SG60493G - Solution monitoring procedure - Google Patents

Solution monitoring procedure

Info

Publication number
SG60493G
SG60493G SG604/93A SG60493A SG60493G SG 60493 G SG60493 G SG 60493G SG 604/93 A SG604/93 A SG 604/93A SG 60493 A SG60493 A SG 60493A SG 60493 G SG60493 G SG 60493G
Authority
SG
Singapore
Prior art keywords
monitoring procedure
solution monitoring
solution
procedure
monitoring
Prior art date
Application number
SG604/93A
Other languages
English (en)
Original Assignee
American Telephone & Telegraph
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone & Telegraph filed Critical American Telephone & Telegraph
Publication of SG60493G publication Critical patent/SG60493G/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SG604/93A 1987-03-23 1993-05-07 Solution monitoring procedure SG60493G (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/029,040 US4844608A (en) 1987-03-23 1987-03-23 Solution monitoring procedure

Publications (1)

Publication Number Publication Date
SG60493G true SG60493G (en) 1993-07-09

Family

ID=21846900

Family Applications (1)

Application Number Title Priority Date Filing Date
SG604/93A SG60493G (en) 1987-03-23 1993-05-07 Solution monitoring procedure

Country Status (8)

Country Link
US (1) US4844608A (ja)
EP (1) EP0284270B1 (ja)
JP (1) JPH0621872B2 (ja)
KR (1) KR960016333B1 (ja)
CA (1) CA1321485C (ja)
DE (1) DE3876660T2 (ja)
HK (1) HK17694A (ja)
SG (1) SG60493G (ja)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI96451C (fi) * 1993-09-07 1996-06-25 Janesko Oy Refraktometri
USH1470H (en) * 1994-03-28 1995-08-01 Ewing Kenneth J Refractive index-based sensor for the discrimination of chlorinated hydrocarbons from groundwater
US7016026B2 (en) * 2002-04-10 2006-03-21 Baker Hughes Incorporated Method and apparatus for a downhole refractometer and attenuated reflectance spectrometer
JP2004150923A (ja) * 2002-10-30 2004-05-27 Atago:Kk 屈折計
US7375813B2 (en) * 2004-10-21 2008-05-20 Eastman Kodak Company Method and system for diffusion attenuated total reflection based concentration sensing
US7456942B1 (en) 2006-10-17 2008-11-25 Curley Michael J Dynamic refractometer
US7852468B2 (en) * 2007-12-14 2010-12-14 Baker Hughes Incorporated Fiber optic refractometer
US7969571B2 (en) * 2009-01-15 2011-06-28 Baker Hughes Incorporated Evanescent wave downhole fiber optic spectrometer
JP2010261793A (ja) * 2009-05-01 2010-11-18 Kurabo Ind Ltd 液体中の溶存物質含有量測定方法及び測定装置、並びに、エッチング液再生システム
JP4889772B2 (ja) * 2009-09-18 2012-03-07 株式会社アタゴ 屈折計
US20130135608A1 (en) * 2011-11-30 2013-05-30 Reflectronics, Inc. Apparatus and method for improved processing of food products
FI127243B (fi) * 2014-05-13 2018-02-15 Janesko Oy Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi
DE102016120377A1 (de) * 2016-10-25 2018-04-26 Anton Paar Optotec Gmbh Refraktometer und Verfahren zur Ermittlung dynamischer Eigenschaften einer Probe
WO2019180694A1 (en) * 2018-03-19 2019-09-26 Valiber Ltd. Portable refractometer

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3435209A (en) * 1966-03-10 1969-03-25 Beckman Instruments Inc Two wavelength infrared analyzer having a pair of variable interference filters for determining the respective wavelengths
CH504683A (de) * 1969-05-13 1971-03-15 Bayer Ag Verfahren und Einrichtung zur Messung des Brechungsindex von Flüssigkeiten
US4451147A (en) * 1981-08-31 1984-05-29 Karel Dobes Refractometer
US4597988A (en) * 1983-06-06 1986-07-01 Macdermid, Incorporated Process for preparing printed circuit board thru-holes

Also Published As

Publication number Publication date
EP0284270A2 (en) 1988-09-28
KR960016333B1 (ko) 1996-12-09
HK17694A (en) 1994-03-11
JPH0621872B2 (ja) 1994-03-23
DE3876660T2 (de) 1993-06-03
JPS63253239A (ja) 1988-10-20
CA1321485C (en) 1993-08-24
EP0284270A3 (en) 1990-01-03
DE3876660D1 (de) 1993-01-28
KR880011587A (ko) 1988-10-29
EP0284270B1 (en) 1992-12-16
US4844608A (en) 1989-07-04

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