SG71724A1 - Bump bonder - Google Patents
Bump bonderInfo
- Publication number
- SG71724A1 SG71724A1 SG1997003555A SG1997003555A SG71724A1 SG 71724 A1 SG71724 A1 SG 71724A1 SG 1997003555 A SG1997003555 A SG 1997003555A SG 1997003555 A SG1997003555 A SG 1997003555A SG 71724 A1 SG71724 A1 SG 71724A1
- Authority
- SG
- Singapore
- Prior art keywords
- bonding
- discard
- bump
- chip
- bump formation
- Prior art date
Links
- 230000015572 biosynthetic process Effects 0.000 abstract 2
- 238000010276 construction Methods 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/002—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating specially adapted for particular articles or work
- B23K20/004—Wire welding
- B23K20/005—Capillary welding
- B23K20/007—Ball bonding
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
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- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
- H01L2224/1134—Stud bumping, i.e. using a wire-bonding apparatus
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- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/13144—Gold [Au] as principal constituent
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- H01L2224/85045—Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball" using a corona discharge, e.g. electronic flame off [EFO]
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25522096A JP3425510B2 (ja) | 1996-09-27 | 1996-09-27 | バンプボンダー形成方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG71724A1 true SG71724A1 (en) | 2000-04-18 |
Family
ID=17275700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1997003555A SG71724A1 (en) | 1996-09-27 | 1997-09-25 | Bump bonder |
Country Status (5)
Country | Link |
---|---|
US (1) | US5899375A (ja) |
JP (1) | JP3425510B2 (ja) |
KR (1) | KR100459602B1 (ja) |
SG (1) | SG71724A1 (ja) |
TW (1) | TW392259B (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6815836B2 (en) * | 2003-03-24 | 2004-11-09 | Texas Instruments Incorporated | Wire bonding for thin semiconductor package |
TWI343611B (en) * | 2007-06-08 | 2011-06-11 | Orient Semiconductor Elect Ltd | Semiconductor package and method for discharging electronic devices on a substrate |
US7918378B1 (en) * | 2010-08-06 | 2011-04-05 | National Semiconductor Corporation | Wire bonding deflector for a wire bonder |
JP5734236B2 (ja) * | 2011-05-17 | 2015-06-17 | 株式会社新川 | ワイヤボンディング装置及びボンディング方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4705204A (en) * | 1985-03-01 | 1987-11-10 | Mitsubishi Denki Kabushiki Kaisha | Method of ball forming for wire bonding |
US5037023A (en) * | 1988-11-28 | 1991-08-06 | Hitachi, Ltd. | Method and apparatus for wire bonding |
US5172851A (en) * | 1990-09-20 | 1992-12-22 | Matsushita Electronics Corporation | Method of forming a bump electrode and manufacturing a resin-encapsulated semiconductor device |
JP2852134B2 (ja) * | 1991-02-20 | 1999-01-27 | 日本電気株式会社 | バンプ形成方法 |
FR2696279B1 (fr) * | 1992-09-25 | 1994-11-18 | Thomson Csf | Procédé pour permettre le montage d'une puce sur un substrat et puce préparée selon le procédé. |
US5601740A (en) * | 1993-11-16 | 1997-02-11 | Formfactor, Inc. | Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires |
US5813115A (en) * | 1994-08-03 | 1998-09-29 | Matsushita Electric Industrial Co., Ltd. | Method of mounting a semiconductor chip on a wiring substrate |
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1996
- 1996-09-27 JP JP25522096A patent/JP3425510B2/ja not_active Expired - Fee Related
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1997
- 1997-09-24 US US08/936,616 patent/US5899375A/en not_active Expired - Lifetime
- 1997-09-24 TW TW086113882A patent/TW392259B/zh not_active IP Right Cessation
- 1997-09-25 SG SG1997003555A patent/SG71724A1/en unknown
- 1997-09-26 KR KR1019970049225A patent/KR100459602B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US5899375A (en) | 1999-05-04 |
TW392259B (en) | 2000-06-01 |
KR100459602B1 (ko) | 2005-02-05 |
JPH10107074A (ja) | 1998-04-24 |
KR19980025053A (ko) | 1998-07-06 |
JP3425510B2 (ja) | 2003-07-14 |
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