SG44693A1 - Scanning objective - Google Patents

Scanning objective

Info

Publication number
SG44693A1
SG44693A1 SG1996005690A SG1996005690A SG44693A1 SG 44693 A1 SG44693 A1 SG 44693A1 SG 1996005690 A SG1996005690 A SG 1996005690A SG 1996005690 A SG1996005690 A SG 1996005690A SG 44693 A1 SG44693 A1 SG 44693A1
Authority
SG
Singapore
Prior art keywords
scanning objective
objective
scanning
Prior art date
Application number
SG1996005690A
Other languages
English (en)
Inventor
Anton Dr Schick
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of SG44693A1 publication Critical patent/SG44693A1/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Lenses (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Microscoopes, Condenser (AREA)
SG1996005690A 1992-05-25 1992-11-03 Scanning objective SG44693A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4217298 1992-05-25

Publications (1)

Publication Number Publication Date
SG44693A1 true SG44693A1 (en) 1997-12-19

Family

ID=6459700

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996005690A SG44693A1 (en) 1992-05-25 1992-11-03 Scanning objective

Country Status (6)

Country Link
US (1) US5608564A (ko)
EP (1) EP0642676A1 (ko)
JP (1) JPH07117647B2 (ko)
KR (1) KR0177848B1 (ko)
SG (1) SG44693A1 (ko)
WO (1) WO1993024854A1 (ko)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1003530C2 (nl) * 1996-07-06 1998-01-12 Philips Electronics Nv Groothoek aftast-objectiefstelsel en aftastapparaat met een dergelijk objectiefstelsel.
JPH11258501A (ja) * 1998-01-09 1999-09-24 Fuji Photo Optical Co Ltd コリメータレンズおよびこれを用いた光走査装置
US20050009022A1 (en) * 2001-07-06 2005-01-13 Weiner Michael P. Method for isolation of independent, parallel chemical micro-reactions using a porous filter
US6917421B1 (en) 2001-10-12 2005-07-12 Kla-Tencor Technologies Corp. Systems and methods for multi-dimensional inspection and/or metrology of a specimen
US7589891B2 (en) * 2003-11-26 2009-09-15 Olympus Corporation Laser scanning type fluorescent microscope
US20060019264A1 (en) * 2003-12-01 2006-01-26 Said Attiya Method for isolation of independent, parallel chemical micro-reactions using a porous filter
JP5536995B2 (ja) 2007-07-17 2014-07-02 オリンパス株式会社 顕微鏡対物レンズおよびレーザー走査型顕微鏡システム
TW201343296A (zh) * 2012-03-16 2013-11-01 Ipg Microsystems Llc 使一工件中具有延伸深度虛飾之雷射切割系統及方法
WO2023106222A1 (ja) * 2021-12-08 2023-06-15 株式会社ニコン 走査型顕微鏡

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3422143A1 (de) * 1984-06-14 1985-12-19 Josef Prof. Dr. Bille Geraet zur wafer-inspektion
US4734578A (en) * 1985-03-27 1988-03-29 Olympus Optical Co., Ltd. Two-dimensional scanning photo-electric microscope
JPS63306413A (ja) * 1987-06-09 1988-12-14 Olympus Optical Co Ltd 走査型光学顕微鏡
US4953927A (en) * 1987-12-23 1990-09-04 Agfa-Gevaert Ag Lens assembly for long-life laser imaging system
JP2945097B2 (ja) * 1990-08-10 1999-09-06 リコー光学株式会社 テレセントリックなｆθレンズ
US7615299B2 (en) * 2005-01-28 2009-11-10 Delphi Technologies, Inc. Method and apparatus for thermal, mechanical, and electrical optimization of a solid-oxide fuel cell stack

Also Published As

Publication number Publication date
WO1993024854A1 (de) 1993-12-09
KR0177848B1 (ko) 1999-05-15
JPH07117647B2 (ja) 1995-12-18
JPH063587A (ja) 1994-01-14
EP0642676A1 (de) 1995-03-15
KR950701741A (ko) 1995-04-28
US5608564A (en) 1997-03-04

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