TW200720732A - Inspecting system of flat panel display - Google Patents

Inspecting system of flat panel display

Info

Publication number
TW200720732A
TW200720732A TW095141121A TW95141121A TW200720732A TW 200720732 A TW200720732 A TW 200720732A TW 095141121 A TW095141121 A TW 095141121A TW 95141121 A TW95141121 A TW 95141121A TW 200720732 A TW200720732 A TW 200720732A
Authority
TW
Taiwan
Prior art keywords
flat panel
cassette
conveyor
inspecting system
panel display
Prior art date
Application number
TW095141121A
Other languages
Chinese (zh)
Inventor
Young-Min Choi
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200720732A publication Critical patent/TW200720732A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Nonlinear Science (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

An inspecting system of a flat panel display is disclosed, which can provide an on-line operation used for an ignited-lamp inspection of a flat panel. The inspecting system includes a conveyor section, which conveys the cassette carrying a flat panel; an inspecting apparatus, which is arranged at two sides of the conveyor section, accepts the flat panel provided from the cassette, and performs the inspection of the flat panel; and a supply member, which lets the cassette be isolated from the conveyor and provides the cassette to the inspecting apparatus. The supply member can include a table, which supports the said cassette placed on the conveyor; and a lifting/descending member, which can lift/descend the said table, so that the cassette can be lifted from the conveyor.
TW095141121A 2005-11-18 2006-11-07 Inspecting system of flat panel display TW200720732A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050110863A KR100740010B1 (en) 2005-11-18 2005-11-18 Inspecting system of flat panel display

Publications (1)

Publication Number Publication Date
TW200720732A true TW200720732A (en) 2007-06-01

Family

ID=38076171

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095141121A TW200720732A (en) 2005-11-18 2006-11-07 Inspecting system of flat panel display

Country Status (4)

Country Link
JP (1) JP2007139763A (en)
KR (1) KR100740010B1 (en)
CN (1) CN100447616C (en)
TW (1) TW200720732A (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5144241B2 (en) * 2007-12-17 2013-02-13 パナソニック液晶ディスプレイ株式会社 Manufacturing method and inspection system of liquid crystal display device
CN101403709B (en) * 2008-10-31 2011-12-14 广东正业科技股份有限公司 Appearance inspection machine for printed circuit board
JP5427099B2 (en) * 2010-04-23 2014-02-26 西部電機株式会社 Plate-like material transfer system
KR101169915B1 (en) * 2010-08-04 2012-08-06 오성엘에스티(주) System for testing liquid crystal display module and method for testing crystal display module using the same
KR101037319B1 (en) 2010-08-17 2011-05-26 주식회사 에이원마이크로 Cell inspection device and cell inspection method
CN104391206B (en) * 2014-12-04 2017-02-22 昆山精讯电子技术有限公司 OLED panel test device
CN107134240A (en) * 2016-02-29 2017-09-05 西安诺瓦电子科技有限公司 Equipment runs board
JP2017198499A (en) * 2016-04-26 2017-11-02 日本電産サンキョー株式会社 Processing system
CN108896575A (en) * 2018-05-08 2018-11-27 苏州建益森电子科技有限公司 A kind of electronic device appearance detection system and detection method
CN109238653A (en) * 2018-08-17 2019-01-18 张家港康得新光电材料有限公司 A kind of detection method, device, computer readable storage medium and computer equipment
KR102617891B1 (en) * 2019-01-09 2023-12-28 삼성디스플레이 주식회사 Apparatus and method for inspecting display pannel
CN109916597B (en) * 2019-04-18 2020-12-04 深圳市华星光电半导体显示技术有限公司 Optical detection device and optical detection method
KR102326415B1 (en) * 2020-06-11 2021-11-15 김강혁 Apparatus for inspecting of con

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2610918B2 (en) * 1987-12-25 1997-05-14 東京エレクトロン株式会社 Method and apparatus for treating object
CN2226775Y (en) * 1994-05-23 1996-05-08 中国科学院长春物理研究所 Electric control double-reflection mode liquid crystal display device
JP2002083854A (en) * 1999-07-09 2002-03-22 Tokyo Electron Ltd Substrate carrying apparatus
JP4356233B2 (en) * 2000-11-30 2009-11-04 株式会社Ｉｈｉ Substrate transfer device
WO2002071023A1 (en) * 2001-03-06 2002-09-12 Toray Industries, Inc. Inspection method, inspection device, and manufacturing method for display panel
KR20020096779A (en) * 2001-06-18 2002-12-31 김연환 Probe used in display test
JP4039130B2 (en) * 2001-08-08 2008-01-30 セイコーエプソン株式会社 OPTICAL DEVICE, OPTICAL DEVICE MANUFACTURING METHOD, AND PROJECTOR
JP2003302439A (en) * 2002-04-09 2003-10-24 Tokyo Cathode Laboratory Co Ltd Probe contact device for display panel inspection
JP2003344220A (en) * 2002-05-22 2003-12-03 Sony Corp Manufacturing method for liquid crystal display, and device and method for inspecting ghost defect for liquid crystal display

Also Published As

Publication number Publication date
CN1967318A (en) 2007-05-23
KR20070052989A (en) 2007-05-23
KR100740010B1 (en) 2007-07-16
CN100447616C (en) 2008-12-31
JP2007139763A (en) 2007-06-07

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