TW200741213A - Testing devices under test by an automatic test apparatus having a multisite probe card - Google Patents
Testing devices under test by an automatic test apparatus having a multisite probe cardInfo
- Publication number
- TW200741213A TW200741213A TW096104425A TW96104425A TW200741213A TW 200741213 A TW200741213 A TW 200741213A TW 096104425 A TW096104425 A TW 096104425A TW 96104425 A TW96104425 A TW 96104425A TW 200741213 A TW200741213 A TW 200741213A
- Authority
- TW
- Taiwan
- Prior art keywords
- probe card
- multisite
- testing
- devices
- malfunctioning
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31901—Analysis of tester Performance; Tester characterization
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2006/050745 WO2007090465A1 (en) | 2006-02-08 | 2006-02-08 | Testing devices under test by an automatic test apparatus having a multisite probe card |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741213A true TW200741213A (en) | 2007-11-01 |
TWI348026B TWI348026B (en) | 2011-09-01 |
Family
ID=37056860
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096104425A TWI348026B (en) | 2006-02-08 | 2007-02-07 | Testing devices under test by an automatic test apparatus having a multisite probe card |
Country Status (2)
Country | Link |
---|---|
TW (1) | TWI348026B (zh) |
WO (1) | WO2007090465A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI773140B (zh) * | 2020-03-05 | 2022-08-01 | 日商愛德萬測試股份有限公司 | 用於流量捕獲及除錯工具之圖形使用者介面 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101286250B1 (ko) * | 2011-11-23 | 2013-07-12 | 양 전자시스템 주식회사 | 다수의 헤드 유니트를 갖는 어레이 테스트 장치 |
CN103869108B (zh) * | 2014-03-17 | 2016-08-17 | 上海华虹宏力半导体制造有限公司 | 持卡器装置及多功位测试装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0763788A (ja) * | 1993-08-21 | 1995-03-10 | Hewlett Packard Co <Hp> | プローブおよび電気部品/回路検査装置ならびに電気部品/回路検査方法 |
US6741085B1 (en) * | 1993-11-16 | 2004-05-25 | Formfactor, Inc. | Contact carriers (tiles) for populating larger substrates with spring contacts |
US5726920A (en) * | 1995-09-29 | 1998-03-10 | Advanced Micro Devices, Inc. | Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line |
US6113646A (en) * | 1997-12-04 | 2000-09-05 | Micron Technology, Inc. | Method of selecting layout of integrated circuit probe card |
US7307433B2 (en) * | 2004-04-21 | 2007-12-11 | Formfactor, Inc. | Intelligent probe card architecture |
-
2006
- 2006-02-08 WO PCT/EP2006/050745 patent/WO2007090465A1/en active Application Filing
-
2007
- 2007-02-07 TW TW096104425A patent/TWI348026B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI773140B (zh) * | 2020-03-05 | 2022-08-01 | 日商愛德萬測試股份有限公司 | 用於流量捕獲及除錯工具之圖形使用者介面 |
Also Published As
Publication number | Publication date |
---|---|
WO2007090465A1 (en) | 2007-08-16 |
TWI348026B (en) | 2011-09-01 |
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