TW200643411A - Inspection device and inspection method - Google Patents

Inspection device and inspection method

Info

Publication number
TW200643411A
TW200643411A TW095107381A TW95107381A TW200643411A TW 200643411 A TW200643411 A TW 200643411A TW 095107381 A TW095107381 A TW 095107381A TW 95107381 A TW95107381 A TW 95107381A TW 200643411 A TW200643411 A TW 200643411A
Authority
TW
Taiwan
Prior art keywords
inspection
sensor
liquid crystal
crystal panel
inspection object
Prior art date
Application number
TW095107381A
Other languages
English (en)
Chinese (zh)
Inventor
Masato Ikeda
Shuji Yamaoka
Shogo Ishioka
Original Assignee
Oht Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oht Inc filed Critical Oht Inc
Publication of TW200643411A publication Critical patent/TW200643411A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Liquid Crystal (AREA)
TW095107381A 2005-03-04 2006-03-03 Inspection device and inspection method TW200643411A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005061290A JP2006242860A (ja) 2005-03-04 2005-03-04 検査装置および検査方法

Publications (1)

Publication Number Publication Date
TW200643411A true TW200643411A (en) 2006-12-16

Family

ID=36941370

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095107381A TW200643411A (en) 2005-03-04 2006-03-03 Inspection device and inspection method

Country Status (3)

Country Link
JP (1) JP2006242860A (fr)
TW (1) TW200643411A (fr)
WO (1) WO2006093349A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005046154B4 (de) * 2005-09-27 2008-07-03 Siemens Ag Messvorrichtung und Messsystem zum Inspizieren einer Oberfläche eines Substrates
DE102006054088A1 (de) * 2006-11-16 2008-05-21 Siemens Ag Messvorrichtung und Messverfahren zum Inspizieren einer Oberfläche eines Substrates
JP5299037B2 (ja) 2009-04-04 2013-09-25 日本電産リード株式会社 検査用プローブ
KR20110127598A (ko) * 2010-05-19 2011-11-25 우관제 터치 센서용 검사장치
AT511226B1 (de) * 2011-03-17 2013-03-15 Rainer Dr Gaggl Vorrichtung zum hochspannungsprüfen von halbleiterbauelementen

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4592885B2 (ja) * 2000-07-31 2010-12-08 富士通セミコンダクター株式会社 半導体基板試験装置
TWI222423B (en) * 2001-12-27 2004-10-21 Orbotech Ltd System and methods for conveying and transporting levitated articles
JP3448290B2 (ja) * 2002-08-21 2003-09-22 三菱重工業株式会社 液晶パネル検査装置

Also Published As

Publication number Publication date
WO2006093349A1 (fr) 2006-09-08
JP2006242860A (ja) 2006-09-14

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