SG148160A1 - Line light irradiation device - Google Patents
Line light irradiation deviceInfo
- Publication number
- SG148160A1 SG148160A1 SG200808228-1A SG2008082281A SG148160A1 SG 148160 A1 SG148160 A1 SG 148160A1 SG 2008082281 A SG2008082281 A SG 2008082281A SG 148160 A1 SG148160 A1 SG 148160A1
- Authority
- SG
- Singapore
- Prior art keywords
- line
- light
- irradiation device
- light irradiation
- line light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/898—Irregularities in textured or patterned surfaces, e.g. textiles, wood
- G01N21/8983—Irregularities in textured or patterned surfaces, e.g. textiles, wood for testing textile webs, i.e. woven material
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Textile Engineering (AREA)
- Engineering & Computer Science (AREA)
- Wood Science & Technology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Light Guides In General And Applications Therefor (AREA)
- Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
- Non-Portable Lighting Devices Or Systems Thereof (AREA)
- Optical Couplings Of Light Guides (AREA)
- Instruments For Viewing The Inside Of Hollow Bodies (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003288283 | 2003-08-06 | ||
JP2004106654 | 2004-03-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG148160A1 true SG148160A1 (en) | 2008-12-31 |
Family
ID=34137919
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200808228-1A SG148160A1 (en) | 2003-08-06 | 2004-08-04 | Line light irradiation device |
SG200808227-3A SG148159A1 (en) | 2003-08-06 | 2004-08-04 | Line light irradiation device |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200808227-3A SG148159A1 (en) | 2003-08-06 | 2004-08-04 | Line light irradiation device |
Country Status (8)
Country | Link |
---|---|
US (1) | US7631999B2 (ja) |
EP (1) | EP1666872A4 (ja) |
JP (1) | JP4480029B2 (ja) |
KR (1) | KR100779133B1 (ja) |
CN (1) | CN1833163B (ja) |
SG (2) | SG148160A1 (ja) |
TW (1) | TWI239377B (ja) |
WO (1) | WO2005015186A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5219236B2 (ja) * | 2007-02-26 | 2013-06-26 | 株式会社モリテックス | ラインライトガイド |
JP2010170835A (ja) * | 2009-01-22 | 2010-08-05 | Sanyo Electric Co Ltd | 照明装置および投写型映像表示装置 |
US8134132B2 (en) * | 2010-04-28 | 2012-03-13 | Dymax Corporation | Exposure device having an array of light emitting diodes |
EP2761414A4 (en) * | 2011-09-29 | 2015-06-10 | Intel Corp | FIBER OPTIC PROXIMITY SENSOR |
KR101316539B1 (ko) * | 2011-11-29 | 2013-10-15 | 주식회사 힘스 | 유기발광다이오드 이물검사기 |
JP6571317B2 (ja) * | 2014-07-02 | 2019-09-04 | 株式会社アイテックシステム | ライン状照明装置、その製造方法および検査方法 |
JP6775273B2 (ja) * | 2018-08-30 | 2020-10-28 | 株式会社アイテックシステム | ライン状照明装置、その製造方法および検査方法 |
CN115327700B (zh) * | 2022-09-09 | 2023-06-06 | 中国建筑材料科学研究总院有限公司 | 光学纤维丝的排列方法和光学纤维元器件的制备方法 |
Family Cites Families (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3941485A (en) * | 1973-11-08 | 1976-03-02 | Madden Richard A | Device for continuously measuring a dimension of a workpiece by reflected light |
JPS62251641A (ja) * | 1986-04-25 | 1987-11-02 | Fuji Electric Co Ltd | 光学的検査装置 |
JPS63104872A (ja) | 1986-10-23 | 1988-05-10 | Kita Denshi:Kk | 印刷エラ−検出方法 |
CA2055142C (en) * | 1990-11-09 | 1995-03-28 | Atsushi Asada | Liquid crystal display apparatus |
US5148303A (en) * | 1991-01-31 | 1992-09-15 | Honeywell Inc. | Delay line fiber optic sensor |
US5185638A (en) * | 1991-04-26 | 1993-02-09 | International Business Machines Corporation | Computer controlled, multiple angle illumination system |
US5222794A (en) * | 1991-12-20 | 1993-06-29 | Ford Motor Company | Fiberoptic line-of-light illuminating device |
US5260766A (en) * | 1992-04-02 | 1993-11-09 | Armitage Mark H | Apparatus for detection of an imperfect seal and method therefore |
US5432600A (en) * | 1992-05-15 | 1995-07-11 | Philip Morris Incorporated | Systems for optically inspecting cylindrical surfaces |
US5268977A (en) * | 1992-07-06 | 1993-12-07 | Miller Jack V | Fiber optic zoom-and-dim pin-spot luminaire |
US5596409A (en) * | 1995-03-22 | 1997-01-21 | Eastman Kodak Company | Associated dual interferometric measurement method for determining a physical property of an object |
JP2975893B2 (ja) | 1996-07-08 | 1999-11-10 | シーシーエス株式会社 | 照明装置の製造方法 |
DE19721915C1 (de) * | 1997-05-26 | 1998-12-10 | Stn Atlas Elektronik Gmbh | Verfahren und Vorrichtung zur Messung von Unebenheiten in einer Objektoberfläche |
US5953113A (en) * | 1997-10-29 | 1999-09-14 | Poffenbarger; Steven Lewis | Device and method for detecting, characterizing and correcting flaws in optic fiber |
US6757058B1 (en) * | 1999-05-05 | 2004-06-29 | Lucidyne Technologies, Inc. | Fiber-optic light line for use in an inspection system |
US6782337B2 (en) * | 2000-09-20 | 2004-08-24 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension an a presence of defects on a specimen |
JP4262413B2 (ja) * | 2001-01-29 | 2009-05-13 | 新日本製鐵株式会社 | 疵検査用照明装置 |
JP2003097931A (ja) * | 2001-09-21 | 2003-04-03 | Olympus Optical Co Ltd | 光学検査方法及びその装置 |
JP2003202294A (ja) * | 2001-10-29 | 2003-07-18 | Ccs Inc | 検査用照明装置 |
DE10252523A1 (de) * | 2001-11-16 | 2003-07-03 | Ccs Inc | Beleuchtungsvorrichtung zur optischen Prüfung |
DE10256365A1 (de) | 2001-12-04 | 2003-07-17 | Ccs Inc | Lichtabstrahlungsvorrichtung, Lichtquellenvorrichtung, Beleuchtungseinheit und Lichtverbindungsmechanismus |
JP3927878B2 (ja) * | 2002-04-16 | 2007-06-13 | シーシーエス株式会社 | 検査等に用いる照明装置 |
-
2004
- 2004-08-04 CN CN2004800225334A patent/CN1833163B/zh not_active Expired - Fee Related
- 2004-08-04 SG SG200808228-1A patent/SG148160A1/en unknown
- 2004-08-04 EP EP04771195A patent/EP1666872A4/en not_active Withdrawn
- 2004-08-04 KR KR1020067001326A patent/KR100779133B1/ko not_active IP Right Cessation
- 2004-08-04 SG SG200808227-3A patent/SG148159A1/en unknown
- 2004-08-04 US US10/567,234 patent/US7631999B2/en not_active Expired - Fee Related
- 2004-08-04 JP JP2005512936A patent/JP4480029B2/ja not_active Expired - Fee Related
- 2004-08-04 WO PCT/JP2004/011157 patent/WO2005015186A1/ja active Application Filing
- 2004-08-05 TW TW093123425A patent/TWI239377B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1666872A1 (en) | 2006-06-07 |
KR20060035774A (ko) | 2006-04-26 |
JPWO2005015186A1 (ja) | 2007-08-30 |
SG148159A1 (en) | 2008-12-31 |
US7631999B2 (en) | 2009-12-15 |
EP1666872A4 (en) | 2011-05-25 |
TWI239377B (en) | 2005-09-11 |
CN1833163B (zh) | 2010-07-07 |
TW200510672A (en) | 2005-03-16 |
CN1833163A (zh) | 2006-09-13 |
KR100779133B1 (ko) | 2007-11-23 |
WO2005015186A1 (ja) | 2005-02-17 |
US20060215151A1 (en) | 2006-09-28 |
JP4480029B2 (ja) | 2010-06-16 |
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