TW200636447A - System-on-a-chip and test/debug method thereof - Google Patents

System-on-a-chip and test/debug method thereof

Info

Publication number
TW200636447A
TW200636447A TW095112493A TW95112493A TW200636447A TW 200636447 A TW200636447 A TW 200636447A TW 095112493 A TW095112493 A TW 095112493A TW 95112493 A TW95112493 A TW 95112493A TW 200636447 A TW200636447 A TW 200636447A
Authority
TW
Taiwan
Prior art keywords
test
embedded memory
register device
tap
debug
Prior art date
Application number
TW095112493A
Other languages
English (en)
Other versions
TWI300524B (en
Inventor
Steve Gianelle
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Publication of TW200636447A publication Critical patent/TW200636447A/zh
Application granted granted Critical
Publication of TWI300524B publication Critical patent/TWI300524B/zh

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  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
TW95112493A 2005-04-13 2006-04-07 System-on-a-chip and test/debug method thereof TWI300524B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US67066605P 2005-04-13 2005-04-13

Publications (2)

Publication Number Publication Date
TW200636447A true TW200636447A (en) 2006-10-16
TWI300524B TWI300524B (en) 2008-09-01

Family

ID=36946964

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95112493A TWI300524B (en) 2005-04-13 2006-04-07 System-on-a-chip and test/debug method thereof

Country Status (2)

Country Link
CN (1) CN100392617C (zh)
TW (1) TWI300524B (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI399550B (zh) * 2007-11-30 2013-06-21 Hon Hai Prec Ind Co Ltd 測試系統及方法
TWI450078B (zh) * 2010-12-09 2014-08-21 Apple Inc 重置或關機後用於終止處理器核心之偵錯暫存器
US8913992B2 (en) 2010-11-03 2014-12-16 Stephan V. Schell Methods and apparatus for access data recovery from a malfunctioning device
US9835682B2 (en) 2015-09-22 2017-12-05 Nuvoton Technology Corporation Debugging system and method

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101996686B (zh) * 2009-08-17 2013-03-20 慧国(上海)软件科技有限公司 将测试数据写入存储器的方法和装置
CN102999459A (zh) * 2011-09-09 2013-03-27 上海华虹Nec电子有限公司 硅片测试机台与bist模块的通信方法
CN103021467B (zh) 2011-09-27 2016-09-07 意法半导体研发(深圳)有限公司 故障诊断电路
KR102038414B1 (ko) * 2013-06-20 2019-11-26 에스케이하이닉스 주식회사 테스트 장치 및 그의 동작 방법
US9628787B2 (en) * 2014-04-16 2017-04-18 Texas Instruments Incorporated Ensuring imaging subsystem integrity in camera based safety systems
US9632137B2 (en) * 2015-04-22 2017-04-25 Apple Inc. Serial wire debug bridge
CN108628723B (zh) * 2017-03-23 2022-03-11 瑞轩科技股份有限公司 信息处理方法
CN109254883B (zh) * 2017-07-14 2021-09-24 深圳市中兴微电子技术有限公司 一种片上存储器的调试装置及方法
US10866283B2 (en) * 2018-11-29 2020-12-15 Nxp B.V. Test system with embedded tester
US11531061B2 (en) * 2020-08-03 2022-12-20 Qualcomm Incorporated Interleaved testing of digital and analog subsystems with on-chip testing interface

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6427216B1 (en) * 1999-03-11 2002-07-30 Agere Systems Guardian Corp. Integrated circuit testing using a high speed data interface bus
CN1312588C (zh) * 2004-04-02 2007-04-25 清华大学 基于目标机上的ejtag部件的交叉调试器实现方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI399550B (zh) * 2007-11-30 2013-06-21 Hon Hai Prec Ind Co Ltd 測試系統及方法
US8913992B2 (en) 2010-11-03 2014-12-16 Stephan V. Schell Methods and apparatus for access data recovery from a malfunctioning device
TWI468943B (zh) * 2010-11-03 2015-01-11 Apple Inc 用於從故障裝置之存取資料復原的方法及設備
TWI450078B (zh) * 2010-12-09 2014-08-21 Apple Inc 重置或關機後用於終止處理器核心之偵錯暫存器
US9835682B2 (en) 2015-09-22 2017-12-05 Nuvoton Technology Corporation Debugging system and method

Also Published As

Publication number Publication date
TWI300524B (en) 2008-09-01
CN100392617C (zh) 2008-06-04
CN1828553A (zh) 2006-09-06

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