TW200707100A - Process for forming permanent pattern - Google Patents
Process for forming permanent patternInfo
- Publication number
- TW200707100A TW200707100A TW095122940A TW95122940A TW200707100A TW 200707100 A TW200707100 A TW 200707100A TW 095122940 A TW095122940 A TW 095122940A TW 95122940 A TW95122940 A TW 95122940A TW 200707100 A TW200707100 A TW 200707100A
- Authority
- TW
- Taiwan
- Prior art keywords
- photo
- pixel portion
- forming
- exposing
- permanent pattern
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70791—Large workpieces, e.g. glass substrates for flat panel displays or solar panels
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0073—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces
- H05K3/0082—Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces characterised by the exposure method of radiation-sensitive masks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Chemical & Material Sciences (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Materials For Photolithography (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
The object is to provide a process for forming a permanent pattern which is capable of forming said permanent pattern in high fineness with more better efficiency by balancing the influence caused by the variation of exposure light and inhibiting the distortion of an image formed on a photo-sensitive layer. Therefore, provided is a process for forming a permanent pattern characterized in comprising, after forming a photo-sensitive layer on a support by using a photo-sensitive composition, exposing the said photo-sensitive layer by using an exposing head which is equipped with a light-irradiating means and a light-modulating means, and is located at a predetermined inclined angle θ with the line orientation of said pixel portion, through determining said pixel portion used in a N-times (provided that N is a nature number of 2 or more) expose by a used-pixel portion-determining means to said exposing head, conducting the control of said pixel portion to that only the said designated pixel portions take part in exposure by a pixel portion-controlling means, and exposing said photo-sensitive layer conducted by relatively moving the said exposing head to the scanning orientation.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005188722A JP2007010785A (en) | 2005-06-28 | 2005-06-28 | Method for forming permanent pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200707100A true TW200707100A (en) | 2007-02-16 |
Family
ID=37595139
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095122940A TW200707100A (en) | 2005-06-28 | 2006-06-26 | Process for forming permanent pattern |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP2007010785A (en) |
KR (1) | KR20080020591A (en) |
CN (1) | CN101189557A (en) |
TW (1) | TW200707100A (en) |
WO (1) | WO2007000885A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI725468B (en) * | 2019-07-05 | 2021-04-21 | 新代科技股份有限公司 | Light-heating curing apparatus |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4903479B2 (en) | 2006-04-18 | 2012-03-28 | 富士フイルム株式会社 | Metal pattern forming method, metal pattern, and printed wiring board |
JP5182913B2 (en) * | 2006-09-13 | 2013-04-17 | 大日本スクリーン製造株式会社 | Pattern drawing apparatus and pattern drawing method |
EP2391924B1 (en) | 2009-01-29 | 2013-07-24 | Digiflex Ltd. | Process for producing a photomask on a photopolymeric surface |
JP5698925B2 (en) * | 2009-06-26 | 2015-04-08 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | Compositions and methods for forming electronic devices |
DE102009046809B4 (en) * | 2009-11-18 | 2019-11-21 | Kleo Ag | exposure system |
DK2538960T3 (en) * | 2010-02-27 | 2016-11-07 | Univ Stellenbosch | Surfactant preparations comprising the polypeptide complexes |
JP5707779B2 (en) * | 2010-08-24 | 2015-04-30 | 日立化成株式会社 | Photosensitive resin composition, photosensitive film, rib pattern forming method, hollow structure forming method, and electronic component |
KR101999497B1 (en) * | 2012-08-28 | 2019-07-11 | 가부시키가이샤 니콘 | Pattern forming device |
CN102890426B (en) * | 2012-09-18 | 2014-05-14 | 天津芯硕精密机械有限公司 | Oblique scan display method in direct writing photoetching system |
CN105068384B (en) * | 2015-08-12 | 2017-08-15 | 杭州思看科技有限公司 | A kind of laser projector time for exposure control method of hand-held laser 3 d scanner |
CN114185250A (en) * | 2016-12-20 | 2022-03-15 | Ev 集团 E·索尔纳有限责任公司 | Apparatus and method for exposing a photosensitive layer |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5006436A (en) * | 1988-09-20 | 1991-04-09 | Atochem North America, Inc. | UV curable compositions for making tentable solder mask coating |
JPH07261388A (en) * | 1994-03-25 | 1995-10-13 | Hitachi Chem Co Ltd | Production of photosensitive resin composition, photosensitive element using the same and plating resist |
JP3391896B2 (en) * | 1994-06-15 | 2003-03-31 | 東京応化工業株式会社 | Heat resistant photosensitive resin composition |
JPH09152660A (en) * | 1995-09-27 | 1997-06-10 | Fuji Photo Film Co Ltd | Image printer |
JP2001500628A (en) * | 1996-02-28 | 2001-01-16 | ケニス シー ジョンソン | Microlens scanner for microlithography and wide field confocal microscope |
JP3496674B2 (en) * | 1997-11-28 | 2004-02-16 | 日立化成工業株式会社 | Photocurable resin composition and photosensitive element using the same |
JP4036550B2 (en) * | 1998-11-25 | 2008-01-23 | 日本化薬株式会社 | Radiation sensitive polyester resin and negative resist composition using the same |
JP2001040174A (en) * | 1999-07-29 | 2001-02-13 | Nippon Kayaku Co Ltd | Resin composition, solder resist resin composition and hardened products therefrom |
US6493867B1 (en) * | 2000-08-08 | 2002-12-10 | Ball Semiconductor, Inc. | Digital photolithography system for making smooth diagonal components |
JP4114184B2 (en) * | 2001-12-28 | 2008-07-09 | 株式会社オーク製作所 | Multiple exposure drawing apparatus and multiple exposure drawing method |
JP2003223007A (en) * | 2002-01-30 | 2003-08-08 | Fuji Photo Film Co Ltd | Method for making lithographic printing plate |
JP2003295326A (en) * | 2002-04-02 | 2003-10-15 | Noritsu Koki Co Ltd | Printer and print adjusting method |
JP4731787B2 (en) * | 2002-04-10 | 2011-07-27 | 富士フイルム株式会社 | Exposure head and exposure apparatus |
JP3938714B2 (en) * | 2002-05-16 | 2007-06-27 | 大日本スクリーン製造株式会社 | Exposure equipment |
JP2004009595A (en) * | 2002-06-07 | 2004-01-15 | Fuji Photo Film Co Ltd | Exposure head and exposure device |
JP2004061584A (en) * | 2002-07-25 | 2004-02-26 | Fuji Photo Film Co Ltd | Method for making planographic printing plate |
JP4150250B2 (en) * | 2002-12-02 | 2008-09-17 | 富士フイルム株式会社 | Drawing head, drawing apparatus and drawing method |
JP4150261B2 (en) * | 2003-01-14 | 2008-09-17 | 富士フイルム株式会社 | Plate making method of lithographic printing plate precursor |
JP4390189B2 (en) * | 2003-04-10 | 2009-12-24 | 大日本スクリーン製造株式会社 | Pattern drawing device |
JP4486323B2 (en) * | 2003-06-10 | 2010-06-23 | 富士フイルム株式会社 | Pixel position specifying method, image shift correcting method, and image forming apparatus |
JP2005022250A (en) * | 2003-07-02 | 2005-01-27 | Fuji Photo Film Co Ltd | Image recording method and image recording apparatus |
JP2005055881A (en) * | 2003-07-22 | 2005-03-03 | Fuji Photo Film Co Ltd | Drawing method and drawing apparatus |
JP4450689B2 (en) * | 2003-07-31 | 2010-04-14 | 富士フイルム株式会社 | Exposure head |
JP2006030966A (en) * | 2004-06-17 | 2006-02-02 | Fuji Photo Film Co Ltd | Image drawing method and apparatus |
JP4823581B2 (en) * | 2004-06-17 | 2011-11-24 | 富士フイルム株式会社 | Drawing apparatus and drawing method |
-
2005
- 2005-06-28 JP JP2005188722A patent/JP2007010785A/en active Pending
-
2006
- 2006-06-08 KR KR1020077019405A patent/KR20080020591A/en not_active Application Discontinuation
- 2006-06-08 WO PCT/JP2006/311503 patent/WO2007000885A1/en active Application Filing
- 2006-06-08 CN CNA2006800198209A patent/CN101189557A/en active Pending
- 2006-06-26 TW TW095122940A patent/TW200707100A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI725468B (en) * | 2019-07-05 | 2021-04-21 | 新代科技股份有限公司 | Light-heating curing apparatus |
Also Published As
Publication number | Publication date |
---|---|
WO2007000885A1 (en) | 2007-01-04 |
CN101189557A (en) | 2008-05-28 |
KR20080020591A (en) | 2008-03-05 |
JP2007010785A (en) | 2007-01-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200707100A (en) | Process for forming permanent pattern | |
TW200641340A (en) | Method of testing surface of strained silicon wafer and apparatus for testing surface of strained silicon wafer | |
TW200710588A (en) | Exposure apparatus | |
EP2023379A4 (en) | Exposure apparatus and exposure method | |
MY158021A (en) | Peripheral inspection system and method | |
TW200611080A (en) | Method for forming pattern | |
EP2512124A4 (en) | Image processing apparatus | |
WO2005116597A3 (en) | Microarray scanning | |
TW200633547A (en) | Color image projection arrangement and method | |
SG158822A1 (en) | Full wafer width scanning using step and scan system | |
TW200943269A (en) | Portable projector background color correction scheme | |
DE60305584D1 (en) | Directional shield for use with dipole exposure | |
TW200626869A (en) | Apparatus for testing a surface and method of testing a surface | |
TW200506491A (en) | Projection device | |
ATE344474T1 (en) | DEFECT PIXEL COMPENSATION METHOD | |
TW200600981A (en) | Exposing apparatus | |
JP2009505143A5 (en) | ||
WO2006088262A3 (en) | Image-drawing method, image-drawing device, image-drawing system, and correction method | |
WO2006124378A3 (en) | Arrangement for and method of increasing pixel symmetry, especially for image projection arrangements | |
TW200705546A (en) | Process for forming pattern | |
WO2007109725A3 (en) | Active mask variable data integral imaging system and method | |
TW200951428A (en) | Inspection device | |
TW200706394A (en) | Process for proudcing color filter, color filter and display device | |
TW200710606A (en) | Method for manufacturing internal cell structure, internal cell structure, and display device | |
TW200608162A (en) | Optical wavefront control pattern generating apparatus and optical wavefront control pattern generating method |