TW200708725A - System for measuring heat-conducting performance of heat-conducting component and screening method thereof - Google Patents
System for measuring heat-conducting performance of heat-conducting component and screening method thereofInfo
- Publication number
- TW200708725A TW200708725A TW094128929A TW94128929A TW200708725A TW 200708725 A TW200708725 A TW 200708725A TW 094128929 A TW094128929 A TW 094128929A TW 94128929 A TW94128929 A TW 94128929A TW 200708725 A TW200708725 A TW 200708725A
- Authority
- TW
- Taiwan
- Prior art keywords
- heat
- conducting
- performance
- conducting component
- component
- Prior art date
Links
- 238000012216 screening Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 title abstract 2
- 238000010438 heat treatment Methods 0.000 abstract 5
- 238000001816 cooling Methods 0.000 abstract 4
- 239000002184 metal Substances 0.000 abstract 2
- 238000011946 reduction process Methods 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094128929A TWI277727B (en) | 2005-08-24 | 2005-08-24 | Measuring system for heat conductance performance of heat conductance device |
US11/317,120 US7581878B2 (en) | 2005-08-24 | 2005-12-22 | Measuring system and screening method for thermal conductive efficiencies of thermal conductive devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW094128929A TWI277727B (en) | 2005-08-24 | 2005-08-24 | Measuring system for heat conductance performance of heat conductance device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200708725A true TW200708725A (en) | 2007-03-01 |
TWI277727B TWI277727B (en) | 2007-04-01 |
Family
ID=37804031
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094128929A TWI277727B (en) | 2005-08-24 | 2005-08-24 | Measuring system for heat conductance performance of heat conductance device |
Country Status (2)
Country | Link |
---|---|
US (1) | US7581878B2 (zh) |
TW (1) | TWI277727B (zh) |
Cited By (3)
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CN104807851A (zh) * | 2015-04-21 | 2015-07-29 | 东莞市卡尔文塑胶科技有限公司 | 标样导散热系数点对点检测方法及检测设备 |
CN107621474A (zh) * | 2016-07-15 | 2018-01-23 | 神讯电脑(昆山)有限公司 | 热导管检测装置 |
CN115597744A (zh) * | 2022-12-14 | 2023-01-13 | 蜂巢传动科技邳州有限公司(Cn) | 温度测量方法、芯片温度检测方法、装置、设备及车辆 |
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JP4673647B2 (ja) * | 2005-03-22 | 2011-04-20 | 出光興産株式会社 | 金属の表面温度測定装置 |
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JP2009047600A (ja) * | 2007-08-21 | 2009-03-05 | Fujitsu Ltd | 温度試験装置、温度試験方法 |
TW200921066A (en) * | 2007-11-02 | 2009-05-16 | Foxconn Tech Co Ltd | Detecting device for heat pipes |
US8042993B2 (en) * | 2007-12-21 | 2011-10-25 | GM Global Technology Operations LLC | Air-cooled power electronics service algorithm |
FR2925693B1 (fr) * | 2007-12-21 | 2009-12-04 | Thales Sa | Procede de test de caloduc et dispositif de test correspondant. |
TW200928340A (en) * | 2007-12-21 | 2009-07-01 | Foxconn Tech Co Ltd | Detecting device for heat pipes |
CN101498676B (zh) * | 2008-01-30 | 2011-06-22 | 富准精密工业(深圳)有限公司 | 热管性能检测装置 |
CN101498677B (zh) * | 2008-02-01 | 2011-06-22 | 富准精密工业(深圳)有限公司 | 热管性能检测装置 |
US7883266B2 (en) * | 2008-03-24 | 2011-02-08 | International Business Machines Corporation | Method and apparatus for defect detection in a cold plate |
KR20110051792A (ko) * | 2009-11-11 | 2011-05-18 | 광주과학기술원 | 접촉열전도재 특성 측정 장치 및 방법 |
TW201118372A (en) * | 2009-11-25 | 2011-06-01 | Inventec Corp | Method for testing heat pipe |
US8985847B2 (en) | 2011-11-21 | 2015-03-24 | International Business Machines Corporation | Thermal resistance-based monitoring of cooling of an electronic component |
US9347898B1 (en) * | 2013-08-08 | 2016-05-24 | The United States Of America As Represented By The Secretary Of The Army | Measuring thermal properties of layered structure in situ |
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US6331075B1 (en) * | 1998-05-01 | 2001-12-18 | Administrator, National Aeronautics And Space Administration | Device and method for measuring thermal conductivity of thin films |
US6142662A (en) * | 1998-06-16 | 2000-11-07 | New Jersey Institute Of Technology | Apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance |
JP3858660B2 (ja) * | 2001-10-10 | 2006-12-20 | 株式会社日立製作所 | 樹脂の熱抵抗測定方法 |
US6663278B1 (en) * | 2002-07-11 | 2003-12-16 | Industrial Technologies Research Institute | Method for determining the thermal performance of a heat sink |
US6945691B2 (en) * | 2002-11-27 | 2005-09-20 | Delphi Technologies, Inc. | Method and apparatus for inferring a temperature |
US6923570B2 (en) * | 2003-09-11 | 2005-08-02 | Hewlett-Packard Development Company, L.P. | Thermal interface material characterizing system |
US20060045165A1 (en) * | 2004-08-30 | 2006-03-02 | Chan Gary K | Thermal interface material characterization system and method |
CN100498313C (zh) * | 2005-05-14 | 2009-06-10 | 富准精密工业(深圳)有限公司 | 热导管性能检测方法及检测设备 |
CN100552444C (zh) * | 2005-08-19 | 2009-10-21 | 富准精密工业(深圳)有限公司 | 热源模拟装置 |
JP4812017B2 (ja) * | 2006-07-26 | 2011-11-09 | エスアイアイ・ナノテクノロジー株式会社 | 熱分析装置及びその乾燥方法 |
-
2005
- 2005-08-24 TW TW094128929A patent/TWI277727B/zh active
- 2005-12-22 US US11/317,120 patent/US7581878B2/en active Active
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104807851A (zh) * | 2015-04-21 | 2015-07-29 | 东莞市卡尔文塑胶科技有限公司 | 标样导散热系数点对点检测方法及检测设备 |
CN107621474A (zh) * | 2016-07-15 | 2018-01-23 | 神讯电脑(昆山)有限公司 | 热导管检测装置 |
CN107621474B (zh) * | 2016-07-15 | 2020-09-25 | 神讯电脑(昆山)有限公司 | 热导管检测装置 |
CN115597744A (zh) * | 2022-12-14 | 2023-01-13 | 蜂巢传动科技邳州有限公司(Cn) | 温度测量方法、芯片温度检测方法、装置、设备及车辆 |
CN115597744B (zh) * | 2022-12-14 | 2023-03-14 | 蜂巢传动科技邳州有限公司 | 温度测量方法、芯片温度检测方法、装置、设备及车辆 |
Also Published As
Publication number | Publication date |
---|---|
TWI277727B (en) | 2007-04-01 |
US7581878B2 (en) | 2009-09-01 |
US20070047614A1 (en) | 2007-03-01 |
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