TW200631094A - Method for integrally fabricating memory cell capacitor and logic device and structure thereof - Google Patents

Method for integrally fabricating memory cell capacitor and logic device and structure thereof

Info

Publication number
TW200631094A
TW200631094A TW094140814A TW94140814A TW200631094A TW 200631094 A TW200631094 A TW 200631094A TW 094140814 A TW094140814 A TW 094140814A TW 94140814 A TW94140814 A TW 94140814A TW 200631094 A TW200631094 A TW 200631094A
Authority
TW
Taiwan
Prior art keywords
memory cell
conductive layer
logic device
capacitor
metal
Prior art date
Application number
TW094140814A
Other languages
English (en)
Other versions
TWI286356B (en
Inventor
Kuo-Chi Tu
Original Assignee
Taiwan Semiconductor Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg Co Ltd filed Critical Taiwan Semiconductor Mfg Co Ltd
Publication of TW200631094A publication Critical patent/TW200631094A/zh
Application granted granted Critical
Publication of TWI286356B publication Critical patent/TWI286356B/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/09—Manufacture or treatment with simultaneous manufacture of the peripheral circuit region and memory cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
    • H01L28/40—Capacitors
    • H01L28/60—Electrodes
    • H01L28/82—Electrodes with an enlarged surface, e.g. formed by texturisation
    • H01L28/90—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions
    • H01L28/91—Electrodes with an enlarged surface, e.g. formed by texturisation having vertical extensions made by depositing layers, e.g. by depositing alternating conductive and insulating layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/03—Making the capacitor or connections thereto
    • H10B12/033—Making the capacitor or connections thereto the capacitor extending over the transistor
TW094140814A 2005-02-23 2005-11-21 Method for integrally fabricating memory cell capacitor and logic device and structure thereof TWI286356B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/064,894 US7189613B2 (en) 2005-02-23 2005-02-23 Method and structure for metal-insulator-metal capacitor based memory device

Publications (2)

Publication Number Publication Date
TW200631094A true TW200631094A (en) 2006-09-01
TWI286356B TWI286356B (en) 2007-09-01

Family

ID=36913280

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094140814A TWI286356B (en) 2005-02-23 2005-11-21 Method for integrally fabricating memory cell capacitor and logic device and structure thereof

Country Status (3)

Country Link
US (1) US7189613B2 (zh)
CN (1) CN100403524C (zh)
TW (1) TWI286356B (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI283458B (en) * 2006-04-04 2007-07-01 Promos Technologies Inc Method for preparing a capacitor structure of a semiconductor memory
US7863663B2 (en) 2006-04-07 2011-01-04 Micron Technology, Inc. Hybrid electrical contact
US20080116496A1 (en) * 2006-11-21 2008-05-22 Kuo-Chyuan Tzeng Integrating a DRAM with an SRAM having butted contacts and resulting devices
US7880303B2 (en) * 2007-02-13 2011-02-01 Taiwan Semiconductor Manufacturing Company, Ltd. Stacked contact with low aspect ratio
US7944732B2 (en) * 2008-11-21 2011-05-17 Xilinx, Inc. Integrated capacitor with alternating layered segments
US8963223B2 (en) * 2010-03-01 2015-02-24 Broadcom Corporation Scalable integrated MIM capacitor using gate metal

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW377495B (en) * 1996-10-04 1999-12-21 Hitachi Ltd Method of manufacturing semiconductor memory cells and the same apparatus
US6339495B1 (en) 1998-01-06 2002-01-15 Corning Incorporated Optical amplifier with power dependent feedback
US5918120A (en) * 1998-07-24 1999-06-29 Taiwan Semiconductor Manufacturing Company, Ltd. Method for fabricating capacitor-over-bit line (COB) dynamic random access memory (DRAM) using tungsten landing plug contacts and Ti/TiN bit lines
US6228703B1 (en) 1998-12-10 2001-05-08 United Microelectronics, Corp. Method of fabricating mixed-mode semiconductor device having a capacitor and a gate
US6232197B1 (en) 1999-04-07 2001-05-15 United Microelectronics Corp, Metal-insulator-metal capacitor
DE19926106C1 (de) * 1999-06-08 2001-02-01 Siemens Ag Halbleiterspeicherbauelement mit Speicherzellen, Logikbereichen und Füllstrukturen
US6117725A (en) * 1999-08-11 2000-09-12 Taiwan Semiconductor Manufacturing Company Method for making cost-effective embedded DRAM structures compatible with logic circuit processing
US6407002B1 (en) 2000-08-10 2002-06-18 Taiwan Semiconductor Manufacturing Company Partial resist free approach in contact etch to improve W-filling
US6528366B1 (en) 2001-03-01 2003-03-04 Taiwan Semiconductor Manufacturing Company Fabrication methods of vertical metal-insulator-metal (MIM) capacitor for advanced embedded DRAM applications
US6391777B1 (en) 2001-05-02 2002-05-21 Taiwan Semiconductor Manufacturing Company Two-stage Cu anneal to improve Cu damascene process
US6376366B1 (en) 2001-05-21 2002-04-23 Taiwan Semiconductor Manufacturing Company Partial hard mask open process for hard mask dual damascene etch
JP2004063559A (ja) * 2002-07-25 2004-02-26 Renesas Technology Corp 半導体装置
JP2006032574A (ja) * 2004-07-14 2006-02-02 Matsushita Electric Ind Co Ltd 半導体装置及びその製造方法

Also Published As

Publication number Publication date
US20060189072A1 (en) 2006-08-24
US7189613B2 (en) 2007-03-13
CN1825567A (zh) 2006-08-30
TWI286356B (en) 2007-09-01
CN100403524C (zh) 2008-07-16

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