc
Publication of TW200936983A publication Critical patent/TW200936983A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW097143276A 2007-11-09 2008-11-07 Method and apparatus for measuring surface shape profile TW200936983A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/983,464 US8402785B2 (en) 2007-11-09 2007-11-09 Method and apparatus for measuring surface shape profile

Publications (1)

Publication Number Publication Date
TW200936983A true TW200936983A (en) 2009-09-01

Family

ID=40258254

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097143276A TW200936983A (en) 2007-11-09 2008-11-07 Method and apparatus for measuring surface shape profile

Country Status (6)

Country Link
US (1) US8402785B2 (enExample)
JP (1) JP2011503574A (enExample)
KR (1) KR20100103500A (enExample)
CN (1) CN101932903A (enExample)
TW (1) TW200936983A (enExample)
WO (1) WO2009061438A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5646861B2 (ja) * 2010-02-26 2014-12-24 株式会社ニコン 計測装置および計測方法
JP2017501951A (ja) * 2013-11-25 2017-01-19 コーニング インコーポレイテッド 実質的に柱面を成す鏡面反射面の形状を決定するための方法
US9546962B2 (en) 2014-02-12 2017-01-17 Kla-Tencor Corporation Multi-spot scanning collection optics
JP6369300B2 (ja) * 2014-11-20 2018-08-08 日本電気硝子株式会社 ガラスリボンの形状監視方法、ガラス物品の製造方法、及びガラス物品の製造装置
KR102499831B1 (ko) * 2016-05-23 2023-02-14 코닝 인코포레이티드 글라스 시트의 무중력 형상 예측 방법 및 무중력 형상 기반 글라스 시트 품질 관리 방법
CN106198397B (zh) * 2016-08-16 2020-01-03 京东方科技集团股份有限公司 一种光电检测装置、方法和光刻胶涂覆设备
US10446423B2 (en) * 2016-11-19 2019-10-15 Applied Materials, Inc. Next generation warpage measurement system
CN106524954A (zh) * 2016-12-21 2017-03-22 南通沃特光电科技有限公司 一种转子叠片的平整度检测方法
CN106524953A (zh) * 2017-01-04 2017-03-22 南通沃特光电科技有限公司 一种定子叠片的平整度检测方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3338696A (en) 1964-05-06 1967-08-29 Corning Glass Works Sheet forming apparatus
BE757057A (fr) 1969-10-06 1971-04-05 Corning Glass Works Procede et appareil de controle d'epaisseur d'une feuille de verre nouvellement etiree
US4853777A (en) * 1987-07-07 1989-08-01 Ashland Oil, Inc. Method for evaluating smooth surfaces
US5523889A (en) * 1994-05-16 1996-06-04 National Research Council Of Canada Beam expanding lens
US5757496A (en) 1997-03-07 1998-05-26 Mitutoyo Corporation Method of surface roughness measurement using a fiber-optic probe
US6621581B1 (en) * 1998-10-16 2003-09-16 Ade Corporation Method and apparatus for mapping surface topography of a substrate
US6999183B2 (en) * 1998-11-18 2006-02-14 Kla-Tencor Corporation Detection system for nanometer scale topographic measurements of reflective surfaces
US6211488B1 (en) 1998-12-01 2001-04-03 Accudyne Display And Semiconductor Systems, Inc. Method and apparatus for separating non-metallic substrates utilizing a laser initiated scribe
TW434399B (en) 2000-06-08 2001-05-16 Ind Tech Res Inst Multi-range fiber-optic reflective displacement micrometer
US6809808B2 (en) * 2002-03-22 2004-10-26 Applied Materials, Inc. Wafer defect detection system with traveling lens multi-beam scanner
CN1950669A (zh) 2004-05-10 2007-04-18 皇家飞利浦电子股份有限公司 光学精密测量装置和方法
US7231786B2 (en) 2004-07-29 2007-06-19 Corning Incorporated Process and device for manufacturing glass sheet
US20070039990A1 (en) 2005-05-06 2007-02-22 Kemmerer Marvin W Impact induced crack propagation in a brittle material
US20060261118A1 (en) 2005-05-17 2006-11-23 Cox Judy K Method and apparatus for separating a pane of brittle material from a moving ribbon of the material
DE102006013584B4 (de) 2006-03-22 2014-07-10 Benteler Automobiltechnik Gmbh Vorrichtung zum Vermessen von Bauteilen
WO2008028246A1 (en) 2006-09-07 2008-03-13 Bluescope Steel Limited Monitoring of profiled sheets

Also Published As

Publication number Publication date
JP2011503574A (ja) 2011-01-27
US20090120134A1 (en) 2009-05-14
KR20100103500A (ko) 2010-09-27
WO2009061438A1 (en) 2009-05-14
CN101932903A (zh) 2010-12-29
US8402785B2 (en) 2013-03-26

Similar Documents

Publication Publication Date Title
TW200936983A (en) Method and apparatus for measuring surface shape profile
JP6027673B2 (ja) 鏡面反射面の形状測定
JP2021182005A (ja) ワークピースの欠陥検出装置及び方法
US20180235738A1 (en) Apparatus and method for measuring surface topography optically
CN105378444B (zh) 用于检测杆形透明物体中的缺陷的方法
TW201226845A (en) Measuring method for topography of moving specimen and a measuring apparatus thereof
CN107167249A (zh) 单相机双波段熔池比色测温方法及系统
US9204800B2 (en) Low cost high efficiency signal interrogation for multi-channel optical coherence tomography
KR20190017644A (ko) 사이드 뷰 이미징을 사용하는 시료의 높이 프로파일 특성화
TW200912385A (en) Optical characteristic measuring apparatus using light reflected from object to be measured and focus adjusting method therefor
CN115096212B (zh) 一种三维形貌测量装置与方法
KR101181395B1 (ko) 다중 검출 공초점 현미경
CN111954804A (zh) 具有宽计量工艺窗口的棱镜耦合应力计
US10606051B2 (en) Optical system for light collection
CN101165471A (zh) 多角度多通道检测装置
US9211052B2 (en) Measuring endoscope
CN110575142A (zh) 一种单光谱仪多光束光学相干层析成像仪
JP6728007B2 (ja) 撮像装置および撮像方法
CN111103062B (zh) 一种基于单光子计数二维成像的装置及方法
TW200809179A (en) Multi-angle and multi-channel inspecting device
KR101111961B1 (ko) Ces 플라즈마 진단을 위한 렌즈 시스템
JP6702851B2 (ja) 撮像装置および撮像方法
TW201037265A (en) Method and apparatus for determining sheet position during production and handling
CN115834869A (zh) 深度相机的帧率测试方法及装置
CN102650551A (zh) 基于fpa非制冷热成像系统的点格分光镜光学读出方法