TW200723345A - Ultra-thin liquid control plate and combination of box-like member and the control plate - Google Patents

Ultra-thin liquid control plate and combination of box-like member and the control plate

Info

Publication number
TW200723345A
TW200723345A TW095128020A TW95128020A TW200723345A TW 200723345 A TW200723345 A TW 200723345A TW 095128020 A TW095128020 A TW 095128020A TW 95128020 A TW95128020 A TW 95128020A TW 200723345 A TW200723345 A TW 200723345A
Authority
TW
Taiwan
Prior art keywords
control plate
box
liquid
ultra
combination
Prior art date
Application number
TW095128020A
Other languages
English (en)
Other versions
TWI296812B (zh
Inventor
Chih-Yu Chao
Wen-Jiunn Hsieh
Original Assignee
Li Bing Huan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Li Bing Huan filed Critical Li Bing Huan
Priority to TW095128020A priority Critical patent/TW200723345A/zh
Priority to JP2006227879A priority patent/JP2007165283A/ja
Publication of TW200723345A publication Critical patent/TW200723345A/zh
Application granted granted Critical
Publication of TWI296812B publication Critical patent/TWI296812B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/2602—Details
    • H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
    • H01J2237/2608—Details operating at elevated pressures, e.g. atmosphere with environmental specimen chamber

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Laminated Bodies (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
TW095128020A 2005-12-09 2006-07-31 Ultra-thin liquid control plate and combination of box-like member and the control plate TW200723345A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW095128020A TW200723345A (en) 2005-12-09 2006-07-31 Ultra-thin liquid control plate and combination of box-like member and the control plate
JP2006227879A JP2007165283A (ja) 2005-12-09 2006-08-24 電子顕微鏡用の超薄液体制御板及び電子顕微鏡用の超薄液体制御板とボックスとの組合せ

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW94143725 2005-12-09
TW095128020A TW200723345A (en) 2005-12-09 2006-07-31 Ultra-thin liquid control plate and combination of box-like member and the control plate

Publications (2)

Publication Number Publication Date
TW200723345A true TW200723345A (en) 2007-06-16
TWI296812B TWI296812B (zh) 2008-05-11

Family

ID=38192511

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095128020A TW200723345A (en) 2005-12-09 2006-07-31 Ultra-thin liquid control plate and combination of box-like member and the control plate

Country Status (3)

Country Link
US (1) US7554099B2 (zh)
JP (1) JP2007163447A (zh)
TW (1) TW200723345A (zh)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI277734B (en) * 2005-10-26 2007-04-01 Li Bing Huan Method for observing living bodies using an electron microscopy
TWI276139B (en) * 2005-12-09 2007-03-11 Li Bing Huan Closed observation environment for electron microscope
TW200722732A (en) * 2005-12-09 2007-06-16 Li Bing Huan Semi-enclosed observation space for electron microscopy
TW200802490A (en) * 2006-06-12 2008-01-01 Contrel Technology Co Ltd Environment for observing liquid/gas and combined with sample room of electron microscope
EP1953789A1 (en) * 2007-02-05 2008-08-06 FEI Company Method for thinning a sample and sample carrier for performing said method
JP5284699B2 (ja) * 2008-03-17 2013-09-11 日本電子株式会社 電子顕微鏡の試料装置
JP5226378B2 (ja) 2008-04-28 2013-07-03 株式会社日立ハイテクノロジーズ 透過型電子顕微鏡、及び試料観察方法
JP2010002300A (ja) * 2008-06-20 2010-01-07 Jeol Ltd 試料保持体、試料検査装置及び試料検査方法
US8732940B2 (en) * 2009-03-12 2014-05-27 Clean Energy Solutions, Inc. System and method for mounting photovoltaic panels
JP5442417B2 (ja) * 2009-12-14 2014-03-12 株式会社日立ハイテクノロジーズ 荷電粒子線装置及び試料観察方法
US20130053281A1 (en) * 2010-02-02 2013-02-28 Arash Zarrine-Afsar Fluid sampling device and method of use thereof
JP5699207B2 (ja) * 2011-04-28 2015-04-08 株式会社日立ハイテクノロジーズ 電子顕微鏡用試料保持装置及び電子顕微鏡装置
JP6239246B2 (ja) 2013-03-13 2017-11-29 株式会社日立ハイテクノロジーズ 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材
DE112014001109B4 (de) * 2013-04-12 2019-11-14 Hitachi High-Technologies Corporation Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Filterelement
GB201613173D0 (en) * 2016-07-29 2016-09-14 Medical Res Council Electron microscopy
CN108593028B (zh) * 2018-06-20 2024-05-17 中国科学技术大学 一种液体离散结构以及液体测量装置
JP6995088B2 (ja) * 2019-07-01 2022-01-14 日本電子株式会社 試料支持体および試料支持体の製造方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE335630B (zh) * 1964-08-31 1971-06-01 H Unger
JP2781320B2 (ja) * 1993-01-18 1998-07-30 株式会社蛋白工学研究所 電子顕微鏡等の試料ホルダ
IL156027A0 (en) * 2000-12-01 2003-12-23 El Mul Technologies Ltd Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope
WO2003104846A2 (en) * 2002-06-05 2003-12-18 Quantomix Ltd. A sample enclosure for a scanning electron microscope and methods of use thereof

Also Published As

Publication number Publication date
US7554099B2 (en) 2009-06-30
TWI296812B (zh) 2008-05-11
US20070145268A1 (en) 2007-06-28
JP2007163447A (ja) 2007-06-28

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees