TW200510082A - Fabricating and cleaning chamber components having textured surfaces - Google Patents
Fabricating and cleaning chamber components having textured surfacesInfo
- Publication number
- TW200510082A TW200510082A TW093113180A TW93113180A TW200510082A TW 200510082 A TW200510082 A TW 200510082A TW 093113180 A TW093113180 A TW 093113180A TW 93113180 A TW93113180 A TW 93113180A TW 200510082 A TW200510082 A TW 200510082A
- Authority
- TW
- Taiwan
- Prior art keywords
- fabricating
- textured
- particles
- textured surface
- component
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24355—Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.]
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Cleaning In General (AREA)
- Treatment Of Fiber Materials (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/653,713 US20050048876A1 (en) | 2003-09-02 | 2003-09-02 | Fabricating and cleaning chamber components having textured surfaces |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200510082A true TW200510082A (en) | 2005-03-16 |
TWI302116B TWI302116B (en) | 2008-10-21 |
Family
ID=34217955
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093113180A TWI302116B (en) | 2003-09-02 | 2004-05-11 | Fabricating and cleaning chamber components having textured surfaces |
Country Status (3)
Country | Link |
---|---|
US (3) | US20050048876A1 (zh) |
TW (1) | TWI302116B (zh) |
WO (1) | WO2005021173A1 (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416997B (zh) * | 2008-06-30 | 2013-11-21 | Lam Res Corp | 多元件電極之再處理程序 |
CN111451190A (zh) * | 2019-01-21 | 2020-07-28 | 宁波江丰电子材料股份有限公司 | 靶材的清洗方法 |
TWI801345B (zh) * | 2016-09-13 | 2023-05-11 | 美商應用材料股份有限公司 | 用於腔室部件、設計薄膜及處理腔室的紋理化表層 |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7964085B1 (en) | 2002-11-25 | 2011-06-21 | Applied Materials, Inc. | Electrochemical removal of tantalum-containing materials |
US20060226003A1 (en) * | 2003-01-22 | 2006-10-12 | John Mize | Apparatus and methods for ionized deposition of a film or thin layer |
US20050048876A1 (en) | 2003-09-02 | 2005-03-03 | Applied Materials, Inc. | Fabricating and cleaning chamber components having textured surfaces |
US7910218B2 (en) | 2003-10-22 | 2011-03-22 | Applied Materials, Inc. | Cleaning and refurbishing chamber components having metal coatings |
US20050183741A1 (en) * | 2004-02-20 | 2005-08-25 | Surjaatmadja Jim B. | Methods of cleaning and cutting using jetted fluids |
US7618769B2 (en) * | 2004-06-07 | 2009-11-17 | Applied Materials, Inc. | Textured chamber surface |
US20060005767A1 (en) * | 2004-06-28 | 2006-01-12 | Applied Materials, Inc. | Chamber component having knurled surface |
US20060021870A1 (en) * | 2004-07-27 | 2006-02-02 | Applied Materials, Inc. | Profile detection and refurbishment of deposition targets |
US7579067B2 (en) * | 2004-11-24 | 2009-08-25 | Applied Materials, Inc. | Process chamber component with layered coating and method |
US8155754B2 (en) * | 2005-01-25 | 2012-04-10 | Medtronic, Inc. | Method for fabrication of low-polarization implantable stimulation electrode |
US9659758B2 (en) * | 2005-03-22 | 2017-05-23 | Honeywell International Inc. | Coils utilized in vapor deposition applications and methods of production |
US20060237043A1 (en) * | 2005-04-25 | 2006-10-26 | Applied Materials, Inc. | Method and apparatus for cleaning semiconductor substrates |
US20060278520A1 (en) * | 2005-06-13 | 2006-12-14 | Lee Eal H | Use of DC magnetron sputtering systems |
US8617672B2 (en) | 2005-07-13 | 2013-12-31 | Applied Materials, Inc. | Localized surface annealing of components for substrate processing chambers |
US7762114B2 (en) * | 2005-09-09 | 2010-07-27 | Applied Materials, Inc. | Flow-formed chamber component having a textured surface |
US20090098002A1 (en) * | 2005-09-20 | 2009-04-16 | Kudu Industries Inc. | Process for hardfacing a metal body |
US20070113783A1 (en) * | 2005-11-19 | 2007-05-24 | Applied Materials, Inc. | Band shield for substrate processing chamber |
US8790499B2 (en) * | 2005-11-25 | 2014-07-29 | Applied Materials, Inc. | Process kit components for titanium sputtering chamber |
US20080092806A1 (en) * | 2006-10-19 | 2008-04-24 | Applied Materials, Inc. | Removing residues from substrate processing components |
US7981262B2 (en) * | 2007-01-29 | 2011-07-19 | Applied Materials, Inc. | Process kit for substrate processing chamber |
US8996129B2 (en) * | 2007-01-31 | 2015-03-31 | Medtronic, Inc. | Medical electrode including an iridium oxide surface and methods of fabrication |
WO2008117482A1 (ja) * | 2007-03-22 | 2008-10-02 | Kabushiki Kaisha Toshiba | 真空成膜装置用部品及び真空成膜装置 |
TWI367147B (en) * | 2007-04-03 | 2012-07-01 | Tara Technologies | An apparatus, method and computer program product for modifying a surface of a component |
US7942969B2 (en) | 2007-05-30 | 2011-05-17 | Applied Materials, Inc. | Substrate cleaning chamber and components |
US20090000641A1 (en) * | 2007-06-28 | 2009-01-01 | Applied Materials, Inc. | Methods and apparatus for cleaning deposition chamber parts using selective spray etch |
US20090050272A1 (en) * | 2007-08-24 | 2009-02-26 | Applied Materials, Inc. | Deposition ring and cover ring to extend process components life and performance for process chambers |
US20090084317A1 (en) * | 2007-09-28 | 2009-04-02 | Applied Materials, Inc. | Atomic layer deposition chamber and components |
US20090194414A1 (en) * | 2008-01-31 | 2009-08-06 | Nolander Ira G | Modified sputtering target and deposition components, methods of production and uses thereof |
US20100089315A1 (en) | 2008-09-22 | 2010-04-15 | Applied Materials, Inc. | Shutter disk for physical vapor deposition chamber |
US8807075B2 (en) * | 2008-09-22 | 2014-08-19 | Applied Materials, Inc. | Shutter disk having a tuned coefficient of thermal expansion |
US8844546B2 (en) * | 2008-10-01 | 2014-09-30 | Applied Materials, Inc. | Apparatus and method for cleaning semiconductor substrate using pressurized fluid |
KR100987978B1 (ko) * | 2008-10-27 | 2010-10-18 | (주)트리플코어스코리아 | 가스 스크러빙 장치 및 가스 스크러빙 방법 |
DE102010007224A1 (de) * | 2010-02-09 | 2011-08-11 | Ford-Werke GmbH, 50735 | Verfahren zum Abtragen von Overspray thermischer Spritzschichten |
US20110220285A1 (en) * | 2010-02-12 | 2011-09-15 | Morgan Advanced Ceramics, Inc. | Methods and systems for texturing ceramic components |
US20120258280A1 (en) * | 2011-04-11 | 2012-10-11 | Applied Materials, Inc. | Extended life textured chamber components and method for fabricating same |
TWI553725B (zh) * | 2011-09-27 | 2016-10-11 | Taiyo Nippon Sanso Corp | 氮化物半導體製造裝置用組件之清洗方法,以及氮化物半導體製造裝置用組件之清洗裝置 |
CN111485226A (zh) * | 2012-07-27 | 2020-08-04 | 应用材料公司 | 粗糙化的基板支撑件 |
CN103794460B (zh) * | 2012-10-29 | 2016-12-21 | 中微半导体设备(上海)有限公司 | 用于半导体装置性能改善的涂层 |
US20160282278A1 (en) * | 2015-03-23 | 2016-09-29 | Cummins Inc. | Chemical cleanliness test method prior to surface treatment |
EP3326196A4 (en) * | 2015-07-23 | 2019-02-27 | Honeywell International Inc. | IMPROVED SPROUT COIL PRODUCT AND METHOD OF MANUFACTURING |
US9917426B1 (en) | 2015-09-01 | 2018-03-13 | Arnold A. Kelson | Reclaimation of scrap copper and other metals by waterblasting in a rotating cylinder |
US11031758B1 (en) | 2016-07-15 | 2021-06-08 | Arnold A. Kelson | Method to reclaim metal from insulated and/or shielded and/or jacketed power cables using waterjetting |
US10625399B1 (en) | 2016-07-15 | 2020-04-21 | Arnold A. Kelson | Method to reclaim metal from insulated and/or shielded and/or jacketed power cables using waterjetting |
US10435784B2 (en) | 2016-08-10 | 2019-10-08 | Applied Materials, Inc. | Thermally optimized rings |
US10434604B2 (en) * | 2016-10-14 | 2019-10-08 | Applied Materials, Inc. | Texturizing a surface without bead blasting |
US10655212B2 (en) | 2016-12-15 | 2020-05-19 | Honeywell Internatonal Inc | Sputter trap having multimodal particle size distribution |
WO2019007488A1 (en) * | 2017-07-04 | 2019-01-10 | Cleanpart Group Gmbh | TREATMENT CHAMBER COMPONENT AND METHOD FOR FORMING SURFACE TEXTURE |
US11183373B2 (en) | 2017-10-11 | 2021-11-23 | Honeywell International Inc. | Multi-patterned sputter traps and methods of making |
CN107838091B (zh) * | 2017-10-27 | 2020-10-16 | 昆明和玘电力设备有限公司 | 一种用于绝缘瓷瓶的带电作业清扫方法 |
US11685990B2 (en) | 2017-12-08 | 2023-06-27 | Applied Materials, Inc. | Textured processing chamber components and methods of manufacturing same |
US20200354831A1 (en) * | 2019-05-07 | 2020-11-12 | Alta Devices, Inc. | Methods and systems for cleaning deposition systems |
US11365475B2 (en) * | 2019-08-02 | 2022-06-21 | Applied Materials Inc. | Physical vapor deposition chamber cleaning processes |
KR20210026954A (ko) * | 2019-09-02 | 2021-03-10 | 삼성전자주식회사 | 반도체 제조 장치 |
Family Cites Families (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US173526A (en) * | 1876-02-15 | Improvement in iron-heating attachments for stoves | ||
US118731A (en) * | 1871-09-05 | Improvement in water-wheels | ||
US10353A (en) * | 1853-12-20 | Steam-boiler | ||
US196890A (en) * | 1877-11-06 | Improvement in portable hot-air and vapor baths combined | ||
US73126A (en) * | 1868-01-07 | Eliphalet s | ||
US5391275A (en) * | 1990-03-02 | 1995-02-21 | Applied Materials, Inc. | Method for preparing a shield to reduce particles in a physical vapor deposition chamber |
US5527275A (en) * | 1991-01-22 | 1996-06-18 | Ginsberg; Irwin A. | Automated ear cleansing device |
US5401319A (en) * | 1992-08-27 | 1995-03-28 | Applied Materials, Inc. | Lid and door for a vacuum chamber and pretreatment therefor |
US5527203A (en) * | 1992-08-28 | 1996-06-18 | Cook; Jack R. | Method for removal of surface contaminants from metal substrates |
GB9310820D0 (en) | 1993-05-26 | 1993-07-14 | Welding Inst | Surface modification |
US5474649A (en) * | 1994-03-08 | 1995-12-12 | Applied Materials, Inc. | Plasma processing apparatus employing a textured focus ring |
DE19504198A1 (de) * | 1995-02-09 | 1996-08-14 | Behringwerke Ag | Kompetitiver Immuntest unter Verwendung komplexierter Analytderivate |
DE19528913C2 (de) * | 1995-08-07 | 1998-07-23 | Franz Schulte | Flußregelventil |
EP0803900A3 (en) * | 1996-04-26 | 1999-12-29 | Applied Materials, Inc. | Surface preparation to enhance the adhesion of a dielectric layer |
US5916454A (en) * | 1996-08-30 | 1999-06-29 | Lam Research Corporation | Methods and apparatus for reducing byproduct particle generation in a plasma processing chamber |
KR19980057929U (ko) * | 1997-02-14 | 1998-10-26 | 배순훈 | 세탁기의 펄세이터 |
US6405399B1 (en) * | 1999-06-25 | 2002-06-18 | Lam Research Corporation | Method and system of cleaning a wafer after chemical mechanical polishing or plasma processing |
US6368410B1 (en) * | 1999-06-28 | 2002-04-09 | General Electric Company | Semiconductor processing article |
KR100613919B1 (ko) * | 1999-07-26 | 2006-08-18 | 동경 엘렉트론 주식회사 | 기판세정구, 기판세정장치 및 기판세정방법 |
US6283840B1 (en) | 1999-08-03 | 2001-09-04 | Applied Materials, Inc. | Cleaning and slurry distribution system assembly for use in chemical mechanical polishing apparatus |
US6296716B1 (en) * | 1999-10-01 | 2001-10-02 | Saint-Gobain Ceramics And Plastics, Inc. | Process for cleaning ceramic articles |
AUPQ477799A0 (en) * | 1999-12-21 | 2000-02-03 | Hydra-Wash Pty Limited | Improved cleaning device and method |
US6669538B2 (en) | 2000-02-24 | 2003-12-30 | Applied Materials Inc | Pad cleaning for a CMP system |
JP2003534451A (ja) | 2000-04-03 | 2003-11-18 | アプライド マテリアルズ インコーポレイテッド | プラズマ処理システムのシリコンルーフの洗浄の改良 |
US6805952B2 (en) * | 2000-12-29 | 2004-10-19 | Lam Research Corporation | Low contamination plasma chamber components and methods for making the same |
US6638366B2 (en) * | 2001-05-15 | 2003-10-28 | Northrop Grumman Corporation | Automated spray cleaning apparatus for semiconductor wafers |
US6777045B2 (en) * | 2001-06-27 | 2004-08-17 | Applied Materials Inc. | Chamber components having textured surfaces and method of manufacture |
JP2003031535A (ja) * | 2001-07-11 | 2003-01-31 | Mitsubishi Electric Corp | 半導体製造装置の超音波洗浄方法 |
US6571472B2 (en) * | 2001-08-14 | 2003-06-03 | General Electric Company | Restoration of thickness to load-bearing gas turbine engine components |
WO2003028909A1 (en) * | 2001-09-28 | 2003-04-10 | Raytheon Company | Dense-phase fluid cleaning system utilizing ultrasonic transducers |
JP2003115576A (ja) * | 2001-10-03 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 電子デバイスの製造方法 |
US6656535B2 (en) * | 2001-12-21 | 2003-12-02 | Applied Materials, Inc | Method of fabricating a coated process chamber component |
US6812471B2 (en) * | 2002-03-13 | 2004-11-02 | Applied Materials, Inc. | Method of surface texturizing |
US6933508B2 (en) * | 2002-03-13 | 2005-08-23 | Applied Materials, Inc. | Method of surface texturizing |
JP3958080B2 (ja) * | 2002-03-18 | 2007-08-15 | 東京エレクトロン株式会社 | プラズマ処理装置内の被洗浄部材の洗浄方法 |
US7041200B2 (en) * | 2002-04-19 | 2006-05-09 | Applied Materials, Inc. | Reducing particle generation during sputter deposition |
US20030230323A1 (en) * | 2002-06-14 | 2003-12-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and method for improving scrubber cleaning |
US20040000327A1 (en) * | 2002-06-26 | 2004-01-01 | Fabio Somboli | Apparatus and method for washing quartz parts, particularly for process equipment used in semiconductor industries |
US20040003990A1 (en) * | 2002-07-02 | 2004-01-08 | Pierre Mansur | Water purification apparatus and method for purifying water |
US6902628B2 (en) * | 2002-11-25 | 2005-06-07 | Applied Materials, Inc. | Method of cleaning a coated process chamber component |
US20050048876A1 (en) | 2003-09-02 | 2005-03-03 | Applied Materials, Inc. | Fabricating and cleaning chamber components having textured surfaces |
US20090000641A1 (en) | 2007-06-28 | 2009-01-01 | Applied Materials, Inc. | Methods and apparatus for cleaning deposition chamber parts using selective spray etch |
-
2003
- 2003-09-02 US US10/653,713 patent/US20050048876A1/en not_active Abandoned
-
2004
- 2004-04-19 WO PCT/US2004/012193 patent/WO2005021173A1/en active Application Filing
- 2004-05-11 TW TW093113180A patent/TWI302116B/zh active
-
2007
- 2007-10-17 US US11/874,169 patent/US20080038481A1/en not_active Abandoned
-
2008
- 2008-12-16 US US12/316,834 patent/US7993470B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI416997B (zh) * | 2008-06-30 | 2013-11-21 | Lam Res Corp | 多元件電極之再處理程序 |
TWI801345B (zh) * | 2016-09-13 | 2023-05-11 | 美商應用材料股份有限公司 | 用於腔室部件、設計薄膜及處理腔室的紋理化表層 |
CN111451190A (zh) * | 2019-01-21 | 2020-07-28 | 宁波江丰电子材料股份有限公司 | 靶材的清洗方法 |
Also Published As
Publication number | Publication date |
---|---|
WO2005021173A1 (en) | 2005-03-10 |
TWI302116B (en) | 2008-10-21 |
US7993470B2 (en) | 2011-08-09 |
US20090120462A1 (en) | 2009-05-14 |
US20050048876A1 (en) | 2005-03-03 |
US20080038481A1 (en) | 2008-02-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200510082A (en) | Fabricating and cleaning chamber components having textured surfaces | |
WO2004048636A3 (en) | Method of cleaning a coated process chamber component | |
WO2009050251A3 (en) | Surface coating processes and uses of same | |
CN103952664B (zh) | 一种类金刚石镀膜工件表面预处理工艺 | |
JP6798997B2 (ja) | プラズマ耐エッチング性が向上された工程部品及びそのプラズマ耐エッチング性の強化処理方法 | |
US20190217336A1 (en) | Methods for forming stainless steel parts | |
EP1310466A3 (en) | Quartz glass parts, ceramic parts and process of producing those | |
TW360874B (en) | Plasma coating process for improved bonding of coatings on substrates | |
WO2008033867A3 (en) | Method of doping surfaces | |
CN105274465B (zh) | 真空镀膜腔内部件洁净粗糙表面的再生方法 | |
TW200514865A (en) | Cleaning and refurbishing chamber components having metal coatings | |
ZA200901557B (en) | Method of doping surfaces | |
ATE234369T1 (de) | Verfahren zur erzeugung eines mit hartmetall beschichteten bauteils | |
WO2007133413A3 (en) | Photoresist stripping chamber and methods of etching photoresist on substrates | |
KR20090082149A (ko) | 세라믹 용사 부재, 그의 제조 방법 및 세라믹 용사 부재용 연마 미디어 | |
KR101359009B1 (ko) | 페인트칠 설비의 구성요소 및 이로부터 페인트를 제거하는장치 | |
CN102477534A (zh) | 镀膜件及其制备方法 | |
CN101967667A (zh) | 铝镁合金物理前处理与电泳涂装工艺 | |
MXPA03008983A (es) | Produccion de superficies abrasivas revestidas y con un patron. | |
US20190031560A1 (en) | Method of producing anti-glare glass and product thereof | |
DK1150801T3 (da) | Metode til at fjerne overfladebelægninger | |
WO2006089134A3 (en) | Apparatus and method for surface preparation using energetic and reactive cluster beams | |
TW200727941A (en) | Coating pickling engraving method for golf head | |
JPS6140329A (ja) | 合成樹脂接着面の表面処理方法 | |
TWI716170B (zh) | 無酸磷化金屬板材的處理方法 |