SG144798A1 - Cantilever-type probe mechanism and method of making cantilever-type probe card - Google Patents

Cantilever-type probe mechanism and method of making cantilever-type probe card

Info

Publication number
SG144798A1
SG144798A1 SG200718122-5A SG2007181225A SG144798A1 SG 144798 A1 SG144798 A1 SG 144798A1 SG 2007181225 A SG2007181225 A SG 2007181225A SG 144798 A1 SG144798 A1 SG 144798A1
Authority
SG
Singapore
Prior art keywords
cantilever
metal
type probe
pin
signal
Prior art date
Application number
SG200718122-5A
Other languages
English (en)
Inventor
Wei-Cheng Ku
Chia-Tai Chang
Chien-He Lin
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39710876&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=SG144798(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Publication of SG144798A1 publication Critical patent/SG144798A1/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200718122-5A 2007-01-15 2007-11-28 Cantilever-type probe mechanism and method of making cantilever-type probe card SG144798A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96101463A TW200829923A (en) 2007-01-15 2007-01-15 High frequency suspension arm probe

Publications (1)

Publication Number Publication Date
SG144798A1 true SG144798A1 (en) 2008-08-28

Family

ID=39710876

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200718122-5A SG144798A1 (en) 2007-01-15 2007-11-28 Cantilever-type probe mechanism and method of making cantilever-type probe card

Country Status (2)

Country Link
SG (1) SG144798A1 (https=)
TW (1) TW200829923A (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI461698B (zh) * 2010-09-30 2014-11-21 Mpi Corp Probe unit and its making method
TW201305574A (zh) * 2011-07-22 2013-02-01 Mpi Corp 高頻訊號路徑調整方式及其測試裝置
TWI458987B (zh) * 2013-04-26 2014-11-01 Mpi Corp 探針模組
WO2016156003A1 (en) * 2015-03-31 2016-10-06 Technoprobe S.P.A. Vertical contact probe and corresponding testing head with vertical contact probes, particularly for high frequency applications
CN108022848B (zh) * 2016-11-01 2020-10-27 稳懋半导体股份有限公司 改良式同轴探针结构
CN119414056A (zh) * 2024-10-31 2025-02-11 昆山德普福电子科技有限公司 射频测试探针装置

Also Published As

Publication number Publication date
TWI312867B (https=) 2009-08-01
TW200829923A (en) 2008-07-16

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