SG45406A1 - Ic fault location tracing apparatus and method - Google Patents

Ic fault location tracing apparatus and method

Info

Publication number
SG45406A1
SG45406A1 SG1996006356A SG1996006356A SG45406A1 SG 45406 A1 SG45406 A1 SG 45406A1 SG 1996006356 A SG1996006356 A SG 1996006356A SG 1996006356 A SG1996006356 A SG 1996006356A SG 45406 A1 SG45406 A1 SG 45406A1
Authority
SG
Singapore
Prior art keywords
fault location
tracing apparatus
location tracing
fault
tracing
Prior art date
Application number
SG1996006356A
Other languages
English (en)
Inventor
Hiroaki Kobayashi
Hironobu Niijima
Soichi Shida
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of SG45406A1 publication Critical patent/SG45406A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG1996006356A 1995-03-16 1996-03-15 Ic fault location tracing apparatus and method SG45406A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7084798A JPH08254572A (ja) 1995-03-16 1995-03-16 Ｉｃ故障箇所追跡装置及びその追跡方法

Publications (1)

Publication Number Publication Date
SG45406A1 true SG45406A1 (en) 1998-01-16

Family

ID=13840732

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996006356A SG45406A1 (en) 1995-03-16 1996-03-15 Ic fault location tracing apparatus and method

Country Status (4)

Country Link
US (1) US5825191A (de)
JP (1) JPH08254572A (de)
DE (1) DE19610258A1 (de)
SG (1) SG45406A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6097884A (en) * 1997-12-08 2000-08-01 Lsi Logic Corporation Probe points and markers for critical paths and integrated circuits
DE19901767A1 (de) * 1999-01-18 2000-07-20 Etec Ebt Gmbh Verfahren und Vorrichtung zum Testen der Funktion einer Vielzahl von Mikrostrukturelementen
US7114136B2 (en) * 1999-09-27 2006-09-26 International Business Machines Corporation Method for VLSI system debug and timing analysis
JP3734392B2 (ja) * 1999-10-29 2006-01-11 松下電器産業株式会社 半導体集積回路の故障検査方法及びレイアウト方法
JP2003167796A (ja) * 2001-11-29 2003-06-13 Hitachi Ltd ファイバーチャネルに接続されるデバイス、及びこのデバイスのマージンテスト方法、並びに、ファイバーチャネルに接続されるデバイスを有するシステムの障害部位特定方法
US7848562B1 (en) * 2005-09-26 2010-12-07 National Semiconductor Corporation Method of reducing the time required to perform a passive voltage contrast test
CA2605234C (en) * 2007-10-03 2015-05-05 Semiconductor Insights Inc. A method of local tracing of connectivity and schematic representations produced therefrom
JP4975661B2 (ja) * 2008-02-26 2012-07-11 ルネサスエレクトロニクス株式会社 半導体集積回路のレイアウト設計方法
US9791508B2 (en) * 2016-01-20 2017-10-17 The Boeing Company Detecting and displaying flaws in a device under test

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3234413A1 (de) * 1982-09-16 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Verfahren zur automatischen fehlersuche im innern von vlsi-schaltungen mit einer elektronensonde und vorrichtung zur durchfuehrung eines solchen verfahrens
DE3437550A1 (de) * 1984-10-12 1986-04-24 Siemens AG, 1000 Berlin und 8000 München Verfahren zur fehleranalyse an integrierten schaltungen
US5089774A (en) * 1989-12-26 1992-02-18 Sharp Kabushiki Kaisha Apparatus and a method for checking a semiconductor
GB2283825B (en) * 1993-11-09 1997-07-02 Advantest Corp IC fault analysis system
JP3157674B2 (ja) * 1994-01-10 2001-04-16 日本電気株式会社 半導体集積回路の故障解析装置および方法
JPH07226426A (ja) * 1994-02-10 1995-08-22 Toshiba Corp 電子ビ−ムテスタ及び電子ビ−ムテスタを使用したテスト方法

Also Published As

Publication number Publication date
JPH08254572A (ja) 1996-10-01
US5825191A (en) 1998-10-20
DE19610258A1 (de) 1996-09-26

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