TW200736593A - Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel - Google Patents

Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel

Info

Publication number
TW200736593A
TW200736593A TW095142030A TW95142030A TW200736593A TW 200736593 A TW200736593 A TW 200736593A TW 095142030 A TW095142030 A TW 095142030A TW 95142030 A TW95142030 A TW 95142030A TW 200736593 A TW200736593 A TW 200736593A
Authority
TW
Taiwan
Prior art keywords
illumination light
substrate
light source
measuring reflectance
display panel
Prior art date
Application number
TW095142030A
Other languages
English (en)
Chinese (zh)
Inventor
Naoki Koto
Kazunori Inoue
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of TW200736593A publication Critical patent/TW200736593A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G02F1/13318—Circuits comprising a photodetector
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133553—Reflecting elements
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/58—Arrangements comprising a monitoring photodetector
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2203/00—Function characteristic
    • G02F2203/69—Arrangements or methods for testing or calibrating a device

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)
TW095142030A 2006-02-09 2006-11-14 Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel TW200736593A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006031804A JP2007212260A (ja) 2006-02-09 2006-02-09 反射率測定装置、反射率測定方法及び表示パネルの製造方法

Publications (1)

Publication Number Publication Date
TW200736593A true TW200736593A (en) 2007-10-01

Family

ID=38490849

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095142030A TW200736593A (en) 2006-02-09 2006-11-14 Apparatus for measuring reflectance, method for measuring reflectance and method for manufacturing display panel

Country Status (4)

Country Link
JP (1) JP2007212260A (ko)
KR (1) KR100795853B1 (ko)
CN (1) CN100464210C (ko)
TW (1) TW200736593A (ko)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012063269A (ja) * 2010-09-16 2012-03-29 Sony Corp 測定装置及び測定方法
JP2012063321A (ja) * 2010-09-17 2012-03-29 Hamamatsu Photonics Kk 反射率測定装置、反射率測定方法、膜厚測定装置及び膜厚測定方法
CN103344613B (zh) * 2013-07-26 2016-09-28 杭州远方光电信息股份有限公司 一种材料反射特性测量装置及方法
CN105195468B (zh) * 2014-06-25 2017-08-18 核工业西南物理研究院 一种在线清洗和检测聚变装置第一镜的方法与装置
CN104503118B (zh) * 2015-01-22 2017-04-26 合肥京东方光电科技有限公司 一种面板引线检测装置及检测方法
CN106596403A (zh) * 2016-11-25 2017-04-26 中国科学院长春光学精密机械与物理研究所 用于曲面镜反射率测量的夹持装置
CN110036284B (zh) 2016-11-29 2020-09-18 株式会社理学 X射线反射率测定装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4385419B2 (ja) * 1998-11-30 2009-12-16 株式会社ニコン 外観検査方法及び外観検査装置
AU4277501A (en) * 2000-03-24 2001-10-03 Olympus Optical Co., Ltd. Apparatus for detecting defect
TWI285738B (en) * 2000-09-26 2007-08-21 Olympus Corp Defect detecting apparatus and computer readable medium
JP2002162360A (ja) * 2000-11-22 2002-06-07 Seiko Epson Corp 液晶パネルの評価方法及び評価装置
JP2003028756A (ja) * 2001-07-11 2003-01-29 Chuo Seiki Kk 反射光測定装置
JP2004177162A (ja) * 2002-11-25 2004-06-24 Alps Electric Co Ltd 反射率測定装置
KR100568725B1 (ko) * 2003-12-30 2006-04-07 삼성전자주식회사 결함 검사 장치
JP2006029833A (ja) * 2004-07-12 2006-02-02 Hikari Physics Kenkyusho:Kk 光学素子評価方法または装置
KR100732349B1 (ko) * 2005-04-29 2007-06-27 주식회사 에이디피엔지니어링 기판 외관 검사 장치

Also Published As

Publication number Publication date
KR20070081079A (ko) 2007-08-14
KR100795853B1 (ko) 2008-01-21
JP2007212260A (ja) 2007-08-23
CN100464210C (zh) 2009-02-25
CN101017254A (zh) 2007-08-15

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