SG153743A1 - Manufacturing method of glass substrate for magnetic disc, glass substrate for magnetic disc, and magnetic disc - Google Patents
Manufacturing method of glass substrate for magnetic disc, glass substrate for magnetic disc, and magnetic discInfo
- Publication number
- SG153743A1 SG153743A1 SG200808836-1A SG2008088361A SG153743A1 SG 153743 A1 SG153743 A1 SG 153743A1 SG 2008088361 A SG2008088361 A SG 2008088361A SG 153743 A1 SG153743 A1 SG 153743A1
- Authority
- SG
- Singapore
- Prior art keywords
- magnetic disc
- glass substrate
- manufacturing
- defect
- judging
- Prior art date
Links
Landscapes
- Manufacturing Of Magnetic Record Carriers (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
A manufacturing method of a glass substrate 100 for a magnetic disc according to the present invention includes a substrate condition measuring step S200; a defect inner surface position specifying step S202; a surface defect judging step S204 for judging whether or not a defect with specified inner surface position is on the surface of the glass substrate 100 or the basis of the number of images formed at an inner surface position by an image forming means; and the non- defective judging step S206 for judging whether or not the glass substrate 100 is non-defective on the basis of a result of the surface defect judging step S204. (FIG. 2)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007340827A JP5084495B2 (en) | 2007-12-28 | 2007-12-28 | Manufacturing method of glass substrate for magnetic disk, glass substrate for magnetic disk and magnetic disk |
Publications (1)
Publication Number | Publication Date |
---|---|
SG153743A1 true SG153743A1 (en) | 2009-07-29 |
Family
ID=40901942
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200808836-1A SG153743A1 (en) | 2007-12-28 | 2008-11-28 | Manufacturing method of glass substrate for magnetic disc, glass substrate for magnetic disc, and magnetic disc |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5084495B2 (en) |
SG (1) | SG153743A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6463246B2 (en) * | 2015-09-30 | 2019-01-30 | 株式会社日立ハイテクファインシステムズ | Optical surface inspection apparatus and optical surface inspection method |
JP7390278B2 (en) | 2020-12-16 | 2023-12-01 | 株式会社日立ハイテクソリューションズ | Appearance inspection method, appearance inspection device, processing method and device for structures |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3108428B2 (en) * | 1990-08-13 | 2000-11-13 | 株式会社東芝 | Defect detection device for transparent circular work |
JP2004233338A (en) * | 2003-01-08 | 2004-08-19 | Tdk Corp | Defect detection method of disc substrate, apparatus for the same, and method for manufacturing substrate for optical disc |
-
2007
- 2007-12-28 JP JP2007340827A patent/JP5084495B2/en active Active
-
2008
- 2008-11-28 SG SG200808836-1A patent/SG153743A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
JP2009162570A (en) | 2009-07-23 |
JP5084495B2 (en) | 2012-11-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG10201503154SA (en) | Automated inspection of colored contact lenses | |
SG10201805220TA (en) | Glass ceramic for ultraviolet lithography and method of manufacturing thereof | |
WO2008008817A3 (en) | Edge inspection and metrology | |
TW200637051A (en) | Mask, mask manufacturing method, pattern forming apparatus, and pattern formation method | |
WO2011015928A3 (en) | Image-processing method for correcting a target image in accordance with a reference image, and corresponding image-processing device | |
TW200717470A (en) | Method and apparatus for manufacturing of magneto-resistance effect element | |
WO2013010976A3 (en) | Method and apparatus for analyzing and for removing a defect of an euv photomask | |
TW201612621A (en) | Reflective mask blank, method for manufacturing reflective mask blank, reflective mask, and method for manufacturing semiconductor device | |
MX2011007280A (en) | Electromagnetic radiation sensor and method of manufacture. | |
TW200620161A (en) | Method and apparatus for inspecting substrate | |
TW200720204A (en) | Glass substrate and a manufacturing method thereof | |
SG158782A1 (en) | Method and system for detecting micro-cracks in wafers | |
EP1768171A4 (en) | Exposure apparatus, exposure method, and device producing method | |
SG11201900477UA (en) | Laser annealing apparatus, inspection method of substrate with crystallized film, and manufacturing method of semiconductor device | |
TW200700932A (en) | Lithography process with an enhanced depth-of-depth | |
TW200746456A (en) | Nitride-based semiconductor device and production method thereof | |
GB2489859A (en) | Through silicon via lithographic alignment and registration | |
SG153743A1 (en) | Manufacturing method of glass substrate for magnetic disc, glass substrate for magnetic disc, and magnetic disc | |
JP2011203343A5 (en) | ||
MY149763A (en) | Light-emitting device and method for manufacturing same. | |
TW200744202A (en) | Image sensor and methods of fabricating the same | |
WO2012044070A3 (en) | Photosensitive resin composition for organic insulator | |
TW200610139A (en) | Panel for display device and manufacturing method thereof | |
TW200739286A (en) | Sensor unit, exposure apparatus, and device manufacturing method | |
WO2013009026A3 (en) | Method for evaluating wafer defects |