TW200831600A - Resin composition - Google Patents

Resin composition Download PDF

Info

Publication number
TW200831600A
TW200831600A TW096138028A TW96138028A TW200831600A TW 200831600 A TW200831600 A TW 200831600A TW 096138028 A TW096138028 A TW 096138028A TW 96138028 A TW96138028 A TW 96138028A TW 200831600 A TW200831600 A TW 200831600A
Authority
TW
Taiwan
Prior art keywords
resin
resin composition
mass
composition according
content
Prior art date
Application number
TW096138028A
Other languages
Chinese (zh)
Other versions
TWI455988B (en
Inventor
Shigeo Nakamura
Original Assignee
Ajinomoto Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ajinomoto Kk filed Critical Ajinomoto Kk
Publication of TW200831600A publication Critical patent/TW200831600A/en
Application granted granted Critical
Publication of TWI455988B publication Critical patent/TWI455988B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L67/00Compositions of polyesters obtained by reactions forming a carboxylic ester link in the main chain; Compositions of derivatives of such polymers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4644Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
    • H05K3/4661Adding a circuit layer by direct wet plating, e.g. electroless plating; insulating materials adapted therefor
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/22Di-epoxy compounds
    • C08G59/24Di-epoxy compounds carbocyclic
    • C08G59/245Di-epoxy compounds carbocyclic aromatic
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/32Epoxy compounds containing three or more epoxy groups
    • C08G59/3218Carbocyclic compounds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/24Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/56Organo-metallic compounds, i.e. organic compounds containing a metal-to-carbon bond
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L71/00Compositions of polyethers obtained by reactions forming an ether link in the main chain; Compositions of derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/29Laminated material
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2367/00Characterised by the use of polyesters obtained by reactions forming a carboxylic ester link in the main chain; Derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2463/00Characterised by the use of epoxy resins; Derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J2471/00Characterised by the use of polyethers obtained by reactions forming an ether link in the main chain; Derivatives of such polymers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/003Additives being defined by their diameter
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2463/00Presence of epoxy resin

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Materials Engineering (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Laminated Bodies (AREA)
  • Adhesive Tapes (AREA)
  • Reinforced Plastic Materials (AREA)

Abstract

Disclosed is a resin composition having low thermal expansion, which enables to form a plated conductive layer with sufficient adhesion strength, while suppressing roughness of an insulating layer surface (namely, ensuring low surface roughness of an insulating layer) during a wet roughening process. Specifically disclosed is a resin composition characterized by containing a cyanate ester resin and a naphthol epoxy resin represented by the following formula (1). (In the formula, n represents a number having an average of 1-6; X represents a glycidyl group or a hydrocarbon group having 1-8 carbon atoms; and the ratio of hydrocarbon group/glycidyl group is within the range of 0.05-2.0.)

Description

200831600 九、發明說明 【發明所屬之技術領域】 本發明係關於一種適於形成多層印刷電路板等之絕緣 層的樹脂組成物。 【先前技術】 近年來電子機器之小型化、高性能化進步,多層印刷 電路板爲提高電子零件之安裝密度,而朝導體電路之微細 化邁進。作爲多層印刷電路板之絕緣層使用之樹脂組成物 ,例如已知含有氰酸酯樹脂之樹脂組成物可形成具介電特 性優異之絕緣層。例如,專利文獻1中,揭示含有氰酸酯 樹脂、環氧樹脂及苯氧樹脂之多層印刷電路板用之樹脂組 成物。 作爲於絕緣層上形成高密度之微細電路之方法,已知 有粗化處理絕緣層表面後,於非電解質電鍍( nonelectrolytic plating)形成導體層的加成法(additive process)、或於非電解質電鍍與電解電鍍形成導體層的半 加成法(S e m i - a d d i t i v e p r 〇 c e s s)等。此等技術中,一般經由 以鹼性過錳酸溶液等之氧化劑之濕式粗化,使絕緣層表面 形成粗化面,該粗化面藉由電鍍而形成導體層。此濕式粗 化製程係於絕緣層表面形成較大的物理固定器(anchor), 爲確保與其上所形成之導體層之附著強度的過程。然而, 近年來更期望高密度微細電路的形成,控制絕緣層表面之 粗度使其爲低(粗度大,則其固定器中潛入之電鍍部因蝕 -4- 200831600 刻而沒有被去除,高密度電路形成爲困難之外,亦使其後 之絕緣信賴性顯著地惡化),求得與導體層之足夠的附著 強度仍尙爲重要的課題。又,高密度化電路之多層印刷電 路板係由於因銅電路及絕緣層之熱膨脹係數之不同而容易 •產生裂痕發生等之問題.,故要求亦能控制絕緣層之熱膨脹 •率使其爲低。 〔專利文獻1〕國際公開03/099952號公報 【發明內容】 〔發明之揭示〕 〔發明所欲解決之課題〕 本發明係爲提供含有適於形成絕緣層之氰酸酯樹脂之 樹脂組成物,於濕式粗化製程中一邊控制絕緣層表面之粗 度使其爲低(低粗度)並於可形成具有足夠的附著強度之電 鍍導體層的同時,亦具熱膨脹率優異之樹脂組成物爲目的 〔課題所欲解決之手段〕 本發明人等爲解決上述課題而專心硏討之結果,發現 藉由含有氰酸酯樹脂與特定之萘酣型環氧樹脂之樹脂組成 物所形成之絕緣層,於濕式粗化製程中絕緣層表面爲低粗 度的同時,可形成具有足夠的附著強度之電鍍導體層,又 該絕緣層係亦可具熱膨脹率優異,可適於多層印刷電路板 的製造使用,遂而完成本發明。 -5- 200831600 亦即,本發明係爲含有以下內容。 Π]—種樹脂組成物,其特徵爲含有氰酸酯樹脂及下式(1) 所不之萘醋型環氧樹脂, 【化1】BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin composition suitable for forming an insulating layer of a multilayer printed circuit board or the like. [Prior Art] In recent years, miniaturization and high performance of electronic devices have progressed, and multilayer printed circuit boards have been moving toward miniaturization of conductor circuits in order to increase the mounting density of electronic components. As the resin composition used for the insulating layer of the multilayer printed wiring board, for example, a resin composition containing a cyanate resin is known to form an insulating layer having excellent dielectric properties. For example, Patent Document 1 discloses a resin composition for a multilayer printed wiring board containing a cyanate resin, an epoxy resin, and a phenoxy resin. As a method of forming a high-density fine circuit on an insulating layer, an additive process for forming a conductor layer in nonelectrolytic plating after roughening the surface of the insulating layer, or a non-electrolytic plating is known. A semi-additive method (S emi - additivepr 〇 cess) for forming a conductor layer by electrolytic plating. In these techniques, the surface of the insulating layer is generally roughened by wet roughening with an oxidizing agent such as an alkaline permanganic acid solution, and the roughened surface is formed into a conductor layer by electroplating. This wet refining process is a process in which a large physical anchor is formed on the surface of the insulating layer to ensure adhesion strength to the conductor layer formed thereon. However, in recent years, the formation of a high-density micro-circuit is more desirable, and the thickness of the surface of the insulating layer is controlled to be low (the thickness is large, and the plated portion that is infiltrated in the holder is not removed due to the etch - 200831,600, In addition to the difficulty in forming a high-density circuit and the deterioration of the reliability of the subsequent insulation, it is still an important problem to obtain sufficient adhesion strength with the conductor layer. Further, since the multilayer printed circuit board of the high-density circuit is susceptible to cracking due to the difference in thermal expansion coefficient between the copper circuit and the insulating layer, it is required to control the thermal expansion rate of the insulating layer to be low. . [Patent Document 1] International Publication No. 03/099952 [Draft of the Invention] [Disclosure of the Invention] The present invention provides a resin composition containing a cyanate resin suitable for forming an insulating layer. In the wet roughening process, while controlling the thickness of the surface of the insulating layer to be low (low thickness) and forming an electroplated conductor layer having sufficient adhesion strength, the resin composition having excellent thermal expansion coefficient is OBJECTIVES OF THE INVENTION The inventors of the present invention have focused on the above problems and found an insulating layer formed by a resin composition containing a cyanate resin and a specific naphthoquinone type epoxy resin. In the wet roughening process, the surface of the insulating layer is low in thickness, and an electroplated conductor layer having sufficient adhesion strength can be formed, and the insulating layer can also have excellent thermal expansion rate, and can be suitable for a multilayer printed circuit board. The invention is manufactured and used to complete the present invention. -5- 200831600 That is, the present invention contains the following contents. Π] - a resin composition characterized by containing a cyanate resin and a naphthalene vinegar type epoxy resin of the following formula (1), [Chemical 1]

OX 0XOX 0X

(η作爲平均値表示1〜6之數,X表示環氧丙基或碳數1 〜8之烴基,烴基/環氧丙基之比例爲〇.〇5〜2.0)。 [2] 如上述[1 ]記載之樹脂組成物,其中氰酸酯樹脂之含有 量相對於樹脂組成物(不揮發份100質量%)爲5〜60質量% 〇 [3] 如上述[1]或[2]記載之樹脂組成物,其中式(1)所示之萘 酚型環氧樹脂之含有量相對於樹脂組成物(不揮發份 φ 質量%)爲1〜50質量%。 [4] 如[1]至[3]中任一項記載之樹脂組成物,其中更含有苯 氧樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺 ' 樹脂、聚礪樹脂、聚醚颯樹脂、聚苯醚樹脂、聚碳酸酯樹 * 脂、聚醚醚酮樹脂、聚酯樹脂所選出之1種以上的高分子 樹脂。 [5] 如上述[4]記載之樹脂組成物,其中高分子樹脂之含有 量相對於樹脂組成物(不揮發份1〇〇質量%)爲1〜6〇質量% 200831600 [6]如[4]或[5]記載之樹脂組成物,其中高分子樹脂之重量 平均分子量爲5000〜2 0 0000。 [7 ]如上述[4 ]至[6 ]中任一項記載之樹脂組成物,其中高分 子樹脂爲苯氧樹脂。 [8] 如上述[1]至[7]中任一項記載之樹脂組成物,其中更含 有無機塡充材料。 [9] 如上述[8]記載之樹脂組成物,其中無機塡充材料之含 有量相對於樹脂組成物(不揮發份100質量%)爲50質量% 以下。 [10] 如上述[8]或[9]記載之樹脂組成物,其中無機塡充材 料爲二氧化矽。 [Π]—種黏著薄膜,其係如上述[1]至[10]中任一項記載之 樹脂組成物層形成於支持薄膜上所構成。 [12] —種預浸物,其係如[1]至[1〇]中任一項記載之樹脂組 成物浸漬於由纖維所成之片狀補強基材中而成。 [13] —種多層印刷電路板,其係藉由上述[1]至[10]中任一 項記載之樹脂組成物之硬化物形成絕緣層而成。 〔發明效果〕 若依據本發明,可提供適於形成多層印刷電路板之絕 緣層的樹脂組成物,熱硬化後所形成之絕緣層之熱膨脹率 低、又絕緣層表面爲低粗度的同時,可形成具有足夠的附 著強度之電鍍導體層的樹脂組成物。 200831600 〔實施發明之最佳形態〕 以下,詳細地說明本發明。 本發明中所使用之氰酸酯樹脂係無特別限定者,例如 可列舉酚醛清漆型(酚酚醛清漆型、烷基酚酚醛清漆型等) 氰酸酯樹脂、雙酚型(雙酚A型、雙酚F型、雙酚S型等) 氰酸酯樹脂及此等一部份三曉化之預聚合物等。此等係可 單獨使用,亦可組合2種以上使用。氰酸酯樹脂之重量平 均分子量係無特別限定者,但較佳爲5 0 0〜4 5 0 0、更佳爲 600〜3000 〇 作爲氰酸酯樹脂之具體例,例如可列舉雙酚A二氰酸 酯、聚酚氰酸酯(寡(3-亞甲基-1,5-伸苯基氰酸酯)、4,4,-亞 甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰 酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-二氰酸酯)苯基丙 烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基 苯基)甲烷、1,3-雙(4-氰酸酯苯基-1·(甲基亞乙基))苯、雙 (4-氰酸酯苯基)硫醚、雙(4-氰酸酯苯基)醚等之2官能氰 酸酯樹脂、酚酚醛清漆、甲酚酚醛清漆等所衍生出之多官 能氰酸酯樹脂、此等氰酸酯樹脂一部份三嗪化之預聚合物 等。 作爲市售之氰酸酯樹脂,可列舉下式(2)所示酚酚醛清 漆型多官能氰酸酯樹脂(Lonza Japan(股)製、PT30、氰酸 酯當量124)、下式(3)所示雙酚A二氰酸酯之一部份或全 部被三嗪化,而成三聚物之預聚合物 (Lonza Japan (股) 製、BA230、氰酸酯當量232)等。 200831600(η as an average 値 represents a number of 1 to 6, X represents an epoxy group or a hydrocarbon group having 1 to 8 carbon atoms, and the ratio of a hydrocarbon group to an epoxy group is 〇.〇5 to 2.0). [2] The resin composition according to the above [1], wherein the content of the cyanate resin is 5 to 60% by mass based on the resin composition (100% by mass of the nonvolatile matter) [3] as described above [1] In the resin composition according to the above [2], the content of the naphthol type epoxy resin represented by the formula (1) is from 1 to 50% by mass based on the resin composition (nonvolatile content φ% by mass). [4] The resin composition according to any one of [1] to [3] which further comprises a phenoxy resin, a polyimine resin, a polyamidimide resin, a polyether quinone imide resin, One or more polymer resins selected from the group consisting of polybenzazole resin, polyether oxime resin, polyphenylene ether resin, polycarbonate resin, polyether ether ketone resin, and polyester resin. [5] The resin composition according to the above [4], wherein the content of the polymer resin is 1 to 6 〇 mass% with respect to the resin composition (nonvolatile content: 1% by mass) 200831600 [6] such as [4] The resin composition according to [5], wherein the polymer resin has a weight average molecular weight of 5,000 to 20,000. [7] The resin composition according to any one of the above [4] to [6] wherein the high molecular weight resin is a phenoxy resin. [8] The resin composition according to any one of the above [1] to [7] which further comprises an inorganic entangled material. [9] The resin composition according to the above [8], wherein the content of the inorganic filler is 50% by mass or less based on the resin composition (100% by mass of the nonvolatile matter). [10] The resin composition according to the above [8] or [9] wherein the inorganic cerium material is cerium oxide. An adhesive film according to any one of the above [1] to [10], wherein the resin composition layer is formed on a support film. [12] A prepreg according to any one of [1] to [1], wherein the resin composition is immersed in a sheet-like reinforcing substrate made of fibers. [13] A multilayer printed circuit board comprising an insulating layer formed of a cured product of the resin composition according to any one of the above [1] to [10]. [Effect of the Invention] According to the present invention, a resin composition suitable for forming an insulating layer of a multilayer printed circuit board can be provided, and an insulating layer formed after thermal curing has a low thermal expansion coefficient and a low thickness of the insulating layer surface. A resin composition of an electroplated conductor layer having sufficient adhesion strength can be formed. 200831600 [Best Mode for Carrying Out the Invention] Hereinafter, the present invention will be described in detail. The cyanate resin to be used in the present invention is not particularly limited, and examples thereof include a novolak type (phenol novolak type, alkylphenol novolak type, etc.) cyanate resin, bisphenol type (bisphenol A type, Bisphenol F type, bisphenol S type, etc.) Cyanate resin and such a part of Sanxiaohua prepolymer. These may be used singly or in combination of two or more. The weight average molecular weight of the cyanate resin is not particularly limited, but is preferably from 500 to 4,500, more preferably from 600 to 3,000. Specific examples of the cyanate resin include, for example, bisphenol A. Cyanate ester, polyphenol cyanate (oligo(3-methylene-1,5-phenylene), 4,4,-methylenebis(2,6-dimethylphenyl cyanide) Acid ester), 4,4'-ethylene diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis(4-dicyanate) phenylpropane, 1,1 - bis(4-cyanate phenylmethane), bis(4-cyanate-3,5-dimethylphenyl)methane, 1,3-bis(4-cyanate phenyl-1·( 2-functional cyanate resin such as benzyl, bis(4-cyanate phenyl) sulfide, bis(4-cyanate phenyl) ether, phenol novolac, cresol novolac A polyfunctional cyanate resin derived from the same, a partially pre-polymerized triazineated resin such as the cyanate resin, etc. As a commercially available cyanate resin, a phenol novolak represented by the following formula (2) A varnish-type polyfunctional cyanate resin (manufactured by Lonza Japan Co., Ltd., PT30, cyanate equivalent 124), and the following formula (3) A dicyanate ester of one part or all of the triazine, of the prepolymer from the trimer (Lonza Japan (shares) system, BA230, cyanate equivalent 232) or the like. 200831600

〔式中,η作爲平均値表示任意的數。〕 【化3】[In the formula, η represents an arbitrary number as an average 値. 〕 【化3】

OCN 樹脂組成物中之氰酸酯樹脂之含有量係無特別限定者 ,但相對於樹脂組成物(不揮發份1 00質量%),較佳爲5〜 60質量%、更佳爲20〜4 0質量%。氰酸酯樹脂之含有量過 少時,有耐熱性降低、熱膨脹率增加的傾向。氰酸酯樹脂 之含有量過多,則有電鍍導體層的附著強度降低的傾向。 本發明中所使用之萘酚型環氧樹脂係以下式(1)表示。 【化4】The content of the cyanate resin in the OCN resin composition is not particularly limited, but is preferably 5 to 60% by mass, more preferably 20 to 4%, based on the resin composition (100% by mass of the nonvolatile matter). 0% by mass. When the content of the cyanate resin is too small, the heat resistance is lowered and the coefficient of thermal expansion tends to increase. When the content of the cyanate resin is too large, the adhesion strength of the plated conductor layer tends to decrease. The naphthol type epoxy resin used in the present invention is represented by the following formula (1). 【化4】

⑴ 200831600 (η作爲平均値表示1〜6之數,X表示環氧丙基或碳數1 〜8之烴基,烴基/環氧丙基之比例爲0.05〜2.0)。 作爲環氧樹脂中之平均値之烴基與環氧丙基比例係烴基/ 環氧丙基= 0·05〜2.0之範圍,較佳爲0.1〜1.0的範圍。X 作爲示碳數1〜8之烴基時的烴基,可列舉甲基、乙基、 η -丙基、異丙基、烯丙基、炔丙基、丁基、η -戊基、sec-戊基、tert-戊基、環己基、苯基、苄基等,尤其以甲基爲 佳。式(1)所示之萘酚環氧樹脂爲日本特開2006- 1 60868記 載之周知的樹脂,可遵循該公報記載之製法來製造。 樹脂組成物中之萘酚型環氧樹脂之含有量係無特別限 定者,但相對於樹脂組成物(不揮發份1 00質量%),較佳 爲1〜50質量%、更佳爲5〜40質量%。萘酣型環氧樹脂 之含有量過少時,有難於將濕式粗化製程中的絕緣層表面 低粗度化與電鍍導體層之附著強度兩立的傾向。又,萘酚 型環氧樹脂之含有量過多,則相對地由於氰酸酯樹脂之含 有量減少,有熱膨脹率增大的傾向。 本發明之樹脂組成物,於能發揮本發明效果的範圍內 ’視需要亦可將式(1)所示之萘酚型環氧樹脂與其它的環 氧樹脂倂用。作爲此種環氧樹脂,例如可列舉雙酌A型環 氧樹脂、雙酚F型環氧樹脂、雙酚s型環氧樹脂、酚酚醛 清漆型環氧樹脂、烷基酚酚醛清漆型環氧樹脂、雙酚型環 氧樹脂、烷基型環氧樹脂、二環戊二烯型環氧樹脂、萘型 環氧樹脂、與具有酚類與酚性羥基之芳香族醛的縮合物的 環氧化物、雙酚芳烷基型環氧樹脂、芴型環氧樹脂、咕噸 -10- 200831600 型環氧樹脂、三環氧丙基異三聚氰酸酯等。此等之環氧樹 脂係可各別單獨使用,亦可組合2種以上使用。 氰酸酯樹脂之氰酸酯當量與萘酚型環氧樹脂之環氧當 量的比,較佳爲1: 〇·3〜1: 3、更佳爲1: 〇·5〜1: 1。當 量比於上述範圍之外,則有難於將濕式粗化製程中的絕緣 層表面低粗度化與電鍍導體層之附著強度兩立的傾向。又 ,樹脂組成物中,含有具式(1)所示之萘酚型環氧樹脂以外 之環氧基之化合物時,亦包括彼之氰酸酯當量與環氧當量 之比以在於上述範圍內爲佳。 本發明之樹脂組成物係因又使爲含有特定的高分子化 合物,故可提高於硬化物之機械強度或黏著薄膜之形態使 用時的薄膜成型能。作爲此種高分子化合物,可列舉苯氧 樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹 脂、聚颯樹脂、聚醚颯樹脂、聚苯醚樹脂、聚碳酸酯樹脂 、聚醚醚酮樹脂、聚酯樹脂。此等高分子化合物可各別單 獨使用,亦可組合2種以上使用。高分子化合物的重量平 均分子量以於 5000〜200000的範圍爲佳。比此範圍還小 ,則薄膜成型能或機械強度提高的效果有無法充分發揮的 傾向,比此範圍還大,則氰酸酯樹脂及萘酚型環氧樹脂間 的相溶性不充分,硬化後之表面凹凸變大,有難於形成高 密度微細電路的傾向。又,本發明中的重量平均分子係以 凝膠滲透層析法(GPC)法(聚苯乙烯換算)所測定。藉由 GPC法之重量平均分子量,具體地係測定裝置使用(股)島 津製作所製LC-9A/RID-6A ;管柱使用昭和電工(股)公司製 -11 - 200831600(1) 200831600 (η as an average 値 represents a number of 1 to 6, X represents an epoxy group or a hydrocarbon group having 1 to 8 carbon atoms, and a ratio of a hydrocarbon group to an epoxy group is 0.05 to 2.0). The range of the hydrocarbon group of the average oxime in the epoxy resin and the ratio of the epoxy group-based hydrocarbon group / epoxy propyl group = 0. 05 to 2.0 is preferably in the range of 0.1 to 1.0. X is a hydrocarbon group in the case of a hydrocarbon group having 1 to 8 carbon atoms, and examples thereof include a methyl group, an ethyl group, an η-propyl group, an isopropyl group, an allyl group, a propargyl group, a butyl group, an η-pentyl group, and a sec-pentyl group. A base, a tert-pentyl group, a cyclohexyl group, a phenyl group, a benzyl group and the like are preferred, and a methyl group is preferred. The naphthol epoxy resin represented by the formula (1) is a well-known resin described in JP-A-2006-16058, and can be produced by following the method described in the publication. The content of the naphthol type epoxy resin in the resin composition is not particularly limited, but is preferably from 1 to 50% by mass, more preferably from 5 to 5% by mass based on the resin composition (nonvolatile content: 100% by mass). 40% by mass. When the content of the naphthoquinone type epoxy resin is too small, it is difficult to make the surface of the insulating layer in the wet roughening process low in thickness and the adhesion strength of the plated conductor layer. Further, when the content of the naphthol type epoxy resin is too large, the amount of the cyanate resin is relatively decreased, and the coefficient of thermal expansion tends to increase. The resin composition of the present invention may be used in the range in which the effects of the present invention can be exerted. The naphthol type epoxy resin represented by the formula (1) may be used in combination with another epoxy resin. Examples of such an epoxy resin include a double-type A-type epoxy resin, a bisphenol F-type epoxy resin, a bisphenol s-type epoxy resin, a phenol novolac type epoxy resin, and an alkylphenol novolac type epoxy resin. Resin, bisphenol type epoxy resin, alkyl type epoxy resin, dicyclopentadiene type epoxy resin, naphthalene type epoxy resin, epoxy with condensate of aromatic aldehyde having phenol and phenolic hydroxyl group Compound, bisphenol aralkyl type epoxy resin, fluorene type epoxy resin, xanthene-10-200831600 type epoxy resin, triepoxypropyl isomeric cyanurate, and the like. These epoxy resins may be used singly or in combination of two or more. The ratio of the cyanate equivalent of the cyanate resin to the epoxy equivalent of the naphthol type epoxy resin is preferably 1: 〇 3 to 1: 3, more preferably 1: 〇 5 to 1: 1. When the amount is outside the above range, it is difficult to make the surface of the insulating layer in the wet roughening process low in thickness and the adhesion strength of the plated conductor layer. Further, when the resin composition contains a compound having an epoxy group other than the naphthol type epoxy resin represented by the formula (1), the ratio of the cyanate equivalent to the epoxy equivalent is also included in the above range. It is better. Since the resin composition of the present invention contains a specific polymer compound, it can improve the film forming ability when used in the mechanical strength of the cured product or the form of the adhesive film. Examples of such a polymer compound include a phenoxy resin, a polyimine resin, a polyamidimide resin, a polyether quinone resin, a polyfluorene resin, a polyether oxime resin, a polyphenylene ether resin, and a polycarbonate. Ester resin, polyether ether ketone resin, polyester resin. These polymer compounds may be used singly or in combination of two or more. The weight average molecular weight of the polymer compound is preferably in the range of from 5,000 to 200,000. If it is smaller than this range, the effect of improving the film forming ability or mechanical strength may not be sufficiently exhibited, and if it is larger than this range, the compatibility between the cyanate resin and the naphthol type epoxy resin may be insufficient, and after hardening, The surface unevenness is increased, and it is difficult to form a high-density fine circuit. Further, the weight average molecular weight in the present invention is measured by a gel permeation chromatography (GPC) method (in terms of polystyrene). By the weight average molecular weight of the GPC method, specifically, the LC-9A/RID-6A manufactured by Shimadzu Corporation is used as the measuring device; the column is made by Showa Denko Co., Ltd. -11 - 200831600

Shodex K-800P / K-804L / K-804L;移動相係使用氯仿等 ,以管柱溫度40°C進行測定、使用標準聚苯乙烯之檢量線 可算出。 樹脂組成物中的高分子化合物之含有量,係無特別限 定者,但相對於樹脂組成物(不揮發份100質量%)較佳爲 1〜60質量%、更佳爲2〜20質量%。熱可塑性樹脂之含有 量過少,則薄膜成型能或機械強度提高的效果無法發揮、 而含有量過多則濕式粗化製程後的絕緣層表面之粗度有增 大傾向。 本發明之樹脂組成物中,爲更一步使自該樹脂組成物 所得之絕緣層之熱膨脹率降低亦可添加無機塡充材料。作 爲無機塡充材料,例如可列舉二氧化矽、氧化鋁、硫酸鋇 、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、 碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸緦、鈦 酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鉻酸鋇、鍩酸鈣等,特 別是二氧化矽、尤其球狀之二氧化矽爲佳。無機塡充材料 之平均粒徑’係無特別限定者,但對絕緣層之微細電路形 成之觀點而言,較佳爲5μιη以下。上述無機塡充材料之平 均粒徑’可藉由依據(Mie)散亂理論之雷射回折·散亂法 進行測定。具體地,藉由雷射回折式粒度分佈測定裝置, 無機塡充材料之粒度分佈以體積基準作成,可以其中徑作 爲平均粒徑來進行測定。測定樣品係較佳地可使用將無機 塡充材料耢由超音波使其分散於水中者。作爲雷射回折式 粒度分佈測定裝置,可使用股份有限公司堀場製作所製 -12- 200831600 LA-5 00 等。 無機塡充材料係以矽烷偶合劑等之表面處理劑進行表 面處理,以使其耐濕性提高者爲佳。無機塡充材料之添加 量係相對於樹脂組成物(不揮發份1 00質量%),一般以5 0 質量%以下、較佳爲20〜40質量%之範圍。無機塡充材料 之含有量過多時,有硬化物變脆、剝離強度降低的傾向。 本發明之樹脂組成物於縮短硬化時間之目的,係亦可 添加以倂用以往之環氧樹脂組成物與氰酸酯化合物之系作 爲硬化觸媒被使用之有機金屬化合物。有機金屬化合物, 可列舉銅(II)乙醯丙酮等之有機銅化合物、鋅(II)乙醯丙 酮等之有機鋅化合物、鈷(II)乙醯丙酮、鈷(III)乙醯丙 酮等之有機鈷化合物等。有機金屬化合物之添加量係相對 於氰酸酯樹脂,以金屬換算一般爲10〜500ppm、較佳爲 25〜200ppm的範圍內。 本發明之樹脂組成物中,由電鍍附著性觀點而言,進 而亦可添加橡膠粒子。於本發明中可被使用之橡膠粒子, 例如,於調製該樹脂組成物之清漆之際使用的有機溶劑中 亦不會溶解,與必須成分之氰酸酯樹脂或式(1)所示之萘酚 型環氧樹脂等亦不相溶者。因此,該橡膠粒子係於本發明 之樹脂組成物之清漆中以分散狀態存在。此種橡膠粒子, 一般係將橡膠成分之分子量增大至不溶解於有機溶劑或樹 脂中的程度,以作成粒子狀來進行調製。 於本發明中可被使用之橡膠粒子的較佳例子,可列舉 芯殼型橡膠粒子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙 -13- 200831600 烯丁二烯橡膠粒子、丙烯基橡膠粒子等。芯殼型橡膠粒子 係爲具有芯層與殼層的橡膠粒子,例如可列舉外層之殼層 爲以玻璃狀聚合物所構成、內層之芯層爲以橡膠狀聚合物 所構成的2層構造、或外層之殼層爲以玻璃狀聚合物所構 成、中間層爲以橡膠狀聚合物所構成、芯層爲以玻璃狀聚 合物所構成的3層構造者等。玻璃層,例如以甲基丙烯酸 甲酯之聚合物等所構成,橡膠狀聚合物層,例如以丙烯酸 丁酯聚合物(丁基橡膠)等所構成。作爲芯殼型橡膠粒子 之具體例,可列舉Staphyloid AC3 832、AC3816N (商品名 、GANZ 化成(股)製)、METABLEN KW-4426(商品名、三 菱RAYON (股)製)。作爲交聯丙烯腈-丁二烯橡膠(NBR)粒 子之具體例,可列舉XER-91(平均粒徑0·5μιη、JSR(股)製 )等。交聯苯乙烯丁二烯橡膠(SBR)粒子之具體例,可列舉 XSK-500(平均粒徑0.5μιη、JSR(股)製)等。丙烯基橡膠粒 子之具體例,可列舉METABLEN W3 00A(平均粒徑Ο.ΐμπχ) 、W450A(平均粒徑0·2μπι)(三菱RAYON (股)製)。 摻合的橡膠粒子之平均粒徑,較佳爲0.005〜 1 μιη 的 範圍、更佳爲0.2〜0·6μπι的範圍。本發明所使用的橡膠 粒子之平均粒徑可使用動態光散射法來測定。例如,藉由 超音波等使橡膠粒子均勻地分散於適當的有機溶劑中,使 用濃厚系粒徑 Analyzer(FPAR- 1 000 ;大塚電子(股)製)以 質量基準來作成橡膠粒子的粒度分佈,可以其中徑作爲平 均粒徑來進行測定。 橡膠粒子之含有量係相對於樹脂組成物(不揮發份1 00 -14- 200831600 質量%),較佳爲1〜1 0質量%、更佳爲2〜5質量%。 本發明之樹脂組成物中在不阻礙本發明之效果的範圍 內,視需要可摻合其它的成分。作爲其它的成分,例如可 列舉有機磷系難燃劑、含有有機系氮之磷化合物、氮化合 物、聚矽氧系難燃劑、金屬水酸化物等之難燃劑;矽粉末 、尼龍粉末、氟粉末等之有機塡充劑;Oruben、皂土 (bentonite )等之增黏劑;聚矽氧系、氟系、高分子系之消 泡劑或塗平劑;咪唑系、噻唑系、三唑系、矽烷系偶合劑 劑等之附著性賦予劑;酞菁•藍、酞菁·綠、碘•綠、二 重氮黃(D IS AZO yellow)、碳黑等之著色劑。 本發明之樹脂組成物之調製方法,係無特別限定者, 例如可列舉氰酸酯樹脂、式(1 )所示之萘酚型環氧樹脂,並 且視需要使用旋轉式混合機混合高分子化合物、無機塡充 材料、硬化觸媒、橡膠粒子或其它成分之方法等。 本發明之樹脂組成物,於多層印刷電路板之製造中可 適於使用於形成絕緣層用。本發明之樹脂組成物係亦可以 清漆狀態塗佈於電路基板形成絕緣層,但工業上一般以黏 著薄膜、預浸物等之片狀層合材料之形態使用爲佳。樹脂 組成物之軟化點,從片狀層合材料之層壓性的觀點而言, 以40〜150°C爲佳。 本發明之黏著薄膜係可以該業者間周知的方法,例如 調製溶解樹脂組成物於有機溶劑中的樹脂清漆,將此樹脂 清漆使用塑模塗佈機等,塗佈於支持體之支持薄膜,進而 進行加熱或藉由吹熱風等使有機溶劑乾燥,藉由使形成樹 -15- 200831600 脂組成物層來製造。 作爲有機溶劑,例如可列舉丙酮、甲基乙基酮、環己 酮等之酮類;乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二 醇一甲基醚乙酸酯、卡必醇乙酸酯等之乙酸酯類;溶纖劑 、丁基卡必醇等之卡必醇類;甲苯、二甲苯等之芳香族烴 類;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等。 有機溶劑亦可組合2種以上使用。 乾燥條件係無特別限定,對樹脂組成物層的有機溶劑 之含有量一般爲1 0質量%以下、較佳爲使其乾燥於5質量 %以下。清漆中的有機溶劑量,依據有機溶劑的沸點亦有 不同,例如含有3 0〜60質量%之有機溶劑之清漆得藉由以 50〜150°C進行3〜10分鐘左右使其乾燥而形成樹脂組成 物層。若爲該業者,可藉由簡單的實驗設定適宜、合適的 乾燥條件。 黏著薄膜中所形成之樹脂組成物層的厚度係一般爲導 體層的厚度之上。電路基板所具有之導體層的厚度係一般 爲5〜70 μιη的範圍,故樹脂組成物係以具有10〜100 μπι 的厚度爲佳。 本發明的支持薄膜,係可列舉聚乙烯、聚丙烯、聚氯 乙烯等之聚烯烴;聚對苯二甲酸乙二醇酯(以下簡稱「PET 」)、聚對苯二甲酸乙二醇酯等之聚酯;聚碳酸酯、聚醯 亞胺等所成之薄膜,進而脫模紙或銅箔、鋁箔等之金屬箔 等。又,於支持薄膜及後述之保護薄膜施行沈澱物處理、 電暈處理、之外亦可施行脫模處理。 -16- 200831600 支持薄膜之厚度係無特別限定,但一般爲1 0〜1 5 0 μιη 、較佳爲25〜50μιη。 於樹脂組成物層之支持薄膜沒有附著的一面上,更可 層合同支持薄膜大小的保護薄膜。保護薄膜之厚度無特別 限定,例如1〜40μιη。藉由層合保護薄膜,可防止朝樹脂 組成物層之表面的灰塵等之黏著或傷痕。黏著薄膜係亦可 捲取爲輥狀貯存。 接著,如上述地進行,說明使用製造好的黏著薄膜製 造多層印刷電路板之方法的一例。 首先,使用真空層壓機層壓黏著薄膜於電路基板的一 面或兩面。電路基板所使用的基板,例如可列舉玻璃環氧 基板、金屬基板、聚酯基板、聚醯亞胺基板、ΒΤ樹脂基 板、熱硬化型聚苯醚基板等。又,此處所言電路基板,係 指被圖型加工於如上述基板之一面或兩面上形成導體層( 電路)者。又,交錯導體層與絕緣層層合而成的多層印刷 電路板中,該多層印刷電路板之最外層的一面或兩面爲被 圖型加工成的導體層(電路)者,亦爲此處所言之電路基板 。又導體層表面上,亦可藉由黑化處理預先施行粗化處理 〇 上述層壓中,黏著薄膜具有保護薄膜時係去除該保護 薄膜之後,視需要預熱黏著薄膜及電路基板,一邊加壓黏 著薄膜及加熱而壓黏於電路基板。本發明之黏著薄膜中, 藉由真空層壓法於減壓下層壓於電路基板之方法爲適於使 用。層壓的條件係無特別限定,例如壓黏溫度(層壓溫度) -17- 200831600 較佳爲 70〜140°C、壓黏壓力較佳爲1〜llkSf/cm2 (9.8χ104 〜107·9χ104 N/m2) ’ 以於空氣壓力 20mmHg(26.7hPa)以下之減壓下進行層壓爲佳。又’層壓 的方法,可爲分批式亦可爲以輥的連續式。 真空層壓係可使用市售的真空層壓機進行。市售的真 空層壓機,例如可列舉 Nichig〇-Morton (股)製 Vacuum Applicator、(股)名機製作所製真空加壓式層壓機、(股)日 立Industries製輥式Dry Coater、日立AIC(股)製真空層 壓機等。 層壓黏著薄膜於電路基板之後,冷卻至室溫左右而剝 離支持薄膜時,係藉由進行剝離、熱硬化可於電路基板上 形成絕緣層。熱硬化的條件,視樹脂組成物中之樹脂成分 的種類、含有量等適宜選擇爲佳,較佳選擇於 150°C〜 220°C進行20分鐘〜180分鐘、更佳於160°C〜200°C進行 30分鐘〜120分鐘的範圍。 形成絕緣層之後,於硬化前沒有剝離支持薄膜時,在 此進行剝離。接著視需要,於電路基板上形成之絕緣層上 進行穿孔,形成通孔(via hole)、穿通孔(through hole)。 穿孔,係例如藉由鑽孔、雷射、電漿等周知的方法、又視 需要可組合此等方法來進行,藉由碳酸氣雷射、YAG雷射 等之雷射之穿孔爲最普遍的方法。 接著’藉由乾式電鍍或濕式電鍍於絕緣層上形成導體 層。乾式電鍍,可使用蒸鍍、濺鍍、離子電鍍等周知的方 法。濕式電鍍時,首先已硬化之樹脂組成物層(絕緣層)之 -18- 200831600 表面以過錳酸鹽(過錳酸鉀、過錳酸鈉等)重鉻酸鹽、臭 氧、過氧化氫/硫酸、硝酸等之氧化劑進行粗化處理,形 成凹凸的固定器。氧化劑,尤其較佳地使用過錳酸鉀、過 錳酸鈉等之氫氧化鈉水溶液(鹼性過猛酸水溶液)。接著, 以組合非電解質電鍍與電解電鍍的方法形成導體層。又, 導體層係指形成逆圖型之電鍍光阻,僅非電解質電鍍亦可 形成導體層。其後之圖型形成的方法,例如可使用該業者 間周知的減成法(Subtractive process)、半加成法等。 本發明之預浸物係爲藉由熱熔法或溶劑法使本發明之 樹脂組成物浸漬於纖維所成之片狀補強基材中,進行加熱 藉由使其半硬化而可製造。亦即,本發明之樹脂組成物可 浸漬於纖維所成之片狀補強基材之狀態作成預浸物。作爲 纖維所成之片狀補強基材,例如可使用常用作爲玻璃布 (glass cloth)或芳香族聚醯胺纖維(Aramid Fiber)等之預浸 物用纖維之纖維所成者。 熱熔法,係爲不溶解樹脂於有機溶劑,而一次塗佈於 與該樹脂之剝離性良好的塗工紙上,再將其層壓於片狀補 強基材上;或不溶解樹脂於有機溶劑,而藉由塑模塗佈機 直接塗佈於片狀補強基材等之製造預浸物的方法。又,溶 劑法,係爲同黏著薄膜一樣進行,溶解樹脂於有機溶劑中 調製樹脂清漆,此清漆中浸漬片狀補強基材,使樹脂清漆 浸漬於片狀補強基材,其後使其乾燥的方法。 接著,如上所述地進行,說明使用製造好的預浸物製 造多層印刷電路板的方法之一例。電路基板上層合1片本 •19- 200831600 發明之預浸物或視需要多片重疊,介由脫模薄膜以金屬板 挾持,於加壓·加熱條件下擠壓層合。加壓·加熱條件係 較佳壓力爲 5 〜40kgf/cm2 (49χ104 〜3 92&gt;&lt;104N/m2)、溫度 於120〜200 °C進行20〜100分鐘。又,與黏著薄膜一樣, 藉由真空層壓法將預浸物層壓於電路基板上後,亦可進行 加熱硬化。其後,同上述記載之方法,進行粗化已硬化之 預浸物表面後,藉由電鍍形成導體層而可製造多層印刷電 路板。 【實施方式】 以下,藉由實施例更具體地說明本發明,但本發明不 受限於此等實施例。 〔實施例1〕 混合雙酚A二氰酸酯之預聚合物(Lonza Japan (股)製 「BA23 0 S75」、氰酸酯當量約2 3 2、不揮發份7 5質量%之 甲基乙基酮(以下簡稱MEK)溶液)30質量份、酚酚醛清漆 型多官能氰酸酯樹脂(Lonza Japan (股)製「PT30」、氰酸 酯當量約1 24) 1 0質量份、通式(1)所示之萘酚型環氧樹脂 之新日鐵化學(股)製「ESN-475V」(環氧當量約340之不 揮發份65質量%之MEK溶液)40質量份、進而液狀雙酚A 型環氧樹脂(日本環氧樹脂(股)製「828EL」、環氧當量約 185)5質量份、苯氧樹脂溶液(東都化成(股)製「γρ-70」 、不揮發份40質量%之MEK與環己酮的混合溶液)20質 -20- 200831600 量份、硬化觸媒之鈷(II)乙醯丙酮(東京化成(股)製)之1 質量%之N,N-二甲基甲醯胺(DMF)溶液4質量份、及以胺 基矽烷表面處理過之球形二氧化矽((股)Admatechs製「 SOC2」、平均粒子徑0.5μιη)40質量份,以高速旋轉式混 合機均勻地分散,製作熱硬化性樹脂組成物清漆。接著, 將上述之樹脂組成物清漆以塑模塗佈機均勻地塗佈於聚對 苯二甲酸乙二醇酯薄膜(厚度3 8μιη、以下簡稱PET薄膜) 上,使其乾燥後之樹脂組成物層之厚度成4 0 μπι,以8 0〜 120°C(平均l〇〇°C)進行6分鐘乾燥(樹脂組成物層中之殘留 溶劑量:約1質量%)。隨後,樹脂組成物層之表面,一邊 貼合1 5 μηι之聚丙烯薄膜,一邊捲取成輥狀。撕開輥狀之 黏著薄膜成寬爲507mm,得到 5 07 x 3 3 6mm大小之片狀的 黏著薄膜。 〈比較例1〉 將萘酚型環氧樹脂「ESN-475V」以固形份換算變更 成同質量份之式(4)所示之雙酚芳烷基型環氧樹脂日本化藥 (股)製「NC-3 000H」(環氧當量約290)外,其餘全同實施 例1 一樣進行求得黏著薄膜。 【化5】Shodex K-800P / K-804L / K-804L; mobile phase using chloroform, etc., measured at a column temperature of 40 ° C, using a standard polystyrene calibration line can be calculated. The content of the polymer compound in the resin composition is not particularly limited, but is preferably 1 to 60% by mass, and more preferably 2 to 20% by mass based on the resin composition (100% by mass of the nonvolatile matter). When the content of the thermoplastic resin is too small, the effect of improving the film forming ability or mechanical strength cannot be exhibited, and if the content is too large, the thickness of the surface of the insulating layer after the wet roughening process tends to increase. In the resin composition of the present invention, an inorganic chelating material may be added in order to further reduce the thermal expansion coefficient of the insulating layer obtained from the resin composition. Examples of the inorganic chelating material include cerium oxide, aluminum oxide, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, boron nitride, and aluminum borate. Barium titanate, barium titanate, calcium titanate, magnesium titanate, barium titanate, titanium oxide, barium chromate, calcium citrate, etc., especially cerium oxide, especially spherical cerium oxide is preferred. The average particle diameter of the inorganic entangled material is not particularly limited, but is preferably 5 μm or less from the viewpoint of formation of a fine circuit of the insulating layer. The average particle diameter ' of the above inorganic filler material can be measured by the laser folding back and scattering method according to the (Mie) scattering theory. Specifically, the particle size distribution of the inorganic entangled material is prepared on a volume basis by a laser-folding type particle size distribution measuring apparatus, and the diameter can be measured as an average particle diameter. For the measurement of the sample, it is preferred to use an inorganic entangled material which is ultrasonically dispersed in water. As the laser-refractive-type particle size distribution measuring device, -12-200831600 LA-5 00, manufactured by Co., Ltd., Ltd., can be used. The inorganic filler material is surface-treated with a surface treatment agent such as a decane coupling agent to improve the moisture resistance. The amount of the inorganic filler to be added is generally in the range of 50% by mass or less, preferably 20% to 40% by mass based on the resin composition (100% by mass of the nonvolatile matter). When the content of the inorganic filler is too large, the cured product tends to be brittle and the peel strength tends to decrease. The resin composition of the present invention may be added with an organometallic compound which is used as a curing catalyst for the purpose of shortening the hardening time by using a conventional epoxy resin composition and a cyanate compound. Examples of the organometallic compound include organic copper compounds such as copper (II) acetamidine acetone, organic zinc compounds such as zinc (II) acetamidine acetone, and organic compounds such as cobalt (II) acetamidine acetone and cobalt (III) acetyl acetonide. Cobalt compounds, etc. The amount of the organometallic compound to be added is usually in the range of 10 to 500 ppm, preferably 25 to 200 ppm, based on the cyanate resin. In the resin composition of the present invention, rubber particles may be added from the viewpoint of plating adhesion. The rubber particles which can be used in the present invention, for example, are not dissolved in the organic solvent used for preparing the varnish of the resin composition, and the cyanate resin of the essential component or the naphthalene represented by the formula (1) Phenolic epoxy resins and the like are also incompatible. Therefore, the rubber particles are present in a dispersed state in the varnish of the resin composition of the present invention. Such rubber particles are generally prepared by increasing the molecular weight of the rubber component to such an extent that it is not dissolved in an organic solvent or a resin. Preferred examples of the rubber particles which can be used in the present invention include core-shell type rubber particles, crosslinked acrylonitrile butadiene rubber particles, crosslinked phenylethylene-13-200831600 olefinic rubber particles, and propylene groups. Rubber particles, etc. The core-shell type rubber particles are rubber particles having a core layer and a shell layer, and for example, the shell layer of the outer layer is composed of a glassy polymer, and the core layer of the inner layer is a two-layer structure composed of a rubber-like polymer. The shell layer of the outer layer is composed of a glassy polymer, the intermediate layer is composed of a rubbery polymer, and the core layer is a three-layer structure composed of a glassy polymer. The glass layer is made of, for example, a polymer of methyl methacrylate or the like, and the rubbery polymer layer is made of, for example, a butyl acrylate polymer (butyl rubber). Specific examples of the core-shell type rubber particles include Staphyloid AC3 832, AC3816N (trade name, manufactured by GANZ Chemical Co., Ltd.), and METABLEN KW-4426 (trade name, manufactured by Mitsubishi Rayon Co., Ltd.). Specific examples of the crosslinked acrylonitrile-butadiene rubber (NBR) particles include XER-91 (average particle diameter: 0.5 μm, manufactured by JSR Co., Ltd.). Specific examples of the crosslinked styrene butadiene rubber (SBR) particles include XSK-500 (average particle diameter: 0.5 μm, manufactured by JSR Co., Ltd.). Specific examples of the propylene-based rubber particles include METABLEN W3 00A (average particle diameter Ο.ΐμπχ) and W450A (average particle diameter 0·2μπι) (manufactured by Mitsubishi Rayon Co., Ltd.). The average particle diameter of the blended rubber particles is preferably in the range of 0.005 to 1 μm, more preferably in the range of 0.2 to 0.6 μm. The average particle diameter of the rubber particles used in the present invention can be measured by a dynamic light scattering method. For example, the rubber particles are uniformly dispersed in a suitable organic solvent by ultrasonic waves or the like, and the particle size distribution of the rubber particles is prepared on a mass basis using a thick particle size Analyzer (FPAR-1 000; manufactured by Otsuka Electronics Co., Ltd.). The measurement can be carried out by using the diameter as the average particle diameter. The content of the rubber particles is preferably from 1 to 10% by mass, more preferably from 2 to 5% by mass, based on the resin composition (nonvolatile matter: 00 -14 to 200831,600% by mass). In the resin composition of the present invention, other components may be blended as needed within a range not inhibiting the effects of the present invention. Examples of the other component include an organic phosphorus-based flame retardant, a phosphorus compound containing an organic nitrogen, a nitrogen compound, a polysulfonium-based flame retardant, and a metal hydroxide, and the like; a tantalum powder, a nylon powder, and the like. An organic chelating agent such as fluorine powder; a tackifier such as Oruben or bentonite; a defoaming agent or a coating agent for polyfluorene, fluorine or polymer; imidazole, thiazole, triazole An adhesion imparting agent such as a phthalic acid coupling agent; a coloring agent such as phthalocyanine blue, phthalocyanine green, iodine green, DIS AZO yellow, or carbon black. The method for preparing the resin composition of the present invention is not particularly limited, and examples thereof include a cyanate resin and a naphthol epoxy resin represented by the formula (1), and a mixed polymer compound is optionally used in a rotary mixer. , inorganic filler materials, hardening catalysts, rubber particles or other ingredients. The resin composition of the present invention can be suitably used for forming an insulating layer in the manufacture of a multilayer printed wiring board. The resin composition of the present invention may be applied to a circuit board to form an insulating layer in a varnish state, but it is generally used in the form of a sheet-like laminate such as a film or a prepreg. The softening point of the resin composition is preferably from 40 to 150 ° C from the viewpoint of lamination property of the sheet-like laminate. The adhesive film of the present invention can be prepared by a method known in the art, for example, a resin varnish in which a resin composition is dissolved in an organic solvent, and the resin varnish is applied to a support film of a support using a mold coater or the like. The organic solvent is dried by heating or by blowing hot air or the like, and is produced by forming a resin composition layer of -15-200831600. Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone, and cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol. Acetate such as acetate; cellulolytic agent, carbitol such as butyl carbitol; aromatic hydrocarbon such as toluene or xylene; dimethylformamide, dimethylacetamide, N-methylpyrrolidone and the like. The organic solvent may be used in combination of two or more kinds. The drying conditions are not particularly limited, and the content of the organic solvent in the resin composition layer is usually 10% by mass or less, and preferably dried at 5% by mass or less. The amount of the organic solvent in the varnish varies depending on the boiling point of the organic solvent. For example, a varnish containing 30 to 60% by mass of an organic solvent can be dried by drying at 50 to 150 ° C for about 3 to 10 minutes to form a resin. Composition layer. For the industry, suitable and suitable drying conditions can be set by simple experiments. The thickness of the resin composition layer formed in the adhesive film is generally above the thickness of the conductor layer. The thickness of the conductor layer of the circuit board is generally in the range of 5 to 70 μm, so that the resin composition preferably has a thickness of 10 to 100 μm. Examples of the support film of the present invention include polyolefins such as polyethylene, polypropylene, and polyvinyl chloride; polyethylene terephthalate (hereinafter referred to as "PET"), polyethylene terephthalate, and the like. Polyester; a film made of polycarbonate, polyimide, or the like, and a metal foil such as a release paper, a copper foil, or an aluminum foil. Further, the support film and the protective film described later may be subjected to a mold release treatment or a corona treatment, and may be subjected to a mold release treatment. The thickness of the support film is not particularly limited, but is generally from 10 to 150 μm, preferably from 25 to 50 μm. On the side of the resin composition layer where the support film is not attached, it is also possible to support the film-size protective film. The thickness of the protective film is not particularly limited, and is, for example, 1 to 40 μm. By laminating the protective film, adhesion or scratches to dust or the like on the surface of the resin composition layer can be prevented. The adhesive film can also be taken up in roll form for storage. Next, as described above, an example of a method of manufacturing a multilayer printed wiring board using the produced adhesive film will be described. First, an adhesive film is laminated on one or both sides of a circuit board using a vacuum laminator. Examples of the substrate used for the circuit board include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a silicone resin substrate, and a thermosetting polyphenylene ether substrate. Further, the circuit board as used herein refers to a pattern formed by forming a conductor layer (circuit) on one or both sides of the substrate. Further, in a multilayer printed circuit board in which a staggered conductor layer and an insulating layer are laminated, one or both of the outermost layers of the multilayer printed circuit board are patterned conductor layers (circuits), and are also referred to herein. The circuit board. Further, on the surface of the conductor layer, roughening treatment may be performed in advance by blackening treatment. In the above lamination, when the protective film is removed by the protective film, the adhesive film and the circuit substrate are preheated as needed, and the film is pressurized. Adhesive film and heat are applied to the circuit substrate. In the adhesive film of the present invention, a method of laminating on a circuit board under reduced pressure by a vacuum lamination method is suitable for use. The conditions for the lamination are not particularly limited, and for example, the pressure-adhesive temperature (lamination temperature) -17-200831600 is preferably 70 to 140 ° C, and the pressure-adhesive pressure is preferably 1 to llkSf/cm 2 (9.8 χ 104 ~ 107 · 9 χ 104 N). /m2) ' It is preferable to carry out lamination under a reduced pressure of 20 mmHg (26.7 hPa) or less. Further, the method of laminating may be a batch type or a continuous type of rolls. Vacuum lamination can be carried out using a commercially available vacuum laminator. For example, a Vacuum Applicator manufactured by Nichig〇-Morton Co., Ltd., a vacuum pressure laminator manufactured by Nihon Seiki Co., Ltd., a Dry Coater manufactured by Hitachi Industries, and a Hitachi AIC. (Stock) vacuum laminator, etc. After laminating the adhesive film on the circuit board and cooling to room temperature to peel off the support film, an insulating layer can be formed on the circuit board by peeling and heat curing. The heat curing condition is preferably selected depending on the kind and content of the resin component in the resin composition, and is preferably selected from 150 ° C to 220 ° C for 20 minutes to 180 minutes, more preferably 160 ° C to 200 ° °C is carried out in the range of 30 minutes to 120 minutes. After the formation of the insulating layer, peeling of the support film before the hardening is performed, and peeling is performed here. Then, as needed, the insulating layer formed on the circuit substrate is perforated to form a via hole and a through hole. The perforation is performed by a well-known method such as drilling, laser, plasma, or the like, and may be combined as needed. The perforation of lasers such as carbon dioxide lasers and YAG lasers is the most common. method. Next, a conductor layer is formed on the insulating layer by dry plating or wet plating. For dry plating, a known method such as vapor deposition, sputtering, or ion plating can be used. In wet plating, the first hardened resin composition layer (insulating layer) -18- 200831600 surface is permanganate (potassium permanganate, sodium permanganate, etc.) dichromate, ozone, hydrogen peroxide An oxidizing agent such as sulfuric acid or nitric acid is subjected to roughening treatment to form a holder for unevenness. As the oxidizing agent, an aqueous sodium hydroxide solution (aqueous alkaline acid solution) such as potassium permanganate or sodium permanganate is particularly preferably used. Next, a conductor layer is formed by a combination of non-electrolyte plating and electrolytic plating. Further, the conductor layer means a plating resist which forms an inverse pattern, and only a non-electrolyte plating can form a conductor layer. For the method of pattern formation thereafter, for example, a subtractive process, a semi-additive method, or the like which is well known among the industry can be used. The prepreg of the present invention is obtained by immersing the resin composition of the present invention in a sheet-like reinforcing substrate made of a fiber by a hot melt method or a solvent method, and heating it to be semi-hardened. That is, the resin composition of the present invention can be immersed in a sheet-like reinforcing substrate made of fibers to form a prepreg. As the sheet-like reinforcing base material made of the fiber, for example, a fiber which is usually used as a fiber for prepreg such as glass cloth or aramid fiber can be used. The hot-melt method is one in which the resin is not dissolved in an organic solvent, and is applied once on a coated paper having good peelability to the resin, and then laminated on a sheet-like reinforcing substrate; or insoluble in a resin in an organic solvent. Further, a method of producing a prepreg by directly applying to a sheet-like reinforcing substrate or the like by a die coater. Further, the solvent method is carried out in the same manner as the adhesive film, and the resin is immersed in an organic solvent to prepare a resin varnish. The varnish is immersed in a sheet-like reinforcing substrate, and the resin varnish is immersed in a sheet-like reinforcing substrate, and then dried. method. Next, an example of a method of manufacturing a multilayer printed wiring board using the manufactured prepreg will be described as described above. Laminated one on the circuit board. 19-200831600 The prepreg of the invention is overlapped as needed, and the release film is held by a metal plate and extruded under pressure and heating. The pressure and heating conditions are preferably 5 to 40 kgf/cm2 (49 χ 104 〜 3 92 &gt;&lt; 104 N/m2), and the temperature is 120 to 200 ° C for 20 to 100 minutes. Further, as in the case of the adhesive film, the prepreg is laminated on the circuit board by a vacuum lamination method, and then heat-hardened. Thereafter, the surface of the prepreg which has been hardened is roughened by the method described above, and then a conductor layer is formed by electroplating to produce a multilayer printed circuit board. [Embodiment] Hereinafter, the present invention will be specifically described by way of Examples, but the present invention is not limited to the Examples. [Example 1] A prepolymer of bisphenol A dicyanate ("BA23 0 S75" manufactured by Lonza Japan Co., Ltd., a cyanate equivalent of about 2 3 2, and a nonvolatile content of 5% by mass of methyl group B) 30 parts by mass of a ketone ketone (hereinafter referred to as MEK) solution, a phenol novolac type polyfunctional cyanate resin ("PT30" manufactured by Lonza Japan Co., Ltd., cyanate equivalent: about 1 24) 10 parts by mass, general formula ( 1) 40% by mass of "ESN-475V" (MEK solution of a non-volatile epoxy group of about 340) having a naphthol type epoxy resin as shown in the above-mentioned naphthol type epoxy resin, and further liquid double Phenolic A-type epoxy resin ("828EL" manufactured by Nippon Epoxy Resin Co., Ltd., epoxy equivalent: 185) 5 parts by mass, phenoxy resin solution ("γρ-70" manufactured by Tohto Kasei Co., Ltd., nonvolatile content 40 Mass% of MEK and cyclohexanone mixed solution) 20 mass-20- 200831600 parts, hardening catalyst cobalt (II) acetamidine acetone (manufactured by Tokyo Chemical Industry Co., Ltd.) 1% by mass of N, N-II 4 parts by mass of methylformamide (DMF) solution, and spherical cerium oxide ("SOC2" manufactured by Admatechs, average particle size) treated with an amino decane surface Diameter 0.5μιη) 40 parts by mass, at a high speed rotary machine mixing uniformly dispersed to prepare a thermosetting resin composition varnish. Then, the resin composition varnish described above is uniformly applied to a polyethylene terephthalate film (thickness: 38 μm, hereinafter abbreviated as PET film) by a die coater to dry the resin composition. The thickness of the layer was 40 μm, and it was dried at 80 to 120 ° C (average 10 ° C) for 6 minutes (the amount of residual solvent in the resin composition layer: about 1% by mass). Subsequently, the surface of the resin composition layer was rolled into a roll shape while being laminated with a polypropylene film of 15 μm. The adhesive film having a roll-like shape was torn to a width of 507 mm to obtain a sheet-like adhesive film of 5 07 x 3 3 6 mm in size. <Comparative Example 1> The bisphenol aralkyl type epoxy resin represented by the formula (4) in which the naphthol type epoxy resin "ESN-475V" was converted into the same mass parts in terms of solid content was prepared. The adhesive film was obtained in the same manner as in Example 1 except that "NC-3 000H" (epoxy equivalent weight: about 290). 【化5】

-21 - 200831600 〈比較例2〉 將萘酚型環氧樹脂「ESN-475V」以固形份換算變吏 成同質量份之式(5)所示之β-萘酚型環氧樹脂之新日鐡化攀 (股)製「ESN-185V」(環氧當量約280)外,其餘同全_鹙 施例1 一樣進行求得黏著薄膜。-21 - 200831600 <Comparative Example 2> The new day of the β-naphthol type epoxy resin represented by the formula (5) in which the naphthol type epoxy resin "ESN-475V" is converted into the same mass fraction in terms of solid content. The adhesive film was obtained in the same manner as in the first example except for the "ESN-185V" (epoxy equivalent of about 280).

【化6】【化6】

(式(5)中,η作爲平均値表示1〜6之數。) 〈熱膨脹率之評價〉 使實施例1及比較例1〜2所得之黏著薄膜於1 80°C下 進行90分鐘熱硬化而得片狀之硬化物。切斷其硬化物成 寬約5mm、長度約15mm之試驗片,使用(股)Rigakii製熱 機械分析裝置(Thermo Plus TMA8 310),以拉伸加重法進 行熱機械分析。安裝試驗片於前述裝置後,以載重1 g、升 溫速度5 °C /分鐘之測定條件連續進行2次測定。算出2次 的目測下於25 °C至150°C爲止之平均線熱膨脹率。所得之 結果示於表1。 〈濕式粗化製程後之絕緣層表面的粗度測定、與電鍍導體 -22- 200831600 層的附著強度評估〉 (1)黏著薄膜之層壓 附內層電路之玻璃布基材環氧樹脂層合板「銅箔之厚 度18μηι、基板厚度0.8mm、松下電工(股)製R5715ES」之 兩面上將實施例1及各比較例所製作之黏著薄膜,使用分 批式真空加壓層壓機MVLP-500(商品名、名機(股)製)進行 層壓。層壓係於30秒鐘內進行減壓使氣壓於13hPa以下 ,其後藉由以110°C、30秒鐘內、壓力〇.74MPa進行擠壓 。自被層壓之黏著薄膜剝離PET薄膜,以180 °C、30分鐘 之硬化條件硬化樹脂組成物,而形成絕緣層。 (2 )濕式粗化處理與導體層電鍍 將電路基板於80°C下浸漬於膨潤液之Atotech Japan ( 股)之 Swelling Dip· Securiganth P 中 5 分鐘。接著,於 80°C下浸漬於粗化液之Atotech Japan(股)之Concentrate· Compact P(KMn〇4: 60g/L、NaOH: 40g/L 之水溶液)中 10 分鐘。最後,於40°C下浸漬於中和液之Atotech Japan(股) 之 Reduction Solution· Securiganth P 中 5 分鐘,再進行 粗化處理。隨後於90 °C下乾燥30分鐘之後,使用非接觸 型表面粗度計(Veeco Instruments 公司製 WYKO NT33 0 0) 求出絕緣層表面之Ra( 10點平均粗度)。 接著,將層合板進行非電解質電鍍後,於15〇°C下加 熱30分鐘,進行退火處理,進而藉由硫酸銅電解電鍍形 成銅層於厚度25±10μπι。最後,於180°C下進行3〇分鐘退 -23- 200831600 火處理。於所得之層合板之電鍍銅層,切開寬l〇mm、長 度1 00mm之長方形之切口(notch),剝離此切口長邊方向 之一邊的端部,以夾具抓住於室溫下,以50mm/分鐘的速 度測定於垂直方向35mm剝離(peeling)時之載重。電鍍導 體層之剝離強度(剝離強度)之結果示於表1。 〔表1〕 實施例1 比較例1 比較例2 平均熱膨脹係數(ppm) 45 50 43 濕式粗化後之表面粗度 Ra(nm) 180 600 220 導體層剝離強度(kgf/cm) 0.7 0.6 0.4 由表1可知藉由於實施例1所得之黏著薄膜所形成之 絕緣層,係平均熱膨脹係數、表面粗度、導體層剝離強度 之任一者皆顯示具有優異的特性。另一方面,雖藉由比較 例1所得之黏著薄膜所形成之絕緣層係導體層剝離強度優 異,但表面粗度値大、於形成高密度微細電路係不利。又 ,平均熱膨脹係數亦比實施例1値高。又,藉由比較例2 所得之黏著薄膜所形成之絕緣層,雖平均熱膨脹係數及表 面粗度優異,但導體層剝離強度値低。 〔產業上之可利用性〕 本發明之樹脂組成物之硬化物係熱膨脹率低,於形成 絕緣層時,絕緣層表面爲低粗度的同時,可形成具有足夠 -24- 200831600(In the formula (5), η is an average 値 indicating the number of 1 to 6.) <Evaluation of thermal expansion coefficient> The adhesive films obtained in Example 1 and Comparative Examples 1 and 2 were thermally cured at 180 ° C for 90 minutes. And the sheet of hardened matter. A test piece having a cured product of about 5 mm in width and about 15 mm in length was cut, and a thermomechanical analysis was carried out by a tensile weighting method using a Rigakii thermomechanical analyzer (Thermo Plus TMA8 310). After the test piece was attached to the apparatus, the measurement was continuously performed twice under the measurement conditions of a load of 1 g and a temperature rise rate of 5 ° C /min. The average linear thermal expansion rate at 25 ° C to 150 ° C under the visual observation twice was calculated. The results obtained are shown in Table 1. <Measurement of the thickness of the surface of the insulating layer after the wet roughening process, and evaluation of the adhesion strength of the layer of the plated conductor-22-200831600> (1) Lamination of the adhesive film The glass cloth substrate epoxy layer with the inner layer circuit The adhesive film produced in Example 1 and Comparative Examples was applied to both sides of the laminate "thickness of copper foil 18 μηι, substrate thickness 0.8 mm, and R5715ES manufactured by Matsushita Electric Co., Ltd.", and a batch type vacuum pressure laminator MVLP- was used. 500 (product name, famous machine (stock) system) is laminated. The lamination was performed under reduced pressure for 30 seconds to bring the gas pressure to 13 hPa or less, followed by extrusion at 110 ° C for 30 seconds at a pressure of 74 74 °. The PET film was peeled off from the laminated adhesive film, and the resin composition was cured at 180 ° C for 30 minutes to form an insulating layer. (2) Wet roughening treatment and conductor layer plating The circuit substrate was immersed in Swelling Dip·Securiganth P of Atotech Japan (shares) of the swelling liquid at 80 ° C for 5 minutes. Subsequently, it was immersed in a crude solution of Atotech Japan (Concentrate· Compact P (KMn〇4: 60 g/L, NaOH: 40 g/L aqueous solution) at 80 ° C for 10 minutes. Finally, it was immersed in Atotech Japan's Reduction Solution·Securiganth P at 40 ° C for 5 minutes, and then roughened. Subsequently, after drying at 90 ° C for 30 minutes, Ra (10-point average roughness) of the surface of the insulating layer was determined using a non-contact surface roughness meter (WYKO NT33 0 0 manufactured by Veeco Instruments Co., Ltd.). Next, the laminate was subjected to non-electrolyte plating, and then heated at 15 ° C for 30 minutes to be annealed, and copper layer was electrolytically plated by copper sulfate to a thickness of 25 ± 10 μm. Finally, at 1800 ° C for 3 〇 -23 - 200831600 fire treatment. On the electroplated copper layer of the obtained laminate, a rectangular notch having a width of 100 mm and a length of 100 mm was cut, and the end of one side of the longitudinal direction of the slit was peeled off, and the holder was grasped at room temperature at 50 mm. The speed of /min was measured at a load of 35 mm peeling in the vertical direction. The results of the peel strength (peel strength) of the electroplated conductor layer are shown in Table 1. [Table 1] Example 1 Comparative Example 1 Comparative Example 2 Average thermal expansion coefficient (ppm) 45 50 43 Surface roughness Ra (nm) after wet roughening 180 600 220 Conductive layer peel strength (kgf/cm) 0.7 0.6 0.4 As is apparent from Table 1, the insulating layer formed by the adhesive film obtained in Example 1 exhibited excellent characteristics in terms of the average thermal expansion coefficient, the surface roughness, and the peeling strength of the conductor layer. On the other hand, although the peeling strength of the insulating layer-based conductor layer formed by the adhesive film obtained in Comparative Example 1 was excellent, the surface roughness was large, which was disadvantageous in forming a high-density fine circuit. Further, the average coefficient of thermal expansion is also higher than that of Example 1. Further, the insulating layer formed by the adhesive film obtained in Comparative Example 2 was excellent in average thermal expansion coefficient and surface roughness, but the conductor layer peeling strength was lowered. [Industrial Applicability] The cured product of the resin composition of the present invention has a low coefficient of thermal expansion, and when the insulating layer is formed, the surface of the insulating layer is low in thickness and can be formed to have sufficient -24 - 200831600

的附著強度之電鍍導體層,故可適於使用於多層印刷電路 板之製造。 本申請係以於日本提出申請之特願2006_27973 9爲基 礎,本說明書係包括其全部內容。 -25-The adhesion strength of the plated conductor layer is suitable for use in the manufacture of multilayer printed circuit boards. The present application is based on Japanese Patent Application No. 2006_27973, the entire disclosure of which is incorporated herein. -25-

Claims (1)

200831600 十、申請專利範圍 1. 一種樹脂組成物,其特徵爲含有氰酸酯樹脂及下式 (1)所示之萘酚型環氧樹脂, 【化1】 OX 0X200831600 X. Patent application scope 1. A resin composition characterized by containing a cyanate resin and a naphthol type epoxy resin represented by the following formula (1), [Chemical 1] OX 0X (η作爲平均値表示1〜6之數,X表示環氧丙基或碳數1 〜8之烴基,烴基/環氧丙基之比例爲0.05〜2·0)。 2.如申請專利範圍第1項之樹脂組成物,其中氰酸酯 樹脂之含有量相對於樹脂組成物(不揮發份1〇〇質量%)爲5 〜6 0質量%。 3 .如申請專利範圍第1或2項之樹脂組成物,其中式 (1)所示之萘酚型環氧樹脂之含有量相對於樹脂組成物(不 揮發份100質量%)爲1〜50質量%。 4. 如申請專利範圍第1至3項中任一項之樹脂組成物 ,其中更含有苯氧樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹 脂、聚醚醯亞胺樹脂、聚颯樹脂、聚醚礪樹脂、聚苯醚樹 脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂所選出之1 種以上的高分子樹脂。 5. 如申請專利範圍第4項之樹脂組成物,其中高分子 樹脂之含有量相對於樹脂組成物(不揮發份100質量%)爲1 〜60質量%。 -26- 200831600 6. 如申請專利範圍第4或5項之樹脂組成物,其中高 分子樹脂之重量平均分子量爲5000〜200 000。 7. 如申請專利範圍第4至6項中任一項之樹脂組成物 ,其中高分子樹脂爲苯氧樹脂。 8. 如申請專利範圍第1至7項中任一項之樹脂組成物 ,其中更含有無機塡充材料。 9. 如申請專利範圍第8項之樹脂組成物,其中無機塡 充材料之含有量相對於樹脂組成物(不揮發份1 00質量%) 爲50質量%以下。 1 0 ·如申請專利範圍第8或9項之樹脂組成物,其中 無機塡充材料爲二氧化砍。 11· 一種黏著薄膜,其係如申請專利範圍第1至10項 中任一項之樹脂組成物層形成於支持薄膜上所構成。 12·—種預浸物,其係如申請專利範圍第1至10項中 任一項之樹脂組成物浸漬於由纖維所成之片狀補強基材中 而成。 1 3 · —種多層印刷電路板,其係藉由申請專利範圍第1 至1 〇項中任一項之樹脂組成物之硬化物形成絕緣層而成 -27- 200831600 4 峰 七、指定代表圖 (一) 、本案指定代表圖為:無 (二) 、本代表圖之元件代表符號簡單說明:無(η as an average 値 represents a number of 1 to 6, and X represents an epoxy group or a hydrocarbon group having 1 to 8 carbon atoms, and the ratio of the hydrocarbon group to the epoxy group is 0.05 to 2·0). 2. The resin composition according to the first aspect of the invention, wherein the content of the cyanate resin is from 5 to 60% by mass based on the resin composition (nonvolatile content: 1% by mass). 3. The resin composition according to claim 1 or 2, wherein the content of the naphthol type epoxy resin represented by the formula (1) is 1 to 50 with respect to the resin composition (100% by mass of the nonvolatile matter) quality%. 4. The resin composition according to any one of claims 1 to 3, which further comprises a phenoxy resin, a polyimine resin, a polyamidimide resin, a polyether phthalimide resin, a polyfluorene One or more polymer resins selected from the group consisting of a resin, a polyether oxime resin, a polyphenylene ether resin, a polycarbonate resin, a polyether ether ketone resin, and a polyester resin. 5. The resin composition of claim 4, wherein the content of the polymer resin is from 1 to 60% by mass based on the resin composition (100% by mass of the nonvolatile matter). -26- 200831600 6. The resin composition of claim 4 or 5, wherein the high molecular weight resin has a weight average molecular weight of from 5,000 to 200,000. 7. The resin composition according to any one of claims 4 to 6, wherein the polymer resin is a phenoxy resin. 8. The resin composition according to any one of claims 1 to 7, which further comprises an inorganic chelating material. 9. The resin composition of claim 8, wherein the content of the inorganic ruthenium material is 50% by mass or less based on the resin composition (nonvolatile content: 100% by mass). 1 0. The resin composition according to claim 8 or 9, wherein the inorganic chelating material is oxidized chopping. An adhesive film formed by forming a resin composition layer according to any one of claims 1 to 10 on a support film. A prepreg obtained by immersing a resin composition according to any one of claims 1 to 10 in a sheet-like reinforcing substrate made of fibers. 1 3 - A multilayer printed circuit board formed by forming a heat-insulating layer of a resin composition according to any one of claims 1 to 1 -27-200831600 4 Peak VII, designated representative diagram (1) The representative representative of the case is: No (2), the representative symbol of the representative figure is a simple description: None 八、本案若有化學式時,請揭示最能顯示發明特徵的化學 式:無8. If there is a chemical formula in this case, please reveal the chemical formula that best shows the characteristics of the invention: none -3--3-
TW096138028A 2006-10-13 2007-10-11 Resin composition TWI455988B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006279739 2006-10-13

Publications (2)

Publication Number Publication Date
TW200831600A true TW200831600A (en) 2008-08-01
TWI455988B TWI455988B (en) 2014-10-11

Family

ID=39282953

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096138028A TWI455988B (en) 2006-10-13 2007-10-11 Resin composition

Country Status (4)

Country Link
JP (1) JP5298852B2 (en)
KR (1) KR101464140B1 (en)
TW (1) TWI455988B (en)
WO (1) WO2008044766A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI477549B (en) * 2009-02-06 2015-03-21 Ajinomoto Kk Resin composition

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101419281B1 (en) * 2007-06-14 2014-07-15 아지노모토 가부시키가이샤 Resin composition for interlayer insulation of multilayer printed wiring board
JP5245526B2 (en) * 2008-05-09 2013-07-24 日立化成株式会社 Insulating resin composition and insulating film with support
JP5276389B2 (en) * 2008-09-05 2013-08-28 パナソニック株式会社 Polyphenylene ether resin composition, prepreg, metal-clad laminate, and printed wiring board
TWI477528B (en) * 2008-10-07 2015-03-21 Ajinomoto Kk Epoxy resin composition
TWI486372B (en) * 2008-11-28 2015-06-01 Ajinomoto Kk Resin composition
WO2010082658A1 (en) * 2009-01-19 2010-07-22 味の素株式会社 Resin composition
TWI565750B (en) 2009-02-20 2017-01-11 Ajinomoto Kk Resin composition
JP5482002B2 (en) * 2009-08-03 2014-04-23 味の素株式会社 Resin composition
TWI540170B (en) * 2009-12-14 2016-07-01 Ajinomoto Kk Resin composition
JP6109569B2 (en) * 2010-05-07 2017-04-05 住友ベークライト株式会社 Epoxy resin composition for circuit board, prepreg, laminate, resin sheet, laminate substrate for printed wiring board, printed wiring board, and semiconductor device
JP2012153752A (en) * 2011-01-24 2012-08-16 Sumitomo Bakelite Co Ltd Resin composition, prepreg, laminate, resin sheet, printed wiring board and semiconductor device
DK2770005T3 (en) * 2011-10-18 2019-08-05 Guangdong Shengyi Sci Tech Co EPOXY RESIN COMPOSITION AND SUBSTRATE OF A ELECTRONIC HIGH-FREQUENCY CIRCUIT PREPARED BY USING IT
JP7357431B2 (en) * 2017-09-20 2023-10-06 横浜ゴム株式会社 Cyanate ester resin composition for fiber reinforced composite materials, prepreg and fiber reinforced composite materials
TWI798734B (en) * 2021-06-30 2023-04-11 南亞塑膠工業股份有限公司 Thermosetting resin material, prepreg, and metal substrate

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002050661A (en) * 2000-08-07 2002-02-15 Toray Ind Inc Adhesive sheet for semiconductor device, and semiconductor device using the same
JP4207560B2 (en) * 2001-12-21 2009-01-14 住友ベークライト株式会社 Cured resin composition
JP2003212970A (en) * 2002-01-28 2003-07-30 Sumitomo Bakelite Co Ltd Curable resin composition
WO2003099952A1 (en) * 2002-05-27 2003-12-04 Ajinomoto Co., Inc. Adhesive film and prepreg
JP5011641B2 (en) * 2004-01-28 2012-08-29 味の素株式会社 Thermosetting resin composition, adhesive film using the same, and multilayer printed wiring board
JP4465257B2 (en) * 2004-12-07 2010-05-19 新日鐵化学株式会社 Naphthol resin, epoxy resin, production method thereof, epoxy resin composition using the same, and cured product thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI477549B (en) * 2009-02-06 2015-03-21 Ajinomoto Kk Resin composition

Also Published As

Publication number Publication date
TWI455988B (en) 2014-10-11
JPWO2008044766A1 (en) 2010-02-18
WO2008044766A1 (en) 2008-04-17
JP5298852B2 (en) 2013-09-25
KR101464140B1 (en) 2014-11-21
KR20090079233A (en) 2009-07-21

Similar Documents

Publication Publication Date Title
TW200831600A (en) Resin composition
JP6572983B2 (en) Epoxy resin composition
TWI335347B (en) Resin composition for interlayer insulation of multilayer printed wiring board, adhesive film and prepreg
JP4725704B2 (en) Resin composition for interlayer insulation of multilayer printed wiring board, adhesive film and prepreg
TWI477549B (en) Resin composition
TWI486372B (en) Resin composition
JP5029093B2 (en) Resin composition
JP6322885B2 (en) Method for manufacturing printed wiring board
TWI471369B (en) Resin composition
TWI441853B (en) Manufacturing method of multilayer printed circuit board
JP5011641B2 (en) Thermosetting resin composition, adhesive film using the same, and multilayer printed wiring board
TW201030046A (en) Epoxy resin composition
TW201002519A (en) Insulating resin sheet and method for manufacturing multilayer printed wiring board using the insulating resin sheet
JP2010090237A (en) Epoxy resin composition
TW200923007A (en) Epoxy resin composition
JP5293065B2 (en) Resin composition
TW200400242A (en) Adhesive film and prepreg
JP2007273616A (en) Manufacturing method for multilayer printed circuit board
TWI470021B (en) Resin composition
JP6658722B2 (en) Manufacturing method of printed wiring board