TW200834084A - A high-speed testing card - Google Patents

A high-speed testing card

Info

Publication number
TW200834084A
TW200834084A TW96104511A TW96104511A TW200834084A TW 200834084 A TW200834084 A TW 200834084A TW 96104511 A TW96104511 A TW 96104511A TW 96104511 A TW96104511 A TW 96104511A TW 200834084 A TW200834084 A TW 200834084A
Authority
TW
Taiwan
Prior art keywords
pcb
testing
electronic circuits
frequency
probes
Prior art date
Application number
TW96104511A
Other languages
Chinese (zh)
Other versions
TWI317426B (en
Inventor
wei-zheng Gu
xin-hong Lin
zhi-hao He
chao-jing Huang
he-hui Lin
shi-chang Wu
Jun-Liang Lai
Original Assignee
Microelectonics Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microelectonics Technology Inc filed Critical Microelectonics Technology Inc
Priority to TW96104511A priority Critical patent/TW200834084A/en
Publication of TW200834084A publication Critical patent/TW200834084A/en
Application granted granted Critical
Publication of TWI317426B publication Critical patent/TWI317426B/zh

Links

Abstract

This invention provides a high-speed testing card. It comprises one first printed circuit board (PCB) and one second PCB. The first PCB is jump-wired with plural signal wires. It is capable of transmitting medium- and low-frequency band testing signals to the multiple first probes. Further, it performs electric testing on electronic devices that are operating in medium- and low-frequency bands in the IC under tested. The second PCB is located above the first PCB and near the center of the first PCB. It is equipped with electronic circuits and adaptor connectors that electrically connect with electronic circuits. The adaptor connectors electrically connect with a testing platform directly. The electronic circuits are capable of transmitting high-frequency testing signal to the multiple second probes to perform high frequency testing on high-speed device in the IC under tested.
TW96104511A 2007-02-07 2007-02-07 A high-speed testing card TW200834084A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Publications (2)

Publication Number Publication Date
TW200834084A true TW200834084A (en) 2008-08-16
TWI317426B TWI317426B (en) 2009-11-21

Family

ID=44819349

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96104511A TW200834084A (en) 2007-02-07 2007-02-07 A high-speed testing card

Country Status (1)

Country Link
TW (1) TW200834084A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (en) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (en) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card

Also Published As

Publication number Publication date
TWI317426B (en) 2009-11-21

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