TW200819749A - Method to test electronic product - Google Patents

Method to test electronic product Download PDF

Info

Publication number
TW200819749A
TW200819749A TW95138916A TW95138916A TW200819749A TW 200819749 A TW200819749 A TW 200819749A TW 95138916 A TW95138916 A TW 95138916A TW 95138916 A TW95138916 A TW 95138916A TW 200819749 A TW200819749 A TW 200819749A
Authority
TW
Taiwan
Prior art keywords
test
carrier
tray
base
electronic product
Prior art date
Application number
TW95138916A
Other languages
English (en)
Chinese (zh)
Other versions
TWI310087B (enrdf_load_stackoverflow
Inventor
qing-shan Yang
Jin-Zheng Ceng
Original Assignee
Stack Devices Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Stack Devices Corp filed Critical Stack Devices Corp
Priority to TW95138916A priority Critical patent/TW200819749A/zh
Publication of TW200819749A publication Critical patent/TW200819749A/zh
Application granted granted Critical
Publication of TWI310087B publication Critical patent/TWI310087B/zh

Links

Landscapes

  • Automatic Analysis And Handling Materials Therefor (AREA)
TW95138916A 2006-10-20 2006-10-20 Method to test electronic product TW200819749A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Publications (2)

Publication Number Publication Date
TW200819749A true TW200819749A (en) 2008-05-01
TWI310087B TWI310087B (enrdf_load_stackoverflow) 2009-05-21

Family

ID=44769918

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95138916A TW200819749A (en) 2006-10-20 2006-10-20 Method to test electronic product

Country Status (1)

Country Link
TW (1) TW200819749A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013137286A (ja) * 2011-12-28 2013-07-11 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
TWI310087B (enrdf_load_stackoverflow) 2009-05-21

Similar Documents

Publication Publication Date Title
JP2002064132A (ja) 被処理体の受け渡し方法、被処理体の載置機構及びプローブ装置
CN201897631U (zh) 具有散热装置的半导体晶片测试装置及检测系统
JP2024026765A (ja) 半導体デバイスを試験するための機器および方法
TWI260755B (en) System for processing electronic devices
CN108318799A (zh) 芯片烧录测试设备及方法
TW201628471A (zh) Ｐｃｂ板測試機進出料檢測設備及其進出料檢測之流程
JP2009088304A (ja) 半導体装置の製造方法
TWI626446B (zh) 晶片燒錄測試設備及方法
TW200819749A (en) Method to test electronic product
TW200902993A (en) Apparatus for testing system-in-package (SIP) devices
TW200907378A (en) Method for testing micro SD devices
TWI240345B (en) A method for re-testing semiconductor device
US20170102427A1 (en) Semiconductor test apparatus
CN200965545Y (zh) 电子产品移转装置
TW200533907A (en) Apparatus and method for inspecting an inspection object
JP2009150746A (ja) プローブカード、半導体集積回路試験装置、及び、半導体集積回路試験方法
TWI298924B (en) Method for recognizing dice positions by multiple alignments comparing to a wafer map
TWI507700B (zh) 探針台
TWM313114U (en) Carrying and loading device for electronic products
CN104511431B (zh) 测试分选机
KR101496059B1 (ko) 다이들의 위치 정보를 획득하는 방법
TWM536357U (zh) 檢測治具
TW200902998A (en) Apparatus for testing micro SD devices
JP5568320B2 (ja) 検査装置および検査方法
CN108074848A (zh) 垫片、晶圆堆叠结构、吸附式移动装置与晶圆移动方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees