TW200618086A - Substrate treating device - Google Patents
Substrate treating deviceInfo
- Publication number
- TW200618086A TW200618086A TW094132597A TW94132597A TW200618086A TW 200618086 A TW200618086 A TW 200618086A TW 094132597 A TW094132597 A TW 094132597A TW 94132597 A TW94132597 A TW 94132597A TW 200618086 A TW200618086 A TW 200618086A
- Authority
- TW
- Taiwan
- Prior art keywords
- treating
- substrate
- drying
- bath
- treating bath
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004275679A JP2006093334A (ja) | 2004-09-22 | 2004-09-22 | 基板処理装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200618086A true TW200618086A (en) | 2006-06-01 |
Family
ID=36089952
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094132597A TW200618086A (en) | 2004-09-22 | 2005-09-21 | Substrate treating device |
Country Status (6)
Country | Link |
---|---|
US (1) | US20080035182A1 (zh) |
JP (1) | JP2006093334A (zh) |
KR (1) | KR20070055515A (zh) |
CN (1) | CN101073146A (zh) |
TW (1) | TW200618086A (zh) |
WO (1) | WO2006033186A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7775219B2 (en) | 2006-12-29 | 2010-08-17 | Applied Materials, Inc. | Process chamber lid and controlled exhaust |
US7694688B2 (en) | 2007-01-05 | 2010-04-13 | Applied Materials, Inc. | Wet clean system design |
KR20080086686A (ko) * | 2007-03-23 | 2008-09-26 | 주식회사 하이닉스반도체 | 반도체 소자의 제조방법 |
JP5154991B2 (ja) * | 2008-03-27 | 2013-02-27 | 大日本スクリーン製造株式会社 | 基板処理装置 |
KR20110001273A (ko) * | 2009-06-30 | 2011-01-06 | 세메스 주식회사 | 기판 처리 방법 및 장치 |
KR20120028079A (ko) * | 2010-09-14 | 2012-03-22 | 삼성모바일디스플레이주식회사 | 기판의 세정 장치 및 세정 방법 |
JP5497607B2 (ja) * | 2010-10-01 | 2014-05-21 | ファインマシーンカタオカ株式会社 | カプセル型の洗浄機 |
JP5630527B2 (ja) * | 2013-04-12 | 2014-11-26 | 株式会社Sumco | 貼合せsoiウェーハの製造方法 |
JP6426927B2 (ja) * | 2013-09-30 | 2018-11-21 | 芝浦メカトロニクス株式会社 | 基板処理装置及び基板処理方法 |
JP6316657B2 (ja) * | 2014-05-26 | 2018-04-25 | 株式会社長英 | デジタル印刷機用インキ洗浄台 |
JP6454605B2 (ja) * | 2015-06-01 | 2019-01-16 | 東芝メモリ株式会社 | 基板処理方法および基板処理装置 |
JP6559602B2 (ja) * | 2015-09-18 | 2019-08-14 | 東京エレクトロン株式会社 | 基板処理装置および処理チャンバ洗浄方法 |
CN106128983A (zh) * | 2016-08-30 | 2016-11-16 | 上海华力微电子有限公司 | 一种提高清洗效率的湿法清洗水槽及其清洗方法 |
CN107086188B (zh) * | 2016-09-09 | 2020-07-03 | 深圳市新纶科技股份有限公司 | 一种晶元清洗装置 |
US11532493B2 (en) * | 2018-07-30 | 2022-12-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wet bench and chemical treatment method using the same |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3363557B2 (ja) * | 1993-12-28 | 2003-01-08 | 富士通株式会社 | 一槽式処理装置 |
JP4286336B2 (ja) * | 1997-01-24 | 2009-06-24 | 東京エレクトロン株式会社 | 洗浄装置及び洗浄方法 |
JP3839553B2 (ja) * | 1997-06-05 | 2006-11-01 | 大日本スクリーン製造株式会社 | 基板処理槽および基板処理装置 |
US6164297A (en) * | 1997-06-13 | 2000-12-26 | Tokyo Electron Limited | Cleaning and drying apparatus for objects to be processed |
KR100445259B1 (ko) * | 2001-11-27 | 2004-08-21 | 삼성전자주식회사 | 세정방법 및 이를 수행하기 위한 세정 장치 |
JP2004095710A (ja) * | 2002-08-30 | 2004-03-25 | Dainippon Screen Mfg Co Ltd | 基板処理装置 |
-
2004
- 2004-09-22 JP JP2004275679A patent/JP2006093334A/ja active Pending
-
2005
- 2005-05-23 KR KR1020077004739A patent/KR20070055515A/ko not_active Application Discontinuation
- 2005-05-23 US US11/574,760 patent/US20080035182A1/en not_active Abandoned
- 2005-05-23 WO PCT/JP2005/009331 patent/WO2006033186A1/ja active Application Filing
- 2005-05-23 CN CNA2005800303198A patent/CN101073146A/zh active Pending
- 2005-09-21 TW TW094132597A patent/TW200618086A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2006033186A1 (ja) | 2006-03-30 |
CN101073146A (zh) | 2007-11-14 |
KR20070055515A (ko) | 2007-05-30 |
US20080035182A1 (en) | 2008-02-14 |
JP2006093334A (ja) | 2006-04-06 |
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