TWI348026B - Testing devices under test by an automatic test apparatus having a multisite probe card - Google Patents
Testing devices under test by an automatic test apparatus having a multisite probe cardInfo
- Publication number
- TWI348026B TWI348026B TW096104425A TW96104425A TWI348026B TW I348026 B TWI348026 B TW I348026B TW 096104425 A TW096104425 A TW 096104425A TW 96104425 A TW96104425 A TW 96104425A TW I348026 B TWI348026 B TW I348026B
- Authority
- TW
- Taiwan
- Prior art keywords
- multisite
- probe card
- devices under
- testing devices
- under test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31901—Analysis of tester Performance; Tester characterization
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2006/050745 WO2007090465A1 (en) | 2006-02-08 | 2006-02-08 | Testing devices under test by an automatic test apparatus having a multisite probe card |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741213A TW200741213A (en) | 2007-11-01 |
TWI348026B true TWI348026B (en) | 2011-09-01 |
Family
ID=37056860
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096104425A TWI348026B (en) | 2006-02-08 | 2007-02-07 | Testing devices under test by an automatic test apparatus having a multisite probe card |
Country Status (2)
Country | Link |
---|---|
TW (1) | TWI348026B (zh) |
WO (1) | WO2007090465A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI491896B (zh) * | 2011-11-23 | 2015-07-11 | Yang Electronic Systems Co Ltd | 具複數檢測頭之陳列檢測裝置 |
TWI773140B (zh) * | 2020-03-05 | 2022-08-01 | 日商愛德萬測試股份有限公司 | 用於流量捕獲及除錯工具之圖形使用者介面 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103869108B (zh) * | 2014-03-17 | 2016-08-17 | 上海华虹宏力半导体制造有限公司 | 持卡器装置及多功位测试装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0763788A (ja) * | 1993-08-21 | 1995-03-10 | Hewlett Packard Co <Hp> | プローブおよび電気部品/回路検査装置ならびに電気部品/回路検査方法 |
US6741085B1 (en) * | 1993-11-16 | 2004-05-25 | Formfactor, Inc. | Contact carriers (tiles) for populating larger substrates with spring contacts |
US5726920A (en) * | 1995-09-29 | 1998-03-10 | Advanced Micro Devices, Inc. | Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line |
US6113646A (en) * | 1997-12-04 | 2000-09-05 | Micron Technology, Inc. | Method of selecting layout of integrated circuit probe card |
US7307433B2 (en) * | 2004-04-21 | 2007-12-11 | Formfactor, Inc. | Intelligent probe card architecture |
-
2006
- 2006-02-08 WO PCT/EP2006/050745 patent/WO2007090465A1/en active Application Filing
-
2007
- 2007-02-07 TW TW096104425A patent/TWI348026B/zh active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI491896B (zh) * | 2011-11-23 | 2015-07-11 | Yang Electronic Systems Co Ltd | 具複數檢測頭之陳列檢測裝置 |
TWI773140B (zh) * | 2020-03-05 | 2022-08-01 | 日商愛德萬測試股份有限公司 | 用於流量捕獲及除錯工具之圖形使用者介面 |
Also Published As
Publication number | Publication date |
---|---|
TW200741213A (en) | 2007-11-01 |
WO2007090465A1 (en) | 2007-08-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1627235A4 (en) | PROBE FOR TESTING A BLOCK TO BE TESTED | |
EP1509776A4 (en) | TEST PROBE OF A DEVICE SUBMITTED TEST | |
HK1154116A1 (zh) | 用於測試數據存儲裝置的測試儀 | |
EP2218005A4 (en) | TEST METHOD IN RECONFIGURABLE TEST EQUIPMENT | |
GB2433125B (en) | A pile test apparatus | |
GB0523958D0 (en) | Test equipment for testing hazard detectors | |
HK1155812A1 (en) | Method for the non-destructive testing of a test object by way of ultrasound and corresponding device | |
EP2008112A4 (en) | INSTRUMENT HOST STATION FOR AN AUTOMATED TESTING SYSTEM | |
IL190826A0 (en) | A probe for testing electrical properties of a test sample | |
EP2257214A4 (en) | METHOD AND APPARATUS FOR TEST TIME OF MEASURING SUBSTANCE TO BE ANALYZED | |
EP2257219A4 (en) | METHOD AND APPARATUS FOR TEST TIME OF MEASURING SUBSTANCE TO BE ANALYZED | |
HK1153106A1 (zh) | 種進行視敏度檢查的系統 | |
FR2918759B1 (fr) | Procede de test d'un systeme electronique | |
TWI371589B (en) | Parallel calibration system for an electronic tester or a test device and method for operating an electronic test device | |
PL2330404T3 (pl) | Urządzenie do testowania elastycznego separatora | |
GB2445187B (en) | Diagnostic test device | |
EP2223105A4 (en) | METHOD FOR TESTING THE FUNCTION OF A DEVICE | |
TWI369499B (en) | Test apparatus, probe card, and test method | |
GB2451314B (en) | Method and apparatus for amplifying a signal and test device using same | |
IL201475A0 (en) | Probe for testing semiconductor devices | |
TWI348026B (en) | Testing devices under test by an automatic test apparatus having a multisite probe card | |
GB201410840D0 (en) | An apparatus for treating a test sample | |
FR2939925B1 (fr) | Dispositif de test d'un circuit et procede de mise en oeuvre | |
TWI317818B (en) | Testing device having a pattern memory and testing method for testing a device under test | |
EP2341837A4 (en) | ANALYSIS NEEDLE DEVICE |