200905189 九、發明說明： 【發明所屬之技術領域】 ::關於一種判別内外層瑕疵的檢測方法與系 =體，透 方法與系統。 【先前技術】 薄型顯示ϋ在現今社會巾的運用，6十料遍，大至 戶外電視牆、液晶電視、電料視、電腦的顯示螢幕小 至手機螢幕、PDA的顯示器以及Μρ3的顯示螢幕等，日常 生活中，幾乎隨處可見此種顯示器的蹤跡。 薄型顯示H的成品’係她示材料、玻璃基材及背光 模組等所多種獅及結獅合而成，製造薄魏晶顯示裝 置的製程非常複雜’通f可概分為三個階段，依序為陣列 製程（array process)、面板組裝製程（ceU pr〇cess) 以及模組組裝製程（module assembly process)。簡單來 說，陣列製程會在一玻璃機板上形成一薄膜電晶體陣列。 面板製程是將一彩色濾光片基板與陣列製程所完成之薄膜 電晶體基板貼合，並於其内灌入液晶材料。而模組組裝製 程而是將面板組裝製程所完成之面板模組與其他如背光模 組（backlightmodule)、驅動電路以及外框等多種零件進 行組裝。由於薄型液晶顯示裝置是一項極精密的高科技產 業，而且製造廠商的資本投資龐大，因此，對於產品的良 200905189 率非常重視，所以，在目前大部分的製程中，皆已且有一 定的標準製程及製程中對半成品的各項檢測工作，^是， 仍難避免各種瑕疵之發生。 對於薄型顯不||而言，視覺贼的種類繁多，一般可 依據瑕_面_微料三類，包__、線缺陷及 面缺陷。無論何種贼，就目触絲_檢職術而言， 均已可利用各種檢測儀器或是檢測方法，輕易發現喊所 在之位置及其形狀。 但是’現行之各種檢測技術，難以正確判斷瑕疲發生 在薄型顯示器_層背光模組、玻璃基材結構上或是外層 的顯示材料上，_，麵摊無法進行適當之處理與修 補’使得有瑕献薄型顯示H論為次級品銷售或予以作 廢’影響生產廠商的良率，亦造成生產成本提高。 ，此’針對於薄型顯示器之視覺瑕症，有必要提出一 種簡單又鮮的綠與裝置，除了可發舰麵在之位置 及其形狀外，更可適當糊械發生袖層結構上或是外 層結構上’方便製造麵，·品進行有效的進行處理與 修補’以達成提昇良率及降低成本的目的。 【發明内容】 本發明之主要目的，在於提供一種判別内外層瑕疵的 檢測方法與系統，制是指-種運用至少二絲檢測具多 層結構之制物體及影像職，發麟職體贼位置， 並準確判職侧物體之内外層碱的方法與系統。利用 200905189 簡單的檢測方法與檢m可正相快柄靖制物 體内外層瑕疫的效果，以有效解決目前習知之各種檢測技 術，難以判斷瑕疵發生於待測物體的内層背光模組、玻璃 基材結構上或是外層的顯示材料上的問題。 本發明之一種判別内外層瑕疫的檢測方法，其步驟包 括將具有錯轉之-制物體，設置於—承載装置上， 並提供制減-背絲置，提_對應於承載裝 置之-影像嫩裝置，鱗f彡像娜裝置進行初始化設定 及待測物體之撕位置校正之後，開啟背光裝置，利用影 像揭取裝置赠轉鱗描之对，棘酬物體之影 像’取得制物體至少—總贼影像；然後，提供待測物 體-表面照明裝置，該表面照明裝置將提供—特定角度之 斜向光’歸至待_體之表面，再·影像嫩裝置以 線性移動掃播之方式，取得待測物體-表面瑕觸像；最 後’藉由-電轉析單元’分_瑕絲像及表面瑕疲影 像’以及將總彡像扣除表面贼縣，所得即為待測 物體之内層瑕症影像。 本發明之-種判助外層瑕_檢測系統包括至少 背光裝置、至少一表面照明裝置、至少-影像擷取裝 置、一相對於影像掏取裝置之承載裝置'一支禮物以及 電腦解析單元；背光裝置侧讀供待測物體一背光 源’表面照明裝置’係為—線性聚光照明裝置’可提供 200905189 制物體-特定角度之斜向_光線，以對制物體進 行表面照明；影像練褒置更包括至少—線性影像感測 器及-大研光學透鏡，胁產生制物體之總瑕疫影 像及表面贼影像；承健置侧財_待測物體； 而支撲物個以麵賊賴取裝置，域其可以進行 線性平移之動作；電腦解鮮元係雜連接於影像榻取 裝置’用时析其職生之制物_總贼影像及表 面瑕疯影像’獲得酬物體之_瑕疲影像。 此方法與系統’可應具衫騎構之背光模組檢 測、液晶模組檢測、液晶面板檢測以及電漿電視面板之 瑕疵檢測等的組合中之任何一種。 關於本發明之優點與精神，可藉由以下的發明詳述 及所附圖式得到進—步的了解，然而所附圖式，僅供參 考與說明’非輯本發·以限制。 【實施方式】 :發:侧於一種判別内外層瑕疵的檢測方法與系 統，特別h-種運用至少二光源檢測— 過影像辨識而判別該待測物體之内外層 下。=ΤΓ之較佳實施例加以詳細說明如 了凊參閱第-圖’為本發明一種判別内外層瑕朗 系統:較佳實施例的整體結構示意圖。如第一圖所示，該 檢測系统包括—影軸取裝置1卜-承載裝置12、一^ 200905189 裝置13、一靡 腦解析單元^ 一線性聚光照明裝置16、以及一電 ^像掏取裝置u，係結合有線型影像感測器（圖未 之将:丨；^野光學透鏡（圖未示^用以對一具有多層結構 'Ί 14 _掃描後’以取得其影像。 =栽震置12係相對應於影像擷取裝置u之下方，以 心=有多層結構之待賴組14，於該承載裝置12之 發I裝置13，該背光裝置可以是冷陰極燈管、 n體或其他發光源，亦可以為該多層結構之待測模 、趣/1具有之背光源裝置，其可提供具有多層結構之待 ^ 4 f麵’使娜齡裝置11得_取具有多層 、，《構之待測模組14之總瑕疵影像。 ^像練裝置U缺於朗15上，雜線性平移方 ，得以對具有多層結構之待測模組進行掃描，取 =狀瑕邮像：材令郷賴補置11 ©設於龍門 上’令承載該具有多層結構之待測模組Μ之承載装置 ^目對於縣嫩裝置η雜伟，辑娜 之總瑕疵影像。 媪^述之影細取裝置U，其取得具有多層結構 馳14之贼難的枝，妨條於细雜掃描 取得，亦可利用背光源裝置提供之背光，以整幅畫面掏取 之方式取得待測模組〗4之瑕疵影像。 線性聚光照明裝置16，可gj定於朗15 其他適當位置’用以提供-特定角度之斜向_光線叹照 200905189 射於具有多層結構之待測模組14之 π得以對具有多層結構之待測模組i4進=象=置 表面瑕疵之影像。 撝取得其 電腦析17電性連結於影像擷取裝置11，利用 像，即可得_層鶴纽。私除表面瑕症影 為本發明一種判別内外層瑕症的檢測方法與系 ==列了描瑕疲示意圖。如第二圖所示，先開 ^先裝置13 ’透過影像娜裝置u對具有 14進行雜，取得一總瑕簡像資訊21了5 閉^先裝置13，而後再開啟線性聚光照明裝置16， 二角度之斜向朗雜，騎於具有多層結構 $ =面進:透措Γ_取裝置11對具有多層_^^ 模t订知取得一表面瑕疲影像資訊22，利用電 腦解析單7G π之f彡像處理分析，卿總瑕縣彡像資訊21 之瑕疵位置31及表_絲騎訊22之贼位置％ 扣除瑕龜位置％，即可得到内層瑕崎訊23 中之内層瑕疵位置33。 對應上述-種判別内外層瑕疲的檢測系統，本發明亦 揭示-種判別内外層瑕疵的檢測方法，請參閱第三圖所 =圖為本發明-種判·外層瑕_檢測方法與系統之流 步驟810及步驟82〇所示，將一具有多層結構之待測 11 200905189 物體14穩定置放於-承載裝置12之_預絲定之位 上；並提供一影像掏取裝置U，其位置係相對應於該承 裝置12 ;步驟830及步驟840，將該影像擷取裝置u進行 初始化之設定；並對該影像擷取裝置丨丨及具有多層結構Z 待測物體14之相對位置校正；步驟85〇所示，開啟二背光 裝置13，利用該影像擁取裝置η，以線性移動掃福之方 式’取得該具有多層結構待測物體14之一總瑕疵影像資訊 22 ;步驟860及870所示，利用一線性聚光照明裝置16， 提供特定角度之斜向光，照射至該具有多層結構之待測物 體14之表面；再用該影像擁取裝置u，以線性移動掃描 之方式’取得具有多層結構待測物體14之一表面瑕疵影像 資訊23 ;最後，如步驟880所示，分析處理該總瑕疫影像 資訊22及該表面瑕疵影像資訊23，將該總瑕疵影像資訊 22扣除持該表面瑕疵影像資訊23，所得即為該待測物體 14之内層瑕疵。 因不同光源所對應之瑕疵資訊不同，故光源點亮方式 並無先後順序之分，因此，於上述步驟中，亦可於步驟84〇 之後，先進行步驟860及870，以取得該多層結構之待測 物體之表面瑕疯影像’再進行步驟850，取得待測物體之 總瑕疫影像；最後’仍如步雜880，分析處理該總瑕疵影 像及該表面瑕疯影像後，獲得該待測物體之内層瑕疫。 综上所述，當知本案之發明已具有產業利用性、新穎200905189 IX. Description of the invention: [Technical field to which the invention pertains] :: A method and system for discriminating the detection of the inner and outer sputum. [Prior Art] The use of thin display 现 in today's social towel, 6 times, as large as outdoor TV wall, LCD TV, electric material, computer display screen as small as mobile phone screen, PDA display and Μ 33 display screen, etc. In daily life, traces of such displays can be seen almost everywhere. The thin-type display H's finished product is made up of a variety of lions and lions, such as her material, glass substrate and backlight module. The process of manufacturing a thin Wei-jing display device is very complicated. The pass f can be divided into three stages, in order. It is an array process, a panel assembly process (ceU pr〇cess), and a module assembly process. Simply put, the array process creates a thin film transistor array on a glass plate. The panel process is to bond a color filter substrate to a thin film transistor substrate completed by an array process, and to fill a liquid crystal material therein. In the module assembly process, the panel module completed by the panel assembly process is assembled with other components such as a backlight module, a driving circuit, and a frame. Since the thin liquid crystal display device is a very high-tech high-tech industry, and the capital investment of the manufacturer is huge, the quality of the product is very high. Therefore, in most of the current processes, there are certain In the standard process and process, the inspection of semi-finished products, ^ is, it is still difficult to avoid the occurrence of various defects. For thin type display||, there are many types of visual thieves, which can generally be based on 瑕_面_微料 three types, including __, line defects and surface defects. Regardless of the type of thief, you can use the various testing instruments or testing methods to easily find out where the shouting is and its shape. However, 'the current various detection techniques make it difficult to correctly judge whether the fatigue occurs on the thin display _ layer backlight module, the glass substrate structure or the outer display material, _, the surface booth can not be properly processed and repaired'瑕 瑕 型 显示 显示 显示 显示 显示 显示 瑕 瑕 瑕 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级 次级In view of the visual snoring of thin display, it is necessary to propose a simple and fresh green and device. In addition to the position and shape of the ship's surface, the cuff structure or outer layer can be appropriately formed. The structure is 'convenient to manufacture the surface, and the product is effectively processed and repaired' to achieve the goal of improving yield and reducing costs. SUMMARY OF THE INVENTION The main object of the present invention is to provide a method and system for detecting the inner and outer sputum. The system refers to a type of object and image using a multi-layer structure for detecting at least two wires, and the location of the thief. And the method and system for accurately determining the inner and outer alkali of the side object. Using the simple detection method of 200905189 and the effect of detecting the inner and outer plague of the object in the positive phase, it can effectively solve the various detection techniques currently known, and it is difficult to judge the inner backlight module and the glass base which occur in the object to be tested. A problem with the material on the structure or on the display material of the outer layer. A method for detecting a plague of the inner and outer layers of the present invention, the method comprising the steps of: disposing the object having the wrong rotation on the carrying device, and providing the subtracting-backing wire, and providing the image corresponding to the carrying device After the tender device, the scale device, and the torn position of the object to be tested are corrected, the backlight device is turned on, and the image is removed by the image uncovering device, and the image of the object is obtained at least - total a thief image; then, providing the object to be tested - the surface illuminating device, the surface illuminating device provides - the oblique light of a certain angle to the surface of the body to be _, and the image endering device is obtained by linearly moving the sweeping device The object to be tested - the surface of the contact image; the last 'by the electro-transformation unit' sub-filament image and surface fatigue image 'and the total image subtracted from the surface of the thief count, the income is the inner layer of the object to be tested . The detection system of the present invention includes at least a backlight device, at least one surface illumination device, at least an image capture device, a carrier device with respect to the image capture device, a gift and a computer analysis unit; The device side reads the object to be tested, and the backlight 'surface illumination device' is a linear concentrating illumination device that provides 200905189 object-specific angle oblique _light for surface illumination of the object; image processing It also includes at least - linear image sensor and -Dayan optical lens, which produces the total plague image and surface thief image of the object; Cheng Jian set the side _ _ the object to be tested; The device, the domain can perform the linear translation action; the computer solution fresh element is connected to the image couching device, and the thief image and the surface mad image are obtained. This method and system can be used in any combination of backlight module detection, liquid crystal module detection, liquid crystal panel detection, and plasma TV panel detection. The advantages and spirit of the present invention will be understood from the following detailed description of the invention and the appended claims. [Embodiment]: The method of detecting and detecting the inner and outer sputum is performed on the side, and the inner and outer layers of the object to be tested are discriminated by using at least two light source detections. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS As described in the accompanying drawings, the present invention is a schematic diagram of an overall structure of a preferred embodiment of the present invention. As shown in the first figure, the detection system includes a shadow capture device 1 - a carrier device 12 , a ^ 200905189 device 13 , a camphor analysis unit ^ a linear spotlight illumination device 16, and an electronic image capture device. The device u is combined with a wired image sensor (the figure is not: 丨; ^ wild optical lens (the figure is not shown to have a multi-layer structure 'Ί 14 _ after scanning' to obtain its image. The 12-series corresponds to the lower side of the image capturing device u, and the heart-shaped group 14 having a multi-layer structure is disposed on the I-device 13 of the carrying device 12, and the backlight device may be a cold cathode lamp, an n-body or The other illuminating source may also be a backlight device of the multi-layer structure to be tested, and having a multi-layer structure, which can provide a multi-layer structure, so that the nano-device 11 has a plurality of layers, The total image of the module to be tested 14 is constructed. ^The image-forming device U is lacking on the Lang 15 and the miscellaneous linear translation side, so that the module to be tested having a multi-layer structure can be scanned, and the image is taken.补 补 11 11 © © gantry on the 'bearing to carry the multi-layer structure of the module to be tested Μ bearing The device is for the county's tender device, and the image of the 娜 之 之 辑 辑 辑 辑 辑 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细 细The backlight provided by the backlight device can be used to obtain the image of the module under test 4 by the whole picture capture. The linear spotlight illumination device 16 can be set at lang 15 other suitable positions to provide - specific The oblique angle of the angle _ light sighs 200905189 π which is shot on the module to be tested 14 having a multi-layer structure can be used to image the module to be tested i4 having a multi-layer structure = image = surface 。. The image is connected to the image capturing device 11, and the image can be used to obtain the layered crane. The method for detecting the internal and external snoring is a schematic diagram of the method for detecting the inner and outer sputum. As shown in the second figure, the device 13' is first opened by the image device u, and the image 14 is read, and the first device 13 is turned on, and then the linear concentrating device 16 is turned on. The angle of the two angles is ambiguous, riding on a multi-layer structure $ = face-in: 透 _ _ device 11 pairs of multi-layer _ ^ ^ modulo t to obtain a surface fatigue image information 22, using a computer to analyze a single 7G π f 彡 image processing analysis, Qing 瑕 瑕 彡 彡 资讯21 瑕疵 position 31 and table _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The invention also discloses a method for detecting the inner and outer sputum, please refer to the third figure=the figure is the invention-species 瑕 瑕 瑕 检测 detection method and system flow step 810 and step 82 , Multi-layer structure to be tested 11 200905189 The object 14 is stably placed on the pre-wired position of the carrier 12; and an image capturing device U is provided, the position of which corresponds to the bearing device 12; steps 830 and 840 And setting the image capturing device u to be initialized; and correcting the relative position of the image capturing device and the object to be tested 14 having the multi-layer structure Z; and as shown in step 85, turning on the two backlight device 13 Image grabbing device η, sweeping in a linear motion The method of obtaining the total image information 22 of the object 14 having the multi-layer structure; as shown in steps 860 and 870, providing a specific angle of oblique light by using a linear concentrating illumination device 16 to illuminate the multi-layer structure The surface of the object 14 to be tested is further processed by the image capturing device u to obtain the surface image information 23 of the object 14 having the multi-layer structure; and finally, as shown in step 880, the analysis processing is performed. The total plaque image information 22 and the surface 瑕疵 image information 23 are used to deduct the total 瑕疵 image information 22 from the surface 瑕疵 image information 23, which is the inner layer of the object 14 to be tested. Because the information corresponding to different light sources is different, the light source lighting manner is not divided into sequential steps. Therefore, in the above step, after step 84, steps 860 and 870 may be performed to obtain the multilayer structure. The surface of the object to be tested is mad, and then step 850 is performed to obtain the total plague image of the object to be tested; finally, 'still as 510, after analyzing and processing the total sputum image and the surface mad image, the test is obtained. The inner plague of the object. In summary, when the invention of the case has been industrially useful, novel
V 性及進步性，符合發明專利要件。惟以上所述者，僅為本 發明之較佳實施例而已，並非用來限定本發明實施之範 圍。及凡本發明申請專利範圍所做的均等變化與修飾，皆 12 200905189 為本發明專利範圍所涵蓋。 【圖式簡單說明】 第一圖，為本發明-種判別内外層秘的檢測系統之 較佳實施例的整體結構示意圖 第-圖係為本發明一種判別内外層瑕庇的檢測方法與 系統之較佳實施例的掃描瑕疫示意圖 第二圖 係為本發明一種判別内外層瑕疵的檢測方法之 較佳實施例的流程圖 【主要元件符號說明】 11 12 13 14 15 16 17 21 22 23 31 32 33 810-880 影像擷取裝置 承載裝置 背光裝置 具有多層結構之待測物體 龍門 線性聚光照明展置 電腦解析單元 總瑕疵影像資訊 表面瑕疲影像資訊 内層瑕疵資訊 總瑕疲位置 表面瑕疲位置 内層瑕疫位置 步驟編號 13V and progress, in line with the invention patent requirements. The above is only the preferred embodiment of the invention, and is not intended to limit the scope of the invention. And the equivalent changes and modifications made by the scope of the patent application of the present invention are all covered by the scope of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS The first figure is a schematic view of a preferred embodiment of a detection system for discriminating inner and outer layers. The first diagram is a method and system for detecting the inner and outer layers of the present invention. The second schematic diagram of the scanning plague of the preferred embodiment is a flow chart of a preferred embodiment of the method for detecting the inner and outer ridges of the present invention. [Main component symbol description] 11 12 13 14 15 16 17 21 22 23 31 32 33 810-880 Image capture device carrier backlight device with multi-layer structure of the object to be tested gantry linear concentrating illumination display computer analysis unit total 瑕疵 image information surface fatigue image information inner layer 瑕疵 information total fatigue position surface fatigue position inner layer Plague Location Step No. 13