TW200702690A - Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices - Google Patents
Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devicesInfo
- Publication number
- TW200702690A TW200702690A TW095109646A TW95109646A TW200702690A TW 200702690 A TW200702690 A TW 200702690A TW 095109646 A TW095109646 A TW 095109646A TW 95109646 A TW95109646 A TW 95109646A TW 200702690 A TW200702690 A TW 200702690A
- Authority
- TW
- Taiwan
- Prior art keywords
- node
- signal
- grounded
- unpowered
- testing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/312—Contactless testing by capacitive methods
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/179,978 US7307426B2 (en) | 2005-07-12 | 2005-07-12 | Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200702690A true TW200702690A (en) | 2007-01-16 |
Family
ID=37609312
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095109646A TW200702690A (en) | 2005-07-12 | 2006-03-21 | Methods and apparatus for unpowered testing of open connections on power and ground nodes of circuit devices |
Country Status (4)
Country | Link |
---|---|
US (1) | US7307426B2 (zh) |
CN (1) | CN100523844C (zh) |
SG (1) | SG129344A1 (zh) |
TW (1) | TW200702690A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103792429A (zh) * | 2012-11-05 | 2014-05-14 | 华邦电子股份有限公司 | 测试系统 |
TWI449933B (zh) * | 2012-10-16 | 2014-08-21 | Winbond Electronics Corp | 晶片之測試系統 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080246491A1 (en) * | 2007-04-06 | 2008-10-09 | Texas Instruments Incorporated | Scalable method for identifying cracks and fractures under wired or ball bonded bond pads |
GB0709893D0 (en) * | 2007-05-23 | 2007-07-04 | Onzo Ltd | Apparatus for monitoring rescue consumption |
DE102008030545A1 (de) * | 2008-06-27 | 2010-01-07 | Siemens Aktiengesellschaft | Vorrichtung und Verfahren zur berührungslosen Ankontaktierung von leitfähigen Strukturen, insbesondere von Dünnschicht-Transistor-Flüssigkristallanzeigen (Thin Film Transistor Liquid Crystal Displays) |
EP2344897B1 (en) * | 2008-11-14 | 2015-06-17 | Teradyne, Inc. | Method and apparatus for testing electrical connections on a printed circuit board |
US8760183B2 (en) * | 2008-11-14 | 2014-06-24 | Teradyne, Inc. | Fast open circuit detection for open power and ground pins |
US7868608B2 (en) | 2009-04-08 | 2011-01-11 | International Business Machines Corporation | Detecting open ground connections in surface mount connectors |
JP5206571B2 (ja) * | 2009-04-22 | 2013-06-12 | 富士通セミコンダクター株式会社 | グランドオープン検出回路を有する集積回路装置 |
US8648616B2 (en) | 2009-12-22 | 2014-02-11 | Ltx-Credence Corporation | Loaded printed circuit board test fixture and method for manufacturing the same |
US8933722B2 (en) | 2011-08-31 | 2015-01-13 | Infineon Technologies Ag | Measuring device and a method for measuring a chip-to-chip-carrier connection |
US8896320B2 (en) * | 2011-08-31 | 2014-11-25 | Infineon Technologies Ag | Measuring device and a method for measuring a chip-to-chip-carrier connection |
US9250293B2 (en) | 2012-07-09 | 2016-02-02 | Infineon Technologies Ag | Capacitive test device and method for capacitive testing a component |
WO2017091591A1 (en) * | 2015-11-25 | 2017-06-01 | Formfactor, Inc. | Floating nest for a test socket |
CN107782944A (zh) * | 2017-09-26 | 2018-03-09 | 信利光电股份有限公司 | 一种万用表和检测线路开路位置的设备及方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5498694A (en) * | 1989-05-25 | 1996-03-12 | La Jolla Cancer Research Foundation | Peptides of the cytoplasmic domain of integrin |
US5557209A (en) * | 1990-12-20 | 1996-09-17 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
US5124660A (en) * | 1990-12-20 | 1992-06-23 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
US5125660A (en) | 1991-11-22 | 1992-06-30 | Frederick Stahl | Six-sided game dice with playing card indicia |
US5469064A (en) * | 1992-01-14 | 1995-11-21 | Hewlett-Packard Company | Electrical assembly testing using robotic positioning of probes |
US5420500A (en) * | 1992-11-25 | 1995-05-30 | Hewlett-Packard Company | Pacitive electrode system for detecting open solder joints in printed circuit assemblies |
US5391993A (en) * | 1994-01-27 | 1995-02-21 | Genrad, Inc. | Capacitive open-circuit test employing threshold determination |
JP4450143B2 (ja) * | 2001-05-24 | 2010-04-14 | オー・エイチ・ティー株式会社 | 回路パターン検査装置並びに回路パターン検査方法及び記録媒体 |
US6734683B2 (en) * | 2001-09-27 | 2004-05-11 | Intel Corporation | Method and apparatus for in-circuit testing of sockets |
US6960917B2 (en) * | 2003-11-06 | 2005-11-01 | Agilent Technologies, Inc. | Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies |
US7057395B1 (en) * | 2005-03-04 | 2006-06-06 | Agilent Technologies, Inc. | Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes |
-
2005
- 2005-07-12 US US11/179,978 patent/US7307426B2/en not_active Expired - Fee Related
-
2006
- 2006-03-21 TW TW095109646A patent/TW200702690A/zh unknown
- 2006-03-23 SG SG200601937A patent/SG129344A1/en unknown
- 2006-06-08 CN CNB2006100874504A patent/CN100523844C/zh not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI449933B (zh) * | 2012-10-16 | 2014-08-21 | Winbond Electronics Corp | 晶片之測試系統 |
CN103792429A (zh) * | 2012-11-05 | 2014-05-14 | 华邦电子股份有限公司 | 测试系统 |
CN103792429B (zh) * | 2012-11-05 | 2016-08-10 | 华邦电子股份有限公司 | 测试系统 |
Also Published As
Publication number | Publication date |
---|---|
CN1896754A (zh) | 2007-01-17 |
CN100523844C (zh) | 2009-08-05 |
US20070013383A1 (en) | 2007-01-18 |
US7307426B2 (en) | 2007-12-11 |
SG129344A1 (en) | 2007-02-26 |
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