TW200732658A - Contactless system and method for detecting defective points on a chargeable surface - Google Patents
Contactless system and method for detecting defective points on a chargeable surfaceInfo
- Publication number
- TW200732658A TW200732658A TW095136866A TW95136866A TW200732658A TW 200732658 A TW200732658 A TW 200732658A TW 095136866 A TW095136866 A TW 095136866A TW 95136866 A TW95136866 A TW 95136866A TW 200732658 A TW200732658 A TW 200732658A
- Authority
- TW
- Taiwan
- Prior art keywords
- chargeable surface
- chargeable
- charge
- probe
- scanner probe
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/75—Details relating to xerographic drum, band or plate, e.g. replacing, testing
- G03G15/751—Details relating to xerographic drum, band or plate, e.g. replacing, testing relating to drum
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/55—Self-diagnostics; Malfunction or lifetime display
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Cleaning In Electrography (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/247,576 US7271593B2 (en) | 2005-10-11 | 2005-10-11 | Contactless system and method for detecting defective points on a chargeable surface |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200732658A true TW200732658A (en) | 2007-09-01 |
Family
ID=37910541
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095136866A TW200732658A (en) | 2005-10-11 | 2006-10-04 | Contactless system and method for detecting defective points on a chargeable surface |
Country Status (4)
Country | Link |
---|---|
US (1) | US7271593B2 (zh) |
JP (1) | JP5026043B2 (zh) |
CA (1) | CA2562468C (zh) |
TW (1) | TW200732658A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108828374A (zh) * | 2018-08-16 | 2018-11-16 | 上海仪器仪表自控系统检验测试所有限公司 | 防爆产品中非金属材料转移电荷测试装置及测试方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7855565B2 (en) * | 2008-11-06 | 2010-12-21 | Xerox Corporation | Substrate characterization device and method for characterizing a substrate |
US8169210B2 (en) * | 2009-04-07 | 2012-05-01 | Xerox Corporation | Contactless system and method for electrostatic sensing with a high spatial resolution |
CN108362746B (zh) * | 2018-02-01 | 2021-07-02 | 中国石油大学(华东) | 基于单对电极电容成像检测技术提离效应的缺陷判别方法 |
CN109030581B (zh) * | 2018-07-04 | 2024-04-16 | 南京铁道职业技术学院 | 一种复合结构的受电弓碳滑板表面损伤检测用电荷变换器 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3898001A (en) * | 1973-08-14 | 1975-08-05 | Xerox Corp | Electrometer system for non-contact detection of electrostatic charge on a moving electrostatographic imaging surface |
JP2674002B2 (ja) * | 1984-03-16 | 1997-11-05 | 富士電機株式会社 | 電子写真用感光体の畫像欠陥評価装置 |
JP2927808B2 (ja) * | 1988-03-22 | 1999-07-28 | 株式会社日立製作所 | 静電記録装置とその感光体寿命評価方法 |
US5119030A (en) * | 1990-05-18 | 1992-06-02 | Trek, Inc | Apparatus for electrically inspecting the surface of a drum |
US6469513B1 (en) * | 1992-11-12 | 2002-10-22 | Quality Engineering Associates, Inc. | Automated stationary/portable test system for applying a current signal to a dielectric material being tested |
JPH0989962A (ja) * | 1995-09-26 | 1997-04-04 | Fuji Electric Co Ltd | 電子写真用感光体の電気特性測定装置 |
US5703487A (en) * | 1996-01-11 | 1997-12-30 | Xerox Corporation | Detection of charge deficient spot susceptibility |
US6008653A (en) | 1997-10-30 | 1999-12-28 | Xerox Corporation | Contactless system for detecting microdefects on electrostatographic members |
US6119536A (en) | 1997-10-30 | 2000-09-19 | Xerox Corporation | Constant distance contactless device |
US6682872B2 (en) * | 2002-01-22 | 2004-01-27 | International Business Machines Corporation | UV-curable compositions and method of use thereof in microelectronics |
-
2005
- 2005-10-11 US US11/247,576 patent/US7271593B2/en not_active Expired - Fee Related
-
2006
- 2006-10-04 CA CA2562468A patent/CA2562468C/en not_active Expired - Fee Related
- 2006-10-04 TW TW095136866A patent/TW200732658A/zh unknown
- 2006-10-04 JP JP2006272964A patent/JP5026043B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108828374A (zh) * | 2018-08-16 | 2018-11-16 | 上海仪器仪表自控系统检验测试所有限公司 | 防爆产品中非金属材料转移电荷测试装置及测试方法 |
Also Published As
Publication number | Publication date |
---|---|
JP2007108173A (ja) | 2007-04-26 |
US20070080693A1 (en) | 2007-04-12 |
CA2562468C (en) | 2011-03-29 |
JP5026043B2 (ja) | 2012-09-12 |
US7271593B2 (en) | 2007-09-18 |
CA2562468A1 (en) | 2007-04-11 |
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