SG53109A1 - Method and apparatus for reducing disturbances on an integrated circuit - Google Patents

Method and apparatus for reducing disturbances on an integrated circuit

Info

Publication number
SG53109A1
SG53109A1 SG1997003781A SG1997003781A SG53109A1 SG 53109 A1 SG53109 A1 SG 53109A1 SG 1997003781 A SG1997003781 A SG 1997003781A SG 1997003781 A SG1997003781 A SG 1997003781A SG 53109 A1 SG53109 A1 SG 53109A1
Authority
SG
Singapore
Prior art keywords
integrated circuit
reducing disturbances
disturbances
reducing
integrated
Prior art date
Application number
SG1997003781A
Other languages
English (en)
Inventor
Moises Cases
Leon L Wu
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of SG53109A1 publication Critical patent/SG53109A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Power Conversion In General (AREA)
  • Electronic Switches (AREA)
SG1997003781A 1996-11-18 1997-10-17 Method and apparatus for reducing disturbances on an integrated circuit SG53109A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/746,950 US5828259A (en) 1996-11-18 1996-11-18 Method and apparatus for reducing disturbances on an integrated circuit

Publications (1)

Publication Number Publication Date
SG53109A1 true SG53109A1 (en) 1998-09-28

Family

ID=25003028

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997003781A SG53109A1 (en) 1996-11-18 1997-10-17 Method and apparatus for reducing disturbances on an integrated circuit

Country Status (4)

Country Link
US (1) US5828259A (ko)
KR (1) KR100282380B1 (ko)
MY (1) MY115559A (ko)
SG (1) SG53109A1 (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6084464A (en) * 1999-10-29 2000-07-04 Vlsi Technology, Inc On-chip decoupling capacitor system with parallel fuse
US6437594B1 (en) 2000-03-17 2002-08-20 International Business Machines Corporation SOI pass gate leakage monitor
US6510033B1 (en) * 2000-06-30 2003-01-21 Intel Corporation RC-timer circuit to reduce current leakage in future semiconductor processes
US20030103301A1 (en) * 2001-12-03 2003-06-05 Fechner Paul S. On chip smart capacitors
US20030140411A1 (en) * 2002-01-30 2003-07-31 Belford Gary P. Arm rest massage feature for whirlpool tubs
FR2841058A1 (fr) * 2002-06-14 2003-12-19 St Microelectronics Sa Dispositif electrique comprenant deux supports et une borne de connexion reliee a un condensateur serie et a un limiteur de tension
US6844771B1 (en) * 2003-09-25 2005-01-18 Taiwan Semiconductor Manufacturing Co. Self-leakage detection circuit of decoupling capacitor in MOS technology
US7495878B2 (en) * 2007-03-22 2009-02-24 Bae Systems Information And Electronic Systems Integration Inc. Decoupling capacitor control circuit and method for enhanced ESD performance
US7750511B2 (en) * 2007-04-10 2010-07-06 International Business Machines Corporation Method and apparatus for self-contained automatic decoupling capacitor switch-out in integrated circuits
US20090040857A1 (en) * 2007-08-08 2009-02-12 Mcneil Grant Integrated circuit including decoupling capacitors that can be disabled
US9166560B2 (en) * 2011-11-14 2015-10-20 Nec Corporation Decoupling circuit and semiconductor integrated circuit
TWI757020B (zh) * 2020-12-31 2022-03-01 瑞昱半導體股份有限公司 去耦合電容的漏電流阻擋電路和漏電流阻擋方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3772097A (en) * 1967-05-09 1973-11-13 Motorola Inc Epitaxial method for the fabrication of a distributed semiconductor power supply containing a decoupling capacitor
NL6808352A (ko) * 1968-06-14 1969-12-16
US3657602A (en) * 1971-04-05 1972-04-18 Inductotherm Corp Method and means for detecting incipient capacitor failure
US4427457A (en) * 1981-04-07 1984-01-24 Oregon Graduate Center Method of making depthwise-oriented integrated circuit capacitors
US4825106A (en) * 1987-04-08 1989-04-25 Ncr Corporation MOS no-leak circuit
JPH0810744B2 (ja) * 1989-08-28 1996-01-31 三菱電機株式会社 半導体装置
US4972101A (en) * 1989-09-19 1990-11-20 Digital Equipment Corporation Noise reduction in CMOS driver using capacitor discharge to generate a control voltage
JPH03153119A (ja) * 1989-11-09 1991-07-01 Seiko Epson Corp 電源起動検出回路
JP2563215B2 (ja) * 1990-06-20 1996-12-11 セイコー電子工業株式会社 半導体集積回路装置
US5101314A (en) * 1990-06-21 1992-03-31 Mitsubishi Denki Kabushiki Kaisha Protection system for capacitor bank
JPH04205994A (ja) * 1990-11-30 1992-07-28 Toshiba Corp プリチャージ回路
US5212402A (en) * 1992-02-14 1993-05-18 Motorola, Inc. Semiconductor device with integral decoupling capacitor
US5148391A (en) * 1992-02-14 1992-09-15 Micron Technology, Inc. Nonvolatile, zero-power memory cell constructed with capacitor-like antifuses operable at less than power supply voltage
KR960012789B1 (ko) * 1993-12-01 1996-09-24 현대전자산업 주식회사 부트스트랩 회로
US5506457A (en) * 1995-04-07 1996-04-09 International Business Machines Corporation Electronic switch for decoupling capacitor

Also Published As

Publication number Publication date
US5828259A (en) 1998-10-27
KR19980041839A (ko) 1998-08-17
MY115559A (en) 2003-07-31
KR100282380B1 (ko) 2001-03-02

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