TW200619925A - Program, test apparatus and testing method - Google Patents

Program, test apparatus and testing method

Info

Publication number
TW200619925A
TW200619925A TW094132417A TW94132417A TW200619925A TW 200619925 A TW200619925 A TW 200619925A TW 094132417 A TW094132417 A TW 094132417A TW 94132417 A TW94132417 A TW 94132417A TW 200619925 A TW200619925 A TW 200619925A
Authority
TW
Taiwan
Prior art keywords
signal
output signal
comparing
expected value
program
Prior art date
Application number
TW094132417A
Other languages
English (en)
Other versions
TWI356993B (en
Inventor
Shinji Furumi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200619925A publication Critical patent/TW200619925A/zh
Application granted granted Critical
Publication of TWI356993B publication Critical patent/TWI356993B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31935—Storing data, e.g. failure memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3016—Delay or race condition test, e.g. race hazard test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
TW094132417A 2004-09-30 2005-09-20 Program, test apparatus and testing method TWI356993B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/954,727 US7228475B2 (en) 2004-09-30 2004-09-30 Program, test apparatus and testing method

Publications (2)

Publication Number Publication Date
TW200619925A true TW200619925A (en) 2006-06-16
TWI356993B TWI356993B (en) 2012-01-21

Family

ID=35427414

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094132417A TWI356993B (en) 2004-09-30 2005-09-20 Program, test apparatus and testing method

Country Status (6)

Country Link
US (1) US7228475B2 (zh)
JP (1) JP2008514899A (zh)
KR (1) KR101228167B1 (zh)
DE (1) DE112005002436T5 (zh)
TW (1) TWI356993B (zh)
WO (1) WO2006036035A1 (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007172778A (ja) * 2005-12-26 2007-07-05 Nec Electronics Corp メモリテスト回路及びメモリテスト方法
CN101605499B (zh) * 2007-02-14 2012-10-03 皇家飞利浦电子股份有限公司 用于确定运动对象的功能性质的系统、方法和计算机程序

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0371197A (ja) 1989-08-10 1991-03-26 Sony Corp 信号処理回路
JP3169620B2 (ja) 1991-01-09 2001-05-28 富士通株式会社 プリンタの回転周期調整方法
JPH04270975A (ja) * 1991-02-27 1992-09-28 Advantest Corp Ｉｃ試験装置
JPH0926468A (ja) * 1995-07-11 1997-01-28 Advantest Corp 半導体試験装置における周波数／周期測定装置
JP3516778B2 (ja) * 1995-07-19 2004-04-05 株式会社アドバンテスト 半導体試験装置における周波数測定方法
US6099161A (en) 1995-12-22 2000-08-08 Zilog, Inc. Asynchronous analog or digital frequency measurement on digital test equipment
US6324485B1 (en) 1999-01-26 2001-11-27 Newmillennia Solutions, Inc. Application specific automated test equipment system for testing integrated circuit devices in a native environment
TW533422B (en) * 2000-11-28 2003-05-21 Advantest Corp Fail analysis device
JP2003329740A (ja) * 2002-05-16 2003-11-19 Hitachi Ltd 半導体検査装置、検査方法および半導体装置の製造方法

Also Published As

Publication number Publication date
WO2006036035A1 (en) 2006-04-06
US7228475B2 (en) 2007-06-05
DE112005002436T5 (de) 2007-08-23
TWI356993B (en) 2012-01-21
JP2008514899A (ja) 2008-05-08
KR20070067167A (ko) 2007-06-27
US20060085712A1 (en) 2006-04-20
KR101228167B1 (ko) 2013-01-30

Similar Documents

Publication Publication Date Title
TW200734653A (en) Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
TW200739092A (en) Measuring apparatus, testing apparatus, and electronic device
EP1742074A4 (en) TESTING DEVICE AND TEST PROCEDURE
MX2009006329A (es) Determinacion de la aceptabilidad de las ubicaciones del sensor utilizado para realizar una investigacion sismica.
TW200623125A (en) Clock signal generation apparatus for use in semiconductor memory device and its method
TW200625327A (en) Self refresh circuit of PSRAM for real access time measurement and operating method for the same
EP1547294A4 (en) METHOD AND DEVICE FOR BIT ERROR RATE ANALYSIS
NO20071802L (no) Mikrostrukturinspesjonsapparat og mikrostrukturinspeksjonsfremgangsmate
WO2004097461A3 (en) Method and apparatus for advanced prediction of changes in a global weather forecast
TW200736639A (en) Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
WO2004081587A3 (en) Apparatus and method for testing electronic systems
TW200506403A (en) Testing apparatus
TW200739109A (en) Test method, test system and assist board
WO2008126747A1 (ja) 試験装置、試験方法、および電子デバイス
TW200601351A (en) Semiconductor memory device having test mode for data access time
TW200611118A (en) Testing simulator, testing simulation program and record medium
TW200609521A (en) Test equipment and test method
TW200631025A (en) Method and system for timing measurement of embedded macro module
TW200619925A (en) Program, test apparatus and testing method
SG138454A1 (en) Memory testing apparatus and method
TW200601354A (en) Apparatus for generating internal voltage in test mode and its method
WO2006115175A3 (ja) 試験装置、プログラム、及び記録媒体
MY144143A (en) Method of controlling the position of a read/write head and apparatus for testing a read/write head
TW200718114A (en) Symbol modulation accuracy measuring device, method, program, and recording medium
ATE441120T1 (de) Auswertung eines ausgangssignals eines gerade geprüften bausteins