JP2012098131A - Light distribution property measuring device, light distribution property inspection device, light distribution property measuring program, light distribution property measuring method and light distribution property inspection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a light distribution property measuring device, light distribution property inspection device, light distribution property measuring program, light distribution property measuring method and light distribution property inspection method in which a light distribution property of a light source that becomes a measuring target or an inspection target is instantaneously measured or determined to fast inspect the light source in a production line and to accurately measure a radiation intensity of the light source that may change with the passage of time.SOLUTION: A light distribution property measuring device 100 includes a hemispherical diffusion panel 30 which is formed in a hemispherical shape so as to cover a light source 10 and disposed in such a manner that an apex of the hemisphere matches a central axis of the light source 10, an imaging apparatus 50 which images light radiated from the light source 10 and transmitted through the hemispherical diffusion panel 30, vertical light intensity extraction means 61 which extracts an X-axis vertical light intensity and a Y-axis vertical light intensity, and radiation strength calculation means 63 which converts the X-axis vertical light intensity and the Y-axis vertical light intensity into an X-axis cross-sectional radiation strength and a Y-axis cross-sectional radiation strength.

Description

  The present invention relates to a light distribution characteristic measurement apparatus, a light distribution characteristic inspection apparatus, a light distribution characteristic measurement program, a light distribution characteristic measurement method, and a light distribution characteristic inspection method for measuring or inspecting a light distribution characteristic of a light source.

  When inspecting the relationship between the radiation intensity and the radiation direction of a light source such as an LED, that is, the quality of the light distribution characteristic, it is first necessary to accurately measure the radiation intensity of the light source. In such measurement of radiation intensity, the concept of photometry is the same as that of general photometry, and attention should be paid to visibility correction using color correction coefficients, photometry distance, removal of ambient reflected light, etc. .

  However, in the measurement of the radiation intensity, it is necessary to measure the radiation intensity of the light emitted from the light source from the direction where the angles are sequentially changed. Therefore, in the conventional inspection of light distribution characteristics, for example, as described in Patent Document 1, a method in which a light source is fixed and a photometer rotates around the light source is used, or a photometer is fixed and its surroundings are used. The radiation intensity of the light source was measured using a method in which the light source was rotated.

JP 2008-70290 A

  However, the conventional light distribution characteristic inspection methods such as Patent Document 1 must measure the radiation intensity from a plurality of directions with different angles with respect to one light source. It was unsuitable for high-speed and instantaneous inspection. Further, when an LED used as a light source is lit for a long time, the radiation intensity changes due to self-heating. Therefore, when the radiation intensity is measured from a plurality of directions while changing the angle as in the prior art, there is a problem in that the radiation intensity of the light source changes during the measurement and cannot be measured accurately.

  The present invention has been made in view of the above problems, and can quickly inspect a light source in a production line by measuring or determining a light distribution characteristic of a light source to be measured or inspected instantaneously. Another object is to provide a light distribution characteristic measurement device, a light distribution characteristic inspection device, a light distribution characteristic measurement program, a light distribution characteristic measurement method, and a light distribution characteristic inspection method capable of accurately measuring the radiation intensity of the light source. To do.

  In order to solve the above problems, the light distribution characteristic measurement device according to the present invention is formed in a hemispherical shape so as to cover the upper part and the periphery of the light source conveyed to a predetermined measurement position, and the vertex of the hemisphere is the central axis of the light source. A hemispherical diffuser plate disposed so as to coincide with the hemispherical diffuser plate, and disposed at a predetermined interval above the hemispherical diffuser plate, and disposed so that an optical axis coincides with a central axis of the light source. And an image processing device that performs predetermined processing on an image captured by the imaging device, and that measures light distribution characteristics of the light source. An optical characteristic measurement device, wherein the image processing device is on an X-axis and a Y-axis on the basis of a central pixel of the image among vertical light intensities corresponding to pixel values of an image captured by the imaging device. X-axis vertical light showing the vertical light intensity at Vertical light intensity extracting means for extracting a predetermined number of degrees and Y axis vertical light intensity, and X indicating a position corresponding to the pixel from which the X axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device The X-axis vertical light intensity according to the vertical distance to the axis-corresponding position, the distance from the X-axis corresponding position to the light source, and the distance from the X-axis corresponding position to the installation surface of the light source. Y-axis correspondence indicating the position corresponding to the pixel from which the Y-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device while converting to the X-axis sectional radiation intensity indicating the sectional radiation intensity at the X-axis corresponding position The Y-axis vertical light intensity is converted to the Y-axis according to the vertical distance to the position, the distance from the Y-axis corresponding position to the light source, and the distance from the Y-axis corresponding position to the installation surface of the light source. In corresponding position A radiation intensity calculating means for converting the Y-axis cross-sectional radiation intensity showing a kick sectional radiation intensity, and configured to include a.

  According to such a configuration, the light distribution characteristic measuring apparatus uses the radiant intensity calculation means to calculate the vertical light intensity in the vertical direction on the X axis and the Y axis extracted by the vertical light intensity extraction means with reference to the light source. It is possible to convert the radiation intensity to a predetermined angle. Therefore, the light distribution characteristic inspection device can easily acquire the value of the radiation intensity of the light source simply by imaging the light emitted from the light source with the imaging device.

  Further, in the light distribution characteristic measuring apparatus according to the present invention, the radiation intensity calculating means calculates the X-axis cross-sectional radiation intensity by the following formula (1), and the Y-axis cross-sectional radiation intensity by the following formula (2). It is preferable to calculate.

Here, in Formula (1) and Formula (2), W _x is the X-axis cross-sectional radiation intensity, W _y is the Y-axis cross-sectional radiation intensity, w _x is the X-axis vertical light intensity, and w _y is the Y-axis vertical light intensity, d is the distance from the imaging device to the apex of the hemispherical diffuser plate, r is the radius of the hemispherical diffuser plate, θ is the X-axis corresponding position or Y-axis corresponding position and the virtual line connecting the light source to the X-axis corresponding position or The angle between the vertical line connecting the Y-axis corresponding position and the light source installation surface is shown.

  According to such a configuration, the light distribution characteristic measurement device uses the radiation intensity calculation means to calculate the vertical distance from the imaging device to the X-axis corresponding position or the Y-axis corresponding position and the cosine value (X-axis corresponding position or Vertical light intensity extraction means based on the imaginary line connecting the Y-axis corresponding position and the light source to the X-axis corresponding position or the vertical line connecting the Y-axis corresponding position and the light source installation surface) In order to convert the vertical light intensity extracted in step 1 into a radiation intensity at a predetermined angle with respect to the light source, it is possible to easily obtain the value of the light intensity of the light source simply by imaging the light emitted from the light source with an imaging device. be able to.

  In order to solve the above problems, a light distribution characteristic inspection apparatus according to the present invention includes a light distribution characteristic measuring apparatus and a light distribution characteristic for determining whether the light distribution characteristic measured by the light distribution characteristic measuring apparatus is good or bad. A light distribution characteristic inspection apparatus comprising: a determination means, wherein the light distribution characteristic determination means measures the X-axis cross-section radiation intensity and the Y-axis cross-section radiation intensity measured by the radiation intensity calculation means of the light distribution characteristic measurement device. Is determined to be within the range of the upper and lower limit values of the X-axis cross-sectional radiation intensity and the Y-axis cross-sectional radiation intensity prepared in advance, so that the light source on the X-axis and the Y-axis The light distribution characteristic determining means for determining the quality of the light distribution characteristic is provided.

  According to such a configuration, the light distribution characteristic inspection device can easily acquire the value of the light intensity of the light source simply by imaging the light emitted from the light source with the imaging device. The quality can be determined with higher accuracy.

  Further, in order to solve the above problems, a light distribution characteristic measurement program according to the present invention emits light transmitted from a light source conveyed to a predetermined measurement position and transmitted through a hemispherical diffusion plate covering the upper part and the periphery of the light source. In order to measure the light distribution measurement of the light source from the imaged image captured by the imaging device, a computer is used to detect the image of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device. Vertical light intensity extracting means for extracting a predetermined number of X-axis vertical light intensity and Y-axis vertical light intensity indicating vertical light intensity on the X-axis and Y-axis with respect to the central pixel, and the hemisphere from the imaging device A vertical distance to the X-axis corresponding position indicating a position corresponding to the pixel from which the X-axis vertical light intensity is extracted on the cylindrical diffuser, a distance from the X-axis corresponding position to the light source, and the X-axis correspondence The X-axis vertical light intensity is converted into an X-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the position corresponding to the X-axis according to the distance from the light source to the installation surface of the light source, and from the imaging device to the hemisphere From the vertical distance to the Y-axis corresponding position indicating the position corresponding to the pixel from which the Y-axis vertical light intensity is extracted on the cylindrical diffuser, the distance from the Y-axis corresponding position to the light source, and the Y-axis corresponding position A function to function as radiation intensity calculating means for converting the Y-axis vertical light intensity into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position according to the distance to the installation surface of the light source; did.

  According to such a configuration, the light distribution characteristic measurement program uses the radiant intensity calculation unit to calculate the vertical light intensity in the vertical direction on the X axis and the Y axis extracted by the vertical light intensity extraction unit, using the light source as a reference. It is possible to convert the radiation intensity to a predetermined angle. Therefore, the light distribution characteristic inspection device can easily acquire the value of the radiation intensity of the light source simply by imaging the light emitted from the light source with the imaging device.

  Further, in order to solve the above problems, a light distribution characteristic measuring method according to the present invention is a light distribution characteristic measuring method for measuring a light distribution characteristic of a light source to be measured, wherein a central axis of the light source is determined by a handler. A light source transporting step for transporting the light source so as to coincide with the vertex of the hemisphere of the hemispherical diffusion plate and the optical axis of the imaging device; and the light irradiated from the light source by the imaging device and transmitted through the hemispherical diffusion plate Of the vertical light intensity corresponding to each pixel value of the image picked up by the image pickup device by the vertical light intensity extraction means on the X axis and the Y axis on the basis of the central pixel of the image X-axis vertical light intensity and Y-axis vertical light intensity indicating the vertical light intensity in the image are extracted from the imaging device onto the hemispherical diffuser plate by a vertical light intensity extracting step for extracting a predetermined number of each and a radiation intensity calculating means. The vertical distance to the X-axis corresponding position indicating the position corresponding to the pixel from which the X-axis vertical light intensity is extracted, the distance from the X-axis corresponding position to the light source, and the installation surface of the light source from the X-axis corresponding position According to the distance to the X-axis, the X-axis vertical light intensity is converted into an X-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the X-axis corresponding position, and the Y on the hemispherical diffuser plate from the imaging device. The vertical distance to the Y-axis corresponding position indicating the position corresponding to the pixel from which the axis vertical light intensity is extracted, the distance from the Y-axis corresponding position to the light source, and the Y-axis corresponding position to the installation surface of the light source According to the distance, a radiation intensity calculation step of converting the Y-axis vertical light intensity into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position is performed.

  According to such a procedure, in the light distribution characteristic measuring method, the vertical light intensity in the vertical direction on the X axis and the Y axis extracted by the vertical light intensity extracting means by the radiation intensity calculating means is used as a reference for the light source. It is possible to convert the radiation intensity to a predetermined angle. Therefore, the light distribution characteristic inspection device can easily acquire the value of the radiation intensity of the light source simply by imaging the light emitted from the light source with the imaging device.

  In order to solve the above problems, a light distribution characteristic inspection method according to the present invention is a light distribution characteristic inspection method for inspecting a light distribution characteristic of a light source to be inspected. A light source transporting step for transporting the light source so as to coincide with the vertex of the hemisphere of the hemispherical diffusion plate and the optical axis of the imaging device; and the light irradiated from the light source by the imaging device and transmitted through the hemispherical diffusion plate Of the vertical light intensity corresponding to each pixel value of the image picked up by the image pickup device by the vertical light intensity extraction means on the X axis and the Y axis on the basis of the central pixel of the image X-axis vertical light intensity and Y-axis vertical light intensity indicating the vertical light intensity in the image are extracted from the imaging device onto the hemispherical diffuser plate by a vertical light intensity extracting step for extracting a predetermined number of each and a radiation intensity calculating means. The vertical distance to the X-axis corresponding position indicating the position corresponding to the pixel from which the X-axis vertical light intensity is extracted, the distance from the X-axis corresponding position to the light source, and the installation surface of the light source from the X-axis corresponding position According to the distance to the X-axis, the X-axis vertical light intensity is converted into an X-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the X-axis corresponding position, and the Y on the hemispherical diffuser plate from the imaging device. The vertical distance to the Y-axis corresponding position indicating the position corresponding to the pixel from which the axis vertical light intensity is extracted, the distance from the Y-axis corresponding position to the light source, and the Y-axis corresponding position to the installation surface of the light source In accordance with the distance, the Y-axis vertical light intensity is converted into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position, and the light distribution characteristic determination unit converts the radiation intensity calculation step. X-axis cross section It is determined whether the radiant intensity is within the range of the upper and lower limits of the X-axis cross-sectional radiation intensity prepared in advance, and the converted Y-axis cross-sectional radiant intensity is the Y-axis cross-sectional radiant intensity prepared in advance. The light distribution characteristic determining step of determining whether the light distribution characteristic on the X axis and the Y axis of the light source is good or not is determined by determining whether or not the value is within the range of the upper and lower limit values.

  According to such a procedure, in the light distribution characteristic inspection method, the vertical light intensity in the vertical direction on the X axis and the Y axis extracted by the vertical light intensity extraction means by the radiation intensity calculation means is used as a reference for the light source. It is possible to convert the radiation intensity to a predetermined angle. Accordingly, the light distribution characteristic inspection device can easily obtain the value of the light intensity of the light source by simply capturing the light emitted from the light source with the image pickup device, and therefore, the quality of the light distribution characteristic can be determined with higher accuracy. can do.

  According to the light distribution characteristic measurement device, the light distribution characteristic inspection device, the light distribution characteristic measurement program, the light distribution characteristic measurement method, and the light distribution characteristic inspection method according to the present invention, there is no need to measure the radiation intensity of the light source for each angle. Since it is only necessary to perform measurement once from one direction for one light source, the light distribution characteristic of the light source to be inspected can be determined instantaneously, and the light source in the production line can be inspected at high speed. In addition, according to the light distribution characteristic measurement device, the light distribution characteristic inspection device, the light distribution characteristic measurement program, the light distribution characteristic measurement method, and the light distribution characteristic inspection method according to the present invention, the radiation intensity is obtained by imaging light at a certain angle. Since it calculates, the radiation intensity of a light source can be measured correctly.

It is a perspective view which shows the whole structure of the light distribution characteristic measuring apparatus and light distribution characteristic inspection apparatus which concern on embodiment of this invention. It is a block diagram which shows the internal structure of the image processing apparatus with which the light distribution characteristic measuring apparatus which concerns on embodiment of this invention is provided. It is a figure for demonstrating the processing content of the vertical light intensity extraction means with which the light distribution characteristic measuring apparatus and light distribution characteristic inspection apparatus which concern on embodiment of this invention are provided. It is a figure for demonstrating the processing content of the radiation intensity calculation means with which the light distribution characteristic measuring apparatus and light distribution characteristic inspection apparatus which concern on embodiment of this invention are provided. It is the schematic which shows the radiation intensity distribution figure which plotted the radiation intensity computed by the radiation intensity calculation means with which the light distribution characteristic measuring apparatus and light distribution characteristic inspection apparatus which concern on embodiment of this invention are equipped for every radiation angle, (a ) Is an X-axis cross-sectional radiation intensity distribution diagram, and (b) is a Y-axis cross-sectional radiation intensity distribution diagram. It is the schematic which shows an example of the light distribution characteristic distribution measured by the light distribution characteristic measuring apparatus and light distribution characteristic inspection apparatus which concern on embodiment of this invention. It is a block diagram which shows the internal structure of the image processing apparatus with which the light distribution characteristic measuring apparatus which concerns on embodiment of this invention is provided, and the internal structure of a light distribution characteristic determination means. It is a figure for demonstrating the processing content by the light distribution characteristic determination means with which the light distribution characteristic inspection apparatus which concerns on embodiment of this invention is provided, (a) is a figure which shows the determination process of the light distribution characteristic on an X-axis. (B) is a figure which shows the determination process of the light distribution characteristic on a Y-axis.

  Hereinafter, a light distribution characteristic inspection apparatus 200 according to an embodiment of the present invention will be described with reference to the drawings. It should be noted that the size and positional relationship of the members shown in each drawing may be omitted or exaggerated for clarity of explanation. Further, in the following description, the same name and reference sign indicate the same or the same members in principle, and the detailed description will be omitted as appropriate.

  The light distribution characteristic inspection apparatus 200 inspects the light distribution characteristic of the light source 10 to be inspected. As shown in FIG. 7 to be described later, the light distribution characteristic inspection apparatus 200 includes a light distribution characteristic measurement apparatus 100 and a light distribution characteristic determination unit 110 as independent components. In the following description, after first describing the configuration of the light distribution characteristic measuring apparatus 100, the configuration of the light distribution characteristic determination unit 110 will be described.

<Light distribution characteristic measuring device>
The light distribution characteristic measuring device measures the light distribution characteristic of a light source to be measured. As shown in FIG. 1, the light distribution characteristic measuring apparatus 100 includes a handler 20, a hemispherical diffuser plate 30, an external light blocking box 40, an imaging device 50, an image processing device 60, a lighting power source 70, and a PC 80. And as a main configuration. In FIG. 1, for convenience of explanation, the hemispherical diffusion plate 30 and the external light blocking box 40 are shown in a cross-sectional view. Hereinafter, each configuration will be described in detail.

  The light source 10 is a light irradiation source to be measured by the light distribution characteristic measuring apparatus 100. The light source 10 is specifically composed of an LED (Light Emitting Diode), but its shape, size, wavelength, etc. are not particularly limited. As shown in FIG. 1, in the light source 10, the lead frame 11 is fixed to the transport mechanism 21 via a fixing member (not shown), and the transport mechanism 21 is transported one by one to a predetermined measurement position. It is configured. The predetermined measurement position means a position where the central axis of the light source 10 coincides with the hemispherical apex (zenith) of the hemispherical diffuser plate 30 and the optical axis of the imaging device 50, as shown in FIG. is doing. As shown in FIG. 1, the light source 10 is configured such that the lead frame 11 is electrically connected to a lighting power source 70 and is lit according to a lighting current from the lighting power source 70.

  The handler 20 conveys the light source 10 to a predetermined measurement position, and classifies the measured light source 10 according to light distribution characteristics. As illustrated in FIG. 1, the handler 20 includes a transport mechanism 21, a grip unit (not shown), and a control unit 22.

  The transport mechanism 21 transports the plurality of light sources 10 one by one to a predetermined measurement position according to instructions from the control unit 22. In addition, the gripping unit fixes (clamps) the light source 10 according to an instruction from the control unit 22 so that the light source 10 is perpendicular to the installation surface (fixed surface). The control unit 22 controls the operations of the transport device 21 and the gripping unit, and instructs the light source 10 to turn on.

  Specifically, when the operation of the light distribution characteristic measuring apparatus 100 starts, the control unit 22 generates a measurement start instruction and outputs the measurement start instruction to the lighting power source control unit 66 as shown in FIG. 10 is turned on. Moreover, the control part 22 produces | generates a conveyance instruction | indication, and conveys the light source 10 used as a measuring object to a predetermined | prescribed measurement position by outputting this to the conveyance mechanism 21. FIG. When the measurement of the light distribution characteristics of the light source 10 is completed and the measurement result is input from the radiation intensity calculation means 63 to the handler 20 as shown in FIG. The transport mechanism 21 is controlled so as to transport to the measurement position. Further, the control unit 22 controls the transport mechanism 21 so as to rank the light sources 10 according to the light distribution characteristics according to the measurement results described above, and transport the measured light sources 10 to a predetermined storage location where the light sources 10 are stored according to rank. .

  The hemispherical diffusion plate 30 is for projecting the light emitted from the light source 10 and diffusing it around. The hemispherical diffusion plate 30 is formed, for example, by bending a glass or resin plate having a predetermined thickness into a hemispherical shape. Although not shown, the hemispherical diffuser plate 30 is sandblasted on the entire inner surface and has fine irregularities formed on the inner surface. The hemispherical diffuser plate 30 is configured not only to project the light emitted from the light source 10 but also to diffuse it around by the unevenness.

  As shown in FIG. 1, the hemispherical diffusion plate 30 is formed in a hemispherical shape and is installed so as to cover the upper part and the periphery of the light source 10 conveyed to a predetermined measurement position by the conveyance mechanism 21. Further, as shown in FIG. 1, the hemispherical diffusion plate 30 is arranged so that the apex of the hemisphere coincides with the central axis of the light source 10 at the measurement position of the transported light source 10. Note that the hemispherical diffuser plate 30 is disposed above the light source 10 being conveyed by a predetermined distance because the directivity angle does not exceed 180 ° when the measurement target is an LED.

  The external light blocking box 40 is for blocking the light irradiation area of the light source 10 from external light. For example, as shown in FIG. 1, the external light blocking box 40 is formed in a box shape and is disposed so as to cover the upper part and the periphery of the hemispherical diffusion plate 30. The light distribution specific measuring apparatus 100 can accurately capture only the light of the light source 10 to be inspected by the imaging apparatus 50 described later by blocking the external light by the external light blocking box 40 in this way.

  The imaging device 50 captures light emitted from the light source 10. Specifically, as shown in FIG. 1, the imaging device 50 images light that is emitted from the light source 10 and transmitted through the hemispherical diffusion plate 30. Specifically, the imaging device 50 is configured by a general color camera such as a CCD camera, and is configured to output captured image data to the image processing device 60 as shown in FIG. .

  As shown in FIG. 1, the imaging device 50 is installed above the hemispherical diffusion plate 30 at a predetermined interval. The interval between the imaging device 50 and the apex of the hemispherical diffusion plate 30 can be arbitrarily set according to the measurement conditions. As shown in FIG. 1, the imaging device 50 is installed through the upper part of the external light blocking box 40. Further, as shown in FIG. 1, the imaging device 50 is arranged so that the optical axis thereof coincides with the apex of the hemispherical diffusion plate 30 and the central axis of the light source 10.

  The image processing device 60 measures light distribution characteristics of the light source 10 by performing predetermined processing on the image captured by the imaging device 50. Specifically, as shown in FIG. 2, the image processing device 60 mainly includes a vertical light intensity extraction unit 61, an extraction condition storage unit 62, a radiation intensity calculation unit 63, and a lighting power source control unit 66. It is provided as a configuration. Hereinafter, each configuration will be described in detail.

  The vertical light intensity extraction means 61 is for extracting the vertical light intensity from the image captured by the imaging device 50. Specifically, as shown in FIG. 2, the vertical light intensity extraction unit 61 refers to the pixel value of each pixel of the image data captured by the imaging device 50 to obtain the vertical light intensity corresponding to the pixel value. Extract. Further, the vertical light intensity extraction means 61 includes an X-axis vertical light intensity indicating vertical light intensity on the X-axis with respect to the center pixel of the image, among the vertical light intensity corresponding to each pixel value, and the center pixel of the image. A predetermined number of Y-axis vertical light intensities indicating the vertical light intensity on the Y-axis are extracted.

  As shown in FIG. 3, the vertical light intensity extracting means 61 preferably extracts the vertical light intensity at the intersection point between the X axis and the radiation intensity contour line at a predetermined angular interval as the X axis vertical light intensity. Further, it is preferable that the vertical light intensity extraction unit 61 extracts the vertical light intensity at the intersection point between the Y axis and the radiation intensity contour line at a predetermined angular interval as the Y-axis vertical light intensity.

  Here, the figure shown in the upper part of FIG. 3 is an image obtained by imaging the hemispherical diffuser plate 30 from above, with contour lines added concentrically. 3 shows an X-axis cross section (radiation intensity contour line on the X-axis) when the diagram shown in the upper part of FIG. 3 is stereoscopically viewed. In addition, the Y-axis cross section (radiation intensity contour line on the Y-axis) when the diagram shown in the upper part of FIG. For example, “X + 45 °” in the diagram shown in the upper part of FIG. 3 indicates a 45 ° position in the plus direction from the apex (zenith) of the hemispherical diffusion plate 30 on the X axis.

  For example, as shown in the lower part of FIG. 3, the vertical light intensity extracting unit 61 calculates the X-axis vertical light intensity and the Y-axis vertical light intensity from the image data when the angular interval of the radiation intensity contour is set to 5 °. Extract 35 each. The angular interval of the radiation intensity contour lines is not particularly limited, and can be arbitrarily set according to the measurement conditions. Further, as shown in FIG. 2, the angular interval between the radiation intensity contour lines is stored in advance in the extraction condition storage means 62 as an extraction condition, and simultaneously with the start of measurement, from the extraction condition storage means 62 to the vertical light intensity extraction means 61. It is configured to be entered.

  As shown in FIG. 2, the vertical light intensity extraction unit 61 receives image data from the imaging device 50 and an extraction condition from the extraction condition storage unit 62. Then, the vertical light intensity extracting means 61 extracts the X-axis vertical light intensity and the Y-axis vertical light intensity from the image data by the method described above, and outputs them to the radiation intensity calculating means 63 as shown in FIG. . Note that the vertical light intensity extraction unit 61 may include a storage unit (not shown) that temporarily stores the image data input from the imaging device 50.

  The extraction condition storage means 62 stores extraction conditions indicating the angular intervals of radiation intensity contour lines. Specifically, the extraction condition storage unit 62 is implemented by a memory, a hard disk, or the like that can store data. As shown in FIG. 2, extraction conditions set by the user from the PC 80 are input to the extraction condition storage means 62, and are output to the vertical light intensity extraction means 61 simultaneously with the start of measurement.

The radiant intensity calculation means 63 converts the vertical light intensity into the cross-sectional radiant intensity. Specifically, as shown in FIG. 4, the radiation intensity calculation means 63 is based on the vertical distance e from the imaging device 50 to the X axis corresponding position P _x on the hemispherical diffusion plate 30 and the X axis corresponding position P _x. The X-axis vertical light intensity is shown in accordance with the distance r to the light source 10 (= the radius r of the hemispherical diffuser plate 30) and the distance b ′ from the X-axis corresponding position _Px to the installation surface f of the light source 10. It converts into the X-axis cross section radiation intensity shown to 5 (a). Further, the radiation intensity calculation unit 63, likewise, the distance r and the vertical distance e from the imaging device 50 to the Y-axis corresponding position P _y in hemispherical diffuser 30 on, the Y axis corresponding position P _y to the light source 10 and the distance b 'from the Y-axis corresponding position P _y to the installation surface f of the light source 10, depending on, converts the Y-axis vertical light intensity in the Y-axis cross-sectional radiation intensity shown in Figure 5 (b).

FIG. 4 is a diagram schematically showing the relationship among the light source 10, the hemispherical diffuser plate 30, and the imaging device 50. In FIG. 5, the vertical axis represents the cross-sectional radiation intensity, and the horizontal axis represents the radiation angle from + 90 ° to −90 ° with respect to the light source 10. Further, the X-axis corresponding position P _x indicates a position on the hemispherical diffusion plate 30 corresponding to the pixel from which the X-axis vertical light intensity is extracted, and the Y-axis corresponding position P _y is the hemispherical diffusion plate 30. The position corresponding to the pixel from which the Y-axis vertical light intensity is extracted is shown. In addition, the X-axis cross-sectional radiation intensity, shows a cross-sectional radiation intensity in the X-axis corresponding position P _x, and the Y-axis cross-sectional radiation intensity, shows a cross-sectional radiation intensity in the Y-axis corresponding position P _y. And the installation surface f has shown the horizontal surface which contact | connected the light-projection surface of the light source 10, as shown in FIG.

The radiant intensity calculating means 63 preferably calculates the X-axis cross-sectional radiant intensity W _x by the following formula (1) and calculates the Y-axis cross-sectional radiant intensity W _y by the following formula (2).

Here, in the above formulas (1) and (2), W _x is the X-axis cross-sectional radiation intensity, W _y is the Y-axis cross-sectional radiation intensity, w _x is the X-axis vertical light intensity, and w _y is the Y-axis vertical light. Intensity, d is the distance from the imaging device 50 to the apex of the hemispherical diffuser plate 30, r is the radius of the hemispherical diffuser plate 30, and θ is the X axis corresponding position _Px or Y axis corresponding position _Py and the light source 10. The angle between the virtual line α and the vertical line β connecting the X-axis corresponding position _Px or the Y-axis corresponding position _Py and the installation surface of the light source 10 is shown.

Equation (1) increases the X-axis vertical light intensity w _x at a predetermined X-axis corresponding position P _x in proportion to the square of the vertical distance e from the imaging device 50 to the X-axis corresponding position P _x , and The X-axis vertical light intensity w is reduced in proportion to the distance ratio cos θ between the distance from the light source 10 to the X-axis corresponding position P _x and the distance from the installation surface f of the light source 10 to the X-axis corresponding position P _{x. x} is converted into X-axis cross-sectional radiation intensity W _x . Further, the formula (2), the Y-axis vertical light intensity w _y in a given Y-axis corresponding position P _y, increases in proportion to the square of the vertical distance e from the imaging device 50 to the Y-axis corresponding position P _y and to decrease in proportion to the distance ratio cosθ and the distance from the installation surface f of the distance and the light source 10 from the light source 10 to the Y-axis corresponding position P _y to Y-axis corresponding position P _y, Y-axis vertical light The intensity w _y is converted into the Y-axis cross-sectional radiation intensity W _y . These are the cosine law that the incident intensity is proportional to the cosine value cos θ when tilted from the light source 10 by a predetermined angle θ, and the radiation intensity from the light source 10 is the square of the distance from the imaging device 50 to the measurement point. This is an application of the inverse square law that is inversely proportional.

According to such a configuration, the light distribution characteristic measuring apparatus 100 uses the radiation intensity calculation unit 63 to determine the vertical distance from the imaging apparatus 50 to the X-axis corresponding position or the Y-axis corresponding position and the cosine value cos θ (X axis corresponding position P _x or Y-axis corresponding position P _y and the light source 10 and the imaginary line connecting the α is, X-axis position corresponding P _x or Y-axis corresponding position P _y and the vertical line connecting the installation surface f of the light source 10 Based on the cosine value cos θ) of the angle θ formed with β, the vertical light intensity extracted by the vertical light intensity extraction means 61 is converted from the light source 10 to a radiation intensity of a predetermined angle with the light source 10 as a reference. The value of the radiant intensity of the light source 10 can be easily acquired simply by imaging the collected light with the imaging device 50.

  As shown in FIG. 2, the X-axis vertical light intensity and the Y-axis vertical light intensity are input to the radiation intensity calculation unit 63 from the vertical light intensity extraction unit 61. Then, the radiation intensity calculation means 63 calculates the X-axis cross-section radiation intensity and the Y-axis cross-section radiation intensity by the method described above, and outputs them to the handler 20 as shown in FIG.

  The lighting power source control means 66 instructs the lighting power source 70 to turn on the light source 10. As shown in FIG. 2, the lighting power control means 66 is instructed to start measurement by the handler 20. Then, as shown in FIG. 2, the lighting power control means 66 generates a lighting instruction based on the measurement start instruction, and outputs this to the lighting power supply 70.

  The lighting power supply 70 is for turning on or off the light source 10. As shown in FIG. 2, a lighting instruction is input to the lighting power source 70 from the lighting power source control unit 66. The lighting power supply 70 supplies a lighting current to the light source 10 to be measured in accordance with the lighting instruction.

  The PC 80 inputs extraction conditions to the extraction condition storage means 62 in accordance with user operations. Further, the PC 80 receives the measurement result of the radiation intensity from the radiation intensity calculation means 63, and the X-axis sectional radiation intensity distribution diagram and the Y-axis sectional radiation intensity distribution diagram as shown in FIG. Thus, the measurement result of the light distribution characteristic can be displayed.

  Further, for example, the PC 80 can convert the measured X-axis cross-sectional radiation intensity or Y-axis cross-sectional radiation intensity into a light distribution characteristic distribution as shown in FIG. 6 and display it on a display monitor (not shown). Here, in FIG. 6, the left and right outer peripheral directions with respect to the vertex of the hemisphere indicate the radiation angle, and the radial direction with reference to the center point of the hemisphere indicates the radiation intensity.

  The light distribution characteristic measuring apparatus 100 having the above-described configuration uses the light source 10 to calculate the vertical light intensity in the vertical direction on the X axis and the Y axis extracted by the vertical light intensity extracting means 61 by the radiation intensity calculating means 63. Can be converted into radiation intensity at a predetermined angle with reference to. Therefore, the light distribution characteristic inspection apparatus 100 can easily obtain the value of the radiation intensity of the light source 10 only by imaging the light emitted from the light source 10 with the imaging apparatus 50.

  Further, according to the light distribution characteristic measuring apparatus 100 according to the present invention, it is not necessary to measure the radiation intensity of the light source 10 for each angle, and it is only necessary to perform a single measurement from one direction with respect to one light source 10, The light distribution characteristics of the light source 10 to be inspected can be determined instantaneously, and the light source 10 in the production line can be inspected at high speed. And according to the light distribution characteristic measuring apparatus 100, since the radiation intensity is calculated by imaging light at a certain angle, the radiation intensity of the light source 10 can be accurately measured.

<Light distribution characteristic judging means>
The light distribution characteristic determining unit 110 determines the quality of the light distribution characteristic measured by the light distribution characteristic measuring apparatus 100. As illustrated in FIG. 7, the light distribution characteristic determination unit 110 functions as a light distribution characteristic inspection apparatus 200 in cooperation with the light distribution characteristic measurement apparatus 100. As shown in FIG. 7, the light distribution characteristic determination unit 110 includes a light distribution characteristic determination unit (light distribution characteristic comparison unit) 64 and a determination condition storage unit 65. Hereinafter, each configuration will be described in detail.

  The light distribution characteristic determining means (light distribution characteristic comparing means) 64 determines (compares) the quality of the light distribution characteristics of the light source 10. Specifically, as shown in FIG. 8A, the light distribution characteristic determining means 64 is based on the X-axis sectional radiation intensity calculated by the radiation intensity calculating means 63 and the X-axis sectional radiation intensity prepared in advance. The lower limit values (upper limit value and lower limit value) are compared to determine whether each of the X-axis cross-sectional radiation intensities is within the range of the upper and lower limit values. Further, as shown in FIG. 8B, the light distribution characteristic determining unit 64 includes the Y-axis cross-sectional radiation intensity calculated by the radiation intensity calculating unit 63, and upper and lower limit values of the Y-axis cross-sectional radiation intensity prepared in advance. To determine whether each of the Y-axis cross-sectional radiation intensities is within the range of the upper and lower limit values.

  In FIG. 8, the vertical axis represents the cross-sectional radiation intensity, and the horizontal axis represents the radiation angle from + 90 ° to −90 ° with respect to the light source 10. In FIG. 8, those plotted with ◯ indicate the X-axis cross-sectional radiation intensity, those plotted with x indicate the upper limit of the X-axis cross-sectional radiation intensity, and those plotted with Δ indicate the lower limit of the X-axis cross-sectional radiation intensity. ing. Further, the upper and lower limit values are not particularly limited, and can be arbitrarily set according to the inspection conditions. Then, as shown in FIG. 7, the upper and lower limit values are stored in advance in the determination condition storage unit 65 as determination conditions, and are input from the determination condition storage unit 65 to the light distribution characteristic determination unit 64 simultaneously with the start of the inspection. It is configured.

  The upper and lower limit values of the X-axis cross-section radiation intensity and the Y-axis cross-section irradiation intensity are radiations that change in advance for each angle of the reference LED by a radiation intensity measurement device (not shown) before the inspection by the light distribution characteristic inspection device 200 is started. It can be determined by measuring the intensity. For example, as an example, the light source 10 is first installed perpendicularly to the installation surface (at an angle of 0 ° with respect to a straight line connecting the installation surface and the hemispherical diffusion plate 30). Then, the radiation intensity is measured with the top of the hemispherical diffusion plate 30 as 100%. Next, the light source 10 is tilted + 5 ° (or −5 °) from the apex, and the radiation intensity is measured with the point as 100%. By repeatedly measuring this in the range from + 90 ° to −90 °, and in the X-axis cross section and the Y-axis cross section, the upper and lower limit values of the X-axis cross-section radiation intensity and the Y-axis cross-section irradiation intensity can be determined. .

  As shown in FIG. 7, the light distribution characteristic determining means 64 receives the X-axis cross-sectional radiation intensity and the Y-axis cross-sectional radiation intensity from the radiation intensity calculating means 63. Then, the light distribution characteristic determining means 64 determines the quality of the X-axis cross-sectional radiation intensity and the Y-axis cross-sectional radiation intensity by the above-described method, and outputs the determination result to the handler 20 as shown in FIG. The light distribution characteristic determining unit 64 may include a storage unit (not shown) that temporarily stores the X-axis sectional radiation intensity and the Y-axis sectional radiation intensity input from the radiation intensity calculating unit 63.

  Note that the determination result may be input from the handler 20 to the PC 80 in the light distribution characteristic inspection apparatus 200. In this case, the PC 80, as the determination result input from the handler 20, determines the result of the determination of the upper and lower limit values of the X-axis cross-sectional radiation intensity distribution as shown in FIG. These determination result diagrams can be displayed on a display monitor (not shown).

  The light distribution characteristic inspection apparatus 200 having the above-described configuration can easily acquire the value of the radiation intensity of the light source 10 simply by imaging the light emitted from the light source 10 with the imaging device 50. The quality of the optical characteristics can be determined with higher accuracy.

<Light distribution characteristic measurement program and light distribution characteristic inspection program>
The light distribution characteristic measurement apparatus 100 and the light distribution characteristic inspection apparatus 200 can be realized by operating a general computer by a program that functions as each of the above-described units and units. This program can be distributed via a communication line, or can be written on a recording medium such as a CD-ROM for distribution.

<Light distribution characteristics measurement method>
Hereinafter, the operation of the light distribution characteristic measuring apparatus 100 according to the embodiment of the present invention, that is, the light distribution characteristic measuring method will be briefly described. The light distribution characteristic measuring method includes a light source transport process, an imaging process, a vertical light intensity extraction process, and a radiation intensity calculation process.

  The light source transport process is a process of transporting the light source 10 to a predetermined measurement position. In the light source transport step, specifically, the transport mechanism 21 is controlled by the handler 20, and the light source 10 is arranged so that the central axis of the light source 10 coincides with the hemispherical apex of the hemispherical diffuser plate 30 and the optical axis of the imaging device 50. 10 is conveyed. And after this light source conveyance process, an imaging process is performed.

  The imaging step is a step of imaging light emitted from the light source 10 that has been transported to a predetermined measurement position in the light source transport step. Specifically, in the imaging step, the imaging device 50 captures the light emitted from the light source 10 and transmitted through the hemispherical diffuser plate 30 to generate image data. Then, after this imaging step, a vertical light intensity extraction step is performed.

  The vertical light intensity extraction step is a step of extracting the vertical light intensity from the image captured in the imaging step. Specifically, in the vertical light intensity extraction step, the X-axis vertical light intensity and the Y-axis vertical light out of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device 50 by the vertical light intensity extraction unit 61. A predetermined number of intensities are extracted. Then, a radiation intensity calculation step is performed after the vertical light intensity extraction step.

  In the vertical light intensity extraction step, as described above, it is preferable to extract the vertical light intensity at the intersection of the X axis and the radiation intensity contour line at a predetermined angular interval as the X axis vertical light intensity. As the light intensity, it is preferable to extract the vertical light intensity at the intersection point between the Y axis and the radiation intensity contour line at a predetermined angular interval (see FIG. 3).

  The radiation intensity calculation process is a process of converting the vertical light intensity extracted in the vertical light intensity extraction process into a radiation intensity. Specifically, in the radiation intensity calculation step, the radiation intensity calculation unit 63 uses the vertical distance from the imaging device 50 to the X-axis corresponding position, the distance from the X-axis corresponding position to the light source 10, and the X-axis corresponding position to the light source 10. The X-axis vertical light intensity is converted into the X-axis cross-sectional radiation intensity in accordance with the distance ratio to the distance to the installation surface. In the radiation intensity calculation step, the vertical intensity from the imaging device 50 to the Y axis corresponding position, the distance from the Y axis corresponding position to the light source 10, and the installation of the light source 10 from the Y axis corresponding position are performed by the radiation intensity calculating means 63. Depending on the distance to the surface, the Y-axis vertical light intensity is converted into the Y-axis cross-sectional radiation intensity.

In the radiation intensity calculating step, as described above, the X-axis sectional radiation intensity W _x is calculated by the following formula (1) by the radiation intensity calculating means 63, and the Y-axis sectional radiation intensity W by the following formula (2). It is preferable to calculate _y (see FIG. 4).

Here, in the above formulas (1) and (2), W _x is the X-axis cross-sectional radiation intensity, W _y is the Y-axis cross-sectional radiation intensity, w _x is the X-axis vertical light intensity, and w _y is the Y-axis vertical light. Intensity, d is the distance from the imaging device 50 to the apex of the hemispherical diffuser plate 30, r is the radius of the hemispherical diffuser plate 30, and θ is the X axis corresponding position _Px or Y axis corresponding position _Py and the light source 10. The angle between the virtual line α and the vertical line β connecting the X-axis corresponding position _Px or the Y-axis corresponding position _Py and the installation surface of the light source 10 is shown.

<Light distribution characteristic inspection method>
Hereinafter, the operation of the light distribution characteristic inspection apparatus 200 according to the embodiment of the present invention, that is, the light distribution characteristic inspection method will be briefly described. The light distribution characteristic inspection method includes performing a light distribution characteristic determination step in addition to the light source conveyance step, the imaging step, the vertical light intensity extraction step, and the radiation intensity calculation step in the light distribution characteristic measurement method described above. It is a feature.

  The light distribution characteristic determination step is a step of determining whether or not the light distribution characteristic of the light source 10 calculated by the radiation intensity calculation step is good. Specifically, in the light distribution characteristic determination step, the light distribution characteristic determination means 64 compares the X-axis cross-sectional radiation intensity with the upper and lower limit values of the X-axis cross-sectional radiation intensity prepared in advance, so that X The quality of the light distribution characteristic on the axis is determined. In the light distribution characteristic determination step, the light distribution characteristic determination unit 64 compares the Y-axis cross-sectional radiation intensity with the upper and lower limit values of the Y-axis cross-sectional radiation intensity prepared in advance, so that the light source 10 on the Y-axis. The quality of the light distribution characteristic is judged.

  The light distribution characteristic measuring apparatus, the light distribution characteristic measuring apparatus, the light distribution characteristic measuring program, the light distribution characteristic measuring method, and the light distribution characteristic inspecting method according to the present invention have been specifically described above by the mode for carrying out the invention. The gist of the present invention is not limited to these descriptions, but should be broadly interpreted based on the description of the scope of claims. Needless to say, various changes and modifications based on these descriptions are also included in the spirit of the present invention.

For example, in the light distribution characteristic measuring apparatus 100 and the light distribution characteristic inspection apparatus 200 described above, the radiation intensity calculating unit 63 calculates the X-axis cross-sectional radiation intensity W _x by the expression (1) and Y by the expression (2). Although it is preferable to calculate the axial cross-sectional radiation intensity W _y , “(d + (r−r cos θ)) ² / cos θ” in the above formula (1) and the above formula (2) is expressed as a constant C _x (θ) and C _y (θ) is calculated in advance, and the radiant intensity calculating means 63 calculates the X-axis cross-sectional radiant intensity W _x by multiplying the X-axis vertical light intensity w _x and the constant C _x (θ), The Y-axis cross-sectional radiation intensity W _y may be calculated by multiplying the Y-axis vertical light intensity w _y by a constant C _y (θ). That is, the radiant intensity calculating means 63 may calculate the X-axis cross-sectional radiant intensity W _x by the following formula (3), and may calculate the Y-axis cross-sectional radiant intensity W _y by the following formula (4). Thereby, the light distribution characteristic measuring apparatus 100 and the light distribution characteristic inspection apparatus 200 can inspect the light source 10 in the production line at a higher speed.

  Further, for example, in the light distribution characteristic measuring apparatus 100 and the light distribution characteristic inspection apparatus 200 described above, as shown in FIGS. 2 and 7, the image processing apparatus 60 includes the lighting power source control unit 66. The lighting power supply control means 66 may be provided to directly control the lighting power supply 70.

  For example, in the light distribution characteristic inspection apparatus 200 described above, the light distribution characteristic measurement apparatus 100 and the light distribution characteristic determination unit 110 have been described as separate configurations as shown in FIG. The means 110 may be configured to be provided inside the image processing apparatus 60 in the light distribution characteristic measuring apparatus 100.

  Further, in the light distribution characteristic measuring apparatus 100 and the light distribution characteristic inspection apparatus 200 described above, as shown in FIG. 1, the hemispherical diffusion plate 30 is disposed above the light source 10 by a predetermined distance. The plate 30 may completely cover the top and the periphery of the light source 10 and form a notch through which the light source 10 to be transported can pass in the transport direction. Alternatively, without forming such a notch, the hemispherical diffusion plate 30, the external light blocking box 40, and the imaging device 50 are moved upward each time the light source 10 is transported to the measurement position so that the light source 10 passes therethrough. You may comprise.

DESCRIPTION OF SYMBOLS 10 Light source 11 Lead frame 20 Handler 21 Conveying mechanism 22 Control part 30 Hemispherical diffusing plate 40 External light blocking box 50 Imaging device 60 Image processing device 61 Vertical light intensity extraction means 62 Extraction condition storage means 63 Radiation intensity calculation means 64 Light distribution characteristic Judgment means (light distribution characteristic comparison means)
65 judgment condition storage means 66 lighting power control means 70 lighting power supply 80 PC
DESCRIPTION OF SYMBOLS 100 Light distribution characteristic measuring apparatus 110 Light distribution characteristic determination means 200 Light distribution characteristic inspection apparatus

Claims (6)

A hemispherical diffusion plate formed in a hemispherical shape so as to cover the upper part and the periphery of the light source conveyed to a predetermined measurement position, and arranged so that the apex of the hemisphere coincides with the central axis of the light source; An imaging device that is installed above the plate at a predetermined interval, is arranged so that an optical axis thereof coincides with a central axis of the light source, and images light emitted from the light source and transmitted through the hemispherical diffusion plate; An image processing device that performs a predetermined process on an image captured by the imaging device, and a light distribution characteristic measuring device that measures a light distribution property of the light source,
The image processing apparatus includes:
Of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device, the X-axis vertical light intensity and the Y-axis indicating the vertical light intensity on the X-axis and the Y-axis with respect to the center pixel of the image Vertical light intensity extracting means for extracting a predetermined number of vertical light intensities, and
A vertical distance to an X-axis corresponding position indicating a position corresponding to a pixel from which the X-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device; a distance from the X-axis corresponding position to the light source; The X-axis vertical light intensity is converted into an X-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the X-axis corresponding position according to the distance from the X-axis corresponding position to the light source installation surface, and the imaging A vertical distance from a device to a Y-axis corresponding position indicating a position corresponding to a pixel obtained by extracting the Y-axis vertical light intensity on the hemispherical diffusion plate, a distance from the Y-axis corresponding position to the light source, and the Y A radiation intensity calculating means for converting the Y-axis vertical light intensity into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position according to a distance from the axis corresponding position to the installation surface of the light source;
A light distribution characteristic measuring apparatus comprising: The said radiation intensity calculation means calculates the said X-axis cross-section radiation intensity by following formula (1), and calculates the said Y-axis cross-section radiation intensity by following formula (2). Light distribution characteristic measuring device.

However, in the formula (1) and (2), _{W x} X-axis cross-sectional radiation intensity, _{W y} is the Y-axis cross-sectional radiation intensity, _{w x} is the X-axis vertical light intensity, _{w y} is the Y-axis vertical light intensity, d Is the distance from the imaging device to the apex of the hemispherical diffusion plate, r is the radius of the hemispherical diffusion plate, θ is the X-axis corresponding position or Y-axis corresponding position and the phantom line connecting the light source and the X-axis corresponding position or Y An angle formed by a vertical line connecting the axis corresponding position and the light source installation surface is shown.
A light distribution characteristic inspection apparatus comprising: the light distribution characteristic measurement apparatus according to claim 1; and a light distribution characteristic determination unit that determines whether the light distribution characteristic measured by the light distribution characteristic measurement apparatus is good or bad. There,
The light distribution characteristic determining means is configured such that the X-axis cross-sectional radiation intensity and the Y-axis cross-sectional radiation intensity measured by the radiation intensity calculating means of the light distribution characteristic measuring device are prepared in advance. A light distribution characteristic determination means for determining whether the light distribution characteristic on the X axis and the Y axis of the light source is good or not by determining whether the value and the upper and lower limit values of the Y-axis cross-sectional radiation intensity are within the range A light distribution characteristic inspection apparatus comprising: The light emitted from the light source transported to a predetermined measurement position and transmitted through the hemispherical diffusion plate covering the top and the periphery of the light source is imaged by the imaging device, and the light distribution measurement of the light source is measured from the captured image Computer to
Of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device, the X-axis vertical light intensity and the Y-axis indicating the vertical light intensity on the X-axis and the Y-axis with respect to the center pixel of the image Vertical light intensity extraction means for extracting a predetermined number of vertical light intensities,
A vertical distance to an X-axis corresponding position indicating a position corresponding to a pixel from which the X-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device; a distance from the X-axis corresponding position to the light source; The X-axis vertical light intensity is converted into an X-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the X-axis corresponding position according to the distance from the X-axis corresponding position to the light source installation surface, and the imaging A vertical distance from a device to a Y-axis corresponding position indicating a position corresponding to a pixel obtained by extracting the Y-axis vertical light intensity on the hemispherical diffusion plate, a distance from the Y-axis corresponding position to the light source, and the Y A radiation intensity calculating means for converting the Y-axis vertical light intensity into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position, depending on a distance from the axis corresponding position to the installation surface of the light source;
A light distribution characteristic measurement program characterized by functioning as A light distribution characteristic measuring method for measuring a light distribution characteristic of a light source to be measured,
A light source transporting step of transporting the light source by the handler so that the central axis of the light source coincides with the hemispherical apex of the hemispherical diffusion plate and the optical axis of the imaging device;
An imaging step of imaging light emitted from the light source and transmitted through the hemispherical diffusion plate by the imaging device;
X indicating the vertical light intensity on the X-axis and the Y-axis with respect to the center pixel of the image, out of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device by the vertical light intensity extraction unit A vertical light intensity extracting step of extracting a predetermined number of the axis vertical light intensity and the Y axis vertical light intensity,
A vertical distance from the imaging device to the X-axis corresponding position indicating the position corresponding to the pixel from which the X-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device, and the X-axis corresponding position from the X-axis corresponding position. Depending on the distance to the light source and the distance from the X-axis corresponding position to the light source installation surface, the X-axis vertical light intensity is changed to the X-axis cross-sectional radiation intensity indicating the cross-sectional radiation intensity at the X-axis corresponding position. The vertical distance from the imaging device to the Y-axis corresponding position indicating the position corresponding to the pixel from which the Y-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device, and from the Y-axis corresponding position to the light source , And the distance from the Y-axis corresponding position to the light source installation surface, the Y-axis vertical light intensity is converted into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position. Release And strength calculation step,
A light distribution characteristic measuring method comprising: A light distribution characteristic inspection method for inspecting a light distribution characteristic of a light source to be inspected,
A light source transporting step of transporting the light source by the handler so that the central axis of the light source coincides with the hemispherical apex of the hemispherical diffusion plate and the optical axis of the imaging device;
An imaging step of imaging light emitted from the light source and transmitted through the hemispherical diffusion plate by the imaging device;
X indicating the vertical light intensity on the X-axis and the Y-axis with respect to the center pixel of the image, out of the vertical light intensity corresponding to each pixel value of the image captured by the imaging device by the vertical light intensity extraction unit A vertical light intensity extracting step of extracting a predetermined number of the axis vertical light intensity and the Y axis vertical light intensity,
A vertical distance from the imaging device to the X-axis corresponding position indicating the position corresponding to the pixel from which the X-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device, and the X-axis corresponding position from the X-axis corresponding position. Depending on the distance to the light source and the distance from the X-axis corresponding position to the light source installation surface, the X-axis vertical light intensity is changed to the X-axis cross-sectional radiation intensity indicating the cross-sectional radiation intensity at the X-axis corresponding position. The vertical distance from the imaging device to the Y-axis corresponding position indicating the position corresponding to the pixel from which the Y-axis vertical light intensity is extracted on the hemispherical diffusion plate from the imaging device, and from the Y-axis corresponding position to the light source , And the distance from the Y-axis corresponding position to the light source installation surface, the Y-axis vertical light intensity is converted into a Y-axis cross-sectional radiation intensity indicating a cross-sectional radiation intensity at the Y-axis corresponding position. Release And strength calculation step,
The light distribution characteristic determining means determines whether the converted X-axis cross-sectional radiation intensity is within the range of upper and lower limits of the X-axis cross-sectional radiation intensity prepared in advance, and the converted Y-axis By determining whether the cross-sectional radiation intensity is within the range of the upper and lower limits of the Y-axis cross-sectional radiation intensity prepared in advance, the quality of the light distribution characteristics on the X-axis and the Y-axis of the light source is determined. A light distribution characteristic determining step,
The light distribution characteristic inspection method characterized by performing.

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