TW200706827A - Illumination system for material inspection - Google Patents

Illumination system for material inspection

Info

Publication number
TW200706827A
TW200706827A TW094126245A TW94126245A TW200706827A TW 200706827 A TW200706827 A TW 200706827A TW 094126245 A TW094126245 A TW 094126245A TW 94126245 A TW94126245 A TW 94126245A TW 200706827 A TW200706827 A TW 200706827A
Authority
TW
Taiwan
Prior art keywords
light
web
defect
illumination system
camera
Prior art date
Application number
TW094126245A
Other languages
English (en)
Other versions
TWI366661B (en
Inventor
Christopher M Kiraly
Original Assignee
Wintriss Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wintriss Engineering Corp filed Critical Wintriss Engineering Corp
Publication of TW200706827A publication Critical patent/TW200706827A/zh
Application granted granted Critical
Publication of TWI366661B publication Critical patent/TWI366661B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW094126245A 2004-01-22 2005-08-02 Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web TWI366661B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US53837704P 2004-01-22 2004-01-22
US10/543,576 US7382457B2 (en) 2004-01-22 2005-01-21 Illumination system for material inspection
PCT/US2005/002001 WO2005072265A2 (en) 2004-01-22 2005-01-21 Illumination system for material inspection

Publications (2)

Publication Number Publication Date
TW200706827A true TW200706827A (en) 2007-02-16
TWI366661B TWI366661B (en) 2012-06-21

Family

ID=34825976

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094126245A TWI366661B (en) 2004-01-22 2005-08-02 Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web

Country Status (4)

Country Link
US (1) US7382457B2 (zh)
EP (1) EP1718954A4 (zh)
TW (1) TWI366661B (zh)
WO (1) WO2005072265A2 (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081047A (zh) * 2009-11-27 2011-06-01 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN101819165B (zh) * 2009-02-27 2013-08-07 圣戈本玻璃法国公司 用于检测图案化基板的缺陷的方法及系统
CN107014292A (zh) * 2017-03-22 2017-08-04 安徽江南春包装科技有限公司 一种花纸观测用光焦可调的检测平台及其操作方法
CN113686879A (zh) * 2021-09-09 2021-11-23 杭州利珀科技有限公司 光学薄膜缺陷视觉检测系统及方法
TWI803684B (zh) * 2018-09-21 2023-06-01 日商東芝照明技術股份有限公司 檢測裝置

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法
EP1783080A1 (en) * 2005-11-08 2007-05-09 Lorillard Licensing Company, LLC Optical data capture and quality assurance
KR101166828B1 (ko) * 2005-12-29 2012-07-19 엘지디스플레이 주식회사 평판표시장치용 검사장비 및 검사 방법
FI119708B (fi) * 2006-02-01 2009-02-13 Viconsys Oy Laite rainan tarkkailemiseksi
US20100085732A1 (en) * 2006-11-07 2010-04-08 Sharp Kabushiki Kaisha Light source unit and display device
BE1017422A3 (nl) * 2006-12-08 2008-09-02 Visys Nv Werkwijze en inrichting voor het inspecteren en sorteren van een productstroom.
KR20090113886A (ko) * 2007-02-16 2009-11-02 쓰리엠 이노베이티브 프로퍼티즈 컴파니 자동화 검사를 위해 필름을 조명하는 방법 및 장치
US20100118136A1 (en) * 2007-06-13 2010-05-13 Riet Jan Arie Pieter Van Surface inspection device and an arrangement for inspecting a surface
US20100098399A1 (en) * 2008-10-17 2010-04-22 Kurt Breish High intensity, strobed led micro-strip for microfilm imaging system and methods
JP2013501211A (ja) * 2009-07-31 2013-01-10 サン−ゴバン グラス フランス 基板の欠陥を検出及び分類する方法及びシステム
DE102011109793B4 (de) * 2011-08-08 2014-12-04 Grenzbach Maschinenbau Gmbh Verfahren und Vorrichtung zur sicheren Detektion von Materialfehlern in transparenten Werkstoffen
EP2748005B1 (de) * 2011-08-22 2015-10-14 Windmöller & Hölscher KG Maschine und verfahren zum bedrucken von materialbahnen
US20140208970A1 (en) * 2011-08-22 2014-07-31 Windmoeller & Hoelscher Kg Machine and method for printing material webs
US9402036B2 (en) * 2011-10-17 2016-07-26 Rudolph Technologies, Inc. Scanning operation with concurrent focus and inspection
CN102654465B (zh) * 2012-04-11 2015-04-22 法国圣戈班玻璃公司 光学测量装置和光学测量方法
US20140304110A1 (en) * 2013-03-15 2014-10-09 W.W. Grainger, Inc. Procurement process utilizing a light sensor
KR102050365B1 (ko) * 2013-08-23 2020-01-09 삼성디스플레이 주식회사 유기 발광 표시 장치의 불량 검출 방법 및 유기 발광 표시 장치
DE102015119444B4 (de) * 2015-11-11 2018-01-18 Protechna Herbst Gmbh & Co. Kg Vorrichtung und Verfahren zur Überwachung einer laufenden Warenbahn
JP6568672B2 (ja) * 2015-11-13 2019-08-28 コグネックス・コーポレイション ビジョンシステムで鏡面上の欠陥を検出するためのシステム及び方法
US11493454B2 (en) * 2015-11-13 2022-11-08 Cognex Corporation System and method for detecting defects on a specular surface with a vision system
US10388011B2 (en) * 2016-05-17 2019-08-20 Abb Schweiz Ag Real-time, full web image processing method and system for web manufacturing supervision
TW201818065A (zh) * 2016-09-01 2018-05-16 美商3M新設資產公司 機器方向線膜檢測
JP6874441B2 (ja) * 2017-03-16 2021-05-19 コニカミノルタ株式会社 欠陥検査方法、欠陥検査プログラム、および欠陥検査装置
EP3502637A1 (en) * 2017-12-23 2019-06-26 ABB Schweiz AG Method and system for real-time web manufacturing supervision
DE102018108696B4 (de) * 2018-04-12 2024-05-02 Ims Messsysteme Gmbh Anordnung und Verfahren zum berührungslosen Bestimmen einer Abmessung einer bewegten Materialbahn
CN108872246A (zh) * 2018-05-29 2018-11-23 湖南科创信息技术股份有限公司 板面材料全视面缺陷检测系统
TWI662940B (zh) * 2018-06-01 2019-06-21 廣達電腦股份有限公司 影像擷取裝置
JP7028091B2 (ja) * 2018-07-11 2022-03-02 日本製鉄株式会社 表面欠陥検出装置及び表面欠陥検出方法
JP7219034B2 (ja) * 2018-09-14 2023-02-07 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法
CN114384081B (zh) * 2021-12-22 2023-07-28 西安工程大学 纺织布匹缺陷检测装置及其检测方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2396287A1 (fr) 1977-07-01 1979-01-26 Agfa Gevaert Dispositif et procede pour detecter les irregularites dans une feuille en mouvement
US4260899A (en) * 1979-06-14 1981-04-07 Intec Corporation Wide web laser scanner flaw detection method and apparatus
JPS6147542A (ja) * 1984-08-13 1986-03-08 Fuji Photo Film Co Ltd 感光フィルムの表面検査方法および装置
US4786817A (en) * 1986-08-29 1988-11-22 Measurex Corporation System and method for measurement of traveling webs
GB2202627A (en) 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
EP0379281A3 (en) * 1989-01-19 1991-03-20 Cosmopolitan Textile Company Limited Web inspecting method and apparatus
US5047652A (en) * 1990-04-16 1991-09-10 International Paper Company System for on-line measurement of color, opacity and reflectance of a translucent moving web
DE4031633A1 (de) 1990-10-05 1992-04-16 Sick Optik Elektronik Erwin Optische inspektionsvorrichtung
US5440648A (en) * 1991-11-19 1995-08-08 Dalsa, Inc. High speed defect detection apparatus having defect detection circuits mounted in the camera housing
US5642198A (en) * 1995-04-03 1997-06-24 Long; William R. Method of inspecting moving material
US5696591A (en) * 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
US5870203A (en) * 1996-03-15 1999-02-09 Sony Corporation Adaptive lighting control apparatus for illuminating a variable-speed web for inspection
US6198537B1 (en) * 1997-07-11 2001-03-06 Philip Morris Incorporated Optical inspection system for the manufacture of banded cigarette paper
WO1999020048A1 (en) 1997-10-10 1999-04-22 Northeast Robotics Llc Imaging method and system with elongate inspection zone
JP2000036033A (ja) * 1998-07-21 2000-02-02 Toshiba Eng Co Ltd 明暗検査装置および明暗検査方法
DE10056783A1 (de) * 1999-12-11 2001-06-13 Qualico Gmbh Vorrichtung zum Erfassen von Eigenschaften einer bewegten Papierbahn mit einer IR-Lichtquelle
US7105848B2 (en) * 2002-04-15 2006-09-12 Wintriss Engineering Corporation Dual level out-of-focus light source for amplification of defects on a surface
FI20021973A (fi) * 2002-11-05 2004-05-06 Sr Instr Oy Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101819165B (zh) * 2009-02-27 2013-08-07 圣戈本玻璃法国公司 用于检测图案化基板的缺陷的方法及系统
CN102081047A (zh) * 2009-11-27 2011-06-01 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN102081047B (zh) * 2009-11-27 2015-04-08 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN107014292A (zh) * 2017-03-22 2017-08-04 安徽江南春包装科技有限公司 一种花纸观测用光焦可调的检测平台及其操作方法
TWI803684B (zh) * 2018-09-21 2023-06-01 日商東芝照明技術股份有限公司 檢測裝置
CN113686879A (zh) * 2021-09-09 2021-11-23 杭州利珀科技有限公司 光学薄膜缺陷视觉检测系统及方法

Also Published As

Publication number Publication date
WO2005072265A3 (en) 2005-11-24
WO2005072265A2 (en) 2005-08-11
US7382457B2 (en) 2008-06-03
TWI366661B (en) 2012-06-21
EP1718954A2 (en) 2006-11-08
EP1718954A4 (en) 2010-08-11
US20070008538A1 (en) 2007-01-11

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