TW200746651A - Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit - Google Patents

Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit

Info

Publication number
TW200746651A
TW200746651A TW095134850A TW95134850A TW200746651A TW 200746651 A TW200746651 A TW 200746651A TW 095134850 A TW095134850 A TW 095134850A TW 95134850 A TW95134850 A TW 95134850A TW 200746651 A TW200746651 A TW 200746651A
Authority
TW
Taiwan
Prior art keywords
cyclic redundancy
redundancy check
check circuit
semiconductor device
signal
Prior art date
Application number
TW095134850A
Other languages
English (en)
Other versions
TWI410054B (zh
Inventor
Masafumi Ito
Tomoaki Atsumi
Original Assignee
Semiconductor Energy Lab Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Lab Co Ltd filed Critical Semiconductor Energy Lab Co Ltd
Publication of TW200746651A publication Critical patent/TW200746651A/zh
Application granted granted Critical
Publication of TWI410054B publication Critical patent/TWI410054B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/09—Error detection only, e.g. using cyclic redundancy check [CRC] codes or single parity bit
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/06—Receivers
    • H04B1/10—Means associated with receiver for limiting or suppressing noise or interference
TW95134850A 2005-09-21 2006-09-20 循環冗餘核對電路及具有循環冗餘核對電路之半導體裝置 TWI410054B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005273356 2005-09-21

Publications (2)

Publication Number Publication Date
TW200746651A true TW200746651A (en) 2007-12-16
TWI410054B TWI410054B (zh) 2013-09-21

Family

ID=37888977

Family Applications (2)

Application Number Title Priority Date Filing Date
TW95134850A TWI410054B (zh) 2005-09-21 2006-09-20 循環冗餘核對電路及具有循環冗餘核對電路之半導體裝置
TW102125058A TWI586111B (zh) 2005-09-21 2006-09-20 循環冗餘核對電路及具有循環冗餘核對電路之半導體裝置

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW102125058A TWI586111B (zh) 2005-09-21 2006-09-20 循環冗餘核對電路及具有循環冗餘核對電路之半導體裝置

Country Status (4)

Country Link
US (4) US7712009B2 (zh)
EP (1) EP1938458B1 (zh)
TW (2) TWI410054B (zh)
WO (1) WO2007034935A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI464578B (zh) * 2009-06-09 2014-12-11 Microchip Tech Inc 可程式化循環冗餘檢查（ｃｒｃ）單元

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US7712009B2 (en) * 2005-09-21 2010-05-04 Semiconductor Energy Laboratory Co., Ltd. Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
JP5322346B2 (ja) * 2007-06-07 2013-10-23 株式会社半導体エネルギー研究所 半導体装置
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JP2009205669A (ja) * 2008-01-31 2009-09-10 Semiconductor Energy Lab Co Ltd 半導体装置
TW201921700A (zh) * 2008-11-07 2019-06-01 日商半導體能源研究所股份有限公司 半導體裝置和其製造方法
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI464578B (zh) * 2009-06-09 2014-12-11 Microchip Tech Inc 可程式化循環冗餘檢查（ｃｒｃ）單元

Also Published As

Publication number Publication date
US9294126B2 (en) 2016-03-22
US20140120858A1 (en) 2014-05-01
US20100205519A1 (en) 2010-08-12
TWI586111B (zh) 2017-06-01
EP1938458A4 (en) 2012-01-18
TW201342811A (zh) 2013-10-16
US7712009B2 (en) 2010-05-04
EP1938458B1 (en) 2015-06-03
US20150214979A1 (en) 2015-07-30
US9009563B2 (en) 2015-04-14
US8627170B2 (en) 2014-01-07
US20070089028A1 (en) 2007-04-19
EP1938458A1 (en) 2008-07-02
TWI410054B (zh) 2013-09-21
WO2007034935A1 (en) 2007-03-29

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