TW200834084A - A high-speed testing card - Google Patents

A high-speed testing card

Info

Publication number
TW200834084A
TW200834084A TW96104511A TW96104511A TW200834084A TW 200834084 A TW200834084 A TW 200834084A TW 96104511 A TW96104511 A TW 96104511A TW 96104511 A TW96104511 A TW 96104511A TW 200834084 A TW200834084 A TW 200834084A
Authority
TW
Taiwan
Prior art keywords
pcb
testing
electronic circuits
frequency
probes
Prior art date
Application number
TW96104511A
Other languages
English (en)
Chinese (zh)
Other versions
TWI317426B (enExample
Inventor
wei-zheng Gu
xin-hong Lin
zhi-hao He
chao-jing Huang
he-hui Lin
shi-chang Wu
Jun-Liang Lai
Original Assignee
Microelectonics Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microelectonics Technology Inc filed Critical Microelectonics Technology Inc
Priority to TW96104511A priority Critical patent/TW200834084A/zh
Publication of TW200834084A publication Critical patent/TW200834084A/zh
Application granted granted Critical
Publication of TWI317426B publication Critical patent/TWI317426B/zh

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW96104511A 2007-02-07 2007-02-07 A high-speed testing card TW200834084A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Publications (2)

Publication Number Publication Date
TW200834084A true TW200834084A (en) 2008-08-16
TWI317426B TWI317426B (enExample) 2009-11-21

Family

ID=44819349

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Country Status (1)

Country Link
TW (1) TW200834084A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (zh) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (zh) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card

Also Published As

Publication number Publication date
TWI317426B (enExample) 2009-11-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees