TW200636447A - System-on-a-chip and test/debug method thereof - Google Patents
System-on-a-chip and test/debug method thereofInfo
- Publication number
- TW200636447A TW200636447A TW095112493A TW95112493A TW200636447A TW 200636447 A TW200636447 A TW 200636447A TW 095112493 A TW095112493 A TW 095112493A TW 95112493 A TW95112493 A TW 95112493A TW 200636447 A TW200636447 A TW 200636447A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- embedded memory
- register device
- tap
- debug
- Prior art date
Links
Landscapes
- Test And Diagnosis Of Digital Computers (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US67066605P | 2005-04-13 | 2005-04-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200636447A true TW200636447A (en) | 2006-10-16 |
TWI300524B TWI300524B (en) | 2008-09-01 |
Family
ID=36946964
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95112493A TWI300524B (en) | 2005-04-13 | 2006-04-07 | System-on-a-chip and test/debug method thereof |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN100392617C (zh) |
TW (1) | TWI300524B (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI399550B (zh) * | 2007-11-30 | 2013-06-21 | Hon Hai Prec Ind Co Ltd | 測試系統及方法 |
TWI450078B (zh) * | 2010-12-09 | 2014-08-21 | Apple Inc | 重置或關機後用於終止處理器核心之偵錯暫存器 |
US8913992B2 (en) | 2010-11-03 | 2014-12-16 | Stephan V. Schell | Methods and apparatus for access data recovery from a malfunctioning device |
US9835682B2 (en) | 2015-09-22 | 2017-12-05 | Nuvoton Technology Corporation | Debugging system and method |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101996686B (zh) * | 2009-08-17 | 2013-03-20 | 慧国(上海)软件科技有限公司 | 将测试数据写入存储器的方法和装置 |
CN102999459A (zh) * | 2011-09-09 | 2013-03-27 | 上海华虹Nec电子有限公司 | 硅片测试机台与bist模块的通信方法 |
CN103021467B (zh) | 2011-09-27 | 2016-09-07 | 意法半导体研发(深圳)有限公司 | 故障诊断电路 |
KR102038414B1 (ko) * | 2013-06-20 | 2019-11-26 | 에스케이하이닉스 주식회사 | 테스트 장치 및 그의 동작 방법 |
US9628787B2 (en) * | 2014-04-16 | 2017-04-18 | Texas Instruments Incorporated | Ensuring imaging subsystem integrity in camera based safety systems |
US9632137B2 (en) * | 2015-04-22 | 2017-04-25 | Apple Inc. | Serial wire debug bridge |
CN108628723B (zh) * | 2017-03-23 | 2022-03-11 | 瑞轩科技股份有限公司 | 信息处理方法 |
CN109254883B (zh) * | 2017-07-14 | 2021-09-24 | 深圳市中兴微电子技术有限公司 | 一种片上存储器的调试装置及方法 |
US10866283B2 (en) * | 2018-11-29 | 2020-12-15 | Nxp B.V. | Test system with embedded tester |
US11531061B2 (en) * | 2020-08-03 | 2022-12-20 | Qualcomm Incorporated | Interleaved testing of digital and analog subsystems with on-chip testing interface |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6427216B1 (en) * | 1999-03-11 | 2002-07-30 | Agere Systems Guardian Corp. | Integrated circuit testing using a high speed data interface bus |
CN1312588C (zh) * | 2004-04-02 | 2007-04-25 | 清华大学 | 基于目标机上的ejtag部件的交叉调试器实现方法 |
-
2006
- 2006-04-07 TW TW95112493A patent/TWI300524B/zh active
- 2006-04-13 CN CNB2006100736237A patent/CN100392617C/zh active Active
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI399550B (zh) * | 2007-11-30 | 2013-06-21 | Hon Hai Prec Ind Co Ltd | 測試系統及方法 |
US8913992B2 (en) | 2010-11-03 | 2014-12-16 | Stephan V. Schell | Methods and apparatus for access data recovery from a malfunctioning device |
TWI468943B (zh) * | 2010-11-03 | 2015-01-11 | Apple Inc | 用於從故障裝置之存取資料復原的方法及設備 |
TWI450078B (zh) * | 2010-12-09 | 2014-08-21 | Apple Inc | 重置或關機後用於終止處理器核心之偵錯暫存器 |
US9835682B2 (en) | 2015-09-22 | 2017-12-05 | Nuvoton Technology Corporation | Debugging system and method |
Also Published As
Publication number | Publication date |
---|---|
TWI300524B (en) | 2008-09-01 |
CN100392617C (zh) | 2008-06-04 |
CN1828553A (zh) | 2006-09-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200636447A (en) | System-on-a-chip and test/debug method thereof | |
TW200739106A (en) | Test system and method for testing electronic devices using a pipelined testing architecture | |
CN102542110B (zh) | 一种应用于移动存储soc芯片的仿真验证方法 | |
CN105091927A (zh) | 全液晶汽车仪表自动化测试平台 | |
JP5651784B2 (ja) | 内蔵自己試験を使用するデバッガベースのメモリダンプ | |
WO2007005706A3 (en) | Encrypted jtag interface | |
CN114333962A (zh) | 闪存芯片的测试方法、装置、系统、电子设备及存储介质 | |
TW200739109A (en) | Test method, test system and assist board | |
US20030233601A1 (en) | Non-intrusive signal observation techniques usable for real-time internal signal capture for an electronic module or integrated circuit | |
ATE293797T1 (de) | Testzugriffs-portsteuerungsvorrichtung (tap) und verfahren zur beseitigung interner intermediärer abtastprüffehler | |
CN201285600Y (zh) | 一种多参数监测数字记录仪 | |
CN113901754B (zh) | 基于fpga的以太网macip的板级验证结构和方法 | |
CN111722968A (zh) | 一种硬件调试方法、装置、系统及可读存储介质 | |
CN103810377A (zh) | 一种基于app技术和云计算技术的血糖分析系统 | |
CN104461796B (zh) | 用于嵌入式8051cpu的jtag调试模块及调试方法 | |
TW200632929A (en) | Semiconductor memory component and method for testing semiconductor memory components having a restricted memory (partial good memories) | |
CN201993421U (zh) | 一种自动测试毫米波前端的系统 | |
CN103796009A (zh) | 一种fpga质量诊断测试系统 | |
CN104635138A (zh) | 带存储单元的集成芯片的复测方法 | |
ATE358847T1 (de) | Schaltkreiskomplex mit dekontaminierungsmitteln für mit fehlern kontaminierte teile | |
CN106095691A (zh) | 一种应用于机载处理器模块的软件替代测试方法 | |
CN2874628Y (zh) | 1553b总线手持式测试仪 | |
CN102568602B (zh) | 闪速存储器发展系统 | |
CN205388780U (zh) | 一种机载数据记录仪 | |
CN106680692A (zh) | 高速usb接口电路多功能测试系统 |