TW200421576A - Package substrate having high heat dissipation performance and the process thereof - Google Patents

Package substrate having high heat dissipation performance and the process thereof Download PDF

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Publication number
TW200421576A
TW200421576A TW092108329A TW92108329A TW200421576A TW 200421576 A TW200421576 A TW 200421576A TW 092108329 A TW092108329 A TW 092108329A TW 92108329 A TW92108329 A TW 92108329A TW 200421576 A TW200421576 A TW 200421576A
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Taiwan
Prior art keywords
metal
layer
dielectric layer
dielectric
heat sink
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TW092108329A
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Chinese (zh)
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TWI244183B (en
Inventor
Cheng-Kuo Ma
Sheng-Chuan Huang
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Kinsus Interconnect Tech Corp
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Publication of TWI244183B publication Critical patent/TWI244183B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

A package substrate having high heat dissipation performance and the process thereof are provided. A stacked dielectric layer that is constructed by single or multiple dielectric layers is pressing-combined on the metal heat dissipation sheet. Then dig a chip containing trough that extends to the heat dissipation sheet in the stacked dielectric layer. Mount the chip on the trough to let the operation-generated heat directly conduct to the heat dissipation sheet. Besides, form micro holes on the stacked dielectric layer by laser drilling and deposit metal conductor in the holes. Guide the ground terminal of the metal circuits of the stacked dielectric layer to the heat dissipation sheet. Therefore, the heat generated by high frequency signal transmission of chip is conducted to the heat dissipation sheet to have excellent heat dissipation performance. On the other hand, the ground inductance is reduced by directly grounding the metal circuit ground terminal to the heat dissipation sheet through a metal conductor, and hence the grounding noise is reduced.

Description

200421576200421576

π趟月竦'喊 【發明所屬之技術領域】 本發明係關於-種具有高散熱性的構裝 製程,尤指-種提供晶片構裝的載體,作為外部 的媒介,並可對晶片工作時產生的高溫以及高頻數位訊號 傳輸所造成的熱散失,提供快速且有效的散熱途徑,並可 %疋傳輸訊號的基板結構及其製程設計。 【先前技術】 目前電子產品的研發,係朝向於輕薄短小的精密輕量 化之趨勢’該電子產品如高功能半導體元件等需具備高散 熱性之效能外,使用高頻數位傳輸訊號也是 號傳輸的發展方向。‘ 日可下已知之半導體構裝載板元件(如:ebga、邡以、 lebga、···等型式的元件)中,為使其具有良好的高散熱性 ,其構裝基板多係於背面上黏接金屬散熱片,提供晶片直 接‘著八中,藉以將晶片工作時產生的熱經由該散熱片予 以發散,以避免元件過熱而影響其性能或損壞。 惟,丽述半導體元件藉由散熱片的設置,雖可將晶片 工作%產生的熱透過散熱片發散,但對於該元件訊號傳輸 π斤產生的熱散失,只能藉助熱傳導性不佳的基板介電層 I放,而無法快速地直接傳導至金屬散熱片後發散,導致 其散熱功能不足,使元件在使用的過程中仍有溫度偏高之 問題。 又’時下高頻數位訊號傳輸模式之應用曰益增加,對 200421576 於半導體元件高頻兮孔缺 、°虎的傳釦,防制雜訊為通訊上一項重 要的澤題’而如柯a、 ^ 達成雜汛防制,除透過高頻電路設計予 以改善之外,提供曰ΰ政μ Λ 曰曰片外部連接的構裝基板亦應具備減少 接地反彈之功用。唯眭 唯%下已知之構裝基板構造,並不具[The technical field to which the invention belongs] The present invention relates to a mounting process with high heat dissipation, especially a carrier that provides a wafer structure as an external medium, and can work on the wafer. The generated high temperature and heat dissipation caused by high-frequency digital signal transmission provide a fast and effective way to dissipate heat, and the substrate structure and process design of the transmitted signal can be reduced. [Previous technology] The current research and development of electronic products is oriented towards the trend of thinness, shortness, precision, and lightweight. The electronic products, such as high-performance semiconductor components, need to have high heat dissipation performance. In addition, high-frequency digital transmission signals are also used for signal transmission. Direction of development. '' Among the known semiconductor structure mounting board components (such as: ebga, 邡 ,, lebga, ...), in order to make them have high heat dissipation, the structure substrate is mostly on the back The metal heat sink is adhered to provide the chip directly to the eighth middle, so that the heat generated during the operation of the chip is dissipated through the heat sink to prevent the component from overheating and affecting its performance or damage. However, with the arrangement of the heat sink, the Lishu semiconductor element can dissipate the heat generated by the wafer's operating% through the heat sink, but for the heat dissipation generated by the component signal transmission π kg, only the substrate with poor thermal conductivity can be used. The electrical layer is discharged, and cannot be directly conducted to the metal heat sink to dissipate quickly, resulting in insufficient heat dissipation function, so that the component still has a problem of high temperature during use. Also, 'the application of the current high-frequency digital signal transmission mode has increased. For 200421576, the high-frequency pass hole of the semiconductor element, the tiger's pass buckle, and the prevention of noise is an important problem in communication. a. ^ Achieving the prevention of miscellaneous floods. In addition to improving the design through high-frequency circuits, the structural substrates that provide external connection μ Λ should be able to reduce ground bounce. The structure of the mounting substrate is not

有效的接地線路設計,者S Τ田曰日片傳輸訊號時,易有接地訊號Effective grounding circuit design. When the Japanese film is transmitting signals, it is easy to have a grounding signal.

雜的產生(接地反彈) 道ZA 夂详),導致其訊號傳輸不穩定。 【發明内容】 •本發明之主要目的在於提供一種具有高散熱性的構褒 基板、構以及用以製造該基板結構的製程,用以克服前揭 白用基板放熱性不{圭’以及提供應用於高頻電路之晶片具 有較佳之接地性。 為達成前揭目的,本發明所提出之具有散熱功用㈣ 裝基板結構,主要係於一金屬散熱片上壓合一介電積層所 成構成,該介電積層可為單—介電層或多層介電層疊^ 成,其上設有延伸至散熱片的晶片容槽,讓散熱片上具有 顯露於晶片容槽底部的黏晶區間,提供晶片黏著於其上, 該介電積層上表面設有圖案化金屬線路,i自金屬線路預 定接地訊號端設延伸至散熱片的雷射微孔, 設有金屬導體,以直接、或以金屬導體上下串;== 設於介電層夾層間之金屬導熱體間接連接於金屬線路與散 熱片之間,該介電積層上表面另設覆蓋於金屬線路上的圖 案化防焊層,並使金屬線路形成複數個顯露於防焊層外的 焊塾,構成一可將晶片工作產生的熱及晶片高頻^^傳輸 產生的熱散失經由直接傳導至散熱片發散,並可穩定訊號 200421576 傳輸之構裝基板。 本發明所提出之具有高散熱性的構裝基板製程,其步 驟主要係以熱壓合手段於金屬散熱片設導電金屬膜介電積 層,次以雷射鑽孔手段於該介電積層上設延伸至散熱片的 雷射微孔,並於對該介電積層之雷射微孔施以鍍設導電金 屬形成金屬導體,之後,再於該介電積層上表面以影像移 轉手段形成圖案化金屬線路,塗覆防焊層並形成焊墊,再 對介電積層挖設深及散熱片並可容置晶片的晶片容槽,而 完成該構裝基板。 前述介電積層為二層(含)以上介電層之組合時,係 於散熱板上進行預定介電層數週期的介電層壓合、雷射鑽 孔、於雷射微孔中鍍設導電金屬形成金屬導體等步驟,再 於最上層介電層之上表面以影像移轉手段形成圖案化金屬 線路,塗覆防焊層以及對介電積層挖設深及散熱片的晶片 容槽步驟。 本發明藉由前揭構裝基板之結構設計,其特點至少勺 括: ’、’· 匕 1、 可增進散熱i生:本發明戶斤設計的構裝基板,可供 晶片直接黏著於金屬散熱片上,故晶片工作時產生的Μ 直接傳導至金屬散熱片發散,另晶片於高㈣號傳輸時所 產生的熱散失可經由介電積層上的金屬線路接地端經雷射 微孔中的金屬導體(及金屬導熱料)快速且直接傳導至 散熱片發散,使其具極佳的散熱效能。 2、 可穩定訊號傳輸、減少雜訊:本發明利用晶片沉 200421576 置於基板之晶片容槽中,縮短連接晶片與基板間之金屬線 長度,以減少訊號傳輸阻抗,另利用介電積層設雷射微孔 、,並於微孔中設金屬導體將金屬線路中之接地線路端直接 連接至金屬散熱片接地,使其可降低接地電感量,減少接 =訊號雜訊的產生(接地反彈),更可利用雷射微孔中設 只〜金屬導體(Solid Via)導通之方式,進一步減少因導通 孔產生雜散訊號。 本發明所設計的基板構裴製程,則可將本發明之構裝 基板結構予以實現,藉此’使其在產業上可被據以實施, 並達成前揭預期之功用。 Γ實施方式】 有關本發明具有高散熱性的構裝基板結構之具體實施 例,請配合參閱第一圖所示,該構裝基板(工)係於金屬 散熱片(10)上塵合介電積層(20)所構成,該介電 積層(2 0 )中設有延伸至散熱片(丄〇 )的晶片容槽( 2 2 ),该散熱片(1 〇 )具有顯露於晶片容槽(2 2 ) ,部的黏晶區間(1 2 ),用以提供晶片(2 )黏著於該 散熱片(1 0 )上,該介電積層(2 〇 )上表面相對於晶 片容槽(2 2 )外側設有圖案化金屬線路(2 3 ),另設 自金屬線路(2 3 )予員定接地訊號端延伸至散熱片(工〇 )的雷射微孔(2 4 ),該雷射微孔(2 4 )中設有金屬 導體(2 5 )連接於金屬線路(2 3 )與散熱片(丄〇 ) 之間,另該介電積層(2 〇)上表面設有覆蓋於金屬線路 (2 3 )上的圖案化防焊層(2 6 ),並使金屬線路(2 200421576 3 )上具有複數個顯露於防焊層(2 6 )外的焊墊(2 7 ),其中鄰近晶片容槽(2 2 )之内側焊墊(2 7 )提供 晶片(2 )電性連接之用,遠離晶片容槽(2 2 )外侧之 焊墊(2 7 )則提供導電金屬凸塊(4 )固設其上。 前述之介電積層(2〇)除第一圖所示之單一介電層 之構造外,亦可如第三圖為二層(含)以士的介電層 1)組構而成之構造,其中介電積層(2〇)為多層介電 層(2 1 )組構而成之實施例時,請配合參閱第三圖所示 ,該介電積層(2 0 )中上下相鄰介電層(2丄)之夾層 間設有圖案化的金屬導熱體(29),金屬線路⑴) 設於最上層介電層(21)上表面,且該最上層介電層( 2 1 )於其上表面金屬線路(2 3 )就處與下表面金屬 導熱體(2 9 )間之相對應處設有雷射微孔(2 4 ),該 雷射微孔(2 4 )中並設有連接金屬線路(2 3 )與金屬/ 導熱體(29)的金屬導體(25),最下層介電層(2 1)則設有自上表面金屬導熱體(29)朝 二 1〇)延伸的雷射微孔(24),該雷射微孔(^)中 :::接金屬導熱體(29)與散熱“1〇)之間的金 = (25),介於最上層介電層(21)與最下層介 电層(2 1 )間之各中層介電層(2工)步於上下層 金屬導熱體(2 9 )之間預定處設有雷射微孔, έ亥雷射微孔(2 4 )中另办·古、击4立u 下層金屬導熱體( Ή的金屬導體(25) ’若該介電積層(2㈡為上 下一介電層(21)組構而成時,則無上述之中層介電層 200421576 構造。 2 0 )雷射微孔(2 4 )中的金 、三圖所示之實心體,或為附著 前述設於介電積層( 屬導體(25)可如第_ 於孔壁上的空心薄層。 刖述之介電積層r〇 电積層(2 〇 )為二層(含)以上 (2 1 )組構而成之構造專 ^ ^ 射微孔可為上下不對靡 并# 」之雷 對應,並猎金屬導熱體( 或者,如第四、五圖所+ ^ y J違接, 射微孔(2 4 )可為上 之各雷 9 . ^ , 下對應狀,且利用上下雷射微孔( 2 4 )中的貫心金屬導體(2 5 五圖所示,於,直接對應連接,或如第 ςS田射楗孔(2 4 )的空心金屬導體(2 5)中设導電金屬凸揷Γ ^ ^ r 0 λ Λ Α 1 9 1 )直接連接上層雷射彳 (2 4 )的金屬導體(2 5 ) 。 了铽孔 前述設於介電積層卩9 )外的蟬墊 :(2〇)頂面顯露於防焊層(26 焊層 、面可鍍設-鎳金合金(Ni/Au)的助 俨: 以利金屬線(3 )、導電金屬凸塊(4 ) 烊接於該焊墊(2 γ )上。 4 ; 别述中,該金屬散埶片 之覆“α 片(1 0 )為介電積層(2 0 ) ,用::…成圖案化的韓片(11),如第二圖所示 用曰加與介電層之接著性。 面二金屬散熱片(1㈧於其點晶區間(⑴之表 =:-絕緣層(圖未示),或者,如第一、三圖所: 凹槽(工月文熱片、(1 0 )於黏晶區間(1 2 )處形成點晶 " ’並於該黏晶凹槽(1 3 )表面覆設-絕緣The occurrence of noise (ground bounce) (Za details), resulting in unstable signal transmission. [Summary of the Invention] • The main object of the present invention is to provide a structured substrate with high heat dissipation, a structure and a process for manufacturing the substrate structure, to overcome the heat dissipation property of the substrate for front exposure and provide applications. Chips used in high-frequency circuits have better groundability. In order to achieve the purpose of previous disclosure, the mounting substrate structure with heat dissipation function provided by the present invention is mainly formed by laminating a dielectric laminate on a metal heat sink, and the dielectric laminate can be a single-dielectric layer or a multilayer dielectric. It is electrically laminated, and a wafer container extending to the heat sink is provided thereon, so that the heat sink has a sticky crystal section exposed at the bottom of the wafer container to provide the wafer to be adhered thereto. The upper surface of the dielectric build-up is provided with a pattern. A metal circuit, i. A laser micro-hole extending from a predetermined ground signal end of the metal circuit to the heat sink is provided with a metal conductor to directly or in series with the metal conductor; == a metal thermal conductor disposed between the interlayers of the dielectric layer It is indirectly connected between the metal circuit and the heat sink. The upper surface of the dielectric build-up is additionally provided with a patterned solder mask layer covering the metal circuit, and the metal circuit is formed into a plurality of welding pads exposed outside the solder mask layer, forming a It can dissipate the heat generated by the work of the wafer and the heat loss generated by the high-frequency transmission of the wafer through the direct conduction to the heat sink, and can stabilize the signal transmission substrate 200421576. The process for manufacturing a substrate with high heat dissipation provided by the present invention mainly includes the steps of providing a conductive metal film dielectric layer on a metal heat sink by means of thermocompression bonding, and secondly by laser drilling on the dielectric layer. The laser microholes extending to the heat sink are plated with a conductive metal to form a metal conductor on the laser microholes of the dielectric layer, and then patterned by image transfer on the upper surface of the dielectric layer. The metal circuit is coated with a solder resist layer and a solder pad is formed, and then a deep and heat sink can be excavated into the dielectric build-up and a wafer container can be accommodated to complete the substrate. When the foregoing dielectric laminate is a combination of two or more dielectric layers, the dielectric lamination is performed on a heat sink with a predetermined number of dielectric layers, laser drilling, and plating in laser micro-holes. Conductive metal forming a metal conductor and other steps, and then forming a patterned metal circuit on the upper surface of the uppermost dielectric layer by image transfer, coating a solder resist layer, and digging a deep groove and a heat sink for the dielectric chip. . The structure design of the mounting substrate of the present invention is disclosed at the front. Its characteristics include at least: ',', and 1. It can improve heat dissipation. The mounting substrate designed by the user of the present invention can directly attach the chip to the metal for heat dissipation. On the chip, the M generated during the wafer's operation is directly transmitted to the metal heat sink to dissipate. In addition, the heat dissipation generated during the transmission of the wafer at high height can be passed through the metal conductor in the laser microhole through the metal line ground on the dielectric laminate. (And metal thermal conductive material) quickly and directly to the heat sink to diverge, which makes it have excellent heat dissipation performance. 2. Stable signal transmission and reduced noise: The present invention uses a wafer sinker 200421576 to be placed in a wafer receptacle of a substrate, shortening the length of the metal wire connecting the wafer and the substrate to reduce the signal transmission impedance, and using a dielectric layer to set a mine Shoot micro holes, and set metal conductors in the micro holes to directly connect the ground terminal of the metal line to the metal heat sink to ground, which can reduce the amount of ground inductance and reduce the generation of signal noise (ground bounce). It is also possible to use a conductive method in which only a metallic conductor (Solid Via) is provided in the laser microvia to further reduce stray signals due to the via. The substrate structure manufacturing process designed by the present invention can realize the structure of the substrate structure of the present invention, so as to make it possible to implement it in the industry and achieve the expected function of the previous disclosure. Γ embodiment] For a specific example of a mounting substrate structure with high heat dissipation properties according to the present invention, please refer to FIG. 1 for reference. The mounting substrate (work) is a dust-laminated dielectric layer on a metal heat sink (10). (20), the dielectric build-up layer (20) is provided with a wafer container (2 2) extending to a heat sink (丄 〇), and the heat sink (10) has a chip receiver (2 2) exposed. ), The sticky crystal interval (1 2) of the part is used to provide the wafer (2) adhered to the heat sink (1 0), and the upper surface of the dielectric build-up (20) is opposite to the outside of the wafer receiving groove (2 2). A patterned metal circuit (2 3) is provided, and a laser micro hole (2 4) extending from a predetermined ground signal end of the metal circuit (2 3) to a heat sink (work 0) is provided, and the laser micro hole ( 2 4) is provided with a metal conductor (2 5) connected between the metal circuit (2 3) and the heat sink (丄 〇), and the upper surface of the dielectric build-up layer (20) is provided with a cover for the metal circuit (2 3) ) On the patterned solder mask layer (2 6), and the metal circuit (2 200421576 3) has a plurality of solder pads (2 7) exposed outside the solder mask layer (2 6). The inner pads (2 7) adjacent to the wafer receptacle (2 2) in the middle provide the wafer (2) for electrical connection, and the pads (2 7) located away from the outer side of the wafer receptacle (2 2) provide conductive metal bumps. (4) It is fixed on it. In addition to the structure of the single dielectric layer shown in the first figure, the aforementioned dielectric laminated layer (20) can also be composed of a two-layer (including) dielectric layer 1) as shown in the third figure. In the embodiment in which the dielectric build-up layer (20) is a multilayer dielectric layer (21), please refer to the third figure, as shown in FIG. A patterned metal thermal conductor (29) is interposed between the interlayers of the layer (2 丄), and a metal circuit (⑴) is provided on the upper surface of the uppermost dielectric layer (21), and the uppermost dielectric layer (2 1) is disposed on the upper surface of the upper dielectric layer (2). The upper surface metal circuit (2 3) is provided with a laser micro-hole (2 4) at a position corresponding to the lower surface metal heat-conducting body (2 9), and a connection is provided in the laser micro-hole (2 4). The metal line (2 3) and the metal conductor (25) of the metal / heat conductor (29), and the lower dielectric layer (2 1) is provided with a thunder extending from the upper surface of the metal heat conductor (29) toward 20). The micro-hole (24), in the laser micro-hole (^), the gold connected between the metal thermal conductor (29) and the heat sink "10" = (25), which is between the uppermost dielectric layer (21) ) And the lower dielectric layer (2 1) The layer (2 steps) is provided with laser micro-holes at a predetermined position between the upper and lower metal thermal conductors (2 9), and the laser micro-holes (2 4) are separately processed in the ancient and the lower 4 layers. The metal conductor (25) of the body ()) 'If the dielectric multilayer (2㈡ is composed of the upper and lower dielectric layers (21), there is no 200421576 structure of the above-mentioned intermediate dielectric layer. 2) Laser micropores The solid body shown in (2 4) in gold and the three figures, or the solid layer shown in the dielectric layer (the conductor (25) can be the same as the hollow thin layer on the hole wall. The dielectric layer described above r〇 Electrodeposited layer (20) is a structure composed of two or more layers (2 1). ^ The injection micro-holes can correspond to the up and down mismatches, and hunt metal heat conductors (or As shown in the fourth and fifth figures, + ^ y J is connected, and the micro-holes (2 4) can be the respective lasers 9. ^, The lower corresponding shape, and the penetrations in the upper and lower laser micro-holes (2 4) are used. The core metal conductor (as shown in Figure 5-5) is directly connected, or a conductive metal bump 中 Γ ^ ^ r 0 λ Λ is set in the hollow metal conductor (2 5) of the second hole (2 4). Α 1 9 1) direct connection The upper layer of the metal conductor (2 4) of the laser beam (2 4). The cicada pads with the holes provided outside the dielectric layer (9) are as follows: (2) The top surface is exposed in the solder mask (26 solder layer, surface Plating-nickel-gold alloy (Ni / Au) assists: The metal wire (3) and the conductive metal bump (4) are connected to the pad (2 γ). 4; In other words, the The "α" sheet (1 0) is a dielectric laminated sheet (2 0), and is used to form a patterned Korean sheet (11), as shown in the second figure. Then sex. Surface two metal heat sink (1㈧ in its crystalline interval (⑴ 的 表 =:-insulating layer (not shown)), or, as shown in the first and third pictures: groove (Gongyuewen heat sheet, (1 0) Forming point crystals at the sticky crystal interval (1 2) " and overlaying-insulating the surface of the sticky crystal groove (1 3)

10 200421576 層(1 4 ),前述之絕緣層(1 4 )可為黑色的氧化層, 忒金屬散熱片(1〇)可為銅(Cu)片,其外表面鍍設一 層可為鎳(Ni)或其他不易氧化的金屬抗氧化層(1 5 ) ^別述之介電層可因應不同之電性需求,選用不同的介 $材料,如Gteck、FR4、FR5、BT、…等,對於高頻需求 日寸’則可選用低介電常數的材料,《改變該介電層的厚度 ’來達到阻抗匹配的需求。 本發明以前揭之構裝基板結構設計,於構裝時,係將 晶片(2 )黏著於該基板(i )位於晶片容槽(2 2 )底 P的政熱片(1 〇 )黏晶區^ (丄2 )上,另以金屬線( )連接於曰日#( 2 )上各接點與基板(1 )上對應的焊 (2 7 )之間,次將其晶片及接線區以灌膠封固,再於 基板(1 )外圍焊t ( 2 7 )上設導電金屬凸塊(4 )構 成一半=體元件,該半導體元件並以其導電金屬凸塊(4 ),朝下焊接於電路板的線路上作外部電性連接,即可讓該 半導體元件受控於電路板工作。 本^明藉由别揭構裝基板結構設計,於使用時至少具 有以上優點,其中: ’、 可增進散熱性:本發明所設計的構裝基板,可供 晶片直接黏著於金屬散熱片上,故晶片卫作時產生的熱可 直接傳導至金屬散熱片發散,另晶片於高頻訊號傳輸時所 產生的熱散失可經由介電積層上的金屬線路接地端經雷射 #孔中的金屬導體(及金屬導熱體等)快速傳導至散熱片 200421576 發散,使其具極佳的散熱效能。 2、可穩定訊號傳輸、減少雜訊:本發明所設計的構 裝基板利用晶片沉置於基板(i )之晶片容槽(2 2 )中 ,可縮短接於晶片(2 )與基板(2 )間之金屬線(3 ) 長度,減少訊號傳輸阻抗,此外,本發明利用介電積層設 雷射微孔,並於其中設金屬導體將金屬線路中之接地^路 端直接連接至金屬散熱片接地,使其可降低接地電感量, 減少接地訊號雜訊的產± (接地反彈),更可利用雷射微 孔中設實心金屬導體(Solid Via)導通之方式,進__步減少 因導通孔產生雜散訊號。 為完成前揭構裝基板結構,本發明接續設計了實現該 構裝基板構造的創新製程,首以介電積層為單一介電層之 構裝基板為例,其製程包括以下步驟: 一提供-如銅等具高導熱性的金屬散熱片,如第六A圖 m 政熱片(2 〇 )上表面可利用影像移轉手段 沉積或蚀刻出圖案化的鰭片(11),如第六B圖所示, 或者:5亥金屬散熱片(1 0 )上亦不設該圖案化的鰭片; 以熱壓合手段於該金屬散熱片(工〇 )上覆設一上表 面具有導電金屬膜(21 G)(如mi等)的介電積層( 2 〇)’如第六c圖所示’其中散熱片(1〇)上設有鰭 Ή可藉鰭片(11)增加與介電積層(20 )間的接著性; :雷射鑽孔手段於該介電積層(20)預定位置處形 成貝通至金屬勒敎ΰ ^ 月文…、片(1 〇 )的雷射微孔(2 4 ),如第 200421576 六D圖所示; 對介電積層(20)之雷射微孔(24)及其上表面 施以鍍設如銅等之導電金屬步驟,如第六E圖所示,使雷 射微孔(2 4 )形成一可為空心或實心的金屬導體(2 5 ),連接導電金屬膜與金屬散熱片(10)之間,於本實 施例中,於雷射微孔(2 4 )中係採取形成空心金屬導體 (2 5 )之方式’此一步驟之後,再以介電材(2 1 2) 填平雷射微孔(2 4 ),如第六F圖所示;以影像移轉手 段於導電金屬膜(2 1 〇)上形成圖案化的乾膜(2 1 1 )’如第六G圖所示; 對導電金屬膜(2 1 〇)顯露於圖案化乾膜(2 1 1 )外之部份鍍設鎳金合金(Ni/Au)之助焊層(2 8 ),如 第六Η圖所示; 剝離覆設於導電金屬膜(2 1 0 )上的乾膜(2 1 1 )’如第六I圖所示; 衫像移轉手段於導電金屬膜(2 案化的金屬線路(23),如第六】圖所示,該金屬線: (23)連接雷射微孔(24)内的金屬導體; 於"電積層(2〇)及金屬線路(23)上塗覆一圖 ? ^烊層(2 6 ),如第六Κ圖所示,並使該金屬線路 3 )形成顯露於防焊層(2 6 )外的焊墊(2 7 ); 對金屬散熱片(i 〇 )外#而妙执一可也# ’ 層(! ς、1 u J外表面鍍汉一可為鎳之抗氧化 如第六L圖所示;以及 、電積層(2 0 )預定位置處挖設深及散熱片(工 13 200421576 0)並可容置晶片的晶片容槽(22),如第六M圖所示 ,挖槽時’玎進-步深入散熱片(丄〇 ) β,使其形成黏 晶凹槽(1 3 ),如第六Ν圖所示,該黏晶凹槽(i 3 ) 表面可再沉積可為黑色氧化層之絕緣層(1 4 ),而完 成該構裝基板之製造。 前述之製程步驟中,亦可於介電積層(2 〇 )之雷射 微孔(24)及其上表面完成鍍設導電金屬步驟之後,直 接以影像移轉手段於導電金屬膜上蝕刻出圖案化的金屬線 路(圖未示),接續於介電積層及金屬線路上塗覆一圖案鲁 化防焊層,對金屬線路顯露於防焊層外的焊墊上鍍設鎳金 合金(Ni/Au)之助焊層,再對金屬散熱片外表面鍍設一可 為鎳之抗氧化層,以及對介電積層挖設晶片容槽等步驟。 有關本發明應用於製造多層介電層構成介電積層之構 裝基板製造,以三介電層構成之介電積層為例,其製程包 括以下步驟: 提供一具高導熱性的金屬散熱片,.如第七八圖所示, 該金屬散熱片(1〇)上表面可利用影像移轉手段沉積戍· -刻出圖案化的韓片⑴),如第七B圖所示,或= 設該圖案化的鰭片; 以熱壓合手段於該金屬散熱片(1 〇 )上覆設一上表 面具有導電金屬膜(21〇a)的第一介電層(21a), 如第七C圖所示; 〆:雷射鑽孔手段於該第一介電層(2 1 a)預定位置處 形成貝通至金屬散熱片(10)的雷射微孔(24a),如 14 200421576 第七D圖所示; 對第-介電層(2la)之雷射微孔(24a)及其上 又面知以鍵設導電金屬步驟,使雷射微孔( 可為空心或實心的金屬’ 4 $版、乙如弟七£圖所示, 連接導電金屬膜(21〇a)與金屬散熱片(1〇)之間, :::施例中,於雷射微孔(24a)中係採取形成空心金 屬¥體(25a)之方式; 以影像移轉手段令第一介電層上的導電金屬膜(2ι 〇a)形成圖案化的金屬導熱體(29a),如第七卩圖所 :二=體(,9a)連接雷射微孔(24a)_ =合手段於該第—介電層(2la)上覆設一上表 面具有導電金屬膜(210b)的第二介電層(2 , 如第七G圖所示,該第二介電層(2lb) 第-介電層(21a)之空心金屬導 才、'真充 ; 腹、Z b a)内部空間 以雷射鑽孔手段於該第二介電層(2ib 形成貫通至金屬導熱體(29b)的雷射微 如第七Η圖所示; 24b) 對第二介電層(2 lb)之雷射微孔( 表面施以鍍設導電金屬步驟,如第七丨 )及其上 孔(24b)形成一可為空心(或實心)的=使雷射微 b),連接導電金屬膜(2丄〇c) 屬導體(2 5 一 (29a)…上述 15 200421576 電層(21)(即隶上層介電層)之壓八 斟帝私W π , n 〇、_射鑽孔以及 對田射你支孔(2 4 C )中鍍設金屬導體Γ l25c〇等步驟, 如弟七J、第七K、第七L、第七M圖所 (2 1 2)填平雷射微孔(24c) …於介電材 y戈第七N圖所示; 再以影像移轉手段於最上層介電層(2 I。彡、— 屬膜(210C)上形成圖案化的乾膜( <導電金 〇圖所示; 2 1 1 ),如第七 圖案化乾膜(2 1 1 助焊層(2 8 ),如10 200421576 layer (1 4), the aforementioned insulating layer (1 4) may be a black oxide layer, the rhenium metal heat sink (10) may be a copper (Cu) sheet, and the outer surface thereof may be plated with nickel (Ni) ) Or other non-oxidizable metal anti-oxidation layer (1 5) ^ Different dielectric layers can be selected according to different electrical requirements, such as Gteck, FR4, FR5, BT, ... Frequency demand day inch 'can choose low dielectric constant materials, "change the thickness of the dielectric layer' to meet the needs of impedance matching. In the structure design of the mounting substrate previously disclosed in the present invention, during the mounting, the wafer (2) is adhered to the substrate (i) and is located on the political wafer (10) at the bottom P of the wafer container (2 2). ^ (丄 2), and another metal wire () is connected between the contacts on the day # (2) and the corresponding solder (2 7) on the substrate (1), and then the chip and the wiring area are filled with Adhesive sealing, and then a conductive metal bump (4) is provided on the substrate (1) peripheral welding t (2 7) to form a half body element. The semiconductor element is soldered downward with its conductive metal bump (4). External electrical connection on the circuit of the circuit board allows the semiconductor element to be controlled by the circuit board. The present invention has at least the above advantages by using the structure design of the mounting substrate, among which: ', can improve heat dissipation: the mounting substrate designed by the present invention can be used to directly attach the chip to the metal heat sink, so The heat generated by the chip can be directly transmitted to the metal heat sink to dissipate. In addition, the heat loss generated when the chip transmits high-frequency signals can be passed through the metal conductor in the laser #hole through the metal circuit ground terminal on the dielectric laminate ( And metal thermal conductor, etc.) quickly conduct to the heat sink 200421576 and diverge, making it have excellent heat dissipation performance. 2. Stable signal transmission and reduced noise: The structured substrate designed by the present invention uses the wafer to be sunk in the wafer container (2 2) of the substrate (i), which can shorten the connection between the wafer (2) and the substrate (2). ) Length of the metal wire (3) to reduce signal transmission impedance. In addition, the present invention uses a dielectric multilayer to set laser micro-holes, and a metal conductor is provided in the invention to directly connect the ground end of the metal line to the metal heat sink. Grounding makes it possible to reduce the amount of ground inductance, reduce the noise signal of the ground signal (ground bounce), and use the solid metal conductor (Solid Via) conduction method in the laser micro-hole to further reduce the conduction The holes produce stray signals. In order to complete the unveiling of the structured substrate structure, the present invention continues to design an innovative process for realizing the structure of the structured substrate. First, a structured substrate with a dielectric layer as a single dielectric layer is taken as an example. The manufacturing process includes the following steps: Metal heat sinks with high thermal conductivity, such as copper, such as Figure 6A, m. The top surface of the political heat sink (20) can be image-transferred to deposit or etch patterned fins (11), as shown in Figure 6B. As shown, or: the patterned fins are not provided on the 5H metal heat sink (1 0); a conductive metal film with an upper surface ( 21 G) (such as mi, etc.) of the dielectric layer (20) 'as shown in Figure 6c' wherein the heat sink (10) is provided with fins, which can be increased by the fins (11) and the dielectric layer ( 20): laser drilling means to form a laser micro-hole (2 4) from Beton to metal 敎 ΰ at a predetermined position of the dielectric layer (20). ), As shown in figure 200421576 6D; the laser micro-holes (24) of the dielectric multilayer (20) and their upper surfaces are plated with conductive gold such as copper In the step, as shown in the sixth E diagram, the laser micro-holes (2 4) are formed into a hollow or solid metal conductor (2 5), which is connected between the conductive metal film and the metal heat sink (10). In the embodiment, a method of forming a hollow metal conductor (2 5) is used in the laser micro-holes (2 4). After this step, the laser micro-holes (2 1 2) are filled with a dielectric material (2 1 2). 4), as shown in FIG. 6F; forming a patterned dry film (2 1 1) on the conductive metal film (2 1 0) by means of image transfer as shown in FIG. 6G; for the conductive metal film (2 1 〇) The exposed part of the patterned dry film (2 1 1) is plated with a nickel-gold alloy (Ni / Au) flux layer (2 8), as shown in the sixth figure; The dry film (2 1 1) 'on the conductive metal film (2 1 0) is as shown in the sixth figure I; the shirt image transfer means is applied to the conductive metal film (2 metalized circuit (23), such as the sixth As shown in the figure, the metal wire: (23) is connected to the metal conductor in the laser micro hole (24); a picture is coated on the "electrodeposition layer (20)" and the metal circuit (23)? 6), as shown in Figure 6K, and make the metal Circuit 3) forming a solder pad (2 7) exposed outside the solder resist layer (2 6); and the outer surface of the metal heat sink (i 〇) # 而 妙 执 一 可 也 # 'layer (!, 1 u J outer surface The anti-oxidation of nickel plating can be shown in Figure 6L; and, a deep and heat sink (work 13 200421576 0) can be dug at a predetermined position of the electrodeposition layer (20) and can accommodate a wafer chip groove ( 22), as shown in FIG. 6M, when the trench is digged, “step into the heat sink (丄 〇) β to form a sticky crystal groove (1 3), as shown in the sixth N, the adhesive The surface of the crystal groove (i 3) can be further deposited with an insulating layer (1 4), which can be a black oxide layer, to complete the fabrication of the structural substrate. In the foregoing process steps, after the step of plating the conductive metal on the laser micro-holes (24) of the dielectric build-up (20) and its upper surface, a pattern can be directly etched on the conductive metal film by image transfer means. A metalized circuit (not shown) is coated with a patterned solder mask on the dielectric build-up layer and the metal circuit, and a nickel-gold alloy (Ni / Au) is plated on the pads of the metal circuit exposed outside the solder mask. A soldering layer, plating an outer surface of the metal heat sink with an anti-oxidation layer that can be nickel, and digging a wafer container for the dielectric build-up. Regarding the application of the present invention to the manufacture of structural substrates with multiple dielectric layers constituting a dielectric build-up, taking a dielectric build-up consisting of three dielectric layers as an example, the manufacturing process includes the following steps: providing a metal heat sink with high thermal conductivity, As shown in Figure 78, the upper surface of the metal heat sink (10) can be deposited using image transfer (戍--engraved with a patterned Korean film ⑴), as shown in Figure 7B, or = The patterned fins; a first dielectric layer (21a) having a conductive metal film (21a) on its top surface is overlaid on the metal heat sink (10) by means of thermocompression bonding, such as the seventh C As shown in the figure: 〆: Laser drilling means forms laser micro-holes (24a) from Beton to metal heat sink (10) at predetermined positions of the first dielectric layer (2 1 a), such as 14 200421576 As shown in Figure D; the laser micro-holes (24a) of the -dielectric layer (2la) and the step of forming a conductive metal by bonding are known to make the laser micro-holes (can be hollow or solid metals' 4 $ Version and B are shown in the figure. They are connected between the conductive metal film (21〇a) and the metal heat sink (1〇). 24a) adopts the method of forming a hollow metal body (25a); the image transfer method is used to form the conductive metal film (2 〇a) on the first dielectric layer to form a patterned metal heat conductor (29a), as in Qiqi diagram: two = body (, 9a) connected to the laser micro hole (24a) = = combined means on the first dielectric layer (2la) a second layer with a conductive metal film (210b) on the top surface Dielectric layer (2, as shown in Figure 7G, the second dielectric layer (2lb), the first dielectric layer (21a) of the hollow metal conductor, 'true charge; belly, Zba') The laser drilling means forms a laser micro through the second dielectric layer (2ib penetrating to the metal thermal conductor (29b) as shown in the seventh figure; 24b) a laser micro to the second dielectric layer (2 lb) The hole (the surface is provided with a conductive metal plating step, such as the seventh one) and its upper hole (24b) form a hollow (or solid) = laser microb), and is connected to the conductive metal film (2 丄 〇c ) Belongs to the conductor (2 5 a (29a) ... above 15 200421576 the pressure of the electrical layer (21) (that is, the upper dielectric layer). (2 4 C) metal plating Volume Γ 125c, and other steps, such as filling the laser micropores (24c) with the seventh, eighth, seventh, seventh, and seventh maps (2 1 2) ... As shown in the figure, a patterned dry film is formed on the uppermost dielectric layer (2 I. 彡, — the metal film (210C) by means of image transfer) (as shown in the figure of conductive gold; 2 1 1), as shown in FIG. The seventh patterned dry film (2 1 1 flux layer (2 8), such as

對導電金屬膜(2 1 〇c)顯露於 )外之部份鍍設鎳金(Ni/Au)合金的 第七P圖所示; 剝離覆設於導電金屬膜(2丄〇c)上的乾膜(2 )’如第七Q圖所示; 以影像移轉手段於導電金屬膜(2丄Q e)上餘刻出圖 案化的金屬線路(2 3 ),如第七㈣所示; ^ 於介電積層(2 0)及金屬線路(2 3)上塗覆一圖 案化防焊層(2 6 ),如第七s圖所示,並使該金屬線路 (2 3 )形成顯露於防焊層(2 6 )外的焊墊(2 7 ); 、,、對金屬散熱片(1 0 )外表面鍍設一可為鎳或其他材 料等之抗氧化層(1 5 ),如第七τ圖所示;以及 對介電積層(2 〇 )預定位置處挖設深及散熱片(丄 〇 )並可容置晶片(2 )的晶片容槽(2 2 ),如第七u 圖所示,於挖槽時,亦可進一步深入散熱ϋ ( 1 0 )内, 使:形成黏晶凹槽("),該黏晶凹槽(1 3 )表面可 再/儿積_可為黑色氡化層或其他絕緣材料之絕緣層(1 4 16 200421576 ),如第七V圖所示,而完成該多介電層構裝基板之製造 〇 前述之製程步驟中,亦可於最上層介電層之雷射微孔 及其上表面完成鍍設導電金屬步驟之後,直接以影像移轉 手段於導電金屬膜上蝕刻出圖案化的金屬線路(圖未示) ’接續於介電積層及金屬線路上塗覆一圖案化防焊層,對 金屬線路顯露於防焊層外的焊墊上鍍設鎳金合金(Ni/Au) 之助焊層,再對金屬散熱片外表面鍍設一可為鎳之抗氧化 層,以及對介電積層挖設晶片容槽等步驟。前揭介電積層 為二層介電層組構而成時,係刪除第二介電層之製程步驟 ,並於完成第一介電層之雷射鑽孔、雷射微孔中鍍設金屬 導體、以及形成圖案化的金屬導熱體等製程步驟後,直接 於第一介電層上壓合具導電金屬膜的第三介電層(即最上 層介電層)、雷射鑽孔、雷射微孔中鍍設金屬導體,接續 於導電金屬膜上形成圖案化的乾膜、鍍設助焊層、剝離乾 膜钱刻出圖案化的金屬線路、塗覆防焊層、於金屬散熱 片外表面鍍設抗氧化層,以及對介電積層挖設深及散熱片 的晶片容槽等後續製程步驟,完成基板製造完成;若該介 電積層為三層以上介電層組構而成時,則反復進行上述第 一 J電層之製步驟,使其具有多層第二介電層,最後再進 行第三介電層之製程步驟。 月述製程步驟中,亦可於介電積層(2 〇 )之雷射微 孔(2 4 )完成鍍設導電金屬步驟之後,直接以影像移轉 手4又方、V電金屬膜上姓刻出圖案化的金屬線路(圖未示) 200421576 ,接續於介電積層及金屬線路上塗覆一圖案化防焊層,對 金屬線路顯露於防焊層外的焊墊上鍍設鎳金合金(Ni/Au) 之助焊層,再接續對金屬散熱片外表面鍍設一抗氧化層, 以及對介電積層挖設晶片容槽等步驟。 前揭具有多層介電層構成介電積層之構裝基板製造亦 可以下列製程步驟完成,該製程係包括: 提供一具高導熱性的金屬散熱片,如第八A圖所示, 該金屬散熱片(1 〇 )上表面可利用影像移轉手段沉積或 蝕刻出圖案化的鰭片(]_ JL ),如第八B圖所示,或可不 設該圖案化的鰭片; 以熱壓合手段於該金屬散熱片(1 〇 )上覆設一第一 介電層(21a),如第八c圖所示; …:雷射鑽孔手段於該第一介電層(2 la)預定位置處 形成貫通至金屬散熱片(1 〇 )的雷射微孔(2 4a),如 八D圖所示; 對第一介電層 設導電金屬步驟, 實心的金屬導體( 八E圖所示;The conductive metal film (2 1 0c) is exposed to the outside of) and is plated with a nickel-gold (Ni / Au) alloy as shown in the seventh P picture; the conductive metal film (2 丄 〇c) overlaid on the conductive metal film (2 丄 〇c) is peeled off. The dry film (2) 'is shown in the seventh Q figure; a patterned metal circuit (2 3) is engraved on the conductive metal film (2 丄 Q e) by means of image transfer, as shown in the seventh figure; ^ Apply a patterned solder mask (2 6) on the dielectric build-up layer (20) and the metal circuit (23), as shown in Figure 7s, and make the metal circuit (2 3) to be exposed The pad (2 7) outside the solder layer (2 6); ,,, The outer surface of the metal heat sink (1 0) is plated with an anti-oxidation layer (15), which can be nickel or other materials, such as the seventh as shown in the τ diagram; and a chip receiving groove (2 2) for digging deep and heat sinks (丄 〇) and accommodating the wafer (2) at a predetermined position of the dielectric laminate (20), as shown in the seventh u diagram It can be shown that when digging a groove, it can be further penetrated into the heat sink 1 (1 0), so as to form a crystal sticky groove ("), and the surface of the sticky crystal groove (1 3) can be black / black. Insulating layer of halogenated layer or other insulating material (1 4 16 200421576) As shown in the seventh V diagram, the manufacturing of the multi-dielectric layer structured substrate is completed. In the foregoing process steps, the conductive micro-holes can also be plated on the laser micro holes of the uppermost dielectric layer and the upper surface thereof. After the step, a patterned metal circuit (not shown) is etched directly on the conductive metal film by means of image transfer. 'Continuously apply a patterned solder mask on the dielectric build-up layer and the metal circuit to expose the metal circuit to the The solder pads outside the solder layer are plated with a nickel / gold alloy (Ni / Au) soldering layer, and then the outer surface of the metal heat sink is plated with an anti-oxidation layer that can be nickel, and the dielectric tank is used to excavate a wafer container. step. When the front dielectric layer is composed of two dielectric layers, the process steps of the second dielectric layer are deleted, and metal is plated in the laser drilling and laser micro holes of the first dielectric layer. After the process steps such as the conductor and forming a patterned metal heat conductor, the third dielectric layer (ie, the uppermost dielectric layer) with the conductive metal film, the laser drilling, and the laser are directly laminated on the first dielectric layer. A metal conductor is plated in the microvia, followed by forming a patterned dry film on the conductive metal film, plating a soldering layer, peeling the dry film, engraving the patterned metal circuit, coating a solder resist layer, and a metal heat sink The outer surface is plated with an anti-oxidation layer, and the subsequent process steps such as digging the dielectric build-up layer and the wafer tank of the heat sink are completed to complete the manufacture of the substrate; if the dielectric build-up is composed of three or more dielectric layers Then, the above-mentioned steps of manufacturing the first J-electric layer are repeatedly performed so that it has a plurality of second dielectric layers, and finally, the process steps of the third dielectric layer are performed. In the process steps described in the month, after the conductive metal plating step is completed in the laser micro-holes (2 4) of the dielectric laminate (20), the image can be directly transferred to the 4th and 4th square, and the V-metal film is engraved. Patterned metal circuit (not shown) 200421576, followed by coating a patterned solder mask on the dielectric build-up and the metal circuit, and plating nickel / gold alloy (Ni / Au) on the pads of the metal circuit exposed outside the solder mask. ), And then follow the steps of plating an anti-oxidation layer on the outer surface of the metal heat sink, and digging the chip cavity for the dielectric build-up. The fabrication of a structured substrate with a multi-layered dielectric layer and a dielectric build-up layer can also be completed by the following process steps, which include: Providing a metal heat sink with high thermal conductivity, as shown in Figure 8A, the metal heat sink The patterned fins (] _ JL) can be deposited or etched on the top surface of the wafer (10) by image transfer, as shown in Figure 8B, or the patterned fins may not be provided; Means: a first dielectric layer (21a) is overlaid on the metal heat sink (10), as shown in FIG. 8c; ...: a laser drilling method is scheduled in the first dielectric layer (2la) Laser micro-holes (24a) penetrating to the metal heat sink (10) are formed at the positions, as shown in FIG. 8D; a step of providing a conductive metal to the first dielectric layer, and a solid metal conductor (shown in FIG. 8E) ;

(2 1 a)之雷射微孔(2 4 a)施以鍍 使雷射微孔(2 4 a)形成一可為空心或 25a)連接金屬散熱片(1〇),如第 口丁议於該 介電層, l ^ }如弟八F圖所示; 以雷射鑽孔手段於 _ 一介電層 、以第一)丨笔層(2 lb)上設對應第 ,hx a電射微孔(2 4 a )的雷射微孔(2 ,如第八G圖所示; L 2 18 421576 ^對第二介電層(2 lb)之雷射微孔(24b)鍍設導 電孟屬,如第八Η圖所示,使雷射微孔(2 4 b)形成一可 為空心或實心的金屬導體(2 5b),並連接第一介電層( 2 1 a)之金屬導體(2 5 a); 壓合一上表面具有導電金屬膜(2 1 0 c)的第三層 η電層(2 1 )(即最上層介電層),並於其上施以雷射 鑽孔對雷射微孔(2 4 c)中鍍設連接第二介電層(2 1 :)金屬導體(25b)的金屬導體(25c)等步驟,如 第八I 、第八J、第八κ圖所示; _ 再以影像移轉手段於最上層介電層(2 4 c)之導電金 屬膜(210C)上形成圖案化的乾膜(211),如第八 八L圖所示; 對導電金屬膜(2 1 0c)顯露於圖案化乾膜(2 1 1 )外之^伤錢设鎳金(Ni/Au)合金的助焊層(2 8 ),如 第八Μ圖所示;(2 1 a) of the laser micro-holes (2 4 a) are plated so that the laser micro-holes (2 4 a) form a hollow or 25a) connection metal heat sink (1〇), as described in Section 2. In this dielectric layer, l ^} as shown in Figure 8F; laser drilling is used to _ a dielectric layer to the first) 丨 pen layer (2 lb) corresponding to the first, hx a radio The laser micropores (2 4 a) of the micropores (2, as shown in the eighth G diagram; L 2 18 421576 ^ The laser micropores (24b) of the second dielectric layer (2 lb) are plated with conductive metal As shown in the eighth figure, the laser micro-holes (2 4 b) are formed into a hollow or solid metal conductor (2 5b) and connected to the first dielectric layer (2 1 a). (2 5 a); a third η electric layer (2 1) (that is, the uppermost dielectric layer) with a conductive metal film (2 1 0 c) on the top surface of the lamination, and a laser drill is applied thereon Hole-to-laser microvias (2 4 c) are plated with metal conductors (25c) connected to the second dielectric layer (2 1 :) metal conductors (25b), such as the eighth I, eighth J, eighth κ picture; _ Then patterned on the conductive metal film (210C) of the uppermost dielectric layer (2 4 c) by image transfer The dry film (211) is shown in Figure 88. The conductive metal film (2 1 0c) is exposed outside the patterned dry film (2 1 1). Flux layer (2 8), as shown in the eighth M diagram;

剝離覆設於導電金屬膜 ),如第八Ν圖所示;Peeling and covering the conductive metal film), as shown in the eighth N diagram;

Oc)上的乾膜(211 以影像移轉手段於導電金屬 电兔屬膜(2 1 〇c)上蝕刻出圖 案化的金屬線路(2 3# 、匕J j ,如第八〇圖所示; 於介電積層(20)上表 覆一圖案化防焊層(2 6 ), 屬線路(2 3 )形成顯露於防 7 ); 面及金屬線路(2 3 )上塗 如第八P圖所示,並使該金 焊層(2 6 )外的焊墊(2 對金屬散熱片 (1〇)外表面鍍設一可為鎳等之抗氧 19 200421576 化層(1 5) ’如第八Q圖所示;以及 對介電積層(2Q)取位置錢設 〇 )並可容置晶片Γ 9、从日 狀"、、月(1A patterned metal circuit (2 3 #, dagger J j) is etched on the dry film (211) on the conductive metal electric rabbit film (2 10 c) by means of image transfer, as shown in FIG. 80 ; A patterned solder mask (2 6) is coated on the dielectric build-up layer (20), and the metal lines (2 3) are formed to be exposed to the protection 7); the surface and the metal lines (2 3) are coated as shown in the eighth P diagram The outer surface of the gold solder layer (2 6) (2 pairs of metal heat sinks (10) is plated with an anti-oxidation layer that can be nickel or the like. 19 200421576 Chemical layer (1 5) As shown in the Q picture; and the position of the dielectric multilayer (2Q) is set to 0) and the chip Γ can be accommodated. 9, from the state ", month (1

圖所示,於挖槽時,亦可 ^ 々弟八R ΛΙ J進一步洙入散熱片(丄〇 使其形成黏晶凹槽(i 3 ),該黏晶凹槽(" ’ 再沉積一可為黑色氧化 ^可 乳化層之絕緣層(1 4 ),如第八s 所示,而完成該多介電層構裝基板之t造。 圖 刖达之製程步驟中,亦可於最上層介電層之雷射 及其上表面完成錢設導電金屬步驟之後,直接以影 手段於導電金屬膜上㈣出圖案化的金屬線路(圖未 ,接續於介電積層及金屬線路上塗覆—㈣化防焊層不 金屬線路顯露於防焊層外的焊墊上鍍設鎳金合金(N丨/ A u )、 之助焊層,再對金屬散熱片外表面鑛設—可為鎳之抗氧化 層,以及對介電積層挖設晶片容槽等步驟。As shown in the figure, when digging a groove, it is also possible to insert a heat sink (丄 〇 to form a sticky crystal groove (i 3)), and the sticky crystal groove (" ' It can be an insulating layer (1 4) of a black oxide ^ emulsifiable layer, as shown in the eighth s, and complete the fabrication of the multi-dielectric layer structured substrate. In the process steps of Figure 2, it can also be the uppermost layer. After the laser on the dielectric layer and the upper surface finish the step of setting the conductive metal, the patterned metal circuit is directly etched on the conductive metal film by shadowing (not shown, followed by coating on the dielectric layer and metal circuit— 金属The non-metal circuit of the solder mask layer is exposed on the pads outside the solder mask layer, and a nickel-gold alloy (N 丨 / Au), a flux layer is plated, and then the outer surface of the metal heat sink is mined—it can be the oxidation resistance of nickel. Layers, and the steps of digging a wafer cavity for a dielectric build-up.

前揭介電積層為二層介電層組構而成時,係刪除第二 介電層之製程步驟,並於完成第一介電層之雷射鑽孔、兩 射微孔中鍍設金屬導體等製程步驟後,直接於第一介電層 上壓合具導電金屬膜的第三介電層(即最上層介電層)、 雷射鑽孔、雷射微孔中鍍設金屬導體,接續於導電金屬膜 上形成圖案化的乾膜、鍵設助焊層、剝離乾膜、钱刻出圖 案化的金屬線路、塗覆防焊層、於金屬散熱片外表面鍵設 抗氧化層,以及對介電積層挖設深及散熱片的晶片容槽等 後續製程步驟,完成基板製造完成;若該介電積層為三層 以上介電層組構而成時,則反復進行上述第二介電層之製 20 步驟’使其具有 之製程步驟。θ第-…,最後再進行第三介電層 前述製程步驟由 . ^ 之雷射微μΠ::!可於最上層介電積層(2ic) 影像移轉手段於、 設導電金屬步驟之後,直接以 圖未示),:广電金屬膜上蝕刻出圖案化的金屬線路( 焊層,對金屬:於介電積層及金屬線路上塗覆一圖案化防 (ni/au :=顯露於防焊層外的焊塾上錄設錄金合金 氧化層,以及:接續對金屬散熱片外表面鐘設-抗 二及對介電積層挖設晶片容槽等步驟。 前述用於製造具多層介電層之介電積層時,該第— 第二介電層[91、 / 2 1 a } (21b)之各雷射微孔(24a y 24b)鍍設出空心金屬導體(25a) ( 2 5 c 後’先於各金屬導體(2 5 a )( 2 5 b )上以網印或$ 像私轉手段設導電金屬凸塊(圖未示),再進行上-層介 電層的壓合、雷射鑽孔及對雷射微孔鍍設金屬導體 電金屬凸塊。 導 根據前 基板結構, 用0 揭構裝基板之製程設計,將實現本發明之構裝 使其在產業上可被據以實施,並達成預期之功When the front dielectric layer is composed of a two-layer dielectric layer, the process steps of the second dielectric layer are deleted, and metal is plated in the laser drilling of the first dielectric layer and two micro-holes. After the conductor and other process steps, a third dielectric layer (ie, the uppermost dielectric layer) with a conductive metal film, a laser drill hole, and a laser micro-hole are plated with a metal conductor directly on the first dielectric layer. Continue to form a patterned dry film on the conductive metal film, bond a soldering layer, peel off the dry film, cut a patterned metal circuit, coat a solder mask, and bond an anti-oxidation layer on the outer surface of the metal heat sink. And subsequent process steps such as digging the dielectric build-up layer and the heat sink's chip tank to complete the manufacture of the substrate; if the dielectric build-up layer is composed of three or more dielectric layers, the above-mentioned second dielectric layer is repeated. 20 steps of the fabrication of the electrical layer. The θth -..., and finally the third process of the third dielectric layer is performed. The laser micro μΠ ::! of ^ can be directly transferred after the image transfer means of the uppermost dielectric build-up (2ic), and the conductive metal step is set. (Not shown) ,: patterned metal circuits (solder layer, etc.) are etched on the radio and television metal film (for metal: apply a patterned resist on the dielectric build-up layer and the metal circuit (ni / au: = exposed in the solder resist layer) A gold alloy oxide layer is recorded on the outer welding pad, and the steps of setting the clock on the outer surface of the metal heat sink-resistance two and digging the wafer container for the dielectric layer are performed. The foregoing is used for manufacturing a multilayer dielectric layer. When the dielectric is laminated, the laser micro-holes (24a y 24b) of the first-second dielectric layer [91, / 2 1 a} (21b) are plated with a hollow metal conductor (25a) (after 2 5 c ') First, conductive metal bumps (not shown) are set on each metal conductor (2 5 a) (2 5 b) by screen printing or private image transfer, and then the upper-layer dielectric layer is laminated and lasered. Drilling and plating laser conductors with metal conductors and electric metal bumps. Based on the front substrate structure, the process design of the substrate assembly with 0 is used to implement the invention It is structured so that it can be implemented in the industry and achieve the desired results.

綜上所述,本發明經由其創新的構裝基板結構與製程 e又计,確具有高度的產業價值,並可有效克服習用構裳基 板散熱性不佳以及訊號傳輸不良之問題,因此,本發明設 計符合發明專利要件,爰依法具文提出申請。In summary, the invention has a high industrial value through its innovative structure of the substrate structure and manufacturing process, and can effectively overcome the problems of poor heat dissipation and poor signal transmission of conventional substrates. Therefore, the present invention The invention design meets the requirements of the invention patent, and the application is filed according to the law.

21 200421576 【圖式簡單說明】 (一)圖式部分 第一圖係本發 示意圖 月為單一 ’丨電層構造之基板實施例之平面 (代表圖)。 苐一圖係第一圖所+ #私U 々一 斤不之政熱片增設鰭片之實施例圖 第三圖係本發明為多層介 ^ Λ ^ ^ 夕尽;丨包層構造之基板實施例 示意圖。 之平面 第四圖係本發明基板之其他實施例(―)平面示意圖。 第五圖係本發明基板之其他實施例(二)平面示意圖。 弟六圖Α〜Ν係本發明用於製造具單-介電層之基板製造 流程圖。21 200421576 [Brief description of the diagram] (I) Schematic part The first diagram is the schematic diagram of the present invention. The month is a plane (representative diagram) of a single embodiment of a substrate structure with a single electric layer structure.苐 一 图 是 一 图 所 + # 私 U Example of adding fins to a pound of non-government hot film. The third figure is the invention of a multi-layered substrate ^ Λ ^ ^ Xi Jin; 丨 cladding structure of the substrate implementation Example diagram. Plane The fourth figure is a schematic plan view of another embodiment (-) of the substrate of the present invention. The fifth diagram is a schematic plan view of another embodiment (2) of the substrate of the present invention. The six figures A to N are flowcharts of the present invention for manufacturing a substrate with a single-dielectric layer.

第七圖 林專]系本叙月用於製造具多層介電層之基板製造4¾厂 第八圖 _!本發明係本發明用於製造具多層介電層之基 流程圖。 土 (二)元件代表符號 (1 )基板 (3)金屬線 (10)散熱片 (1 2 )黏晶區間 (1 4 )絕緣層 (2 0 )介電積層 (2 1 a)介電層 (2 1 c)介電層 (4 )導電金屬凸塊 (11)鰭片 (1 3 )黏晶凹槽 (15)抗氧化層 (21)介電層 (2 1 b)介電層 (210)導電金屬膜The seventh figure is Lin Zhuan] is a substrate manufacturing process for manufacturing a substrate with multiple dielectric layers in this month. The eighth figure _! The present invention is a flow chart of the present invention for manufacturing a substrate with multiple dielectric layers. Soil (two) component representative symbols (1) substrate (3) metal wire (10) heat sink (1 2) sticky crystal section (1 4) insulating layer (2 0) dielectric build-up layer (2 1 a) dielectric layer ( 2 1 c) Dielectric layer (4) Conductive metal bump (11) Fin (1 3) Sticky crystal groove (15) Anti-oxidation layer (21) Dielectric layer (2 1 b) Dielectric layer (210) Conductive metal film

22 200421576 (2 1 1 )乾膜 (2 2 )晶片容槽 (2 4 )雷射微孔 (2 4 b)雷射微孔 (2 5 )金屬導體 (2 5 b)金屬導體 (2 6 )防焊層 (2 8 )助焊層 (291)導電金屬凸塊 (2 1 2 )介電材 (2 3 )金屬線路 (2 4 a)雷射微孔 (2 4 c)雷射微孔 (2 5 a)金屬導體 (2 5 c)金屬導體 (2 7 )焊墊 (2 9 )金屬導熱體22 200421576 (2 1 1) dry film (2 2) wafer container (2 4) laser micro hole (2 4 b) laser micro hole (2 5) metal conductor (2 5 b) metal conductor (2 6) Solder mask layer (2 8) Flux layer (291) Conductive metal bump (2 1 2) Dielectric material (2 3) Metal circuit (2 4 a) Laser microvia (2 4c) Laser microvia ( 2 5 a) metal conductor (2 5 c) metal conductor (2 7) pad (2 9) metal heat conductor

23twenty three

Claims (1)

200421576 拾、申請專利範圍 ...:乂 、.、讀._:.... 1、 一種具有高散熱性的構裝基板結構,係一作為晶 片載體,作為外部訊號傳輸之媒介,其係由金屬散熱片上 壓合介電積層所構成,該介電積層中設有延伸至散熱片的 晶片容槽,該散熱片具有顯露於晶片容槽底部的黏晶區間 ,提供晶片黏著於其上,該介電積層上表面設有圖案化金 屬線路,並自金屬線路預定接地訊號端設延伸至散熱片的 雷射微孔,該雷射微孔中設有金屬導體,連接於金屬線路 與散熱片之間,該介電積層上表面另設覆蓋於金屬線路上_ 的圖案化防焊層,並使金屬線路形成複數個顯露於防焊層 外的焊墊,構成一可將晶片工作產生的熱及晶片高頻訊^ 傳輸產生的熱散失直接傳導至散熱片發散,並可穩定訊號 傳輸之構裝基板。 2、 如申請專利範圍第丄項所述之具有高散熱性的構 裝基板結構,其中該介電積層為單一介電層所構成。 3、 如申請專利範圍第1項所述之具有高散熱性的構 裝基板結構,其中該介電積層為二層(含)以上的介電層 · 上下組構而成,金屬線路設於最上層介電層上表面,最下 層介電層位於散熱片上,上下介電層各設有雷射微孔,並 於雷射微孔中設有金屬導體,最上層介電層之金屬導體連 接金屬線路預定接地訊號端,最下層介電層之金屬導體連 接散熱片,介於上下介電層的夾層間設有連接上下層金屬 導體的圖案化金屬導熱體,用以將上方的金屬線路預定接 地訊號端連接至下方散熱片。 24 200421576 4、 如申請專利範圍第1項所述之具有高散熱性的構 裝基板結構’其中該介電積層為二層(含)以上介電層上 下組構而成’金屬線路設於最上層介電層上表面,最下層 介電層位於散熱片上,上下介電層各設具金屬導體的雷射 微孔’最上層介電層之金屬導體連接金屬線路預定接地訊 號端’最下層介電層之金屬導體連接散熱片,且上下層雷 射微孔相對應,設於雷射微孔的金屬導體上下直接連接, 用以將上方的金屬線路預定接地訊號端連接至下方散熱片 5、 如申請專利範圍第1項所述之具有高散熱性的構 裝基板結構’其中該介電積層為二層(含)以上介電層上 下組構而成’金屬線路設於最上·層介電層上表面,最下層 介電層位於散熱片上,上下介電層各設具金屬導體的雷射 微孔,最上層介電層之金屬導體連接金屬線路預定接地訊 號端,最下層介電層之金屬導體連接散熱片,且上下層雷 射微孔相對應,上下層雷射微孔中的金屬導體藉導電金屬 凸塊連接,用以將上方的金屬線路預定接地訊號端連接至Φ 下方散熱片。 6、 如申請專利範圍第2、3、4或5項所述之具有 高散熱性的構裝基板結構,其中設於介電層雷射微孔中的 金屬導體為實心體。 7、 如申請專利範圍第2、3、4或5項所述之具有 南散熱性的構裝基板結構,其中設於介電層雷射微孔中的 金屬導體附著於孔壁上的空心薄層。 25 200421576 古8、如申請專利範圍第2、3、4或5項所述之具有 间政熱性的構裝基板結構,#中設於介電積層頂面顯露於 防焊層外的焊塾表面鍍設一助焊層。 ‘古9、如申請專利範圍第2、3、“5項所述之具有 同^熱性的構裝基板結構,纟中金屬散熱片為介電積層之 覆盡部份形成圖案化的鰭片。 1 0、如中請專利範㈣2、3、4或5項所述之呈 有高散熱性的構裝基板結構,其中該金屬散熱片於黏晶區 間處形成黏晶凹槽。200421576 Scope of patent application ...: 乂,., Read ._: .... 1. A structure substrate structure with high heat dissipation, which is used as a chip carrier and as a medium for external signal transmission. It is composed of a laminated dielectric layer on a metal heat sink. The dielectric layer is provided with a wafer container extending to the heat sink. The heat sink has a sticky crystal section exposed at the bottom of the wafer container to provide the wafer to adhere to it. A patterned metal circuit is provided on the upper surface of the dielectric build-up layer, and a laser micro-hole extending from a predetermined ground signal end of the metal circuit to a heat sink is provided. The laser micro-hole has a metal conductor connected to the metal circuit and the heat sink. In between, the upper surface of the dielectric buildup layer is additionally provided with a patterned solder mask layer covering the metal circuit, and the metal circuit is formed into a plurality of solder pads exposed outside the solder mask layer, forming a heat that can be generated by the work of the wafer. And the high-frequency signal of the chip ^ The heat dissipation generated by the transmission is directly transmitted to the heat sink to dissipate, and it can stabilize the signal transmission. 2. The structure substrate structure with high heat dissipation as described in item (1) of the scope of patent application, wherein the dielectric build-up layer is composed of a single dielectric layer. 3. The mounting substrate structure with high heat dissipation as described in item 1 of the scope of the patent application, wherein the dielectric build-up layer is composed of two or more dielectric layers. The upper surface of the upper dielectric layer, the lowermost dielectric layer is located on the heat sink, the upper and lower dielectric layers are provided with laser micro-holes, and metal conductors are provided in the laser micro-holes, and the metal conductor of the uppermost dielectric layer is connected to the metal The metal ground conductor of the bottom dielectric layer is connected to the heat sink, and a patterned metal heat conductor is connected between the upper and lower dielectric layers to connect the upper and lower metal conductors to the upper metal line. The signal end is connected to the lower heat sink. 24 200421576 4. The substrate structure with high heat dissipation as described in item 1 of the scope of the patent application, where the dielectric multilayer is composed of two or more dielectric layers, and the metal circuit is placed at the top. The upper surface of the upper dielectric layer, the lower dielectric layer is located on the heat sink, and the upper and lower dielectric layers are provided with laser conductors with metal conductors. The metal conductors of the upper dielectric layer are connected to the metal line and the ground terminal is the lowest dielectric layer. The metal conductor of the electrical layer is connected to the heat sink, and the upper and lower laser micro-holes correspond to each other. The metal conductors provided in the laser micro-holes are directly connected to the upper and lower layers to connect the predetermined ground signal end of the upper metal line to the lower heat sink. The structure of the mounting substrate structure with high heat dissipation as described in item 1 of the scope of the patent application, wherein the dielectric multilayer is composed of two or more dielectric layers, and the metal circuit is provided at the uppermost layer of the dielectric. The upper surface of the layer, the lowest dielectric layer is located on the heat sink, and the upper and lower dielectric layers are provided with laser micro-holes with metal conductors. The metal conductors of the uppermost dielectric layer are connected to the predetermined ground signal terminal of the metal line. The metal conductor of the lowest dielectric layer is connected to the heat sink, and the upper and lower laser micro holes correspond to each other. The metal conductors in the upper and lower laser micro holes are connected by conductive metal bumps, and are used to connect the upper metal line to a predetermined ground signal. End is connected to the heat sink under Φ. 6. The mounting substrate structure with high heat dissipation as described in item 2, 3, 4 or 5 of the scope of patent application, wherein the metal conductor provided in the dielectric micro-laser is a solid body. 7. The structural substrate structure with south heat dissipation as described in the scope of application for patents No. 2, 3, 4 or 5, wherein the metal conductor provided in the laser micro-hole of the dielectric layer is attached to the hollow thin wall Floor. 25 200421576 Ancient 8. As described in the patent application scope No. 2, 3, 4 or 5 of the structure of the substrate structure with thermal insulation, the # on the top surface of the dielectric build-up exposed solder mask surface Plating a flux layer. 'Ancient 9. As described in the patent application scope Nos. 2, 3, and "5, the structural substrate structure having the same thermal properties, the metal heat sink in the middle of the dielectric layer to form patterned fins. 10. The substrate structure with high heat dissipation performance as described in Chinese Patent Application No. 2, 3, 4 or 5, wherein the metal heat sink forms a sticky crystal groove at the sticky crystal interval. 又口甲睛寻利範圍第丄〇 …一《 π 丄 U ,只"I ;〜为有高勒孰 的構政基板結構’其中該黏晶凹槽表面覆設—絕緣層。 1 2、如中請專利範圍第2、3、4或5項所述之 有高散熱性的構裝基板結構,其中該金屬散 間的表面覆設一絕緣層。 、、月於黏曰曰 如曱晴專利範圍第2 古— 4我5項所述之具 =月=性的構裝基板結構’其中該金屬散熱片為銅(cu )片,其外表面鍍設一層金屬抗氧化層。 1 4、一種具有高散熱性的構裝基板製 括有: 具步驟包 以壓合手段於金屬散熱片上覆設介電積層; 以雷射鑽孔手段於該介電積層上設朝向散熱 片延伸的 對介電積層之雷射微孔鍍設導電金屬 形成金屬導體,連接散熱片; 使雷射微孔内 26 200421576 以影像移轉手段於介電積層上形成圖案化的金屬線路 ,連接雷射微孔内的金屬導體; 於η電積層及金屬線路上塗覆一圖案化防焊層,並使 該金屬線路形成顯露於防焊層外的焊墊;以及 對介電積層預定位置處挖設深及散熱片並可容置晶片 的晶片容槽,完成該構裝基板之製造。 1 5、如申請專利範圍第i 4項所述之具有高散熱性 的構裝基板製程,其中該介電積層係使用一上表面具有導 電金屬膜的單一介電層,並在壓合於散熱片上、雷射鑽孔鲁 及雷射微孔鑛設導電金屬步驟之後,利用影像移轉手段於 導電金屬膜上㈣出圖案化的金屬線路,連接雷射微孔内. 的金屬導體。 1 6、如申請專利範圍第i 4項所述之具有高散熱性 的構裝基板製程,其中該介電積層係依序重複壓合二層( 含)以上介電層’並於每壓合一介電層後,接續施以;射 鑽孔及雷射微孔鍍設導電金屬步驟,再進行下一介電層之 壓合、雷射鑽孔及雷射微孔鍍設導電金屬步驟,使上^介 電層雷射微孔中的金屬導體連接之後,再於最上層介電二 上利用影像移轉手段形成圖案化的金屬線路,連接雷射微 孔内的金屬導體。 1 7、如申請專利範圍第i 6項所述之具有高散孰性 的構裝基板製程’丨中相對於最下層介電層上方之介電層 於雷射鑽孔時’係令其雷射微孔對應於下層介電層的雷身; 微孔’讓雷射微孔於鑛設導電金屬時’該導體金屬直接連 27 200421576 接下層金屬導體。 1 8、如申請專利範圍第1 6項所述之具有高散熱性 的構裝基板製程,纟中相對於最下層介電層上方之介電層 Μ合於下方介電層#’先於該下方介電層的金屬導體上植 設金屬凸塊,再壓合該上層介電層,並令該上層介電層雷 射鑽孔時,雷射微孔對應於下方介電層的雷射微孔’讓雷 射微孔於鑛設導電金屬時,使該電射微孔内的金屬導體透 過導電金屬凸塊連接下層金屬導體。In addition, the range of profitability is 甲 0… π 丄 U, which is only "I; ~ is a government substrate structure with Gao Leyao ', in which the surface of the sticky crystal groove is covered with an insulating layer. 1 2. The substrate structure with high heat dissipation as described in item 2, 3, 4 or 5 of the patent scope of the patent, wherein the surface of the metal powder is covered with an insulating layer. , Yue Yunian said that the range of the 2nd-4th and 5th of the patent scope of the Rongqing patent is that the structure of the substrate with the structure of "month = nature" where the metal heat sink is a copper (cu) sheet, and the outer surface is plated Set up a metal anti-oxidation layer. 14. A structural substrate with high heat dissipation properties includes: a step of overlaying a dielectric build-up layer on a metal heat sink with a pressing method; and a laser drilling method provided on the dielectric build-up layer to extend toward the heat sink The dielectric micro-layered laser micro-holes are plated with conductive metal to form a metal conductor and connected to a heat sink; the laser micro-holes 26 200421576 are used to form a patterned metal circuit on the dielectric multi-layered layer by image transfer to connect the laser A metal conductor in a microhole; coating a patterned solder mask on the η electrode build-up layer and the metal circuit, and forming the metal circuit to form a solder pad exposed outside the solder mask layer; and digging deep at a predetermined position of the dielectric layer And a wafer receiving groove capable of accommodating a wafer with a heat sink and completing the manufacture of the structured substrate. 15. The process for mounting a substrate with high heat dissipation as described in item i 4 of the scope of the patent application, wherein the dielectric build-up uses a single dielectric layer with a conductive metal film on its upper surface and is laminated to the heat dissipation After the conductive metal step is performed on the chip, the laser drill hole, and the laser microhole, the image transfer method is used to punch out a patterned metal circuit on the conductive metal film to connect the metal conductor in the laser microhole. 16. The process of mounting a substrate with high heat dissipation as described in item i 4 of the scope of the patent application, wherein the dielectric build-up layer is sequentially and repeatedly laminated with two or more dielectric layers, and each laminated After a dielectric layer, successively apply; the steps of laser drilling and laser micro-hole plating of conductive metal, and then the next dielectric layer pressing, laser drilling and laser micro-hole plating of conductive metal steps, After the metal conductors in the laser micro-holes in the upper dielectric layer are connected, a patterned metal circuit is formed on the upper dielectric layer 2 using image transfer to connect the metal conductors in the laser micro-holes. 17. As described in item i 6 of the scope of the patent application, the fabrication process of a substrate with high dispersiveness, '丨 the dielectric layer above the lowest dielectric layer is drilled during laser drilling,' which makes it lightning. The micro-holes correspond to the laser body of the lower dielectric layer; the micro-holes 'let the laser micro-holes be used when the conductive metal is laid in the mine'. The conductor metal is directly connected to the lower metal conductor 27 200421576. 18. According to the process of mounting a substrate with high heat dissipation as described in item 16 of the scope of the patent application, the dielectric layer above the lower dielectric layer is combined with the lower dielectric layer # 'before the When metal bumps are planted on the metal conductor of the lower dielectric layer, and then the upper dielectric layer is pressed and the upper dielectric layer is laser-drilled, the laser micro-holes correspond to the laser micro-layers of the lower dielectric layer. Holes allow laser microholes to be used to mine conductive metal, so that the metal conductors in the radioactive microholes are connected to the underlying metal conductor through the conductive metal bumps. 9、如申清專利範圍第j 6項所述之具有高散熱性 的構裝基板製程,丨中相對於最上層介電層下方之介電層 係使用上面具有導電金屬膜的介電層,該介電層於壓合、 雷射鑽孔及雷射微孔鍍設導電金屬後’利用影像移轉手段 蝕刻出圖案化的金屬導熱體,該金屬導熱體連接上下層雷 射微孔内導電金屬間。 2 〇、如申請專利範圍第1 7、丄8或丄g項所述之 具有高散熱性的構裝基板製程,其中該最上層介電層係使 用上表面具有導電金屬膜的介電層,並於該最上層介電層 壓合、雷射鑽孔及雷射微孔鍍設導電金屬步驟之後,利用 衫像移轉手段蝕刻出連接雷射微孔内金屬導體的圖案化金 屬線路,再進行塗覆圖案化防焊層,以及對介電積層挖設 深及散熱片的晶片容槽步驟。 2 1、如申請專利範圍第2 0項所述之具有高散熱性 的構裂基板製程’其中於最上層介電層導電金屬膜上蝕刻 出圖案化金屬線路之步驟前,先以影像移轉手段於介電積 28 200421576 層之導電金屬膜上形成圖牵 恭+A 取Q累化的乾膜;次對導電金屬膜顯 圖案化乾膜外之部份鍍設金屬助焊層,剝離覆設於導 Z屬膜上的乾膜,再以影像移轉手段於導電金屬膜上钱 刻出圖案化的金屬線路。 22、如巾請專利範圍第2q項所述之具有高散熱性 勺構裝基板製程’其中於最卜屏 r%取上層介電層及金屬線路上塗覆 圖案化防焊層之後,以雷供主抓^ ^ & 電鏟手^又於焊墊上鍍設金屬助焊層 〇 2 3、如申請專利範圍帛工4項所述之具有高散熱性 的構裝基板製程’丨中該金屬散熱片於壓合介電積層之前 ,於其上表面以影像移轉手段形成圖案化的鰭片。 2 4、如申請專利範圍第2 4項所述之具有高散熱性 的構裝基板製程’纟中,使用銅板作為金屬散熱片,並於 4金屬散熱片壓合介電積層之後,於其外表面鍍設一抗氧 化層。 2 5、如申睛專利範圍第1 4項所述之具有高散熱性 的構裝基板製程,其中,對介電積層挖設深及散熱片之晶 片容槽之後,可對散熱片顯露於晶片容槽底部的黏晶區間 沉積一絕緣層。 2 6、如申請專利範圍第1 4項所述之具有高散熱性 的構裝基板製程,其中,對介電積層挖設深及散熱片曰 日日 片容槽時,進一步深入散熱片,使其形成黏晶區間形成一 黏晶凹槽。 2 7、如申請專利範圍第2 6項所述之具有高散熱性 200421576 的構裝基板製程,其中,該黏晶凹槽表面沉積一絕緣層 拾壹、圖式 如次頁9. As described in claim 6 of the patent application for a substrate manufacturing process with high heat dissipation, the dielectric layer below the uppermost dielectric layer uses a dielectric layer with a conductive metal film on it. After the dielectric layer is laminated with a conductive metal by lamination, laser drilling, and laser micro-holes, a patterned metal thermal conductor is etched by means of image transfer. The metal thermal conductor is connected to the upper and lower laser micro-holes to conduct electricity. Metal room. 20. The process of mounting a substrate with high heat dissipation as described in item 17, 7, 8 or 8g of the scope of patent application, wherein the uppermost dielectric layer is a dielectric layer having a conductive metal film on the upper surface, After the steps of the uppermost layer of dielectric lamination, laser drilling and laser micro-hole plating of conductive metal, the patterned metal circuit connecting the metal conductors inside the laser micro-holes is etched by means of shirt image transfer, and then Wafer steps of applying a patterned solder mask and digging deep and heat sinks of the dielectric build-up layer are performed. 2 1. According to the process of framing substrate with high heat dissipation described in item 20 of the scope of the patent application, in which the patterned metal circuit is etched on the conductive metal film of the uppermost dielectric layer, the image is transferred first. Means to form a dry film on the conductive metal film with a dielectric layer 28 200421576 layer + A and take a Q accumulation; dry the conductive metal film with a patterned metal film and peel off the coating The dry film is set on the conductive Z-type film, and then patterned metal lines are engraved on the conductive metal film by means of image transfer. 22. As described in the item 2q of the patent application, a process for fabricating a substrate with a high heat dissipation spoon, wherein the upper dielectric layer and the metal circuit are coated with a patterned solder mask layer at r% of the screen, and then supplied with lightning. The main grasp ^ ^ & electric shovel ^ and a metal soldering layer is plated on the pad 0 2 3, as described in the patent application scope of the 4th process with a high heat dissipation structure of the substrate manufacturing process' 丨 the metal heat dissipation Before laminating the dielectric laminated layer, a patterned fin is formed on the upper surface by means of image transfer. 24. As described in item 24 of the scope of the patent application, a process for mounting a substrate with high heat dissipation is used. A copper plate is used as a metal heat sink, and the dielectric metal laminate is laminated on the 4 metal heat sink, and outside it. An anti-oxidation layer is plated on the surface. 25. The process of mounting a substrate with high heat dissipation as described in item 14 of the patent scope of Shenjing, wherein after the deep layer and the heat sink's wafer container are dug into the dielectric laminate, the heat sink can be exposed on the wafer An insulating layer is deposited in the sticky crystal interval at the bottom of the tank. 26. The process of mounting a substrate with high heat dissipation as described in item 14 of the scope of patent application, wherein when the dielectric buildup is dug deep and the heat sink is sunk, the heat sink is further penetrated, so that It forms a sticky crystal groove to form a sticky crystal groove. 27. The process of mounting a substrate with high heat dissipation performance as described in item 26 of the patent application No. 26, 21,621,576, in which an insulating layer is deposited on the surface of the sticky crystal groove.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI404495B (en) * 2010-06-29 2013-08-01 Univ Nat Pingtung Sci & Tech Method for forming circuit patterns on substrate
US9185792B2 (en) 2012-12-14 2015-11-10 Mutual-Tek Industries Co. Ltd. Package substrate and electronic assembly

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI299554B (en) 2006-06-21 2008-08-01 Advanced Semiconductor Eng Substrate structure and method for manufacturing the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI404495B (en) * 2010-06-29 2013-08-01 Univ Nat Pingtung Sci & Tech Method for forming circuit patterns on substrate
US9185792B2 (en) 2012-12-14 2015-11-10 Mutual-Tek Industries Co. Ltd. Package substrate and electronic assembly

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