SU805316A1 - Programme-control device - Google Patents

Description

one

The invention relates to computing, in particular, to software control systems.

A device is known for monitoring the number of LeVy objects, which makes it possible to carry out a test check of an object by comparing the results of diagnostics of the controlled and reference objects.

The disadvantage of this device is the lack of control of the functioning of the control device, as well as the use of pseudo-random tests only for the purpose of diagnostics, which eliminates directed troubleshooting.

The closest to the invention is a device comprising an input unit, a control unit, a test generation unit, a measurement unit, an operation unit, a switch, a registration unit, a synchronization unit, 6JXOK comparison unit and a program control unit, the input and output of the input unit connected respectively to the first the output and input of the control unit, the second output of which is connected to the input of the test generation block:, with the first inputs of the operating unit, the measurement unit, the switch

the second input of the switch is connected to the output of the monitored unit, and the first output of the switch is connected to the second inputs of the operational unit and the measurement unit, the first output of which is connected to the third input of the operational unit, the first output of the test generation unit is connected to the input of the monitored unit, the second output

0 of the control unit is connected respectively to the first input of the program control unit, to the input of the comparison unit, the output of which is connected to the first input of the synchronization unit, the second,

5 the third and fourth inputs of which are connected respectively with the first output of the measuring unit, with the first output of the recording unit, with the first output of the operating unit, and the first, second and third outputs of the unit

synchronization is connected respectively with the second input of the control unit, with the first input of the registration unit, with the fourth input of the operation unit, the second input of the program control unit is connected to the third output of the control unit, with the second output of the registration unit, with the second output of the operation unit, with the second output of the measurement unit , with the second output of the test generation unit, with the second output of the switch, with the fourth output of the synchronization unit, the output of the program control unit is connected to the third output of the measurement unit 2 y.

The drawback of the device is the low level of confidence in monitoring the device as a whole, since only the input parity program is monitored and the operation of individual units in their interconnection is not checked.

The purpose of the invention is to increase the reliability of the control.

The goal is achieved by the fact that a device containing a control unit, a measurement unit, a switch, a test generation unit, a fault localization unit, a registration unit, the first output of the control unit is connected to the first inputs of the test generation and registration units, and the second output is the first inputs of the fault localization unit and the switch, the second input of the switch is connected to the input of receiving the device tests, and the output of the switch is connected to the input of the measuring unit, the first, second and third outputs of which are connected to The third inputs of the fault localization, registration and test generation modules, respectively, the third input of the test generation block is connected to the first output of the localization block of malfunctions, and its output is connected to the output of the test device, the third output of the localization block of malfunctions is connected to the third input of the registration block, the power supply control unit is entered voltages, decoder address of the test test, the control test memory block, test test driver, stimulus signal storage unit, sig driver Start, the first input of the power supply control unit is connected to the input of the supply voltage of the device, the second input - to the third output, the control unit, the first output to the third input of the test generation unit, and the second output - to the fourth input of the registration unit, the fifth input of which is connected to the third input of the fault localization unit and the test reception input of the device; the output of the test generation unit is connected to the input of the decoder address of the control test, the output of which is connected to the memory block of control tests, the output of which is connected to the first input of the test test generator, the second input of which is connected to the first input of the Start signal generator and the fourth output of the measuring unit, the third clock to the second input of the Start signal generator and the second output of the control unit, and the output to the third input of the switch, the input of the memory block of stimulating signals is connected to the output of the localization block of malfunctions and the signal output of the device, and the output is connected to the third input of the Trigger signal generator, the fourth input of which is connected to the third output of the fault localization unit, and the output - with the fourth input of the test generation unit.

The drawing shows the block diagram of the device.

The device contains a control unit 1, a power supply control unit 2, consisting of 3 comparisons and a reference voltage driver 4, a switch 5, a measurement unit 6 consisting of a test information analysis node 7 and a test information tolerance memory, a block 9 test generation unit, fault localization unit 10, consisting of receiving register 11 test information, comparison node 12, fault decoder 13, memory of 14 subroutines and control tests, synchronization and control node 15, stimulating generation and issuing node 16 signals, a self-monitoring module 17, consisting of a decoder 18 of the test test address, a control test memory block 19, a test control generator 20, a stimulation signal block 2-1, a trigger signal generator 22, a recording unit 23 containing memory 24 results of the control unit 25 receiving and converting test information, indicator 26.

The control unit 1 sets to the switch 5, the synchronization and control unit 15, the test test driver 20 and the signal driver 22 Starting either the operating mode or the self-control mode, controls the test generation unit 9 and the indicator 26, as well as through the unit 2 of the supply voltage monitoring performs the launch of the monitoring program.

Comparison node 2 compares the value of the supply voltages postpone from the test object with the reference voltage produced by the driver 4 of the reference voltages.

The switch 5 receives the test information either from the control object or from the self-monitoring module 17 and transmits it for analysis to the unit b of measurements.

The test information analysis node 7 serves for analyzing and comparing test information from the switch 5 and from the memory 8 of the test information monitoring tolerances. Depending on the results of the analysis and comparison of the test information analysis node 7, a command on positive or negative outcome of the control is stored on the memory 24, and, in case of a negative outcome, it starts the synchronization and control node 15 and writes the number of the subroutine in the memory 14 of the subroutines and control tests.

The memory 8 tolerances for the control of test information serves to store the values of the tolerances for the control of test information.

The test generation block 9 is used to form control tests for the commands from the test information analysis node 7, from the control block 1, from the comparison node 3 and from the test run block 22. Test kits are supplied to the control object and to the decoder 18 of the reference test address of the self-checking module 17.

The receiving register 11 of test information receives test information from the control object and transmits it to the comparison node 12.

Comparison node 12 compares the test information from the receiving register 11 of the test information with the control test supplied from the memory of 14 subroutines and control tests.

The decoder 13 failures is used to determine the number of the failed block of the test object, depending on the number of subroutines and the result of the comparison of test information with the control.

The synchronization and control unit 15 synchronizes the operation of the fault localization unit 10, and also gives control commands to the stimulating signal generation unit 16 and to the test generation unit 9.

The node 16 of forming and stimulating the signals on commands from the node 15 of synchronization and control generates the necessary stimulating signals, which are given to the object of control and to the module 17 self-monitoring.

The stimulation test receiving unit 18 of the self control module 17 is used to receive the stimulation test and decrypt the address, which in the test test memory block 19 selects a specific counter-test.

Block 19 of the memory of control tests serves to store control tests.

The forwarder 20 control tests serves to issue control tests to the switch 5 in the self-monitoring mode.

Block 2 of the memory of stimulating signals. serves to store stimulation signals from the node 16 for generating and outputting stimulation signals.

The signal generator 22 is used to form a Run command in a self-monitoring mode in the case of the presence of commands from the stimulating signal storage unit 21, from the test information analysis node 7 and from the decoder 13 of the failures.

The KOtiTrol result memory node 24 serves to store data from the test information analysis node 7 and from the decoder 13 faults.

The test information receiving and converting unit 25 serves to receive, store and convert test information from the control object.

Indicator 26 is used to display information coming from or from the control results memory node 24.

5 or from the unit 22 receiving and converting test information depending on the set operating mode.

The device works as follows.

0

In the automatic mode of checking the operability of the test object, the command from the control unit 1 controls the power supply control unit 2 to check the power supply voltage of the control object in the case of

5 their health issues a command on the test generation block 9, which forms and stimulates the test into the control object. In response, a control test is sent from the control object through the switch 5 to the test information analysis node 7, where it is compared with the codes received from the memory 8 tolerances for the control of test information.

five

When the test test information corresponds to the established tolerances, the test information analysis node 7 issues a command to the memory of 8 test information control tolerances and

0 block 9 test generation. At the same time, at the output of the memory 8 tolerances of the test information control, new values of the test inspection tolerances are set. information, and block 9 test generation entails the next program

5 stimulating test on the object of control, etc. At the end of the control program, the test information analysis node 7 through the memory of 24 control results is displayed on the indicator

0 26 scoreboard valid.

If the test information does not match the established tolerance, the test information analysis node 7 via the memory 24 of the control results issues the Failure indicator 26, and also launches one of the failure localization routines by issuing a command to the subprogram memory and control tests on the node 14, according to which he remembers the number

0 subroutines, and to the control synchronization node 15, which through the node 16 of generating and issuing stimulating signals carries out stimulating signals, and through block 9

five

test generation - stimulating tests on the object of control. The test information from X-step is received by the test-information register 11, and from it is fed to the first input of the comparison node 12, to the second input of which a control test is received from the memory 14 of the subroutines and control tests. The result of the comparison from the comparison node 12 and the number of the subroutine from the memory 15 of the subroutines and control tests are sent to the fault decoder 13, at the output of which the number of the control object that failed in the block is decoded, which is then displayed on the indicator 26 through the memory 24 of the results.

In this case, if at least one of the channels of the power source of the control object is faulty, the power control unit 2 through the control results memory issues the Failure command to the indicator 26, and the power supply unit number of the control object is also displayed.

The sam1control mode is also automatic and is carried out before each measurement of the parameters of the control object. Incentive tests from test generation block 9 are issued to the decoder 18 addresses of the test test, which, after decryption, submits. to block 19 of the memory of control tests, a command to select {4y the corresponding control test. The selected control test through the driver of the control test 20 is fed to the switch 5. Further operation of the unit 6 measurements is similar to the operation in the automatic mode of checking the operability of the test object.

In order to ensure the self-checking of the fault localization unit 10 at the end of the control program, the test information analysis node 7 restarts it, and a command is sent to the control test generator 20 and the Start signal generator 29. For this co-operation, the control test driver 20 starts generating false control tests, and the signal driver 22 Starting if the command from the decoder 13 fails matches the command from the stimulation memory 21, it generates a command to start the test generation unit 9.

When the monitoring program is re-terminated, the test information analysis node 7 via the memory 24 of the monitoring results issues the Goden command to the indicator 26, which indicates that the device is working.

In the event of a failure of one of the device blocks, the monitoring program is interrupted, the test information analysis node 7 does not generate the Fit command, and the memory of 24 results

The control displays on the indicator 26 a Failure command indicating the program control area at which the stop has occurred.

The device also allows selectively checking the object of control at any part of the program in non-automatic mode of operation. At the control unit 1, the selected program section is installed, while the test generation unit 9 generates the same stimulating test corresponding to the selected program section, and the test information from the control object through the test information receiving and conversion unit 25 is displayed on the indicator 26

From reviewing the operation of the device, it can be seen that self-checking is carried out by simulating an automatic mode of testing the performance of the control object. In this case, the stimulating tests from the dough generation unit 9 are provided to the decoder 18 of the control test address of the self-checking module 17. The test information to the switch 5 is removed from the driver 20 of the control test stimulating. the signals from the node 16 for generating and outputting stimulating signals are stored in the block 21 of the memory of the stimulating signals, and the numbers of the failed blocks are sent to the shaper 22 of the Start signal, the introduction of the supply voltage into the device of the control unit 2 allows the control supply voltage of the control object to be automatically controlled before the start control programs

Thus, the task of increasing the reliability of control is solved by the introduction of a self-control module by the unit. These blocks allow you to test the operation of the device itself with the full program before starting an object check. Comparative tests of the proposed device with the known showed that the instrumental error is reduced by 8-10 times, and the instrumental reliability of the control increases from 0.925 to 0.993. The introduction of a power supply control unit also increases the overall reliability of the control.

Claims (2)

Invention Formula A device for software control containing a control unit, a measurement unit, a switch, a test generation unit, a fault localization unit, a registration unit, the first output of the control unit being connected to the first inputs of the test generation and recording units, and the second output to the first inputs of the fault localization unit and a switch, the second input of the switch is connected to the test input of the device, and the switch output is connected to the input of the measuring unit, the first, second and third outputs of which are connected to the second inputs Fault localization, registration and test generation units, respectively, the third input of the test generation unit is connected to the first output of the localization unit, malfunctions, and its output is connected to the output of the device test output, the third output of the fault localization unit is connected to the third input of the registration unit, different from that, in order to increase the reliability of the control, a power supply control block, a test test address decoder, a control test memory block, a test test driver, a block the memory of stimulating signals, the Trigger signal shaper, the first input of the supply voltage monitoring unit connected to the input of the supply voltage of the device, the second input to the third output of the control unit, the first output to the third input of the test generation unit, and the second output to the fourth input of the registration unit, the fifth input of which is connected to the third input of the malfunction localization unit and the device test input, the output of the test generation unit is connected to the input of the decoder address of the control test, the output of which It is connected to the control test memory block, the output of which is connected to the first input of the driver test, the second input of which is connected to the first input, the Start signal generator and the fourth output of the measurement unit, the third input to the second Start signal generator input and the second output block control, and the output is connected to the third input of the switch, the input of the memory block of stimulating signals is connected to the output of the fault localization unit and the signal output of the device, and the output to the third input of the driver Starting signal, a fourth input coupled to a third output unit fault localization, and output - with a fourth input test generation unit. Sources of information taken into account in the examination 1. USSR author's certificate number 546888, cl. G About F 11/00, 1974. 2. USSR author's certificate number 559239, cl. G 06 F-11/00, 1975 (prototype).