200921122 九、發明說明： 【發明所屬之技術領域】 本發明係有關於—種測試轉接裝置，更詳而言之，係 裝i於一種應用於視訊介面之訊號測試作業之測試轉接 【先前技術】 近，由於電子與資訊相關產業的高度發展以及人 ^ = ΐ =求變的時代趨勢不，各式各樣的電子及資訊產 爐’而現有的產品也不斷翻新樣式或更新版本。 針對各頻^商而言’每一新產品的研發開發，總免不了要 以。之樣品作錄測試的動作，以驗證該產品的設 能正確運作，故而諸多產品的品管及檢測也就成為 各廠商一個重大的課題。 ' ^P^^J(ylde〇 Graphic Array, VGA)+ i..：> :、1 #現/之v G A介面卡在電腦設備中的標準顯示裳置已 ^使用L隨著電腦的普及’似彳面卡之市場需 正二加’而在VGA介面卡投入使用前必須經過檢 測，才月巨確保其符合預期的功能。一般，在對似介面卡 進行測試^係預先將似介面卡裝設至電腦設備之主機 Ιί 供複數引線’並將引線一端銲接在該VGA介面 卡之似接頭的各個待測針腳上，而另—端則連接 之例如示波器之測試設備的連接探測頭上，以供進行測^ 一視讯介面之訊號測試作業。 、 惟，上述習知技術卻隱含有許多缺失：首先，於引線 110577 5 200921122 -銲接作業中，因似介面之VGA接頭係為例如15針之疗 準母接頭，引線只得銲接在m接敎後端之各針腳上: 而該m接頭係裝設於主機板上，故需預先將主機板從電 =機箱中取出以便於銲接。換言之，每次測試後皆須進行 =妾’應用此種習知技術引出訊號之過程相對較為繁複且 費時，·同時再更換測試訊號時甚至必須重開機，不僅使用 不便，且實不符時間與成本之經濟效益。 另外’因VGA接頭之各針腳間的間距較小，對所 要求之技術較高，造成銲接作業比較麻煩。而且，一方面， 需要求在狹小之有限空間内將引線牢固地銲接至對 上’以達到訊號之有效傳輸，避免產生連線虛谭甚至 ===另一方面，於銲接過程中需避免各引腳或連 it::錫而產生之短路現象。如此，導致該VGA /貝J °式作業之準備工作够技g & 2 改楚Μ 、力且耗時’並且銲接過程中發生斷 或紐路#誤之機率較高。再有，因待測之針腳數 試工料往往料數針㈣㈣之引線搞混，導致 測试項目之錯誤，這是我們所極力避免的。 因此，如何提供一種供測試之測試轉接裝置，萨以 測試作業中銲接針腳繁續不便、費時費力、二及測 減效率不高之缺失，遂成為目前亟待解決之問題。j 【發明内容】 ' 一種:::::知技術之缺失，本發明之-目的在於提供 種/、使用便利性之測試轉接裝置。 本發明之另一目的在於提供一種結構簡單之測試轉 】10577 6 200921122 接裝置。 本發明之再一目的在於提供一種具經濟效益之測試 轉接裝置。 ' ° 為達上述目的以及其他目的，本發明即提供一種測試 :轉接装置，係應用於以測試設備來測試一視訊介面之訊號 測。式作業中，待測之視訊介面係具有視訊連接埠，該視訊 連接琿包含複數第一針腳，該測試轉接裝置則係包括：測 / 接車係供對應結合至該視訊連接埠，具有對應該複 針腳之複數第二針腳；以及測試面板，係設於該測 轉接槔未供對應結合至該待測視訊連接埠之另一端，且 具有與該複數第二針腳電性連接之複數測試點， =點電性連接至㈣試設備以供測試該視訊介^訊 之連：t測：轉接裝置中，該測試轉接埠係選擇為插頭式 連接埠。_試轉接埠係可為—視 k.200921122 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to a test switching device, and more particularly, to a test transfer applied to a signal test operation of a video interface. Technology] Recently, due to the high development of electronics and information-related industries and the trend of people's = ΐ = change, a variety of electronic and information production furnaces, and existing products are constantly refurbished or updated. For each frequency, the development and development of each new product is always inevitable. The sample recording test action to verify the correct operation of the product, so the quality control and testing of many products has become a major issue for manufacturers. ' ^P^^J(ylde〇Graphic Array, VGA)+ i..:> :, 1 #现/的v GA interface card in the standard display of computer equipment has been used ^ use L with the popularity of computers 'The market for the face-to-face card needs to be plus two' and the VGA interface card must be tested before it is put into use, and the company can ensure that it meets the expected functions. Generally, in the test of the interface card, the interface card is pre-installed to the host of the computer device 供 供 for the plurality of leads 'and one end of the lead is soldered to each of the pins to be tested of the VGA interface card, and the other The terminal is connected to a connection probe such as an oscilloscope test device for performing a signal test operation of the video interface. However, the above-mentioned conventional techniques have many hidden defects: First, in the lead 110577 5 200921122 - soldering operation, since the interface-like VGA connector is, for example, a 15-pin therapeutic female connector, the leads are only soldered at the m-connector. On the back of each pin: And the m connector is installed on the motherboard, so the motherboard must be removed from the electrical = chassis in advance for welding. In other words, after each test, it is necessary to carry out the process of using the conventional technique to extract the signal. The process of extracting the signal is relatively complicated and time-consuming. When the test signal is replaced at the same time, even the restart must be restarted, which is not only inconvenient, but also inconsistent with time and cost. Economic benefits. In addition, because the spacing between the pins of the VGA connector is small, the required technique is high, which causes troublesome soldering work. Moreover, on the one hand, it is required to firmly solder the leads to the upper side in a narrow limited space to achieve effective transmission of signals, avoiding the connection of virtual wires or even === on the other hand, in the welding process, it is necessary to avoid A short circuit caused by a pin or even it:: tin. As a result, the preparation of the VGA/Bay J ° type operation is sufficient, and the time and force of the welding process are high. In addition, because the number of stitches to be tested is often mixed with the number of pins (4) and (4), the test items are wrong, which is what we try to avoid. Therefore, how to provide a test transfer device for testing, the inconvenient, time-consuming and labor-intensive soldering stitches in the Sa-I test operation, and the lack of efficiency in measurement and reduction, have become an urgent problem to be solved. j [Summary] A kind of::::: the lack of knowing technology, the present invention is to provide a test/transfer device with convenience/useability. Another object of the present invention is to provide a test switch with a simple structure, 10577 6 200921122. It is still another object of the present invention to provide a cost effective test adapter. For the above and other purposes, the present invention provides a test: an adapter device for testing a video interface of a video device with a test device. In the operation, the video interface to be tested has a video connection port, and the video connection port includes a plurality of first stitches, and the test switching device includes: a measuring/receiving system for correspondingly coupling to the video port, having a pair The second stitch of the plurality of stitches should be repeated; and the test panel is disposed at the other end of the test switch that is not coupled to the other end of the video link to be tested, and has a plurality of tests electrically connected to the plurality of second pins Point, = point is electrically connected to (4) test equipment for testing the video communication connection: t measurement: in the adapter device, the test transfer system is selected as the plug type connection port. _Try transfer system can be - see k.
Graphlcs Array，vr v 干〜、viaeo 埠係為—母接頭。△㈣，而該視訊介面之視訊連接 息。面板^復具有對應各該測試點之提示訊 該測試設:肴:亦即’：等測試點係透過引線而電性連接至 試點之複數引、線式轉接裝置復可包括連接該等測 備。於其財;該複數料村設於該測試設 孔之凹點。、w ’該等測試點係例如探針之凸點或探 《月之測4轉接裝置係、設計—可供對應結合至視 110577 7 200921122 :視訊連接埠的測試轉接璋，該測試轉接埠係連接 此，透過插頭式之測試轉接璋將該視訊介面 對應連接至退端之測試設備上，即可對該視訊介面執行有 性的視訊訊號測試。換言之，應用本發明可於測試過 =中’根據需要來選擇不同組合之測試點，以完成多次測 成。 相較於習知技術中需將裝設有該視訊介面之主機板 『自電腦主機中取出、並將複數連線逐—銲接至該視訊介面 之視訊連接槔中的各個針腳上，本發明具有使用便利性， =提高作業效率，、並可降低發生錯誤之機率及提高測試 、此外H式轉接裝置之結構簡單，俾節省製造成 本：而且，本發明無需在每次測試後進行銲接，解決習知 1術繁複、費時、及不具時間與成本之經濟效益等缺失。 【實施方式】 一以下係藉由特定的具體實例說明本發明之實施方 i. 式’熟悉此技藝之人士可由本說明書所揭示之内容輕易地 瞭解本發明之其他優點與功效。 ^請參閱第1圖，其係顯示本發明之測試轉接裝置一實 %例之基本結構示意圖。本發明之測試轉接裝置】係應用 ^以測試設備（未圖示）來測試一視訊介面2之訊號測試 <業^、’其中’該待測之視訊介面2係具有—視訊連接璋 ^該視訊連接埠2G則包含有複數第—針腳·。於本 貝也例中°亥視5孔介面2係例如一視訊圖形陣列（y kaPhics Array，VGA)介面，而該視訊連接璋2〇係為具 110577 8 200921122 有例如15個的第一針腳200之標準規格VGA母接頭，各 該第一針腳200係包括對應例如R、g、b、hsy、vsy等視 訊分量以及接地端（GND)之針腳。需注意的是，於本實施 —例中，該視訊介面2係以VGA介面為例進行說明者，=並 ••不以此為限，其亦可例如為數位影像介面⑶化^“ ViSual Interiace，DVI)、高解析多媒體數位傳輸介面 (High Definition Multimedia lnterface，ηΜΙ)等其他 類似之視訊介面。另外，該測試設備可為例如示波器，但 ( 非以此為限。 於本實施例中，本發明之測試轉接裝置1係包括：測 試轉接埠lQ、以及設於㈣^轉鱗1g _端之測試面板 12° 該測試轉接4 10係具有複數第二相1〇〇，俾供對 應結合至該視訊介面2之視訊連接痒2〇。於本實施例中， 該測試轉接埠20係設計為插頭式之連接埠，而可直接插 ί :接至該視訊連接埠20 ;換言之，該視訊連接埠2〇係為一 = 試轉接槔1〇則可為—與該視訊連接缚20 2。二' 頭，以便一端對應結合至該視訊連接埠 =似公接頭係符合標準規範，為本領域之技術人員 斤无、知之么知技術，故在此不再予以費 1 ΠΠ ^ ^ ^ ,, 貝k °哀·#弟二針腳 '、匕括對應例如R、G、B、HSY、VSY等稍1八θ 接地端⑽D)之針腳。 心·^分1以及 板12係設於該測試轉接埠1Q之相對一端， 顧试面板12係設於該測試轉接埠】。未供對應結合 110577 9 200921122 二=視訊連接蟑20之另一端。同時，該測試面 : 複數第二針腳100電性連接之複數測試勢 1 ^本貫施例中，該等測試點⑽係與該複數第二針 P 00相對應，可透過例如録接引線（未予以圖示）而連接 二=點120至該遠端之測試設備之探測頭上，但並不 •^備°例如’該測試點12 G係可設計成例如與該測試 測頭相對應之探針，或是設計成與該測試設備之 t頭相對應之探孔，㈣，可設計匹配該探測頭大小之 2或探孔作為訊號量測點，以使要量測之訊號通過該探 、，十或楝孔而引人該探測頭。而且，該賴轉接m復 包括連接料測試點12〇之複數引線（未予㈣示），使該 引線末端可匹配該探測頭；但’當然本發明可有其他變 化j例如該複數引線亦可設於該測試設備，故只要可連接 該等測試，點120至該測試設備者，皆適用於本發明。另 外，為便於分辨各個測試點丨2〇所對應之視訊分量，於本 只％例中更可於該測试點12 〇所在位置旁標註有對廡兮 第二針腳1 〇〇所代表之視訊分量的訊息。 、當應用本發明之測試轉接裝置丨執行該視訊介面2 之視訊訊號測量時，係可預先將該測試轉接裝置丨之則試 轉接埠10對應該視訊介面2之視訊連接埠2〇上，接著· 將銲接於該測試面板12上之複數測試點12〇的各個引線 電性連接至該測試設備。如此即可透過該測試設備對該視 訊介面2之各個視訊分量訊號進行測試。 綜上所述，本發明之測試轉接裝置係透過提供—可供 110577 10 200921122 對應結合至該待測視訊介面之視訊連接蜂的測試轉接 璋，以及設於該測試轉接埠之相對一端的測試面板，且該 觀面板具有與㈣m轉料之複數針腳對應之複數測 Λ^如此，透過將該等測試點對應連接至該測試設備 ，上’即可於測試過程中，根據需要來選擇不同組合之測試 點’以完成多次測試。 相較於習知技術中需將裂設有該視訊介面之主機板 自電腦主機巾取出並進行針腳銲接，本發明 I測之訊號，直接接在視訊介面丁貝d而要里 文隹祝巩；丨面上即可進行測試，簡單便 利’相應提咼作業效率。同時，庫用 應用本發明無需重新開機 卩可更_試訊號’復可避免習知技術於銲接 =或料w象之缺失；此外，透過該測試轉接裝置， 人測試項目後，可在電腦系統不關機的狀況下 置之^ 再有’該測試轉接裝 罝之、、，。構間早，俾節省製造成本。 S, 上述實施例僅例示性㈣本發明之原理及其功效，而 卜用於限制本發明。任何熟習此 北士找rm 又农I人士均可在不遠 月本毛明之精神及範疇下，對上 變。因A 例進行修飾與改 範圍所列。 固應如後返之申請專利 【圖式簡單說明】 示意=。1圖係為顯示本發明之測試轉接裝置之基本結構 【主要元件符號說明】 110577 11 200921122 測試轉接裝置 10 測試轉接埠 100 第二針腳 12 測試面板 120 測試點 2 視訊介面 20 視訊連接埠 200 第一針腳Graphlcs Array, vr v dry ~, viaeo 为 is - female connector. △ (4), and the video interface of the video interface. The panel has a prompt corresponding to each test point. The test device: the food: that is, the test point is electrically connected to the pilot through the lead wire, and the line transfer device can include the connection. Ready. Yu Qicai; the complex material village is located in the pit of the test hole. , w 'The test points are, for example, the bumps of the probe or the probes of the month 4 test device system, design - can be correspondingly coupled to the view 110577 7 200921122: video transfer port test transfer, the test turn The interface is connected to the test device, and the video interface is connected to the test device of the back end through a plug-type test transfer, so that the video signal test can be performed on the video interface. In other words, the application of the present invention can be tested over = in 'selecting different combinations of test points as needed to complete multiple measurements. Compared with the prior art, the motherboard equipped with the video interface needs to be taken out from the computer host and the plurality of wires are soldered to the respective pins in the video interface of the video interface, and the invention has Convenience, = improve work efficiency, reduce the probability of error and improve testing, and the structure of the H-type adapter is simple, saving manufacturing costs: Moreover, the present invention does not need to be welded after each test to solve Xizhi 1 is complicated, time-consuming, and has no economic benefits such as time and cost. [Embodiment] The following describes the embodiments of the present invention by way of specific examples. i. Those skilled in the art can readily appreciate other advantages and effects of the present invention from the disclosure of the present specification. ^ Please refer to Fig. 1, which is a schematic view showing the basic structure of a test adapter device of the present invention. The test switching device of the present invention is a test device (not shown) for testing the signal test of a video interface 2 < industry, 'where the video interface 2 to be tested has a video connection 璋 ^ The video connection 埠2G includes a plurality of pin-pins. In the example of Benbe, the 5-hole interface 2 is, for example, a video graphics array (ykaPhics Array, VGA) interface, and the video interface is 110577 8 200921122, for example, 15 first pins 200 The standard VGA female connector, each of the first pins 200 includes pins corresponding to a video component such as R, g, b, hsy, vsy, and a ground terminal (GND). It should be noted that in the present embodiment, the video interface 2 is described by taking the VGA interface as an example. The value of the VGA interface is not limited thereto, and may be, for example, a digital image interface (3). ViSual Interiace Other similar video interfaces, such as a high resolution multimedia lnterface (nΜΙ), etc. In addition, the test device may be, for example, an oscilloscope, but not limited thereto. In this embodiment, The test adapter device 1 of the invention comprises: a test adapter 埠lQ, and a test panel 12° disposed at the (four)^turn scale 1g _ end. The test adapter 4 10 series has a plurality of second phases 1〇〇, corresponding to In the present embodiment, the test transfer port 20 is designed as a plug-type port, and can be directly connected to the video port 20; in other words, The video connection 埠 2 为 is a = test transfer 槔 1 〇 can be - with the video connection 20 2 . 2 'head, so that one end is correspondingly coupled to the video connection 埠 = like a male connector is in accordance with the standard specifications, For those skilled in the art If you know the technology, you will not be charged 1 ΠΠ ^ ^ ^ , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , (10) The stitch of D). The heart ^1 and the board 12 are set at the opposite end of the test adapter 埠1Q, and the test panel 12 is set in the test adapter 埠]. The corresponding combination is not included in the combination 110577 9 200921122 2 = video The other end of the connection port 20. At the same time, the test surface: the plurality of test positions of the plurality of second pins 100 are electrically connected. 1 In the present embodiment, the test points (10) correspond to the plurality of second pins P 00 , The test head of the test device of the remote end can be connected by, for example, a recording lead (not shown), but it is not necessary to prepare, for example, the test point 12 G system can be designed, for example, with the Test the probe corresponding to the probe, or the probe hole corresponding to the t head of the test equipment, (4), can be designed to match the size of the probe 2 or the probe hole as the signal measurement point, so as to make the amount The measured signal introduces the probe through the probe, ten or the pupil. Moreover, the transfer adapter includes the connection material test. Point 12 复 of the plurality of leads (not shown (4)), so that the end of the lead can match the probe; but of course, the invention can have other changes. For example, the plurality of leads can also be set in the test device, so as long as the connection can be The test, point 120 to the test equipment, are applicable to the present invention. In addition, in order to facilitate the resolution of the video component corresponding to each test point, in this only example, the test point is 12 A message corresponding to the video component represented by the second pin 1 标注 is marked next to the position. When the video signal measurement of the video interface 2 is performed by applying the test switching device of the present invention, the test can be transferred in advance. The device is connected to the video interface 2 of the video interface 2, and then the respective leads of the plurality of test points 12A soldered to the test panel 12 are electrically connected to the test device. In this way, the video component signals of the video interface 2 can be tested through the test device. In summary, the test switching device of the present invention provides a test transfer port for the video connection bee that is coupled to the video interface to be tested, and is disposed at the opposite end of the test transfer port. Test panel, and the viewing panel has a plurality of measurements corresponding to the plurality of pins of the (four) m-transfers. Thus, by connecting the test points to the test device, the 'on the test process can be selected according to needs. Different combinations of test points 'to complete multiple tests. Compared with the prior art, the motherboard with the video interface is taken out from the computer mainframe and stitched, and the signal of the invention is directly connected to the video interface Dingbei. The test can be carried out on the surface, which is simple and convenient 'corresponding to the efficiency of the work. At the same time, the library can be used in the invention without the need to reboot, and the _ test signal can avoid the loss of the conventional technology in the welding = or the w image; in addition, through the test transfer device, after the test project, the computer can be used in the computer If the system is not shut down, then there will be 'the test transfer adapter, ,,. The structure is early, and the manufacturing cost is saved. The above-described embodiments are merely illustrative of the principles of the invention and its effects, and are intended to limit the invention. Anyone who is familiar with this North Shi to find rm and farmer I can change up in the spirit and scope of the moon. Modified in the A case and listed in the scope of the change. Patent application for returning to the future [Simplified description of the diagram] 1 is the basic structure of the test adapter device of the present invention. [Main component symbol description] 110577 11 200921122 Test adapter device 10 Test adapter 100 Second pin 12 Test panel 120 Test point 2 Video interface 20 Video connection埠200 first stitch