SU1177735A1 - Method of producing standards for flaw detection - Google Patents
Method of producing standards for flaw detection Download PDFInfo
- Publication number
- SU1177735A1 SU1177735A1 SU843709767A SU3709767A SU1177735A1 SU 1177735 A1 SU1177735 A1 SU 1177735A1 SU 843709767 A SU843709767 A SU 843709767A SU 3709767 A SU3709767 A SU 3709767A SU 1177735 A1 SU1177735 A1 SU 1177735A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- order
- plate
- radially oriented
- obtain radially
- patterns
- Prior art date
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- Solid-Phase Diffusion Into Metallic Material Surfaces (AREA)
Abstract
СПОСОБ ИЗГОТОВЛЕНИЯ ЭТАЛОНОВ ДЛЯ ДЕФЕКТОСКОПИИ, заключающийс в том, что эталон изготавливают в виде пластины, азотированной на заданную глубину, и изгибают его на матрице с помощью пуансона, вызьгоа по вление трещин в азотированном слое, отличающийс тем, что, с целью получени радиально направленных микротрещин перед азотированием в центре пластины выполн ют отверстие, площадь которого относитс к площади пластины как 1:30. (Л 41 со елTHE METHOD OF MAKING STANDARDS FOR DEFECTOSCY, which consists in making the standard in the form of a plate nitrated to a predetermined depth, and bending it on the matrix using a punch, producing cracks in the nitrided layer, different from that, in order to obtain radially oriented patterns, in order to obtain radially oriented patterns, in order to obtain radially oriented patterns, in order to obtain radially oriented patterns, in order to obtain radially oriented patterns, in order to obtain radially oriented patterns, in order to obtain radially distorted patterns, in order to obtain radially oriented patterns. Before nitriding, a hole is made in the center of the plate, the area of which refers to the area of the plate as 1:30. (L 41 coined
Description
1one
Изобретение относитс к области неразрушающего контрол качества материалов и изделий и предназначено дл метрологического обеспечени дефектоскопической аппаратзтзы, а именно дл вы влени поверхностных дефектов в капилл рной и магнитнопорошковой дефектоскопии с помощью эталонов.The invention relates to the field of non-destructive quality control of materials and products and is intended for the metrological assurance of the flaw detection apparatus, namely, for the detection of surface defects in capillary and magnetic particle flaw detection using standards.
Цель изобретени - получение радиально направленных микротрещин.The purpose of the invention is to obtain radially directed microcracks.
На чертеже представлена схема осуществлени способа.The drawing shows the implementation of the method.
Схема содержит эталон, выполненньй в виде пластины 1 с отверстием 2 в центре и азотированным слоем 3, матрицу 4 пуансон 5.The scheme contains a standard, made in the form of a plate 1 with a hole 2 in the center and nitrated layer 3, a die 4, a punch 5.
11777351177735
Способ осуществл етс следующим образом.The method is carried out as follows.
В центре пластины 1 высверливают отверстие 2, площадь которого относитс к площади пластины 1 как 1:30. При нарушении указанного соотношени площадей отверсти и пластины направленность трещин измен етс . Затем пластину азотируют на определенную глубину (слой 3) дл стабилизации глубины трещин и помещают на матрицу 4.In the center of the plate 1, a hole 2 is drilled, the area of which refers to the area of the plate 1 as 1:30. If this ratio of the hole and plate areas is violated, the direction of the cracks changes. Then the plate is nitrated to a certain depth (layer 3) to stabilize the depth of the cracks and placed on the matrix 4.
К пуансону 5 прикладывают определенное усилие Р, в результате чего на пластине 1 вокруг отверсти 2 в азотированном слое 3 по вл ютс микротрещины, имеющие радиальные направлени .A certain force P is applied to the punch 5, as a result of which on the plate 1 around the hole 2 in the nitrided layer 3 there appear microcracks having radial directions.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU843709767A SU1177735A1 (en) | 1984-02-12 | 1984-02-12 | Method of producing standards for flaw detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU843709767A SU1177735A1 (en) | 1984-02-12 | 1984-02-12 | Method of producing standards for flaw detection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU1177735A1 true SU1177735A1 (en) | 1985-09-07 |
Family
ID=21106993
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU843709767A SU1177735A1 (en) | 1984-02-12 | 1984-02-12 | Method of producing standards for flaw detection |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU1177735A1 (en) |
-
1984
- 1984-02-12 SU SU843709767A patent/SU1177735A1/en active
Non-Patent Citations (1)
| Title |
|---|
| Авторское свидетельство СССР №266331, кл. G 01 N 27/84, 1968. 1С.... . * |
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